1304479 九、發明說明： -【發明所屬之技術領域】 本發明係有關於一種測試系統及方法，更詳而言之 - 係關於一種按鍵測試系統及方法。 【先前技術】 一般而言，電子裝置都具有可供使用者操作的按鍵， 按鍵的好壞直接影響了使用者對電子裝置的功能操控，因 此，對按鍵進行測試係為產品出廠前的必要流程。目前的 按鍵測試技術多藉由單晶片機控制，亦即，將單晶片 (SingleChip)機與按鍵板（SwitchB〇ard)電 Z 連接， 該按鍵板係為包含有複數按鍵之電路板，而此種測試方法 會存在如下缺點： ' 〇〇 〇)測試人員需要熟悉單晶片機的硬體電路（亦即， 單晶片機的輸入輸出接腳及連接方式），藉此將單曰 與按鍵板電性連接，而不同型號的單晶片機，其輸入輸出 •接腳的數量與位W，若更換另—型號的單晶二出 則早晶片機與按鍵板即需要重新連接。故此種藉 機測試按鍵的技術，其硬體連接電路不具有通用性，= 改硬體連接電路亦則浪費測試時間。 ⑵測試人員需要—定程度的單晶片機程式 ^由於不同型號的單晶片機，其軟體設計亦不同二 二==單晶片機的記憶體之後，其來源碼 若更換另一型號的單晶片機，則測試程式 、、扁寫及重新燒錄。故此種藉由單晶片機測試按 19646 5 1304479 鍵的技術，其軟體測試 制崎妒彳π 不八邛不具有通用性，而重新編寫 J 5式耘式同樣會浪費測試時間。 你受單晶片機的功能限制，測試程式僅能判斷按鍵 的域好壞而缺乏對測試結果的後續處理 =時：:不良按鍵的具體位置、測試總量及良品率均 數旦I?:、:十與5己錄。又’受單晶片機的輸入輸出接腳的 ^ ^ , _月匕測忒一個或少量的按鍵板。因此， 種糟由早晶片機測試按鍵的技術既不利於測試人員對 =鍵板測試資料的追縱管理，又不適用於按鍵板的大量測 為此，如何提供一種能實現摘測通用性與 間之功效，復能提供按鍵板測試㈣之追”理，並適用可 於按鍵板之大量職的按鍵職系統及方法，以解決1304479 IX. INSTRUCTIONS: - [Technical Field to Which the Invention pertains] The present invention relates to a test system and method, and more particularly to a key test system and method. [Prior Art] In general, electronic devices have buttons that can be operated by the user. The quality of the buttons directly affects the user's function control of the electronic device. Therefore, testing the buttons is a necessary process before leaving the factory. . The current button testing technology is mostly controlled by a single-chip machine, that is, a single-chip (SingleChip) machine is connected to a keypad (SwitchB〇ard), which is a circuit board containing a plurality of buttons, and this The test method has the following disadvantages: ' 〇〇〇) Testers need to be familiar with the hardware circuit of the single-chip machine (that is, the input and output pins of the single-chip machine and the connection method), thereby electrically charging the single-turn and the button board. Sex connection, and the different types of single-chip machines, the number of input and output / pin and bit W, if the replacement of the other type of single crystal two out, the early wafer machine and the keypad need to be reconnected. Therefore, the technology of borrowing the test button does not have the versatility of the hardware connection circuit, and the test circuit is wasted when the hardware connection circuit is changed. (2) The tester needs a certain degree of single-chip machine program. Because of the different types of single-chip machines, the software design is different. After the memory of the single-chip machine, the source code is replaced with another type of single-chip machine. , test the program, flat write and re-burn. Therefore, the technique of testing the 19646 5 1304479 key by the single-chip machine, the software test system is not versatile, and the rewriting of the J 5 type is also a waste of test time. You are limited by the function of the single-chip machine. The test program can only judge whether the key field is good or bad and lacks subsequent processing of the test result. =: The specific position of the bad button, the total test quantity and the yield rate are several times? : Ten and 5 have been recorded. In addition, one or a small number of keypads are measured by ^ ^ , _ month of the input and output pins of the single-chip machine. Therefore, the technique of testing the button by the early wafer machine is not conducive to the tester's tracking management of the keyboard test data, and is not applicable to the large number of test of the keyboard. How to provide a universal versatility With the effect of the inter-function, Re-energy provides the keyboard test (4), and applies to a large number of key job systems and methods available on the keypad.
習知按制試技狀種種龍，遂絲目^待解決 題。 、 J 【發明内容】 供 鑒於上述f知技術之缺點，本發明之主要目的在於提 種具有通用性之按鍵測試系統及方法。 法 本發明之另一目的在於提供一種按鍵測試系統及方 以節省測試時間。 本杂明之再一目的在於提供一種按鍵测試系統及方 法，其能對按鍵板之測試結果進行處理，俾後 杯 試資料之追縱管理。 、*鍵板ΛΙ 本發明之又一目的在於提供一種按鍵测試系統及方 19646 6 1304479 -法’藉以實現按鍵板之大量測試。 _ 為達上述之目的，本發明提供一種按鍵測試系統，其 包括U則試裝置，係用以電性連接具有至少一按鍵之按鍵 ^板（Switch B〇ard)，用以偵測該按鍵板之按鍵狀態；資料 處理裝置，係用以依據該測試裝置所偵測之按鍵板之按鍵 |狀態，記錄對應於該按鍵板之測試結果及按鍵板測試之統 计結果’並用以顯示該測試裝置所偵測之按鍵板之按鍵狀 悲、測试結果及統計結果；以及傳輸介面，係電性連接該 測試裝置及資料處理裝置，用以將該測試裝置所偵測之按 鍵板之按鍵狀態傳輸至該資料處理裝置，該傳輸介面係為 周邊元件介面（Peripheral Component Interface; PCI) 及萬用串列匯流排（Universal Serial Bus; USB)之其中 一者。 於本發明之一種型態中，該資料處理裝置進一步包 括：設定模組，係用以設定對應於按鍵狀態之顯示方式， 鲁並用以建立該按鍵板及按鍵之位置分佈與該測試裝置所 、偵測之按鍵板及按鍵之實體位置的對應關係；讀取模組， 係用以讀取該傳輸介面所傳輸之該測試裝置所偵測之按 鍵板之按鍵狀態；記錄模組，係用以依據該讀取模組所讀 取之按鍵板之按鍵狀態記錄對應於該按鍵板之測試結果 及按鍵板測試之統計結果；顯示模組，係用以提供按鍵測 試視窗，該按鍵測試視窗係用以顯示該按鍵板及按鍵之位 置分佈、該記錄模組所記錄之對應於該按鍵板之測試結果 及按鍵板測試之統計結果，並用以依據該設定模組所設定 19646 7 1304479 ‘ 之顯示方式及所建立之對應關係顯示該讀取模組所讀取 - 之按鍵板之按鍵狀態；以及儲存模組，係用以儲存該記錄 模組所記錄之對應於該按鍵板之測試結果及按鍵板測試 • 之統計結果。 ‘於本發明之一種型態中，該設定對應於按鍵狀態之顯 示方式，係指設定不同的按鍵狀態對應於不同的顯示色 彩。 透過前述本發明之按鍵測試系統，本發明復提供一種 _按鍵測試方法’係包括下述步驟：設定對應於按鍵狀態之 顯示方式，並建立按鍵板及按鍵之位置分佈與該測試裝置 所偵測之按鍵板及按鍵之實體位置的對應關係；電性連接 該按鍵板與該測試裝置；顯示該按鍵板及按鍵之位置分 佈；讀取該傳輸介面所傳輸之該測試裝置所偵測之按鍵板 之按鍵狀態；依據所設定之顯示方式及所建立之對應關係 顯示所讀取之該按鍵板之按鍵狀態；依據所讀取之該按鍵 ⑩板之按鍵狀態記錄對應於該按鍵板之測試結果及按鍵板 •測試之統計結果；顯示所記錄之對應於該按鍵板之測試結 果及按鍵板測試之統計結果；以及儲存該所記錄之對應於 忒按鍵板之測试結果及按鍵板測試之統計結果，其中，該 傳輸介面係為周邊元件介面（peripheral c〇mp〇nent Interface; PCI)及萬用串列匯流排（Universal Bus; USB)之其中一者。 於本發明之一種型態中，該設定對應於按鍵狀態之顯 不方式，係指設定不同的按鍵狀態對應於不同的顯示色 8 19646 1304479 彩。 ^ 錢及方法係藉由傳輸介φ _衣置所偵測之各按鍵板之按鍵狀態傳輪 處理裝置並予以顯示及處理’測試人員能 °、紐+ 測試結果及統計結果，且由於資 項扣鍵之 次、PR“ 岐處理裝置之硬體及軟體 貝源強大’即無需再使用單晶片機對按鍵測試進行控制， 故能解決習知技術因使用單晶片機控制而導致硬體 電路、軟體測試程式不具有通用性，以及浪費測試時間之 缺點。再者，本發明之按鍵測試系統利用了資料處理裝 將測試時間、測試通過的按鍵位置、測試按鍵板的缺量及 良品率予以儲存，藉此能使測試人員直接了解不良按鍵之 具體位置以及測試良品率’俾於測試人員對按鍵板測試進 行追縱管理。另外，利用該資料處理裝置之強大硬體資源 可-次同時測試多個按鍵板並予以記錄，故本發明亦能適 用於按鍵板之大量測試。 【實施方式】 以下係藉由具體實例說明本發明之實施方式，熟悉此 技藝之人士可由本說明書所揭示之内容輕易地瞭解本發 明之其他優點與功效。本發明亦可藉由其他不同的具體實 例加以施行或應用，本說明書中的各項細節亦可基於不同 觀點與應用，在不悖離本發明之精神下進行各種修飾與變 更0 弟1圖為一方塊示意圖，係用以顯示本發明之按鍵測 試系統之基本架構，如圖所示，該按鍵測試系統i係包括 19646 9 1304479 .測試裝置11，傳輸介面12，以及資料處理裝置13。 - 該測試裝置1卜係電性連接具有至少一按鍵之按鍵 板（SwitchB〇ard)10,用以偵測各按鍵板1〇之按鍵狀態。 -該測試裝置11能依據實際需要電性連接單一或複數個按 鍵板，於本實施例中，該測試裝置u係電性連接4個按 鍵板10,且每個按鍵板具有8個按鍵，該測試裝置n可 '1別偵測32個按鍵之按鍵狀態，亦即該些按鍵被按下後 疋否能正常發出其所代表的訊號。 籲 該傳輸介面12，係電性連接該測試裴置11及資料處 里衣置1 3，用以將s亥測试裝置1 1所偵測之各按鍵板1 〇 之按鍵狀態傳輸至該資料處理裝置13。其中，該傳輸介 面12係為周邊元件介面（Peripheral c〇mp〇nentAccording to the test-making techniques, the dragons are all kinds of dragons. SUMMARY OF THE INVENTION In view of the above disadvantages of the prior art, the main object of the present invention is to provide a versatile key test system and method. Another object of the present invention is to provide a button test system and to save test time. A further object of the present invention is to provide a button test system and method which can process the test results of the keypad and then manage the tracking data. , *Keyboard 又一 Another object of the present invention is to provide a button test system and a method for implementing a large number of test of the keypad. For the purpose of the above, the present invention provides a button test system, which includes a U test device for electrically connecting a switch panel having at least one button to detect the button panel. The data processing device is configured to record the test result corresponding to the test panel and the statistical result of the keypad test according to the button state of the keypad detected by the test device and to display the test device The button shape of the detected button, the test result and the statistical result; and the transmission interface are electrically connected to the test device and the data processing device for transmitting the button state of the button board detected by the test device To the data processing device, the transmission interface is one of a Peripheral Component Interface (PCI) and a Universal