KR900008069A - 실리콘 단결정의 제조장치 - Google Patents
실리콘 단결정의 제조장치Info
- Publication number
- KR900008069A KR900008069A KR1019890016352A KR890016352A KR900008069A KR 900008069 A KR900008069 A KR 900008069A KR 1019890016352 A KR1019890016352 A KR 1019890016352A KR 890016352 A KR890016352 A KR 890016352A KR 900008069 A KR900008069 A KR 900008069A
- Authority
- KR
- South Korea
- Prior art keywords
- single crystal
- silicon single
- manufacturing equipment
- crystal manufacturing
- silicon
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/02—Single-crystal growth by pulling from a melt, e.g. Czochralski method adding crystallising materials or reactants forming it in situ to the melt
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/10—Crucibles or containers for supporting the melt
- C30B15/12—Double crucible methods
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/14—Heating of the melt or the crystallised materials
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/20—Controlling or regulating
- C30B15/22—Stabilisation or shape controlling of the molten zone near the pulled crystal; Controlling the section of the crystal
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10S117/90—Apparatus characterized by composition or treatment thereof, e.g. surface finish, surface coating
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1024—Apparatus for crystallization from liquid or supercritical state
- Y10T117/1032—Seed pulling
- Y10T117/1052—Seed pulling including a sectioned crucible [e.g., double crucible, baffle]
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1024—Apparatus for crystallization from liquid or supercritical state
- Y10T117/1032—Seed pulling
- Y10T117/1056—Seed pulling including details of precursor replenishment
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1024—Apparatus for crystallization from liquid or supercritical state
- Y10T117/1032—Seed pulling
- Y10T117/1068—Seed pulling including heating or cooling details [e.g., shield configuration]
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
- Glass Melting And Manufacturing (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63284017A JPH0676274B2 (ja) | 1988-11-11 | 1988-11-11 | シリコン単結晶の製造装置 |
| JP284017 | 1988-11-11 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR900008069A true KR900008069A (ko) | 1990-06-02 |
| KR920009565B1 KR920009565B1 (ko) | 1992-10-19 |
Family
ID=17673220
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019890016352A Expired KR920009565B1 (ko) | 1988-11-11 | 1989-11-11 | 실리콘 단결정의 제조장치 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US5009863A (ko) |
| EP (1) | EP0368586B1 (ko) |
| JP (1) | JPH0676274B2 (ko) |
| KR (1) | KR920009565B1 (ko) |
| CN (1) | CN1019031B (ko) |
| DE (1) | DE68913429D1 (ko) |
| FI (1) | FI895158A7 (ko) |
| MY (1) | MY104476A (ko) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20190114506A (ko) * | 2018-03-30 | 2019-10-10 | 엘에스산전 주식회사 | Plc 시스템 |
Families Citing this family (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH035392A (ja) * | 1989-05-30 | 1991-01-11 | Nkk Corp | シリコン単結晶の製造装置 |
| US5139750A (en) * | 1989-10-16 | 1992-08-18 | Nkk Corporation | Silicon single crystal manufacturing apparatus |
| US5312600A (en) * | 1990-03-20 | 1994-05-17 | Toshiba Ceramics Co. | Silicon single crystal manufacturing apparatus |
| JPH0825836B2 (ja) * | 1990-04-27 | 1996-03-13 | 東芝セラミックス株式会社 | シリコン単結晶の製造装置 |
| JP2670548B2 (ja) * | 1990-04-27 | 1997-10-29 | 東芝セラミックス株式会社 | シリコン単結晶の製造装置 |
| US5314667A (en) * | 1991-03-04 | 1994-05-24 | Lim John C | Method and apparatus for single crystal silicon production |
| JPH04317493A (ja) * | 1991-04-15 | 1992-11-09 | Nkk Corp | シリコン単結晶の製造装置 |
| DE4123336A1 (de) * | 1991-07-15 | 1993-01-21 | Leybold Ag | Kristallziehverfahren und vorrichtung zu seiner durchfuehrung |
| US5363795A (en) * | 1991-09-04 | 1994-11-15 | Kawasaki Steel Corporation | Czochralski crystal pulling process and an apparatus for carrying out the same |
| JPH0585879A (ja) * | 1991-09-04 | 1993-04-06 | Mitsubishi Materials Corp | 単結晶引上装置 |
| US5284631A (en) * | 1992-01-03 | 1994-02-08 | Nkk Corporation | Crucible for manufacturing single crystals |
| JP2506525B2 (ja) * | 1992-01-30 | 1996-06-12 | 信越半導体株式会社 | シリコン単結晶の製造方法 |
| JP3478406B2 (ja) * | 1992-09-09 | 2003-12-15 | アルベマール・コーポレーシヨン | 粒状物質の供給装置 |
| JP2807609B2 (ja) * | 1993-01-28 | 1998-10-08 | 三菱マテリアルシリコン株式会社 | 単結晶の引上装置 |
| JPH0859386A (ja) * | 1994-08-22 | 1996-03-05 | Mitsubishi Materials Corp | 半導体単結晶育成装置 |
| JP3769800B2 (ja) * | 1996-01-12 | 2006-04-26 | 株式会社Sumco | 単結晶引上装置 |
| JP3533416B2 (ja) * | 1996-02-06 | 2004-05-31 | 三菱住友シリコン株式会社 | 単結晶引上装置 |
| US5942032A (en) * | 1997-08-01 | 1999-08-24 | Memc Electronic Materials, Inc. | Heat shield assembly and method of growing vacancy rich single crystal silicon |
| US7959732B1 (en) * | 2005-06-17 | 2011-06-14 | Saint-Gobain Ceramics & Plastics, Inc. | Apparatus and method for monitoring and controlling crystal growth |
