CN108074838A - Substrate wet processing device - Google Patents
Substrate wet processing device Download PDFInfo
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- CN108074838A CN108074838A CN201711049350.7A CN201711049350A CN108074838A CN 108074838 A CN108074838 A CN 108074838A CN 201711049350 A CN201711049350 A CN 201711049350A CN 108074838 A CN108074838 A CN 108074838A
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Abstract
Description
技术领域technical field
本发明系关于一种基板湿式处理装置。The invention relates to a substrate wet processing device.
背景技术Background technique
在半导体工艺中,需先对基板(如晶圆)进行多道清洁程序,以移除基板表面的杂质。抑或是,以微影蚀刻于基板(如晶圆)形成图案后,也必须藉由多道清洁程序以去除光阻(Photo Resistor,PR)或金属膜(Metal Film)。一般而言,系先将基板浸泡于化学液,再以喷洗的方式清洗基板,最后再以旋转的方式干燥基板,且每个步骤系使用单晶圆水平式处理单元。因此,每一片基板需等待浸泡完后,才能接着进行清洗、干燥等后续步骤。由于每个步骤的处理时间不同,如浸泡的时间较长,进而使基板处理设备的使用效率不佳。In the semiconductor process, it is necessary to perform multiple cleaning procedures on the substrate (such as a wafer) to remove impurities on the surface of the substrate. Or, after forming a pattern on the substrate (such as a wafer) by photolithography, it is necessary to remove the photoresist (Photo Resistor, PR) or the metal film (Metal Film) through multiple cleaning procedures. Generally speaking, the substrate is soaked in a chemical solution first, then the substrate is cleaned by spray washing, and finally the substrate is dried by rotation, and each step uses a single-wafer horizontal processing unit. Therefore, each substrate needs to be soaked before subsequent steps such as cleaning and drying can be performed. Since the processing time of each step is different, such as a longer soaking time, the utilization efficiency of the substrate processing equipment is not good.
为了改善前述情况,市面上出现一种具有批次式浸泡槽的基板处理设备,一次性将多个片基板置于浸泡槽内,以批次式进行浸泡程序。藉由批次式浸泡槽的设计,以提高基板处理设备使用效率。然而如后续程序仍是使用单晶圆水平式处理单元进行,故仍必须自批次式浸泡槽内依序取出基板(1片/次)进行清洗、干燥等步骤。因此,批次式浸泡槽的设计反而会造成必须维持同一工艺条件的每一片基板的浸泡时间却不同(例如一基板较快被取出,则浸泡时间较短;反之,另一基板浸泡时间则较长),浸泡后的效果亦有所差异。然,后续仍以同样条件进行清洗、干燥,将使每片基板的清洗程度不同,反而会降低良率,实有改良的必要。In order to improve the aforementioned situation, a substrate processing equipment with a batch-type soaking tank appears on the market. Multiple substrates are placed in the soaking tank at one time, and the soaking process is performed in batches. Through the design of batch soaking tanks, the utilization efficiency of substrate processing equipment is improved. However, if the follow-up procedure is still carried out using a single-wafer horizontal processing unit, it is still necessary to sequentially take out the substrates (1 piece/time) from the batch type soaking tank for cleaning, drying and other steps. Therefore, the design of the batch type soaking tank will cause the soaking time of each substrate that must maintain the same process conditions to be different (for example, if one substrate is taken out sooner, the soaking time will be shorter; on the contrary, the soaking time of the other substrate will be shorter. Long), the effect after soaking is also different. However, the subsequent cleaning and drying under the same conditions will make the cleaning degree of each substrate different, which will reduce the yield rate instead, and there is a need for improvement.
发明内容Contents of the invention
有鉴于上述课题,本发明的主要目的系在提供一种基板湿式处理装置,基板湿式处理装置包括具有多片式容置部的浸泡槽,且控制单元控制多个基板的湿式处理,并藉由输送载具分别控制每一基板于多片式容置部的浸泡处理时序(如第一基板及第二基板),控制单元并依据喷洗处理槽所需喷洗处理时间排程浸泡处理时序,以解决现有基板处理装置的基板湿式处理的问题。In view of the above problems, the main purpose of the present invention is to provide a substrate wet processing device, the substrate wet processing device includes a soaking tank with a multi-piece container, and the control unit controls the wet processing of a plurality of substrates, and by The transport carrier separately controls the soaking treatment sequence of each substrate in the multi-piece container (such as the first substrate and the second substrate), and the control unit schedules the soaking treatment sequence according to the spray cleaning treatment time required by the spray cleaning treatment tank, In order to solve the problem of substrate wet processing in the existing substrate processing device.
为达成上述的目的,本发明提供一种基板湿式处理装置,其包括一浸泡槽、一喷洗处理槽、一输送载具以及一控制单元。控制单元控制多个基板的湿式处理。浸泡槽包括一多片式容置部,其中控制单元分别控制每一基板于多片式容置部的浸泡处理时序。喷洗处理槽邻设于浸泡槽,并具有至少一单片式喷洗单元。输送载具于浸泡槽及喷洗处理槽之间移送每一基板。控制单元控制输送载具移送该些基板中的一第一基板至浸泡槽的多片式容置部,经过一间隔时间,移送该些基板中的一第二基板至浸泡槽的多片式容置部,第一基板经过一浸泡处理时间,自浸泡槽移送至喷洗处理槽的单片式喷洗单元进行喷洗处理,经过一喷洗处理时间,自单片式喷洗单元移出第一基板,及第二基板经过该浸泡处理时间,自浸泡槽接续移送至喷洗处理槽的单片式喷洗单元进行喷洗处理,其中控制单元依据喷洗处理时间排程间隔时间。To achieve the above object, the present invention provides a substrate wet processing device, which includes a soaking tank, a spraying treatment tank, a transport carrier and a control unit. The control unit controls wet processing of a plurality of substrates. The soaking tank includes a multi-chip accommodating part, wherein the control unit respectively controls the soaking treatment sequence of each substrate in the multi-chip accommodating part. The spraying treatment tank is adjacent to the soaking tank and has at least one single-piece spraying unit. The transport carrier transfers each substrate between the soaking tank and the spraying treatment tank. The control unit controls the conveying carrier to transfer a first substrate among the substrates to the multi-chip container of the soaking tank, and after an interval time, transfers a second substrate among the substrates to the multi-chip container of the soaking tank. The first substrate is transferred from the soaking tank to the single-piece spraying unit of the spraying treatment tank after a soaking treatment time for spraying treatment, and after a spraying treatment time, the first substrate is removed from the single-piece spraying unit After the soaking treatment time, the substrate and the second substrate are successively transferred from the soaking tank to the single-chip spraying unit in the spraying treatment tank for spraying treatment, wherein the control unit schedules the interval time according to the spraying treatment time.
根据本发明之一实施例,基板湿式处理装置更包括一清洗干燥单元,其邻设于单片式喷洗单元,其中输送载具自单片式喷洗单元移送每一该些基板至清洗干燥单元。According to an embodiment of the present invention, the substrate wet processing device further includes a cleaning and drying unit, which is adjacent to the single-wafer spray cleaning unit, wherein the transport carrier transfers each of the substrates from the single-wafer spray cleaning unit to the cleaning and drying unit. unit.
