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DE60042914D1 - Halbleitervorrichtung und verfahren zu ihrer herstellung - Google Patents

Halbleitervorrichtung und verfahren zu ihrer herstellung

Info

Publication number
DE60042914D1
DE60042914D1 DE60042914T DE60042914T DE60042914D1 DE 60042914 D1 DE60042914 D1 DE 60042914D1 DE 60042914 T DE60042914 T DE 60042914T DE 60042914 T DE60042914 T DE 60042914T DE 60042914 D1 DE60042914 D1 DE 60042914D1
Authority
DE
Germany
Prior art keywords
production
semiconductor device
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60042914T
Other languages
English (en)
Inventor
Masatoshi Inaba
Takanao Suzuki
Tadanori Ominato
Masahiro Kaizu
Akihito Kurosaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujikura Ltd
Original Assignee
Fujikura Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujikura Ltd filed Critical Fujikura Ltd
Application granted granted Critical
Publication of DE60042914D1 publication Critical patent/DE60042914D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H10W74/129
    • H10W72/20
    • H10W70/05
    • H10W72/01225
    • H10W72/251
    • H10W72/29
    • H10W72/931
    • H10W72/934
DE60042914T 1999-06-11 2000-06-12 Halbleitervorrichtung und verfahren zu ihrer herstellung Expired - Lifetime DE60042914D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP16609099 1999-06-11
PCT/JP2000/003804 WO2000077843A1 (fr) 1999-06-11 2000-06-12 Boitier a semi-conducteur, dispositif semi-conducteur, dispositif electronique et procede de fabrication de boitier a semi-conducteur

Publications (1)

Publication Number Publication Date
DE60042914D1 true DE60042914D1 (de) 2009-10-22

Family

ID=15824818

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60042914T Expired - Lifetime DE60042914D1 (de) 1999-06-11 2000-06-12 Halbleitervorrichtung und verfahren zu ihrer herstellung

Country Status (7)

Country Link
US (1) US6387734B1 (de)
EP (1) EP1107306B1 (de)
JP (1) JP3651596B2 (de)
AU (1) AU5109000A (de)
CA (1) CA2340108C (de)
DE (1) DE60042914D1 (de)
WO (1) WO2000077843A1 (de)

