KR0184091B1 - 다이나믹형 메모리 - Google Patents
다이나믹형 메모리 Download PDFInfo
- Publication number
- KR0184091B1 KR0184091B1 KR1019950031300A KR19950031300A KR0184091B1 KR 0184091 B1 KR0184091 B1 KR 0184091B1 KR 1019950031300 A KR1019950031300 A KR 1019950031300A KR 19950031300 A KR19950031300 A KR 19950031300A KR 0184091 B1 KR0184091 B1 KR 0184091B1
- Authority
- KR
- South Korea
- Prior art keywords
- data
- memory
- subarray
- sense amplifier
- subarrays
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F12/00—Accessing, addressing or allocating within memory systems or architectures
- G06F12/02—Addressing or allocation; Relocation
- G06F12/08—Addressing or allocation; Relocation in hierarchically structured memory systems, e.g. virtual memory systems
- G06F12/0802—Addressing of a memory level in which the access to the desired data or data block requires associative addressing means, e.g. caches
- G06F12/0893—Caches characterised by their organisation or structure
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/409—Read-write [R-W] circuits
- G11C11/4091—Sense or sense/refresh amplifiers, or associated sense circuitry, e.g. for coupled bit-line precharging, equalising or isolating
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/409—Read-write [R-W] circuits
- G11C11/4096—Input/output [I/O] data management or control circuits, e.g. reading or writing circuits, I/O drivers or bit-line switches
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Theoretical Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Databases & Information Systems (AREA)
- Dram (AREA)
- Semiconductor Memories (AREA)
Abstract
Description
Claims (5)
- 각각 행렬 모양으로 배치된 다이나믹형 메모리셀어레이를 갖추고, 동일 행의 메모리셀에 접속된 복수의 워드선 및 동일 열의 메모리셀에 접속된 복수의 비트선을 갖춘 복수의 서브어레이(11)와, 상기 각 서브어레이(11)에 있어서 선택된 행의 메모리셀로부터 독출된 전위를 센스 증폭하기 위하여 설치되고, 상기 각 서브어레이(11)에서 각각 동일한 타이밍에서 동작하도록 제어되고, 억세스 대기상태의 서브어레이(11)에서는 센스 데이터를 보호유지한 그대로 상태로 제어되고, 캐쉬메모리로서 사용되는 복수의 센스앰프(12), 상기 복수의 서브어레이(11) 및 복수의 센스앰프(12)를 포함하며, 1개의 서브어레이(11)와 1개의 센스앰프(12)가 메모리칩의 제1변에 따라 교대로 반복하고, 그 반복하는 방향의 양단에 센스앰프(12)가 위치하도록 배치되고, 2개의 서브어레이(11)에 끼운 센스앰프(12)가 상기 2개의 서브어레이(11)에서 시분할적으로 사용되고, 상기 제1변에 수직인 방향의 메모리칩의 제2변에 따라 복수개로 분할되어 배치되고, 상기 복수개의 분할에 의해 복수의 뱅크로 분할되어 동작이 제어되는 복수의 공유 센스앰프(12) 구성의 메모리블럭(10), 각각 상기 각 서브어레이(11)에 대응하여 상기 메모리칩의 제2변에 평행하게 형성되고, 대응하는 서브어레이(11)의 상기 복수의 센스앰프(12)에 보호유지된 데이터 중 선택된 열의 데이터를 전송하기 위한 복수의 데이터선(13) 및, 상기 각 뱅크의 서브어레이(11)에 대응하여 상기 메모리칩의 제1변에 평행하게 배치되고, 대응하는 데이터선을 매개로 대응하는 서브어레이(11)의 사이에서 데이터의 입출력이 행해지는 복수의 데이터 입/출력패드(16)를 구비하여 구성된 것을 특징으로 다이나믹형 메모리.
- 제1항에 있어서, 각각 상기 각 서브어레이(11)에 대응하여 그 근방에서 상기 데이터 입/출력패드(16)에 가까운 측에 배치되고, 대응하는 서브어레이(11)의 데이터선으로부터의 데이터를 증폭하는 복수의 데이터 버퍼회로(14) 및, 상기 복수의 데이터 버퍼회로(14) 보다도 상기 메모리칩의 제1변으로부터 먼 위치에서 상기 제1변에 평행하게 배치되고, 각각 상기 복수의 뱅크에 있어서 각 1개의 서브어레이(11)에 대응하는 데이터 버퍼회로(14)에 공통으로 접속되어 상기 복수의 뱅크로부터의 데이터를 선택적으로 취출하는 복수의 멀티플랙서(15)를 더 구비하여 구성된 것을 특징으로 하는 다이나믹형 메모리.
