KR900700556A - 실리콘 웨이퍼 연마용 화합물 - Google Patents
실리콘 웨이퍼 연마용 화합물Info
- Publication number
- KR900700556A KR900700556A KR1019890701994A KR890701994A KR900700556A KR 900700556 A KR900700556 A KR 900700556A KR 1019890701994 A KR1019890701994 A KR 1019890701994A KR 890701994 A KR890701994 A KR 890701994A KR 900700556 A KR900700556 A KR 900700556A
- Authority
- KR
- South Korea
- Prior art keywords
- silicon wafer
- wafer polishing
- polishing compound
- compound
- silicon
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
-
- H10P52/402—
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1409—Abrasive particles per se
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Silicon Compounds (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP135451 | 1988-06-03 | ||
| JP13545188 | 1988-06-03 | ||
| JP69881 | 1989-03-22 | ||
| JP6988189 | 1989-03-22 | ||
| PCT/JP1989/000558 WO1989012082A1 (fr) | 1988-06-03 | 1989-06-02 | Substance abrasive pour tranches de silicium |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR900700556A true KR900700556A (ko) | 1990-08-16 |
| KR930002764B1 KR930002764B1 (ko) | 1993-04-10 |
Family
ID=26411060
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019890701994A Expired - Lifetime KR930002764B1 (ko) | 1988-06-03 | 1989-06-02 | 실리콘 웨이퍼 연마용 화합물 |
Country Status (4)
| Country | Link |
|---|---|
| EP (1) | EP0371147B1 (ko) |
| JP (1) | JP2782692B2 (ko) |
| KR (1) | KR930002764B1 (ko) |
| WO (1) | WO1989012082A1 (ko) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20030013146A (ko) * | 2001-08-07 | 2003-02-14 | 에이스하이텍 주식회사 | 실리콘 웨이퍼 연마제 조성물과 그 제조방법 |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2862073B2 (ja) * | 1995-12-08 | 1999-02-24 | 日本電気株式会社 | ウェハー研磨方法 |
| US6646348B1 (en) * | 2000-07-05 | 2003-11-11 | Cabot Microelectronics Corporation | Silane containing polishing composition for CMP |
| WO2003038883A1 (en) | 2001-10-31 | 2003-05-08 | Hitachi Chemical Co., Ltd. | Polishing fluid and polishing method |
| DE10164262A1 (de) * | 2001-12-27 | 2003-07-17 | Bayer Ag | Zusammensetzung für das chemisch-mechanische Polieren von Metall- und Metall/Dielektrikastrukturen |
| JP2003277731A (ja) * | 2002-03-26 | 2003-10-02 | Catalysts & Chem Ind Co Ltd | 研磨用粒子および研磨材 |
| JP4554142B2 (ja) * | 2002-04-30 | 2010-09-29 | 日揮触媒化成株式会社 | 基板洗浄用粒子および該基板洗浄用粒子を含む洗浄材、基材の洗浄方法 |
| US8202502B2 (en) | 2006-09-15 | 2012-06-19 | Cabot Corporation | Method of preparing hydrophobic silica |
| US20080070146A1 (en) | 2006-09-15 | 2008-03-20 | Cabot Corporation | Hydrophobic-treated metal oxide |
| US8455165B2 (en) | 2006-09-15 | 2013-06-04 | Cabot Corporation | Cyclic-treated metal oxide |
| US8435474B2 (en) | 2006-09-15 | 2013-05-07 | Cabot Corporation | Surface-treated metal oxide particles |
| JP2008288398A (ja) | 2007-05-18 | 2008-11-27 | Nippon Chem Ind Co Ltd | 半導体ウェハーの研磨用組成物、その製造方法、及び研磨加工方法 |
| CN101338082A (zh) * | 2007-07-06 | 2009-01-07 | 安集微电子(上海)有限公司 | 改性二氧化硅溶胶及其制备方法和应用 |
| JP5385619B2 (ja) * | 2009-01-15 | 2014-01-08 | 株式会社アドマテックス | 研磨用組成物、研磨用部材、及び研磨方法 |
| CN104371552B (zh) * | 2013-08-14 | 2017-09-15 | 安集微电子(上海)有限公司 | 含硅有机化合物在延长化学机械抛光液中研磨颗粒稳定性中的应用 |
| CN104371553B (zh) * | 2013-08-14 | 2017-10-13 | 安集微电子(上海)有限公司 | 一种化学机械抛光液以及应用 |
| CN104371550B (zh) * | 2013-08-14 | 2018-02-09 | 安集微电子(上海)有限公司 | 一种用于抛光硅材料的化学机械抛光液 |
| WO2020092789A1 (en) | 2018-10-31 | 2020-05-07 | Kvh Industries, Inc. | Method and apparatus for control and suppression of stray light in a photonic integrated circuit |
| US12352571B2 (en) | 2021-08-11 | 2025-07-08 | Emcore Corporation | In-situ residual intensity noise measurement method and system |
| WO2023211518A2 (en) | 2021-11-30 | 2023-11-02 | Emcore Corporation | Multi-axis fiber optic gyroscope photonic integrated circuit for inertial measurement units and inertial navigation systems |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3170273A (en) * | 1963-01-10 | 1965-02-23 | Monsanto Co | Process for polishing semiconductor materials |
| US3485608A (en) * | 1968-01-02 | 1969-12-23 | Texas Instruments Inc | Slurry for polishing silicon slices |
| US4260396A (en) * | 1978-01-16 | 1981-04-07 | W. R. Grace & Co. | Compositions for polishing silicon and germanium |
| JP3146395B2 (ja) * | 1993-01-29 | 2001-03-12 | ローム株式会社 | 液晶セルの位置決め装置 |
-
1989
- 1989-06-02 EP EP89906447A patent/EP0371147B1/en not_active Expired - Lifetime
- 1989-06-02 JP JP1506188A patent/JP2782692B2/ja not_active Expired - Fee Related
- 1989-06-02 KR KR1019890701994A patent/KR930002764B1/ko not_active Expired - Lifetime
