200817685 九、發明說明： 【發明所屬之技術領域】 本發明係提供一種以上、下合模方式，使壓件更加平整壓抵 電子元件執行測試作業，以有效提升測試品質之測試區之模壓 電子元件測試器。 、 【先前技術】 、在現今，電子元件於生產過程中係歷經多道加工製程，業者 為確保品質，於電子元件製作完成後，均會進行職作業，ς積 體電路integrated circuit，簡稱！ C )之電性測試作業' 该I C係具有幕多接腳，各接腳依設計而使j ^有不同電性， 並於製作完成後，即會進行電性測試，以檢測〗c於製 是否遭受損壞，進而檢測出不良品。 凊參閱第1、2、3®，其係為台灣專利申請第9311〇783沪 一 I c檢測裝置（一）』專利案，該檢測裝置包含有測試台1 第一、二取料機構2 〇、3 〇及入、出料機構4 〇、5 〇， ，該測試台1〇之兩側設有第一、二取料機構2 3 ^ 3 41及橫向滑座2 4 2 且螺合於橫向滑執21、 面設有縱向滑座2 4 3、 面具下壓吸嘴2 51、3 料機構均設有相互組裝之鄉結構及騎結構，各橫移 機架上設有橫向滑軌2 1、3 1及橫向螺桿2 2、3 2，而^ 螺桿2 2、3 2由馬達2 3、3 3驅動，一具以，向 3 4 2之滑動件2 4、3 4，係滑置 3 1及橫向螺桿22、32上，並於另 3 4 3，而升降結構係於一呈L型且底 5 1之取料器25、35侧面設有鄉& 滑軌2 5 2、3 5 2,以滑置於滑動件24、34之縱;=向 2 4 3、3 4 3中，該橫移結構另於取料器2 5、3 有-橫向滑座2 5 3、3 5 3，以滑置於-支架26、、二 向滑軌2 61、3 61上’而升降結構並於該支架2 6 : 另面設有二縱向滑座2 6 2、3 6 2及-螺套26 3、3 200817685 以分別組裝於機架之縱向滑軌2 7、3 7及縱向螺桿2 8、3 8 ^，而縱向螺桿2 8、3 8由一馬達2 9、3 9驅動，進而當各 橫移結構之馬達2 3、3 3驅動橫向螺桿2 2、3 2時，即帶動 滑動件$ 4、3 4之橫向滑座2 4 2、3 4 2及取料器2 5、 3 5之橫向滑座2 5 3、3 5 3，於機架之橫向滑軌21、31 及支架26、36之橫向滑軌26 1、3Θ1上作X方向往復位 移，而當各升降結構之馬達2 9、3 9驅動縱向螺桿2 8、3 8 日^即帶動支架2 6、3 6之縱向滑座2 6 2、2 6 2及取料哭 f = 3 5之縱向滑執2 5 2、3 5 2 ’於機架之縱向滑執2 7 向往指t動件2 4、3 4之縱向滑座2 4 3、3 4 3上作2方 ^移’另該人料機構4 〇及出料機構5 Q係分別設於 Ϊ方’各設有一具載台41、51之载台結構，用 I ? 具有吸嘴4 2、5 2之取放結構，用以取放 上，以係將待測1 c放置於載台4 1 筮一 載达至第取料機構2 0之取料器2 5下方，辞 並i入::以::料器2、5，,_台4 1上吸取I C 了 :試台1 0之;《實接ί於腳與 =另一待測10至測試台10之側方時，第-取料ϋ i再 取料器3 5作X方向位移，人取料哭^/一取科機構3 0之 台41上吸取待測IC ’當第一取料機槿=入料機構4 0之載 :，即，取料器2 5橫向位移 畢 U,取料機構3 〇之取料器3 5作χ，在此同 ;，5上另一待測j c置入於測試 夕，將取料 2 C，使1 [之接腳與測試台！ 0之^2f戦時下屢 ，當第二取料機構3 〇之j c作測試時，、試 200817685 2 2 5即反向位移作動，而再次於入料機構4 0之載 ;、、列气-ί?又一待測1 C ’當第二取料機構3 0之取料器3 5 C放置於出料機構5 Q之载台5 1上送出時，第一 構2 0即可將待測丨c置人於測試台i 〇中進行測試，而 ;、—取料機構2 0、3 0依序迅速载送IC進行測試作 架置於測試台i 〇:兩==以以㈣ 壓I C，進而b影響平度，而無法確保以相同之下壓力下 經驗有ίΐϊ前事相關行業的研發與製作 ?ΐ，終究研以===== 壓件更加平整壓抵電子元件， 2口^方式’使 器，該測試區U有區之模壓式電子元件測試 機構，其“=====料 S壓:ΐ?ί間設有一導移組哪件係由驅動源驅動作ί降 卜口杈方式，令壓件保持較佳之水平度以 200817685 平整堡抵電子元件，使電_ 均確實接觸，以精確 ^^測試座相對應之各接腳與接點 益。 、111業，達到提升測試品質之實用效 供置入電子元件的;以:u巧試器可設置複數個測試座，以 度壓抵各電子元件同牛Μ 杈方式，令壓件保持較佳之水平 效 【實施方式】 實施仏=委明作更進-步之瞭解，兹舉，佳 類機包4有供二明5置，测”分類機使用時，該測試分 輪出端輪送機構9 Q及收料送機構7 0、測試區8 〇、 將供料機構6 〇上待測試之電;輪人端輪送機構7 〇係 載具8 1，測試區8 〇收料姐达至測試區8 〇内之供料 測試結果由輪出端輪送舰qj2上完測之電子元件，則依據 。 __祕構9 0輸送錄料機構丨Q Q分類放置 器8 3 巧包括有模壓式測試 另側之收料_ Q。<之七、科載具8 1、位於測試器8 3 料載呈8 W系^2、弟一移料器84及第二移料器8 5 ;該供 之電ϊ元件i、„之電子元件’收料載具8 2則供承置完測 座8 Ί ? 試11 8 3係設有上、下配合之壓件8 3 1及承 二ίίΐ件8 3 1與承座8 3 2間設有-導移組，該導 :<^孔導柱組或線性滑軌組，而用以輔助帶動壓件 _ 降位移，本實施例之導移組係為一導孔導柱組，該 ί ίΐϊϊίΓ壓件8 31上開設有四個導孔8 311，並於承 相對應壓件8 3 1各導孔8 3 1 1位置設有四套置 κ 3 3之導柱8 3 2 1，該導柱8 3 21可供壓件8 31之 200817685 導孔8 31 1套置’另該壓件8 31夕念么 8 312，而頂面則設有壓桿8 3丄—有壓抵部 動源驅動而帶動壓件8 3 i作升降位移， 測試座8 3 4，該測試座8 3 4係用4 3 5 = 動式第-移料器8 4係用以移載兀件’而擺 至測試器8 3之測試座8 3 4 t以4行ς 之J則電子元件 =8 5則係_座δ 3 4中之“子元件 送mi可【電輸 子元件1 1 0置入於測試座8 3 Hif f 1將待測電 器8 3，並復位至供料載呈8 1處.▲主失 °方疋轉退出測試 ,8 3^8 3 ； π9! ^ ^ 器8 3即以驅動源驅動壓桿8 3丄1 =則$ 刪3 i係以導孔8 3 i工沿承== 玄 子3 1關抵部8 3 1 2壓抵^電 行測試作業，由於壓⑶；^^ =81=而:受限於導柱8 3 2 1 壓抵部 f 測試器8 3之驅動源即驅動壓桿 動’令壓件8 31以導孔8 311 々¥柱8 3 2 1十％、位移设位，而脫離電子元件i ^ 〇，以供取 200817685 • 1請參閲第1 〇圓，於完成測試作 二至測Τ8 3處，而取出測試】8°31;，器8 5係 1 1 H同時’由於輸人端輸送機構已將往私、，之&測電子元 111輸送至供料載具8丄上，該极，核測之電子元件 ―具8 1上取出下—待測之電子元g 4即可於供料裁 f二移料器8 5取出完測之電子元參閱第1 1圖，於 8 5即反向旋轉將電子元件1 H該第二移料器 而收料載具8 2 JL完測之電子元# Ί 收料载具8 2處放置， 端輸送機構輪送至收料機構巧依據檢測結果由輪出 即將下-待測電子同時，該第-移料器8 4 中以供執行測試作聿，並隨即^ =5式裔8 3之測試座8 3 4 至供料载且81? 