[go: up one dir, main page]

CN1796127A - Fluid ejection device with sensor and method of making same - Google Patents

Fluid ejection device with sensor and method of making same Download PDF

Info

Publication number
CN1796127A
CN1796127A CN 200410081965 CN200410081965A CN1796127A CN 1796127 A CN1796127 A CN 1796127A CN 200410081965 CN200410081965 CN 200410081965 CN 200410081965 A CN200410081965 A CN 200410081965A CN 1796127 A CN1796127 A CN 1796127A
Authority
CN
China
Prior art keywords
fluid
sensor
fluid ejection
ejection apparatus
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN 200410081965
Other languages
Chinese (zh)
Inventor
周忠诚
黄宗伟
周凯彬
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BenQ Corp
Original Assignee
BenQ Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by BenQ Corp filed Critical BenQ Corp
Priority to CN 200410081965 priority Critical patent/CN1796127A/en
Publication of CN1796127A publication Critical patent/CN1796127A/en
Pending legal-status Critical Current

Links

Images

Landscapes

  • Particle Formation And Scattering Control In Inkjet Printers (AREA)

Abstract

The invention provides a fluid ejection device with a sensor and a method of manufacturing the same. The fluid ejection device includes a substrate. A structural layer is disposed on the substrate and forms a fluid chamber with the substrate. At least one bubble generating device is arranged on the structural layer at the corresponding side of the fluid cavity. At least one linear resistance sensor connected to the fluid chamber. A protection layer covering the bubble generating device and the linear resistance sensor. And a nozzle, which is adjacent to the bubble generator, penetrates the protective layer and the structural layer, and is communicated with the fluid cavity.

Description

具有传感器的流体喷射装置及其制作方法Fluid ejection device with sensor and method of making same

技术领域technical field

本发明涉及一种流体喷射装置及其制造方法,特别涉及一种具有传感器(sensor)的流体喷射装置及其制造方法,通过传感器,使得在制造过程中实时监控流体腔的形成。The present invention relates to a fluid ejection device and a manufacturing method thereof, in particular to a fluid ejection device with a sensor and a manufacturing method thereof, through which the formation of a fluid cavity can be monitored in real time during the manufacturing process.

背景技术Background technique

微流体喷射装置近来已广泛地运用于信息产业,例如喷墨打印机或类似设备中。随着微系统工程(micro system engineering)的逐步开发,此种流体喷射装置逐渐应用与其它众多领域,例如燃料喷射系统(fuel injectionsystem)、细胞筛选(cell sorting)、药物释放系统(drug delivery system)、喷印光刻技术(print lithography)及微喷射推进系统(micro jet propulsion system)等。在前述各应用领域中,较为成功的一种设计使用热驱动气泡(thermaldriven bubble)方式以喷射微液滴。由于其设计简单且成本低廉,因此在使用上也最为普遍。Microfluid ejection devices have recently been widely used in the information industry, such as in inkjet printers or the like. With the gradual development of micro system engineering, this kind of fluid injection device is gradually applied to many other fields, such as fuel injection system, cell sorting, drug delivery system , printing lithography (print lithography) and micro jet propulsion system (micro jet propulsion system), etc. Among the aforementioned application fields, a relatively successful design uses thermally driven bubbles to eject micro-droplets. It is also the most commonly used due to its simple design and low cost.

图1显示一种现有技术中的美国专利第6,102,530号的独石化的流体喷射装置1,其以一硅基底10作为本体,且在硅基底l0上形成一结构层12,而在硅基底10和结构层12之间形成一流体腔14,用以容纳流体26;而在结构层12上设有一第一加热器20、以及一第二加热器22,第一加热器20用以在流体腔14内产生一第一气泡30,第二加热器22用以在流体腔14内产生一第二气泡32,以将流体腔14内的流体26射出。Fig. 1 shows a monolithic fluid ejection device 1 of U.S. Patent No. 6,102,530 in the prior art, which uses a silicon substrate 10 as a body, and forms a structural layer 12 on the silicon substrate 10, and on the silicon substrate 10 A fluid cavity 14 is formed between the structural layer 12 to accommodate the fluid 26; and a first heater 20 and a second heater 22 are arranged on the structural layer 12, and the first heater 20 is used for the fluid cavity 14 A first air bubble 30 is generated in the fluid chamber 14 , and the second heater 22 is used to generate a second air bubble 32 in the fluid chamber 14 to eject the fluid 26 in the fluid chamber 14 .

由于独石化的流体喷射装置1具有虚拟气阀(virtual valve)的设计,并拥有高排列密度、低交互干扰、低热量损失的特性,且无须另外利用组装方式接合喷孔片,因此可以降低生产成本。Since the monolithic fluid injection device 1 has a virtual valve design, and has the characteristics of high arrangement density, low interaction interference, and low heat loss, and does not need to be assembled to join the orifice sheet, it can reduce production. cost.

然而,在现有技术的独石化的流体喷射装置1中,结构层12主要由低应力的氮化硅所组成。在制造过程中,其厚度对于流体喷射装置的寿命有直接的影响。此外,对流体喷射装置的设计者而言,流体喷射装置所表现的流体喷射效果,与使用寿命皆为其所关注的重点。因此,形成流体腔时的蚀刻过程能否精确受到控制将关键地影响流体腔尺寸的精确,也对流体喷射性质的表现有很大的影响。However, in the prior art monolithic fluid ejection device 1, the structural layer 12 is mainly composed of low stress silicon nitride. During manufacture, its thickness has a direct effect on the life of the fluid ejection device. In addition, for the designers of the fluid ejection device, the fluid ejection effect and service life of the fluid ejection device are the focus of attention. Therefore, whether the etching process during the formation of the fluid cavity can be accurately controlled will critically affect the accuracy of the size of the fluid cavity, and also have a great influence on the performance of the fluid ejection properties.

此外,针对热气泡驱动流体喷射的装置,若流体腔内的流体填充不足,除影响所喷出微流体液滴尺寸的均匀性的外,也可能造成加热器的「空烧效应」而导致加热器过早损坏。In addition, for thermal bubble-driven fluid injection devices, if the fluid in the fluid chamber is not filled enough, in addition to affecting the uniformity of the ejected microfluidic droplet size, it may also cause the "empty firing effect" of the heater to cause heating. premature damage to the device.