- 1989-06-02 WO PCT/JP1989/000558 patent/WO1989012082A1/ja not_active Ceased
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20030013146A (ko) * | 2001-08-07 | 2003-02-14 | 에이스하이텍 주식회사 | 실리콘 웨이퍼 연마제 조성물과 그 제조방법 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP0371147B1 (en) | 1993-05-19 |
| EP0371147A4 (en) | 1990-09-19 |
| JP2782692B2 (ja) | 1998-08-06 |
| EP0371147A1 (en) | 1990-06-06 |
| WO1989012082A1 (fr) | 1989-12-14 |
| KR930002764B1 (ko) | 1993-04-10 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR900009918A (ko) | 웨이퍼 파인 연마용 조성물 | |
| KR900700556A (ko) | 실리콘 웨이퍼 연마용 화합물 | |
| DE68927116D1 (de) | Poliermasse | |
| DE69024681D1 (de) | Schleifeinrichtung für Halbleiterplättchen | |
| KR900008635A (ko) | 반도체 웨이퍼의 흐림 방지장치 | |
| DE69127314D1 (de) | Diamant-Halbleiteranordnung | |
| DE68927295D1 (de) | Kunstharzversiegeltes halbleiterbauelement | |
| DE69405342D1 (de) | Poliervorrichtung für Halbleiterscheibe | |
| DE68925374D1 (de) | Halbleiterherstellungsvorrichtung | |
| KR900008069A (ko) | 실리콘 단결정의 제조장치 | |
| DE69414277D1 (de) | Halbleiterwaferkassette | |
| DK348089D0 (da) | Halvlederkomposition | |
| KR900008697A (ko) | 반도체 웨이퍼 제조방법 | |
| KR880701024A (ko) | 웨이퍼 조립체 | |
| EP0367292A3 (en) | Compound semiconductor substrate | |
| KR880701017A (ko) | 반도체 장치 | |
| EP0438127A3 (en) | Semiconductor wafer | |
| DK486287D0 (da) | Slibe- eller polertallerken | |
| DE68928913D1 (de) | Halbleiterkommutator | |
| DE68927357D1 (de) | Halbleiteranordnung | |
| KR880701456A (ko) | 반도체 소자 | |
| KR890013731A (ko) | 반도체 디바이스의 표면 평탄화 방법 | |
| EP0416128A4 (en) | Wafer of compound semiconductor | |
| KR920008855A (ko) | 웨이퍼 표면연마법 | |
| DE69030355D1 (de) | Verbindungshalbleiteranordnung |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A201 | Request for examination | ||
| PA0109 | Patent application |
Patent event code: PA01091R01D Comment text: Patent Application Patent event date: 19891027 |
|
| PA0201 | Request for examination |
Patent event code: PA02012R01D Patent event date: 19891027 Comment text: Request for Examination of Application |
|
| PG1501 | Laying open of application | ||
| G160 | Decision to publish patent application | ||
| PG1605 | Publication of application before grant of patent |
Comment text: Decision on Publication of Application Patent event code: PG16051S01I Patent event date: 19930315 |
|
| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
Patent event code: PE07011S01D Comment text: Decision to Grant Registration Patent event date: 19930625 |
|
| GRNT | Written decision to grant | ||
| PR0701 | Registration of establishment |
Comment text: Registration of Establishment Patent event date: 19930906 Patent event code: PR07011E01D |
|
| PR1002 | Payment of registration fee |
Payment date: 19930906 End annual number: 3 Start annual number: 1 |
|
| PR1001 | Payment of annual fee |
Payment date: 19960320 Start annual number: 4 End annual number: 4 |
|
| PR1001 | Payment of annual fee |
Payment date: 19970324 Start annual number: 5 End annual number: 5 |
|
| PR1001 | Payment of annual fee |
Payment date: 19980319 Start annual number: 6 End annual number: 6 |
|
| PR1001 | Payment of annual fee |
Payment date: 19990401 Start annual number: 7 End annual number: 7 |
|
| PR1001 | Payment of annual fee |
Payment date: 20000306 Start annual number: 8 End annual number: 8 |
|
| PR1001 | Payment of annual fee |
Payment date: 20010404 Start annual number: 9 End annual number: 9 |
|
| PR1001 | Payment of annual fee |
Payment date: 20020403 Start annual number: 10 End annual number: 10 |
|
| PR1001 | Payment of annual fee |
Payment date: 20030320 Start annual number: 11 End annual number: 11 |
|
| PR1001 | Payment of annual fee |
Payment date: 20040323 Start annual number: 12 End annual number: 12 |
|
| PR1001 | Payment of annual fee |
Payment date: 20050322 Start annual number: 13 End annual number: 13 |
|
| PR1001 | Payment of annual fee |
Payment date: 20060327 Start annual number: 14 End annual number: 14 |
|
| PR1001 | Payment of annual fee |
Payment date: 20070404 Start annual number: 15 End annual number: 15 |
|
| PR1001 | Payment of annual fee |
Payment date: 20080331 Start annual number: 16 End annual number: 16 |
|
| FPAY | Annual fee payment |
Payment date: 20090326 Year of fee payment: 17 |
|
| PR1001 | Payment of annual fee |
Payment date: 20090326 Start annual number: 17 End annual number: 17 |
|
| EXPY | Expiration of term | ||
| PC1801 | Expiration of term |