WO2017063781A1 - Multilayer printed circuit board - Google Patents
Multilayer printed circuit board Download PDFInfo
- Publication number
- WO2017063781A1 WO2017063781A1 PCT/EP2016/070283 EP2016070283W WO2017063781A1 WO 2017063781 A1 WO2017063781 A1 WO 2017063781A1 EP 2016070283 W EP2016070283 W EP 2016070283W WO 2017063781 A1 WO2017063781 A1 WO 2017063781A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- layer
- circuit board
- printed circuit
- conductive
- recess
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/0266—Marks, test patterns or identification means
- H05K1/0268—Marks, test patterns or identification means for electrical inspection or testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2805—Bare printed circuit boards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2818—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] using test structures on, or modifications of, the card under test, made for the purpose of testing, e.g. additional components or connectors
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/11—Printed elements for providing electric connections to or between printed circuits
- H05K1/111—Pads for surface mounting, e.g. lay-out
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/09—Shape and layout
- H05K2201/09209—Shape and layout details of conductors
- H05K2201/09372—Pads and lands
- H05K2201/09381—Shape of non-curved single flat metallic pad, land or exposed part thereof; Shape of electrode of leadless component
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/09—Shape and layout
- H05K2201/09209—Shape and layout details of conductors
- H05K2201/09654—Shape and layout details of conductors covering at least two types of conductors provided for in H05K2201/09218 - H05K2201/095
- H05K2201/0969—Apertured conductors
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/09—Shape and layout
- H05K2201/09818—Shape or layout details not covered by a single group of H05K2201/09009 - H05K2201/09809
- H05K2201/0989—Coating free areas, e.g. areas other than pads or lands free of solder resist
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/16—Inspection; Monitoring; Aligning
- H05K2203/162—Testing a finished product, e.g. heat cycle testing of solder joints
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Definitions
- the invention generally relates to a multilayered board
- Printed circuit boards generally consist of a base material which has a multiplicity of individual printed conductors.
- a base material for example, plastics can be used.
- the use of aluminum, Teflon or various ceramics as a base material is also known.
- metallic base materials is the use of so-called IMS materials
- Insulated metal substrate (Insulated metal substrate) known. These provide that the metallic core is surrounded by an electrically non-conductive material to Errei ⁇ chen as an insulating effect.
- the conductor tracks are arranged on the electrically non-conductive material.
- Printed circuit boards as a carrier for electronic components ge ⁇ suitable and may be made of an insulating material. Furthermore, the printed circuit board may comprise one or more interconnects fixedly connected to this insulating material and optionally one or more solder joints, in particular measuring points or terminal contacts.
- Printed circuit boards delivered for further assembly have electrically insulated metallic conductor tracks and a plurality of solder joints, in particular measuring points or terminal contacts, which are mounted on an electrically non-conductive base layer.
- the printed conductors are mostly covered by a surface protection (solder mask), which is different the connection contacts over the entire circuit board surface pulls, protected.
- the circuit boards are generally provided before their assembly, directly after the production of the conductor track structures to the free copper surfaces and in the copper-coated ferten bores with the protective layer which is to guarantee that all terminals that are to be formed during loading ⁇ pieces, both electrically and mechanically meet all requirements.
- the protective layers thus serve to ensure the solderability and are often referred to as "solderable end surfaces".
- SMD components do not require any printed circuit board holes for their mounting, but are soldered with their connections directly to contacts provided for this purpose on the printed circuit board. SMD components are automatically placed on the solder paste-mounted connection contacts on the printed circuit board using assembly machines and soldered together in a single reflow soldering process. Before soldering, the circuit board is either treated with a flux or the flux is already part of the solder paste. In the hot tin, the flux evaporates only partially. In a quiet tin bath, burnt flux residues float on the tin surface. They pollute the Oberflä ⁇ che the board
- the electronic components and their solder joints, in particular connection contacts, can be connected to an ICT adapter (In
- test are electrically tested.
- the probes are equipped with small springs and mounted in a hermetically sealed housing. Under vacuum, the lid is sucked and pressed the circuit board down, and thereby on the test needles.
- mechanical ICT adapters are used. In this way, a contact between the test probes and the measuring points of the conductor plate reached. In this case, the test probes must touch the measuring points or signal nodes and establish an electrical contact.
- the contact between the test probes and the measuring points of the printed circuit board is very often inadequate. Often the test probes touch the measuring points but can not make electrical contact. Very thin oxidized layers or soiled areas are enough to prevent contact.
- test probes and the measuring points are in contact with the ambient air, often micro-thin interference layers, which prevent the contact. It often happens that the test needle also slips or punctures in the edge area of the measuring point. This in turn causes problems during testing, including incorrect measurements. In the case of faulty contacting, the test must be repeated several times, which makes it both time-consuming and expensive.
- the multilayer printed ⁇ te has at least a first electrically non-conductive Ba ⁇ sis slaughter on; at least one second conductive layer - ie, an electrically conductive second layer, preferably of copper and / or a copper alloy, wherein the second conductive layer is deposited on a first surface of the first non-electrically conductive layer; and at least one third layer, in particular of solder resist, on.