Serial Bus (USB). In one aspect of the present invention, the data processing device further includes: a setting module configured to set a display mode corresponding to the state of the button, and configured to establish a position distribution of the button pad and the button and the testing device, Corresponding relationship between the physical position of the button and the button; the reading module is configured to read the button state of the button board detected by the test device transmitted by the transmission interface; the recording module is used for According to the button state record of the keypad read by the reading module, the test result corresponding to the keypad and the statistical result of the keypad test; the display module is used to provide a button test window, and the button test window is used Displaying the position distribution of the button board and the button, the test result corresponding to the button board recorded by the recording module, and the statistical result of the button board test, and using the display mode of 19646 7 1304479 ' according to the setting module And the corresponding relationship is displayed to display the button state of the button board read by the reading module; and the storage module is configured to store the recording mode The record corresponding to the test of the key sheet and the key sheet of the results of the test • statistics. In one aspect of the invention, the setting corresponds to the display mode of the button state, which means that setting different button states corresponds to different display colors. Through the above-mentioned button test system of the present invention, the present invention provides a _button test method comprising the steps of: setting a display mode corresponding to a button state, and establishing a position distribution of the button board and the button and detecting by the test device. Corresponding relationship between the physical position of the button board and the button; electrically connecting the button board and the testing device; displaying the position distribution of the button board and the button; reading the key board detected by the testing device transmitted by the transmission interface The state of the button; the state of the button of the read button is displayed according to the set display mode and the established relationship; and the test result corresponding to the button is recorded according to the state of the button of the button 10 The statistical result of the button board and the test; the recorded statistical result corresponding to the test result of the keypad and the test of the keypad; and the statistical result of storing the recorded test result corresponding to the keypad and the test of the keypad Wherein, the transmission interface is a peripheral component interface (PCI) and a universal string Bus (Universal Bus; USB) of one person. In one form of the invention, the setting corresponds to the display mode of the button state, which means that setting different button states corresponds to different display colors 8 19646 1304479. ^ The money and method are displayed and processed by the button state transfer processing device of each button board detected by φ _ clothing, and the tester can, °, test results and statistical results, and because of the funds The key of the button and the PR "the hardware of the processing device and the power of the soft body" are no need to use the single-chip machine to control the button test, so that the conventional technology can be solved due to the use of the single-chip machine control, resulting in a hardware circuit, The software test program is not versatile and has the disadvantage