DE60130065D1 - Elektronisches Bauteil und Halbleitervorrichtung - Google Patents
Elektronisches Bauteil und HalbleitervorrichtungInfo
- Publication number
- DE60130065D1 DE60130065D1 DE60130065T DE60130065T DE60130065D1 DE 60130065 D1 DE60130065 D1 DE 60130065D1 DE 60130065 T DE60130065 T DE 60130065T DE 60130065 T DE60130065 T DE 60130065T DE 60130065 D1 DE60130065 D1 DE 60130065D1
- Authority
- DE
- Germany
- Prior art keywords
- semiconductor device
- electronic component
- electronic
- component
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K35/00—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
- B23K35/22—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by the composition or nature of the material
- B23K35/24—Selection of soldering or welding materials proper
- B23K35/26—Selection of soldering or welding materials proper with the principal constituent melting at less than 400 degrees C
- B23K35/262—Sn as the principal constituent
-
- H10W70/60—
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- H05K3/346—
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- H10W72/30—
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2101/00—Articles made by soldering, welding or cutting
- B23K2101/36—Electric or electronic devices
-
- H10W72/07236—
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- H10W72/252—
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- H10W72/253—
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- H10W72/325—
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- H10W72/351—
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- H10W72/352—
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- H10W72/354—
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- H10W72/381—
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- H10W72/884—
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- H10W72/90—
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- H10W72/923—
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- H10W72/9415—
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- H10W72/952—
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- H10W74/00—
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- H10W74/15—
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- H10W90/724—
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- H10W90/734—
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- H10W90/736—
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- H10W90/754—
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- H10W90/756—
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/12—All metal or with adjacent metals
- Y10T428/12493—Composite; i.e., plural, adjacent, spatially distinct metal components [e.g., layers, joint, etc.]
- Y10T428/12528—Semiconductor component
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Wire Bonding (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000180714 | 2000-06-12 | ||
| JP2000180714 | 2000-06-12 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE60130065D1 true DE60130065D1 (de) | 2007-10-04 |
| DE60130065T2 DE60130065T2 (de) | 2008-05-15 |
Family
ID=18681747
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE60130065T Expired - Lifetime DE60130065T2 (de) | 2000-06-12 | 2001-03-07 | Elektronische Vorrichtung und Halbleitervorrichtung |
Country Status (5)
| Country | Link |
|---|---|
| US (2) | US6555052B2 (de) |
| EP (1) | EP1163971B1 (de) |
| KR (1) | KR100407448B1 (de) |
| DE (1) | DE60130065T2 (de) |
| TW (1) | TWI228439B (de) |
Families Citing this family (50)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6703707B1 (en) * | 1999-11-24 | 2004-03-09 | Denso Corporation | Semiconductor device having radiation structure |
| CN1191747C (zh) * | 2001-09-06 | 2005-03-02 | 株式会社理光 | 电子元件组装检查方法 |
| JP2003151726A (ja) * | 2001-11-19 | 2003-05-23 | Nec Corp | 加温装置、加温装置実装構造および光導波路デバイス |
