[go: up one dir, main page]

JP2001198540A - Cleaning sheet - Google Patents

Cleaning sheet

Info

Publication number
JP2001198540A
JP2001198540A JP2000177964A JP2000177964A JP2001198540A JP 2001198540 A JP2001198540 A JP 2001198540A JP 2000177964 A JP2000177964 A JP 2000177964A JP 2000177964 A JP2000177964 A JP 2000177964A JP 2001198540 A JP2001198540 A JP 2001198540A
Authority
JP
Japan
Prior art keywords
cleaning
layer
cleaning sheet
sensitive adhesive
adhesive layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2000177964A
Other languages
Japanese (ja)
Other versions
JP4718667B2 (en
Inventor
Akira Namikawa
亮 並河
Jiro Nukaga
二郎 額賀
Hideshi Toyoda
英志 豊田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nitto Denko Corp
Original Assignee
Nitto Denko Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to JP2000177964A priority Critical patent/JP4718667B2/en
Application filed by Nitto Denko Corp filed Critical Nitto Denko Corp
Priority to DE2001629687 priority patent/DE60129687T2/en
Priority to EP20100011695 priority patent/EP2266716A2/en
Priority to EP01926156A priority patent/EP1286792B1/en
Priority to EP07004040.7A priority patent/EP1782894A3/en
Priority to CNB018106811A priority patent/CN100400185C/en
Priority to KR1020027016584A priority patent/KR100786437B1/en
Priority to EP20100011696 priority patent/EP2266717A2/en
Priority to PCT/JP2001/003848 priority patent/WO2001094036A1/en
Priority to MYPI20012130A priority patent/MY135752A/en
Priority to US10/297,173 priority patent/US7713356B2/en
Publication of JP2001198540A publication Critical patent/JP2001198540A/en
Priority to US11/014,779 priority patent/US7793668B2/en
Priority to US11/229,586 priority patent/US20060105164A1/en
Priority to US12/851,797 priority patent/US20100319151A1/en
Application granted granted Critical
Publication of JP4718667B2 publication Critical patent/JP4718667B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Adhesive Tapes (AREA)
  • Adhesives Or Adhesive Processes (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Cleaning In General (AREA)

Abstract

(57)【要約】 【課題】 本発明は、例えば、半導体、フラットパネル
ディスプレイ、プリント基板などの製造装置や検査装置
など、異物を嫌う基板処理装置のクリーニングシートを
提供する。 【解決手段】 支持体に、実質的に粘着性を有さずかつ
引張弾性率(試験法JIS K7127に準ずる)が
0.98N/mm2以上のクリーニング層が設けられて
なる、又はさらに他面に通常の粘着剤層が設けられてな
るクリーニングシートである。
(57) Abstract: The present invention provides a cleaning sheet for a substrate processing apparatus that rejects foreign matter, such as a manufacturing apparatus or an inspection apparatus for semiconductors, flat panel displays, printed boards, and the like. SOLUTION: The support is provided with a cleaning layer having substantially no tackiness and having a tensile modulus of elasticity of 0.98 N / mm 2 or more (according to test method JIS K7127), or the other surface. Is a cleaning sheet provided with a normal pressure-sensitive adhesive layer.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、各種装置をクリー
ニングするシートに関し、例えば、半導体、フラットパ
ネルディスプレイ、プリント基板などの製造装置や検査
装置など、異物を嫌う基板処理装置のクリーニングシー
トに関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a sheet for cleaning various devices, and more particularly, to a cleaning sheet for a substrate processing apparatus which does not like foreign substances, such as a manufacturing apparatus and an inspection apparatus for semiconductors, flat panel displays and printed circuit boards.

【0002】[0002]

【従来の技術】各種基板処理装置は、各搬送系と基板と
を物理的に接触させながら搬送する。その際、基板や搬
送系に異物が付着していると、後続の基板を次々に汚染
することになり、定期的に装置を停止させ、洗浄処理を
する必要があった。このため、稼働率低下や多大な労力
が必要になるという問題があった。これらの問題を解決
するため、粘着性の物質を固着した基板を搬送すること
により基板処理装置内の付着した異物をクリーニング除
去する方法が提案されている(例えば特開平10−15
4686号)。
2. Description of the Related Art Various substrate processing apparatuses transport substrates while physically contacting each transport system with a substrate. At that time, if foreign matter is attached to the substrate or the transport system, the subsequent substrate is contaminated one after another, and it is necessary to periodically stop the apparatus and perform a cleaning process. For this reason, there has been a problem that the operation rate is reduced and a large amount of labor is required. In order to solve these problems, there has been proposed a method of cleaning and removing adhered foreign matter in a substrate processing apparatus by transporting a substrate to which an adhesive substance is adhered (for example, Japanese Patent Application Laid-Open No. H10-15).
No. 4686).