of wasting test time. Furthermore, the button test system of the present invention utilizes a data processing device to store test time, test button position, test button deficiencies, and yield rate. In this way, the tester can directly understand the specific location of the bad button and the test yield rate. The tester can track and control the keypad test. In addition, the powerful hardware resources of the data processing device can be used for simultaneous testing. The key sheet is recorded and recorded, so the present invention can also be applied to a large number of test of the key sheet. [Embodiment] The following is by specific Other embodiments of the present invention can be easily understood by those skilled in the art from the disclosure of the present disclosure. The present invention can also be implemented or applied by other different specific examples. Various details and applications may be made based on different viewpoints and applications, and various modifications and changes may be made without departing from the spirit and scope of the invention. FIG. 1 is a block diagram showing the basic structure of the key test system of the present invention, such as As shown, the button test system i includes 19646 9 1304479. The test device 11, the transmission interface 12, and the data processing device 13. - The test device 1 is electrically connected to a keypad having at least one button (SwitchB〇ard 10, for detecting the state of the button of each button board. - The test device 11 can electrically connect a single or a plurality of button boards according to actual needs. In this embodiment, the test device u is electrically connected 4 The button board 10, and each button board has 8 buttons, the test device n can '1' detect the button state of the 32 buttons, that is, after the buttons are pressed, no Normally, the signal represented by it is issued. The transmission interface 12 is electrically connected to the test device 11 and the clothing device 13 for the purpose of detecting the key plates 1 detected by the s test device 1 1 The button state is transmitted to the data processing device 13. The transmission interface 12 is a peripheral component interface (Peripheral c〇mp〇nent)
Interface; PCI)’於本發明之其他實施例中，該傳輸介 面12亦可為萬用串列匯流排（Universal Bus; USB)。於本實施例中，該傳輸介面12係為一具有μ路「工 ，參與〇」之開關量（Switch)輸入之PCI介面的開關量卡， -用以將該測試裝置11所偵測之各按鍵板之按鍵狀態轉換 為開關量，例如’丨表示按鍵被按下，〇表示按鍵未按下。 »亥資料處理裝置13 ’係用以顯示該測試襞置丨丨所偵 測之各按鍵板之按鍵狀態，且用以依據該測試裝置η所 偵利之各按鍵板丨〇之按鍵狀態記錄對應於各按鍵板之測 忒結果及按鍵板測試之統計結果並予以顯示。於本實施例 I、,’、該資料處理裝置13係為一電腦。如第1圖所示，該 資料處理哀置13包括設定模組130、讀取模組131、記錄 10 19646 1304479 *模組132、顯示模組133、以及儲存模組134。 - 該設定模組13〇,係用以設定對應於按鍵狀態之顯示 方式，並用以建立該按鍵板1〇及按鍵之位置分佈與該測 試裝置11所偵測之按鍵板1〇及按鍵之實體位置的對應關 '係。其中，該設定對應於按鍵狀態之顯示方式，係指設定 不同的按鍵狀態對應於不同的顯示色彩，例如，黑色表示 r 按鍵被按下，白色表示按鍵未被按下。 該讀取模組131，係用以讀取該傳輸介面12所傳輪 鲁之該測試裝置11所偵測之各按鍵板1〇之按鍵狀態。於本 實施例中，測試人員分別按下32個按鍵，該測試裝置丄工 偵測32個按鍵之按鍵狀態，若按鍵有問題（例如斷路， 按鍵接觸不良等），即使按鍵被按下，測試裝置1丨所偵 測之按鍵狀態亦為未按下。 該記錄模組132,係用以依據該讀取模組131所讀取 之按鍵板10之按鍵狀態記錄對應於該按鍵板丨〇之測試結 果及按鍵板10測試之統計結果。於本實施例中，各按鍵 •板1 〇之測试結果係指，若所讀取之1個按鍵板1 〇上8 個按鍵狀態均為1(被按下），則記錄該按鍵板1〇為測 試通過（Pass);若所讀取之1個按鍵板上至少有1個 按鍵狀態為0(未按下），則記錄該按鍵板為測試失 敗（Fail)。此外，記錄按鍵板測試之統計結果係包括記錄 所測试之按鍵板的總量（Total )、通過量以及失敗量。 該顯示模組133，係用以提供按鍵測試視窗，該按鍵 測試視窗係用以顯示該按鍵板1〇及按鍵之位置分佈、該 11 19646 1304479 •圮錄杈組I32所記錄之對應於該按鍵板1〇之測試社果及 •按鍵板1〇測試之統計結果，並用以依據該設定㈣· •所设定之顯不方式及所建立之對應關係顯示該讀取模組 _⑶所讀取之按鍵板1〇。如第2八圖所示，其係顯示一按 鍵測試視窗，該按鍵測試視窗顯示對應於該測試装置u 所偵測之各按鍵板10及按鍵之實體位置之按鍵板⑴板 〜4#板）及按鍵的位置分佈（白色方格）。請繼續參閲第 2B圖，其係依據該設定模組13〇所設定之顯示方式及所 建立之對應關係顯示該讀取模組131所讀取之各按鍵板 1 〇之知:鍵狀悲，圖中黑色方格表示偵測到按鍵按下，白 色方格表示未偵測到按鍵按下。若測試人員按下按鍵測試 視自中之檢測結果”按鍵，該按鍵測試視窗即顯示本次測 忒中该纪錄模組132所記錄之對應於各按鍵板1〇之測試 …果及按鍵板1 〇測試之統計結果，並將按鍵狀態之顯示 ^灰復至初始狀態（白色方格）以繼續進行測試，如第2c -鲁圖所示，其中，1#板、2#板及3#板測試失敗（Fail)，4# •板测試通過（Pass);請配合參閱第2B圖（前次累計的按 鍵板測試之統計結果），本次測試後累計的測試按鍵板的 總 i(Total)為 24 個（pcs)，通過量（pass)為 18 個（pcs)， 失敗量（Fail)為6個（pcs)。 