士ίί向旋轉退出測試器8 3，而復位 件1 1 2輪送至^料載具輸=構則已f待檢測之電子元 载具81上取出下一待測 ^ f料益84則可於供料 作業。 電子70件1 1 2，進而依序執行測試 構之配i圖:該搭配另一種旋轉式移料機 ^ q _,a,,]忒£ 8 0包含有模壓式測試器8 3 S 2，以及具8 1、位於測試器8 3另側之收料載且“ ^笛測試器8 3、供料載具8 1、收料载具者 收料载且8】；：料載具81係承置待測之電子元件， 832間姑iL31及承座832，並於壓件831與承座 2 = ’該導_可為-導孔導柱組或線性滑軌 導ί 8 ί 1 ί 該導孔導柱_於壓件8 3 1上開設有四個 8 3 Ί Ί Μ於承座8 3 2頂面相對應壓件8 3 1各導孔 8 ^ 四套置彈酱8 3 3之導柱8 3 2 1，該導柱 3 1 巧土抵口3 1 2，而頂面則設有壓桿8 3 1 3， 200817685 該壓桿8 7 Ί 〇 3 3==¾ i作升降位移， 8 6 2 C > ^ 862A ♦一移料臂8 6 2 b、第：銘社辟 、測試器 請參閲笛η二移戰待/完測電子元件。 ，送機構可將待測:電測試作業時’該輪入端 6 2 A、第二移料臂8 6 2 b、楚二 "^動第一移 8 6 2 O^kml 2ΐ^ 5具8 1上將待測二^ 移料臂8 6 2 Α由供料 !J；：^1 1 〇^U8f^ 移枓臂8 6 2 B則位於供料載且以中二f測試’同時該第二 ^移料臂8 6 2 A將電子^ ^參閱第1 5圖，於第 弟二移料器8 6之μ動、π#〇置入於測試座8 3 4中德， 料臂8 6 2==;=向旋轉，=第 6 2D^^ 6 2 c ，心8 3 ’而位移至 二二糾臂8 6 2a退 二料==2端輪送機構已將待檢===巧=試作 ^器8 6亦可採取不同移料作Bn然本發明之第 I 〇iA^i8 3 4 ； *；f ^ 17圖’於測試器8 3之測物Πΐί!待=¾、 200817685 ^ 0,該測試器8 3即以驅動源驅動壓桿8 3 i 3 ^ 1 ^下位移，碰件8 3 i係以導孔8 3 11沿承^ ，=柱8 3 21位移，並下壓彈簧8 3 3，使壓件 j 3 1 2驗於電子元件U 〇之接聊上，使電子 ， β Q f f 中執抑风作業，由於塵件8 3 1係利用導孔 /口 J座8 3 2之導柱8 3 21位移，而可受限於各導 平Π而並口會產生偏斜情況’使壓件8 3 1可獲得較=水 抵各電子元件ui ϊ: 業，以提升測試於測;:章同條件下進行測試作 以導孔8 3 1 1沪導1反向作動’令壓件8 3 1 y 0，以縣料；請參 電子元件 8 6 2 A、88 66 6 1再帶動各第一移料臂 =8 6 2娜反向 ;^第四移 測試器8 3中，以取出完測之電子^ =臂=2 A旋轉至 ?巧以測臂 子元件1 1〇後，該第：料写$料孑8 6 2A取出完測之電 f料臂8 6 2 a、第二;料以g轉$ 6 1，續帶動第一 第四移料臂8 6 2D同步旋轉作動，a f二移料臂8 6 2 c、 收料機構分類放置， ^ 剩結果由輪出端輸送機構輪送至 請參閱第2 0、2 1 isi，而依序執打測試作業。 構之配置圖，該測試區“ 配又—種直進式移料機 匕3有杈壓式測試器8 3、一穿越測 測之電子元件11 〇移载至3料軌2 7移料臂8 6 2趙完 完測之電子元件1 =載八8 2上，而收料載具8 2上 *…， ，_絲由細端輸職構輸送至 、„,问時’ s亥第二移料臂8 6 2 B係將牿泪崎工 200817685 器8 7，該第四移料器8 7上 元件，而測試器1?係=j子 :丄㈡:? i與承座8 3 2間設有-導移組，該導 ^#8 3 i±m^MiTsT^9 相對應壓件8 3 1各導;^q q 11並於承座8 3 2頂面 ，321，該導以;二 ^i；{f 3 1 3 !it!：'fWrW8 3 1 ^ 而承座8 3 2上則2細寺測之電子元件， 言，其；向is:s之‘ 動_動作橫向直進式移載供料載具8 i及^上之^電 輪送電J 00=J作業時，該輸入端 7係同步直進式移二：4=ί200817685 IX. Description of the Invention: [Technical Field] The present invention provides a molding electronic component in a test area which is improved in the test area by which the pressing member is flattened and pressed against the electronic component to perform a test operation. Tester. [Prior Art] In today's production, electronic components are subjected to multiple processing processes in the production process. In order to ensure quality, after the electronic components are manufactured, they will perform homework operations, and the integrated circuit is referred to as the integrated circuit. C) Electrical test operation 'The IC system has multiple screen pins, each pin is designed to make j ^ different electrical properties, and after the production is completed, it will be electrically tested to test the system. Whether it is damaged or not, and then the defective product is detected.