CN201156138Y - Array substrate - Google Patents
Array substrate Download PDFInfo
- Publication number
- CN201156138Y CN201156138Y CNU2008200557138U CN200820055713U CN201156138Y CN 201156138 Y CN201156138 Y CN 201156138Y CN U2008200557138 U CNU2008200557138 U CN U2008200557138U CN 200820055713 U CN200820055713 U CN 200820055713U CN 201156138 Y CN201156138 Y CN 201156138Y
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- CN
- China
- Prior art keywords
- additional
- pixel electrode
- measuring
- ito
- distribution
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000000758 substrate Substances 0.000 title description 9
- 239000003292 glue Substances 0.000 claims abstract description 21
- 238000009826 distribution Methods 0.000 claims description 33
- 238000005259 measurement Methods 0.000 claims description 21
- 238000009413 insulation Methods 0.000 claims description 7
- 230000035807 sensation Effects 0.000 claims description 2
- 239000004973 liquid crystal related substance Substances 0.000 abstract description 12
- 239000000523 sample Substances 0.000 abstract description 3
- 238000007789 sealing Methods 0.000 abstract description 3
- 238000005286 illumination Methods 0.000 abstract 1
- 210000002858 crystal cell Anatomy 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000002161 passivation Methods 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000002224 dissection Methods 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
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- Liquid Crystal (AREA)
Abstract
The utility model discloses an array baseplate, which can more easily measure TFT characteristics. The array baseplate comprises scanning lines, data lines, an insulating layer, a pixel electrode and frame-sealing glue; the four corners of the display area of the array baseplate are respectively provided with an additional pixel electrode and respectively provided with two additional scanning lines and two additional data lines, which correspond to the four additional pixel electrodes; one side of the pixel electrode is also provided with additional measuring wires; a connecting lug, which is partially superposed with the additional measuring wires, is arranged on one side of each additional pixel electrode, which faces the additional measuring wires; each of the six additional wires is provided with a measuring block which is electrically connected with the additional wire and extended out of the frame-sealing glue. The array baseplate can ensure that without disassembling a panel, a probe can be directly used to measure the TFT characteristics of additional pixels on the four corners of the display area of the panel through the ITO measuring blocks electrically contacted with the additional wires, and moreover, the array baseplate can provide proper backlight source illumination and keep the existence of a liquid crystal box, thus increasing the credibility of measuring results.
Description
Technical field
The utility model relates to a kind of liquid crystal display, relates in particular to a kind of tft array substrate.
Background technology
LCD (LCD) is to utilize the variation that is applied to electric field intensity on the liquid crystal molecule, and the orientation control that changes liquid crystal molecule comes display image through the power of light.In general, complete display panels backlight module, polaroid, TFT (thin film transistor (TFT)) infrabasal plate and CF (color filter) upper substrate must be arranged and the box formed by two substrates in the layer of liquid crystal molecule of filling constitute.A large amount of pixel electrodes is arranged on the TFT substrate, and voltage swing on the pixel electrode and break-make are controlled by the grid that is connected with horizontal scanning line signal, the source signal that is connected with vertical drive signal line.ITO public electrode on the CF upper substrate and the electric field intensity between the ITO pixel electrode on the infrabasal plate change the orientation of controlling liquid crystal molecule.On the TFT substrate and the sweep signal line parallel and be in be used for keeping next signal and arrive with the memory capacitance that forms between the memory capacitance concentric line of one deck and the ITO pixel electrode before the state of liquid crystal molecule.
In the manufacture process of TFT substrate, technologic any deviation a little all may cause defective to display panel, or the variation on the homogeneity of thickness or the pixel TFT characteristic, influence the image quality of liquid crystal display, when going wrong, often need every signal is measured, especially for the TFT characteristic, because the viewing area distributes on panel, the each several part characteristic is because thickness deviation difference to some extent, the reason that need assist decision problem to take place to its measurement of carrying out each position.Simultaneously, counter plate performs an analysis when judging, to guarantee that also panel is excellent, so the measurement to the TFT characteristic can not be based upon on the basis of destroying panel, and want to judge by measuring-signal the TFT characteristic of various diverse locations or same position different panels, and judge the part characteristic of panel designs with this.
Existing panel needs counter plate to carry out dissection process to the TFT feature measurement usually, promptly taking the part of panel apart carries out, and panel cut measure, operation is comparatively numerous and diverse, and measurement result is not accurate enough owing to having lacked liquid crystal cell and suitable backlight irradiation, and causes liquid crystal pollution easily, panel after measurement finishes can not be assembled use again, can only discard, thereby increase the coefficient of losses of factory aspect, increase cost.
The utility model content
Technical problem to be solved in the utility model provides a kind of liquid crystal display tft array substrate with special peripheral additional pixels design, can not need to disassemble panel and just can finish measurement, and not influence the internal soundness of array base palte the TFT characteristic.
Comprise sweep trace, data line, insulation course, pixel electrode and envelope frame glue for solving the problems of the technologies described above array base palte of the present utility model.
Four angles in the array base palte viewing area respectively are provided with an additional pixel electrode, and two additional (Dummy) sweep traces and two additional (Dummy) data lines of being respectively arranged with corresponding connection with it in the edge, viewing area, side in additional pixel electrode, be provided with other two additional distributions of measuring with data line in data line layer with paralleling, described additional pixel electrode is provided with the connection projection to an additional side of measuring distribution, and it is overlapping with described additional measurement distribution that this connects the projection part; All six roots of sensation are added distribution (comprising above-mentioned two additional scanning lines, two additional data lines, two additional distributions of measuring) and all are provided with the ITO measurement piece that seals outside the frame glue that stretches out in that is electrically connected with it.
Described additional measurement distribution preferably is arranged at the outside of additional pixel electrode.
It is the conducting strip of pixel electrode layer that described ITO measures piece, and its inner is connected with additional wired electric by contact hole, and the outer measuring junction that exposes that forms of envelope frame glue is stretched out in its outer end.
Another way can extend to zone outside the envelope frame glue for: described additional distribution, and the area pixel electrode layer outside envelope frame glue is provided with ITO and measures piece, and ITO measures piece and is connected with additional wired electric.
The insulation course on regional upper strata is etched with and measures the piece breach outside the further described additional distribution envelope frame glue, is provided with the ITO that directly is electrically connected with additional distribution in the breach and measures piece.
Array base palte based on the special peripheral additional pixels design of having of said structure, panel can not disassembled, under the prerequisite of not damaging panel and envelope frame glue, directly measure by the TFT characteristic that the ITO that contacts with additional wired electric measures the additional pixels of four jiaos of the direct counter plate of piece viewing areas with probe, thereby can give the confidence level that improves measurement result with irradiation of suitable backlight and the existence that keeps liquid crystal cell, and such design can not have influence in the circuit characteristic of panel or the production run operations such as contraposition inspection.
Description of drawings
For above-mentioned purpose of the present utility model, feature and advantage can be become apparent, below in conjunction with accompanying drawing embodiment of the present utility model is elaborated, wherein:
Fig. 1 is the structural representation of the utility model array base palte additional pixels design;
Fig. 2 is the synoptic diagram that additional pixel electrode and additional measurement distribution overlap;
Fig. 3 is the structural representation () that ITO measurement piece and additional distribution directly electrically contact;
Fig. 4 is the structural representation (two) that ITO measurement piece and additional distribution directly electrically contact, i.e. A-A sectional view among Fig. 3.
Among the figure: 1. sweep trace 2. data lines 3. pixel electrodes
4. envelope frame glue 5. viewing area 6.ITO measure piece
7. insulation course, passivation layer 100. add the extension end block of distributions
101. additional scanning line 102. additional data lines
103. the additional pixel electrode 202. additional distributions of measuring
601. measuring junction 1032. connects projection
Embodiment
Fig. 1 shows the array base palte that is easy to measure the TFT characteristic of the present utility model, comprise sweep trace 1, data line 2, insulation course, pixel electrode 3 and envelope frame glue 4, four angles in array base palte viewing area 5 respectively are provided with an additional pixel electrode 103, and are respectively arranged with two additional scanning lines 101 and two additional data lines 102 of corresponding connection with it in the edge, viewing area.
The outside in additional pixel electrode 103, be provided with other two additional distributions 202 of measuring at data line layer and data line 2 with paralleling, promptly Zuo Ce additional measurement distribution 202 is arranged at the left side of additional data lines 102, the additional measurement distribution 202 on right side is arranged at the right side of additional pixel electrode 103, described additional pixel electrode 103 is provided with to an additional side of measuring distribution and connects projection 1032, and these connection projection 1032 parts and described additional measurement distribution 202 are overlapping.
All 6 additional distributions all are provided with the ITO that stretches out in outside the envelope frame glue 4 that is electrically connected with it and measure piece 6, it is the ITO conducting strip that is provided with when the ITO pixel electrode layer is set that described ITO measures piece, its the inner is connected with additional wired electric by contact hole, and the exposed measuring junction 601 that forms 1mm * 1mm outside the envelope frame glue 4 is stretched out in its outer end.
Equally shown in Fig. 3,4 as another embodiment, described additional distribution can be arranged to extend to the zone outside the envelope frame glue, form the extension end block 100 of additional distribution, simultaneously in the zone of sealing outside the frame glue 4, the insulation course on wiring layer upper strata, passivation layer 7 are etched with 1mm * 1mm and measure the piece breach, are provided with the ITO that directly is electrically connected with additional distribution in the breach and measure piece 6.
During measurement, with laser the pixel electrode 103 of the additional pixels measured is welded together (as shown in Figure 2) with the additional distribution of measuring, scrape off the alignment film that corresponding ITO measures measuring junction 601 surfaces of piece 6 then gently, be pressed in survey measurements on the measuring junction 601 with probe.Additional pixel electrode 103, is measured distribution 202 and is measured piece 6 Continuity signals and finish feature measurement to TFT by additional to its charging by additional scanning line 101 and additional data lines 102.
Claims (5)
1. an array base palte comprises sweep trace, data line, insulation course, pixel electrode and envelope frame glue, it is characterized in that:
Four angles in the array base palte viewing area respectively are provided with an additional pixel electrode, and are respectively arranged with two additional scanning lines and two additional data lines of corresponding connection with it in the edge, viewing area,
Side in additional pixel electrode, be provided with other two additional distributions of measuring with data line in data line layer with paralleling, described additional pixel electrode is provided with the connection projection to an additional side of measuring distribution, and it is overlapping with described additional measurement distribution that this connects the projection part;
The additional distribution of all six roots of sensation all is provided with the ITO that stretches out in outside the envelope frame glue that is electrically connected with it and measures piece.
2. array base palte according to claim 1 is characterized in that: described additional measurement distribution is arranged at the outside of additional pixel electrode.
3. array base palte according to claim 1 is characterized in that: it is the conducting strip of pixel electrode layer that described ITO measures piece, and its inner is connected with additional wired electric by contact hole, and the outer measuring junction that exposes that forms of envelope frame glue is stretched out in its outer end.
4. array base palte according to claim 1 is characterized in that: described additional distribution extends to the zone outside the envelope frame glue, and the area pixel electrode layer outside envelope frame glue is provided with ITO and measures piece, and ITO measures piece and is connected with additional wired electric.
5. array base palte according to claim 4 is characterized in that: the insulation course on regional upper strata is etched with and measures the piece breach outside the described additional distribution envelope frame glue, is provided with the ITO that directly is electrically connected with additional distribution in the breach and measures piece.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU2008200557138U CN201156138Y (en) | 2008-02-26 | 2008-02-26 | Array substrate |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU2008200557138U CN201156138Y (en) | 2008-02-26 | 2008-02-26 | Array substrate |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201156138Y true CN201156138Y (en) | 2008-11-26 |
Family
ID=40103918
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNU2008200557138U Expired - Lifetime CN201156138Y (en) | 2008-02-26 | 2008-02-26 | Array substrate |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN201156138Y (en) |
-
2008
- 2008-02-26 CN CNU2008200557138U patent/CN201156138Y/en not_active Expired - Lifetime
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| AV01 | Patent right actively abandoned |
Effective date of abandoning: 20080226 |
|
| C25 | Abandonment of patent right or utility model to avoid double patenting |