JP2005528781A - 半導体ウェハー及び/又はハイブリッドを調整する方法及び装置 - Google Patents
半導体ウェハー及び/又はハイブリッドを調整する方法及び装置 Download PDFInfo
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- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Drying Of Solid Materials (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
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Abstract
Description
ラインr0,i1によって新たに送り込まれる乾燥空気と同様に、冷却に寄与する。乾燥
空気は、ラインi4を経て熱交換器95を出発し、加熱装置105の直ぐ後方で、該加熱
装置105を通って流される空気と混ざる。この乾燥空気は、付随する連結点から、第一実施形態と正しく同様に、ラインr4及び流出部材40を経て容器5の空気を調整すべく容器5に導かれる。
よって所定の温度とされ、その後、容器5の内部にラインr1及び流出部材30によって導かれる。
Claims (20)
- 半導体ウェハー及び/又はハイブリッドの調整方法であって、
少なくとも部分的に取り囲まれ、半導体ウェハー及び/又はハイブリッドを保持すべくウェハー/ハイブリッド保持装置(10)が配置される空間(1)を用意し、
ウェハー/ハイブリッド保持装置(10)を熱処理すべく、乾燥流体を、ウェハー/ハイブリッド保持装置(10)を通って導入し、
ウェハー/ハイブリッド保持装置(10)を出発する流体の少なくとも一部が、空間(1)内の空気を調整するのに用いられる、半導体ウェハー/ハイブリッドの調整方法。 - 空間(1)は、基本的に容器(5)によって取り囲まれることを特徴とする請求項1に記載の半導体ウェハー/ハイブリッドの調整方法。
- 前記一部は、まず熱処理され、その後空間(1)内に送り出されることを特徴とする請求項1又は2に記載の半導体ウェハー/ハイブリッドの調整方法。
- 前記一部は、空間(1)の外部で熱処理され、その後空間(1)に送り返されることを特徴とする請求項1,2又は3のいずれかに記載の半導体ウェハー/ハイブリッドの調整方法。
- 前記一部は、ウェハー/ハイブリッド保持装置(10)を出発した後に、空間(1)内に直接送り出されることを特徴とする請求項1に記載の半導体ウェハー/ハイブリッドの調整方法。
- 試料台(10)を出発した流体の第一の一部は、まず熱処理され、その後空間(1)内に送り出され、第二の一部は、ウェハー/ハイブリッド保持装置(10)を出発した後に、空間(1)内に直接送り出されることを特徴とする請求項1に記載の半導体ウェハー/ハイブリッドの調整方法。
- 第一及び第二の一部のうちの少なくとも一方は、流量に応じて調整可能であることを特徴とする請求項1に記載の半導体ウェハー/ハイブリッドの調整方法。
- 前記一部は、熱処理され、空間(1)内に送り出される前に、空間(1)の外部で予冷のために用いられ、特に、流体を予冷するために用いられることを特徴とする請求項3に記載の半導体ウェハー/ハイブリッドの調整方法。
- 半導体ウェハー及び/又はハイブリッドの調整装置であって、
半導体ウェハー及び/又はハイブリッドを保持すべくウェハー/ハイブリッド保持装置(10)が配置され、少なくとも部分的に取り囲まれる空間(1)と、
ウェハー/ハイブリッド保持装置(10)を熱処理すべく該ウェハー/ハイブリッド保持装置(10)を通って乾燥流体を導き、且つ、空間(1)内の空気を調整すべくウェハー/ハイブリッド保持装置(10)を出発した流体の少なくとも一部を該空間(1)に導くためのライン部材(r2,r3,r4,r5,i3,i4)とを備える、半導体ウェハ
ー及び/又はハイブリッドの調整装置。 - 前記ライン部材(r2,r3,r4,r5,i3,i4)は、
空間(1)の外部からウェハー/ハイブリッド保持装置(10)に流体を導くことが可能な第一ライン(r2)と、
ウェハー/ハイブリッド保持装置(10)から空間(1)の外部に流体を導くことが可能な第二ライン(r3)と、
空間(1)の外部から空間(1)に流体を送り返すことが可能な第三ライン(r4)とを備え、
第二ライン(r3)と第三ライン(r4)との間には、温度調整装置(70;70,80”)が設けられることを特徴とする請求項9に記載の半導体ウェハー及び/又はハイブリッドの調整装置。 - 流出部材(40)が、第三ライン(r4)の終端に設けられることを特徴とする請求項10に記載の半導体ウェハー及び/又はハイブリッドの調整装置。
- 前記ライン部材(r2,r3,r4,r5,i3,i4)は、
空間(1)の外部からウェハー/ハイブリッド保持装置(10)に流体を導くことが可能な第一ライン(r2)と、
ウェハー/ハイブリッド保持装置(10)から空間(1)に流体を導くことが可能な第四ライン(r5)とを備えることを特徴とする請求項9に記載の半導体ウェハー及び/又はハイブリッドの調整装置。 - 前記ライン部材(r2,r3,r4,r5,i3,i4)は、
ウェハー/ハイブリッド保持装置(10)から空間(1)の外部に流体を導くことが可能な第二ライン(r3)と、
空間(1)の外部から空間(1)に流体を送り返すことが可能な第三ライン(r4)とを備え、
第二ライン(r3)と第三ライン(r4)との間には、温度調整装置(70;70,80”)が設けられることを特徴とする請求項12に記載の半導体ウェハー及び/又はハイブリッドの調整装置。 - 第四ライン(r5)の流量を調整すべく、バルブ(45)が設けられることを特徴とする請求項12又は13に記載の半導体ウェハー及び/又はハイブリッドの調整装置。
- 温度調整装置(70;70,80”)は、加熱装置(105)を備えることを特徴とする請求項10から14のいずれか一つに記載の半導体ウェハー及び/又はハイブリッドの調整装置。
- 温度調整装置(70;70,80”)は、空間(1)を出発した流体の少なくとも一部が導かれ得る熱交換器(95)を備えることを特徴とする請求項10から15のいずれか一つに記載の半導体ウェハー及び/又はハイブリッドの調整装置。
- 熱交換器(95)は、送り込まれた流体を予冷すべく用いられることを特徴とする請求項16に記載の半導体ウェハー及び/又はハイブリッドの調整装置。
- 前記ライン部材(r2,r3,r4,r5,i3,i4)は、熱交換器(95)を出発
した一部が、空気を調整すべく、部分的に空間に送り返されるように構成されることを特徴とする請求項13に記載の半導体ウェハー及び/又はハイブリッドの調整装置。 - 乾燥流体が付加的に空間(1)の外部から空間(1)に直接導かれるライン(r1)がさらに設けられることを特徴とする請求項9から18のいずれか一つに記載の半導体ウェハー及び/又はハイブリッドの調整装置。
- 空間(1)は、基本的に容器(5)に取り囲まれることを特徴とする請求項9から19のいずれか一つに記載の半導体ウェハー及び/又はハイブリッドの調整装置。
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE10216786A DE10216786C5 (de) | 2002-04-15 | 2002-04-15 | Verfahren und Vorrichtung zur Konditionierung von Halbleiterwafern und/oder Hybriden |
| PCT/EP2003/003937 WO2003088323A1 (de) | 2002-04-15 | 2003-04-15 | Verfahren und vorrichtung zur konditionierung von halbleiterwafern und/oder hybriden |
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| Publication Number | Publication Date |
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| JP2005528781A true JP2005528781A (ja) | 2005-09-22 |
| JP4070724B2 JP4070724B2 (ja) | 2008-04-02 |
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| Application Number | Title | Priority Date | Filing Date |
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| JP2003585158A Expired - Lifetime JP4070724B2 (ja) | 2002-04-15 | 2003-04-15 | 温度調整方法及び検査測定装置 |
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| Country | Link |
|---|---|
| US (1) | US7900373B2 (ja) |
| EP (1) | EP1495486B3 (ja) |
| JP (1) | JP4070724B2 (ja) |
| KR (1) | KR100625631B1 (ja) |
| CN (1) | CN100378903C (ja) |
| AT (1) | ATE341831T1 (ja) |
| AU (1) | AU2003224079A1 (ja) |
| CA (1) | CA2481260C (ja) |
| DE (2) | DE10216786C5 (ja) |
| DK (1) | DK1495486T5 (ja) |
| ES (1) | ES2274225T7 (ja) |
| NO (1) | NO336896B1 (ja) |
| PL (1) | PL211045B1 (ja) |
| PT (1) | PT1495486E (ja) |
| RU (1) | RU2284609C2 (ja) |
| WO (1) | WO2003088323A1 (ja) |
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- 2003-04-15 AT AT03720475T patent/ATE341831T1/de active
- 2003-04-15 WO PCT/EP2003/003937 patent/WO2003088323A1/de not_active Ceased
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- 2003-04-15 RU RU2004130436/28A patent/RU2284609C2/ru active
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- 2003-04-15 CA CA2481260A patent/CA2481260C/en not_active Expired - Fee Related
- 2003-04-15 EP EP03720475A patent/EP1495486B3/de not_active Expired - Lifetime
