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WO2016043013A8 - Ｘ線分析装置 - Google Patents

Ｘ線分析装置 Download PDF

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Publication number
WO2016043013A8
WO2016043013A8 PCT/JP2015/074270 JP2015074270W WO2016043013A8 WO 2016043013 A8 WO2016043013 A8 WO 2016043013A8 JP 2015074270 W JP2015074270 W JP 2015074270W WO 2016043013 A8 WO2016043013 A8 WO 2016043013A8
Authority
WO
WIPO (PCT)
Prior art keywords
gain
peak value
analyzing apparatus
wave peak
ray analyzing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2015/074270
Other languages
English (en)
French (fr)
Other versions
WO2016043013A1 (ja
Inventor
幸雄 迫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rigaku Denki Co Ltd
Rigaku Corp
Original Assignee
Rigaku Denki Co Ltd
Rigaku Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rigaku Denki Co Ltd, Rigaku Corp filed Critical Rigaku Denki Co Ltd
Priority to CN201580049565.1A priority Critical patent/CN106716115B/zh
Priority to EP15841789.9A priority patent/EP3196636B1/en
Publication of WO2016043013A1 publication Critical patent/WO2016043013A1/ja
Priority to US15/458,326 priority patent/US9778214B2/en
Publication of WO2016043013A8 publication Critical patent/WO2016043013A8/ja
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/36—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry
    • G01T1/40—Stabilisation of spectrometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/17—Circuit arrangements not adapted to a particular type of detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/303—Accessories, mechanical or electrical features calibrating, standardising
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/304—Accessories, mechanical or electrical features electric circuits, signal processing

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Dispersion Chemistry (AREA)

Abstract

本発明のＸ線分析装置は、予備測定で求めた計数率の総計に基づいて推定したターゲットピークの波高値を所定の期待波高値に一致させるための第１ゲインを出力する第１補正手段（１３Ａ，１３Ｂ）と、所定のエネルギー範囲で検出したターゲットピークの波高値を期待波高値に一致させるために第１ゲインに加えるべき第２ゲインをリアルタイムにフィードバック制御で出力する第２補正手段（１４Ａ，１４Ｂ）とを併せ備え、さらに、ターゲットピークに対する妨害線の有無を的確に判断し、妨害線有りと判断した場合には、ゲインを第１ゲインのみからなる一定値に設定するフィードバック制御停止手段（１６Ａ，１６Ｂ）を備える。
PCT/JP2015/074270 2014-09-18 2015-08-27 Ｘ線分析装置 Ceased WO2016043013A1 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
CN201580049565.1A CN106716115B (zh) 2014-09-18 2015-08-27 X射线分析装置
EP15841789.9A EP3196636B1 (en) 2014-09-18 2015-08-27 X-ray analyzing apparatus
US15/458,326 US9778214B2 (en) 2014-09-18 2017-03-14 X-ray analyzing apparatus

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2014190249A JP6002890B2 (ja) 2014-09-18 2014-09-18 Ｘ線分析装置
JP2014-190249 2014-09-18

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US15/458,326 Continuation US9778214B2 (en) 2014-09-18 2017-03-14 X-ray analyzing apparatus

Publications (2)

Publication Number Publication Date
WO2016043013A1 WO2016043013A1 (ja) 2016-03-24
WO2016043013A8 true WO2016043013A8 (ja) 2017-03-16

Family

ID=55533054

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2015/074270 Ceased WO2016043013A1 (ja) 2014-09-18 2015-08-27 Ｘ線分析装置

Country Status (5)