- the third layer is deposited on a first surface of the second conductive layer with a recess around the solder joint; wherein the recess has a diameter d which is greater than the solder joint, and wherein the Lot ⁇ site with flux and solder for the electrical Kontak- ting the second conductive layer is coated.
- the second conductive layer has, in a region between the recess and the solder joint at least a first recess, said first recess being adapted occurring in a soldering residues, particularly flux residues ⁇ receive.
- the second conductive layer in the region between the recess and the solder joint at least a second recess, wherein the first recess and the second recess are separated by at least one web.
- the second conductive layer in the region between the Ausspa ⁇ tion and the solder joint on a plurality of recesses, wherein the recesses are separated by a plurality of webs.
- the recesses are in the form of a
- the second conductive layer forms the webs in the region of the recesses.
- the solder joint is electrically connected via at least one web with at least one conductor track.
- the soldering point forms a measuring point, in particular an ICT measuring point.
- the invention comprises a method for producing a multilayer printed circuit board having at least one solder joint, in particular a measuring point or Anschlußkon ⁇ tact, wherein in a first process step on a first surface of a first non-electrically conductive layer at least one second conductive layer, preferably made of copper and / or a copper alloy is applied. Subsequently, the conductive second layer thus formed is patterned, after which at least a third layer, the special ⁇ from solder resist is applied to a first surface of the second conductive layer having a recess around the solder joint. The recess has a diameter through d, which is greater than the solder joint.
- the second conductive layer far further in a region between the recess and the solder joint at least a first recess.
- the solder joint is printed with solder paste.
- the solder paste includes both flux and tin for electrically contacting the solder joint with the second conductive layer.
- the printed circuit board is soldered, wherein the residues occurring during the soldering process, in particular flux residues, are received in the first recess of the second conductive layer.
- the soldering process is a reflow soldering process, wherein according to the invention it is possible for the flux to be localized and mechanically applied to the solder joint.
- the multilayer printed circuit board is electrically checked in an ICT test (in-circuit test).
- ICT test in-circuit test
- FIG. 1 shows a detail of a printed circuit board.
- Figure 2 is a side view of a solder joint, in particular egg ⁇ nes ICT measuring point from the prior art before egg nem soldering.
- Fig. 3 is a side view of the solder joint, in particular one
- FIG. 4 is a side view of a first variant of a soldering ⁇ site, in particular an ICT measuring point of he ⁇ inventive circuit board after a soldering process;
- Fig. 5 is a plan view of the solder joint of Figure 4;
- Fig. 6 is a plan view of a second variant of a soldering ⁇ site, in particular an ICT measuring point of he ⁇ inventive circuit board after a soldering process.
- 1 shows a section of a printed circuit board 100 in the solder joints 102, in particular measuring points and / or
- connection contacts are arranged.
- the solder joints 102 are either a connection to a circuit trace 126 or, as illustrated in this embodiment, arranged as an earthing point, for example, in a free, not occupied by components printed ⁇ ten Scheme.
- the solder joints 102 can be electrically checked, for example, in an in-circuit test.
- Figures 2 and 3 show the prior art.
- FIG 2 is a side view of a solder joint 102, in particular egg ⁇ nes measuring point or terminal contact, is on a circuit board 100 before soldering.
- Figure 3 shows the solder ⁇ point 102 of Figure 2 after application of the solder.
- a first layer forms a first non-electrically conduct ⁇ de base layer 110.
- a second conductive layer 120 is preferably copper and / or a copper alloy. This second conductive layer 120 is applied to a first surface 111 of the first non-electrically conductive base layer 110.
- a third layer 130 in particular
- Solder stop is deposited on a first surface 121 of the second conductive layer 120 with a recess 132 having a diameter d around the solder pad 102.
- the solder 102 is coated currency ⁇ end of the soldering process, in particular a reflow soldering method proceedings for electrically contacting the second conductive layer 120 with flux and solder 104th
- residues 108 in particular flux residues, deposit around solder joint 102.
- 108 Kgs ⁇ NEN prevent these residues a clean electrical contact between the solder 104, the solder 102 and the test adapter 200 during an in-circuit tests.
- Figures 4 to 6 each show a solder 102, and in particular ⁇ sondere an ICT measurement point on an inventive Lei ⁇ terplatte 100.
- the second conductive layer 120 recesses 122 in the Area of the recess 132 on.
- the recess 132 has a diameter d which is greater than the diameter e of the solder joint 102.
- These recesses 122 are designed to receive the residues 108 occurring during a soldering process. In this way, the solder joint 102 is kept free from residues, so that the residues 108 no longer prevent the contact between the test adapter 200 and the solder joint 102 and an in-circuit test can be performed easily.
- the recess 132 and the solder 102 can be at least a second recess 122, preferably a multi ⁇ number of recesses 122, wherein the recesses 122 in each case by at least one web 124 are separated from each other.
- the recesses 122 are arranged in the form of an interrupted by the webs 124 annulus.
- the ridges are formed by the second lei ⁇ tend layer 120 124th
- the soldering point 102 is electrically connected via at least one web 124 to at least one printed conductor 126.
- the solder joint 102 as shown in Figure 6, also form a ground point 128.
- the invention is not limited to the described Srindelsbei ⁇ game, but also includes the same effect other embodiments. The description of the figures is only for understanding the invention.
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
- Production Of Multi-Layered Print Wiring Board (AREA)
Abstract
Description
Beschreibung description
Mehrschichtige Leiterplatte Die Erfindung betrifft im Allgemeinen eine mehrschichtigeMultilayer Printed Circuit Board The invention generally relates to a multilayered board
Leiterplatte mit mindestens einer Lötstelle, insbesondere ei¬ nem ICT-Messpunkt , wie sie beispielsweise in Steuergeräten bzw. Verteilern für Kraftfahrzeuge eingesetzt werden kann. Des Weiteren betrifft die Erfindung ein Verfahren zum Her- stellen einer derartigen mehrschichtigen Leiterplatte. Printed circuit board with at least one solder joint, in particular egg ¬ nem ICT measuring point, as it can be used for example in control units or distributors for motor vehicles. Furthermore, the invention relates to a method for producing such a multilayer printed circuit board.
Leiterplatten bestehen dabei im allgemeinen aus einem Basismaterial, welches eine Vielzahl einzelner Leiterbahnen aufweist. Als Basismaterial können beispielsweise Kunststoffe eingesetzt werden. Darüber hinaus ist auch die Verwendung von Aluminium, Teflon oder verschiedenen Keramiken als Basismaterial bekannt. Beim Einsatz von metallischen Basismaterialien ist die Verwendung von sogenannten IMS Materialien Printed circuit boards generally consist of a base material which has a multiplicity of individual printed conductors. As a base material, for example, plastics can be used. In addition, the use of aluminum, Teflon or various ceramics as a base material is also known. When using metallic base materials is the use of so-called IMS materials
( Insulated-metal-substrate) bekannt. Diese sehen vor, dass der metallische Kern von einem elektrisch nicht leitenden Material umgeben wird, um so eine isolierende Wirkung zu errei¬ chen. Die Leiterbahnen sind dabei auf dem elektrisch nicht leitenden Material angeordnet. Leiterplatten sind als Träger für elektronische Bauteile ge¬ eignet und können aus einem isolierenden Material hergestellt sein. Ferner kann die Leiterplatte eine oder mehrere fest mit diesem isolierenden Material verbundene Leiterbahn sowie ggf. ein oder mehrere Lötstellen, insbesondere Messpunkte oder An- Schlusskontakte umfassen. (Insulated metal substrate) known. These provide that the metallic core is surrounded by an electrically non-conductive material to Errei ¬ chen as an insulating effect. The conductor tracks are arranged on the electrically non-conductive material. Printed circuit boards as a carrier for electronic components ge ¬ suitable and may be made of an insulating material. Furthermore, the printed circuit board may comprise one or more interconnects fixedly connected to this insulating material and optionally one or more solder joints, in particular measuring points or terminal contacts.
Für die weitere Bestückung ausgelieferte Leiterplatten weisen voneinander elektrisch getrennte metallische Leiterzüge und mehrere Lötstellen, insbesondere Messpunkte oder Anschluss- kontakte auf, die auf einer elektrisch nichtleitenden Basisschicht angebracht sind. Die Leiterbahnen sind meist durch einen Oberflächenschutz (Lötstopplack) , der sich mit Ausnahme der Anschlusskontakte über die gesamte Leiterplattenfläche zieht, geschützt. Die Leiterplatten werden im allgemeinen vor ihrer Bestückung, direkt nach der Herstellung der Leiterbahnstrukturen, auf den freien Kupferflächen und in den verkup- ferten Bohrungen mit der Schutzschicht versehen, die garantieren soll, dass sämtliche Anschlusskontakte, die beim Be¬ stücken gebildet werden sollen, sowohl elektrisch als auch mechanisch allen Anforderungen genügen. Die Schutzschichten dienen also der Absicherung der Lötbarkeit und werden oft als „lötfähige Endoberflächen" bezeichnet. Printed circuit boards delivered for further assembly have electrically insulated metallic conductor tracks and a plurality of solder joints, in particular measuring points or terminal contacts, which are mounted on an electrically non-conductive base layer. The printed conductors are mostly covered by a surface protection (solder mask), which is different the connection contacts over the entire circuit board surface pulls, protected. The circuit boards are generally provided before their assembly, directly after the production of the conductor track structures to the free copper surfaces and in the copper-coated ferten bores with the protective layer which is to guarantee that all terminals that are to be formed during loading ¬ pieces, both electrically and mechanically meet all requirements. The protective layers thus serve to ensure the solderability and are often referred to as "solderable end surfaces".
