GB1071645A - Apparatus for measuring weak ion currents - Google Patents
Apparatus for measuring weak ion currentsInfo
- Publication number
- GB1071645A GB1071645A GB4058464A GB4058464A GB1071645A GB 1071645 A GB1071645 A GB 1071645A GB 4058464 A GB4058464 A GB 4058464A GB 4058464 A GB4058464 A GB 4058464A GB 1071645 A GB1071645 A GB 1071645A
- Authority
- GB
- United Kingdom
- Prior art keywords
- electrode
- ion
- oct
- directed
- cell
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000004888 barrier function Effects 0.000 abstract 2
- 239000010410 layer Substances 0.000 abstract 2
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 abstract 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 abstract 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 abstract 1
- 239000004411 aluminium Substances 0.000 abstract 1
- 229910052782 aluminium Inorganic materials 0.000 abstract 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 abstract 1
- 238000011109 contamination Methods 0.000 abstract 1
- 239000010949 copper Substances 0.000 abstract 1
- 229910052802 copper Inorganic materials 0.000 abstract 1
- 238000000151 deposition Methods 0.000 abstract 1
- 230000008021 deposition Effects 0.000 abstract 1
- 239000011888 foil Substances 0.000 abstract 1
- 239000012535 impurity Substances 0.000 abstract 1
- 238000010849 ion bombardment Methods 0.000 abstract 1
- 238000010884 ion-beam technique Methods 0.000 abstract 1
- 239000000463 material Substances 0.000 abstract 1
- 229910000510 noble metal Inorganic materials 0.000 abstract 1
- 239000002245 particle Substances 0.000 abstract 1
- 229910052697 platinum Inorganic materials 0.000 abstract 1
- 239000004065 semiconductor Substances 0.000 abstract 1
- 229910052709 silver Inorganic materials 0.000 abstract 1
- 239000004332 silver Substances 0.000 abstract 1
- 239000007787 solid Substances 0.000 abstract 1
- 239000002344 surface layer Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/025—Detectors specially adapted to particle spectrometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/28—Measuring radiation intensity with secondary-emission detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J41/00—Discharge tubes for measuring pressure of introduced gas or for detecting presence of gas; Discharge tubes for evacuation by diffusion of ions
- H01J41/02—Discharge tubes for measuring pressure of introduced gas or for detecting presence of gas
- H01J41/06—Discharge tubes for measuring pressure of introduced gas or for detecting presence of gas with ionisation by means of cold cathodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/022—Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply
Landscapes
- High Energy & Nuclear Physics (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Electron Tubes For Measurement (AREA)
- Measurement Of Radiation (AREA)
Abstract
1,071,645. Heavy-ion-beam apparatus; photo-electric devices. LEYBOLD HOLDING A.G. Oct. 5, 1964 [Oct. 5, 1963], No. 40584/64. Headings H1D and H1K. In an arrangement for measuring weak ion currents, e.g. in mass spectrometers and ionization gauges, the ion stream is directed, as shown through the envelope neck 13, on to an electrode 12 yielding electrons under ion bombardment, this electrode being continuously heated or baked during operation to prevent the deposition of impurities and the electrons being directed on to a solid state particle counter 3, specifically a barrier layer cell. Polepieces 11, 12 provide an homogeneous magnetic field. The electron emitting electrode may comprise a thin foil of noble metal, e.g. platinum, and is preferably maintained at 500‹ C., e.g. by passing a current through it. The barrier layer cell has a conducting surface layer of aluminium, copper or silver to protect the semi-conductor material from light and contamination as well as to serve as one electrode of the cell.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DEL46030A DE1228348B (en) | 1963-10-05 | 1963-10-05 | Device for measuring the smallest ion currents |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| GB1071645A true GB1071645A (en) | 1967-06-07 |
Family
ID=7271418
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB4058464A Expired GB1071645A (en) | 1963-10-05 | 1964-10-05 | Apparatus for measuring weak ion currents |
Country Status (4)
| Country | Link |
|---|---|
| BE (1) | BE653942A (en) |
| CH (1) | CH415875A (en) |
| DE (1) | DE1228348B (en) |
| GB (1) | GB1071645A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3206309A1 (en) * | 1982-02-22 | 1983-09-15 | Siemens AG, 1000 Berlin und 8000 München | SECONDARY ELECTRON SPECTROMETER AND METHOD FOR ITS OPERATION |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2575769A (en) * | 1948-09-30 | 1951-11-20 | Rca Corp | Detection of ions |
| DE1035939B (en) * | 1952-05-06 | 1958-08-07 | Philips Nv | Mass spectrometer for analyzing substances or for displaying a small amount of a certain substance |
| DE972280C (en) * | 1952-12-30 | 1959-06-25 | Philips Nv | Mass spectrometer for analyzing substances |
| US2784317A (en) * | 1954-10-28 | 1957-03-05 | Cons Electrodynamics Corp | Mass spectrometry |
-
1963
- 1963-10-05 DE DEL46030A patent/DE1228348B/en active Pending
-
1964
- 1964-09-07 CH CH1164164A patent/CH415875A/en unknown
- 1964-10-02 BE BE653942D patent/BE653942A/xx unknown
- 1964-10-05 GB GB4058464A patent/GB1071645A/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| BE653942A (en) | 1965-02-01 |
| DE1228348B (en) | 1966-11-10 |
| CH415875A (en) | 1966-06-30 |
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