| JP2003178661A (ja) * | 2001-12-11 | 2003-06-27 | Yazaki Corp | リレー素子及びその実装構造 |
| US20030116860A1 (en) * | 2001-12-21 | 2003-06-26 | Biju Chandran | Semiconductor package with low resistance package-to-die interconnect scheme for reduced die stresses |
| US7235886B1 (en) | 2001-12-21 | 2007-06-26 | Intel Corporation | Chip-join process to reduce elongation mismatch between the adherents and semiconductor package made thereby |
| US7038142B2 (en) * | 2002-01-24 | 2006-05-02 | Fujitsu Limited | Circuit board and method for fabricating the same, and electronic device |
| US20040007779A1 (en) * | 2002-07-15 | 2004-01-15 | Diane Arbuthnot | Wafer-level method for fine-pitch, high aspect ratio chip interconnect |
| US7061025B2 (en) * | 2003-03-10 | 2006-06-13 | Mccolloch Lawrence R | Optoelectronic device packaging assemblies and methods of making the same |
| US20050029675A1 (en) * | 2003-03-31 | 2005-02-10 | Fay Hua | Tin/indium lead-free solders for low stress chip attachment |
| US20040187976A1 (en) * | 2003-03-31 | 2004-09-30 | Fay Hua | Phase change lead-free super plastic solders |
| JP2005011838A (ja) * | 2003-06-16 | 2005-01-13 | Toshiba Corp | 半導体装置及びその組立方法 |
| US7193326B2 (en) * | 2003-06-23 | 2007-03-20 | Denso Corporation | Mold type semiconductor device |
| US7607560B2 (en) * | 2004-05-14 | 2009-10-27 | Intevac, Inc. | Semiconductor die attachment for high vacuum tubes |
| US7012328B2 (en) * | 2004-05-14 | 2006-03-14 | Intevac, Inc. | Semiconductor die attachment for high vacuum tubes |
| US20050269385A1 (en) * | 2004-06-03 | 2005-12-08 | National Tsing Hua University | Soldering method and solder joints formed therein |
| CN101006362A (zh) * | 2004-08-13 | 2007-07-25 | 皇家飞利浦电子股份有限公司 | 固态辐射探测器封装技术 |
| JP2006100552A (ja) * | 2004-09-29 | 2006-04-13 | Rohm Co Ltd | 配線基板および半導体装置 |
| US7223695B2 (en) * | 2004-09-30 | 2007-05-29 | Intel Corporation | Methods to deposit metal alloy barrier layers |
| GB2419137A (en) * | 2004-10-15 | 2006-04-19 | Alpha Fry Ltd | Solder alloy |
| DE102005009358B4 (de) * | 2005-03-01 | 2021-02-04 | Snaptrack, Inc. | Lötfähiger Kontakt und ein Verfahren zur Herstellung |
| JP4490861B2 (ja) * | 2005-04-25 | 2010-06-30 | 日立協和エンジニアリング株式会社 | 基板 |
| US7183652B2 (en) | 2005-04-27 | 2007-02-27 | Infineon Technologies Ag | Electronic component and electronic configuration |
| US20070018308A1 (en) * | 2005-04-27 | 2007-01-25 | Albert Schott | Electronic component and electronic configuration |
| KR100706574B1 (ko) * | 2005-06-29 | 2007-04-13 | 삼성전자주식회사 | 무연 솔더볼을 갖는 반도체 패키지 및 그 제조방법 |
| EP1924393A1 (de) | 2005-08-24 | 2008-05-28 | Fry's Metals Inc. | Verringerung von gelenkversprödung in bleifreien lötprozessen |
| US20070090475A1 (en) * | 2005-10-05 | 2007-04-26 | Honeywell International Inc. | Mems performance improvement using high gravity force conditioning |
| US7601612B1 (en) * | 2005-10-24 | 2009-10-13 | Globalfoundries Inc. | Method for forming solder joints for a flip chip assembly |
| KR100719905B1 (ko) * | 2005-12-29 | 2007-05-18 | 삼성전자주식회사 | Sn-Bi계 솔더 합금 및 이를 이용한 반도체 소자 |
| US20070164428A1 (en) * | 2006-01-18 | 2007-07-19 | Alan Elbanhawy | High power module with open frame package |
| JP4790439B2 (ja) * | 2006-02-09 | 2011-10-12 | 富士通株式会社 | 電極、電子部品及び基板 |
| US8004075B2 (en) * | 2006-04-25 | 2011-08-23 | Hitachi, Ltd. | Semiconductor power module including epoxy resin coating |
| CN100469511C (zh) * | 2006-06-14 | 2009-03-18 | 浙江亚通焊材有限公司 | 无铅软钎料 |
| US20080157910A1 (en) * | 2006-12-29 | 2008-07-03 | Park Chang-Min | Amorphous soft magnetic layer for on-die inductively coupled wires |
| KR100797161B1 (ko) * | 2007-05-25 | 2008-01-23 | 한국생산기술연구원 | 주석-은-구리-인듐의 4원계 무연솔더 조성물 |
| KR20090042556A (ko) * | 2007-10-26 | 2009-04-30 | 삼성전기주식회사 | 인쇄회로기판 및 그 제조방법 |
| JP5058766B2 (ja) * | 2007-12-07 | 2012-10-24 | 山陽特殊製鋼株式会社 | 鉛フリー接合用材料を用いてはんだ付けしてなる電子機器 |
| JP4899115B2 (ja) * | 2008-03-05 | 2012-03-21 | 千住金属工業株式会社 | 鉛フリーはんだ接続構造体およびはんだボール |