【0003】[0003]

【発明が解決しようとする課題】粘着性の物質を固着し
た基板を搬送することにより基板処理装置内の付着した
異物をクリーニング除去する方法は、前述の課題を克服
する有効な方法である。しかしこの方法では粘着性物質
と装置接触部とが強く接着しすぎて剥れない恐れがあ
り、基板を確実に搬送できなくなる恐れがあった。本発
明は、このような事情に照らし、基板処理装置内に基板
を確実に搬送できると共に、装置内に付着している異物
を簡便かつ確実に除去できるクリーニングシートを提供
することを目的としている。
The method of cleaning and removing the adhered foreign matter in the substrate processing apparatus by transporting the substrate to which the adhesive substance is fixed is an effective method for overcoming the above-mentioned problem. However, in this method, the sticky substance and the device contact portion may be so strongly adhered that they cannot be peeled off, and the substrate may not be transported reliably. The present invention has been made in view of the above circumstances, and has as its object to provide a cleaning sheet that can reliably transport a substrate into a substrate processing apparatus and that can easily and surely remove foreign substances attached to the apparatus.

【0004】[0004]

【課題を解決するための手段】本発明者らは、上記の目
的を達成するために、鋭意検討した結果、クリーニング
層を固着したシートあるいはこのシートを固着した基板
を搬送することにより、基板処理装置内の付着した異物
をクリーニング除去するにあたり、そのクリーニング層
として実質的に粘着性を有さずかつその引張弾性率を特
定値以上にすることにより、前記問題を生じることな
く、さらに異物を簡便かつ確実に除去できることを見出
し、本発明を完成するに至つた。
Means for Solving the Problems The inventors of the present invention have conducted intensive studies to achieve the above object, and as a result, by transporting a sheet to which a cleaning layer is fixed or a substrate to which this sheet is fixed, the substrate processing is performed. In cleaning and removing foreign substances attached to the apparatus, the cleaning layer has substantially no tackiness and its tensile modulus is set to a specific value or more, so that the above-described problem does not occur and foreign substances can be further simplified. The inventors have found that they can be reliably removed, and have completed the present invention.

【0005】即ち、本発明は、支持体に、実質的に粘着
性を有さずかつ引張弾性率(試験法JIS K7127
に準ずる)が0.98N/mm2以上のクリーニング層
が設けられてなるクリーニングシート(請求項1)、支
持体の片面に、実質的に粘着性を有さず引張弾性率(試
験法JIS K7127に準ずる)が0.98N/mm
2以上のクリーニング層が設けられ、他面に通常の粘着
剤層が設けられてなるクリーニングシート(請求項
2)、クリーニング層が、感圧接着性ポリマーに分子内
に不飽和二重結合を1個以上有する化合物と重合開始剤
を少なくとも含有させたものを、活性エネルギーにより
重合硬化反応させて粘着性が実質的に消失されてなるク
リーニングシート(請求項3)、さらにクリーニング層
の表面抵抗率が1×1013Ω/□以上であるクリーニン
グシート(請求項4)、通常の粘着剤層のシリコンウエ
ハ(ミラー面)に対する180°引き剥がし粘着力が
0.21〜0.98N/10mmであるクリーニングシ
ート(請求項5)などに係るものである。
That is, according to the present invention, the support has substantially no tackiness and a tensile modulus (test method JIS K7127).
A cleaning sheet provided with a cleaning layer having a thickness of 0.98 N / mm 2 or more (according to JIS K7127), having substantially no tackiness on one side of the support and having a tensile modulus of elasticity (test method JIS K7127). 0.98 N / mm
A cleaning sheet comprising two or more cleaning layers and a normal pressure-sensitive adhesive layer on the other surface (Claim 2). The cleaning layer comprises a pressure-sensitive adhesive polymer having one unsaturated double bond in the molecule. A cleaning sheet (Claim 3) in which a compound containing at least a compound having at least one and a polymerization initiator is subjected to a polymerization-curing reaction with active energy to substantially eliminate tackiness, and further, the surface resistivity of the cleaning layer is reduced. A cleaning sheet having a resistivity of 1 × 10 13 Ω / □ or more (Claim 4), and a cleaning agent having a 180 ° peeling adhesive force of 0.21 to 0.98 N / 10 mm with respect to a silicon wafer (mirror surface) of a normal adhesive layer. It relates to a sheet (Claim 5).

【0006】[0006]

【発明の実施の形態】本発明のクリーニングシートは、
支持体の片面にクリーニング層が設けられ、該クリーニ
ング層は、その引張弾性率(試験法JIS K7127
に準ずる)が0.98N/mm2以上、好ましくは9.
8〜3000N/mm2であることが必要である。 か
かる引張弾性率が0.98N/mm2未満の場合、クリ
ーニング層が粘着性を発現するようになり、搬送時に装
置内の被クリーニング部に接着して搬送トラブルとなる
恐れがある。
DESCRIPTION OF THE PREFERRED EMBODIMENTS The cleaning sheet of the present invention
A cleaning layer is provided on one side of the support, and the cleaning layer has a tensile elasticity (test method JIS K7127).
0.98 N / mm 2 or more, and preferably 9.9 N / mm 2 .
It needs to be 8 to 3000 N / mm 2 . When the tensile elastic modulus is less than 0.98 N / mm 2 , the cleaning layer becomes tacky, and may adhere to a portion to be cleaned in the apparatus at the time of transport, causing a transport trouble.