根据本发明之一实施例,清洗干燥单元设置于喷洗处理槽内,对每一该些基板先进行喷洗处理及接续进行清洗干燥。According to an embodiment of the present invention, the cleaning and drying unit is arranged in the spray cleaning treatment tank, and each of the substrates is firstly sprayed and then cleaned and dried.
根据本发明之一实施例,清洗干燥单元包括一清洗液供应单元及一挥发性溶液供应单元,清洗干燥单元对基板施予一清洗液及一挥发性溶液。According to an embodiment of the present invention, the cleaning and drying unit includes a cleaning solution supply unit and a volatile solution supply unit, and the cleaning and drying unit applies a cleaning solution and a volatile solution to the substrate.
根据本发明之一实施例,该多片式容置部为一水平多片式容置部。According to an embodiment of the present invention, the multi-piece accommodating portion is a horizontal multi-piece accommodating portion.
根据本发明之一实施例,多片式容置部为一垂直多片式容置部。According to an embodiment of the present invention, the multi-piece accommodating portion is a vertical multi-piece accommodating portion.
根据本发明之一实施例,单片式喷洗单元为一垂直单片式喷洗单元。According to an embodiment of the present invention, the monolithic spray washing unit is a vertical monolithic spray washing unit.
根据本发明之一实施例,单片式喷洗单元包括一喷洗槽及至少一流体喷头,流体喷头设置于喷洗槽的至少一侧壁,并藉由每一该些基板于该喷洗槽内垂直移动,该流体喷头喷洗每一该些基板。According to one embodiment of the present invention, the single-chip spray cleaning unit includes a spray cleaning tank and at least one fluid spray head, the fluid spray head is arranged on at least one side wall of the spray cleaning tank, and each of the substrates is sprayed on the spray cleaning tank. Moving vertically in the tank, the fluid spray head sprays each of the substrates.
根据本发明之一实施例,基板于喷洗槽内垂直向上移动时,流体喷头喷洗基板。According to an embodiment of the present invention, when the substrate moves vertically upwards in the spray cleaning tank, the fluid spray head sprays the substrate.
根据本发明之一实施例,浸泡槽包括一流场控制单元,于垂直多片式容置部以一降流流场处理基板。According to an embodiment of the present invention, the immersion tank includes a flow field control unit for processing substrates in a vertical multi-chip container with a downflow flow field.
根据本发明之一实施例,输送载具垂直地承载基板并移动至垂直多片式容置部及垂直单片式喷洗单元。According to an embodiment of the present invention, the conveying carrier carries the substrate vertically and moves to the vertical multi-chip accommodating portion and the vertical single-chip spray cleaning unit.
根据本发明之一实施例,其中输送载具更包括一移动轨道,设置于浸泡槽及喷洗处理槽的上方。According to an embodiment of the present invention, the conveying carrier further includes a moving track disposed above the soaking tank and the spraying treatment tank.
根据本发明之一实施例,垂直多片式容置部包括多个单片式容置槽位,该些单片式容置槽位及垂直单片式喷洗单元各包括一处理承载架,输送载具承载基板至处理承载架,由处理承载架承载基板升降置入该些单片式容置槽位之一或垂直单片式喷洗单元。According to an embodiment of the present invention, the vertical multi-piece accommodation part includes a plurality of single-piece accommodation slots, and each of the single-piece accommodation slots and the vertical single-piece spraying unit includes a processing carrier, The transport carrier carries the substrate to the processing carrier, and the processing carrier carries the substrate up and down and puts it into one of the single-piece accommodation slots or the vertical single-piece spray cleaning unit.
根据本发明之一实施例,输送载具包括一附加电路板,输送载具移动附加电路板并由附加电路板承载基板升降,以置入浸泡槽或喷洗处理槽。According to an embodiment of the present invention, the transporting carrier includes an additional circuit board, and the transporting carrier moves the additional circuit board and is lifted and lowered by the carrier substrate of the additional circuit board, so as to be put into the soaking tank or the spraying treatment tank.
根据本发明之一实施例,基板湿式处理装置更包括一浸泡前喷洗单元,邻设于多片式容置部,控制单元先控制输送载具移送基板至浸泡前喷洗单元进行喷洗后,再移送至多片式容置部。According to an embodiment of the present invention, the substrate wet processing device further includes a pre-soaking spray cleaning unit, which is adjacent to the multi-chip accommodating part. The control unit first controls the transport carrier to transfer the substrate to the pre-soaking spray cleaning unit for spray cleaning. , and then transferred to the multi-piece container.
根据本发明之一实施例,浸泡前喷洗单元设置于浸泡槽内,对基板先进行喷洗处理及接续移送至多片式容置部进行浸泡处理。According to an embodiment of the present invention, the pre-soaking spray unit is arranged in the soaking tank, and the substrate is first sprayed and then transferred to the multi-chip accommodating part for soaking.
根据本发明之一实施例,基板湿式处理装置更包括一气体喷洗单元,其设置于浸泡槽或喷洗处理槽至少其一的上方,对基板移出槽体时进行气体喷洗。According to an embodiment of the present invention, the substrate wet processing device further includes a gas spraying unit, which is disposed above at least one of the soaking tank or the spraying treatment tank, and performs gas spraying when the substrate is moved out of the tank.
根据本发明之一实施例,喷洗处理槽设置有多个该单片式喷洗单元,控制单元依据多个该单片式喷洗单元的喷洗处理时间排程间隔时间。According to an embodiment of the present invention, the spray cleaning treatment tank is provided with a plurality of the single-chip spray cleaning units, and the control unit schedules the interval time according to the spray cleaning treatment time of the multiple single-chip spray cleaning units.
根据本发明之一实施例,基板的浸泡处理时间大于喷洗处理时间,控制单元依据浸泡处理时间及喷洗处理时间排程间隔时间。According to an embodiment of the present invention, the soaking treatment time of the substrate is longer than the spray cleaning treatment time, and the control unit schedules the interval time according to the soaking treatment time and the spray cleaning treatment time.
根据本发明之一实施例,每一该些基板的浸泡处理时间由控制单元分别控制,控制单元依据每一该些基板的浸泡处理时间及喷洗处理时间排程间隔时间。According to an embodiment of the present invention, the soaking treatment time of each of the substrates is separately controlled by the control unit, and the control unit schedules the interval time according to the soaking treatment time and the spray cleaning treatment time of each of the substrates.