Auf die Lötstellen, insbesondere Messpunkte oder Anschluss¬ kontakte werden oberflächenmontierte Bauelemente, so genannte ' Surface Mounted Devices' - kurz SMD Bauteile eingesetzt. SMD Bauteile benötigen für ihre Montage keine Leiterplattenlö¬ cher, sondern werden mit ihren Anschlüssen direkt auf hierfür auf der Leiterplatte vorgesehene Kontakte gelötet. SMD- Bauteile werden mit Bestückungsautomaten maschinell auf die mit Lotpaste versehenen Anschlusskontakte auf der Leiterplat- te platziert und gemeinsam in einem einzigen Reflowlötver- fahren aufgelötet. Vor dem Auflöten wird die Leiterplatte entweder mit einem Flussmittel behandelt oder das Flussmittel ist bereits ein Bestandteil der Lotpaste. In dem heißen Zinn verdampft das Flussmittel nur teilweise. In einem ruhigen Zinnbad schwimmen die Rückstände aus verbranntem Flussmittel auf der Zinnoberfläche auf. Sie verschmutzen so die Oberflä¬ che der Leiterplatte On the solder joints, in particular measuring points or terminal ¬ contacts surface-mounted components, so-called 'surface mounted devices' - short SMD components used. SMD components do not require any printed circuit board holes for their mounting, but are soldered with their connections directly to contacts provided for this purpose on the printed circuit board. SMD components are automatically placed on the solder paste-mounted connection contacts on the printed circuit board using assembly machines and soldered together in a single reflow soldering process. Before soldering, the circuit board is either treated with a flux or the flux is already part of the solder paste. In the hot tin, the flux evaporates only partially. In a quiet tin bath, burnt flux residues float on the tin surface. They pollute the Oberflä ¬ che the board
Die elektronischen Bauteile und deren Lötstellen, insbesonde- re Anschlusskontakte, können mit einem ICT-Adapter (In-The electronic components and their solder joints, in particular connection contacts, can be connected to an ICT adapter (In
Circuit-Test ) elektrisch geprüft werden. Die Prüfnadeln sind mit kleinen Federn ausgestattet und in einem hermetisch verschließbaren Gehäuse angebracht. Durch Unterdruck wird der Deckel angesaugt und die Leiterplatte nach unten gedrückt, und dadurch auf die Prüfnadeln. Alternativ werden mechanische ICT-Adapter verwendet. Auf diese Weise wird eine Kontaktie- rung zwischen den Prüfnadeln und den Messpunkten der Leiter- platte erreicht. Hierbei müssen die Prüfnadeln die Messpunkte bzw. Signalknoten berühren und einen elektrischen Kontakt herstellen. Die Erfahrung zeigt jedoch, dass die Kontaktie- rung zwischen den Prüfnadeln und den Messpunkten der Leiter- platte sehr oft unzureichend ist. Oft berühren die Prüfnadeln zwar die Messpunkte, können aber keinen elektrischen Kontakt herstellen. Es reichen sehr dünne oxidierte Schichten oder verschmutzte Stellen um den Kontakt zu verhindern. Da die Prüfnadeln und die Messpunkte in Kontakt mit der Umgebungs- luft sind, entstehen oftmals mikrodünne Störschichten, die das Kontaktieren verhindern. Öfters passiert es, dass außerdem die Prüfnadel abrutscht oder im Randbereich des Messpunktes einsticht. Dies verursacht wiederum Probleme beim Prüfen, unter anderem Fehlmesswerte. Bei fehlerhafter Kontaktierung muss die Prüfung mehrmals wiederholt werden, wodurch sie so¬ wohl Zeitaufwendig als auch teuer wird. Circuit test) are electrically tested. The probes are equipped with small springs and mounted in a hermetically sealed housing. Under vacuum, the lid is sucked and pressed the circuit board down, and thereby on the test needles. Alternatively, mechanical ICT adapters are used. In this way, a contact between the test probes and the measuring points of the conductor plate reached. In this case, the test probes must touch the measuring points or signal nodes and establish an electrical contact. Experience has shown, however, that the contact between the test probes and the measuring points of the printed circuit board is very often inadequate. Often the test probes touch the measuring points but can not make electrical contact. Very thin oxidized layers or soiled areas are enough to prevent contact. Since the test probes and the measuring points are in contact with the ambient air, often micro-thin interference layers, which prevent the contact. It often happens that the test needle also slips or punctures in the edge area of the measuring point. This in turn causes problems during testing, including incorrect measurements. In the case of faulty contacting, the test must be repeated several times, which makes it both time-consuming and expensive.
Es ist eine Aufgabe der Erfindung, eine Leiterplatte mit we¬ nigstens einer Lötstelle und ein Verfahren zur Herstellung einer Leiterplatte mit wenigstens einer Lötstelle so auszu¬ bilden, dass die Lötstelle im Wesentlichen frei von Rückständen, die während des Lötvorganges entstehen, ist, so dass der Aufwand für Wartung und Reinigung sinkt, und dass fehlerhafte Kontaktierungen der Lötstelle und die damit einhergehenden Kosten reduziert werden, unter anderem in Hinblick auf das In-Circuit-Testen. It is an object of the invention, a circuit board having we ¬ nigstens a solder joint and a method for producing a circuit board having at least one solder joint for For so ¬ form that the solder is substantially free from residues formed during the soldering process, so that the cost of maintenance and cleaning is reduced, and that defective solder joints and the associated costs are reduced, among other things, with regard to the in-circuit testing.