【0007】かかるクリーニング層は、その引張弾性率
が前述の特定値以上で実質的に粘着性を有しない限り、
その材質等は特に限定されないが、紫外線や熱などの活
性エネルギー源により架橋反応や硬化が促進されて、そ
の引張弾性率を大きくできるものが好ましい。さらに、
該クリーニング層は、その表面抵抗率が1×1013Ω/
□以上、好ましくは1×1014Ω/□以上であることが
望ましい。クリーニング層の表面抵抗率をかかる特定値
以上に設計して、クリーニング層をできるだけ絶縁体に
することにより、静電気による異物の捕獲、吸着できる
という効果も得られる。 よって、表面抵抗率が1×1
13Ω/□未満の場合は、かかる静電気による異物の捕
獲、吸着効果が著しく低下する。
As long as the cleaning layer has a tensile modulus equal to or higher than the specific value described above and does not substantially have tackiness,
The material and the like are not particularly limited, but those which can promote a crosslinking reaction and curing by an active energy source such as ultraviolet light or heat and increase the tensile elastic modulus thereof are preferable. further,
The cleaning layer has a surface resistivity of 1 × 10 13 Ω /.
It is desirably at least □, preferably at least 1 × 10 14 Ω / □. By designing the surface resistivity of the cleaning layer to be equal to or more than the specific value and making the cleaning layer an insulator as much as possible, it is possible to obtain an effect that foreign matter can be captured and adsorbed by static electricity. Therefore, the surface resistivity is 1 × 1
If it is less than 0 13 Ω / □, the effect of capturing and adsorbing foreign matter due to such static electricity is significantly reduced.

【0008】かかるクリーニング層としては、例えば感
圧接着性ポリマーに分子内に不飽和二重結合を1個以上
有する化合物と重合開始剤を少なくとも含有させたもの
を、活性エネルギーにより重合硬化反応させて粘着性が
実質的に消失されてなるものが好ましい。かかる感圧接
着性ポリマーとしては、例えばアクリル酸、アクリル酸
エステル、メタクリル酸、メタクリル酸エステルから選
ばれる(メタ)アクリル酸及び/又は(メタ)アクリル
酸エステルを主モノマーとしたアクリル系ポリマーが挙
げられる。このアクリル系ポリマーの合成にあたり、共
重合モノマーとして分子内に不飽和二重結合を2個以上
有する化合物を用いるか、あるいは合成後のアクリル系
ポリマーに分子内に不飽和二重結合を有する化合物を官
能基間の反応で化学結合させるなどして、アクリル系ポ
リマーの分子内に不飽和二重結合を導入しておくことに
より、このポリマー自体も活性エネルギーにより重合硬
化反応に関与させるようにすることもできる。
As such a cleaning layer, for example, a pressure-sensitive adhesive polymer containing at least a compound having at least one unsaturated double bond in a molecule and a polymerization initiator is subjected to a polymerization curing reaction by active energy. It is preferable that the tackiness is substantially eliminated. Examples of such a pressure-sensitive adhesive polymer include acrylic polymers having a main monomer of (meth) acrylic acid and / or (meth) acrylic ester selected from acrylic acid, acrylic ester, methacrylic acid, and methacrylic ester. Can be In synthesizing this acrylic polymer, a compound having two or more unsaturated double bonds in the molecule is used as a copolymerization monomer, or a compound having an unsaturated double bond in the molecule is synthesized from the synthesized acrylic polymer. By introducing an unsaturated double bond into the molecule of the acrylic polymer, for example, by chemically bonding through a reaction between functional groups, the polymer itself can be involved in the polymerization curing reaction by active energy. Can also.

【0009】ここで、分子内に不飽和二重結合を1個以
上有する化合物(以下、重合性不飽和化合物という)と
しては、不揮発性でかつ重量平均分子量が10000以
下の低分子量体であるのがよく、特に硬化時の接着剤層
の三次元網状化が効率よくなされるように、5000以
下の分子量を有しているのが好ましい。
The compound having one or more unsaturated double bonds in the molecule (hereinafter referred to as a polymerizable unsaturated compound) is a low molecular weight compound which is nonvolatile and has a weight average molecular weight of 10,000 or less. In particular, the adhesive layer preferably has a molecular weight of 5,000 or less so that the three-dimensional network of the adhesive layer at the time of curing can be efficiently formed.

【0010】また、クリーニング層に添加される重合開
始剤は、特に限定されず公知のものを使用でき、例えば
活性エネルギー源に熱を用いる場合は、ベンゾイルパー
オキサイド、アゾビスイソブチロニトリルなどの熱重合
開始剤、また光を用いる場合は、ベンゾイル、ベンゾイ
ンエチルエーテル、シベンジル、イソプロピルベンゾイ
ンエーテル、ベンゾフェノン、ミヒラーズケトンクロロ
チオキサントン、ドデシルチオキサントン、ジメチルチ
オキサントン、アセトフェノンジエチルケタール、ベン
ジルジメチルケタール、α−ヒドルキシシクロヒキシル
フェニルケトン、2−ヒドロキシジメチルフェニルプロ
パン、2,2−ジメトキシ−2−フェニルアセトフェノ
ンなどの光重合開始剤が挙げられる。またクリーニング
層の厚さは特に限定されないが、通常5〜100μm程
度である。
The polymerization initiator to be added to the cleaning layer is not particularly limited, and a known initiator can be used. For example, when heat is used as an active energy source, benzoyl peroxide, azobisisobutyronitrile, etc. When a thermal polymerization initiator or light is used, benzoyl, benzoin ethyl ether, cibenzyl, isopropyl benzoin ether, benzophenone, Michler's ketone chlorothioxanthone, dodecylthioxanthone, dimethylthioxanthone, acetophenone diethyl ketal, benzyl dimethyl ketal, α-hiddle Photopolymerization initiators such as xycyclohexylphenyl ketone, 2-hydroxydimethylphenylpropane, and 2,2-dimethoxy-2-phenylacetophenone are exemplified. The thickness of the cleaning layer is not particularly limited, but is usually about 5 to 100 μm.