承上所述,依据本发明的基板湿式处理装置,其包括一浸泡槽、一喷洗处理槽、一输送载具以及一控制单元。浸泡槽包括一多片式容置部,而喷洗处理槽邻设于浸泡槽。控制单元控制多个基板的湿式处理,并藉由输送载具分别控制每一片基板于多片式容置部的浸泡处理时序。其中,多个基板置于多片式容置部,同一工艺条件的每片基板分别经过相同的浸泡处理时间后,再依序移至喷洗处理槽。由于每片基板的浸泡处理时间相同,故可避免因浸泡时间不同而造成清洗程度的差异,进而可提高良率。As mentioned above, the substrate wet processing device according to the present invention includes a soaking tank, a spray cleaning tank, a transport carrier and a control unit. The soaking tank includes a multi-piece accommodating part, and the spraying treatment tank is adjacent to the soaking tank. The control unit controls the wet processing of multiple substrates, and separately controls the soaking processing sequence of each substrate in the multi-chip accommodating part through the conveying carrier. Wherein, a plurality of substrates are placed in the multi-piece accommodation part, and each substrate of the same process condition is respectively subjected to the same soaking treatment time, and then sequentially moved to the spray cleaning treatment tank. Since the soaking treatment time of each substrate is the same, it is possible to avoid the difference in cleaning degree caused by different soaking times, thereby improving the yield rate.
又,置放第一基板及第二基板于浸泡槽的间隔时间大于等于喷洗处理时间,可确保排序较前的第一基板喷洗完成后,排序较后的第二基板始浸泡完成。因此,排序较后的第二基板可顺畅地移动至喷洗处理槽,不会受到排序较前的第一基板的阻碍。In addition, the interval between placing the first substrate and the second substrate in the soaking tank is greater than or equal to the spray cleaning treatment time, which can ensure that after the spray cleaning of the first substrate ranked earlier is completed, the soaking of the second substrate ranked later is completed. Therefore, the second substrates that are sorted later can smoothly move to the spray cleaning tank without being hindered by the first substrates that are sorted earlier.
又,本发明的基板湿式处理装置,控制单元可依据工艺需求,处理不同工艺条件的多个基板。不同工艺条件所需的浸泡处理时间有所不同,可藉由控制单元分别控制每一基板所需的特定的浸泡处理时间;及控制单元依据每一基板的浸泡处理时间及喷洗处理时间排程间隔时间。In addition, in the substrate wet processing device of the present invention, the control unit can process multiple substrates with different process conditions according to process requirements. The soaking treatment time required by different process conditions is different, and the specific soaking treatment time required for each substrate can be controlled separately by the control unit; and the control unit schedules according to the soaking treatment time and spray cleaning treatment time of each substrate Intervals.
附图说明Description of drawings
图1为本发明之一实施例的基板湿式处理装置的示意图。FIG. 1 is a schematic diagram of a substrate wet processing device according to an embodiment of the present invention.
图2为图1所示的浸泡槽、喷洗处理槽及清洗干燥单元的剖面示意图。Fig. 2 is a schematic cross-sectional view of the soaking tank, the spraying treatment tank and the cleaning and drying unit shown in Fig. 1 .
图3为图1所示的浸泡槽及喷洗处理槽的立体示意图。FIG. 3 is a three-dimensional schematic diagram of the soaking tank and the spraying treatment tank shown in FIG. 1 .
图4为本发明之一实施例的基板湿式处理方法的流程示意图。FIG. 4 is a schematic flowchart of a substrate wet processing method according to an embodiment of the present invention.
图5为图3所示的浸泡槽的作动示意图。FIG. 5 is a schematic diagram of the operation of the soaking tank shown in FIG. 3 .
图6为本发明的另一实施例的浸泡槽的示意图。Fig. 6 is a schematic diagram of a soaking tank according to another embodiment of the present invention.
图7为图3所示的浸泡槽的降流流场示意图。Fig. 7 is a schematic diagram of the downflow flow field of the soaking tank shown in Fig. 3 .
图8为本发明的另一实施例的喷洗处理槽的示意图。Fig. 8 is a schematic diagram of a spray cleaning treatment tank according to another embodiment of the present invention.
图9为本发明的另一实施例的喷洗处理槽及清洗干燥单元的示意图。Fig. 9 is a schematic diagram of a spray washing treatment tank and a washing and drying unit according to another embodiment of the present invention.
图10为本发明的又一实施例的喷洗处理槽及清洗干燥单元的示意图。Fig. 10 is a schematic diagram of a spray washing treatment tank and a washing and drying unit according to another embodiment of the present invention.
图11为本发明的另一实施例的基板湿式处理装置的示意图。FIG. 11 is a schematic diagram of a substrate wet processing device according to another embodiment of the present invention.
其中附图标记为:Wherein reference sign is:
基板湿式处理装置1、1dSubstrate wet processing device 1, 1d
浸泡槽10、10a、10dSoaking tank 10, 10a, 10d
多片式容置部11、11a、11dMulti-piece housing part 11, 11a, 11d
单片式容置槽位111dSingle-piece storage slot 111d
基板水平垂直转换单元12、12dSubstrate horizontal and vertical conversion units 12, 12d
喷洗处理槽20、20a、20b、20c、20dSpray washing treatment tanks 20, 20a, 20b, 20c, 20d
单片式喷洗单元21、21a、21b、21c、21dSingle-piece spray washing unit 21, 21a, 21b, 21c, 21d
喷洗槽211Spray tank 211
流体喷头212Fluid Nozzle 212
处理液收集单元22cTreatment liquid collection unit 22c
输送载具30Conveyor 30
附加电路板31、31dAdditional circuit board 31, 31d
移动件32、32dMoving part 32, 32d
移动轨道33、33dMoving track 33, 33d
控制单元40control unit 40
清洗干燥单元50、50b、50cWashing and drying unit 50, 50b, 50c
清洗液供应单元51、51b、51cWashing liquid supply unit 51, 51b, 51c
清洗液收集单元52cWashing liquid collection unit 52c
气体喷洗单元60Gas spray unit 60
处理承载架AHandle carrier A
基板SSubstrate S
第一基板S1first substrate S1
第二基板S2Second Substrate S2
具体实施方式Detailed ways
为能让贵审查委员能更了解本发明的技术内容,特举较佳具体实施例说明如下。In order to enable your review committee members to better understand the technical content of the present invention, the preferred specific embodiments are described as follows.
图1为本发明之一实施例的基板湿式处理装置的示意图,图2为图1所示的浸泡槽、喷洗处理槽及清洗干燥单元的剖面示意图,图3为图1所示的浸泡槽及喷洗处理槽的立体示意图,请一并参考图1、图2及图3所示。本实施例的基板湿式处理装置1用于处理多个片基板S,针对多个片基板S分别进行浸泡、喷洗、清洗及干燥等程序,关于作动的部分系以第一基板S1及第二基板S2为例说明。本实施例的基板湿式处理装置1包括浸泡槽10、喷洗处理槽20、输送载具30、控制单元40以及清洗干燥单元50。其中,喷洗处理槽20邻设于浸泡槽10,输送载具30于浸泡槽10及喷洗处理槽20之间移动,藉此将每一基板S移送至浸泡槽10及喷洗处理槽20。Fig. 1 is a schematic diagram of a substrate wet processing device according to an embodiment of the present invention; Fig. 2 is a schematic cross-sectional view of the soaking tank, the spraying treatment tank and the cleaning and drying unit shown in Fig. 1; Fig. 3 is the soaking tank shown in Fig. 1 and the three-dimensional schematic diagram of the spraying treatment tank, please refer to Fig. 1, Fig. 2 and Fig. 3 together. The substrate wet processing device 1 of this embodiment is used to process a plurality of substrates S, and processes such as immersion, spray washing, cleaning and drying are respectively performed on the plurality of substrates S, and the operating parts are the first substrate S1 and the second substrate S The second substrate S2 is described as an example. The substrate wet processing device 1 of this embodiment includes a soaking tank 10 , a spray cleaning tank 20 , a transport carrier 30 , a control unit 40 and a cleaning and drying unit 50 . Wherein, the spraying treatment tank 20 is adjacent to the soaking tank 10, and the transport carrier 30 moves between the soaking tank 10 and the spraying treatment tank 20, thereby transferring each substrate S to the soaking tank 10 and the spraying treatment tank 20 .
