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DE60033894D1 - Strahlungsdetektor - Google Patents

Strahlungsdetektor

Info

Publication number
DE60033894D1
DE60033894D1 DE60033894T DE60033894T DE60033894D1 DE 60033894 D1 DE60033894 D1 DE 60033894D1 DE 60033894 T DE60033894 T DE 60033894T DE 60033894 T DE60033894 T DE 60033894T DE 60033894 D1 DE60033894 D1 DE 60033894D1
Authority
DE
Germany
Prior art keywords
radiation detector
detector
radiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60033894T
Other languages
English (en)
Other versions
DE60033894T2 (de
Inventor
Kenji Sato
Msahito Sato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Shindengen Electric Manufacturing Co Ltd
Shindengen Sensor Device Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp, Shindengen Electric Manufacturing Co Ltd, Shindengen Sensor Device Co Ltd filed Critical Shimadzu Corp
Application granted granted Critical
Publication of DE60033894D1 publication Critical patent/DE60033894D1/de
Publication of DE60033894T2 publication Critical patent/DE60033894T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/191—Photoconductor image sensors
    • H10F39/195—X-ray, gamma-ray or corpuscular radiation imagers
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/803—Pixels having integrated switching, control, storage or amplification elements
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00—Constructional details of devices covered by this subclass
    • H10F77/10—Semiconductor bodies
    • H10F77/16—Material structures, e.g. crystalline structures, film structures or crystal plane orientations
    • H10F77/162—Non-monocrystalline materials, e.g. semiconductor particles embedded in insulating materials
    • H10F77/166—Amorphous semiconductors
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Light Receiving Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
DE60033894T 1999-08-26 2000-08-11 Strahlungsdetektor Expired - Lifetime DE60033894T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP24002699 1999-08-26
JP24002699A JP3832615B2 (ja) 1999-08-26 1999-08-26 放射線検出装置

Publications (2)

Publication Number Publication Date
DE60033894D1 true DE60033894D1 (de) 2007-04-26
DE60033894T2 DE60033894T2 (de) 2007-12-06

Family

ID=17053373

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60033894T Expired - Lifetime DE60033894T2 (de) 1999-08-26 2000-08-11 Strahlungsdetektor

Country Status (6)

Country Link
US (1) US6495817B1 (de)
EP (1) EP1079437B1 (de)
JP (1) JP3832615B2 (de)
KR (1) KR100356115B1 (de)
CN (1) CN1148807C (de)
DE (1) DE60033894T2 (de)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3678162B2 (ja) * 2001-04-12 2005-08-03 株式会社島津製作所 放射線検出装置
JP3932857B2 (ja) 2001-10-22 2007-06-20 株式会社島津製作所 放射線検出装置
JP3775585B2 (ja) * 2002-02-08 2006-05-17 富士写真フイルム株式会社 画像記録媒体および製造方法
KR20050030225A (ko) * 2002-08-05 2005-03-29 코닌클리케 필립스 일렉트로닉스 엔.브이. 단일 물질로 이루어진 대물계를 구비한 주사장치
JP4269859B2 (ja) * 2003-09-10 2009-05-27 株式会社島津製作所 放射線検出器
JP2005101193A (ja) * 2003-09-24 2005-04-14 Shimadzu Corp 放射線検出器
US7928401B2 (en) 2006-06-14 2011-04-19 Fujifilm Corporation Radiation detecting system
JP5213005B2 (ja) 2006-12-18 2013-06-19 浜松ホトニクス株式会社 放射線検出器
JP2008227346A (ja) * 2007-03-15 2008-09-25 Fujifilm Corp 放射線検出装置
JP5264291B2 (ja) * 2007-09-28 2013-08-14 富士フイルム株式会社 放射線検出器
JP2009175102A (ja) * 2008-01-28 2009-08-06 Shimadzu Corp 直接変換型ｘ線フラットパネルセンサー
CN101577284B (zh) * 2008-05-09 2011-04-13 同方威视技术股份有限公司 用于测量辐射的半导体探测器及成像装置
CN102414580B (zh) * 2009-04-30 2015-07-22 株式会社岛津制作所 放射线检测器
KR101042047B1 (ko) * 2010-05-31 2011-06-16 주식회사 디알텍 리드 아웃 장치 및 이를 이용한 디지털 엑스선 검출장치
KR101042048B1 (ko) * 2010-05-31 2011-06-16 주식회사 디알텍 리드 아웃 장치 및 이를 이용한 디지털 엑스선 검출장치
US8053856B1 (en) * 2010-06-11 2011-11-08 Taiwan Semiconductor Manufacturing Company, Ltd. Backside illuminated sensor processing
RU2734452C2 (ru) * 2015-11-26 2020-10-16 Конинклейке Филипс Н.В. Компенсация темнового тока
CN112083470B (zh) * 2020-09-02 2023-11-24 重庆中易智芯科技有限责任公司 一种阻态敏感CdZnTe辐射探测器及其制造方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4233514A (en) * 1978-12-14 1980-11-11 General Electric Company Solid state radiation detector and arrays thereof
US5101255A (en) * 1987-01-14 1992-03-31 Sachio Ishioka Amorphous photoelectric conversion device with avalanche
JPH04261071A (ja) * 1991-01-11 1992-09-17 Canon Inc 光電変換装置
DE4227096A1 (de) * 1992-08-17 1994-02-24 Philips Patentverwaltung Röntgenbilddetektor
US5986285A (en) * 1996-11-07 1999-11-16 Fuji Xerox, Co., Ltd. Group III-V amorphous and microcrystalline optical semiconductor including hydrogen, and method of forming thereof
JP4059463B2 (ja) * 1998-12-10 2008-03-12 株式会社島津製作所 放射線検出装置

Also Published As

Publication number Publication date
CN1286406A (zh) 2001-03-07
CN1148807C (zh) 2004-05-05
KR20010067103A (ko) 2001-07-12
JP2001068656A (ja) 2001-03-16
JP3832615B2 (ja) 2006-10-11
EP1079437A2 (de) 2001-02-28
EP1079437B1 (de) 2007-03-14
EP1079437A3 (de) 2004-08-18
KR100356115B1 (ko) 2002-10-12
DE60033894T2 (de) 2007-12-06
US6495817B1 (en) 2002-12-17

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