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TW200601401A - Dut interface of semiconductor test apparatus - Google Patents

Dut interface of semiconductor test apparatus

Info

Publication number
TW200601401A
TW200601401A TW094112844A TW94112844A TW200601401A TW 200601401 A TW200601401 A TW 200601401A TW 094112844 A TW094112844 A TW 094112844A TW 94112844 A TW94112844 A TW 94112844A TW 200601401 A TW200601401 A TW 200601401A
Authority
TW
Taiwan
Prior art keywords
test apparatus
semiconductor test
dut
interface
board
Prior art date
Application number
TW094112844A
Other languages
English (en)
Other versions
TWI299179B (en
Inventor
Mitsutada Hanajima
Original Assignee
Yokogawa Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Electric Corp filed Critical Yokogawa Electric Corp
Publication of TW200601401A publication Critical patent/TW200601401A/zh
Application granted granted Critical
Publication of TWI299179B publication Critical patent/TWI299179B/zh

Links

Classifications

    • A—HUMAN NECESSITIES
    • A63—SPORTS; GAMES; AMUSEMENTS
    • A63B—APPARATUS FOR PHYSICAL TRAINING, GYMNASTICS, SWIMMING, CLIMBING, OR FENCING; BALL GAMES; TRAINING EQUIPMENT
    • A63B19/00—Hoop exercising apparatus

Landscapes

  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Physical Education & Sports Medicine (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
TW094112844A 2004-05-07 2005-04-22 Dut interface of semiconductor test apparatus TWI299179B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004138025A JP2005321238A (ja) 2004-05-07 2004-05-07 半導体試験装置のｄｕｔインターフェース

Publications (2)

Publication Number Publication Date
TW200601401A true TW200601401A (en) 2006-01-01
TWI299179B TWI299179B (en) 2008-07-21

Family

ID=35468648

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094112844A TWI299179B (en) 2004-05-07 2005-04-22 Dut interface of semiconductor test apparatus

Country Status (3)

Country Link
JP (1) JP2005321238A (zh)
KR (1) KR100636303B1 (zh)
TW (1) TWI299179B (zh)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007322372A (ja) * 2006-06-05 2007-12-13 Yokogawa Electric Corp Ｉｃテスタ
JP4972386B2 (ja) * 2006-12-04 2012-07-11 株式会社アドバンテスト 試験装置および測定装置
JP4962794B2 (ja) * 2008-02-18 2012-06-27 横河電機株式会社 コネクタ装置および半導体試験システム
JP5351071B2 (ja) 2009-02-24 2013-11-27 株式会社アドバンテスト テスト部ユニット、テストヘッドおよび電子部品試験装置
JP2011242339A (ja) * 2010-05-20 2011-12-01 Advantest Corp テストヘッド、試験ボードおよび試験装置
JP7170494B2 (ja) * 2018-10-15 2022-11-14 東京エレクトロン株式会社 中間接続部材及び検査装置
KR102902641B1 (ko) * 2021-08-11 2025-12-23 삼성전자주식회사 이미지 센서를 테스트하기 인터페이스 보드, 그것을 갖는 테스트 시스템, 및 그것의 동작 방법
CN115754556B (zh) * 2022-11-25 2024-01-05 温州众彩汽车零部件有限公司 一种多触手的车辆面板老化变形率检测设备

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6437586B1 (en) 1997-11-03 2002-08-20 Micron Technology, Inc. Load board socket adapter and interface method
JP2001074816A (ja) 1999-09-09 2001-03-23 Advantest Corp 半導体試験装置

Also Published As

Publication number Publication date
TWI299179B (en) 2008-07-21
KR20060045879A (ko) 2006-05-17
JP2005321238A (ja) 2005-11-17
KR100636303B1 (ko) 2006-10-18

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees