WO2012132577A1 - 印刷回路用銅箔 - Google Patents
印刷回路用銅箔 Download PDFInfo
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- WO2012132577A1 WO2012132577A1 PCT/JP2012/053107 JP2012053107W WO2012132577A1 WO 2012132577 A1 WO2012132577 A1 WO 2012132577A1 JP 2012053107 W JP2012053107 W JP 2012053107W WO 2012132577 A1 WO2012132577 A1 WO 2012132577A1
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- layer
- copper foil
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- resistant layer
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- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/10—Electroplating with more than one layer of the same or of different metals
- C25D5/12—Electroplating with more than one layer of the same or of different metals at least one layer being of nickel or chromium
- C25D5/14—Electroplating with more than one layer of the same or of different metals at least one layer being of nickel or chromium two or more layers being of nickel or chromium, e.g. duplex or triplex layers
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- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/48—After-treatment of electroplated surfaces
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/60—Electroplating characterised by the structure or texture of the layers
- C25D5/605—Surface topography of the layers, e.g. rough, dendritic or nodular layers
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- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D7/00—Electroplating characterised by the article coated
- C25D7/06—Wires; Strips; Foils
- C25D7/0614—Strips or foils
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/09—Use of materials for the conductive, e.g. metallic pattern
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/03—Conductive materials
- H05K2201/0332—Structure of the conductor
- H05K2201/0335—Layered conductors or foils
- H05K2201/0352—Differences between the conductors of different layers of a multilayer
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/03—Conductive materials
- H05K2201/0332—Structure of the conductor
- H05K2201/0335—Layered conductors or foils
- H05K2201/0355—Metal foils
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/07—Treatments involving liquids, e.g. plating, rinsing
- H05K2203/0703—Plating
- H05K2203/0723—Electroplating, e.g. finish plating
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/38—Improvement of the adhesion between the insulating substrate and the metal
- H05K3/382—Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal
- H05K3/384—Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal by plating
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/38—Improvement of the adhesion between the insulating substrate and the metal
- H05K3/388—Improvement of the adhesion between the insulating substrate and the metal by the use of a metallic or inorganic thin film adhesion layer
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/38—Improvement of the adhesion between the insulating substrate and the metal
- H05K3/389—Improvement of the adhesion between the insulating substrate and the metal by the use of a coupling agent, e.g. silane
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/12—All metal or with adjacent metals
- Y10T428/12014—All metal or with adjacent metals having metal particles
- Y10T428/12028—Composite; i.e., plural, adjacent, spatially distinct metal components [e.g., layers, etc.]
- Y10T428/12049—Nonmetal component
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/12—All metal or with adjacent metals
- Y10T428/12014—All metal or with adjacent metals having metal particles
- Y10T428/12028—Composite; i.e., plural, adjacent, spatially distinct metal components [e.g., layers, etc.]
- Y10T428/12063—Nonparticulate metal component
- Y10T428/12069—Plural nonparticulate metal components
- Y10T428/12076—Next to each other
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/12—All metal or with adjacent metals
- Y10T428/12431—Foil or filament smaller than 6 mils
- Y10T428/12438—Composite
Definitions
- the present invention relates to a copper foil for a printed circuit and a copper clad laminate, and in particular, after a roughening treatment is formed on the surface of the copper foil, a heat resistant layer, a weather resistant layer, and a rust preventive layer are formed thereon, and then a silane
- a copper foil for printed circuit that has been subjected to coupling treatment
- the substrate is subjected to acid treatment or chemical etching after the fine pattern printed circuit is formed
- the interface between the copper foil circuit and the substrate resin It is related with the copper foil for printed circuits which can improve the suppression of the adhesive fall by the acid saturation of this, is excellent in acid-proof adhesion strength, and was excellent in alkali etching property.
- the copper foil for printed circuit of the present invention is suitable for, for example, a flexible printed circuit (FPC) and a fine pattern printed circuit.
- Copper and copper alloy foils have greatly contributed to the development of electrical and electronic industries, and are indispensable particularly as printed circuit materials.
- Copper foils for printed circuits are generally laminated and bonded to substrates such as synthetic resin boards and polyimide films via adhesives, or without using adhesives at high temperature and high pressure, or by applying polyimide precursors.
- the necessary circuit is printed through a resist coating and exposure process, and then an etching process is performed to remove unnecessary portions. Is done. Finally, the required elements are soldered to form various printed circuit boards for the electronic device.
- the copper foil for printed circuit boards differs in the surface (roughening surface) and non-bonding surface (gloss surface) adhere
- the requirements for the roughened surface formed on the copper foil are as follows: 1) No oxidation discoloration during storage, 2) High peel strength with substrate, high temperature heating, wet processing, soldering, chemicals It is sufficient even after treatment or the like, and 3) that there is no so-called lamination stain that occurs after lamination with the substrate and etching.
- the roughening treatment of the copper foil plays a major role as determining the adhesiveness between the copper foil and the base material.
- a copper roughening treatment in which electrodeposition of copper was initially employed was adopted, but various techniques were proposed thereafter, and copper-- for the purpose of improving the heat-resistant peel strength, hydrochloric acid resistance and oxidation resistance.
- Nickel roughening is established as one typical processing method.
- the applicant has proposed a copper-nickel roughening treatment (see Patent Document 1) and has achieved results.
- the surface of the copper-nickel treatment is black, and particularly in the rolled foil for flexible substrates, this copper-nickel treatment black has been recognized as a symbol as a product.
- the copper-nickel roughening treatment is excellent in heat-resistant peel strength, oxidation resistance, and hydrochloric acid resistance, it is difficult to perform etching with an alkaline etchant that has recently become important as a fine pattern treatment, and has a pitch of 150 ⁇ m.
- the processing layer becomes an etching residue. Therefore, the applicant has previously developed a Cu—Co treatment (see Patent Documents 2 and 3) and a Cu—Co—Ni treatment (see Patent Document 4) as fine pattern treatments.
- the present applicant forms a cobalt plating layer or a cobalt-nickel alloy plating layer on the surface of the copper foil and then forms a cobalt plating layer or a cobalt-nickel alloy plating layer.
- it has many of the above-mentioned general characteristics, and in particular has the above-mentioned characteristics comparable to the Cu-Ni treatment, and does not decrease the heat-resistant peel strength when an acrylic adhesive is used.
- the present inventors have succeeded in developing a copper foil treatment method having excellent oxidation resistance and a black surface color (see Patent Document 5).
- a cobalt-nickel alloy plating layer is formed on the surface of the copper foil referred to in Patent Document 6 after a roughening process by copper-cobalt-nickel alloy plating.
- the surface etching solution erodes the interface between the copper foil circuit and the substrate resin, and the copper foil circuit and the substrate resin. This causes a problem that an electric circuit failure occurs as an FPC characteristic, and it is required to solve this problem.
- the applicant of the present application disclosed a roughening treatment layer by copper-cobalt-nickel alloy plating on the surface of a copper foil, a cobalt-nickel alloy plating layer formed on the roughening treatment layer, and the cobalt- In the copper foil for printed circuits in which a zinc-nickel alloy plating layer is formed on the nickel alloy plating layer, a technique has been proposed in which the total amount of zinc-nickel alloy plating layer, the amount of nickel, and the ratio of nickel are predetermined.
- Ni can be contained not only in the zinc-nickel alloy layer but also in the roughened layer, heat-resistant layer, and weather-resistant layer.
- Zn can be contained not only in the zinc-nickel alloy layer but also in the weather resistant layer and the rust preventive layer, the total Zn content in all of the weather resistant layer and the rust preventive layer is further compared with the above total Ni content. It turns out that the ratio needs to be considered.
- JP-A-52-145769 Japanese Patent Publication No.63-2158 JP-A-2-292895 JP-A-2-292894 Japanese Patent Publication No. 6-54831 Japanese Patent Publication No. 9-87889 WO2009 / 041292
- the present invention relates to a copper foil for a printed circuit and a copper clad laminate, and in particular, after a roughening treatment is formed on the surface of the copper foil, a heat resistant layer, a weather resistant layer, and a rust preventive layer are formed thereon, and then a silane In copper-clad laminates using copper foil for printed circuit that has been subjected to coupling treatment, when the substrate is subjected to acid treatment or chemical etching after the fine pattern printed circuit is formed, the interface between the copper foil circuit and the substrate resin
- the present invention relates to a copper foil for printed circuit that can improve the suppression of adhesion deterioration due to the “soaking” of acid, has excellent acid-resistant adhesion strength, and has excellent alkali etching properties.
- the miniaturization and high integration of semiconductor devices have further advanced, and the processing performed in the manufacturing process of these printed circuits has become more severe. It is an object of the present invention to provide a technique that meets these requirements.
- the total Ni amount in the surface treatment layer is 450 to 1100 ⁇ g / dm 2 3)
- the copper foil with a surface treatment layer as described in 1) above.
- the total amount of Co in the surface treatment layer is 770 to 2500 ⁇ g / dm 2 and the total Co / (total Zn + total Ni) is 3.0 or less.
- the copper foil with a surface treatment layer as described in 1) or 2) above, wherein 4) the surface treatment Above 1) to 3) copper foil with a surface treatment layer according to any one of the total Cr content in is characterized in that a 50 ⁇ 120 [mu] g / dm 2
- the present application also provides the following invention. 5) The copper foil with a surface-treated layer according to any one of 1) to 4) above, wherein Ni in the roughened layer is 50 to 550 ⁇ g / dm 2 6) The roughened layer The copper foil with a surface-treated layer according to any one of 1) to 5) above, wherein the roughened layer is an average particle. 6. The copper foil with a surface treatment layer according to any one of 1) to 5) above, comprising fine particles of a ternary alloy composed of Cu, Co, and Ni having a diameter of 0.05 to 0.60 ⁇ m.