凊 Refer to No. 1, 2, and 3®, which is the patent application of Taiwan Patent Application No. 9311〇783 Shanghai Ic Detection Device (1), which includes the test station 1 first and second reclaiming mechanism 2 〇 , 3 〇 and the inlet and outlet mechanisms 4 〇, 5 〇, the first and second reclaiming mechanisms 2 3 ^ 3 41 and the transverse slides 2 4 2 are provided on both sides of the test rig and screwed into the lateral direction Sliding handle 21, surface is provided with longitudinal sliding seat 2 4 3, mask pressing nozzle 2 51, 3 material mechanism are provided with mutual assembly structure and riding structure, and horizontal sliding rails are provided on each traverse frame 2 1 , 3 1 and the transverse screw 2 2, 3 2, and ^ the screw 2 2, 3 2 is driven by the motor 2 3, 3 3 , one to the sliding member 2 4, 3 4 of the 3 4 2, sliding 3 1 and the transverse screws 22, 32, and in the other 3 4 3, and the lifting structure is attached to the side of the retractors 25, 35 of the L-shaped and bottom 5 1 with the township & slide rails 2 5 2, 3 5 2, in the longitudinal direction of the sliding members 24, 34; = in the direction of 2 4 3, 3 4 3, the traverse structure and the reclaimer 2 5, 3 have - the lateral slide 2 5 3, 3 5 3 , sliding on the bracket 26, the two-way rails 2 61, 3 61 ' while lifting the structure and the bracket 2 6 : On the other hand, there are two longitudinal slides 2 6 2, 3 6 2 and - screw sleeves 26 3, 3 200817685 to be assembled on the longitudinal rails 2 7 and 3 7 of the frame and the longitudinal screws 28, 3 8 ^, respectively. The longitudinal screws 28, 38 are driven by a motor 29, 39, and when the motors 2 3, 3 3 of the traverse structure drive the transverse screws 2 2, 3 2, the sliders 4 4, 3 4 are driven. The lateral slide 2 4 2, 3 4 2 and the reclaimer 2 5, 3 5 of the lateral slide 2 5 3, 3 5 3, the lateral slide rails 21, 31 of the frame and the brackets 26, 36 laterally slide The rails 26 1 and 3Θ1 are reciprocally displaced in the X direction, and when the motors 2 9 and 39 of the lifting structures drive the longitudinal screws 28, 38, the longitudinal slides of the brackets 26, 36 are driven. 2 6 2 and reclaiming crying f = 3 5 longitudinal sliding 2 5 2, 3 5 2 'longitudinal sliding in the frame 2 7 pointing to t moving parts 2 4, 3 4 longitudinal sliding 2 4 3, 3 4 3, 2, 2, 2, and 2, and the other 4, and the discharge mechanism, 5, Q, respectively, are located in the square, each with a loading platform 41, 51, with I? 4 2, 5 2 pick and place structure, used for pick and place, to put the 1 c to be tested on the stage 4 1 筮 one to reach the Feeder 2 0 Reclaimer 2 5 below, resign and enter:::: 2, 5,, _ table 4 1 pick up IC: test bench 10; "actually connected to the foot and = When another 10 is to be tested to the side of the test bench 10, the first pick-up ϋ i and the reclaimer 3 5 are displaced in the X direction, and the person picks up the material and cries it. Test IC 'When the first reclaimer 槿 = loading mechanism 40:, that is, the retractor 2 5 lateral displacement is completed U, the reclaiming mechanism 3 取 reclaimer 3 5 as χ, here same; On the 5th, another jc to be tested is placed on the test eve, and 2 C will be taken to make 1 [the pin and the test bench! 