Diese Aufgabe wird mittels einer Leiterplatte gemäß Patentan¬ spruch 1 und einem Verfahren zur Herstellung einer Leiter- platte gemäß Anspruch 8 gelöst. Vorteilhafte Ausführungsfor¬ men sind in den abhängigen Ansprüchen angegeben. This object is achieved by means of a printed circuit board according to patent claim ¬ 1 and a method for producing a printed circuit board according to claim 8. Advantageous Ausführungsfor ¬ men are given in the dependent claims.
Zur Lösung dieser Aufgabe wird eine mehrschichtige Leiter¬ platte mit mindestens einer Lötstelle, insbesondere einem An- schlusskontakt, vorgeschlagen. Die mehrschichtige Leiterplat¬ te weist mindestens eine erste nicht elektrisch leitende Ba¬ sisschicht auf; mindestens eine zweite leitende Schicht - d.h. eine elektrisch leitende zweite Schicht -, vorzugsweise aus Kupfer und/oder einer Kupferlegierung, wobei die zweite leitende Schicht auf einer ersten Oberfläche der ersten nicht elektrisch leitenden Schicht aufgebracht ist; und wenigstens eine dritte Schicht, insbesondere aus Lötstopplack, auf. Die dritte Schicht wird auf einer ersten Oberfläche der zweiten leitenden Schicht mit einer Aussparung um die Lötstelle herum aufgebracht; wobei die Aussparung einen Durchmesser d aufweist, der größer ist als die Lötstelle, und wobei die Lot¬ stelle mit Flussmittel und Lötzinn zur elektrischen Kontak- tierung der zweiten leitenden Schicht überzogen wird. Die zweite leitende Schicht weist in einem Bereich zwischen der Aussparung und der Lötstelle wenigstens eine erste Ausnehmung auf, wobei die erste Ausnehmung ausgelegt ist, bei einem Lötvorgang auftretende Rückstände, insbesondere Flussmittel¬ rückstände, aufzunehmen. To solve this problem, a multilayer Leiter ¬ plate with at least one solder joint, in particular a connection terminal proposed. The multilayer printed ¬ te has at least a first electrically non-conductive Ba ¬ sisschicht on; at least one second conductive layer - ie, an electrically conductive second layer, preferably of copper and / or a copper alloy, wherein the second conductive layer is deposited on a first surface of the first non-electrically conductive layer; and at least one third layer, in particular of solder resist, on. The third layer is deposited on a first surface of the second conductive layer with a recess around the solder joint; wherein the recess has a diameter d which is greater than the solder joint, and wherein the Lot ¬ site with flux and solder for the electrical Kontak- ting the second conductive layer is coated. The second conductive layer has, in a region between the recess and the solder joint at least a first recess, said first recess being adapted occurring in a soldering residues, particularly flux residues ¬ receive.
In einer Ausführungsform der Erfindung weist die zweite leitende Schicht in dem Bereich zwischen der Aussparung und der Lötstelle wenigstens eine zweite Ausnehmung auf, wobei die erste Ausnehmung und die zweite Ausnehmung durch zumindest einen Steg voneinander getrennt sind. In one embodiment of the invention, the second conductive layer in the region between the recess and the solder joint at least a second recess, wherein the first recess and the second recess are separated by at least one web.
In einer weiteren Ausführungsform der Erfindung weist die zweite leitende Schicht in dem Bereich zwischen der Ausspa¬ rung und der Lötstelle eine Mehrzahl von Ausnehmungen auf, wobei die Ausnehmungen durch eine Mehrzahl von Stegen voneinander getrennt sind. Bevorzugterweise sind die Ausnehmungen in Form eines durchIn a further embodiment of the invention, the second conductive layer in the region between the Ausspa ¬ tion and the solder joint on a plurality of recesses, wherein the recesses are separated by a plurality of webs. Preferably, the recesses are in the form of a
Stege unterbrochenen Kreisrings im Bereich der Aussparung angeordnet. Dabei ist es besonders vorteilhaft, dass die zweite leitende Schicht die Stege im Bereich der Ausnehmungen ausbildet . Webs broken circle arranged in the area of the recess. It is particularly advantageous that the second conductive layer forms the webs in the region of the recesses.
Vorzugsweise ist die Lötstelle über wenigstens einen Steg mit wenigstens einer Leiterbahn elektrisch verbunden. In einer besonders vorteilhaften Ausgestaltung bildet die Lötstelle einen Messpunkt aus, insbesondere einen ICT-Messpunkt . Preferably, the solder joint is electrically connected via at least one web with at least one conductor track. In a In a particularly advantageous embodiment, the soldering point forms a measuring point, in particular an ICT measuring point.