该儲存模組134，係用以儲存該記錄模組132所記錄 之對應於該按鍵板1 〇之測試結果及按鍵板10測試之統計 結果。如第2D及2E圖所示，其係為本發明之按鍵測試系 統所儲存之測試結果及統計結果之一實施例示意圖，該儲 12 19646 1304479 存杈組134將測試時間及測試通過的按鍵位置儲存於一 檔案中，如第2D圖所示；同時，該儲存模組134依據所 記錄之測試按鍵板1〇的總量及通過量計算按鍵板測試的 良品率並儲存於一檔案中，如第2E圖所示。 明參閱第3圖’其係為本發明之按鍵測試方法透過前 述本發明之按鍵測試系統流程示意圖。如圖所示，本發明 之按鍵測試方法3包括以下步驟： 設定對應於按鍵狀態之顯示方式，並建立按鍵板及按 鍵之位置分佈與該測試裝置所偵測之按鍵板及按鍵之實 體位置的對應關係；電性連接該按鍵板與該測試裝置；顯 示該按鍵板及按鍵之位置分佈；讀取該傳輸介面所傳輪之 該測試裝置所偵測之按鍵板之按鍵狀態；依據所設定之顯 不方式及所建立之對應關係顯示所讀取之該按鍵板之按 鍵狀悲，依據所讀取之該按鍵板之按鍵狀態記錄對應於該 按鍵板之測試結果及按鍵板測試之統計結果；顯示所記錄 之對應於該按鍵板之測試結果及按鍵板測試之統計結 、果；以及儲存該所記錄之對應於該按鍵板之測試結果及按 鍵板測試之統計結果，其中，該傳輸介面係為周邊元件介 面（peripheral Component Interface; PCI)及萬用串列 匯流排（Universal Serial Bus; USB)之其中一者 於步驟S30中，設定對應於按鍵狀態之顯示方式，並 建立按鍵板及按鍵之位置分佈與該測試裝置所偵測之按 鍵板及按鍵之實體位置的對應關係。接著進至步驟S31。 於步驟S31中，電性連接該按鍵板與該測試裝置。接 19646 13 1304479 著進至步驟S32。 於步驟S32中，判斷是否開始測試，即測試人員是否 啓動按鍵測試，若是，則進至步驟S33，·若否，則返回該 步驟S 3 2。 於步驟S33中’提供-按鍵測試視窗，卩顯示該按鍵 板及按，之位置分佈’並顯示供測試人員操作之測試按 鍵’如第2Α圖所示。接著進至步驟S34。 於步驟S34中’讀取該傳輸介面所傳輸之該測試裝置 所偵測之按鍵板之按鍵狀態。接著 於步驟咖中，依據所設定之顯示方式及所建立之對 應關係顯示所讀取之各按鍵板之按鍵狀態。於本實施例 中，測試人員依次按下各按鍵板之按鍵，若按鍵正常，測 試裝置能夠偵測到該按鍵被按下，則該按鍵測試視窗中相 應心鍵位置之白色方格即轉換為黑色方格；若按鍵有問 ^測試1置_到該按鍵未被按下，㈣按鍵測試視窗 相應按鍵位置之白色方格保持不變，其可例如第2β圖 所不。接著進至步驟S36。 於步驟S36中’依據所讀取之各按鍵板之按鍵狀態記 錄對應於各按鍵板之測試結果及按鍵板測試之統計結〜° 果。接著進至步驟S37。 β 7步驟S37中，判斷是否顯示檢測結果，即測試人員 疋否按下該按鍵測試視窗中之“檢測結果，，按鍵，若是，則 進至步驟S38 ;若否，則返回至步驟S37。 於步驟S38巾，顯示所記錄之對應於各按鍵板之測試 19646 14 1304479 結果及按鍵板測試之統計結果。對應於第2B圖，本步驟 之顯示所z錄之對應於各按鍵板之測試結果及按鍵板測 試之統計結果係如第2C圖所示，其顯示各按鍵板是否通 過，測試按鍵板的總量，通過量以及失敗量。接著進至步 驟 S39 〇 於步驟S39中，儲存該所記錄之對應於該按鍵板之測 試結果及按鍵板測試之統計結果。於本實施例中，將測試 時間及測試通過的按鍵位置儲存於一檔案中，如第2D圖 所示，以及依據所δ己錄之測試按鍵板的總量及通過量計算 按鍵板測試的良品率並儲存於一檔案中，如第2Ε圖所示。 综前所述，本發明之按鍵測試系統及方法係藉由傳輸 ^面將測試裝置所偵測之各按鍵板之按鍵狀態傳輸至該 資料處理衣置並予以顯示及處理，測試人員能直接讀取按 1之測試結果及統計結果，且由於資料處理裝置之硬體及 車人體資源強大，即無需再使用單晶片機對按鍵測試進行控 •馨制，故能解決習知技術因使用單晶片機控制而導致硬體連 •接電路、軟體測試程式不具有通用性，以及浪費測試時間 之缺點。再者，本發明之按鍵測試系統利用了資料處理裝 置將測4日守間、測試通過的按鍵位置、測試按鍵板的總量 及良品率予以儲存，藉此能使測試人員直接了解不良按鍵 ^具體位置以及測試良品率，俾於測試人員對按鍵板測試 仃追縱管理。另外，利用該資料處理裝置之強大硬體資 二可—次同時測試多個按鍵板並予以記錄，故本發明亦能 適用於按鍵板之大量測試。 19646 15 1304479 上述實施例僅例示性說明本發明之原理及其功效，而 非用於限制本發明。任何熟習此項技藝之人士均可^不遠 背本發明之精神及範疇下，對上述實施例進行修飾與改 、又。因此，本發明之權利保護範圍，應如後述之申請專利 範圍所列。 【圖式簡單說明】 弟1圖係為本發明之按鍵測試系統之基本架構的方 塊示意圖； 第2A至2C圖係為本發明之按鍵測試系統所顯示之按 鍵測試視窗之其中一實施例的示意圖； 第2D至2E圖係為本發明之按鍵測試系統所儲存之測 試結果及統計結果之其中一實施例的示意圖；以及 第3圖係為本發明之按鍵測試方法之流程示意圖。 【主要元件符號說明】 1 按鍵測試系統 10 按鍵板 11 測試裝置 12 傳輸介面 13 資料處理裝置 130 設定模組 131 讀取模組 132 記錄模組 133 顯示模組 134 儲存模組 3 按鍵測試方法 S30〜S38 步驟 16 19646In other embodiments of the present invention, the transmission interface 12 may also be a universal bus (USB). In this embodiment, the transmission interface 12 is a PCI interface switch card having a switch input of a switch, and is used to detect each of the test devices 11 The button state of the keypad is converted to a switch quantity, for example, '丨 indicates that the button is pressed, and 〇 indicates that the button is not pressed. The information processing device 13' is configured to display the state of the button of each of the keypads detected by the test device, and the button state record corresponding to each of the keypads detected by the testing device η corresponds to The test results of each button board and the statistical results of the button board test are displayed. In the present embodiment I,, ', the data processing device 13 is a computer. As shown in FIG. 1, the data processing device 13 includes a setting module 130, a reading module 131, a recording 10 19646 1304479 * module 132, a display module 133, and a storage module 134. - the setting module 13 is configured to set a display mode corresponding to the state of the button, and is used to establish the position distribution of the button board 1 and the button and the entity of the button board 1 and the button detected by the testing device 11 The corresponding position of the position