0^^ff often, when the second reclaiming mechanism 3 〇jc is tested, the test 200817685 2 2 5 is the reverse displacement actuation, and again the loading mechanism 40; ί? Another test to be tested 1 C 'When the reclaimer 3 5 C of the second reclaiming mechanism 30 is placed on the stage 5 1 of the discharge mechanism 5 Q, the first configuration 20 will be tested丨c is placed in the test bench i 进行 for testing, and; - the reclaiming mechanism 2 0, 30 0 sequentially carries the IC for testing and placed on the test bench i 〇: two == to (four) pressure IC And b affects the flatness, but can't ensure that the experience under the same pressure is related to the development and production of the relevant industries. ΐ, after all, the test is ===== The pressure piece is flattened against the electronic components, 2 ^ In the mode of the actuator, the test area U has a molded electronic component testing mechanism, and its "===== material S pressure: ΐ? ί has a guiding group which is driven by the driving source. The mouth-and-mouth method keeps the pressure parts at a good level to the electronic components with 200817685, so that the electricity _ is indeed in contact, so as to accurately control the corresponding pins and contacts of the test socket. To put the practical effects of the test quality into the electronic components; to: u test the tester to set a plurality of test sockets, to pressure the electronic components to the same way as the burdock, so that the pressure parts maintain a better level of effect [implementation] Ways] Implementation 仏 = Commissioning to make more progress - step by step, here, good class machine package 4 for two Ming 5 set, test "classifier use, the test wheel end of the wheel transfer mechanism 9 Q and close Feeding mechanism 70, test area 8 〇, feeding mechanism 6 to the electricity to be tested; wheel end wheeling mechanism 7 〇 series vehicle 8 1, test area 8 〇 receiving material reaches the test area 8 〇 The internal feeding test result is based on the electronic components that are tested on the wheel and the ship's qj2. __秘秘9 0 conveyance recording mechanism 丨Q Q classification placer 8 3 Including the embossed test The other side of the receipt _ Q. <7, Section Carrier 8 1 , located in the tester 8 3 material loading 8 W system ^ 2, brother a shifter 84 and second feeder 8 5; the electric component i, „ The electronic component 'receiving carrier 8 2 is for the test stand 8 Ί ? Test 11 8 3 is equipped with upper and lower fittings 8 3 1 and bearing 2 ίίΐ 8 3 1 and bearing 8 3 2 Between the set-guide group, the guide: < ^ hole guide column group or linear slide group, and used to assist the driving of the pressing member _ lowering the displacement, the guiding group of the embodiment is a guiding hole guiding column group The ίίίί pressure piece 8 31 is provided with four guide holes 8 311, and four sets of κ 3 3 guide columns 8 3 2 are arranged at the positions of the corresponding guide holes 8 3 1 1 of the corresponding pressing members 8 3 1 . 