Desweiteren umfasst die Erfindung ein Verfahren zur Herstel- lung einer mehrschichtigen Leiterplatte mit mindestens einer Lötstelle, insbesondere einem Messpunkt oder Anschlusskon¬ takt, wobei in einem ersten Verfahrensschritt auf eine erste Oberfläche einer ersten nicht elektrisch leitenden Schicht mindestens eine zweite leitende Schicht, vorzugsweise aus Kupfer und/oder einer Kupferlegierung aufgebracht wird. Anschließend wird die so hergestellte leitende zweite Schicht strukturiert, woraufhin wenigstens eine dritte Schicht, ins¬ besondere aus Lötstopplack, mit einer Aussparung um die Lötstelle herum auf eine erste Oberfläche der zweiten leitenden Schicht aufgebracht wird. Die Aussparung weist einen Durch¬ messer d auf, der größer ist als die Lötstelle. Die zweite leitende Schicht weit ferner in einem Bereich zwischen der Aussparung und der Lötstelle wenigstens eine erste Ausnehmung auf. In einem weiteren Verfahrensschritt wird die Lötstelle mit Lotpaste bedruckt. Wobei die Lotpaste sowohl Flussmittel als auch Zinn zur elektrischen Kontaktierung der Lötstelle mit der zweiten leitenden Schicht beinhaltet. In einem letzten Verfahrensschritt wird die Leiterplatte gelötet, wobei die während des Lötvorgangs auftretenden Rückstände, insbe- sondere Flussmittelrückstände, in der ersten Ausnehmung der zweiten leitenden Schicht aufgenommen werden. Furthermore, the invention comprises a method for producing a multilayer printed circuit board having at least one solder joint, in particular a measuring point or Anschlußkon ¬ tact, wherein in a first process step on a first surface of a first non-electrically conductive layer at least one second conductive layer, preferably made of copper and / or a copper alloy is applied. Subsequently, the conductive second layer thus formed is patterned, after which at least a third layer, the special ¬ from solder resist is applied to a first surface of the second conductive layer having a recess around the solder joint. The recess has a diameter through d, which is greater than the solder joint. The second conductive layer far further in a region between the recess and the solder joint at least a first recess. In a further process step, the solder joint is printed with solder paste. Wherein the solder paste includes both flux and tin for electrically contacting the solder joint with the second conductive layer. In a last method step, the printed circuit board is soldered, wherein the residues occurring during the soldering process, in particular flux residues, are received in the first recess of the second conductive layer.
Vorteilhafterweise handelt es sich bei dem Lötvorgang um ein Reflow-Lötverfahren, wobei es gemäß der Erfindung möglich ist, dass das Flussmittel lokal begrenzt und maschinell auf die Lötstelle aufgebracht wird. Advantageously, the soldering process is a reflow soldering process, wherein according to the invention it is possible for the flux to be localized and mechanically applied to the solder joint.
In einem weiteren Verfahrensschritt ist vorgesehen, dass die mehrschichtige Leiterplatte in einem ICT-Test (In-Circuit- Test) elektrisch überprüft wird. Die Erfindung ist im Folgenden anhand von Ausführungsbeispie¬ len unter Bezugnahme auf die beigefügten Zeichnungen näher erläutert. Elemente oder Bauteile, welche eine identische, univoke oder analoge Ausbildung und/oder Funktion besitzen, sind in den verschiedenen Figuren (Fig.) der Zeichnungen mit denselben Bezugszeichen gekennzeichnet. Dabei ist zu beachten, dass die dargestellten Merkmale nur einen beschreibenden Charakter haben und auch in Kombination mit Merkmalen anderer oben beschriebener Weiterentwicklungen verwendet werden kön- nen und nicht dazu gedacht sind, die Erfindung in irgendeiner Form einzuschränken. In a further method step, it is provided that the multilayer printed circuit board is electrically checked in an ICT test (in-circuit test). The invention is explained in more detail below with reference to Ausführungsbeispie ¬ len with reference to the accompanying drawings. Elements or components which have an identical, univocal or analogous configuration and / or function are identified by the same reference numerals in the various figures (FIG. 1) of the drawings. It should be noted that the illustrated features have only a descriptive character and can also be used in combination with features of other developments described above and are not intended to limit the invention in any way.
Die Zeichnungen sind schematisch und zeigen: The drawings are schematic and show:
Fig. 1 einen Ausschnitt einer Leiterplatte; 1 shows a detail of a printed circuit board.
Fig. 2 eine Seitenansicht einer Lötstelle, insbesondere ei¬ nes ICT-Messpunktes aus dem Stand der Technik vor ei- nem Lötvorgang; Figure 2 is a side view of a solder joint, in particular egg ¬ nes ICT measuring point from the prior art before egg nem soldering.