- 제1항에 있어서, 상기 메모리블럭과 데이터 입/출력패드 사이의 영역에서 메모리칩의 제1변에 평행하게 배치되고, 각각 상기 복수의 뱅크에 있어서 각 1개의 서브어레이(11)에 대응하는 복수의 데이터선에 공통으로 접속되어 상기 복수의 뱅크로부터의 데이터를 선택적으로 증폭하는 복수의 데이터 버퍼회로·멀티플랙서(31)를 더 구비하여 구성된 것을 특징으로 하는 다이나믹형 메모리.
- 제1항 내지 제3항중 어느 한 항에 있어서, 상기 복수의 데이터선 중 상기 데이터 입/출력패드(16)로부터 먼 측에 위치하는 서브어레이(11)에 대응하는 데이터선은 상기 데이터 입/출력패드(16)에 가까운 측에 위치하는 메모리블럭의 센스앰프(12) 위를 통과해 있는 것을 특징으로 하는 다이나믹형 메모리.
- 제1항 내지 제3항중 어느 한 항에 있어서, 상기 복수의 데이터선 중 상기 데이터 입/출력패드(16)로부터 먼 측에 위치하는 서브어레이(11)에 대응하는 데이터선은 상기 데이터 입/출력패드(16)에 가까운 측에 위치하는 서브어레이(11)에 대응하는 데이터선보다도 큰 것을 특징으로 하는 다이나믹형 메모리.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP06227639A JP3135795B2 (ja) | 1994-09-22 | 1994-09-22 | ダイナミック型メモリ |
| JP94-227639 | 1994-09-22 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR960012008A KR960012008A (ko) | 1996-04-20 |
| KR0184091B1 true KR0184091B1 (ko) | 1999-04-15 |
Family
ID=16864038
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019950031300A Expired - Lifetime KR0184091B1 (ko) | 1994-09-22 | 1995-09-22 | 다이나믹형 메모리 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US5586078A (ko) |
| EP (2) | EP1081711B1 (ko) |
| JP (1) | JP3135795B2 (ko) |
| KR (1) | KR0184091B1 (ko) |
| CN (1) | CN1134016C (ko) |
| DE (2) | DE69521095T2 (ko) |
| TW (1) | TW303522B (ko) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20230026075A (ko) * | 2021-08-17 | 2023-02-24 | 연세대학교 산학협력단 | Ram 메모리에 기반한 pim 연산 장치 및 ram 메모리에 기반한 pim 연산 방법 |
Families Citing this family (44)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5901105A (en) * | 1995-04-05 | 1999-05-04 | Ong; Adrian E | Dynamic random access memory having decoding circuitry for partial memory blocks |
| US5787267A (en) * | 1995-06-07 | 1998-07-28 | Monolithic System Technology, Inc. | Caching method and circuit for a memory system with circuit module architecture |
| JPH09161476A (ja) | 1995-10-04 | 1997-06-20 | Toshiba Corp | 半導体メモリ及びそのテスト回路、並びにデ−タ転送システム |
| JP3277108B2 (ja) * | 1995-10-31 | 2002-04-22 | インターナショナル・ビジネス・マシーンズ・コーポレーション | Dramアレイ |
| JP3477018B2 (ja) * | 1996-03-11 | 2003-12-10 | 株式会社東芝 | 半導体記憶装置 |
| TW348266B (en) | 1996-03-11 | 1998-12-21 | Toshiba Co Ltd | Semiconductor memory device |
| JPH09288888A (ja) | 1996-04-22 | 1997-11-04 | Mitsubishi Electric Corp | 半導体記憶装置 |
| US6044433A (en) * | 1996-08-09 | 2000-03-28 | Micron Technology, Inc. | DRAM cache |
| JP2927344B2 (ja) * | 1996-08-09 | 1999-07-28 | 日本電気株式会社 | 半導体記憶回路 |
| JP3280867B2 (ja) * | 1996-10-03 | 2002-05-13 | シャープ株式会社 | 半導体記憶装置 |
| WO1998029874A1 (en) * | 1996-12-26 | 1998-07-09 | Rambus, Inc. | Method and apparatus for sharing sense amplifiers between memory banks |
| US6075743A (en) * | 1996-12-26 | 2000-06-13 | Rambus Inc. | Method and apparatus for sharing sense amplifiers between memory banks |
| US6134172A (en) * | 1996-12-26 | 2000-10-17 | Rambus Inc. | Apparatus for sharing sense amplifiers between memory banks |
| KR100242998B1 (ko) * | 1996-12-30 | 2000-02-01 | 김영환 | 잡음특성을 개선한 셀 어레이 및 센스앰프의 구조 |
| US5774408A (en) * | 1997-01-28 | 1998-06-30 | Micron Technology, Inc. | DRAM architecture with combined sense amplifier pitch |
| US5995437A (en) * | 1997-06-02 | 1999-11-30 | Townsend And Townsend And Crew Llp | Semiconductor memory and method of accessing memory arrays |
| US6084816A (en) * | 1998-04-16 | 2000-07-04 | Kabushiki Kaisha Toshiba | Semiconductor memory device |
| US6141286A (en) * | 1998-08-21 | 2000-10-31 | Micron Technology, Inc. | Embedded DRAM architecture with local data drivers and programmable number of data read and data write lines |
| US6442666B1 (en) * | 1999-01-28 | 2002-08-27 | Infineon Technologies Ag | Techniques for improving memory access in a virtual memory system |
| KR100363079B1 (ko) * | 1999-02-01 | 2002-11-30 | 삼성전자 주식회사 | 이웃한 메모리 뱅크들에 의해 입출력 센스앰프가 공유된 멀티 뱅크 메모리장치 |
| US6118717A (en) * | 1999-07-15 | 2000-09-12 | Stmicroelectronics, Inc. | Method and apparatus for loading directly onto bit lines in a dynamic random access memory |
| TW434538B (en) * | 1999-07-28 | 2001-05-16 | Sunplus Technology Co Ltd | Cache data access memory structure |
| KR100339428B1 (ko) * | 1999-09-07 | 2002-05-31 | 박종섭 | 불휘발성 강유전체 메모리의 셀 블록 구조 |
| EP1181691B1 (de) | 2000-03-13 | 2005-08-24 | Infineon Technologies AG | Schreib-leseverstärker für eine dram-speicherzelle sowie dram-speicher |
| US7215595B2 (en) * | 2003-11-26 | 2007-05-08 | Infineon Technologies Ag | Memory device and method using a sense amplifier as a cache |
| US7050351B2 (en) * | 2003-12-30 | 2006-05-23 | Intel Corporation | Method and apparatus for multiple row caches per bank |
| US6990036B2 (en) | 2003-12-30 | 2006-01-24 | Intel Corporation | Method and apparatus for multiple row caches per bank |
| KR100533977B1 (ko) * | 2004-05-06 | 2005-12-07 | 주식회사 하이닉스반도체 | 셀영역의 면적을 감소시킨 반도체 메모리 장치 |
| KR101149816B1 (ko) * | 2004-05-28 | 2012-05-25 | 삼성전자주식회사 | 캐쉬 메모리의 캐쉬 히트 로직 |
| DE102004059723B4 (de) * | 2004-12-11 | 2010-02-25 | Qimonda Ag | Speicherbauelement mit neuer Anordnung der Bitleitungen |
| KR100735527B1 (ko) * | 2006-02-13 | 2007-07-04 | 삼성전자주식회사 | 2개의 패드 행을 포함하는 반도체 메모리 장치 |
| JP2009009633A (ja) * | 2007-06-27 | 2009-01-15 | Elpida Memory Inc | 半導体記憶装置 |
| JP5743045B2 (ja) * | 2008-07-16 | 2015-07-01 | ピーエスフォー ルクスコ エスエイアールエルPS4 Luxco S.a.r.l. | 半導体記憶装置及び半導体記憶装置におけるメモリアクセス方法 |
| JP2011146094A (ja) * | 2010-01-14 | 2011-07-28 | Renesas Electronics Corp | 半導体集積回路 |
| CN109155310B (zh) | 2016-08-31 | 2023-03-31 | 美光科技公司 | 存储器单元及存储器阵列 |
| WO2018044457A1 (en) | 2016-08-31 | 2018-03-08 | Micron Technology, Inc. | Memory cells and memory arrays |
| US10355002B2 (en) | 2016-08-31 | 2019-07-16 | Micron Technology, Inc. | Memory cells, methods of forming an array of two transistor-one capacitor memory cells, and methods used in fabricating integrated circuitry |
| US10276230B2 (en) | 2016-08-31 | 2019-04-30 | Micron Technology, Inc. | Memory arrays |