1, the guide post 8 3 21 can be used for the presser 8 31 of the 200817685 guide hole 8 31 1 set 'the other press piece 8 31 念念 8 312, while the top surface is provided with a pressure bar 8 3 丄 - pressure Driven by the source and driven by the pressing member 8 3 i for lifting and lowering, the test seat 8 3 4, the test seat 8 3 4 is used for 4 3 5 = dynamic type first shifter 8 4 for transferring the piece 'And the test seat of the tester 8 3 8 3 4 t with 4 lines J J is electronic components = 8 5 is the _ seat δ 3 4 in the "sub-component Mi can [electrical input component 1 1 0 placed in the test socket 8 3 Hif f 1 will be tested electrical equipment 8 3, and reset to the feeding load in 8 1 . ▲ main lost ° square turn to exit test, 8 3 ^8 3 ; π9! ^ ^ 8 8 is to drive the pressure bar 8 3丄1 = then $ delete 3 i to guide hole 8 3 i work along the bearing == mysterious 3 1 off the 8 3 1 2 Pressing ^ electric line test operation, due to pressure (3); ^^ = 81 =: limited by the guide post 8 3 2 1 pressing part f tester 8 3 driving source that is driving the pressing rod to move the 'pressing piece 8 31 Take the guide hole 8 311 々 ¥ column 8 3 2 1 ten%, the displacement is set, and it is separated from the electronic component i ^ 〇 for the supply of 200817685 • 1 Please refer to the 1st round, after completing the test 2 to test 8 3 At the same time, the test is taken out 8°31; the device 8 5 is 1 1 H at the same time 'because the input end transport mechanism has transported the private electronic unit 111 to the feeding carrier 8丄, Extremely, the electronic component of the nuclear test - with the 8 1 removed - the electronic component g 4 to be tested can be used to supply the material to the second shifter 8 5 to take out the measured electronic element. See Figure 1 1 at 8 5 That is, the reverse rotation of the electronic component 1 H the second shifter and the receiving carrier 8 2 JL completed the electronic element #收 The receiving vehicle is placed at 8 2, and the end conveying mechanism is rotated to the receiving mechanism. According to the detection result, the first-to-be-tested electron is taken out at the same time, and the first-feeder 8 4 is used for performing the test. And immediately ^ = 5 type 8 8 test seat 8 3 4 to the feed and 81? ίί to the test exit 8 3, and the reset 1 1 2 to the material carrier = structure has been f The electronic component carrier 81 to be tested is taken out and the next to be tested is used to supply the material. 70 pieces of electrons 1 1 2, and then execute the test configuration in sequence: the other type of rotary type shifting machine ^ q _, a,,] 8 £ 8 0 contains a molded tester 8 3 S 2, And the receiving load on the other side of the tester 8 3 and "the flute tester 8 3, the supply carrier 8 1 , the receiving vehicle receiving load and 8];: the material carrier 81 series The electronic components to be tested, 832 ai31 and socket 832, and the pressure piece 831 and the socket 2 = 'the guide _ can be - guide hole guide column or linear slide guide ί 8 ί 1 ί Guide hole guide post _ on the pressing member 8 3 1 open four 8 3 Ί Μ Μ on the seat 8 3 2 top surface corresponding pressure member 8 3 1 each guide hole 8 ^ four sets of bomb paste 8 3 3 guide Column 8 3 2 1, the guide post 3 1 is the earth to the mouth 3 1 2, and the top surface is provided with the pressure bar 8 3 1 3, 200817685 the pressure bar 8 7 Ί 〇 3 3 == 3⁄4 i for the lifting displacement, 8 6 2 C > ^ 862A ♦ A transfer arm 8 6 2 b, No.: Mingshe, tester, please refer to the whistle two to move / to complete the test electronic components., the sending mechanism can be tested: electricity During the test operation, the wheel end 6 2 A, the second moving arm 8 6 2 b, the Chu 2 "^ move the first move 8 6 2 O^kml 2ΐ^ 5 with 8 1 The two moving arm to be tested 8 6 2 Α is supplied by the feed! J;: ^1 1 〇 ^ U8f^ The moving arm 8 6 2 B is located in the feeding load and is tested in the middle two f ' at the same time the second ^ The transfer arm 8 6 2 A will refer to the image of Fig. 15 and the second shifter of the second shifter 8 6 and the π#〇 will be placed in the test seat 8 3 4, the material arm 8 6 2 = =;=direction rotation,=6th 2D^^ 6 2 c , heart 8 3 'and displacement to the second and second correction arm 8 6 2a returning the second == 2 end of the wheeling mechanism has been checked === Qiao = trial The device 8 6 can also take different materials for Bn. However, the first I 〇iA^i8 3 4 of the present invention; *;f ^ 17 picture 'measured in the tester 8 3 待ί! to be =3⁄4, 200817685 ^ 0, The tester 8 3 is displaced by the driving source driving lever 8 3 i 3 ^ 1 ^, and the driving member 8 3 i is displaced along the bearing hole 8 3 11 along the bearing, = column 8 3 21, and the spring 8 is depressed. 3 3, the pressure piece j 3 1 2 is checked on the electronic component U 接 接 , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , The guide post 8 3 21 displacement, but can be limited by each guide Π and the parallel port will produce a skewing situation 'the pressure piece 8 3 1 can be obtained = water to the electronic components ui ϊ: industry, to improve the test In the test;: Test under the same conditions as the guide hole 8 3 1 1 Shanghai guide 1 reverse action 'Let the pressure piece 8 3 1 y 0, to the county material; please refer to the electronic components 8 6 2 A, 88 66 6 1 then drive each of the first moving arms = 8 6 2 Na reverse; ^ 4th shift tester 8 3, to take out the measured electrons ^ = arm = 2 A to rotate to the arm component 1 1 After the ,, the first: write $ 孑 8 6 2A take out the measured electric f arm 8 6 2 a, second; feed g to $ 6 1, continue to drive the first fourth moving arm 8 6 2D Simultaneous rotary operation, af two transfer arm 8 6 2 c, the receiving mechanism is placed in the category, ^ The remaining result is transferred by the wheel-out conveying mechanism to please refer to the 2nd 0, 2 1 isi, and the test operation is carried out in