又,本实施例的控制单元40藉由控制输送载具30的作动,已将多个片基板S进行湿式处理,并分别控制每一基板S(第一基板S1、第二基板S2)于浸泡槽10的多片式容置部11的浸泡处理时序。又,控制单元40储存一基板湿式处理方法(程序),如图4所示,图4为本发明的一实施例的基板湿式处理方法的流程示意图。控制单元40可控制输送载具30执行以下步骤:移送多个基板中的第一基板至浸泡槽的多片式容置部(步骤S10);经过一间隔时间,移送多个基板中的第二基板至浸泡槽的多片式容置部(步骤S20);第一基板经过一浸泡处理时间,自浸泡槽移送至喷洗处理槽的单片式喷洗单元进行喷洗处理(步骤S30);经过一喷洗处理时间,自单片式喷洗单元移出第一基板(步骤S40);以及第二基板经过该浸泡处理时间,自浸泡槽接续移送至喷洗处理槽的单片式喷洗单元进行喷洗处理(步骤S50)。以下搭配各步骤,进一步说明本实施例的基板湿式处理装置1的结构特征。In addition, the control unit 40 of this embodiment has performed wet processing on a plurality of substrates S by controlling the movement of the transport carrier 30, and separately controls each substrate S (first substrate S1, second substrate S2) to Sequence of immersion treatment of the multi-chip container 11 of the immersion tank 10 . Moreover, the control unit 40 stores a substrate wet processing method (program), as shown in FIG. 4 , which is a schematic flowchart of a substrate wet processing method according to an embodiment of the present invention. The control unit 40 can control the transport carrier 30 to perform the following steps: transfer the first substrate among the plurality of substrates to the multi-chip accommodating portion of the soaking tank (step S10); after an interval, transfer the second substrate among the plurality of substrates Substrates to the multi-chip accommodating part of the soaking tank (step S20); after a soaking treatment time, the first substrate is transferred from the soaking tank to the single-chip spraying unit of the spraying treatment tank for spraying treatment (step S30); After a spraying treatment time, the first substrate is removed from the single-piece spraying unit (step S40); and the second substrate is transferred from the soaking tank to the single-piece spraying unit of the spraying treatment tank after the soaking time A spray cleaning process is performed (step S50). The structural features of the substrate wet processing apparatus 1 of the present embodiment will be further described in conjunction with each step below.
步骤S10:移送多个基板S中的第一基板S1至浸泡槽10的多片式容置部11。Step S10 : transferring the first substrate S1 among the plurality of substrates S to the multi-piece accommodating portion 11 of the soaking tank 10 .
本实施例的浸泡槽10内具有浸泡液,并包括一多片式容置部11,其可容置多个片基板S。其中,多片式容置部11可以为水平式或垂直式,较佳可以为垂直式,本实施例的多片式容置部11为一垂直多片式容置部。垂直式的设计除了可达到节省空间的效果,更使输送载具30可不受空间的限制,夹持并移送控制单元40所指定夹持的基板S。本实施例的输送载具30可移动地设置于浸泡槽10及喷洗处理槽20,且输送载具30垂直地承载基板S。详细而言,输送载具30包括附加电路板31、移动件32及移动轨道33。附加电路板31用以承接基板S,以使基板S进行升降而可置入浸泡槽10及喷洗处理槽20。移动轨道33设置于浸泡槽10及喷洗处理槽20的上方。移动件32设置于附加电路板31的二侧,且部分容置于移动轨道33,使移动件32可沿着移动轨道33移动,以带动附加电路板31将基板S移送指定位置。其中于各处理步骤皆为各别基板的单片式处理,因此可依靠单一的移动件32往返于浸泡槽10及喷洗处理槽20,夹持并移送控制单元40所指定夹持的基板S。在其他实施例中,依据工艺需求,亦可设置多个移动件32,本发明并不限制。The soaking tank 10 of the present embodiment contains soaking liquid, and includes a multi-piece accommodating portion 11 , which can accommodate a plurality of substrates S. As shown in FIG. Wherein, the multi-piece accommodating portion 11 can be horizontal or vertical, preferably vertical. The multi-piece accommodating portion 11 in this embodiment is a vertical multi-piece accommodating portion. The vertical design not only achieves the effect of saving space, but also enables the transport carrier 30 to clamp and transfer the substrate S specified by the control unit 40 without being limited by space. The transport carrier 30 of this embodiment is movably disposed in the soaking tank 10 and the spraying treatment tank 20 , and the transport carrier 30 vertically carries the substrate S. As shown in FIG. In detail, the transport carrier 30 includes an additional circuit board 31 , a moving part 32 and a moving track 33 . The additional circuit board 31 is used to receive the substrate S, so that the substrate S can be lifted and placed into the soaking tank 10 and the spraying treatment tank 20 . The moving track 33 is arranged above the soaking tank 10 and the spraying treatment tank 20 . The moving part 32 is disposed on two sides of the additional circuit board 31 and partially accommodated in the moving track 33 , so that the moving part 32 can move along the moving track 33 to drive the additional circuit board 31 to move the substrate S to a designated position. Each processing step is a single-piece processing of each substrate, so a single moving part 32 can be relied on to go back and forth between the soaking tank 10 and the spraying processing tank 20 to clamp and transfer the clamped substrate S specified by the control unit 40 . In other embodiments, a plurality of moving parts 32 may also be provided according to technological requirements, which is not limited by the present invention.
一般而言,藉由机械手臂等机构将基板S以水平的状态送入基板湿式处理装置1,故浸泡槽10前方仍具有可置放水平状态的基板S的空间及一基板水平垂直转换单元12。较佳的,本实施例的浸泡槽10具有基板水平垂直转换单元12,其接收水平状态的基板S后,再转换成垂直状态,并由输送载具30的附加电路板31所接收。请搭配图5所示,图5为图3所示的浸泡槽的作动示意图。移动件32带动附加电路板31及基板S移动至指定位置后,例如多片式容置部11中尚未置放基板S的位置,再将基板S(以第一基板S1为例)垂直地置于多片式容置部11,同时,控制单元40纪录其置放时间。Generally speaking, the substrate S is sent into the substrate wet processing device 1 in a horizontal state by a mechanism such as a robot arm, so there is still a space in front of the soaking tank 10 where the substrate S in a horizontal state can be placed and a substrate horizontal-vertical conversion unit 12 . Preferably, the soaking tank 10 of this embodiment has a substrate horizontal-vertical conversion unit 12 , which converts the substrate S into a vertical state after receiving the substrate S in a horizontal state, and receives it by the additional circuit board 31 of the transport carrier 30 . Please match it as shown in Figure 5, which is a schematic diagram of the operation of the soaking tank shown in Figure 3. After the moving part 32 drives the additional circuit board 31 and the substrate S to move to a designated position, for example, the position where the substrate S has not been placed in the multi-piece accommodating part 11, the substrate S (taking the first substrate S1 as an example) is placed vertically. In the multi-chip accommodating part 11, at the same time, the control unit 40 records the placement time.