【0011】本発明は、支持体の片面に、上記の特定の
クリーニング層が設けられ、他面に通常の粘着剤層が設
けられたクリーニングシートも提供する。 この他面側
の粘着剤層は、粘着機能を満たす限りその材質などは特
に限定されず、通常の粘着剤(例えばアクリル系、ゴム
系など)を用いることができる。かかる構成とすること
により、クリーニングシートを通常の粘着剤層により各
種基板や他のテープ・シートなどの搬送部材に貼り付け
て、クリーニング機能付き搬送部材(請求項6)として
装置内に搬送して、被洗浄部位に接触させてクリーニン
グすること(請求項7)もできる。
The present invention also provides a cleaning sheet in which the above-mentioned specific cleaning layer is provided on one side of a support and the ordinary pressure-sensitive adhesive layer is provided on the other side. The material of the pressure-sensitive adhesive layer on the other side is not particularly limited as long as it satisfies the pressure-sensitive adhesive function, and a normal pressure-sensitive adhesive (for example, acrylic or rubber-based) can be used. With this configuration, the cleaning sheet is attached to a transport member such as various substrates or other tapes / sheets with a normal adhesive layer, and is transported into the apparatus as a transport member with a cleaning function (Claim 6). Alternatively, cleaning can be performed by contacting the part to be cleaned (claim 7).

【0012】本発明において上記の基板などの搬送部材
を再利用するために、クリーニング後に基板をかかる粘
着剤層から剥がす場合は、かかる通常の粘着剤層の粘着
力は、シリコンウエハ(ミラー面)に対する180°引
き剥がし粘着力が0.21〜0.98N/10mm(請
求項5)、特に0.40〜0.98N/10mm程度で
あれば、搬送中に剥離することなく、かつクリーンニン
グ後に容易に再剥離できるので好ましい。
In the present invention, when the substrate is peeled off from the pressure-sensitive adhesive layer after cleaning in order to reuse the transfer member such as the substrate, the adhesive force of the normal pressure-sensitive adhesive layer is determined by a silicon wafer (mirror surface). 180 ° peeling strength to 0.21 to 0.98 N / 10 mm (Claim 5), especially about 0.40 to 0.98 N / 10 mm, without peeling during transportation and after cleaning It is preferable because it can be easily removed again.

【0013】またクリーニング層の支持体としては特に
限定されないが、例えばポリエチレン、ポリエチレンテ
レフタレート、アセチルセルロース、ポリカーボネー
ト、ポリプロピレン、ポリアミドなどのプラスチックフ
ィルムなどが挙げられる。 その厚みは通常10〜10
0μm程度である。
The support for the cleaning layer is not particularly limited, and examples thereof include plastic films such as polyethylene, polyethylene terephthalate, acetylcellulose, polycarbonate, polypropylene and polyamide. Its thickness is usually 10 to 10
It is about 0 μm.

【0014】クリーニングシートが貼り付けられる搬送
部材としては特に限定されないが、例えば半導体ウエ
ハ、LCD、PDPなどのフラットパネルディスプレイ
用基板、その他コンパクトディスク、MRヘッドなどの
基板などが挙げられる。
The transport member to which the cleaning sheet is adhered is not particularly limited, and examples thereof include semiconductor wafers, substrates for flat panel displays such as LCDs and PDPs, and other substrates such as compact disks and MR heads.

【0015】[0015]