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US6936531B2 (en) * 1998-12-21 2005-08-30 Megic Corporation Process of fabricating a chip structure
US8021976B2 (en) 2002-10-15 2011-09-20 Megica Corporation Method of wire bonding over active area of a semiconductor circuit
DE60022458T2 (de) * 1999-06-15 2006-06-22 Fujikura Ltd. Halbleitergehäuse, halbleitervorrichtung, elektronikelement und herstellung eines halbleitergehäuses
JP3548082B2 (ja) * 2000-03-30 2004-07-28 三洋電機株式会社 半導体装置及びその製造方法
US7034402B1 (en) * 2000-06-28 2006-04-25 Intel Corporation Device with segmented ball limiting metallurgy
JP2002050716A (ja) * 2000-08-02 2002-02-15 Dainippon Printing Co Ltd 半導体装置及びその作製方法
US6818545B2 (en) * 2001-03-05 2004-11-16 Megic Corporation Low fabrication cost, fine pitch and high reliability solder bump
JP4892791B2 (ja) * 2001-05-31 2012-03-07 大日本印刷株式会社 マルチチップモジュール用の中間基板
TW508987B (en) * 2001-07-27 2002-11-01 Phoenix Prec Technology Corp Method of forming electroplated solder on organic printed circuit board
US6646347B2 (en) * 2001-11-30 2003-11-11 Motorola, Inc. Semiconductor power device and method of formation
US7932603B2 (en) * 2001-12-13 2011-04-26 Megica Corporation Chip structure and process for forming the same
TW200302685A (en) * 2002-01-23 2003-08-01 Matsushita Electric Industrial Co Ltd Circuit component built-in module and method of manufacturing the same
JP3542350B2 (ja) 2002-05-31 2004-07-14 沖電気工業株式会社 半導体装置及びその製造方法
US6897566B2 (en) * 2002-06-24 2005-05-24 Ultra Tera Corporation Encapsulated semiconductor package free of chip carrier
JP2004055628A (ja) * 2002-07-17 2004-02-19 Dainippon Printing Co Ltd ウエハレベルの半導体装置及びその作製方法
US7265045B2 (en) * 2002-10-24 2007-09-04 Megica Corporation Method for fabricating thermal compliant semiconductor chip wiring structure for chip scale packaging
KR100629764B1 (ko) * 2002-10-25 2006-09-28 마쯔시다덴기산교 가부시키가이샤 반도체 디바이스 및 반도체 디바이스를 조립하기 위한수지 바인더
JP3969295B2 (ja) 2002-12-02 2007-09-05 セイコーエプソン株式会社 半導体装置及びその製造方法と回路基板及び電気光学装置、並びに電子機器
US7180195B2 (en) * 2003-12-17 2007-02-20 Intel Corporation Method and apparatus for improved power routing
JP4741201B2 (ja) * 2004-06-02 2011-08-03 株式会社フジクラ 半導体装置及びそれを備えた電子機器並びに半導体装置の製造方法
US7468545B2 (en) * 2005-05-06 2008-12-23 Megica Corporation Post passivation structure for a semiconductor device and packaging process for same
US7582556B2 (en) 2005-06-24 2009-09-01 Megica Corporation Circuitry component and method for forming the same
US7582966B2 (en) 2006-09-06 2009-09-01 Megica Corporation Semiconductor chip and method for fabricating the same
JP4486103B2 (ja) 2007-03-19 2010-06-23 Okiセミコンダクタ株式会社 加速度センサ、及び加速度センサの製造方法
JP5249080B2 (ja) * 2009-02-19 2013-07-31 セイコーインスツル株式会社 半導体装置
JP5563777B2 (ja) * 2009-03-19 2014-07-30 パナソニック株式会社 半導体装置および半導体基板、並びに半導体装置の製造方法
TWI395279B (zh) * 2009-12-30 2013-05-01 財團法人工業技術研究院 微凸塊結構
JP2011176011A (ja) * 2010-02-23 2011-09-08 Panasonic Corp 半導体集積回路装置
EP2405468A1 (de) * 2010-07-05 2012-01-11 ATOTECH Deutschland GmbH Verfahren zur Formung von Lötablagerungen auf Substraten
US8409979B2 (en) * 2011-05-31 2013-04-02 Stats Chippac, Ltd. Semiconductor device and method of forming interconnect structure with conductive pads having expanded interconnect surface area for enhanced interconnection properties
US8624392B2 (en) 2011-06-03 2014-01-07 Taiwan Semiconductor Manufacturing Company, Ltd. Electrical connection for chip scale packaging
US8912668B2 (en) * 2012-03-01 2014-12-16 Taiwan Semiconductor Manufacturing Company, Ltd. Electrical connections for chip scale packaging
US9548281B2 (en) * 2011-10-07 2017-01-17 Taiwan Semiconductor Manufacturing Company, Ltd. Electrical connection for chip scale packaging
US9196573B2 (en) 2012-07-31 2015-11-24 Taiwan Semiconductor Manufacturing Company, Ltd. Bump on pad (BOP) bonding structure
US8829673B2 (en) 2012-08-17 2014-09-09 Taiwan Semiconductor Manufacturing Company, Ltd. Bonded structures for package and substrate
US9673161B2 (en) 2012-08-17 2017-06-06 Taiwan Semiconductor Manufacturing Company, Ltd. Bonded structures for package and substrate
US9620468B2 (en) * 2012-11-08 2017-04-11 Tongfu Microelectronics Co., Ltd. Semiconductor packaging structure and method for forming the same
US9761549B2 (en) * 2012-11-08 2017-09-12 Tongfu Microelectronics Co., Ltd. Semiconductor device and fabrication method
US9437574B2 (en) 2013-09-30 2016-09-06 Freescale Semiconductor, Inc. Electronic component package and method for forming same
US20150123267A1 (en) * 2013-11-06 2015-05-07 Taiwan Semiconductor Manufacturing Company Ltd. Packaged semiconductor device
US9515034B2 (en) * 2014-01-03 2016-12-06 Freescale Semiconductor, Inc. Bond pad having a trench and method for forming
US9484318B2 (en) * 2014-02-17 2016-11-01 Taiwan Semiconductor Manufacturing Company Ltd. Semiconductor device and manufacturing method thereof
KR102493465B1 (ko) * 2016-03-22 2023-01-30 삼성전자 주식회사 인쇄회로기판 및 이를 가지는 반도체 패키지
KR102017635B1 (ko) * 2016-03-25 2019-10-08 삼성전자주식회사 팬-아웃 반도체 패키지
US10818621B2 (en) * 2016-03-25 2020-10-27 Samsung Electronics Co., Ltd. Fan-out semiconductor package
US10600748B2 (en) 2016-06-20 2020-03-24 Samsung Electronics Co., Ltd. Fan-out semiconductor package
JP6708015B2 (ja) 2016-06-27 2020-06-10 セイコーエプソン株式会社 Memsデバイス、液体噴射ヘッド、液体噴射装置、および、memsデバイスの製造方法
KR102073294B1 (ko) * 2016-09-29 2020-02-04 삼성전자주식회사 팬-아웃 반도체 패키지
CN107104058A (zh) * 2017-06-21 2017-08-29 中芯长电半导体(江阴)有限公司 扇出型单裸片封装结构及其制备方法

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US5248903A (en) * 1992-09-18 1993-09-28 Lsi Logic Corporation Composite bond pads for semiconductor devices
US5527741A (en) * 1994-10-11 1996-06-18 Martin Marietta Corporation Fabrication and structures of circuit modules with flexible interconnect layers
TW448524B (en) * 1997-01-17 2001-08-01 Seiko Epson Corp Electronic component, semiconductor device, manufacturing method therefor, circuit board and electronic equipment
JP2000228423A (ja) 1999-02-05 2000-08-15 Sanyo Electric Co Ltd 半導体装置及びその製造方法

Also Published As

Publication number Publication date
JP3651596B2 (ja) 2005-05-25
EP1107306B1 (de) 2009-09-09
EP1107306A1 (de) 2001-06-13
EP1107306A4 (de) 2008-02-27
WO2000077843A1 (fr) 2000-12-21
CA2340108C (en) 2005-03-29
CA2340108A1 (en) 2000-12-21
US6387734B1 (en) 2002-05-14
AU5109000A (en) 2001-01-02

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