在其他实施例中,请参考图1所示,基板水平垂直转换单元12设置于喷洗处理槽20及清洗干燥单元50之间,将垂直状态的基板S,再转换成水平状态。In other embodiments, please refer to FIG. 1 , the substrate horizontal-vertical conversion unit 12 is disposed between the spraying treatment tank 20 and the cleaning and drying unit 50 , and converts the substrate S in a vertical state into a horizontal state.
在其他实施例中,多片式容置部11a亦可以水平式,如图6所示,图6为本发明的另一实施例的浸泡槽的示意图。此实施例的浸泡槽10a具有水平式的多片式容置部11a,仅须搭配其他机构,使输送载具30可一次取出一片基板。又,水平式的设计可使基板S进入浸泡槽10a时可不用转换为垂直状态。In other embodiments, the multi-piece accommodating portion 11a can also be horizontal, as shown in FIG. 6 , which is a schematic diagram of a soaking tank according to another embodiment of the present invention. The soaking tank 10a of this embodiment has a horizontal multi-chip accommodating portion 11a, and only needs to be equipped with other mechanisms so that the transport carrier 30 can take out one substrate at a time. Moreover, the horizontal design can make the substrate S not need to be converted into a vertical state when it enters the soaking tank 10a.
步骤S20:经过一间隔时间,移送多个基板S中的第二基板S2,并置于浸泡槽10的多片式容置部11。Step S20 : After an interval time, the second substrate S2 among the plurality of substrates S is transferred, and placed in the multi-piece accommodating portion 11 of the soaking tank 10 .
换言之,输送载具30先移送第一基板S1至多片式容置部11进行浸泡程序(步骤S10),经过一间隔时间后,再移送第二基板S2至多片式容置部11进行浸泡程序(步骤S20),重复多次后,即可将多个片的基板S置放于多片式容置部11进行浸泡程序。需注意的是,每一片基板S(以第一基板S1及第二基板S2为例)皆独立进出浸泡槽10,且其置放时间的时间差即为前述的间隔时间。换言之,第一基板S1及第二基板S2的置放时间的差值为前述的间隔时间。因此,将第一基板S1及第二基板S2(多个片基板S)依序置于浸泡槽10后,可同时于浸泡槽10分别进行浸泡程序,不用等待第一基板S1浸泡完后再置放第二基板S2,藉此提高基板湿式处理装置1的使用效率。In other words, the conveying carrier 30 first transfers the first substrate S1 to the multi-piece container 11 to perform the soaking process (step S10), and then transfers the second substrate S2 to the multi-chip container 11 to perform the soaking process after an interval of time (step S10). Step S20 ), after repeated several times, can place multiple pieces of substrates S in the multi-piece container 11 to perform the soaking process. It should be noted that each substrate S (taking the first substrate S1 and the second substrate S2 as an example) enters and exits the soaking tank 10 independently, and the time difference between the placement times is the aforementioned interval time. In other words, the difference between the placement time of the first substrate S1 and the second substrate S2 is the aforementioned interval time. Therefore, after the first substrate S1 and the second substrate S2 (multiple substrates S) are placed in the soaking tank 10 in sequence, the soaking procedures can be carried out in the soaking tank 10 at the same time, without waiting for the first substrate S1 to be soaked before being placed. Place the second substrate S2, thereby improving the use efficiency of the substrate wet processing device 1 .
较佳的,浸泡槽10更包括温度控制单元、流场控制单元、或震荡单元,其中,温度控制单元可将浸泡槽10内的浸泡液维持在一指定温度区间,而流场控制单元可控制浸泡液的流场,以均匀地泡软基板S上的光阻,例如可为降流流场,如图7的箭头符号所示,图7为图3所示的浸泡槽的降流流场示意图。具体而言,流场控制单元于垂直多片式容置部11形成降流流场以进一步处理基板S,如基板S有剥离物,可利用降流将剥离物往下带。又,震荡单元连接于多片式容置部11,以摇动置于多片式容置部11的第一基板S1及第二基板S2(多个片基板S),进而加速移除基板S上的光阻或金属膜。Preferably, the soaking tank 10 further includes a temperature control unit, a flow field control unit, or an oscillation unit, wherein the temperature control unit can maintain the soaking liquid in the soaking tank 10 at a specified temperature range, and the flow field control unit can control The flow field of the immersion liquid, to evenly soak the photoresist on the soft substrate S, for example, can be a downflow flow field, as shown by the arrow symbol in Figure 7, and Figure 7 is the downflow flow field of the soaking tank shown in Figure 3 schematic diagram. Specifically, the flow field control unit forms a downflow flow field in the vertical multi-piece accommodating portion 11 to further process the substrate S. If there is peeling on the substrate S, the downflow can be used to bring the peeling down. In addition, the vibration unit is connected to the multi-piece accommodation part 11 to shake the first substrate S1 and the second substrate S2 (multiple pieces of substrate S) placed in the multi-piece accommodation part 11, thereby speeding up removal of the substrate S. photoresist or metal film.
在其他实施例中,基板湿式处理装置1更可包括一浸泡前喷洗单元,其邻设于多片式容置部11。在步骤S10之前,控制单元40可先控制输送载具30移送第一基板S1(单一基板S)至浸泡前喷洗单元,进行浸泡前的喷洗处理后,再执行步骤S10,以将第一基板S1移送至多片式容置部11。接着,夹持第二基板S2并移送至浸泡前喷洗单元进行喷洗处理后,再执行步骤S20(将第二基板S2移送至多片式容置部11。In other embodiments, the substrate wet processing device 1 may further include a pre-soaking spray unit, which is adjacent to the multi-chip accommodating portion 11 . Before step S10, the control unit 40 can first control the transport carrier 30 to transfer the first substrate S1 (single substrate S) to the pre-soaking spray cleaning unit, and then perform step S10 after performing the pre-soaking spray cleaning process, so that the first The substrate S1 is transferred to the multi-chip container 11 . Next, clamp the second substrate S2 and transfer it to the pre-immersion spray cleaning unit for spray cleaning treatment, and then perform step S20 (transfer the second substrate S2 to the multi-chip accommodating part 11 .
又,浸泡前喷洗单元可设置于浸泡槽10内,或邻设于浸泡槽10。以设置于浸泡槽10内为例,浸泡槽10可区分为二个空间,其一具有喷头以作为浸泡前喷洗单元,另一置放多片式容置部11,并可先对基板S进行喷洗处理后,接续移送至多片式容置部11并进行浸泡处理。In addition, the pre-soaking spray unit can be arranged in the soaking tank 10 or adjacent to the soaking tank 10 . Taking the setting in the soaking tank 10 as an example, the soaking tank 10 can be divided into two spaces, one of which has a spray head as a spray cleaning unit before soaking, and the other is placed with a multi-piece container 11, and the substrate S can be cleaned first. After performing the spray washing process, it is successively transferred to the multi-chip storage unit 11 and subjected to soaking process.