【実施例】以下、本発明を実施例に基づいて説明する
が、本発明はこれらに限定されるものではない。 な
お、以下、部とあるのは重量部を意味するものとする。 実施例 アクリル酸−2−エチルヘキシル75部、アクリル酸メ
チル20部、及びアクリル酸5部からなるモノマ―混合
液から得たアクリル系ポリマー(重量平均分子量70
万)100部に対して、ポリエチレングリコ―ルジメタ
クリレ―ト50部、ウレタンアクリレ―ト50部、ベン
ジルジメチルケタール3部、及びジフエニルメタンジイ
ソシアネ―ト3部を均一に混合し、紫外線硬化型の粘着
剤溶液とした。この粘着剤に中心波長365nmの紫外
線を積算光量1000mJ/cm2照射して硬化させた
後の引張弾性率は49N/mm2であった。ここで引張
弾性率は、試験法JIS K7127に準じて測定し
た。一方、上記粘着剤からベンジルジメチルケタールを
除いた以外は、上記と同様にして得た粘着剤溶液を、幅
250mm、厚み38μmのポリエステル製剥離フィル
ムの剥離面に、乾燥後の厚みが10μmになるように塗
布して通常の粘着剤層を設けた。 次に厚み38μmの
ポリエステル製剥離フィルムの剥離面に、前記の紫外線
硬化型粘着剤溶液を乾燥後の厚みが40μmになるよう
に塗布してクリーニング層を設け、先に作製した通常の
粘着剤層面をその表面に貼り合せた。このシートに中心
波長365nmの紫外線を積算光量1000mJ/cm
2照射して、本発明のクリーニングシートを得た。 か
かるクリーニング層の表面は実質的に粘着性は有してい
なかった。また、温度23℃、湿度60%RHの条件下
でクリーニング層上から表面抵抗率を表面抵抗測定計
(三菱化学社製、型式MCP−UP450)にて測定したとこ
ろ、9.99×1013Ω/□以上で測定不能であった。
また、他面側の通常の粘着剤層をシリコンウエハのミラ
ー面に幅10mmで貼り付け、JISZ0237に準じ
てシリコンウエハに対する180°引き剥がし粘着力を
測定した結果、0.25N/10mmであった。
EXAMPLES The present invention will be described below with reference to examples, but the present invention is not limited to these examples. Hereinafter, “parts” means “parts by weight”. Example An acrylic polymer (weight average molecular weight 70) obtained from a monomer mixture consisting of 75 parts of 2-ethylhexyl acrylate, 20 parts of methyl acrylate, and 5 parts of acrylic acid
100 parts), uniformly mix 50 parts of polyethylene glycol dimethacrylate, 50 parts of urethane acrylate, 3 parts of benzyl dimethyl ketal, and 3 parts of diphenylmethane diisocyanate, and cure by ultraviolet light. A mold-type adhesive solution was obtained. The tensile elasticity after curing the adhesive by irradiating it with ultraviolet light having a central wavelength of 365 nm and an integrated light quantity of 1000 mJ / cm 2 was 49 N / mm 2 . Here, the tensile modulus was measured according to the test method JIS K7127. On the other hand, a pressure-sensitive adhesive solution obtained in the same manner as described above, except that benzyldimethyl ketal was removed from the pressure-sensitive adhesive, was dried to a thickness of 10 μm on a release surface of a polyester release film having a width of 250 mm and a thickness of 38 μm. To form an ordinary pressure-sensitive adhesive layer. Next, on the release surface of a 38 μm-thick polyester release film, the above-mentioned ultraviolet-curable pressure-sensitive adhesive solution was applied so as to have a thickness of 40 μm after drying, and a cleaning layer was provided. Was adhered to the surface. Ultraviolet light having a central wavelength of 365 nm is applied to this sheet at an integrated light amount of 1000 mJ / cm.
After 2 irradiations, a cleaning sheet of the present invention was obtained. The surface of such a cleaning layer had substantially no tackiness. When the surface resistivity was measured from above the cleaning layer with a surface resistivity meter (Model MCP-UP450, manufactured by Mitsubishi Chemical Corporation) under the conditions of a temperature of 23 ° C. and a humidity of 60% RH, it was 9.99 × 10 13 Ω. The measurement was impossible at // or more.
Further, the normal pressure-sensitive adhesive layer on the other side was adhered to the mirror surface of the silicon wafer with a width of 10 mm, and the 180 ° peeling strength of the silicon wafer with respect to the silicon wafer was measured according to JISZ0237. As a result, it was 0.25 N / 10 mm. .

【0016】このクリーニングシートの通常の粘着剤層
側の剥離フィルムを剥がし、8inchのシリコンウエ
ハの裏面(ミラー面)にハンドローラで貼り付け、クリ
ーニング機能付き搬送用クリーニングウエハを作製し
た。
The release film on the normal pressure-sensitive adhesive layer side of the cleaning sheet was peeled off and affixed to the back surface (mirror surface) of an 8-inch silicon wafer with a hand roller to produce a transport cleaning wafer having a cleaning function.

【0017】一方、基板処理装置のウエハステージを2
つ取り外し、レーザー式異物測定装置で、0.3μm以
上の異物を測定したところ、8inchウエハサイズの
エリア内で1つは18000個、もう一つは17000
個であった。
On the other hand, the wafer stage of the substrate processing apparatus is
When a foreign substance having a size of 0.3 μm or more was measured using a laser type foreign substance measuring apparatus, one of the 18,000 pieces and one of the foreign substances were 17000 in an 8-inch wafer size area.
Was individual.

【0018】次いで前記で得た搬送用クリーニングウエ
ハのクリーニング層側の剥離フィルムを剥がし、上記の
18000個の異物が付着していたウエハステージを持
つ基板処理装置内に搬送したところ、支障なく搬送でき
た。 その後にウエハステージを取り外し、レーザー式
異物測定装置で0.3μm以上の異物を測定したとこ
ろ、8inchウエハサイズのエリア内で4000個で
あり、クリーニング前に付着していた異物数の3/4以
上を除去することができた。
Next, the release film on the cleaning layer side of the cleaning wafer for transfer obtained above was peeled off, and was transferred into a substrate processing apparatus having a wafer stage to which 18,000 foreign substances had adhered. Was. After that, the wafer stage was removed, and a foreign substance having a size of 0.3 μm or more was measured with a laser type foreign substance measuring apparatus. Could be removed.