| CN102196881B (zh) * | 2008-10-24 | 2014-06-04 | 三菱电机株式会社 | 半导体装置 |
| JP5339968B2 (ja) * | 2009-03-04 | 2013-11-13 | パナソニック株式会社 | 実装構造体及びモータ |
| US8462510B2 (en) * | 2011-05-11 | 2013-06-11 | Taiwan Semiconductor Manufacturing Company, Ltd. | Board-level package with tuned mass damping structure |
| JP2013252548A (ja) * | 2012-06-08 | 2013-12-19 | Nihon Almit Co Ltd | 微細部品接合用のソルダペースト |
| US8829692B2 (en) | 2012-09-04 | 2014-09-09 | Rolls-Royce Corporation | Multilayer packaged semiconductor device and method of packaging |
| TWM521008U (zh) * | 2016-01-27 | 2016-05-01 | Lite On Technology Corp | 車燈裝置及其發光模組 |
| CN108886353B (zh) * | 2016-04-11 | 2022-03-22 | 株式会社村田制作所 | 弹性波元件以及弹性波装置 |
| US10957667B2 (en) * | 2016-10-01 | 2021-03-23 | Intel Corporation | Indium solder metallurgy to control electro-migration |
| DE102020116018A1 (de) | 2020-06-17 | 2021-12-23 | Tdk Electronics Ag | Sensor |
| CN112117205B (zh) * | 2020-09-15 | 2024-01-16 | 桂林航天工业学院 | 一种锡基钎料封装焊点的制备方法 |
| JP2022129553A (ja) * | 2021-02-25 | 2022-09-06 | セイコーエプソン株式会社 | センサーモジュール |
| CN115319221A (zh) * | 2022-07-26 | 2022-11-11 | 云南电网有限责任公司昆明供电局 | 一种基于Sn基材料的电缆线芯接头钎焊方法 |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3097965A (en) | 1961-06-27 | 1963-07-16 | Richard A Wilkins | Conductive wire coating alloys, wires coated therewith and process for improving solderability therefor |
| US6184475B1 (en) * | 1994-09-29 | 2001-02-06 | Fujitsu Limited | Lead-free solder composition with Bi, In and Sn |
| JP2805595B2 (ja) | 1994-11-02 | 1998-09-30 | 三井金属鉱業株式会社 | 鉛無含有半田合金 |
| JP3040929B2 (ja) | 1995-02-06 | 2000-05-15 | 松下電器産業株式会社 | はんだ材料 |
| WO1997009455A1 (en) * | 1995-09-01 | 1997-03-13 | Sarnoff Corporation | Soldering composition |
| JP3874031B2 (ja) * | 1995-11-29 | 2007-01-31 | 内橋エステック株式会社 | 無鉛はんだ合金 |
| US6224690B1 (en) * | 1995-12-22 | 2001-05-01 | International Business Machines Corporation | Flip-Chip interconnections using lead-free solders |
| US6046499A (en) * | 1996-03-27 | 2000-04-04 | Kabushiki Kaisha Toshiba | Heat transfer configuration for a semiconductor device |
| JPH09326554A (ja) | 1996-06-06 | 1997-12-16 | Matsushita Electric Ind Co Ltd | 電子部品接合用電極のはんだ合金及びはんだ付け方法 |
| US5854514A (en) * | 1996-08-05 | 1998-12-29 | International Buisness Machines Corporation | Lead-free interconnection for electronic devices |
| US5985212A (en) * | 1996-12-12 | 1999-11-16 | H-Technologies Group, Incorporated | High strength lead-free solder materials |
| JP3736819B2 (ja) * | 1997-01-17 | 2006-01-18 | 株式会社豊田中央研究所 | 無鉛はんだ合金 |
| JPH10314980A (ja) * | 1997-05-14 | 1998-12-02 | Sony Corp | はんだ材料 |
| US6402013B2 (en) * | 1999-12-03 | 2002-06-11 | Senju Metal Industry Co., Ltd | Thermosetting soldering flux and soldering process |
| KR100398716B1 (ko) * | 2000-06-12 | 2003-09-19 | 가부시키가이샤 히타치세이사쿠쇼 | 반도체 모듈 및 반도체 장치를 접속한 회로 기판 |
| JP3350026B2 (ja) * | 2000-08-01 | 2002-11-25 | エフシーエム株式会社 | 電子部品用材料、電子部品用材料の接続方法、ボールグリッドアレイ型電子部品およびボールグリッドアレイ型電子部品の接続方法 |
-
2001
- 2001-02-27 KR KR10-2001-0009845A patent/KR100407448B1/ko not_active Expired - Fee Related
- 2001-03-07 EP EP01302086A patent/EP1163971B1/de not_active Expired - Lifetime
- 2001-03-07 DE DE60130065T patent/DE60130065T2/de not_active Expired - Lifetime
- 2001-03-07 US US09/799,486 patent/US6555052B2/en not_active Expired - Fee Related
- 2001-03-19 TW TW090106383A patent/TWI228439B/zh not_active IP Right Cessation
-
2003
- 2003-03-25 US US10/395,231 patent/US6774490B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| DE60130065T2 (de) | 2008-05-15 |
| US20030186072A1 (en) | 2003-10-02 |
| EP1163971A1 (de) | 2001-12-19 |
| US6774490B2 (en) | 2004-08-10 |
| EP1163971B1 (de) | 2007-08-22 |
| US6555052B2 (en) | 2003-04-29 |
| KR100407448B1 (ko) | 2003-11-28 |
| TWI228439B (en) | 2005-03-01 |
| US20020066583A1 (en) | 2002-06-06 |
| KR20010112054A (ko) | 2001-12-20 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8364 | No opposition during term of opposition |