is 'system. Wherein, the setting corresponds to the display mode of the button state, which means that different button states are set corresponding to different display colors, for example, black indicates that the r button is pressed, and white indicates that the button is not pressed. The reading module 131 is configured to read the state of the button of each of the keypads detected by the testing device 11 transmitted by the transmission interface 12. In this embodiment, the tester presses 32 buttons respectively, and the test device is configured to detect the state of the button of the 32 buttons. If there is a problem with the button (such as open circuit, poor button contact, etc.), even if the button is pressed, the test is performed. The status of the button detected by the device 1 is also not pressed. The recording module 132 is configured to record the test result corresponding to the button board and the statistical result of the button board 10 test according to the button state of the keypad 10 read by the reading module 131. In this embodiment, the test result of each button and board 1 means that if the state of the 8 buttons on the 1 button board 1 is 1 (pressed), the button board 1 is recorded. 〇 Pass (Pass); if at least one button on one of the read button boards has a status of 0 (not pressed), the board is recorded as a test failure (Fail). In addition, the statistical results of the record keypad test include recording the total amount of the button (Total) tested, the throughput, and the amount of failure. The display module 133 is configured to provide a button test window for displaying the position distribution of the button board 1 and the button, and the 11 19646 1304479 • recorded by the group I32 corresponds to the button The test results of the board test and the key panel test, and are used to display the read module _(3) according to the setting mode (4)·• the displayed display mode and the corresponding relationship established. The button board is 1〇. As shown in FIG. 2, a button test window is displayed, and the button test window displays the button board (1) board 4# board corresponding to the physical position of each of the keypad 10 and the button detected by the test device u. And the position distribution of the buttons (white squares). Please continue to refer to FIG. 2B, which is based on the display mode set by the setting module 13 and the established correspondence relationship, and displays the knowledge of each of the keypads 1 read by the reading module 131: key sorrow The black square in the figure indicates that the button is pressed, and the white square indicates that the button is not detected. If the tester presses the button to test the detection result from the button, the button test window displays the test corresponding to each button board recorded in the record module 132 in this test...统计 Test the statistical results, and reset the display of the button status to the initial state (white square) to continue the test, as shown in 2c - Lutu, where 1# board, 2# board and 3# board Test failure (Fail), 4# • Board test pass (Pass); please refer to Figure 2B (statistical results of the previous accumulated button board test), the total i of the test button board accumulated after this test (Total ) is 24 (pcs), the pass is 18 (pcs), and the fail (Fail) is 6 (pcs). The storage module 134 is used to store the record recorded by the record module 132. Corresponding to the test result of the keypad 1 and the statistical result of the test of the keypad 10, as shown in Figures 2D and 2E, which is a schematic diagram of one of the test results and statistical results stored in the button test system of the present invention. , the