sequence. Configuration diagram, the test area "with a straight-through type of feeder 匕3 has a pressure tester 8 3, a cross-test electronic component 11 〇 transfer to 3 track 2 7 transfer arm 8 6 2 Zhao finished the electronic component 1 = 8 8 2, and the receiving vehicle 8 2 on *..., , _ wire is transported to the lower end of the body, „, ask when the second move The arm 8 6 2 B will be 牿 崎 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 There is a set-guide group, the guide ^8 3 i±m^MiTsT^9 corresponds to the pressure piece 8 3 1 each guide; ^qq 11 and the top of the seat 8 3 2, 321, the guide; ^i;{f 3 1 3 !it!:'fWrW8 3 1 ^ and the seat 8 3 2 is the electronic component of the 2 寺 Temple, saying, to the is: s 'movement _ action lateral straight move When the load carrier 8 i and ^ are powered by the electric wheel J 00=J, the input 7 is synchronously moved in two: 4=ί
J 8 1 A ii〇~:^3r#83iB~ 13 200817685 試器8 3，而位於出料位置，❿第一供料載具81A上完測之. 1 ^依ίί測結果由輸出端輸送機構輸送至收料機構 置叫’该弟二供料載具8工Β係將待測電子 ^移載至測試H 8 3中’進而依序執行測試作業。 據此’本發明不僅可易於製作及降低製了 測試作業品質，實為一深具實用性及進步性之ίΠ升 =品及刊物公開，從而允符發明專财請要件，'爰依法g 【圖式簡單說明】 第1圖==93_號『Ic檢測裝置(二)』專 :2圖::;為案==^ 第3圖·係為台灣專利申請第9311_號『！ 卜 利案第二取料機構之示意圖。 ’、衣（一）』專 第5圖 第6圖 第7圖 第8圖 第4圖：^發明配置於測試分類機之配置示意圖。 本發明配置於測試區之架構圖。 本發明模壓式測試器之示意圖。 本發明測試電子元件之動作示意圖（。 第qpi 試電子元件之動作示意圖（二）。 第1 1圖 第1 2圖 第1 3圖 第1 4圖 第1 5圖 第1 6圖 第1 7圖 ίΓΓί電子元件之動作示意H 气明測試電子元件之動作示意® (五）。 本务明另一實施例之架構圖。 實施例模壓式測試器之示意圖。 元：之動作示意圖㈠。 本發明另-;二)。 本發明另-實施例測試電子元件之動作；((:))： 14 200817685 ί ； ο8： ：) ，2 0圖：本發明又一實施例之架構圖。 ’、心圖0、） ==^發明又-實施例模壓式測試器之示意圖。 月又—ΐ施例測試電子元件之動作示意圖（一） 【主要元件符號說明】 千之勤作不思圖（一> 習式部份： 1 0 :測試台 2 0 :第一取料機構 21:橫向滑軌 2 2 :橫向螺桿 2 3 :馬達 2 4 :滑動件 2 4 1 :螺套 2 4 2 ·橫向滑座 2 4 3 :縱向滑座 2 5 ·取料器 2 51 :下壓吸嘴 2 5 2 ·縱向滑軌 2 5 3 ·橫向滑座 2 6 :支架 2 61 :橫向滑執 2 6 2 :縱向滑座 2 6 3 :螺套 2 7 ·縱向滑執 2 8 :縱向螺桿 2 9 :馬達 d◦•弟—取料機構 31·橫向滑執 3 2 :橫向螺桿 3 3 '•馬達 3 4 :滑動件 3 4 1 :螺套 3 4 2 :橫向滑座 3 4 3 :縱向滑座 3 5 :取料器 3 51 :下壓吸嘴 3 5 2 :縱向滑轨 3 5 3 ·橫向滑座 3 6 :支架 3 61 ·橫向滑軌 3 6 2 :縱向滑座 3 6 3 :螺套 3 7 ·縱向滑執 3 8 :縱向螺桿 3 9 :馬達 4 0 :入料機構 4 1 :載台 4 2 :吸嘴 5 0 :出料機構 5 1 :載台 5 2 :吸嘴 15 200817685 本發明部份： 6 0 8 0 8 1 8 3 8 3 1 供料機構 檢測區 供料載具 測試器 1 :導孔 7 0 :輸入端輸送機構 8 2 8 3 8 3 8 3 8 3 8 3 8 5 86 :收料載具 1 :壓件 1 2 :壓抵部 2 :承座 3 :彈簧 5 :電路板 :第二移料器 1 :轉桿 8 313 :壓桿 8 3 2 1 :導柱 8 3 4 :測試座 8 4 :第一移料器 8 6 :第三移料器 8 6 2A :第一移料臂 8 6 2 B :第二移料臂 8 6 2 C :第三移料臂 8 6 2D :第四移料臂 8 7 :第四移料器 81 A :第一供料載具 81B:第二供料載具 9 0 :輸出端輸送機構 10 0 :收料機構 1 10 :電子元件 1 1 2 :電子元件 111:電子元件 16J 8 1 A ii〇~:^3r#83iB~ 13 200817685 Tester 8 3, and located at the discharge position, the first feed carrier 81A is tested. 1 ^According to the result of the output delivery mechanism The delivery to the receiving mechanism is called 'the second two feeding vehicles 8 workers transfer the electrons to be tested ^ to the test H 8 3' and then perform the test operation in sequence. According to this, the invention can not only be easy to manufacture and reduce the quality of the test operation, but is also practical and progressive. The product and the publication are open to the public, so that the invention of the special