| US10079235B2 (en) | 2016-08-31 | 2018-09-18 | Micron Technology, Inc. | Memory cells and memory arrays |
| WO2018044479A1 (en) | 2016-08-31 | 2018-03-08 | Micron Technology, Inc. | Sense amplifier constructions |
| KR102223551B1 (ko) | 2016-08-31 | 2021-03-08 | 마이크론 테크놀로지, 인크 | 메모리 셀 및 메모리 어레이 |
| US11211384B2 (en) | 2017-01-12 | 2021-12-28 | Micron Technology, Inc. | Memory cells, arrays of two transistor-one capacitor memory cells, methods of forming an array of two transistor-one capacitor memory cells, and methods used in fabricating integrated circuitry |
| KR102359067B1 (ko) * | 2017-08-29 | 2022-02-08 | 마이크론 테크놀로지, 인크 | 메모리 회로 |
| GB2634496A (en) * | 2023-10-04 | 2025-04-16 | Ibm | Banked sense amplifier circuit for a memory core and a memory core complex |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0814985B2 (ja) | 1989-06-06 | 1996-02-14 | 富士通株式会社 | 半導体記憶装置 |
| ATE101746T1 (de) * | 1989-11-24 | 1994-03-15 | Siemens Ag | Halbleiterspeicher. |
| DE69114345T2 (de) * | 1990-03-28 | 1996-05-23 | Nippon Electric Co | Halbleiterspeichereinrichtung. |
| JPH05274879A (ja) * | 1992-03-26 | 1993-10-22 | Nec Corp | 半導体装置 |
| US5384745A (en) * | 1992-04-27 | 1995-01-24 | Mitsubishi Denki Kabushiki Kaisha | Synchronous semiconductor memory device |
| KR970004460B1 (ko) | 1992-06-30 | 1997-03-27 | 니뽄 덴끼 가부시끼가이샤 | 반도체 메모리 회로 |
-
1994
- 1994-09-22 JP JP06227639A patent/JP3135795B2/ja not_active Expired - Fee Related
-
1995
- 1995-09-14 US US08/528,306 patent/US5586078A/en not_active Expired - Lifetime
- 1995-09-20 EP EP00124224A patent/EP1081711B1/en not_active Expired - Lifetime
- 1995-09-20 EP EP95114797A patent/EP0704847B1/en not_active Expired - Lifetime
- 1995-09-20 DE DE69521095T patent/DE69521095T2/de not_active Expired - Lifetime
- 1995-09-20 DE DE69536100T patent/DE69536100D1/de not_active Expired - Lifetime
- 1995-09-21 CN CNB951165518A patent/CN1134016C/zh not_active Expired - Fee Related
- 1995-09-22 KR KR1019950031300A patent/KR0184091B1/ko not_active Expired - Lifetime
- 1995-10-28 TW TW084111414A patent/TW303522B/zh not_active IP Right Cessation
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20230026075A (ko) * | 2021-08-17 | 2023-02-24 | 연세대학교 산학협력단 | Ram 메모리에 기반한 pim 연산 장치 및 ram 메모리에 기반한 pim 연산 방법 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0896571A (ja) | 1996-04-12 |
| US5586078A (en) | 1996-12-17 |
| DE69521095T2 (de) | 2001-10-25 |
| EP1081711A3 (en) | 2008-04-09 |
| DE69521095D1 (de) | 2001-07-05 |
| EP1081711A2 (en) | 2001-03-07 |
| EP1081711B1 (en) | 2010-09-01 |
| JP3135795B2 (ja) | 2001-02-19 |
| CN1142115A (zh) | 1997-02-05 |
| DE69536100D1 (de) | 2010-10-14 |
| EP0704847B1 (en) | 2001-05-30 |
| KR960012008A (ko) | 1996-04-20 |
| EP0704847A1 (en) | 1996-04-03 |
| CN1134016C (zh) | 2004-01-07 |
| TW303522B (ko) | 1997-04-21 |
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