【0019】比較例 実施例において、ベンジルジメチルケタールを0.05
部にした以外は、実施例と同じ方法で作製したクリーニ
ングシートのクリーニング層は粘着性を有し、その引張
弾性率を測定したところ、0.5N/mm2であった。
このクリーニングシートから実施例と同じ方法で作製し
た搬送用クリーニングウエハを、17000個の異物が
付着しているウエハステージを持つ基板処理装置内を搬
送したところ、搬送アームに接着し、搬送できなかっ
た。
COMPARATIVE EXAMPLE In the examples, benzyldimethyl ketal was added at 0.05%.
The cleaning layer of the cleaning sheet prepared in the same manner as in the example except that the cleaning layer had an adhesive portion was tacky, and its tensile modulus was measured to be 0.5 N / mm 2 .
When a transfer cleaning wafer produced in the same manner as in the example from this cleaning sheet was transferred in a substrate processing apparatus having a wafer stage to which 17000 foreign substances were attached, it was adhered to a transfer arm and could not be transferred. .

【0020】[0020]

【発明の効果】以上のように本発明のクリーニングシー
トによれば、基板処理装置内を確実に搬送できると共
に、装置内に付着している異物を簡便かつ確実に除去で
きる。
As described above, according to the cleaning sheet of the present invention, the inside of the substrate processing apparatus can be reliably transported, and the foreign substances adhering to the apparatus can be easily and reliably removed.

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.7 識別記号 FI テーマコート゛(参考) // A47L 25/00 A47L 25/00 B Fターム(参考) 3B116 AA02 AA03 AA46 AB01 BC01 BC07 4J004 AA05 AA10 AB01 AB07 CA02 CA04 CA06 CC03 EA06 FA04 FA05 FA10 5F031 CA02 CA04 CA11 FA01 FA02 MA37 PA24 ──────────────────────────────────────────────────続 き Continued on the front page (51) Int.Cl. 7 Identification symbol FI theme coat ゛ (reference) // A47L 25/00 A47L 25/00 B F term (reference) 3B116 AA02 AA03 AA46 AB01 BC01 BC07 4J004 AA05 AA10 AB01 AB07 CA02 CA04 CA06 CC03 EA06 FA04 FA05 FA10 5F031 CA02 CA04 CA11 FA01 FA02 MA37 PA24

Claims (7)

【特許請求の範囲】[Claims] 【請求項1】 支持体に、実質的に粘着性を有さずかつ
引張弾性率(試験法JIS K7127に準ずる)が
0.98N/mm2以上のクリーニング層が設けられて
なるクリーニングシート。
1. A cleaning sheet comprising a support and a cleaning layer having substantially no tackiness and having a tensile elasticity of 0.98 N / mm 2 or more (according to JIS K7127).
【請求項2】 支持体の片面に、実質的に粘着性を有さ
ず引張弾性率(試験法JIS K7127に準ずる)が
0.98N/mm2以上のクリーニング層が設けられ、
他面に通常の粘着剤層が設けられてなるクリーニングシ
ート。
2. A cleaning layer having substantially no tackiness and having a tensile modulus of elasticity of 0.98 N / mm 2 or more (according to JIS K7127) is provided on one surface of the support,
A cleaning sheet having a normal pressure-sensitive adhesive layer provided on the other surface.
【請求項3】 クリーニング層が、感圧接着性ポリマー
に分子内に不飽和二重結合を1個以上有する化合物と重
合開始剤を少なくとも含有させたものを、活性エネルギ
ーにより重合硬化反応させて粘着性が実質的に消失され
てなる請求項1又は2記載のクリーニングシート。
3. A cleaning layer comprising a pressure-sensitive adhesive polymer containing at least a compound having at least one unsaturated double bond in a molecule and a polymerization initiator, which is subjected to a polymerization-curing reaction by active energy to form an adhesive. 3. The cleaning sheet according to claim 1, wherein the cleaning property is substantially lost.
【請求項4】 クリーニング層の表面抵抗率が1×10
13Ω/□以上である請求項1〜3いずれか記載のクリー
ニングシート。
4. The cleaning layer having a surface resistivity of 1 × 10
The cleaning sheet according to claim 1, wherein the cleaning sheet has a resistance of 13 Ω / □ or more.
【請求項5】 通常の粘着剤層のシリコンウエハ(ミラ
ー面)に対する180°引き剥がし粘着力が0.21〜
0.98N/10mmである請求項2〜4いずれか記載
のクリーニングシート。
5. An adhesive layer having a 180 ° peeling adhesive force of 0.21 to a silicon wafer (mirror surface) of a normal adhesive layer.
The cleaning sheet according to claim 2, wherein the thickness is 0.98 N / 10 mm.
【請求項6】 搬送部材に、請求項2〜5いずれか記載
のクリーニングシートが、通常の粘着剤層により設けら
れたクリーニング機能付き搬送部材。
6. A transport member with a cleaning function, wherein the cleaning sheet according to claim 2 is provided on the transport member by a normal pressure-sensitive adhesive layer.
【請求項7】 請求項6記載のクリーニング機能付き搬
送部材を、被洗浄部位に搬送接触させることを特徴とす
るクリーニング方法。
7. A cleaning method, wherein the transfer member with a cleaning function according to claim 6 is brought into contact with a portion to be cleaned.
JP2000177964A 1999-11-09 2000-06-14 Cleaning sheet Expired - Fee Related JP4718667B2 (en)

Priority Applications (14)