storage 12 19646 1304479 杈 杈 group 134 will pass the test time and test pass The button position is stored in a file, as shown in FIG. 2D. At the same time, the storage module 134 calculates the yield of the button board test according to the total amount and the throughput of the recorded test button board 1 and stores it in a file. As shown in Fig. 2E, see Fig. 3, which is a schematic diagram of the key test method of the present invention through the foregoing key test system of the present invention. As shown in the figure, the key test method 3 of the present invention comprises the following steps: Setting a display mode corresponding to the state of the button, and establishing a correspondence between the position distribution of the button board and the button and the physical position of the button board and the button detected by the testing device; electrically connecting the button board and the testing device; Position distribution of the button board and the button; reading the button state of the button board detected by the test device transmitted by the transmission interface; displaying the read button according to the set display mode and the established correspondence relationship The button shape of the board is sorrowful, and the test result corresponding to the button board and the statistical result of the button board test are recorded according to the state of the button state of the read button board; Recording the statistical result of the test result corresponding to the keypad and the test of the keypad; and storing the recorded statistical result corresponding to the test result of the keypad and the test of the keypad, wherein the transmission interface is One of a peripheral component interface (PCI) and a universal serial bus (USB) in step S30, setting a display mode corresponding to the state of the button, and establishing a position of the button board and the button The correspondence between the physical position of the keypad and the button detected by the testing device is distributed. Then, the process proceeds to step S31. In step S31, the keypad and the testing device are electrically connected. Then, 19646 13 1304479 proceeds to step S32. In step S32, it is judged whether or not the test is started, that is, whether the tester activates the key test, and if so, proceeds to step S33, and if not, returns to step S32. In step S33, the 'press-key test window is displayed, and the position distribution of the button board and the button is displayed, and the test button for the tester's operation is displayed as shown in the second figure. Then it proceeds to step S34. In step S34, the state of the button of the keypad detected by the test device transmitted by the transmission interface is read. Then, in the step coffee, the state of the button of each of the read keypads is displayed according to the set display mode and the established correspondence relationship. In this embodiment, the tester sequentially presses the button of each button board. If the button is normal and the test device can detect that the button is pressed, the white square of the corresponding heart button position in the button test window is converted into Black square; if the button has a question ^ test 1 set _ to the button is not pressed, (4) the white square of the corresponding button position of the button test window remains unchanged, which can be, for example, the second β figure. Then it proceeds to step S36. In step S36, the test result corresponding to each keypad and the statistical result of the keypad test are recorded according to the state of the button of each of the read keypads. Then it proceeds to step S37. In step S37, it is determined whether or