JP2008039452A - Inspection device - Google Patents

Abstract

When inspection is performed on a plurality of devices to be inspected using a plurality of measuring instruments, the inspection can be performed without increasing the number of measuring instruments used, and the number of inspection facilities is reduced.
An inspection apparatus (2) for performing a plurality of inspections with different items using a plurality of measuring devices (16) for a plurality of devices to be inspected (14), wherein each measuring device (16) is individually attached to each device to be inspected (14) A relay box 8 (switch connection means) including relay contact groups 44a, 44b and the like for switching connection; and a personal computer 6 (control means) for controlling the switching connection of the switching connection means 42, 44. The personal computer 6 controls the switching connection operation of the relay contact groups 44a and 44b to execute the inspection using different measuring devices 16 in parallel for each of the devices 14 to be inspected.
[Selection] Figure 4

Description

  The present invention relates to an inspection apparatus that inspects a plurality of devices to be inspected using a plurality of measuring devices.

  In general, after an electronic device is assembled at a factory, various functions and the like are inspected as an inspected device before being shipped as a product. For the inspection of such an inspected device, a plurality of measuring devices may be required as a measuring device set.

  If such an inspection is performed on each of a plurality of devices to be inspected in a predetermined inspection process with one measuring instrument set, the inspection time becomes longer. Thus, when a plurality of measuring device sets are used and a plurality of devices to be inspected are simultaneously tested in parallel, the inspection time is shortened.

  However, in such inspection, when the number of devices to be inspected increases, the number of measuring instrument sets required for inspection increases and inspection equipment costs increase.

  Patent Document 1 discloses an inspection apparatus that performs simultaneous inspection by connecting a plurality of semiconductor elements of the same type in parallel to one measurement inspection means.

However, this inspection apparatus also requires a plurality of measuring instrument sets in the same manner as described above, and an increase in inspection equipment cost cannot be avoided.
Japanese Patent No. 2644579

  Therefore, the problem to be solved by the present invention is to reduce the cost of inspection equipment for inspecting a plurality of devices to be inspected using a plurality of measuring devices.

  (1) The inspection apparatus according to the first aspect of the present invention is an inspection apparatus capable of executing a plurality of inspections having different items using a measuring instrument set including a plurality of measuring instruments for a plurality of inspected devices. Switching connection means for individually switching connection of each measuring device to each device under test, and control means for controlling the switching connection of the switching connection means, the control means of the switching connection means By controlling the switching connection operation, it is possible to execute in parallel tests using different measuring devices for each of at least two devices to be inspected.

  The target of the inspection is not particularly limited, but inspection of the function of the inspected device is preferable. Examples of this function include a continuity test, a communication function test, and other tests.

  The device to be inspected is not limited to that type. The present invention can be applied to any device such as a semiconductor element, an electronic device, a control device, etc. regardless of its name.

  The type of measuring instrument is not limited, and can include, for example, an ammeter, a voltmeter, and a wattmeter. For example, a control device that serially transmits output states of a large number of contacts, for example, a PLC ( In the case of a programmable logic controller, it can include a digital multimeter (DMM) for measuring the effective value of the alternating current signal required for the inspection of the PLC, and the like.

  Although the switching connection means is not particularly limited, for example, a relay can be exemplified. Although a control means is not specifically limited, For example, a personal computer can be illustrated.

  The parallel execution of inspections means that inspections for two or more devices to be inspected are performed simultaneously in time.

  According to the first aspect of the present invention, since a plurality of devices to be inspected can be executed in parallel using different measuring devices in the measuring device set, the idle time of the measuring devices in the measuring device set can be reduced. The number of inspection facilities can be reduced as compared with the conventional case where at least two or more of the same measuring devices are required to be executed simultaneously in parallel.

  (2) An inspection apparatus according to the second aspect of the present invention is an inspection apparatus that performs a plurality of inspections with different items using a measuring instrument set including a plurality of measuring instruments for a plurality of devices to be inspected. A relay contact group for individually switching connection of each measuring device to each device to be inspected, and a control means for controlling the switching connection operation of the relay contact group, and is detachable from the apparatus main body, A fixture for setting the device to be inspected at a measurement position, and controlling the switching connection of the relay contact group by the control means to use a different measuring device for each of at least two devices to be inspected. It is characterized in that the inspections that have been performed are executed in parallel. The control means is preferably a personal computer. The control means may be a combination with a PLC or a peripheral device such as a console.

  According to the second aspect of the present invention, the control means controls the relay contact group so that at least two devices to be inspected can be executed in parallel using different measuring devices. The idle time of the measuring device can be reduced, and the inspection equipment can be reduced as compared with the conventional case.

  A second preferred aspect of the present invention is that the apparatus main body can be provided with additional fixtures. In this aspect, the number of devices to be inspected can be easily increased without increasing the inspection equipment.

  A second preferred aspect of the present invention is that the apparatus main body can exchange a fixture with another fixture. In this aspect, it becomes possible to easily cope with the inspection of the inspected devices that are produced in a small variety of products.

  According to the present invention, since inspections using different measuring devices can be performed in parallel on a plurality of devices to be inspected, in order to inspect a plurality of devices to be inspected using such a plurality of measuring devices. The cost of inspection equipment can be reduced.

  Hereinafter, an inspection apparatus according to an embodiment of the present invention will be described with reference to the accompanying drawings.

  FIG. 1 shows the appearance of the inspection apparatus according to the embodiment.

  This inspection apparatus is an inspection apparatus after final assembly of a control apparatus (inspected apparatus) having functions such as I / O, communication, and control.

  The inspection apparatus 2 includes a monitor 4, a personal computer 6 as control means, a relay box 8 as switching connection means, a measuring instrument rack 10, and a fixture 12 as inspection jig.

  The fixture 12 performs electrical connection with the device under test 14, positioning of the device under test 14 at the four-corner measurement position, and the like. Switching connection between the fixture 12 and the measuring device 16 in the measuring device rack 10 is performed by the relay box 8.

  Control of the entire inspection apparatus 2 and transmission / reception of commands are performed by the personal computer 6. The main body of the inspection apparatus 2 is mainly composed of a monitor 4, a personal computer 6, and a relay box 8.

  FIG. 2 shows an appearance of the inspection apparatus 2 in which the inspection capability is increased by adding the fixture 12 to the inspection apparatus 2.

  In FIG. 1, there are two fixtures 12 and two inspected devices 14 can be inspected. However, in FIG. 2, there are four fixtures 12 and four inspected devices 14 are inspected at a time. Can do. That is, the number of fixtures 12 can be increased from two in FIG. 1 to four in FIG.

  FIG. 3 shows an exploded configuration of the fixture 12.

  The fixture 12 is for setting the device 14 to be inspected at a measurement position, and includes a probing jig 18 that can be raised and lowered and a lower jig 20 that performs the main positioning of the device 14 to be inspected. It has a function of pulling the device 14 and a function of hitting the tip of the probe included in both jigs 18 and 20 to the device 14 to be inspected from the left, right, top and bottom.

  The probing jig 18 can be moved up and down using an air cylinder (not shown) as a drive source. In this case, the air pressure of the air cylinder may be adjusted so that the probing jig 18 can be linearly moved in the vertical direction and an appropriate probe contact pressure is provided.

  The probing jig 18 and the lower jig 20 can be exchanged with other jigs corresponding to the device to be inspected in order to cope with high-mix low-volume production. The fixture 12 can be attached and detached from the apparatus main body of the inspection apparatus 2. The probing jig 18 has a modular structure, and is composed of a main jig 18a and a sub jig 18b.

  The fixture 12 performs a process for recognizing the inspected device 14 based on probe inputs from the jigs 18 and 2 and has a function of transmitting information on the inspected device 14 to the personal computer 6 at the start of the inspection. Can have a part. The fixture 12 can be provided with a wireless LAN as wireless communication means (not shown) so that the inspection information signal can be communicated with the personal computer 66.

  The inspection apparatus 2 having the above configuration will be described in more detail. In the inspection apparatus 2, the personal computer 6 is mounted on the lower stage base plate 24 of the gantry 22 and the relay box 8 is mounted on the intermediate stage base plate 26. Two pieces of inspected device mounting plates 33 are juxtaposed on the upper stage plate 28. The device under test 14 is mounted on these mounting plates 33. In this case, each of the devices 14 to be inspected is arranged in an inspection box 30 installed on the device-to-be-inspected board 33 and fixed by the fixture 12.

  On one inspection target device mounting plate 33, one lower jig guide rail 32 and one inspection box 30 installed on the rear side of the lower jig guide rail 32 are installed. A lower jig 20 (lower fixture) and a probing jig 18 (upper fixture) guided by a lower jig guide rail 32 are arranged in the inspection box 30. The lower jig 20 and the probing jig 18 constitute a fixture 12 for fixing the device 14 to be inspected.

  The lower jig 20 has jig plates 34 and 36 separated into two upper and lower stages by four support columns 35, and a pair of left and right connectors 38 and 40 on the upper jig plate 36 (the connector 40 does not appear in the drawing). Are arranged opposite to each other.

  The probing jig 18 includes a main jig 18a and a sub jig 18b, and is disposed above the lower jig 20. The sub jig 18b is accommodated in the notch recess 18c of the main jig 18a in an exchangeable manner. As shown by arrows P and Q, the sub jig 18b can be exchanged with other sub jigs 18b1 and 18b2 according to the device to be inspected. The sub jigs 18b1 and 18b2 are shown face down in the figure, and a plurality of pin rows 18d1 and 18d2 are provided on the back surface in a number corresponding to the device 14 to be inspected.

  The pin row 18d1 has a three-row configuration, and the pin row 18d2 has a two-row configuration.

  When the combination of the main jig 18a and the sub jigs 18b, 18b1, and 18b2 to be mounted on the main jig 18a is increased, there is a possibility that mounting errors of the sub jigs 18b, 18b1, and 18b2 may occur. Therefore, when the sub jigs 18b, 18b1, and 18b2 are attached to the main jig 18a, the resistance values Rx of the sub jigs 18b, 18b1, and 18b2 (for example, x = 1 is the sub jig 18b). Are added in series to identify the total resistance value (R0 + Rx), and x = 2 is the resistance value of the sub jig 18b1, and x = 3 is the resistance value of the sub jig 18b2. You may enable it to determine the kind of jig | tool 18b, 18b1, 18b2.

  Further, for example, a ZIF connector or the like can be used as a connector used for jig connection or the like, thereby facilitating the insertion / extraction operation. In this case, it may be possible to check whether or not the jig is completely mounted using a sensor or the like.

  1 includes two inspection boxes 30 and FIG. 2 includes four inspection boxes 30. Of these inspection boxes 30, only one monitor 4 is disposed on the leftmost inspection box 30 in the figure. . Two fixtures 12 can be mounted on one pedestal 22, and the fixtures 12 can be added in even numbers by adding the pedestals 22 as shown in FIG.

  FIG. 4 shows a schematic configuration of the hardware of the inspection apparatus 2, and FIG. 5 shows details in the relay box 8.

  The inspection apparatus 2 includes a personal computer 6, a relay box 8, a measuring instrument rack 10, and a plurality of fixtures 12. In the relay box 8, a relay control circuit 42 and a relay matrix circuit 44 for switching signals of the device under test 14 (first device under test 141, second device under test 142) are provided. The relay matrix circuit 44 includes relay contact groups 44a and 44b and a relay wiring 44c. When the relay contact groups 44a and 44b are controlled to be switched and connected under the control of the relay control circuit 42, the measuring instrument 16 (ammeter 161). , Voltmeter 162, wattmeter 163, etc.) can be switched.

  The relay matrix circuit 44 has a plurality of ports and can be switched in the same manner regardless of which port is used, and can be connected to the plurality of fixtures 12.

  The fixture 12 is electrically connected to the device under test 14 by a probe, a connector, or the like as described above. The personal computer 6 monitors the usage status for each measuring instrument, and when signals overlap at the same time, one of them can be waited to avoid contention. The measuring instrument rack 10 includes measuring instruments such as an ammeter, a voltmeter, and a wattmeter.

  The personal computer 6 has a communication control function, a measuring instrument control function, an inspection program execution function, an inspection result receiving function, an inspection result output function, a jig control function, an inspection item management function, and the like.

  The personal computer 6 controls various inspection modules (not shown) by the communication control function, controls the measuring instrument rack 10 by the measuring instrument control function, receives the result from the measuring instrument rack 10, and sets the relay box 8 by the wiring control function. Control, instruct the inspected device 14 by the inspection program execution function, send the inspection result from the relay box 8 by the inspection result receiving function, send the inspection result to the inspection result output function, and inspect the inspection result by the inspection result output function Is output to a file or an operator, and the fixture 12 is instructed to the fixture 12 by the jig control function.

  The measuring instrument rack 10 houses an ammeter 161, a voltmeter 162, a wattmeter 163, and various other measuring instruments 16, and the measuring operation of the measuring instrument 16 is controlled by the personal computer 6. Output measurement results.

  The relay box 8 has a switching connection function capable of individually switching and connecting any of the plurality of measuring instruments 16 to the plurality of devices 14 to be inspected, and the switching connection is controlled by the personal computer 6. . The fixture 12 has a function capable of absorbing the shape of the device under test 14 and a function of absorbing the interface, and is electrically connected to the device under test 14.

  The relay box 8 can individually input the measurement signals of the plurality of measuring devices 16 by switching and connecting the relay contact groups 44a and 44b in the relay matrix circuit 44 to the plurality of devices 14 to be inspected. The measurement result signals of the devices under test 14 can be inputted to the plurality of measuring instruments 16 by switching and connecting the relay contact groups 44a and 44b in the relay matrix circuit 44, respectively.

  The relay box 8 includes a measuring instrument side relay contact group 44a capable of switching and connecting the measuring instrument 16 and the inspected apparatus 14 respectively, an inspected apparatus side relay contact group 44b, and between these two relay contact groups 44a and 44b. Relay wiring 44c.

  In the relay box 8, the measuring instrument side relay contact group 44 a and the device under test side relay contact group 44 b are controlled to be turned on / off by a control input from the personal computer 6 to the relay control circuit 42. The measurement signal is input-controlled to the device under test 14 and the measurement result signal of each device under test 14 is output-controlled to each measuring device 16, and the specific configuration of the relay wiring 44c is as shown in the figure. Details are omitted for the sake of brevity.

  The inspection of the inspection apparatus 2 will be described with reference to FIGS.

  FIG. 6 shows an inspection flowchart. In addition, there are two inspected devices 14 to be inspected by the inspection apparatus 2, the first and second inspected devices 141 and 142, and the inspection table of the first inspected device 141 is shown in FIG. An inspection table is shown in FIG. FIG. 9 shows a monitoring program.

  In the inspection table, “state”, “inspection item”, “program”, and “use measuring instrument” are described. “State” indicates the execution state of the inspection program, and represents “Run (running)”, “Skip (skip inspection)”, “Pass (examination of inspection)”, and “blank (inspection possible)”. .

  The monitoring program in FIG. 9 monitors the fixture number (inspection location), the types of the inspected devices 141 and 142, the program being executed, and the measuring instruments 161 to 163 to be used, and Skip On / Off of the inspection items. There is a function.

  The flowchart in FIG. 6 is a flowchart in which two first and second devices to be inspected 141 and 142 are executed by one inspection apparatus. When the inspection is started (n1, n2), the inspection items of the first and second devices to be inspected 141, 142 are confirmed with reference to the inspection tables of FIGS. 7 and 8, and all inspection items are Pass (inspection). If completed, the inspection is terminated (n3, n4).

  When all the inspection items are not Pass (end of inspection) but there are no blanks, waiting for inspection execution (n5, n6), and when there are blanks, the inspection is started (status: Run), and measuring instruments 161-163 Is in use (n5, n7, n8, n9) and the status is set to Pass (n10).

  When there is an inspection item that uses the measuring device 161-163 among uninspected items, the monitoring program sets the item to Skip (inspection skip), and leaves it blank when the inspection is completed. Then, when all the inspection items are finally lost, the inspection ends.

  In FIG. 7 and FIG. 8, the inspection items are current, voltage, power, the programs are programs A to D, and the measuring instruments 161 to 163 are an ammeter, a voltmeter, and a wattmeter, respectively.

  FIG. 10 shows the inspection process.

  In order to understand the description of this inspection process, there are two devices to be inspected (first inspected device 141 and second inspected device 142), and three measuring devices (ammeter 161, voltmeter 162, wattmeter 163). ). The number of inspection processes is four, A, B, C, and D. Each of the inspected devices 141 and 142 performs four inspections A, B, C, and D.

  In the first inspection A, the first device under test 141 uses an ammeter 161, and the second device under test 142 uses a voltmeter 162.

  In the second inspection B, the first device 141 to be inspected uses a voltmeter 162, and the second device to be inspected 142 uses an ammeter 161.

  In the third inspection C, the first device to be inspected 141 uses an ammeter 161 and a voltmeter 162, and the second device to be inspected 142 uses a wattmeter 163.

  In the fourth inspection D, the first device to be inspected 141 uses the wattmeter 163, and the second device to be inspected 142 uses the ammeter 161 and the voltmeter 162.

  That is, in the inspection apparatus according to the embodiment, among the three measuring devices, the ammeter 161 and the voltmeter 162 are used in all of the first to fourth inspections AD, and there is no idle state. The wattmeter 163 is idle in the first and second tests A and B, but is used in the third and fourth tests C and D.

  In the embodiment, all of the first to fourth inspections A to D are performed so that the first and second devices to be inspected 141 and 142 do not simultaneously execute the same inspection. Two identical measuring instruments are not required.

  That is, there is one ammeter 161, voltmeter 162, and wattmeter 163. On the other hand, conventionally, the first and second devices to be inspected 141 and 142 execute the same inspection in parallel at the same time, so two identical measuring devices are required.