Application Number Priority Date Filing Date Title
JP2000177964A JP4718667B2 (en) 1999-11-09 2000-06-14 Cleaning sheet
US10/297,173 US7713356B2 (en) 2000-06-06 2001-05-08 Cleaning sheet, conveying member using the same, and substrate processing equipment cleaning method using them
EP01926156A EP1286792B1 (en) 2000-06-06 2001-05-08 Cleaning member
EP07004040.7A EP1782894A3 (en) 2000-06-06 2001-05-08 Process for preparing a conveying member with a cleaning function and cleaning sheet for use in the process
CNB018106811A CN100400185C (en) 2000-06-06 2001-05-08 Cleaning sheet, transport member using the cleaning sheet, and method of cleaning substrate processing apparatus using the cleaning sheet and the transport member
KR1020027016584A KR100786437B1 (en) 2000-06-06 2001-05-08 Cleaning sheet, conveying member using same, and cleaning method of substrate processing apparatus using these
EP20100011696 EP2266717A2 (en) 2000-06-06 2001-05-08 Cleaning member
PCT/JP2001/003848 WO2001094036A1 (en) 2000-06-06 2001-05-08 Cleaning sheet, conveying member using the same, and substrate processing equipment cleaning method using them
DE2001629687 DE60129687T2 (en) 2000-06-06 2001-05-08 CLEANING ELEMENT
EP20100011695 EP2266716A2 (en) 2000-06-06 2001-05-08 Cleaning member
MYPI20012130A MY135752A (en) 2000-06-06 2001-05-08 Cleaning member
US11/014,779 US7793668B2 (en) 2000-06-06 2004-12-20 Cleaning sheet, conveying member using the same, and substrate processing equipment cleaning method using them
US11/229,586 US20060105164A1 (en) 2000-06-06 2005-09-20 Cleaning sheet, conveying member using the same, and substrate processing equipment cleaning method using them
US12/851,797 US20100319151A1 (en) 2000-06-06 2010-08-06 Cleaning sheet, conveying member using the same, and substrate processing equipment cleaning method using them

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP11-317680 1999-11-09
JP31768099 1999-11-09
JP1999317680 1999-11-09
JP2000177964A JP4718667B2 (en) 1999-11-09 2000-06-14 Cleaning sheet

Publications (2)

Publication Number Publication Date
JP2001198540A true JP2001198540A (en) 2001-07-24
JP4718667B2 JP4718667B2 (en) 2011-07-06

Family

ID=26569102

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000177964A Expired - Fee Related JP4718667B2 (en) 1999-11-09 2000-06-14 Cleaning sheet

Country Status (1)

Country Link
JP (1) JP4718667B2 (en)

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003112128A (en) * 2001-10-05 2003-04-15 Nitto Denko Corp Particle removal tape and cleaning method using the same
JP2003115522A (en) * 2001-10-05 2003-04-18 Nitto Denko Corp Metal impurity removing tape and metal impurity removing method using the same
JP2003142370A (en) * 2001-10-31 2003-05-16 Nitto Denko Corp Cleaning method for equipment in contact with reticle
JP2009138027A (en) * 2007-12-03 2009-06-25 Nitto Denko Corp Manufacturing method of pressure-sensitive adhesive layer, pressure-sensitive adhesive sheet, cleaning sheet, transport member with cleaning function, and cleaning method
JP2010056113A (en) * 2008-08-26 2010-03-11 Hitachi High-Technologies Corp Cleaning apparatus and cleaning method
US7713356B2 (en) 2000-06-06 2010-05-11 Nitto Denko Corporation Cleaning sheet, conveying member using the same, and substrate processing equipment cleaning method using them
KR100957282B1 (en) * 2003-06-26 2010-05-12 닛토덴코 가부시키가이샤 Cleaning member and cleaning method
US7718255B2 (en) 2003-08-19 2010-05-18 Nitto Denko Corporation Cleaning sheets and method of cleaning with the same
US7793668B2 (en) 2000-06-06 2010-09-14 Nitto Denko Corporation Cleaning sheet, conveying member using the same, and substrate processing equipment cleaning method using them
US8460783B2 (en) 2002-06-19 2013-06-11 Nitto Denko Corporation Cleaning sheets, transfer member having cleaning function, and method of cleaning substrate-processing apparatus with these
CN112852333A (en) * 2019-11-12 2021-05-28 山太士股份有限公司 Probe cleaning sheet and method for cleaning probe
EP3872935A1 (en) 2013-12-11 2021-09-01 Jae Oregon, Inc. Self-rejecting automotive harness connector

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61138253A (en) * 1984-12-10 1986-06-25 Matsushita Electric Works Ltd Ultraviolet-hardenable resin composition
JPH06173041A (en) * 1992-12-02 1994-06-21 Nissin Electric Co Ltd Method for cleaning etching device
JPH07236863A (en) * 1993-12-16 1995-09-12 Eastman Kodak Co Method of cleaning carrying element and particle removing film
JPH08115896A (en) * 1994-10-13 1996-05-07 Nitto Denko Corp Adhesive tape for removing foreign matter adhering to semiconductor wafer and removal method
JPH08115897A (en) * 1994-10-13 1996-05-07 Nitto Denko Corp Adhesive tape for removing foreign matter adhering to semiconductor wafer and removal method