步骤S30:第一基板S1经过一浸泡处理时间,自浸泡槽10移送至喷洗处理槽20的单片式喷洗单元21进行喷洗处理。Step S30: After a soaking treatment time, the first substrate S1 is transferred from the soaking tank 10 to the single-chip spraying unit 21 of the spraying treatment tank 20 for spraying treatment.
换言之,第一基板S1置于浸泡槽10内,并经浸泡处理时间后取出。需说明的是,每一片基板S皆经一浸泡处理时间后,即自浸泡槽10取出。又,不同工艺所需的浸泡处理时间有所不同,亦可藉由控制单元40依据工艺排程适当的浸泡处理时间。In other words, the first substrate S1 is placed in the soaking tank 10 and taken out after a soaking treatment time. It should be noted that each substrate S is taken out from the soaking tank 10 after a soaking treatment time. In addition, the soaking treatment time required by different processes is different, and the appropriate soaking treatment time can also be scheduled by the control unit 40 according to the process.
在本实施例中,由于多片式容置部11及为垂直式的设计,故输送载具30同样以垂直的方式取出基板S(第一基板S1),相较于水平式的设计,可大幅降低基板S上的浸泡液的残留量。较佳的,基板湿式处理装置1更可具有一气体喷洗单元60(如图2所示),并设置于浸泡槽10的上方,取出基板S(第一基板S1)时,可同时喷除基板S上的浸泡液,更进一步降低浸泡液的残留量。气体喷洗单元60设置于浸泡槽10的上方或浸泡槽10的槽壁上方,本发明并不限制。In this embodiment, since the multi-piece accommodating portion 11 is designed vertically, the transport carrier 30 also takes out the substrate S (first substrate S1) in a vertical manner. Compared with the horizontal design, it can The residual amount of the immersion liquid on the substrate S is greatly reduced. Preferably, the substrate wet processing device 1 can further have a gas spraying unit 60 (as shown in FIG. 2 ), which is arranged above the immersion tank 10. When the substrate S (first substrate S1) is taken out, the gas spraying unit 60 can be sprayed at the same time. The soaking liquid on the substrate S further reduces the residual amount of the soaking liquid. The gas spray unit 60 is disposed above the immersion tank 10 or above the tank wall of the immersion tank 10 , which is not limited by the present invention.
喷洗处理槽20具有至少一单片式喷洗单元21,本实施例系以二个相邻设置的单片式喷洗单元21为例,故可依据需求使用不同的化学液进行喷洗处理,亦可为相同化学液的两单片式喷洗单元21,以增加处理基板S的数量。又,单片式喷洗单元21系针对单一基板S进行喷洗程序,以确保每一片基板S可在同样条件下被清洗。单片式喷洗单元21亦可以为水平式或垂直式,较佳可以为垂直式,而本实施例的单片式喷洗单元21为一垂直单片式喷洗单元,故可承接上一站的浸泡槽10的垂直状态,不用再转换基板S的状态。举例而言,第一基板S1浸泡完成后,输送载具30的移动件32带动附加电路板31至第一基板S1的位置,附加电路板31向下移动以承接垂直状态的第一基板S1。接着,附加电路板31向上移动至原位(移动件32的顶缘),移动件32带动附加电路板31及第一基板S1移动至单片式喷洗单元21,并以同样的方式将第一基板S1垂直地置放于单片式喷洗单元21内。简言之,输送载具30垂直地承载基板S并移动至垂直多片式容置部11及垂直单片式喷洗单元21。The spraying treatment tank 20 has at least one single-piece spraying unit 21. The present embodiment takes two adjacent single-piece spraying units 21 as an example, so different chemical liquids can be used for spraying according to requirements. , can also be two single-chip spray cleaning units 21 of the same chemical liquid, so as to increase the number of substrates S to be processed. Moreover, the single-piece spray cleaning unit 21 performs a spray cleaning process on a single substrate S to ensure that each substrate S can be cleaned under the same conditions. The monolithic spraying unit 21 can also be horizontal or vertical, preferably vertical, and the monolithic spraying unit 21 of the present embodiment is a vertical monolithic spraying unit, so it can undertake the last The vertical state of the soaking tank 10 of the station does not need to change the state of the substrate S. For example, after the first substrate S1 is soaked, the moving part 32 of the transport carrier 30 drives the additional circuit board 31 to the position of the first substrate S1, and the additional circuit board 31 moves downward to receive the first substrate S1 in a vertical state. Then, the additional circuit board 31 moves upwards to the original position (the top edge of the moving part 32), and the moving part 32 drives the additional circuit board 31 and the first substrate S1 to move to the single-chip spraying unit 21, and in the same way the second A substrate S1 is vertically placed in the single-chip spray cleaning unit 21 . In short, the transport carrier 30 vertically carries the substrate S and moves to the vertical multi-chip accommodating portion 11 and the vertical single-chip spray cleaning unit 21 .
又,本实施例的单片式喷洗单元21包括一喷洗槽211及至少一流体喷头212,且流体喷头212设置于喷洗槽211的至少一侧壁,并藉由每一片基板S于喷洗槽211内垂直移动,流体喷头212喷洗每一片基板S。换言之,当第一基板S1(或其他基板S)垂直地移动至喷洗槽211内,位于侧壁的流体喷头212可直接喷洗第一基板S1。Moreover, the single-chip spray cleaning unit 21 of this embodiment includes a spray cleaning tank 211 and at least one fluid spray head 212, and the fluid spray head 212 is arranged on at least one side wall of the spray cleaning tank 211, and each substrate S is placed on the Moving vertically in the spray tank 211 , the fluid spray head 212 sprays each substrate S. In other words, when the first substrate S1 (or other substrates S) vertically moves into the spray tank 211 , the fluid spray head 212 located on the sidewall can directly spray the first substrate S1 .
在其他实施例中,单片式喷洗单元21a亦可以水平式,如图8所示,图8为本发明的另一实施例的喷洗处理槽的示意图。此实施例的喷洗处理槽20a具有水平式的单片式喷洗单元21a。In other embodiments, the single-piece spray cleaning unit 21a can also be horizontal, as shown in FIG. 8 , which is a schematic diagram of a spray cleaning treatment tank according to another embodiment of the present invention. The spray cleaning treatment tank 20a of this embodiment has a horizontal single piece spray cleaning unit 21a.
步骤S40:经过一喷洗处理时间,自单片式喷洗单元21移出第一基板S1。Step S40 : After a spray cleaning treatment time, remove the first substrate S1 from the single-chip spray cleaning unit 21 .