传统上,对于蚀刻过程的控制,现有技术多利用控片(control wafer)监控蚀刻结果,作为蚀刻进度的比较基准。此种方法必须在蚀刻过程中的各项参数,例如:蚀刻液浓度、温度...等皆处于精确的控制下,方可进行有效的比较。除所需手续繁复外,还需增加成本付出(例如控片花费),且无法实时测知其结果。另一方面,对流体填充的检测方式,则多利用流体喷射装置内加热器电阻值的变化作为依据,但此方法在检测过程中会对加热器造成直接地影响,所以准确性也受到怀疑。Traditionally, for the control of the etching process, the prior art mostly utilizes a control wafer to monitor the etching result as a comparison benchmark of the etching progress. In this method, various parameters in the etching process, such as: etchant concentration, temperature, etc., must be under precise control before effective comparison can be made. In addition to the complicated procedures required, it also requires additional costs (such as the cost of film control), and the results cannot be measured in real time. On the other hand, the detection method of fluid filling is mostly based on the change of the resistance value of the heater in the fluid ejection device, but this method will directly affect the heater during the detection process, so the accuracy is also questioned.

发明内容Contents of the invention

因此,本发明的目的在于提供一种具有传感器的流体喷射装置,通过传感器元件,使得在制造过程中实时监控流体腔的形成,且精确控制流体腔尺寸。Therefore, it is an object of the present invention to provide a fluid ejection device with a sensor. Through the sensor element, the formation of the fluid cavity can be monitored in real time during the manufacturing process, and the size of the fluid cavity can be precisely controlled.

本发明的另一目的在于提供一种具有传感器的流体喷射装置,通过传感器元件,使得可以对液体填充于喷孔中的高度实时监控,以提高喷射液滴的精确性。Another object of the present invention is to provide a fluid ejection device with a sensor. Through the sensor element, the filling height of the liquid in the nozzle hole can be monitored in real time, so as to improve the accuracy of ejecting liquid droplets.

本发明的再一目的在于提供一种流体喷射装置的制造方法,通过传感器元件,使得可以在制造过程中实时监控流体腔的形成,且精确控制流体腔尺寸。Another object of the present invention is to provide a method for manufacturing a fluid ejection device. Through the sensor element, the formation of the fluid chamber can be monitored in real time during the manufacturing process, and the size of the fluid chamber can be precisely controlled.

根据上述目的,本发明提供一种具有传感器的流体喷射装置,包括:一基底;一结构层,设置在基底上,且与基底之间形成一流体腔;至少一气泡产生装置,设置于结构层上流体腔的对应侧;至少一线状电阻传感器,与流体腔连接;一保护层,覆盖气泡产生装置与线状电阻传感器;以及一喷孔,邻近气泡产生器且穿透保护层与结构层,且与流体腔连通。According to the above object, the present invention provides a fluid ejection device with a sensor, comprising: a substrate; a structural layer disposed on the substrate and forming a fluid chamber with the substrate; at least one bubble generating device disposed on the structural layer upstream The corresponding side of the body cavity; at least a linear resistance sensor connected to the fluid cavity; a protective layer covering the bubble generating device and the linear resistance sensor; and a nozzle hole adjacent to the bubble generator and penetrating the protective layer and the structural layer, and in contact The fluid chambers are in communication.

根据上述目的,本发明还提供一种具有传感器的流体喷射装置,包括:一基底;一结构层,设置在基底上,且与基底之间形成一流体腔;至少一气泡产生装置,设置于结构层上流体腔的对应侧;一保护层,覆盖气泡产生装置;以及一喷孔,邻近气泡产生器且穿透保护层与结构层,且与流体腔连通;以及一薄壳电容传感器,设于结构层上、镶嵌于保护层中且环绕喷孔。According to the above object, the present invention also provides a fluid ejection device with a sensor, comprising: a substrate; a structural layer disposed on the substrate and forming a fluid chamber with the substrate; at least one bubble generating device disposed on the structural layer The corresponding side of the upper fluid chamber; a protective layer covering the bubble generating device; and a spray hole adjacent to the bubble generator and penetrating the protective layer and the structural layer, and communicated with the fluid chamber; and a thin-shell capacitive sensor disposed on the structural layer on, embedded in the protective layer and surrounding the nozzle hole.

根据上述目的,本发明又提供一种流体喷射装置的制作方法,包括下列步骤:提供一基底;形成一图案化牺牲层于基底上;形成一电阻器于牺牲层上,具有一第一端与一第二端;形成一图案化结构层于基底上,且覆盖图案化牺牲层与电阻器,露出电阻器的第一端与一第二端;以及形成一流体通道于基板的底部,以露出牺牲层;以及移除牺牲层以形成一流体腔。According to the above object, the present invention further provides a method for manufacturing a fluid ejection device, comprising the following steps: providing a substrate; forming a patterned sacrificial layer on the substrate; forming a resistor on the sacrificial layer, having a first terminal and A second end; forming a patterned structural layer on the base, covering the patterned sacrificial layer and the resistor, exposing the first end and a second end of the resistor; and forming a fluid channel on the bottom of the substrate to expose a sacrificial layer; and removing the sacrificial layer to form a fluid cavity.

附图说明Description of drawings

以下配合附图以及优选实施例,以更详细地说明本发明。The following describes the present invention in more detail in conjunction with the accompanying drawings and preferred embodiments.

图1是显示一种现有技术的独石化的流体喷射装置的剖面示意图;1 is a schematic cross-sectional view showing a prior art monolithic fluid injection device;

图2A和图2B是显示根据本发明第一实施例的具有传感器的流体喷射装置的制作过程的剖面示意图;2A and 2B are schematic cross-sectional views showing the fabrication process of the fluid ejection device with sensors according to the first embodiment of the present invention;

图2C是显示本发明第一实施例的具有传感器的流体喷射装置于填充墨水后的剖面示意图;FIG. 2C is a schematic cross-sectional view showing the fluid ejection device with sensors according to the first embodiment of the present invention after being filled with ink;

图3A和图3B是显示根据本发明第二实施例的具有传感器的流体喷射装置的制作过程的剖面示意图;3A and 3B are schematic cross-sectional views showing the fabrication process of a fluid ejection device with a sensor according to a second embodiment of the present invention;

图3C是显示本发明第二实施例的具有传感器的流体喷射装置于填充墨水后的剖面示意图;3C is a schematic cross-sectional view showing a fluid ejection device with a sensor according to a second embodiment of the present invention after being filled with ink;

图4A是显示根据本发明实施例的传感器电路为一填充流体(长度L),与线状电阻器串联的等效电路图;4A is an equivalent circuit diagram showing that the sensor circuit according to an embodiment of the present invention is a filling fluid (length L) connected in series with a linear resistor;

图4B是显示本发明第二实施例的传感器电路被设计成惠斯登电桥(Wheatstone bridge)的电路图;4B is a circuit diagram showing that the sensor circuit of the second embodiment of the present invention is designed as a Wheatstone bridge;

图5是显示本发明第三实施例的具有传感器的流体喷射装置的上视图;5 is a top view showing a fluid ejection device with a sensor according to a third embodiment of the present invention;

图6A和图6B是显示根据本发明第三实施例的具有传感器的流体喷射装置沿图5中箭头I-I’方向的制作过程剖面示意图;6A and 6B are schematic cross-sectional views showing the fabrication process of a fluid ejection device with a sensor according to a third embodiment of the present invention along the direction of arrow I-I' in FIG. 5;

图6C是显示本发明第三实施例的具有传感器的流体喷射装置于填充墨水后的剖面示意图;6C is a schematic cross-sectional view showing a fluid ejection device with a sensor according to a third embodiment of the present invention after being filled with ink;

图7A是显示本发明第三实施例的薄壳电容传感器的结构示意图;7A is a schematic structural view showing a thin shell capacitive sensor according to a third embodiment of the present invention;

图7B是显示本发明第三实施例的薄壳电容传感器的电极为多层结构,由加热器的电阻材料、金属层、与接触窗等相同的材料所构成;以及Fig. 7B shows that the electrodes of the thin shell capacitive sensor according to the third embodiment of the present invention have a multi-layer structure, which is composed of the resistance material of the heater, the metal layer, and the same material as the contact window; and

图8是显示本发明第三实施例的包含C1、C2电容与运算器的感测电路图。FIG. 8 is a diagram showing a sensing circuit including capacitors C 1 , C 2 and an arithmetic unit according to a third embodiment of the present invention.

附图标记说明Explanation of reference signs

现有技术部分(图1)Part of prior art (Figure 1)

1~独石化的流体喷射装置;10~硅基底;12~结构层;14~流体腔;20~第一加热器;22~第二加热器;26~流体通道;30~第一气泡;32~第二气泡。1~monolithic fluid injection device; 10~silicon substrate; 12~structural layer; 14~fluid cavity; 20~first heater; 22~second heater; 26~fluid channel; 30~first air bubble; 32 ~Second bubble.

本发明部分(图2A~图8)Part of the present invention (Fig. 2A-Fig. 8)

100、200、500~流体喷射装置;101、201、501~基底;110、210~牺牲层;120、120a、120b、205、205a、205b、220~线状电阻;130、230~结构层;135、235~开口;140、240~电表;145、245~保护层;150、250~流体通道;160、260~流体腔;170、270~气泡产生装置;171、271~第一加热器;172、272~第二加热器;180、280~喷孔;L~填充流体长度;R1、R2、R3、R4~电阻;510~并联电阻传感器;512~牺牲层;514~结构层;516~保护层;520~流体通道;530~流体腔;540~喷孔;550~薄壳电容传感器;551-555~薄壳电容传感器电极的多层导体结构;560a、560b与560c~电阻;562、564~导线;C1、C2~电容。100, 200, 500~fluid injection device; 101, 201, 501~substrate; 110, 210~sacrificial layer; 120, 120a, 120b, 205, 205a, 205b, 220~linear resistance; 130, 230~structural layer; 135, 235~opening; 140, 240~electric meter; 145, 245~protective layer; 150, 250~fluid channel; 160, 260~fluid chamber; 170, 270~bubble generating device; 171, 271~first heater; 172, 272~second heater; 180, 280~injection hole; L~filling fluid length; R 1 , R 2 , R 3 , R 4 ~resistance; 510~parallel resistance sensor; 512~sacrificial layer; 514~structure layer; 516~protective layer; 520~fluid channel; 530~fluid cavity; 540~spray hole; 550~thin shell capacitive sensor; 551-555~multilayer conductor structure of electrode of thin shell capacitive sensor; Resistance; 562, 564 ~ wire; C 1 , C 2 ~ capacitance.

具体实施方式Detailed ways

本发明提供一种具有传感器的流体喷射装置及流体喷射装置的制造方法。亦即提供一附有传感器的流体喷射装置,此传感器通过预设的线路布局,可在流体喷射装置蚀刻过程的前后,与流体填充与否的状态下,表现出不同的输出电子信号(例如电流或电阻),而控制系统可借此判断其蚀刻是否完成,或者是否达到适当的流体驱动条件。本发明除通过单一传感器元件达到多重功用,同时可监控流体腔的形成及检测流体腔内液体位置。并且,通过传感器,可避免直接测量加热器电阻值的变化,在检测过程中,不会直接地影响加热器原结构。The invention provides a fluid ejection device with a sensor and a manufacturing method of the fluid ejection device. That is to provide a fluid ejection device with a sensor, the sensor can show different output electronic signals (such as current) before and after the etching process of the fluid ejection device, and under the state of whether the fluid is filled or not through the preset circuit layout. Or resistance), and the control system can use this to judge whether its etching is complete, or whether it has reached the appropriate fluid driving conditions. In addition to achieving multiple functions through a single sensor element, the present invention can simultaneously monitor the formation of the fluid cavity and detect the liquid position in the fluid cavity. Moreover, the sensor can avoid directly measuring the change of the resistance value of the heater, and the original structure of the heater will not be directly affected during the detection process.

第一实施例first embodiment

本发明的第一实施例提供一具有单一线状电阻器的流体喷射装置及其制造方法。图2A和图2B是显示根据本发明第一实施例的具有传感器的流体喷射装置的制作过程的剖面示意图。图2C是显示本发明第一实施例的具有传感器的流体喷射装置于填充墨水后的剖面示意图。The first embodiment of the present invention provides a fluid ejection device with a single linear resistor and a manufacturing method thereof. 2A and 2B are schematic cross-sectional views showing the fabrication process of the fluid ejection device with sensors according to the first embodiment of the present invention. 2C is a schematic cross-sectional view showing the fluid ejection device with sensors according to the first embodiment of the present invention after being filled with ink.

请参阅图2A,提供一基底101,例如单晶硅基底,且在基底101上形成一图案化牺牲层110。牺牲层110由化学气相沉积(CVD)法所沉积的硼硅酸磷玻璃(BPSG)、硅酸磷玻璃(PSG)或其它氧化硅材质。形成一线状电阻器120于基底101上,顺应地披覆于牺牲层110上。线状电阻器120的材质包括掺杂的多晶硅层或其它导电材料。接着,顺应地形成一图案化结构层130于基底101上,且覆盖图案化牺牲层110。结构层130可由化学气相沉积法(CVD)所形成的一低应力氮化硅层构成,其应力介于100~200百万帕(MPa)。结构层130包括两开口135,露出线状电阻器120的两端。施加一电压差于线状电阻120的两端,并利用一电表140,例如电流计,直接测量线状电阻器120的电阻值或通过该线路的电流。Referring to FIG. 2A , a substrate 101 is provided, such as a single crystal silicon substrate, and a patterned sacrificial layer 110 is formed on the substrate 101 . The sacrificial layer 110 is made of borosilicate phosphoglass (BPSG), phosphosilicate glass (PSG) or other silicon oxide materials deposited by chemical vapor deposition (CVD). A linear resistor 120 is formed on the substrate 101 to conformably cover the sacrificial layer 110 . The material of the wire resistor 120 includes doped polysilicon layer or other conductive materials. Next, a patterned structural layer 130 is conformally formed on the substrate 101 and covers the patterned sacrificial layer 110 . The structure layer 130 may be formed of a low-stress silicon nitride layer formed by chemical vapor deposition (CVD), and its stress is between 100-200 megapascals (MPa). The structure layer 130 includes two openings 135 exposing two ends of the wire resistor 120 . Apply a voltage difference across the two ends of the wire resistor 120, and use an ammeter 140, such as an ammeter, to directly measure the resistance of the wire resistor 120 or the current passing through the wire.

接着,形成一气泡产生装置170于结构层130上。气泡产生装置170优选为由一电阻层所构成的加热器,其中电阻层是由物理气相沉积法(PVD),例如蒸镀、溅镀法或反应性溅镀法,形成的如HfB2、TaAl、TaN或其它电阻材料。接着,在结构层130上形成一保护层145,覆盖气泡产生装置170。保护层145的材质可为化学气相沉积法所形成的氧化硅。Next, a bubble generating device 170 is formed on the structural layer 130 . The bubble generating device 170 is preferably a heater made of a resistance layer, wherein the resistance layer is formed by physical vapor deposition (PVD), such as evaporation, sputtering or reactive sputtering, such as HfB 2 , TaAl , TaN or other resistive materials. Next, a protection layer 145 is formed on the structure layer 130 to cover the air bubble generating device 170 . The protective layer 145 is made of silicon oxide formed by chemical vapor deposition.

在本实施例中,气泡产生装置170包括一第一加热器171、以及一第二加热器172,第二加热器172与第一加热器171分别位于喷孔位置的相对侧。In this embodiment, the bubble generating device 170 includes a first heater 171 and a second heater 172 , and the second heater 172 and the first heater 171 are respectively located on opposite sides of the nozzle holes.

请参阅图2B,以湿蚀刻法蚀刻基底101的背面形成一流体通道150,且露出牺牲层110。然后,再以蚀刻法移除牺牲层110以形成一流体腔160并扩大之,成为扩大的流体腔160。根据本发明的实施例,于形成流体腔160的过程中,施加一电压差于线状电阻120的两端,并利用一电表140,例如电流计,测量该线状电阻120的电阻值或通过该线路的电流。当所测量到的电流值为线状电阻器120所贡献时,则继续进行蚀刻。当所测量到的电流值为蚀刻溶液所贡献时,或所测量得到的电流值为零时,则停止蚀刻步骤,继续进行后续的制作过程步骤。Referring to FIG. 2B , the back surface of the substrate 101 is etched by a wet etching method to form a fluid channel 150 and expose the sacrificial layer 110 . Then, the sacrificial layer 110 is removed by etching to form a fluid chamber 160 and then expanded to become the enlarged fluid chamber 160 . According to an embodiment of the present invention, during the process of forming the fluid cavity 160, a voltage difference is applied across the two ends of the linear resistor 120, and a meter 140, such as an ammeter, is used to measure the resistance value of the linear resistor 120 or by current in this line. When the measured current value is contributed by the linear resistor 120, the etching is continued. When the measured current value is contributed by the etching solution, or when the measured current value is zero, the etching step is stopped, and subsequent manufacturing process steps are continued.

在图2A中,线状电阻120的材质由多晶硅(Poly-Silicon)或类似的导电材料所构成。线状电阻器120位于牺牲层110与结构层130之间。若此电路通过一电流I,则可得到在传感器两端的电压信号为V。当牺牲层移除后,再以KOH溶液对蚀刻硅基底101进行扩大流体腔160蚀刻时,由图2B可看出线状电阻器120会随硅材质一并被移除,而形成一断路电路120a与120b,此时两端电流信号接近于0。如此即可利用电路输出信号的变化掌握蚀刻进度。In FIG. 2A , the material of the wire resistor 120 is made of polysilicon (Poly-Silicon) or similar conductive materials. The wire resistor 120 is located between the sacrificial layer 110 and the structure layer 130 . If this circuit passes a current I, the voltage signal at both ends of the sensor can be obtained as V. After the sacrificial layer is removed, when the etched silicon substrate 101 is etched with KOH solution to expand the fluid chamber 160, it can be seen from FIG. 2B that the linear resistor 120 will be removed together with the silicon material to form an open circuit 120a. Compared with 120b, the current signal at both ends is close to 0 at this time. In this way, the change of the output signal of the circuit can be used to grasp the etching progress.

图2C是显示本发明第一实施例的具有传感器的流体喷射装置100于填充墨水后的剖面示意图。本实施例的流体喷射装置100包括一基底101、一结构层130、一流体腔160、以及一流道150,其中,结构层130设置在基底101上,流体腔160形成于结构层130与基底101之间,以及通道150与流体腔160连接。至少一气泡产生装置170设置于结构层130上,与流体腔160对应。一保护层145形成于该结构层130上且覆盖气泡产生装置170。一喷孔180邻近该气泡产生装置130且穿透保护层145与结构层130与流体腔160连通。2C is a schematic cross-sectional view showing the fluid ejection device 100 with sensors according to the first embodiment of the present invention after being filled with ink. The fluid ejection device 100 of the present embodiment includes a substrate 101, a structural layer 130, a fluid chamber 160, and a channel 150, wherein the structural layer 130 is disposed on the substrate 101, and the fluid chamber 160 is formed between the structural layer 130 and the substrate 101 Between, and the channel 150 is connected with the fluid chamber 160. At least one bubble generating device 170 is disposed on the structural layer 130 corresponding to the fluid cavity 160 . A protection layer 145 is formed on the structure layer 130 and covers the air bubble generating device 170 . A nozzle hole 180 is adjacent to the bubble generating device 130 and penetrates the protective layer 145 to communicate with the structural layer 130 and the fluid cavity 160 .

当前述的蚀刻步骤完成后,结构已形成一完整的流体喷射装置100。此时经由歧管、流道150而流入流体腔160与喷孔180内的流体(请参见图2C)也同时与原电路120a、120b接触。此时可将传感器电路视为一填充流体(长度L),与线状电阻器140A、140b串联的电阻系统。假设流体的等效电阻(equivalent resistor)为Rliq,此时传感器两端的电压Vf为:Vf=I(R1+Rliq+R2)。式中R1与R2分别为电路120a与120b的电阻值。After the aforementioned etching steps are completed, the structure has formed a complete fluid ejection device 100 . At this time, the fluid (see FIG. 2C ) flowing into the fluid cavity 160 and the nozzle hole 180 through the manifold and the flow channel 150 also contacts the original circuits 120 a and 120 b at the same time. At this point, the sensor circuit can be regarded as a resistive system filled with fluid (length L) and connected in series with the linear resistors 140A, 140b. Assuming that the equivalent resistance of the fluid is Rliq, the voltage V f across the sensor at this moment is: V f =I(R 1 +R liq +R 2 ). In the formula, R 1 and R 2 are the resistance values of the circuits 120a and 120b, respectively.

在实际应用中,本发明中的传感器设计不限于上述的电阻电路,也可为电容电路,或电阻-电容混合电路。而所设置的部位,也可针对流体喷射装置中不同的区域,作单一或多组感测监控元件。然而,对于传感器应用的设计,需注意的是流体的导电度范围。此外,进行蚀刻监控时,若能将传感器输出信号,配合适当信号处理系统,更可直接控制蚀刻装置的运行。对完成后的装置言,传感器还可将所测量的流体位置反馈给驱动系统,以避免发生“空烧效应”而导致流体喷射装置损毁。In practical applications, the design of the sensor in the present invention is not limited to the above-mentioned resistance circuit, but may also be a capacitance circuit, or a resistance-capacitance hybrid circuit. The set parts can also serve as single or multiple sets of sensing and monitoring elements for different areas in the fluid ejection device. However, for the design of sensor applications, attention should be paid to the conductivity range of the fluid. In addition, when performing etching monitoring, if the sensor output signal can be combined with an appropriate signal processing system, the operation of the etching device can be directly controlled. On the finished device, the sensor can also provide feedback to the drive system of the measured fluid position to avoid the occurrence of "dry fire effect" that can cause damage to the fluid injection device.

第二实施例second embodiment

本发明的第二实施例提供一具有两线状电阻器并联的流体喷射装置及其制造方法。图3A-图3B显示根据本发明第二实施例的具有传感器的流体喷射装置的制作过程的剖面示意图。图3C是显示本发明第二实施例的具有传感器的流体喷射装置于填充墨水后的剖面示意图。The second embodiment of the present invention provides a fluid ejection device with two wire resistors connected in parallel and a manufacturing method thereof. 3A-3B are schematic cross-sectional views showing the fabrication process of the fluid ejection device with sensors according to the second embodiment of the present invention. FIG. 3C is a schematic cross-sectional view showing the fluid ejection device with sensors according to the second embodiment of the present invention after being filled with ink.

本发明第二实施例的流体喷射装置200是依据第一实施例的流体喷射装置100设计的,相同的处于此省略叙述。不同的处在于第二实施例所设计的传感器200为一多重电阻并联设计架构。于图3A的流体喷射装置200中,共包括两组线状电阻传感器:第一组线状电阻器205设置于基底201与牺牲层210之间,而第二组线状电阻器220设置于牺牲层210与结构层230之间,保护层245披覆于最上层。两组传感器设计为并联,亦可设计为独立线路。当电流I通过时可得到电压V0,由第一组线状电阻器205与第二组线状电阻器220所贡献。当流体喷射结构的基底201(单晶硅晶片),被KOH蚀刻液移除时(如图3B所示),线状电阻传感器205的线路也随之被部分移除,留下线状电阻器205a及205b,从而形成断路电路。此时电流I将只通过第二组线状电阻器220的线路,所测量得到的电压也变为V1。当牺牲层移除后,再次以KOH进行蚀刻时,第二组线状电阻器220也将随之被移除而形成断路(如图3C所示),而整体电路的电压输出即变为0。同理,当流体填充入蚀刻完成的区域时,传感器的输出电压也会随流体填入的位置而再次变化。此时可将传感器电路视为一填充流体(长度L),与线状电阻器205a、205b串联的电阻系统。假设流体的等效电阻(equivalent resistor)为Rliq,此时传感器两端的电压Vf为:Vf=I(R1+Rliq+R2)。式中R1与R2分别为电路205a与205b的电阻值。图4A是显示根据本发明实施例的传感器电路为一填充流体L,与线状电阻器140A、140b串联的等效电路图。假设流体的等效电阻(equivalent resistor)为Rliq,此时传感器两端的电压Vf为:Vf=I(R1+Rliq+R2)。此外也可将传感器电路设计成惠斯登电桥(Wheatstonebridge)的配置,如图4B所示。在图4B中Va与Vb的电压压差可表示为:Vb-Va=Vi(R1R4-R2R3)/((R1+R2)(R3+R4))。若使Ri=R2,则前式可改写为:Vb-Va=0.5Vi(R4-R3)/(R3+R4)。若将R3设计成准备测量的流体等效电阻的相近数值时,当传感器的电路形成断路时(R4趋近无限大),可得到Va与Vb的压差约为二分的一输入电压;又当流体填充于电路间时(R3=R4),Va与Vb的压差约为0。如此可利用输入电压与输出电压的变化,直接得到对蚀刻过程的进度的控制与流体填充后的位置测量。举例来说,在常温下,墨水的等效电阻约为相同几何尺寸、60℃温度、重量浓度33%的氢氧化钾(KOH)溶液的等效电阻的万至十万倍以上。因此可通过不同电路的匹配设计,制定出适当的相对应的惠斯登电桥,以用于进行蚀刻进度或墨水填充的监控。The fluid ejection device 200 of the second embodiment of the present invention is designed according to the fluid ejection device 100 of the first embodiment, and the description of the same is omitted here. The difference is that the sensor 200 designed in the second embodiment is a multi-resistor parallel design structure. In the fluid ejection device 200 of FIG. 3A , two sets of linear resistance sensors are included: the first group of linear resistors 205 is disposed between the substrate 201 and the sacrificial layer 210, and the second group of linear resistors 220 is disposed on the sacrificial layer. Between the layer 210 and the structural layer 230 , a protective layer 245 is covered on the uppermost layer. The two sets of sensors are designed to be connected in parallel, or they can be designed as independent circuits. When the current I passes through, the voltage V 0 can be obtained, which is contributed by the first set of wire resistors 205 and the second set of wire resistors 220 . When the substrate 201 (single crystal silicon wafer) of the fluid injection structure is removed by KOH etching solution (as shown in FIG. 3B ), the circuit of the linear resistance sensor 205 is also partially removed thereupon, leaving a linear resistor 205a and 205b, thereby forming an open circuit. At this time, the current I will only pass through the line of the second set of linear resistors 220 , and the measured voltage will also become V 1 . When the sacrificial layer is removed and etched again with KOH, the second group of linear resistors 220 will also be removed to form an open circuit (as shown in FIG. 3C ), and the voltage output of the overall circuit becomes 0. . In the same way, when the fluid is filled into the etched area, the output voltage of the sensor will change again with the position where the fluid is filled. At this time, the sensor circuit can be regarded as a resistance system filled with fluid (length L) and connected in series with the linear resistors 205a and 205b. Assuming that the equivalent resistance of the fluid is R liq , the voltage V f across the sensor is: V f =I(R 1 +R liq +R 2 ). In the formula, R 1 and R 2 are the resistance values of the circuits 205a and 205b respectively. FIG. 4A is an equivalent circuit diagram showing that the sensor circuit according to an embodiment of the present invention is a filling fluid L connected in series with linear resistors 140A, 140b. Assuming that the equivalent resistance of the fluid is R liq , the voltage V f across the sensor is: V f =I(R 1 +R liq +R 2 ). In addition, the sensor circuit can also be designed as a Wheatstone bridge configuration, as shown in FIG. 4B . In Figure 4B, the voltage difference between V a and V b can be expressed as: V b -V a =V i (R 1 R 4 -R 2 R 3 )/((R 1 +R 2 )(R 3 +R 4 )). If R i =R 2 , the previous formula can be rewritten as: V b -V a =0.5V i (R 4 -R 3 )/(R 3 +R 4 ). If R3 is designed to be close to the equivalent resistance of the fluid to be measured, when the circuit of the sensor forms an open circuit (R4 approaches infinity), an input voltage with a pressure difference of about half of V a and V b can be obtained ; And when the fluid is filled between the circuits (R 3 =R 4 ), the pressure difference between V a and V b is about 0. In this way, the change of the input voltage and the output voltage can be used to directly obtain the control of the progress of the etching process and the position measurement after the fluid is filled. For example, at normal temperature, the equivalent resistance of the ink is about 10,000 to 100,000 times higher than the equivalent resistance of a potassium hydroxide (KOH) solution with the same geometric size, a temperature of 60° C., and a weight concentration of 33%. Therefore, through the matching design of different circuits, an appropriate corresponding Wheatstone bridge can be formulated for monitoring the etching progress or ink filling.

第三实施例third embodiment

本发明第三实施例所设计的传感器为一多重电阻并联且同时包括电容设计的结构。图5是本发明第三实施例的具有传感器的流体喷射装置500的上视图。第一组传感器550为一薄壳电容传感器550,其方向与未来喷孔540的方向平行。而第二组传感器510则与第一及第二实施例类似,但线状电阻器所设置的位置不同于先前实施例所述,而改在牺牲层512的边缘(如图6A所示)。The sensor designed in the third embodiment of the present invention is a structure in which multiple resistors are connected in parallel and also includes capacitors. 5 is a top view of a fluid ejection device with sensors 500 according to a third embodiment of the present invention. The first group of sensors 550 is a thin shell capacitive sensor 550 whose direction is parallel to the direction of the future nozzle hole 540 . The second group of sensors 510 is similar to the first and second embodiments, but the location of the wire resistors is different from that of the previous embodiments, and is changed to the edge of the sacrificial layer 512 (as shown in FIG. 6A ).

图6A和图6B显示根据本发明第三实施例的具有传感器的流体喷射装置500沿图5中箭头I-I’方向的剖面示意图。图6C是显示本发明第三实施例的具有传感器的流体喷射装置500于填充墨水后的剖面示意图。6A and 6B show a schematic cross-sectional view of a fluid ejection device 500 with a sensor according to a third embodiment of the present invention along the direction of arrow II' in FIG. 5 . FIG. 6C is a schematic cross-sectional view showing the fluid ejection device 500 with sensors according to the third embodiment of the present invention after being filled with ink.

本发明第三实施例的流体喷射装置500是依据第二实施例的流体喷射装置200的设计,相同之处在此省略叙述。不同之处在于第三实施例所设计的传感器包括薄壳电容传感器550与并联电阻传感器510的混合电路。薄壳电容传感器550的结构如图7A所示,其电极由多层导体结构(551~555)所构成,包括加热器的电阻材料(TaAl、TiN、TiW或Pt等)、金属层(Al-Si-Cu及Al-Cu)、与接触窗(TiW或TiN)。因此,在制造方法上可与传统的半导体工艺兼容。薄壳电容传感器550埋设于保护层516中,其中心位置是流体喷射装置500的喷孔540。并联电阻传感器510由电阻器560a、560b与560c并联并由导线562及564连接其端点构成,电阻器560a设置于牺牲层512与结构层514间的角落,且部分披覆于牺牲层上方,电阻器560b与560c设置于牺牲层512、结构层514与基底501间的角落。The fluid ejection device 500 of the third embodiment of the present invention is based on the design of the fluid ejection device 200 of the second embodiment, and the similarities are omitted here. The difference is that the sensor designed in the third embodiment includes a hybrid circuit of the thin case capacitive sensor 550 and the parallel resistance sensor 510 . The structure of the thin-shell capacitive sensor 550 is shown in FIG. 7A, and its electrodes are composed of multilayer conductor structures (551-555), including resistance materials (TaAl, TiN, TiW or Pt, etc.) of the heater, metal layers (Al- Si-Cu and Al-Cu), and contact windows (TiW or TiN). Therefore, the manufacturing method is compatible with conventional semiconductor processes. The thin capacitive sensor 550 is embedded in the protection layer 516 , and its central position is the nozzle hole 540 of the fluid ejection device 500 . The parallel resistance sensor 510 is composed of resistors 560a, 560b, and 560c connected in parallel and connected to their terminals by wires 562 and 564. The resistor 560a is arranged at the corner between the sacrificial layer 512 and the structural layer 514, and is partially covered above the sacrificial layer. The devices 560b and 560c are disposed at corners between the sacrificial layer 512 , the structural layer 514 and the substrate 501 .

根据本发明实施例,可通过测量传感器550电路的电容变化(介电常数改变),用于监测喷孔制作过程与流体填充的位置控制,如图7A所示。如先前实施例所述,并联电阻传感器510可用于监测流体腔的蚀刻状态与流体腔内流体的填充状态(请参见图6C)。According to the embodiment of the present invention, the measurement of the capacitance change (dielectric constant change) of the sensor 550 circuit can be used to monitor the nozzle hole fabrication process and fluid filling position control, as shown in FIG. 7A . As described in previous embodiments, the parallel resistance sensor 510 can be used to monitor the etching state of the fluid chamber and the filling state of the fluid in the fluid chamber (see FIG. 6C ).

图8为一包括C1、C2电容与运算放大器的感测电路,再配合非重迭电路(non-overlapping circuit)(图中未标示)后可得Figure 8 is a sensing circuit including C 1 , C 2 capacitors and an operational amplifier, which can be obtained after cooperating with a non-overlapping circuit (not shown in the figure).

VV oo == CC 11 CC 22 ×× VV inin ..

其中C1即为一半径r,高度L的薄壳电容器(如图7A所示),此电容器利用原加热器的电阻材料(TaAl、TiN、TiW或Pt等)、金属层(Al-Si-Cu及Al-Cu)、与接触窗(TiW或TiN)等材料构成(如图7B所示)。假设空气与流体所占高度分别为a与L-a,则薄壳电容器的电容可表示为式1:Among them , C1 is a thin-shell capacitor with a radius r and a height L (as shown in Figure 7A). This capacitor uses the resistance material (TaAl, TiN, TiW or Pt, etc.) of the original heater, the metal layer (Al-Si- Cu and Al—Cu), and contact windows (TiW or TiN) and other materials (as shown in FIG. 7B ). Assuming that the heights occupied by air and fluid are a and La respectively, the capacitance of the thin-shell capacitor can be expressed as Equation 1:

C 1 = ϵ 0 ϵ f πa ( L - a ) 2 [ ϵ 0 a + ϵ f ( L - a ) ] (式1) C 1 = ϵ 0 ϵ f πa ( L - a ) 2 [ ϵ 0 a + ϵ f ( L - a ) ] (Formula 1)

式1中ε0与εf分别表示空气与流体的介电常数。通过输出/输入电压比和已知C2的设计值,可以计算得出C1。而流体与空气的介电常数εf与ε0,与薄壳电容550的高度L皆为已知,故可经由C1解出空气高度a,与流体高度L-a。此数据可反馈至流体喷射系统进行判读,并根据该流体于该喷孔内的高度调整驱动加热体的时间,或做为是否执行加热等后续动作,如此即可避免加热器「空烧效应」,从而有效保障流体喷射装置的寿命。In Equation 1, ε 0 and ε f represent the dielectric constants of air and fluid, respectively. From the output/input voltage ratio and knowing the design value of C 2 , C 1 can be calculated. The dielectric constants ε f and ε 0 of the fluid and air, and the height L of the shell capacitor 550 are known, so the air height a and the fluid height La can be obtained through C 1 . This data can be fed back to the fluid injection system for interpretation, and the time to drive the heating element can be adjusted according to the height of the fluid in the nozzle hole, or as follow-up actions such as whether to perform heating, so as to avoid the "empty burning effect" of the heater , so as to effectively guarantee the life of the fluid injection device.

根据本发明所公开的方式,每一微流体喷射装置可配合传感器的设计,对日后进行的单段、多段制作过程,与流体填充状况进行监控。此项结果除可提高流体喷射装置的尺寸制作精度外,更可用以提供系统,做为驱动流体喷射的检验条件,达到避免「空烧效应」的目的,进而延长使用寿命的目的。而此两项目的可利用同一传感器的设计线路,还可达到减少制作成本的效果。According to the method disclosed in the present invention, each microfluid ejection device can cooperate with the design of the sensor to monitor the single-stage or multi-stage production process and the fluid filling status in the future. In addition to improving the dimensional accuracy of the fluid injection device, this result can also be used to provide a system that can be used as a test condition for driving fluid injection, so as to avoid the "dry burning effect" and prolong the service life. The design circuit of the same sensor can be used in these two projects, and the effect of reducing the production cost can also be achieved.

本发明的特征与效果在于形成一具有传感器的流体喷射装置。此传感器通过输出电子信号的变化,除可作为喷射头制作过程中蚀刻工艺的进度监测外,亦可用于整体结构完成后的流体位置测量。前者可控制蚀刻工艺的进度,代替事后的光学或其它破坏性检测;而后者所提供的流体位置,可作为流体喷射时的参考依据。本发明装置可有效地应用于文字或影像的数据打印处理、燃料喷射系统及生医科技的药剂注射等相关或类似系统。The feature and effect of the present invention is to form a fluid ejection device with a sensor. The sensor can not only monitor the progress of the etching process during the production of the spray head, but also measure the position of the fluid after the overall structure is completed by outputting the change of the electronic signal. The former can control the progress of the etching process, instead of subsequent optical or other destructive detection; while the fluid position provided by the latter can be used as a reference for fluid injection. The device of the present invention can be effectively applied to data printing processing of text or image, fuel injection system, medicine injection of biomedical technology and other related or similar systems.

虽然本发明已以优选实施例公开如上,然而,其并非用以限定本发明,本领域中的普通技术人员,在不脱离本发明的精神和范围的前提下,当然可作更动与润饰,因此本发明的保护范围应当以所附的权利要求书所界定的范围为准。Although the present invention has been disclosed above with preferred embodiments, it is not intended to limit the present invention. Those skilled in the art can certainly make changes and modifications without departing from the spirit and scope of the present invention. Therefore, the protection scope of the present invention should be determined by the scope defined in the appended claims.

Claims (21)

1. fluid ejection apparatus with sensor comprises:
One substrate;
One structure sheaf is arranged in the described substrate, and and described substrate between form a fluid cavity;
At least one air Bubble generating apparatus is arranged at the respective side of described the above fluid cavity of structure sheaf;
At least one wire electric resistance sensor is connected with described fluid cavity;
One protective layer covers described air Bubble generating apparatus and described wire electric resistance sensor; And
One spray orifice is close to described bubble generator and penetrates described protective layer and described structure sheaf, and is communicated with described fluid cavity.
2. the fluid ejection apparatus with sensor as claimed in claim 1, wherein said air Bubble generating apparatus comprises:
One primary heater is arranged on the surface of described protective layer to be positioned at the outer mode of described fluid cavity, in order to produce one first bubble in described fluid cavity; And
One secondary heater; be arranged on the surface of described protective layer to be positioned at the outer mode of described fluid cavity; and lay respectively at the opposite side of described spray orifice with described primary heater, in order in described fluid cavity, to produce one second bubble so that the fluid in the described fluid cavity is penetrated.
3. the fluid ejection apparatus with sensor as claimed in claim 1, wherein said structure sheaf are a low stress nitride silicon.
4. the fluid ejection apparatus with sensor as claimed in claim 1, wherein said wire electric resistance sensor comprises a plurality of parallel resistance groups.
5. the fluid ejection apparatus with sensor as claimed in claim 1, wherein when described fluid cavity formed, wherein said wire electric resistance sensor is the formation of the described fluid cavity of monitoring in real time, and is etched excessively to avoid described structure sheaf.
6. the fluid ejection apparatus with sensor as claimed in claim 1, wherein when described fluid cavity was filled a fluid, described wire electric resistance sensor became a series connection resistor group with described fluid.
7. fluid ejection apparatus with sensor comprises:
One substrate;
One structure sheaf is arranged in the described substrate, and and described substrate between form a fluid cavity; At least one air Bubble generating apparatus is arranged at the respective side of described the above fluid cavity of structure sheaf;
One protective layer covers described air Bubble generating apparatus; And
One spray orifice is close to described bubble generator and penetrates described protective layer and described structure sheaf, and is communicated with described fluid cavity; And
One shell capacitance sensor is located on the described structure sheaf, is embedded in the described protective layer and around described spray orifice.
8. the fluid ejection apparatus with sensor as claimed in claim 7, wherein said shell capacitance sensor has a pair of arc-shaped electrode.
9. the fluid ejection apparatus with sensor as claimed in claim 8, wherein said arc-shaped electrode are a multi-layer conductive electrode.
10. the fluid ejection apparatus with sensor as claimed in claim 9, the material of wherein said multi-layer conductive electrode comprise TaAl, TiN, TiW, Pt, Al-Si-Cu alloy or Al-Cu alloy.
11. the fluid ejection apparatus with sensor as claimed in claim 7, wherein when described fluid cavity is filled a fluid, described fluid borrows capillarity to be filled in the described spray orifice, described shell capacitance sensor is measured the height of described fluid in described spray orifice, and drives the time of calandria according to the Height Adjustment of described fluid in described spray orifice.
12. the fluid ejection apparatus with sensor as claimed in claim 7 wherein also comprises at least one wire electric resistance sensor, is connected with described fluid cavity.
13. the preparation method of a fluid ejection apparatus comprises the following steps:
One substrate is provided;
Form a sacrificial patterned in described substrate;
Form a wire electric resistance sensor on described sacrifice layer, have one first end and one second end;
Form a pattern structure layer in described substrate, and cover described sacrificial patterned and described wire electric resistance sensor, expose described first end and described second end of described wire electric resistance sensor;
Form a fluid passage in the bottom of described substrate, to expose described sacrifice layer; And
Remove described sacrifice layer to form a fluid cavity.
14. the preparation method of fluid ejection apparatus as claimed in claim 13, the material of wherein said wire electric resistance sensor comprises polysilicon or conductive material.
15. the preparation method of fluid ejection apparatus as claimed in claim 13, the step that wherein removes described sacrifice layer are with the described sacrifice layer of an etching solution etching.
16. the preparation method of fluid ejection apparatus as claimed in claim 15, the step that wherein removes described sacrifice layer comprise, apply described first end and described second end that a voltage is worse than described wire electric resistance sensor, to measure a current value therebetween.
17. the preparation method of fluid ejection apparatus as claimed in claim 16 wherein when measured current value is entirely described wire electric resistance sensor and contributes, then continues etching step and forms described fluid cavity.
18. the preparation method of fluid ejection apparatus as claimed in claim 16, wherein when measured current value was contributed by described wire electric resistance sensor and described etching solution, the step that then stops etching was finished described fluid cavity.
19. the preparation method of fluid ejection apparatus as claimed in claim 13, wherein said wire electric resistance sensor comprises a plurality of parallel resistance groups.
20. the preparation method of fluid ejection apparatus as claimed in claim 19, wherein said a plurality of parallel resistance group comprises one first resistor at the interface that is positioned at described sacrifice layer and described structure sheaf and one second resistor at the interface that is positioned at described structure sheaf and described substrate.
21. the preparation method of fluid ejection apparatus as claimed in claim 20, the step that wherein removes described sacrifice layer comprises, apply one first end and one second end that a voltage is worse than described parallel resistance group, to measure a current value therebetween, wherein when measured current value is contributed by described first and second resistor, then continue the described sacrifice layer of etching, wherein when measured current value was contributed by described second resistor, described sacrifice layer then stopped etching.
CN 200410081965 2004-12-30 2004-12-30 Fluid ejection device with sensor and method of making same Pending CN1796127A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 200410081965 CN1796127A (en) 2004-12-30 2004-12-30 Fluid ejection device with sensor and method of making same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 200410081965 CN1796127A (en) 2004-12-30 2004-12-30 Fluid ejection device with sensor and method of making same

Publications (1)

Publication Number Publication Date
CN1796127A true CN1796127A (en) 2006-07-05

Family

ID=36817537

Family Applications (1)

Application Number Title Priority Date Filing Date
CN 200410081965 Pending CN1796127A (en) 2004-12-30 2004-12-30 Fluid ejection device with sensor and method of making same

Country Status (1)

Country Link
CN (1) CN1796127A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106158681A (en) * 2015-04-10 2016-11-23 中国科学院微电子研究所 A corrosion monitoring method for making Schottky diode air bridges
WO2021062890A1 (en) * 2019-09-30 2021-04-08 上海傲睿科技有限公司 Single-cell screening device, screening assembly, screening method, and use

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106158681A (en) * 2015-04-10 2016-11-23 中国科学院微电子研究所 A corrosion monitoring method for making Schottky diode air bridges
WO2021062890A1 (en) * 2019-09-30 2021-04-08 上海傲睿科技有限公司 Single-cell screening device, screening assembly, screening method, and use

Similar Documents

Publication Publication Date Title
JP4146812B2 (en) MEMS substrate and method for forming MEMS substrate
US7445314B2 (en) Piezoelectric ink-jet printhead and method of manufacturing a nozzle plate of the same
US8052249B2 (en) Liquid discharge head, liquid supply cartridge, and liquid jet apparatus having electrostatic actuator formed by a semiconductor manufacturing process
CN1724257A (en) The method of ink gun substrate, ink gun and manufacturing ink gun substrate
US20090213188A1 (en) method of manufacturing an actuator apparatus, a method of manufacturing a liquid jet head and a liquid jet apparatus
KR100560593B1 (en) Method for manufacturing liquid ejection head
WO1994015791A1 (en) Ink jet head
US10974508B2 (en) Fluid ejection device with piezoelectric actuator and manufacturing process thereof
CN1796127A (en) Fluid ejection device with sensor and method of making same
KR100618627B1 (en) Micro gas sensor array and its manufacturing method
CN1660691B (en) Fluid drive device, electrostatic drive fluid discharge device and manufacturing method thereof
TWI252813B (en) Fluid injector device with sensors and method of manufacturing the same
KR20170114590A (en) Bridge Type Micro Gas Sensor and Manufacturing Method Thereof
CN102214787A (en) Piezoelectric element, method for manufacturing the same, piezoelectric actuator, liquid ejecting head, and liquid ejecting apparatus
US20070220722A1 (en) Method for manufacturing inkjet head
CN116512760A (en) Inkjet printhead, inkjet printing apparatus and method
JP2024073750A (en) LIQUID EJECTION HEAD AND LIQUID EJECTION APPARATUS
JP7570910B2 (en) LIQUID DISCHARGE HEAD AND METHOD FOR MANUFACTURING LIQUID DISCHARGE HEAD
KR200342819Y1 (en) Micro gas sensor array
CN101037040A (en) Microinjection device with integrated size detector
KR20050014130A (en) Ink-jet printhead driven piezoelectrically and electrostatically and method for manufacturing method thereof
JP5019027B2 (en) Method for manufacturing liquid jet head
JP4121600B2 (en) Through hole forming method and through hole forming substrate
US20100033540A1 (en) Droplet discharge head, droplet discharge device, and method for manufacturing droplet discharge head
US20060082614A1 (en) Fluid injection devices and methods for controlling injection quality thereof

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C02 Deemed withdrawal of patent application after publication (patent law 2001)
WD01 Invention patent application deemed withdrawn after publication