Country Link
US (1) US9778214B2 (ja)
EP (1) EP3196636B1 (ja)
JP (1) JP6002890B2 (ja)
CN (1) CN106716115B (ja)
WO (1) WO2016043013A1 (ja)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10082475B2 (en) * 2015-08-28 2018-09-25 Rigaku Corporation X-ray fluorescence spectrometer
US9933375B2 (en) * 2015-09-25 2018-04-03 Olympus Scientific Solutions Americas, Inc. XRF/XRD system with dynamic management of multiple data processing units
WO2017145494A1 (ja) * 2016-02-25 2017-08-31 ソニー株式会社 アナログデジタル変換器、電子装置およびアナログデジタル変換器の制御方法
US20190005523A1 (en) * 2017-06-28 2019-01-03 Facebook, Inc. Identifying changes in estimated actions performed by users presented with a content item relative to different budgets for presenting the content item
JP6797421B2 (ja) 2018-08-09 2020-12-09 株式会社リガク 蛍光ｘ線分析装置
JP6808693B2 (ja) * 2018-08-16 2021-01-06 日本電子株式会社 Ｘ線分析装置および計数率の補正方法
WO2020079486A2 (en) * 2018-10-18 2020-04-23 Security Matters Ltd. System and method for detection and identification of foreign elements in a substance
JP7200193B2 (ja) * 2020-11-09 2023-01-06 日本電子株式会社 Ｘ線測定装置、ｘ線測定方法及び機械学習方法
WO2022162975A1 (ja) * 2021-01-27 2022-08-04 株式会社島津製作所 蛍光ｘ線分析装置
RU2756666C1 (ru) * 2021-02-01 2021-10-04 Акционерное общество "Чепецкий механический завод" Способ определения содержания гафния в металлическом цирконии и сплавах на его основе
EP4220143B1 (en) * 2022-02-01 2023-12-27 Bruker AXS GmbH System and method for improved measurement of peak intensities in pulse height spectra obtained by wave-length dispersive x-ray fluorescence spectrometers
JP2023115777A (ja) * 2022-02-08 2023-08-21 旭化成メディカル株式会社 濃度算出装置及び血液処理システム並びに濃度算出方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5286385A (en) 1976-01-14 1977-07-18 Rigaku Denki Kogyo Kk Wave height stabilizing apparatus for radiation detecting pulse
JPS58187885A (ja) 1982-04-27 1983-11-02 Rigaku Denki Kogyo Kk 放射線計測装置
JP3094437B2 (ja) * 1990-10-30 2000-10-03 株式会社島津製作所 Ｘ線分光装置
EP0566191B1 (en) * 1992-04-15 2000-01-19 Koninklijke Philips Electronics N.V. X-ray analysis apparatus with pulse amplitude shift correction
DE69327609T2 (de) 1992-04-15 2000-08-10 Koninklijke Philips Electronics N.V., Eindhoven Röntgenanalysegerät mit Impulsamplitudenverschiebungskorrektur
JPH10318946A (ja) * 1997-05-15 1998-12-04 Shimadzu Corp エネルギー分散型ｘ線分析装置
JP2005009861A (ja) * 2003-04-23 2005-01-13 Rigaku Industrial Co 波長分散型蛍光ｘ線分析装置
JP3950866B2 (ja) * 2004-03-31 2007-08-01 株式会社東芝 Ｘ線分析装置及びその分析方法
JP4880077B1 (ja) * 2011-02-16 2012-02-22 株式会社リガク Ｘ線検出信号処理装置および方法
US8374814B2 (en) * 2011-02-16 2013-02-12 Rigaku Corporation X-ray detection signal processing apparatus and method therefor
JP2014209098A (ja) * 2013-03-25 2014-11-06 株式会社リガク Ｘ線分析装置

Also Published As

Publication number Publication date
JP2016061688A (ja) 2016-04-25
EP3196636B1 (en) 2019-03-20
EP3196636A1 (en) 2017-07-26
EP3196636A4 (en) 2018-03-07
US9778214B2 (en) 2017-10-03
US20170184519A1 (en) 2017-06-29
WO2016043013A1 (ja) 2016-03-24
CN106716115B (zh) 2018-01-05
JP6002890B2 (ja) 2016-10-05
CN106716115A (zh) 2017-05-24

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