第一基板S1于喷洗槽211内进行喷洗程序,并持续一喷洗处理时间后,移动件32移动至喷洗槽211后,附加电路板31向下移动并承接第一基板S1,接着向上移动,以移出第一基板S1。较佳的,流体喷头212可设置于侧壁的上方,当第一基板S1于单片式喷洗单元21内垂直向上移动时,流体喷头212更可由第一基板S1上至下喷除剥离物(例如光阻及金属膜)。同时,已喷洗过的基板S部位向上移动,进而达到避免回沾及刮伤的效果。The first substrate S1 undergoes a spray cleaning process in the spray cleaning tank 211, and after the spray cleaning process lasts for a period of time, after the moving part 32 moves to the spray cleaning tank 211, the additional circuit board 31 moves downward to receive the first substrate S1, and then Move upward to remove the first substrate S1. Preferably, the fluid spray head 212 can be arranged above the side wall. When the first substrate S1 moves vertically upwards in the single-piece spray cleaning unit 21, the fluid spray head 212 can spray the peeling off from the first substrate S1 from top to bottom. (such as photoresist and metal film). At the same time, the S portion of the substrate that has been sprayed moves upwards, thereby achieving the effect of avoiding back-staining and scratching.
较佳的,除了浸泡槽10的上方以外,基板湿式处理装置1更可具有另一气体喷洗单元60,其设置于喷洗处理槽20的上方,或喷洗处理槽20的槽壁上方。于取出第一基板S1的同时喷除基板S上的化学液,更进一步降低化学液的残留量。接着,输送载具30将第一基板S1移至下一程序,本实施例系移动至清洗干燥单元50。又,控制单元40可依据多个单片式喷洗单元21的喷洗处理时间以排程间隔时间,或依据浸泡处理时间及喷洗处理时间排程间隔时间。例如使(置放第一基板S1及第二基板S2的)间隔时间大于等于喷洗处理时间,以确保前面的基板S(如第一基板S1)可实时的喷洗完成,不会阻碍后续基板S(如第二基板S2)移动至喷洗处理槽20的时序。较佳的,间隔时间大于喷洗处理时间,但若输送载具30具有多个附加电路板31及移动件32时或具有多个单片式喷洗单元21并行处理,则间隔时间可小于等于喷洗处理时间,本发明并不限制。Preferably, besides above the immersion tank 10 , the substrate wet processing device 1 may further have another gas spray unit 60 , which is disposed above the spray cleaning tank 20 or above the tank wall of the spray cleaning tank 20 . While taking out the first substrate S1, the chemical liquid on the substrate S is sprayed to further reduce the residual amount of the chemical liquid. Next, the transport carrier 30 moves the first substrate S1 to the next procedure, which in this embodiment is moved to the cleaning and drying unit 50 . Moreover, the control unit 40 can schedule the interval time according to the spraying processing time of the plurality of single-chip spraying units 21 , or schedule the interval time according to the soaking processing time and the spraying processing time. For example, the interval time (for placing the first substrate S1 and the second substrate S2) is greater than or equal to the spray cleaning treatment time, so as to ensure that the previous substrate S (such as the first substrate S1) can be spray cleaned in real time without hindering the subsequent substrates S (such as the second substrate S2 ) moves to the timing of the spray cleaning treatment tank 20 . Preferably, the interval time is greater than the spray cleaning processing time, but if the transport carrier 30 has multiple additional circuit boards 31 and moving parts 32 or has multiple single-chip spray cleaning units 21 for parallel processing, the interval time can be less than or equal to The spray cleaning treatment time is not limited in the present invention.
步骤S50:第二基板S2经过该浸泡处理时间,自浸泡槽10接续移送至喷洗处理槽20的单片式喷洗单元21进行喷洗处理。Step S50: after the soaking treatment time, the second substrate S2 is transferred from the soaking tank 10 to the single-chip spraying unit 21 of the spraying treatment tank 20 for spraying treatment.
首先,第一基板S1与第二基板S2的浸泡处理时间皆相同。又,由于置放第一基板S1及第二基板S2于浸泡槽10的间隔时间大于等于喷洗处理时间,故当第二基板S2浸泡完成时,第一基板S1亦已喷洗完成而移至下一程序(清洗干燥单元50)。因此,输送载具30可直接自浸泡槽10夹持第二基板S2,并移送至单片式喷洗单元21,而不会有任何阻碍。Firstly, the soaking treatment time of the first substrate S1 and the second substrate S2 are the same. Also, since the interval between placing the first substrate S1 and the second substrate S2 in the soaking tank 10 is greater than or equal to the spray cleaning treatment time, when the second substrate S2 is soaked, the first substrate S1 has also been spray cleaned and moved to Next procedure (washing and drying unit 50). Therefore, the transport carrier 30 can directly hold the second substrate S2 from the soaking tank 10 and transfer it to the single-piece spray cleaning unit 21 without any hindrance.
另外,浸泡处理时间大于喷洗时间,系为使第一基板S1及第二基板S2上的光阻及金属膜可有效脱落的设计。第二基板S2喷洗完成后,亦藉由输送载具30移至下一程序的清洗干燥单元50。In addition, the soaking treatment time is longer than the spray cleaning time, which is designed to effectively remove the photoresist and metal films on the first substrate S1 and the second substrate S2. After the spray cleaning of the second substrate S2 is completed, it is also moved to the cleaning and drying unit 50 of the next procedure by the transport carrier 30 .
清洗干燥单元50邻设于单片式喷洗单元21,而清洗干燥单元50为单片式的清洗旋转平台,并具有清洗液供应单元51,每次可针对一片基板S(例如第一基板S1或第二基板S2)施予清洗液后,再以旋转的方式使基板S干燥。清洗液可以为去离子水,藉此清洗基板S上所残留的化学液。较佳的,清洗干燥单元50更可包括一挥发性溶液供应单元,以对基板S施予一挥发性溶液,例如异丙醇。当基板S为具表面结构的晶圆时,施予去离子水后,更进一步藉由挥发性溶液供应单元喷撒少许的异丙醇,以有效地去除残留在基板S上的水分。The cleaning and drying unit 50 is adjacent to the single-chip spray cleaning unit 21, and the cleaning and drying unit 50 is a single-chip cleaning rotary platform, and has a cleaning liquid supply unit 51, which can be used for one substrate S (such as the first substrate S1) at a time. Or the second substrate S2) after the cleaning solution is applied, the substrate S is dried in a rotating manner. The cleaning solution may be deionized water, so as to clean the remaining chemical solution on the substrate S. Referring to FIG. Preferably, the cleaning and drying unit 50 may further include a volatile solution supply unit for applying a volatile solution to the substrate S, such as isopropanol. When the substrate S is a wafer with a surface structure, after the deionized water is applied, a little isopropanol is further sprayed by the volatile solution supply unit to effectively remove the moisture remaining on the substrate S.
