GB2325565B - Electromagnetic alignment and scanning apparatus - Google Patents
Electromagnetic alignment and scanning apparatusInfo
- Publication number
- GB2325565B GB2325565B GB9817493A GB9817493A GB2325565B GB 2325565 B GB2325565 B GB 2325565B GB 9817493 A GB9817493 A GB 9817493A GB 9817493 A GB9817493 A GB 9817493A GB 2325565 B GB2325565 B GB 2325565B
- Authority
- GB
- United Kingdom
- Prior art keywords
- scanning apparatus
- electromagnetic alignment
- alignment
- electromagnetic
- scanning
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H10P76/00—
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70766—Reaction force control means, e.g. countermass
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70358—Scanning exposure, i.e. relative movement of patterned beam and workpiece during imaging
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70716—Stages
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70716—Stages
- G03F7/70725—Stages control
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70775—Position control, e.g. interferometers or encoders for determining the stage position
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70858—Environment aspects, e.g. pressure of beam-path gas, temperature
- G03F7/709—Vibration, e.g. vibration detection, compensation, suppression or isolation
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70991—Connection with other apparatus, e.g. multiple exposure stations, particular arrangement of exposure apparatus and pre-exposure and/or post-exposure apparatus; Shared apparatus, e.g. having shared radiation source, shared mask or workpiece stage, shared base-plate; Utilities, e.g. cable, pipe or wireless arrangements for data, power, fluids or vacuum
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
Landscapes
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Public Health (AREA)
- Epidemiology (AREA)
- Atmospheric Sciences (AREA)
- Toxicology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Computer Networks & Wireless Communication (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Control Of Position Or Direction (AREA)
- Details Of Measuring And Other Instruments (AREA)
- Machine Tool Units (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB9900929A GB2329518B (en) | 1994-06-27 | 1995-06-21 | Electromagnetic alignment and scanning apparatus |
| GB9900926A GB2329517B (en) | 1994-06-27 | 1995-06-21 | Electromagnetic alignment and scanning apparatus |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US26699994A | 1994-06-27 | 1994-06-27 | |
| GB9512659A GB2290658B (en) | 1994-06-27 | 1995-06-21 | Electromagnetic alignment and scanning apparatus |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| GB9817493D0 GB9817493D0 (en) | 1998-10-07 |
| GB2325565A GB2325565A (en) | 1998-11-25 |
| GB2325565B true GB2325565B (en) | 1999-03-31 |
Family
ID=23016891
Family Applications (13)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB9900933A Expired - Lifetime GB2329519B (en) | 1994-06-27 | 1995-06-21 | Electromagnmetic alignment and scanning apparatus |
| GB9817491A Expired - Lifetime GB2329067B (en) | 1994-06-27 | 1995-06-21 | Electromagnetioc alignment and scanning apparatus |
| GB9900926A Expired - Lifetime GB2329517B (en) | 1994-06-27 | 1995-06-21 | Electromagnetic alignment and scanning apparatus |
| GB9817494A Expired - Lifetime GB2325566B (en) | 1994-06-27 | 1995-06-21 | Electromagnetic alignment and scanning apparatus |
| GB9825844A Expired - Lifetime GB2329516B (en) | 1994-06-27 | 1995-06-21 | Electromagnetic alignment and scanning apparatus |