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61138253A (en) * 1984-12-10 1986-06-25 Matsushita Electric Works Ltd Ultraviolet-hardenable resin composition
JPH06173041A (en) * 1992-12-02 1994-06-21 Nissin Electric Co Ltd Method for cleaning etching device
JPH07236863A (en) * 1993-12-16 1995-09-12 Eastman Kodak Co Method of cleaning carrying element and particle removing film
JPH08115896A (en) * 1994-10-13 1996-05-07 Nitto Denko Corp Adhesive tape for removing foreign matter adhering to semiconductor wafer and removal method
JPH08115897A (en) * 1994-10-13 1996-05-07 Nitto Denko Corp Adhesive tape for removing foreign matter adhering to semiconductor wafer and removal method

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7713356B2 (en) 2000-06-06 2010-05-11 Nitto Denko Corporation Cleaning sheet, conveying member using the same, and substrate processing equipment cleaning method using them
US7793668B2 (en) 2000-06-06 2010-09-14 Nitto Denko Corporation Cleaning sheet, conveying member using the same, and substrate processing equipment cleaning method using them
JP2003112128A (en) * 2001-10-05 2003-04-15 Nitto Denko Corp Particle removal tape and cleaning method using the same
JP2003115522A (en) * 2001-10-05 2003-04-18 Nitto Denko Corp Metal impurity removing tape and metal impurity removing method using the same
JP2003142370A (en) * 2001-10-31 2003-05-16 Nitto Denko Corp Cleaning method for equipment in contact with reticle
US8460783B2 (en) 2002-06-19 2013-06-11 Nitto Denko Corporation Cleaning sheets, transfer member having cleaning function, and method of cleaning substrate-processing apparatus with these
KR100957282B1 (en) * 2003-06-26 2010-05-12 닛토덴코 가부시키가이샤 Cleaning member and cleaning method
US7718255B2 (en) 2003-08-19 2010-05-18 Nitto Denko Corporation Cleaning sheets and method of cleaning with the same
JP2009138027A (en) * 2007-12-03 2009-06-25 Nitto Denko Corp Manufacturing method of pressure-sensitive adhesive layer, pressure-sensitive adhesive sheet, cleaning sheet, transport member with cleaning function, and cleaning method
JP2010056113A (en) * 2008-08-26 2010-03-11 Hitachi High-Technologies Corp Cleaning apparatus and cleaning method
EP3872935A1 (en) 2013-12-11 2021-09-01 Jae Oregon, Inc. Self-rejecting automotive harness connector
CN112852333A (en) * 2019-11-12 2021-05-28 山太士股份有限公司 Probe cleaning sheet and method for cleaning probe

Also Published As

Publication number Publication date
JP4718667B2 (en) 2011-07-06

Similar Documents

Publication Publication Date Title
JP3987720B2 (en) Cleaning sheet and method for cleaning substrate processing apparatus using the same
JP4718667B2 (en) Cleaning sheet
JP3822763B2 (en) Cleaning sheet
JP4109712B2 (en) Label sheet for cleaning
JP3740004B2 (en) Cleaning sheet and substrate processing apparatus cleaning method using the same
JP4456666B2 (en) Cleaning sheet, conveying member with cleaning function, and method for cleaning substrate processing apparatus using them
JP4316105B2 (en) Cleaning sheet
JP2005286261A (en) Cleaning member for conveying member with cleaning function and substrate processing apparatus
JP4439855B2 (en) Cleaning sheet and method for cleaning substrate processing apparatus using the same
JP2001198075A (en) Cleaning sheet
JP2005032971A (en) Cleaning method for substrate processing apparatus
JP3981243B2 (en) Conveying member with cleaning function and cleaning label sheet used therefor
JP2002018377A (en) Cleaning sheet and method of cleaning substrate processing apparatus using the same
JP4406156B2 (en) Cleaning method for substrate processing apparatus and cleaning sheet used therefor
JP4495806B2 (en) Cleaning sheet
JP3740003B2 (en) Cleaning sheet and substrate processing apparatus cleaning method using the same
JP4248018B2 (en) Cleaning sheet and cleaning method for substrate processing apparatus
JP4593761B2 (en) Cleaning sheet and substrate processing apparatus cleaning method using the same
JP3740002B2 (en) Cleaning sheet and substrate processing apparatus cleaning method using the same
JP4130087B2 (en) How to remove particles
JP4280120B2 (en) Cleaning sheet and method for cleaning substrate processing apparatus using the same
JP4130830B2 (en) Conveying member with cleaning function and method for cleaning substrate processing apparatus using the same
JP2002192084A (en) Cleaning sheet and method of cleaning substrate processing apparatus using the same
JP2002158199A (en) Method of manufacturing transport member with cleaning function and cleaning sheet used therefor
JP2005270553A (en) Cleaning sheet and cleaning method for substrate processing apparatus

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20061106

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20090630

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20090828

RD02 Notification of acceptance of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7422

Effective date: 20090828

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20100209

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20101019

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20110117

A911 Transfer of reconsideration by examiner before appeal (zenchi)

Free format text: JAPANESE INTERMEDIATE CODE: A911

Effective date: 20110124

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20110329

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20110401

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20140408

Year of fee payment: 3

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees