[go: up one dir, main page]

DE102004008900A8 - Vorrichtung und Verfahren zum Verarbeiten von Wafern - Google Patents

Vorrichtung und Verfahren zum Verarbeiten von Wafern Download PDF

Info

Publication number
DE102004008900A8
DE102004008900A8 DE102004008900A DE102004008900A DE102004008900A8 DE 102004008900 A8 DE102004008900 A8 DE 102004008900A8 DE 102004008900 A DE102004008900 A DE 102004008900A DE 102004008900 A DE102004008900 A DE 102004008900A DE 102004008900 A8 DE102004008900 A8 DE 102004008900A8
Authority
DE
Germany
Prior art keywords
processing wafers
wafers
processing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE102004008900A
Other languages
English (en)
Other versions
DE102004008900B4 (de
DE102004008900A1 (de
Inventor
Kun-Hyung Suwon Lee
Hyun-Ho Suwon Cho
Hee-Sun Yongin Chae
Sun-Yong Lee
Soo-Wong Suwon Lee
Jae-Hyung Yongin Jung
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electronics Co Ltd
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from KR1020030011777A external-priority patent/KR100562500B1/ko
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of DE102004008900A1 publication Critical patent/DE102004008900A1/de
Publication of DE102004008900A8 publication Critical patent/DE102004008900A8/de
Application granted granted Critical
Publication of DE102004008900B4 publication Critical patent/DE102004008900B4/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H10P72/0402
    • H10P72/3406
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S414/00Material or article handling
    • Y10S414/135Associated with semiconductor wafer handling
    • Y10S414/14Wafer cassette transporting
DE102004008900A 2003-02-25 2004-02-24 Vorrichtung zum Verarbeiten von Wafern Expired - Fee Related DE102004008900B4 (de)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
KR1020030011777A KR100562500B1 (ko) 2003-02-25 2003-02-25 기판 이송 시스템 및 기판 이송 방법
KR03-11777 2003-02-25
US10/619112 2003-07-14
US10/619,112 US20040165973A1 (en) 2003-02-25 2003-07-14 Apparatus and method for processing wafers

Publications (3)

Publication Number Publication Date
DE102004008900A1 DE102004008900A1 (de) 2004-10-14
DE102004008900A8 true DE102004008900A8 (de) 2005-05-19
DE102004008900B4 DE102004008900B4 (de) 2009-05-07

Family

ID=36386485

Family Applications (1)

Application Number Title Priority Date Filing Date
DE102004008900A Expired - Fee Related DE102004008900B4 (de) 2003-02-25 2004-02-24 Vorrichtung zum Verarbeiten von Wafern

Country Status (5)

Country Link
US (1) US7398801B2 (de)
JP (1) JP4384519B2 (de)
CN (1) CN100382231C (de)
DE (1) DE102004008900B4 (de)
TW (1) TWI228750B (de)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4666183B2 (ja) * 2005-11-30 2011-04-06 Tdk株式会社 密閉容器の蓋開閉システムに用いられるパージ用パイプユニット
JP4278676B2 (ja) 2005-11-30 2009-06-17 Tdk株式会社 密閉容器の蓋開閉システム
JP4098338B2 (ja) * 2006-07-20 2008-06-11 川崎重工業株式会社 ウェハ移載装置および基板移載装置
FR2933813B1 (fr) * 2008-07-11 2010-12-24 Alcatel Lucent Dispositif de purge et procede.
KR101690327B1 (ko) * 2009-03-31 2016-12-27 램 리써치 코포레이션 플라즈마 어레스터 인서트
WO2013040330A1 (en) 2011-09-14 2013-03-21 Brooks Automation, Inc. Load station
JP2013161924A (ja) * 2012-02-03 2013-08-19 Tokyo Electron Ltd 基板収容容器のパージ装置及びパージ方法
KR101344215B1 (ko) 2012-06-01 2013-12-23 주식회사 테스 박막 증착장치
US9662688B2 (en) 2012-07-09 2017-05-30 Kla-Tencor Corporation Apparatus and method for cross-flow purge for optical components in a chamber
CN117174611A (zh) 2013-08-12 2023-12-05 应用材料公司 具有工厂接口环境控制的基板处理系统、装置和方法
US9607873B2 (en) * 2014-02-07 2017-03-28 Taiwan Semiconductor Manufacturing Company Ltd. Apparatus and operation method thereof
CN103904010B (zh) * 2014-03-20 2017-01-04 上海华力微电子有限公司 一种晶圆传送装置
KR20210080633A (ko) 2014-11-25 2021-06-30 어플라이드 머티어리얼스, 인코포레이티드 기판 캐리어 및 퍼지 챔버 환경 제어들을 이용하는 기판 프로세싱 시스템들, 장치, 및 방법들
JP6429015B2 (ja) * 2014-12-26 2018-11-28 Tdk株式会社 ガスパージユニットおよびガスパージ装置
CN104766814A (zh) * 2015-03-31 2015-07-08 上海华力微电子有限公司 一种防止湿法清洗工艺中自然氧化膜生长的装置及方法
US10566216B2 (en) * 2017-06-09 2020-02-18 Lam Research Corporation Equipment front end module gas recirculation
TWI635559B (zh) * 2017-07-25 2018-09-11 春田科技顧問股份有限公司 裝載埠的吹淨裝置及其吹淨方法
TWI779134B (zh) * 2017-11-27 2022-10-01 荷蘭商Asm智慧財產控股私人有限公司 用於儲存晶圓匣的儲存裝置及批爐總成

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0408216A3 (en) * 1989-07-11 1991-09-18 Hitachi, Ltd. Method for processing wafers and producing semiconductor devices and apparatus for producing the same
JPH0846005A (ja) 1994-07-26 1996-02-16 Takenaka Komuten Co Ltd ウエーハ移載装置
TW344847B (en) * 1996-08-29 1998-11-11 Tokyo Electron Co Ltd Substrate treatment system, substrate transfer system, and substrate transfer method
JP3425592B2 (ja) * 1997-08-12 2003-07-14 東京エレクトロン株式会社 処理装置
JP3722604B2 (ja) * 1997-11-13 2005-11-30 大日本スクリーン製造株式会社 基板処理装置
JP3367421B2 (ja) 1998-04-16 2003-01-14 東京エレクトロン株式会社 被処理体の収納装置及び搬出入ステージ
US6032704A (en) * 1998-04-30 2000-03-07 Taiwan Semiconductor Manufacturing Co., Ltd. Method and apparatus for storing wafers without moisture absorption
NL1009327C2 (nl) * 1998-06-05 1999-12-10 Asm Int Werkwijze en inrichting voor het overbrengen van wafers.
US6109915A (en) * 1998-12-08 2000-08-29 United Microelectronics Corp. Drafting apparatus
US6364762B1 (en) * 1999-09-30 2002-04-02 Lam Research Corporation Wafer atmospheric transport module having a controlled mini-environment
US7241993B2 (en) * 2000-06-27 2007-07-10 Ebara Corporation Inspection system by charged particle beam and method of manufacturing devices using the system
US6593152B2 (en) * 2000-11-02 2003-07-15 Ebara Corporation Electron beam apparatus and method of manufacturing semiconductor device using the apparatus
JP2002158155A (ja) * 2000-11-17 2002-05-31 Canon Inc 露光装置および露光方法
US6448537B1 (en) * 2000-12-11 2002-09-10 Eric Anton Nering Single-wafer process chamber thermal convection processes
JP2002359273A (ja) * 2001-06-01 2002-12-13 Takehide Hayashi ウェハー搬送容器用オープナー
JP2003007813A (ja) * 2001-06-20 2003-01-10 Nec Corp 半導体ウエハの保管ボックス、運搬装置、運搬方法及び保管倉庫
JP2003007799A (ja) * 2001-06-21 2003-01-10 Tokyo Electron Ltd 処理システム
JP2003092345A (ja) * 2001-07-13 2003-03-28 Semiconductor Leading Edge Technologies Inc 基板収納容器、基板搬送システム、保管装置及びガス置換方法
JP3880343B2 (ja) * 2001-08-01 2007-02-14 株式会社ルネサステクノロジ ロードポート、基板処理装置および雰囲気置換方法