wealth is required. Brief description of the schema] Figure 1 == 93_ No. "Ic detection device (2)": 2::; for the case ==^ Figure 3 is the Taiwan patent application No. 9311_"! Schematic diagram of the second reclaiming mechanism in the case. ‘,衣(一)』Special 5th Figure 6th Figure 7th Figure 8th Figure 4: The schematic diagram of the configuration of the invention in the test classification machine. The architecture of the present invention is configured in a test area. A schematic view of a molded tester of the present invention. Schematic diagram of the operation of the test electronic component of the present invention (Fig. 1 1 Fig. 1 2 Fig. 1 3 Fig. 1 4 Fig. 1 5 Fig. 1 6 Fig. 1 7 Fig. ΓΓ 动作 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 动作 动作 动作 动作 动作 动作 动作 动作 动作 动作 动作 动作 动作 动作 动作 动作 动作 动作 动作 动作-;two). The operation of the electronic component is tested by another embodiment of the present invention; ((:)): 14 200817685 ί ; ο8: :) , 20 0: an architectural diagram of still another embodiment of the present invention. ', heart map 0,) ==^ invention again - the schematic diagram of the embodiment of the molded tester. Month - ΐ Example of the action of testing electronic components (1) [Key component symbol description] Thousands of hard work does not think (a) Part: 1 0: Test bench 2 0: First reclaiming mechanism 21: transverse rail 2 2 : transverse screw 2 3 : motor 2 4 : slide 2 4 1 : screw sleeve 2 4 2 · transverse slide 2 4 3 : longitudinal slide 2 5 · retractor 2 51 : press down Nozzle 2 5 2 · Longitudinal slide 2 5 3 · Lateral slide 2 6 : Bracket 2 61 : Horizontal slide 2 6 2 : Longitudinal slide 2 6 3 : Screw sleeve 2 7 · Longitudinal slide 2 8 : Longitudinal screw 2 9 : Motor d◦• brother—Retracting mechanism 31·Transverse sliding 3 2 : Transverse screw 3 3 '•Motor 3 4 : Slide 3 4 1 : Screw sleeve 3 4 2 : Lateral slide 3 4 3 : Longitudinal Slide 3 5 : Reclaimer 3 51 : Lower suction nozzle 3 5 2 : Longitudinal slide 3 5 3 · Lateral slide 3 6 : Bracket 3 61 · Lateral slide 3 6 2 : Longitudinal slide 3 6 3 : Screw sleeve 3 7 · Longitudinal slip 3 8 : Longitudinal screw 3 9 : Motor 4 0 : Feeding mechanism 4 1 : Carrier 4 2 : Nozzle 5 0 : Discharge mechanism 5 1 : Carrier 5 2 : Nozzle 15 200817685 Part of the invention: 6 0 8 0 8 1 8 3 8 3 1 Feeding Structure detection zone feeding vehicle tester 1: pilot hole 7 0 : input end conveying mechanism 8 2 8 3 8 3 8 3 8 3 8 3 8 5 86 : receiving carrier 1 : pressing member 1 2 : pressing portion 2: Seat 3: Spring 5: Circuit board: Second shifter 1: Rotary rod 8 313: Pressing rod 8 3 2 1 : Guide post 8 3 4 : Test stand 8 4 : First shifter 8 6 : The third shifter 8 6 2A: the first transfer arm 8 6 2 B : the second transfer arm 8 6 2 C : the third transfer arm 8 6 2D : the fourth transfer arm 8 7 : the fourth transfer material 81 A: first supply carrier 81B: second supply carrier 90: output delivery mechanism 10 0: receiving mechanism 1 10: electronic component 1 1 2 : electronic component 111: electronic component 16