又,清洗干燥单元50可为水平或垂直式,本实施例系以独立设置的水平式清洗干燥单元50为例。图9为本发明的另一实施例的喷洗处理槽及清洗干燥单元的示意图,请参考图9所示。清洗干燥单元50b亦可为垂直式,并亦可设置于喷洗处理槽20b,亦即,清洗干燥单元50b与单片式喷洗单元21可以为设置于同一槽体(喷洗处理槽20b)的不同处理单元,例如图9所示的左侧为喷洗处理液的单片式喷洗单元21b、右侧为喷洗清洗液的清洗液供应单元51b。图10为本发明的又一实施例的喷洗处理槽及清洗干燥单元的示意图,请参考图10所示。单片式喷洗单元21c与清洗干燥单元50c皆为水平式,设置于同一槽体(喷洗处理槽20c),并可使用同一喷头于不同时程喷洗处理液、或清洗液,或是使用不同喷头,以分别喷洗处理液、清洗液。而本实施例的喷洗处理槽20c内设置有处理液收集单元22c、及清洗液收集单元52c的二个不同的单元,已分别接收处理液、清洗液。In addition, the cleaning and drying unit 50 can be horizontal or vertical, and this embodiment takes the independently installed horizontal cleaning and drying unit 50 as an example. FIG. 9 is a schematic diagram of a spray washing treatment tank and a cleaning and drying unit according to another embodiment of the present invention, please refer to FIG. 9 . The cleaning and drying unit 50b can also be vertical, and can also be arranged in the spraying treatment tank 20b, that is, the cleaning and drying unit 50b and the single-chip spraying unit 21 can be arranged in the same tank body (the spraying treatment tank 20b) Different processing units, for example, the left side shown in FIG. 9 is a single-chip spraying unit 21b for spraying processing liquid, and the right side is a cleaning liquid supply unit 51b for spraying cleaning liquid. FIG. 10 is a schematic diagram of a spray washing treatment tank and a cleaning and drying unit according to another embodiment of the present invention, please refer to FIG. 10 . The single-chip spraying unit 21c and the cleaning and drying unit 50c are all horizontal, and are arranged in the same tank (spraying treatment tank 20c), and the same nozzle can be used to spray the treatment liquid or cleaning liquid in different time courses, or Use different nozzles to spray the treatment liquid and cleaning liquid respectively. However, two different units, the treatment liquid collection unit 22c and the cleaning liquid collection unit 52c, are arranged in the spray cleaning treatment tank 20c of this embodiment, and have respectively received the treatment liquid and the cleaning liquid.
图11为本发明的另一实施例的基板湿式处理装置的示意图,请参考图11所示。在本实施例中,垂直多片式容置部11d包括多个单片式容置槽位111d,且单片式容置槽位111d及垂直单片式喷洗单元21d具有处理承载架A。输送载具30d同样包括附加电路板31d、移动件32d及移动轨道33d,而移动轨道33d设置于基板湿式处理装置1d的侧壁。输送载具30d的附加电路板31d承载基板S至处理承载架A,由处理承载架A承载基板S升降置入单片式容置槽位111d之一、或置入垂直单片式喷洗单元21d。其中可依靠单一的移动件32d往返于浸泡槽10d及喷洗处理槽20d,夹持并移送控制单元40所指定夹持的基板S。FIG. 11 is a schematic diagram of a substrate wet processing device according to another embodiment of the present invention, please refer to FIG. 11 . In this embodiment, the vertical multi-piece accommodation part 11d includes a plurality of single-piece accommodation slots 111d, and the single-piece accommodation slots 111d and the vertical single-piece spraying unit 21d have a processing carrier A. The transport carrier 30d also includes an additional circuit board 31d, a moving part 32d and a moving track 33d, and the moving track 33d is arranged on the side wall of the substrate wet processing device 1d. The additional circuit board 31d of the transport carrier 30d carries the substrate S to the processing carrier A, and the substrate S is lifted and lowered by the processing carrier A to place the substrate S into one of the single-chip accommodation slots 111d, or into the vertical single-chip spray cleaning unit 21d. Wherein, the substrate S designated by the control unit 40 can be clamped and transferred by a single moving part 32d to and fro between the soaking tank 10d and the spraying treatment tank 20d.
在其他实施例中,依据工艺需求,亦可设置多个移动件32d,本发明并不限制。In other embodiments, a plurality of moving parts 32d may also be provided according to technological requirements, which is not limited by the present invention.
综上所述,依据本发明的基板湿式处理装置,其包括一浸泡槽、一喷洗处理槽、一输送载具以及一控制单元。浸泡槽包括一多片式容置部,而喷洗处理槽邻设于浸泡槽。控制单元控制多个基板的湿式处理,并藉由输送载具分别控制每一基板于多片式容置部的浸泡处理时序。其中,多个基板置于多片式容置部,同一工艺条件的每片基板分别经过相同的浸泡处理时间后,再依序移至喷洗处理槽。由于每片基板的浸泡处理时间相同,故可避免因浸泡时间不同而造成清洗程度的差异,进而可提高良率。In summary, according to the substrate wet processing device of the present invention, it includes a soaking tank, a spraying treatment tank, a transport carrier and a control unit. The soaking tank includes a multi-piece accommodating part, and the spraying treatment tank is adjacent to the soaking tank. The control unit controls the wet processing of a plurality of substrates, and separately controls the soaking processing sequence of each substrate in the multi-chip accommodating part through the transport carrier. Wherein, a plurality of substrates are placed in the multi-piece accommodation part, and each substrate of the same process condition is respectively subjected to the same soaking treatment time, and then sequentially moved to the spray cleaning treatment tank. Since the soaking treatment time of each substrate is the same, it is possible to avoid the difference in cleaning degree caused by different soaking times, thereby improving the yield rate.
又,置放第一基板及第二基板于浸泡槽的间隔时间大于等于喷洗处理时间,可确保排序较前的第一基板喷洗完成后,排序较后的第二基板始浸泡完成。因此,排序较后的第二基板可顺畅地移动至喷洗处理槽,不会受到排序较前的第一基板的阻碍。In addition, the interval between placing the first substrate and the second substrate in the soaking tank is greater than or equal to the spray cleaning treatment time, which can ensure that after the spray cleaning of the first substrate ranked earlier is completed, the soaking of the second substrate ranked later is completed. Therefore, the second substrates that are sorted later can smoothly move to the spray cleaning tank without being hindered by the first substrates that are sorted earlier.
又,本发明的基板湿式处理装置,控制单元可依据工艺需求,处理不同工艺条件的多个基板。不同工艺条件所需的浸泡处理时间有所不同,可藉由控制单元分别控制每一基板所需的特定的浸泡处理时间;及控制单元依据每一基板的浸泡处理时间及喷洗处理时间排程间隔时间。In addition, in the substrate wet processing device of the present invention, the control unit can process multiple substrates with different process conditions according to process requirements. The soaking treatment time required by different process conditions is different, and the specific soaking treatment time required for each substrate can be controlled separately by the control unit; and the control unit schedules according to the soaking treatment time and spray cleaning treatment time of each substrate Intervals.
本发明无论就目的、手段及功效,均显示其迥异于现有技术之特征。惟应注意的是,上述诸多实施例系为了便于说明而举例,本发明所主张的保护范围自应以权利要求所述为准,而非仅限于上述实施例。No matter the purpose, means and effect of the present invention, it all shows its characteristics that are very different from the prior art. However, it should be noted that the above-mentioned embodiments are examples for the convenience of description, and the scope of protection claimed by the present invention should be determined by the claims, rather than limited to the above-mentioned embodiments.
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