- 2003-04-15 ES ES03720475T patent/ES2274225T7/es active Active
- 2003-04-15 AU AU2003224079A patent/AU2003224079A1/en not_active Abandoned
- 2003-04-15 PT PT03720475T patent/PT1495486E/pt unknown
- 2003-04-15 PL PL371238A patent/PL211045B1/pl unknown
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Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
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| JP2013167458A (ja) * | 2012-02-14 | 2013-08-29 | Seiko Epson Corp | ハンドラー、及び部品検査装置 |
| JP2016153810A (ja) * | 2016-05-16 | 2016-08-25 | セイコーエプソン株式会社 | ハンドラー、及び部品検査装置 |
| JP2016148686A (ja) * | 2016-05-25 | 2016-08-18 | セイコーエプソン株式会社 | ハンドラー、及び部品検査装置 |
| WO2019163608A1 (ja) * | 2018-02-26 | 2019-08-29 | 東京エレクトロン株式会社 | 検査装置及び検査装置の動作方法 |
| JP2019149421A (ja) * | 2018-02-26 | 2019-09-05 | 東京エレクトロン株式会社 | 検査装置及び検査装置の動作方法 |
| KR20200113223A (ko) * | 2018-02-26 | 2020-10-06 | 도쿄엘렉트론가부시키가이샤 | 검사 장치 및 검사 장치 동작 방법 |
| JP7012558B2 (ja) | 2018-02-26 | 2022-01-28 | 東京エレクトロン株式会社 | 検査装置及び検査装置の動作方法 |
| US11614477B2 (en) | 2018-02-26 | 2023-03-28 | Tokyo Electron Limited | Inspection device and method for operating inspection device |
| TWI798355B (zh) * | 2018-02-26 | 2023-04-11 | 日商東京威力科創股份有限公司 | 檢查裝置及檢查裝置之動作方法 |
| KR102527533B1 (ko) * | 2018-02-26 | 2023-04-28 | 도쿄엘렉트론가부시키가이샤 | 검사 장치 |
| JP2023051113A (ja) * | 2021-09-30 | 2023-04-11 | 東京エレクトロン株式会社 | 検査装置、および露点管理方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| DE50305265D1 (de) | 2006-11-16 |
| KR20040111509A (ko) | 2004-12-31 |
| PL211045B1 (pl) | 2012-04-30 |
| ES2274225T3 (es) | 2007-05-16 |
| DK1495486T3 (da) | 2007-02-05 |
| CN100378903C (zh) | 2008-04-02 |
| EP1495486B1 (de) | 2006-10-04 |
| CA2481260A1 (en) | 2003-10-23 |
| DE10216786B4 (de) | 2004-07-15 |
| WO2003088323A1 (de) | 2003-10-23 |
| PT1495486E (pt) | 2007-01-31 |
| EP1495486A1 (de) | 2005-01-12 |
| ES2274225T7 (es) | 2010-03-31 |
| ATE341831T1 (de) | 2006-10-15 |
| US20050227503A1 (en) | 2005-10-13 |
| DE10216786A1 (de) | 2003-11-06 |
| CN1647246A (zh) | 2005-07-27 |
| RU2284609C2 (ru) | 2006-09-27 |
| CA2481260C (en) | 2010-10-12 |
| JP4070724B2 (ja) | 2008-04-02 |
| EP1495486B3 (de) | 2009-10-21 |
| DK1495486T5 (da) | 2010-03-08 |
| DE10216786C5 (de) | 2009-10-15 |
| NO20044607L (no) | 2004-10-26 |
| RU2004130436A (ru) | 2005-07-10 |
| AU2003224079A1 (en) | 2003-10-27 |
| PL371238A1 (pl) | 2005-06-13 |
| KR100625631B1 (ko) | 2006-09-20 |
| US7900373B2 (en) | 2011-03-08 |
| NO336896B1 (no) | 2015-11-23 |
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