| GB9900937A Expired - Lifetime GB2329521B (en) | 1994-06-27 | 1995-06-21 | Electromagnetic alignment and scanning apparatus |
| GB9512659A Expired - Lifetime GB2290658B (en) | 1994-06-27 | 1995-06-21 | Electromagnetic alignment and scanning apparatus |
| GB9817490A Expired - Lifetime GB2325563B (en) | 1994-06-27 | 1995-06-21 | Electromagnetic alignment and scanning apparatus |
| GB9817492A Expired - Lifetime GB2325564B (en) | 1994-06-27 | 1995-06-21 | Electromagnetic alignment and scanning apparatus |
| GB9900935A Expired - Lifetime GB2329520B (en) | 1994-06-27 | 1995-06-21 | Electromagnetic alignment and scanning apparatus |
| GB9900929A Expired - Lifetime GB2329518B (en) | 1994-06-27 | 1995-06-21 | Electromagnetic alignment and scanning apparatus |
| GB9900940A Expired - Lifetime GB2329522B (en) | 1994-06-27 | 1995-06-21 | Electromagnetic alignment and scanning apparatus |
| GB9817493A Expired - Lifetime GB2325565B (en) | 1994-06-27 | 1995-06-21 | Electromagnetic alignment and scanning apparatus |
Family Applications Before (12)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB9900933A Expired - Lifetime GB2329519B (en) | 1994-06-27 | 1995-06-21 | Electromagnmetic alignment and scanning apparatus |
| GB9817491A Expired - Lifetime GB2329067B (en) | 1994-06-27 | 1995-06-21 | Electromagnetioc alignment and scanning apparatus |
| GB9900926A Expired - Lifetime GB2329517B (en) | 1994-06-27 | 1995-06-21 | Electromagnetic alignment and scanning apparatus |
| GB9817494A Expired - Lifetime GB2325566B (en) | 1994-06-27 | 1995-06-21 | Electromagnetic alignment and scanning apparatus |
| GB9825844A Expired - Lifetime GB2329516B (en) | 1994-06-27 | 1995-06-21 | Electromagnetic alignment and scanning apparatus |
| GB9900937A Expired - Lifetime GB2329521B (en) | 1994-06-27 | 1995-06-21 | Electromagnetic alignment and scanning apparatus |
| GB9512659A Expired - Lifetime GB2290658B (en) | 1994-06-27 | 1995-06-21 | Electromagnetic alignment and scanning apparatus |
| GB9817490A Expired - Lifetime GB2325563B (en) | 1994-06-27 | 1995-06-21 | Electromagnetic alignment and scanning apparatus |
| GB9817492A Expired - Lifetime GB2325564B (en) | 1994-06-27 | 1995-06-21 | Electromagnetic alignment and scanning apparatus |
| GB9900935A Expired - Lifetime GB2329520B (en) | 1994-06-27 | 1995-06-21 | Electromagnetic alignment and scanning apparatus |
| GB9900929A Expired - Lifetime GB2329518B (en) | 1994-06-27 | 1995-06-21 | Electromagnetic alignment and scanning apparatus |
| GB9900940A Expired - Lifetime GB2329522B (en) | 1994-06-27 | 1995-06-21 | Electromagnetic alignment and scanning apparatus |
Country Status (3)
| Country | Link |
|---|---|
| JP (6) | JP3800616B2 (en) |
| KR (7) | KR100281853B1 (en) |
| GB (13) | GB2329519B (en) |
Families Citing this family (65)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1341044A3 (en) * | 1995-05-30 | 2003-10-29 | ASML Netherlands B.V. | Positioning device with a reference frame for a measuring system |
| JP3659529B2 (en) * | 1996-06-06 | 2005-06-15 | キヤノン株式会社 | Exposure apparatus and device manufacturing method |
| JPH10521A (en) * | 1996-06-07 | 1998-01-06 | Nikon Corp | Support device |
| US5821981A (en) * | 1996-07-02 | 1998-10-13 | Gerber Systems Corporation | Magnetically preloaded air bearing motion system for an imaging device |
| US6222614B1 (en) * | 1996-12-06 | 2001-04-24 | Nikon Corporation | Exposure elements with a cable-relaying support |
| DE69735016T2 (en) * | 1996-12-24 | 2006-08-17 | Asml Netherlands B.V. | Lithographic device with two object holders |
| USRE40043E1 (en) | 1997-03-10 | 2008-02-05 | Asml Netherlands B.V. | Positioning device having two object holders |
| EP1450208A1 (en) * | 1997-03-10 | 2004-08-25 | ASML Netherlands B.V. | Lithographic apparatus having two object holders |
| US20010003028A1 (en) | 1997-09-19 | 2001-06-07 | Nikon Corporation | Scanning Exposure Method |
| WO1999016113A1 (en) | 1997-09-19 | 1999-04-01 | Nikon Corporation | Stage device, a scanning aligner and a scanning exposure method, and a device manufactured thereby |
| JP4164905B2 (en) * | 1997-09-25 | 2008-10-15 | 株式会社ニコン | Electromagnetic force motor, stage apparatus and exposure apparatus |
| US6408045B1 (en) * | 1997-11-11 | 2002-06-18 | Canon Kabushiki Kaisha | Stage system and exposure apparatus with the same |
| EP1041607A4 (en) * | 1997-11-12 | 2003-11-05 | Nikon Corp | PROJECTION EXPOSURE APPARATUS |
| AU4061099A (en) * | 1998-06-17 | 2000-01-05 | Nikon Corporation | Exposure method and exposure apparatus |
| US6252234B1 (en) * | 1998-08-14 | 2001-06-26 | Nikon Corporation | Reaction force isolation system for a planar motor |
| US6307284B1 (en) * | 1998-09-16 | 2001-10-23 | Canon Kabushiki Kaisha | Positioning apparatus, information recording/reproducing apparatus, and inspection apparatus |
| AU1554901A (en) * | 1999-12-16 | 2001-06-25 | Nikon Corporation | Exposure method and exposure apparatus |
| EP1111469B1 (en) * | 1999-12-21 | 2007-10-17 | ASML Netherlands B.V. | Lithographic apparatus with a balanced positioning system |
| US6836093B1 (en) * | 1999-12-21 | 2004-12-28 | Nikon Corporation | Exposure method and apparatus |
| TWI264617B (en) | 1999-12-21 | 2006-10-21 | Asml Netherlands Bv | Balanced positioning system for use in lithographic apparatus |
| TW546551B (en) * | 1999-12-21 | 2003-08-11 | Asml Netherlands Bv | Balanced positioning system for use in lithographic apparatus |
| EP1128216B1 (en) | 2000-02-21 | 2008-11-26 | Sharp Kabushiki Kaisha | Precision stage device |
| US7301605B2 (en) | 2000-03-03 | 2007-11-27 | Nikon Corporation | Projection exposure apparatus and method, catadioptric optical system and manufacturing method of devices |
| KR100387243B1 (en) * | 2000-06-26 | 2003-06-12 | 삼성전자주식회사 | Electromagnetic x-y stage driver for the nano data storage system and method for fabricating the coils of the same |
| JP2002170765A (en) * | 2000-12-04 | 2002-06-14 | Nikon Corp | Stage device and exposure device |
| JP4021158B2 (en) * | 2001-04-27 | 2007-12-12 | 株式会社新川 | XY table in semiconductor manufacturing equipment |
| JP2002343706A (en) * | 2001-05-18 | 2002-11-29 | Nikon Corp | Stage apparatus and stage driving method, exposure apparatus and exposure method, and device and method for manufacturing the same |
| US6788385B2 (en) | 2001-06-21 | 2004-09-07 | Nikon Corporation | Stage device, exposure apparatus and method |
| KR100391000B1 (en) * | 2001-06-30 | 2003-07-12 | 주식회사 하이닉스반도체 | Exposure device for semiconductor device |
| EP3252806B1 (en) * | 2002-03-12 | 2019-10-09 | Hamamatsu Photonics K.K. | Substrate dividing method |
| KR100937318B1 (en) * | 2002-12-02 | 2010-01-18 | 두산인프라코어 주식회사 | Right Angle Adjuster of Machining Center Feed Shaft |
| CN100514581C (en) * | 2002-12-09 | 2009-07-15 | Acm研究公司 | Measurement alignment between wafer chuck and polishing/plating receptacle |
| KR101187612B1 (en) | 2003-04-09 | 2012-10-08 | 가부시키가이샤 니콘 | Exposure method and apparatus, and device manufacturing method |
| TWI628698B (en) | 2003-10-28 | 2018-07-01 | 尼康股份有限公司 | Optical illumination device, exposure device, exposure method and device manufacturing method |
| TW201809801A (en) | 2003-11-20 | 2018-03-16 | 日商尼康股份有限公司 | Optical illumination device, exposure device, exposure method, and component manufacturing method |
| DE602004030481D1 (en) | 2003-12-15 | 2011-01-20 | Nippon Kogaku Kk | STAGE SYSTEM, EXPOSURE DEVICE AND EXPOSURE METHOD |
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| KR101187611B1 (en) | 2004-09-01 | 2012-10-08 | 가부시키가이샤 니콘 | Substrate holder, stage apparatus, and exposure apparatus |
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| US7557529B2 (en) | 2005-01-11 | 2009-07-07 | Nikon Corporation | Stage unit and exposure apparatus |
| US7456935B2 (en) * | 2005-04-05 | 2008-11-25 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method utilizing a positioning device for positioning an object table |
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| US7292317B2 (en) * | 2005-06-08 | 2007-11-06 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method utilizing substrate stage compensating |
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| US7675201B2 (en) * | 2006-07-25 | 2010-03-09 | Asml Netherlands B.V. | Lithographic apparatus with planar motor driven support |
| EP2068349A4 (en) * | 2006-09-29 | 2011-03-30 | Nikon Corp | Stage device and exposure device |
| JP5267029B2 (en) | 2007-10-12 | 2013-08-21 | 株式会社ニコン | Illumination optical apparatus, exposure apparatus, and device manufacturing method |
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| JP4554715B2 (en) * | 2009-02-24 | 2010-09-29 | ファナック株式会社 | Linear drive with cable clamp or relay structure |
| TWI623819B (en) * | 2009-05-15 | 2018-05-11 | Nikon Corporation | Moving body device, power transmission device, exposure device, and element manufacturing method |
| JP5651035B2 (en) * | 2011-02-09 | 2015-01-07 | 株式会社ソディック | Mobile device |
| CN102887341A (en) * | 2011-07-22 | 2013-01-23 | 大银微系统股份有限公司 | Crossbeam pre-tensioning module of cantilever type platform |
| CN103522079B (en) * | 2013-09-29 | 2016-01-06 | 天津大学 | Dual spring pretension flexible decoupling zero linear electric motors locating platform |
| US9878386B2 (en) | 2013-10-31 | 2018-01-30 | Foundation Of Soongsil University-Industry Cooperation | Eccentric electrode for electric discharge machining, method of manufacturing the same, and micro electric discharge machining apparatus including the same |
| CN103824792A (en) * | 2014-02-28 | 2014-05-28 | 上海和辉光电有限公司 | Storage cabinet and control method thereof |
| JP5912143B2 (en) | 2014-03-04 | 2016-04-27 | 株式会社新川 | Bonding equipment |
| JP6379612B2 (en) * | 2014-04-11 | 2018-08-29 | 株式会社ニコン | MOBILE DEVICE, EXPOSURE APPARATUS, AND DEVICE MANUFACTURING METHOD |
| CN107664920B (en) * | 2016-07-29 | 2019-04-12 | 上海微电子装备(集团)股份有限公司 | Electromagnetic rail device |
| WO2018046280A1 (en) * | 2016-09-09 | 2018-03-15 | Asml Holding N.V. | Lithographic apparatus and support structures background |
| CN110328405B (en) * | 2019-08-09 | 2020-09-22 | 佛山市镭科智能设备有限公司 | Clamping control method for sectional material |
| CN114043260B (en) * | 2022-01-13 | 2022-04-26 | 上海隐冠半导体技术有限公司 | Displacement device |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0502578A1 (en) * | 1991-03-07 | 1992-09-09 | Koninklijke Philips Electronics N.V. | Optical lithographic device having a machine frame with force compensation |
| US5208497A (en) * | 1989-04-17 | 1993-05-04 | Sharp Kabushiki Kaisha | Linear driving apparatus |
| US5285142A (en) * | 1993-02-09 | 1994-02-08 | Svg Lithography Systems, Inc. | Wafer stage with reference surface |
| GB2288277A (en) * | 1994-04-01 | 1995-10-11 | Nikon Precision Inc | Guideless stage with isolated reaction stage |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0529442A (en) * | 1991-07-18 | 1993-02-05 | Toshiba Corp | Table device |
| JPH07260472A (en) * | 1994-03-22 | 1995-10-13 | Nikon Corp | Orthogonality measurement method for stage equipment |
| JPH08229759A (en) * | 1995-02-24 | 1996-09-10 | Canon Inc | Positioning device and device manufacturing apparatus and method |
-
1995
- 1995-06-09 JP JP14319095A patent/JP3800616B2/en not_active Expired - Lifetime
- 1995-06-21 GB GB9900933A patent/GB2329519B/en not_active Expired - Lifetime
- 1995-06-21 GB GB9817491A patent/GB2329067B/en not_active Expired - Lifetime
- 1995-06-21 GB GB9900926A patent/GB2329517B/en not_active Expired - Lifetime
- 1995-06-21 GB GB9817494A patent/GB2325566B/en not_active Expired - Lifetime
- 1995-06-21 GB GB9825844A patent/GB2329516B/en not_active Expired - Lifetime
- 1995-06-21 GB GB9900937A patent/GB2329521B/en not_active Expired - Lifetime
- 1995-06-21 GB GB9512659A patent/GB2290658B/en not_active Expired - Lifetime
- 1995-06-21 GB GB9817490A patent/GB2325563B/en not_active Expired - Lifetime
- 1995-06-21 GB GB9817492A patent/GB2325564B/en not_active Expired - Lifetime
- 1995-06-21 GB GB9900935A patent/GB2329520B/en not_active Expired - Lifetime
- 1995-06-21 GB GB9900929A patent/GB2329518B/en not_active Expired - Lifetime
- 1995-06-21 GB GB9900940A patent/GB2329522B/en not_active Expired - Lifetime
- 1995-06-21 GB GB9817493A patent/GB2325565B/en not_active Expired - Lifetime
- 1995-06-26 KR KR1019950018389A patent/KR100281853B1/en not_active Expired - Lifetime
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1999
- 1999-02-05 KR KR1019990003989A patent/KR100281859B1/en not_active Expired - Lifetime
- 1999-02-05 KR KR1019990003984A patent/KR100281857B1/en not_active Expired - Lifetime
- 1999-02-05 KR KR1019990003983A patent/KR100281856B1/en not_active Expired - Lifetime
- 1999-02-05 KR KR1019990003982A patent/KR100281855B1/en not_active Expired - Lifetime
- 1999-02-05 KR KR1019990003987A patent/KR100281858B1/en not_active Expired - Lifetime
- 1999-02-05 KR KR1019990003992A patent/KR100281860B1/en not_active Expired - Lifetime
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2002
- 2002-10-21 JP JP2002305401A patent/JP3804785B2/en not_active Expired - Lifetime
- 2002-10-21 JP JP2002305402A patent/JP3804786B2/en not_active Expired - Lifetime
- 2002-10-21 JP JP2002305403A patent/JP3804787B2/en not_active Expired - Lifetime
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2006
- 2006-03-17 JP JP2006075215A patent/JP4135188B2/en not_active Expired - Lifetime
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2007
- 2007-03-30 JP JP2007094076A patent/JP4687911B2/en not_active Expired - Lifetime
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5208497A (en) * | 1989-04-17 | 1993-05-04 | Sharp Kabushiki Kaisha | Linear driving apparatus |
| EP0502578A1 (en) * | 1991-03-07 | 1992-09-09 | Koninklijke Philips Electronics N.V. | Optical lithographic device having a machine frame with force compensation |
| US5285142A (en) * | 1993-02-09 | 1994-02-08 | Svg Lithography Systems, Inc. | Wafer stage with reference surface |
| GB2288277A (en) * | 1994-04-01 | 1995-10-11 | Nikon Precision Inc | Guideless stage with isolated reaction stage |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PE20 | Patent expired after termination of 20 years |
Expiry date: 20150620 |