CN201145800Y - TFT array substrate for liquid crystal display being easy to measure - Google Patents
TFT array substrate for liquid crystal display being easy to measure Download PDFInfo
- Publication number
- CN201145800Y CN201145800Y CNU2008200545770U CN200820054577U CN201145800Y CN 201145800 Y CN201145800 Y CN 201145800Y CN U2008200545770 U CNU2008200545770 U CN U2008200545770U CN 200820054577 U CN200820054577 U CN 200820054577U CN 201145800 Y CN201145800 Y CN 201145800Y
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- test block
- common electrode
- array substrate
- liquid crystal
- tft array
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Abstract
The utility model discloses a TFT array substrate which is easy to measure and is used for liquid crystal display. The TFT array substrate comprises a common electrode, an insulation layer, a passivation layer, a pixel electrode layer and frame sealing glue; the pixel electrode layer is also provided with an ITO test block; the test block and the common electrode are in electric connection; and the outer measuring terminal of the test block is exposed outside the frame sealing glue. In the TFT array substrate which is easy to measure and is used for liquid crystal display, as the IOT test block which is in electric connection with the common electrode is preset when the array substrate is manufactured, and the outermost side of the ITO test block is exposed outside the frame sealing glue, the test block can be contacted by a probe without detaching a panel, thereby greatly simplifying the working procedure needed for measurement, farthest ensuring the integrality of the substrate, avoiding elements from being damaged and greatly improving the working efficiency and the yield of finished products.
Description
Technical field
The utility model relates to a kind of liquid crystal indicator, relates in particular to a kind of liquid crystal display tft array substrate.
Background technology
LCD (LCD) is to utilize the variation that is applied to electric field intensity on the liquid crystal molecule, and the orientation control that changes liquid crystal molecule comes display image through the power of light.In general, complete display panels backlight module, polaroid, TFT (thin film transistor (TFT)) infrabasal plate and CF (color filter) upper substrate must be arranged and the box formed by two substrates in the layer of liquid crystal molecule of filling constitute.A large amount of pixel electrodes is arranged on the TFT substrate, and voltage swing on the pixel electrode and break-make are controlled by the grid that is connected with horizontal scanning line signal, the source signal that is connected with vertical drive signal line.ITO public electrode on the CF upper substrate and the electric field intensity between the ITO pixel electrode on the infrabasal plate change the orientation of controlling liquid crystal molecule.On the TFT substrate and the sweep signal line parallel and be in be used for keeping next signal and arrive with the memory capacitance that forms between the memory capacitance concentric line of one deck and the ITO pixel electrode before the state of liquid crystal molecule.
In the manufacture process of TFT substrate, technologic any deviation a little all may cause defective to display panel, or the pollution on the opening circuit of lead, short circuit or the pixel electrode, influence the image quality of liquid crystal display, when going wrong, often need every signal is measured, particularly for common electrode, because distributed more widely on panel, each several part voltage is difference to some extent, need assist the position of decision problem generation to its measurement of carrying out each position.Simultaneously, counter plate performs an analysis when judging, to guarantee that also panel is excellent, so the measurement to common electrode can not be based upon on the basis of destroying panel, and want to judge by measuring-signal the common electrode electric conductivity of various different models or same model different panels, and judge the part characteristic of panel designs with this.
Usually measurement needs counter plate to carry out dissection process to existing panel to common electrode, promptly taking the part of panel apart carries out, operation is comparatively numerous and diverse, measuring result error is bigger, and cause liquid crystal pollution easily, the panel of measuring after finishing can not be assembled use again, can only discard, thereby increased the coefficient of losses of factory aspect, increased cost.
The utility model content
Technical problem to be solved in the utility model provides a kind of liquid crystal display tft array substrate with special peripheral ITO design, can not need to disassemble panel and just can finish measurement common electrode, do not influence the internal soundness of array base palte, can not cause therefore that extra electric capacity produces yet.
In order to solve the problems of the technologies described above the liquid crystal display tft array substrate of easy measurement of the present utility model, comprise common electrode, insulation course and passivation layer, pixel electrode layer and envelope frame glue, also be provided with the ITO test block at described pixel electrode layer, test block and common electrode are electrically connected, and the outside measuring junction of test block is exposed to outside the envelope frame glue.
Described ITO test block can be arranged at the top of insulation course and passivation layer, and test block is electrically connected by contact hole and common electrode.
Be provided with peripheral extension end block as the described common electrode of another mode greater than envelope frame glue periphery, insulation course and passivation layer etching above the extension end block of common electrode are provided with opening, are provided with the ITO test block that is electrically connected with common electrode in the opening.
The liquid crystal display of easy measurement of the present utility model with tft array substrate owing to be provided with the ITO test block that is electrically connected with common electrode in advance when the manufacturing array substrate, this ITO test block is of a size of a millimeter magnitude, goes for various measurement boards and various instrument and meter probe; This ITO test block outermost is exposed to outside the envelope frame glue, can not need to disassemble panel and just can touch with probe; So simplified greatly and measured required operation, also at utmost guaranteed substrate integrality, avoid element therefore impaired, improved work efficiency greatly, also improved yield rate.In addition, the ITO pattern of this test block does not cover alignment mark or the interior cabling of other faces in any panel, produces, can not produce harmful effect to showing so can not cause extra electric capacity.
Description of drawings
Fig. 1. be the utility model array base palte periphery ITO test block structured synoptic diagram;
Fig. 2. be the synoptic diagram () that the ITO test block is connected with common electrode by contact hole in the array base palte of the utility model embodiment 1;
Fig. 3. be the synoptic diagram (two) that the ITO test block is connected with common electrode by contact hole in the array base palte of the utility model embodiment 1;
Fig. 4. be the synoptic diagram () that the ITO test block is connected with common electrode by contact hole in the array base palte of the utility model embodiment 2;
Fig. 5. be the synoptic diagram (two) that the ITO test block is connected with common electrode by contact hole in the array base palte of the utility model embodiment 2, i.e. A-A sectional view among Fig. 4.
Among the figure: 1. array base palte housing 2. color membrane substrates housing 3.ITO test blocks
4. seal frame glue 5. common electrodes 6. contact holes
7. glass electrode 8. the first metal layers tops insulation course and passivation layer
301.ITO the extension end block of outside measuring junction 501. common electrodes of test block
Embodiment
The utility model is described in further detail below in conjunction with drawings and the specific embodiments.
Fig. 1,2,3 shows a kind of liquid crystal display tft array substrate of easy measurement, include the first metal layer, the insulation course on the first metal layer and the passivation layer 8 that are provided with grid, source electrode and common electrode, pixel electrode layer and envelope frame glue 4, voltage swing on the pixel electrode and break-make are controlled by the grid that is connected with horizontal scanning line signal, the source signal that is connected with vertical drive signal line.Pixel electrode layer above insulation course and passivation layer 8 also is provided with ITO test block 3, and test block 3 is electrically connected by contact hole 6 and common electrode 5, and the outside of test block 3 has and is exposed to that size is the measuring junction 301 of 1mm * 1mm outside the envelope frame glue 4.
Like this when measuring, just can measure every data easily as long as directly be pressed in probe with measurement on the outside measuring junction 301 of ITO test block 3.
Fig. 4, the 5th, another kind of embodiment of the present utility model, the difference of itself and embodiment 1 is: the edge that is arranged at the common electrode 5 of the first metal layer is provided with peripheral extension end block 501 greater than envelope frame glue periphery, and insulation course above the extension end block 501 of common electrode 5 and passivation layer 8 etchings are provided with opening; When deposition ITO pixel electrode, in opening, be provided with the ITO test block 3 that directly is electrically connected with common electrode simultaneously.
During measurement, same just can measure every data easily as long as directly be pressed on the ITO test block 3 with probe with measurement.
Claims (3)
1. liquid crystal display tft array substrate of easily measuring, comprise common electrode, insulation course and passivation layer, pixel electrode layer and envelope frame glue, it is characterized in that: also be provided with the ITO test block at described pixel electrode layer, test block and common electrode are electrically connected, and the outside measuring junction of test block is exposed to outside the envelope frame glue.
2. the liquid crystal display tft array substrate of easy measurement according to claim 1, it is characterized in that: described ITO test block is arranged at the top of insulation course and passivation layer, and test block is electrically connected by contact hole and common electrode.
3. the liquid crystal display tft array substrate of easy measurement according to claim 1, it is characterized in that: described common electrode is provided with peripheral extension end block greater than envelope frame glue periphery, insulation course and passivation layer etching above the extension end block of common electrode are provided with opening, are provided with the ITO test block that is electrically connected with common electrode in the opening.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU2008200545770U CN201145800Y (en) | 2008-01-09 | 2008-01-09 | TFT array substrate for liquid crystal display being easy to measure |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU2008200545770U CN201145800Y (en) | 2008-01-09 | 2008-01-09 | TFT array substrate for liquid crystal display being easy to measure |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201145800Y true CN201145800Y (en) | 2008-11-05 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNU2008200545770U Expired - Fee Related CN201145800Y (en) | 2008-01-09 | 2008-01-09 | TFT array substrate for liquid crystal display being easy to measure |
Country Status (1)
| Country | Link |
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| CN (1) | CN201145800Y (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103354072A (en) * | 2013-02-20 | 2013-10-16 | 友达光电股份有限公司 | display device and detection method thereof |
| TWI467269B (en) * | 2012-07-02 | 2015-01-01 | E Ink Holdings Inc | Test structure of display panel and testing method thereof and tested test structure |
| CN104777637A (en) * | 2015-05-08 | 2015-07-15 | 上海中航光电子有限公司 | Array substrate and touch-control display device and testing method thereof |
| CN116360168A (en) * | 2023-05-11 | 2023-06-30 | 惠科股份有限公司 | display device |
-
2008
- 2008-01-09 CN CNU2008200545770U patent/CN201145800Y/en not_active Expired - Fee Related
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI467269B (en) * | 2012-07-02 | 2015-01-01 | E Ink Holdings Inc | Test structure of display panel and testing method thereof and tested test structure |
| CN103354072A (en) * | 2013-02-20 | 2013-10-16 | 友达光电股份有限公司 | display device and detection method thereof |
| CN103354072B (en) * | 2013-02-20 | 2015-12-09 | 友达光电股份有限公司 | display device and detection method thereof |
| CN104777637A (en) * | 2015-05-08 | 2015-07-15 | 上海中航光电子有限公司 | Array substrate and touch-control display device and testing method thereof |
| CN104777637B (en) * | 2015-05-08 | 2018-01-02 | 上海中航光电子有限公司 | Array base palte, touch control display apparatus and its method of testing |
| US10162440B2 (en) | 2015-05-08 | 2018-12-25 | Shanghai Avic Opto Electronics Co., Ltd. | Array substrate, touch display apparatus and test method thereof |
| CN116360168A (en) * | 2023-05-11 | 2023-06-30 | 惠科股份有限公司 | display device |
| CN116360168B (en) * | 2023-05-11 | 2023-08-18 | 惠科股份有限公司 | display device |
| US12523911B2 (en) | 2023-05-11 | 2026-01-13 | HKC Corporation Limited | Display device |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20081105 Termination date: 20110109 |