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JP2019066221A - 電子部品搬送装置および電子部品検査装置 - Google Patents

電子部品搬送装置および電子部品検査装置 Download PDF

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Publication number
JP2019066221A
JP2019066221A JP2017189449A JP2017189449A JP2019066221A JP 2019066221 A JP2019066221 A JP 2019066221A JP 2017189449 A JP2017189449 A JP 2017189449A JP 2017189449 A JP2017189449 A JP 2017189449A JP 2019066221 A JP2019066221 A JP 2019066221A
Authority
JP
Japan
Prior art keywords
unit
electronic component
inspection
grip
hand
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2017189449A
Other languages
English (en)
Japanese (ja)
Inventor
冬生 ▲高▼田
冬生 ▲高▼田
Fuyumi Takada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP2017189449A priority Critical patent/JP2019066221A/ja
Priority to TW107133781A priority patent/TW201916232A/zh
Priority to CN201811128622.7A priority patent/CN109581182A/zh
Publication of JP2019066221A publication Critical patent/JP2019066221A/ja
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP2017189449A 2017-09-29 2017-09-29 電子部品搬送装置および電子部品検査装置 Pending JP2019066221A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2017189449A JP2019066221A (ja) 2017-09-29 2017-09-29 電子部品搬送装置および電子部品検査装置
TW107133781A TW201916232A (zh) 2017-09-29 2018-09-26 電子零件搬送裝置及電子零件檢查裝置
CN201811128622.7A CN109581182A (zh) 2017-09-29 2018-09-27 电子部件输送装置以及电子部件检查装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2017189449A JP2019066221A (ja) 2017-09-29 2017-09-29 電子部品搬送装置および電子部品検査装置

Publications (1)

Publication Number Publication Date
JP2019066221A true JP2019066221A (ja) 2019-04-25

Family

ID=65919882

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2017189449A Pending JP2019066221A (ja) 2017-09-29 2017-09-29 電子部品搬送装置および電子部品検査装置

Country Status (3)

Country Link
JP (1) JP2019066221A (zh)
CN (1) CN109581182A (zh)
TW (1) TW201916232A (zh)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2020193902A (ja) * 2019-05-29 2020-12-03 セイコーエプソン株式会社 電子部品搬送装置、判断方法、および電子部品検査装置
TWI856616B (zh) * 2023-04-19 2024-09-21 鴻勁精密股份有限公司 接合機構、測試裝置及作業機

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4539685B2 (ja) * 2007-06-22 2010-09-08 セイコーエプソン株式会社 部品搬送装置及びicハンドラ
JP6252241B2 (ja) * 2014-02-27 2017-12-27 セイコーエプソン株式会社 力検出装置、およびロボット
JP2016070778A (ja) * 2014-09-30 2016-05-09 セイコーエプソン株式会社 電子部品搬送装置および電子部品検査装置
JP2016070777A (ja) * 2014-09-30 2016-05-09 セイコーエプソン株式会社 電子部品搬送装置および電子部品検査装置
JP2017116369A (ja) * 2015-12-24 2017-06-29 セイコーエプソン株式会社 電子部品搬送装置および電子部品検査装置

Also Published As

Publication number Publication date
CN109581182A (zh) 2019-04-05
TW201916232A (zh) 2019-04-16

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