Also Published As

Publication number Publication date
DE102004008900B4 (de) 2009-05-07
JP2004260172A (ja) 2004-09-16
DE102004008900A1 (de) 2004-10-14
CN1525529A (zh) 2004-09-01
US20060104750A1 (en) 2006-05-18
TWI228750B (en) 2005-03-01
TW200416807A (en) 2004-09-01
JP4384519B2 (ja) 2009-12-16
US7398801B2 (en) 2008-07-15
CN100382231C (zh) 2008-04-16

Similar Documents

Publication Publication Date Title
DE60322144D1 (de) Verfahren und Vorrichtung zum chemisch-mechanischen Polieren
DE60217289D1 (de) Vorrichtung und Verfahren zum Verarbeiten von bewegten Bildern
DE602004015615D1 (de) Einrichtung und verfahren zum verarbeiten von banknoten
DE60222730D1 (de) Verfahren und Vorrichtung zum Ausführen von Aufgaben
DE602004029853D1 (de) Vorrichtung und Verfahren zur Aufbereitung von Proben
DE60319661D1 (de) Datenverarbeitungsverfahren und Vorrichtung zum Einfügen und Auffinden von Wasserzeichen
DE60301642D1 (de) Verfahren und Vorrichtung zum Selektieren und Zuführen von Artikeln
DE50302347D1 (de) Verfahren und einrichtung zum verarbeiten von flachen sendungen
DE60323015D1 (de) Vorrichtung und Verfahren zum Gewinnen von Röntgenstrahlendaten
DE602006008553D1 (de) Vorrichtung und Verfahren zum Fördern von Werkstücken
DE102004008900A8 (de) Vorrichtung und Verfahren zum Verarbeiten von Wafern
DE602005017318D1 (de) Verfahren und Vorrichtung zum Bereitstellen von Entwurfsdaten
DE60306247D1 (de) Vorrichtung und Verfahren zum Sterilisieren
DE60206447D1 (de) Verfahren und Vorrichtung zum Ausbalancieren von Superkapazitäten
DE60315540D1 (de) Vorrichtung und Verfahren zum Dispergieren
DE60306215D1 (de) Verfahren und Vorrichtung zum superplastischen Verformen
DE602006020007D1 (de) Verfahren und Vorrichtung zum Bearbeiten von zurückgeschicktem Postgut
AT4855U3 (de) Verfahren und vorrichtung zum behandeln von maische
DE60204394D1 (de) Vorrichtung und Verfahren zum Aufschäumen
DE60127319D1 (de) Verfahren und vorrichtung zum integrieren mehrerer prozesssteuerungen
DE50312099D1 (de) Vorrichtung und Verfahren zum Umsetzen und Addiererschaltung
DE10391843D2 (de) Verfahren und Vorrichtung zum chemisch-mechanischen Polieren von Werkstücken
DE50303159D1 (de) Vorrichtung und Verfahren zum Heraustrennen von Kunststoffkarten
DE60137466D1 (de) Verfahren und Vorrichtung zum Bearbeiten von V-Mikrorillen
DE60215277D1 (de) Vorrichtung und Verfahren zum Zeichnen

Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
8181 Inventor (new situation)

Inventor name: CHAE, HEE-SUN, YONGIN, KYONGGI, KR

Inventor name: LEE, SOO-WONG, SUWON, KYONGGI, KR

Inventor name: LEE, KUN-HYUNG, SUWON, KYONGGI, KR

Inventor name: JUNG, JAE-HYUNG, YONGIN, KYONGGI, KR

Inventor name: CHO, HYUN-HO, SUWON, KYONGGI, KR

Inventor name: LEE, SUN-YONG, SEOUL, KR

8196 Reprint of faulty title page (publication) german patentblatt: part 1a6
OP8 Request for examination as to paragraph 44 patent law
8364 No opposition during term of opposition
R119 Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee

Effective date: 20110901