| US8262797B1 (en) * | 2007-03-13 | 2012-09-11 | Solaicx, Inc. | Weir design providing optimal purge gas flow, melt control, and temperature stabilization for improved single crystal growth in a continuous Czochralski process |
| JP2015527295A (ja) * | 2012-09-10 | 2015-09-17 | ジーティーエイティー アイピー ホールディング エルエルシーGtat Ip Holding Llc | 連続チョクラルスキー法及び装置 |
| US20140144371A1 (en) * | 2012-11-29 | 2014-05-29 | Solaicx, Inc. | Heat Shield For Improved Continuous Czochralski Process |
| CN105887185A (zh) * | 2016-05-30 | 2016-08-24 | 上海超硅半导体有限公司 | 一种多重提拉单晶硅的制造方法 |
| CN111041551B (zh) * | 2020-01-06 | 2021-02-05 | 北京北方华创真空技术有限公司 | 直拉硅单晶炉 |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE962868C (de) * | 1953-04-09 | 1957-04-25 | Standard Elektrik Ag | Tiegel zum Herstellen reinsten Halbleitermaterials, insbesondere von Silizium und dessen Verwendung |
| US2892739A (en) * | 1954-10-01 | 1959-06-30 | Honeywell Regulator Co | Crystal growing procedure |
| US4015048A (en) * | 1975-03-03 | 1977-03-29 | Corning Glass Works | Ceramic articles having cordierite coatings |
| US4010064A (en) * | 1975-05-27 | 1977-03-01 | International Business Machines Corporation | Controlling the oxygen content of Czochralski process of silicon crystals by sandblasting silica vessel |
| US4042361A (en) * | 1976-04-26 | 1977-08-16 | Corning Glass Works | Method of densifying metal oxides |
| US4200445A (en) * | 1977-04-28 | 1980-04-29 | Corning Glass Works | Method of densifying metal oxides |
| US4238274A (en) * | 1978-07-17 | 1980-12-09 | Western Electric Company, Inc. | Method for avoiding undesirable deposits in crystal growing operations |
| DE2928089C3 (de) * | 1979-07-12 | 1982-03-04 | Heraeus Quarzschmelze Gmbh, 6450 Hanau | Verbundtiegel für halbleitertechnologische Zwecke und Verfahren zur Herstellung |
| US4911896A (en) * | 1986-07-24 | 1990-03-27 | General Electric Company | Fused quartz member for use in semiconductor manufacture |
| JPS63177988A (ja) * | 1987-01-20 | 1988-07-22 | Toyo Seikan Kaisha Ltd | レ−ザ−溶接缶製造方法 |
| US4919901A (en) * | 1987-12-31 | 1990-04-24 | Westinghouse Electric Corp. | Barrier design for crucibles for silicon dendritic web growth |
| JPH0280392A (ja) * | 1988-09-16 | 1990-03-20 | Osaka Titanium Co Ltd | 単結晶製造装置 |
-
1988
- 1988-11-11 JP JP63284017A patent/JPH0676274B2/ja not_active Expired - Lifetime
-
1989
- 1989-10-31 FI FI895158A patent/FI895158A7/fi not_active Application Discontinuation
- 1989-11-06 EP EP89311456A patent/EP0368586B1/en not_active Expired - Lifetime
- 1989-11-06 DE DE89311456T patent/DE68913429D1/de not_active Expired - Lifetime
- 1989-11-07 MY MYPI89001546A patent/MY104476A/en unknown
- 1989-11-11 KR KR1019890016352A patent/KR920009565B1/ko not_active Expired
- 1989-11-11 CN CN89109188A patent/CN1019031B/zh not_active Expired
-
1990
- 1990-06-19 US US07/540,647 patent/US5009863A/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20190114506A (ko) * | 2018-03-30 | 2019-10-10 | 엘에스산전 주식회사 | Plc 시스템 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP0368586B1 (en) | 1994-03-02 |
| JPH02133389A (ja) | 1990-05-22 |
| FI895158A7 (fi) | 1990-05-12 |
| CN1019031B (zh) | 1992-11-11 |
| US5009863A (en) | 1991-04-23 |
| DE68913429D1 (de) | 1994-04-07 |
| EP0368586A1 (en) | 1990-05-16 |
| MY104476A (en) | 1994-04-30 |
| CN1042954A (zh) | 1990-06-13 |
| JPH0676274B2 (ja) | 1994-09-28 |
| KR920009565B1 (ko) | 1992-10-19 |
| FI895158A0 (fi) | 1989-10-31 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A201 | Request for examination | ||
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| R17-X000 | Change to representative recorded |
St.27 status event code: A-3-3-R10-R17-oth-X000 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| G160 | Decision to publish patent application | ||
| PG1605 | Publication of application before grant of patent |
St.27 status event code: A-2-2-Q10-Q13-nap-PG1605 |
|
| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
St.27 status event code: A-1-2-D10-D22-exm-PE0701 |
|
| GRNT | Written decision to grant | ||
| PR0701 | Registration of establishment |
St.27 status event code: A-2-4-F10-F11-exm-PR0701 |
|
| PR1002 | Payment of registration fee |
St.27 status event code: A-2-2-U10-U11-oth-PR1002 Fee payment year number: 1 |
|
| LAPS | Lapse due to unpaid annual fee | ||
| PC1903 | Unpaid annual fee |
St.27 status event code: A-4-4-U10-U13-oth-PC1903 Not in force date: 19951020 Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE |
|
| PC1903 | Unpaid annual fee |
St.27 status event code: N-4-6-H10-H13-oth-PC1903 Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE Not in force date: 19951020 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-5-5-R10-R18-oth-X000 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-4-4-P10-P22-nap-X000 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-5-5-R10-R18-oth-X000 |