Fig. 3 eine Seitenansicht der Lötstelle, insbesondere eines Fig. 3 is a side view of the solder joint, in particular one
ICT-Messpunktes aus Figur 2 nach einem dem ICT measuring point of Figure 2 after a the
Lötvorgang, während eines ICT Prüfverfahrens; Soldering process, during an ICT test procedure;
Fig. 4 eine Seitenansicht einer ersten Variante einer Löt¬ stelle, insbesondere eines ICT-Messpunktes einer er¬ findungsgemäßen Leiterplatte nach einem Lötvorgang; Fig. 5 eine Draufsicht auf die Lötstelle aus Figur 4; und 4 is a side view of a first variant of a soldering ¬ site, in particular an ICT measuring point of he ¬ inventive circuit board after a soldering process; Fig. 5 is a plan view of the solder joint of Figure 4; and
Fig. 6 eine Draufsicht auf eine zweite Variante einer Löt¬ stelle, insbesondere eines ICT-Messpunktes einer er¬ findungsgemäßen Leiterplatte nach einem Lötvorgang. Die Figur 1 zeigt einen Ausschnitt einer Leiterplatte 100 in dem Lötstellen 102, insbesondere Messpunkte und/oder Fig. 6 is a plan view of a second variant of a soldering ¬ site, in particular an ICT measuring point of he ¬ inventive circuit board after a soldering process. 1 shows a section of a printed circuit board 100 in the solder joints 102, in particular measuring points and / or
Anschlusskontakte, angeordnet sind. Die Lötstellen 102 haben entweder eine Verbindung zu einer Leiterbahn 126 oder sind, wie in dieser Ausführungsvariante dargestellt, beispielsweise in einem freien, nicht durch Bauelemente belegten Leiterplat¬ tenbereich als Massepunkt angeordnet. Mittels eines in Figur 3 dargestellten Prüfadapters 200 können die Lötstellen 102 beispielsweise in einem In-Circuit-Test elektrisch überprüft werden. Connection contacts are arranged. The solder joints 102 are either a connection to a circuit trace 126 or, as illustrated in this embodiment, arranged as an earthing point, for example, in a free, not occupied by components printed ¬ tenbereich. By means of a test adapter 200 shown in Figure 3, the solder joints 102 can be electrically checked, for example, in an in-circuit test.
Die Figuren 2 und 3 zeigen den Stand der Technik. In Figur 2 ist eine Seitenansicht einer Lötstelle 102, insbesondere ei¬ nes Messpunkt oder Anschlusskontakt, auf einer Leiterplatte 100 vor einem Lötvorgang darstellt. Figur 3 zeigt die Löt¬ stelle 102 der Figur 2 nach Aufbringen des Lots. Deutlich zu erkennen ist der mehrschichtige Aufbau der Leiterplatte 100. Eine erste Schicht bildet eine erste nicht elektrisch leiten¬ de Basisschicht 110. Eine zweite leitende Schicht 120 besteht vorzugsweise aus Kupfer und/oder einer Kupferlegierung. Diese zweite leitende Schicht 120 ist auf einer ersten Oberfläche 111 der ersten nicht elektrisch leitenden Basisschicht 110 aufgebracht. Eine dritte Schicht 130, insbesondere aus Figures 2 and 3 show the prior art. In figure 2 is a side view of a solder joint 102, in particular egg ¬ nes measuring point or terminal contact, is on a circuit board 100 before soldering. Figure 3 shows the solder ¬ point 102 of Figure 2 after application of the solder. Can be seen clearly the multilayer structure of the printed circuit board 100. A first layer forms a first non-electrically conduct ¬ de base layer 110. A second conductive layer 120 is preferably copper and / or a copper alloy. This second conductive layer 120 is applied to a first surface 111 of the first non-electrically conductive base layer 110. A third layer 130, in particular
Lötstopplack, ist auf einer ersten Oberfläche 121 der zweiten leitenden Schicht 120 mit einer Aussparung 132 mit einem Durchmesser d um die Lötstelle 102 herum aufgebracht. Solder stop, is deposited on a first surface 121 of the second conductive layer 120 with a recess 132 having a diameter d around the solder pad 102.
Wie in der Figur 3 dargestellt, wird die Lötstelle 102 wäh¬ rend des Lötvorganges, insbesondere eines Reflow-Lötver- fahrens zur elektrischen Kontaktierung der zweiten leitenden Schicht 120 mit Flussmittel und Lötzinn 104 überzogen. Dabei lagern sich Rückstände 108, insbesondere Flussmittelrückstände, um die Lötstelle 102 herum ab. Diese Rückstände 108 kön¬ nen einen sauberen elektrischen Kontakt zwischen dem Lötzinn 104 der Lötstelle 102 und dem Prüfadapter 200 während eines In-Circuit-Tests verhindern. Die Figuren 4 bis 6 zeigen jeweils eine Lötstelle 102, insbe¬ sondere einen ICT-Messpunkt , auf einer erfindungsgemäßen Lei¬ terplatte 100. Im Gegensatz zum dargestellten Stand der Technik in den Figuren 2 und 3 weist hier die zweite leitende Schicht 120 Ausnehmungen 122 im Bereich der Aussparung 132 auf. Dabei weist die Aussparung 132 weist einen Durchmesser d auf, der größer ist als der Durchmesser e der Lötstelle 102. Diese Ausnehmungen 122 sind dazu ausgelegt die bei einem Lötvorgang auftretenden Rückstände 108 aufzunehmen. Auf diese Weise wird die Lötstelle 102 frei von Rückständen gehalten, so dass die Rückstände 108 nicht mehr den Kontakt zwischen dem Prüfadapter 200 und der Lötstelle 102 verhindern und ein In-Circuit-Test problemlos durchgeführt werden kann. Wie in den Figuren 5 und 6 im Detail dargestellt, kann in dem Bereich zwischen der Aussparung 132 und der Lötstelle 102 wenigstens eine zweite Ausnehmung 122, vorzugsweise eine Mehr¬ zahl von Ausnehmungen 122 angeordnet sein, wobei die Ausnehmungen 122 jeweils durch zumindest einen Steg 124 voneinander getrennt sind. Die Ausnehmungen 122 sind in Form eines durch die Stege 124 unterbrochenen Kreisrings angeordnet. As shown in Figure 3, the solder 102 is coated currency ¬ end of the soldering process, in particular a reflow soldering method proceedings for electrically contacting the second conductive layer 120 with flux and solder 104th In the process, residues 108, in particular flux residues, deposit around solder joint 102. 108 Kgs ¬ NEN prevent these residues a clean electrical contact between the solder 104, the solder 102 and the test adapter 200 during an in-circuit tests. Figures 4 to 6 each show a solder 102, and in particular ¬ sondere an ICT measurement point on an inventive Lei ¬ terplatte 100. In contrast to the prior art shown in Figures 2 and 3, here the second conductive layer 120 recesses 122 in the Area of the recess 132 on. In this case, the recess 132 has a diameter d which is greater than the diameter e of the solder joint 102. These recesses 122 are designed to receive the residues 108 occurring during a soldering process. In this way, the solder joint 102 is kept free from residues, so that the residues 108 no longer prevent the contact between the test adapter 200 and the solder joint 102 and an in-circuit test can be performed easily. As shown in Figures 5 and 6 in detail, in the region between the recess 132 and the solder 102 can be at least a second recess 122, preferably a multi ¬ number of recesses 122, wherein the recesses 122 in each case by at least one web 124 are separated from each other. The recesses 122 are arranged in the form of an interrupted by the webs 124 annulus.