  As described above, in the present embodiment, the required number of measuring instruments can be reduced as compared with the prior art, so that the cost required for the inspection facility can be greatly reduced. In the simultaneous and parallel inspection according to the present embodiment, a plurality of devices to be inspected 14 are performed by a single inspection device 2 by constantly checking resources used on a program and executing items that can be inspected one after another. be able to.

  On the other hand, the conventional inspection apparatus requires two identical inspection apparatuses including a measuring instrument in order to increase production capacity. In the present embodiment, the inspection capability can be improved by using only a plurality of fixtures 12 and simultaneously inspecting the same inspected device 14. By executing inspection items that can be inspected one after another on the program, it is possible to increase the operating rate of the measuring instrument and improve the inspection capability as compared with the conventional case.

  FIG. 11 shows the relay box 8 in the case of inspection (mixed flow inspection) when the device under test 14 is not the same type of device but another type of device under test, and FIG. 12 shows the inspection process of FIG.

  In the mixed flow inspection, the inspection capability is improved by simultaneously inspecting different types of inspected devices 14. In FIG. 11, the inspected devices are referred to as a first inspected device 143 and a second inspected device 144 for convenience of explanation.

  In the case of this mixed flow inspection, when the inspections A, B, and D of the first inspected device 143 and the second inspected device 144 are performed, the inspection A is performed on the first inspected device 143 with the ammeter 161. The inspection B of the second inspected device 144 is simultaneously performed by the wattmeter 163, the inspection B is performed on the first inspected device 143 by the voltmeter 162, and the inspection D of the second inspected device 144 is simultaneously performed by the ammeter 161. ing.

  In addition, since the wattmeter 161 used in common is alternately used and other inspections are performed during that time, the inspection is very efficient.

FIG. 1 is a view showing an appearance of an inspection apparatus according to an embodiment of the present invention. FIG. 2 is a view showing the appearance of the inspection apparatus according to the embodiment having increased inspection capability. FIG. 3 is a diagram illustrating a configuration of a fixture used in the inspection apparatus according to the embodiment. FIG. 4 is a diagram illustrating a hardware configuration of the inspection apparatus according to the embodiment. FIG. 5 is a diagram showing details of the relay box of FIG. FIG. 6 is a flowchart used for explaining the operation of the inspection apparatus according to the embodiment. FIG. 7 is a diagram showing an inspection table of the first device to be inspected. FIG. 8 is a diagram showing an inspection table of the second device to be inspected. FIG. 9 shows a monitoring program. FIG. 10 is a diagram showing an inspection process. FIG. 11 is a diagram showing details of a relay box that performs a mixed flow inspection. FIG. 12 is a diagram showing the inspection process of FIG.

Explanation of symbols

2 Inspection device 4 Monitor 6 Personal computer (control means)
8 Relay box (switch connection means)
42 relay control circuit 44 relay matrix circuit 44a, 44b relay contact group 44c relay wiring 10 measuring instrument rack 12 fixture 14 inspected apparatus 141 first inspected apparatus 142 second inspected apparatus 16 measuring instrument 161 ammeter (first measurement) vessel)
162 Voltmeter (second measuring instrument)
163 Wattmeter (Third measuring instrument)
18 Probing jig 20 Lower jig

Claims (4)

An inspection apparatus capable of performing a plurality of inspections with different items using a measuring instrument set including a plurality of measuring instruments for a plurality of inspected devices,
Switching connection means for individually switching and connecting each measuring device to each device under test;
Control means for controlling the switching connection of the switching connection means;
With
The control means controls the switching connection operation of the switching connection means, so that it is possible to execute in parallel inspection using different measuring devices for each of at least two devices to be inspected.
Inspection apparatus characterized by that. An inspection apparatus that performs a plurality of inspections with different items using a measuring instrument set composed of a plurality of measuring instruments for a plurality of inspected devices,
The apparatus main body includes at least a relay contact group for switching and connecting each measuring device to each device to be inspected, and a control means for controlling the switching connection operation of the relay contact group, and further,
It is detachable from the apparatus main body, and includes a fixture for setting the device to be inspected at a measurement position.
By the control means, the switching connection of the relay contact group is controlled, and a control using different measuring devices for each of at least two devices to be inspected is performed in parallel.
Inspection apparatus characterized by that.   The inspection apparatus according to claim 2, wherein the apparatus main body is capable of adding a fixture.   The inspection apparatus according to claim 2 or 3, wherein the apparatus main body is configured such that a fixture can be exchanged with another fixture.

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