not the detection result is displayed, that is, whether the tester presses the "detection result in the key test window, and the button is pressed, and if yes, the process proceeds to step S38; if not, the process returns to step S37. Step S38, displaying the recorded results of the test 19646 14 1304479 corresponding to each of the keypads and the test results of the keypad test. Corresponding to the 2B diagram, the display of the step is recorded corresponding to the test results of the keypads and The statistical result of the keypad test is as shown in FIG. 2C, which shows whether each keypad passes, tests the total amount of the keypad, the throughput, and the amount of failure. Then proceeds to step S39, and in step S39, the record is stored. Corresponding to the test result of the keypad and the statistical result of the keypad test. In this embodiment, the test time and the button position passed by the test are stored in a file, as shown in FIG. 2D, and according to the Calculate the yield of the keyboard test by the total amount and throughput of the test button board and store it in a file, as shown in Figure 2. As described above, the key test system of the present invention And the method transmits the button state of each button board detected by the testing device to the data processing device by the transmission surface, and displays and processes the test button, and the tester can directly read the test result and the statistical result according to 1, and Due to the powerful hardware of the data processing device and the human body resources, it is no longer necessary to use the single-chip machine to control the button test. Therefore, it can solve the conventional technology that the hardware connection and the circuit are caused by the use of the single-chip machine control. The software test program does not have the versatility, and the shortcomings of wasting test time. Moreover, the button test system of the present invention utilizes the data processing device to measure the 4-day custodial, the position of the test pass button, the total amount of the test button board, and the good product. The rate is stored, so that the tester can directly understand the specific position of the defective button and the test yield rate, and the tester can track and manage the key board test. In addition, the powerful hardware of the data processing device can be used - The plurality of keypads are simultaneously tested and recorded, so the invention can also be applied to a large number of tests of the keypads. 19646 15 1304479 The embodiments are merely illustrative of the principles and effects of the invention, and are not intended to limit the invention, and those skilled in the art can modify the above-described embodiments without departing from the spirit and scope of the invention. Therefore, the scope of protection of the present invention should be as listed in the scope of the patent application described later. [Simple Description of the Drawings] The first drawing of the present invention is a block diagram of the basic structure of the key testing system of the present invention; 2C is a schematic diagram of one embodiment of a key test window displayed by the key test system of the present invention; FIGS. 2D to 2E are one embodiment of test results and statistical results stored in the key test system of the present invention; Schematic diagram of the key test method of the present invention. [Key component symbol description] 1 Key test system 10 Key pad 11 Test device 12 Transmission interface 13 Data processing device 130 Setting module 131 Reading mode Group 132 Recording Module 133 Display Module 134 Storage Module 3 Key Test Method S30~S38 Step 16 19646