Vorteilhafterweise werden die Stege 124 durch die zweite lei¬ tende Schicht 120 ausgebildet. Auf diese Weise ist es mög- lieh, dass die Lötstelle 102 über wenigstens einen Steg 124 mit wenigstens einer Leiterbahn 126 elektrisch verbunden ist. Alternativ kann die Lötstelle 102, wie in Figur 6 dargestellt, auch einen Massepunkt 128 ausbilden. Die Erfindung ist nicht auf das beschriebene Ausführungsbei¬ spiel beschränkt, sondern umfasst auch gleichwirkende weitere Ausführungsformen. Die Figurenbeschreibung dient lediglich dem Verständnis der Erfindung. Advantageously, the ridges are formed by the second lei ¬ tend layer 120 124th In this way it is possible that the soldering point 102 is electrically connected via at least one web 124 to at least one printed conductor 126. Alternatively, the solder joint 102, as shown in Figure 6, also form a ground point 128. The invention is not limited to the described Ausführungsbei ¬ game, but also includes the same effect other embodiments. The description of the figures is only for understanding the invention.
Claims
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102015220025.6A DE102015220025A1 (en) | 2015-10-15 | 2015-10-15 | Multilayer printed circuit board |
| DE102015220025.6 | 2015-10-15 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2017063781A1 true WO2017063781A1 (en) | 2017-04-20 |
Family
ID=56855439
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/EP2016/070283 Ceased WO2017063781A1 (en) | 2015-10-15 | 2016-08-29 | Multilayer printed circuit board |
Country Status (2)
| Country | Link |
|---|---|
| DE (1) | DE102015220025A1 (en) |
| WO (1) | WO2017063781A1 (en) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5519580A (en) * | 1994-09-09 | 1996-05-21 | Intel Corporation | Method of controlling solder ball size of BGA IC components |
| US6448504B1 (en) * | 1998-06-11 | 2002-09-10 | Sony Corporation | Printed circuit board and semiconductor package using the same |
| US20050061540A1 (en) * | 2003-09-24 | 2005-03-24 | Parker Kenneth P. | Printed circuit board test access point structures and method for making the same |
| CN201051111Y (en) * | 2007-05-17 | 2008-04-23 | 创宇科技工业股份有限公司 | piercing probe |
| CN103341701A (en) * | 2013-06-24 | 2013-10-09 | 升贸电子科技(重庆)有限公司 | Flux for Soldering |
| CN104416297A (en) * | 2013-08-21 | 2015-03-18 | 苏州优诺电子材料科技有限公司 | Clean-free solder paste low in ICT (in circuit testing) false positive rate |
-
2015
- 2015-10-15 DE DE102015220025.6A patent/DE102015220025A1/en not_active Ceased
-
2016
- 2016-08-29 WO PCT/EP2016/070283 patent/WO2017063781A1/en not_active Ceased
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5519580A (en) * | 1994-09-09 | 1996-05-21 | Intel Corporation | Method of controlling solder ball size of BGA IC components |
| US6448504B1 (en) * | 1998-06-11 | 2002-09-10 | Sony Corporation | Printed circuit board and semiconductor package using the same |
| US20050061540A1 (en) * | 2003-09-24 | 2005-03-24 | Parker Kenneth P. | Printed circuit board test access point structures and method for making the same |
| CN201051111Y (en) * | 2007-05-17 | 2008-04-23 | 创宇科技工业股份有限公司 | piercing probe |
| CN103341701A (en) * | 2013-06-24 | 2013-10-09 | 升贸电子科技(重庆)有限公司 | Flux for Soldering |
| CN104416297A (en) * | 2013-08-21 | 2015-03-18 | 苏州优诺电子材料科技有限公司 | Clean-free solder paste low in ICT (in circuit testing) false positive rate |
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|---|---|
| DE102015220025A1 (en) | 2017-04-20 |
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