- the roughening layer comprises a primary particle layer of Cu having an average particle diameter of 0.25 to 0.45 ⁇ m, and Cu, Co, Ni having an average particle diameter of 0.05 to 0.25 ⁇ m formed thereon.
- One of the above 1) to 5 characterized in that it comprises a secondary particle layer comprising a ternary alloy comprising Surface treatment layer with a copper foil described.
- a copper foil for a printed circuit comprising the copper foil with a surface treatment layer according to any one of 1) to 8) above.
- the present invention relates to a copper foil for a printed circuit and a copper foil with a surface treatment layer for a copper clad laminate, and in particular, after a roughening treatment is formed on the surface of the copper foil, a heat resistant layer, a weather resistant layer,
- the copper In copper-clad laminates using copper foil for printed circuits that has been subjected to silane coupling treatment after forming a rust-preventing layer, after forming the fine pattern printed circuit, when the substrate is subjected to acid treatment or chemical etching, the copper
- the present invention relates to a copper foil for printed circuit, which can improve the suppression of adhesion deterioration due to “soaking” of acid at the interface between the foil circuit and the substrate resin, has excellent acid-resistant adhesion strength, and has excellent alkali etching property.
- the present invention is an excellent technique that meets these requirements.
- the main object of the present invention is to prevent circuit erosion that occurs during surface etching in the pretreatment process in the manufacturing process of the FPC multilayer substrate.
- the copper foil with a surface treatment layer of the present invention was formed on a roughened layer formed by subjecting a copper foil or a copper alloy foil to a roughening (treat) treatment, and this roughened layer. It has a heat-resistant layer composed of a Ni—Co layer, and a plurality of surface treatment layers composed of a weather-resistant layer containing Zn, Ni, and Cr and a rust-proof layer formed on the heat-resistant layer.
- the total Zn content / (total Zn content + total Ni content) in the surface treatment layer is set to 0.13 or more and 0.23 or less.
- Zn is a component of a weathering layer and a rust prevention layer in the surface treatment layer of copper foil
- Ni is a component of a roughening treatment layer, a heat-resistant layer, and a weathering layer
- Zn and Ni are the surfaces of the copper foil It is an important component as a constituent component of the treatment layer.
- Zn is a component having an effect on weather resistance, but it is an unfavorable component for chemical resistance characteristics in the fine pattern circuit forming process, and “soaking” easily occurs in etching for circuit formation.
- Ni is an effective component for “soaking”, but if it is too much, the alkaline etching property is lowered and it is not suitable for printed circuit.
- the present invention has found that the balance between Zn and Ni is important. That is, the total Zn amount / (total Zn amount + total Ni amount) in the surface treatment layer is 0.13 or more and 0.23 or less. When the amount is less than 0.13, there are cases where Zn is too little and cases where Ni is too much. In cases where Zn is too little, the weather resistance is deteriorated. Is also not preferable. On the other hand, if it exceeds 0.23, the acid resistance tends to be deteriorated, so that “soaking” tends to occur during etching, which is not preferable.
- the definition of the total Zn amount is “the total amount of Zn contained in the roughened layer, the heat resistant layer, the weather resistant layer, and the rust preventive layer on the copper foil”. Since the layer does not contain Zn, the total amount of Zn contained in the two layers of the weather resistant layer and the rust preventive layer is obtained.
- the definition of the total amount of Ni is “the amount of Ni contained in the roughened layer, the heat resistant layer, the weather resistant layer, and the rust preventive layer on the copper foil”, but the rust preventive layer usually contains Ni. Therefore, the total amount of Ni in the roughened layer, the heat resistant layer, and the weather resistant layer is obtained.
- the “soaking” is shown in FIG. 1, but when the surface is etched using a solution of hydrogen peroxide and sulfuric acid, or the circuit is formed using an etching solution made of a cupric chloride solution, a ferric chloride solution, or the like.
- This refers to a phenomenon in which an etchant penetrates into the interface between a copper foil and a resin when the formation is etched.
- the left side of FIG. 1 is a conceptual diagram showing a state ( ⁇ portion) in which the circuit surfaces of the resin layer and the copper foil with a surface treatment layer are in close contact with each other.
- the right side of FIG. 1 is a conceptual diagram showing a state ( ⁇ portion) in which permeation occurs on both edges of the circuit and adhesion is slightly reduced.
- FIG. 2 after the fine pattern printed circuit was formed, the “soaking” of the acid into the interface between the copper foil circuit and the substrate resin was observed when the substrate was soft-etched (by a solution of hydrogen peroxide and sulfuric acid).
- the figure (photograph) which shows a result is shown.
- the upper figure (photo) shows the case where there is no stain at the edge of the linear circuit, and the lower figure (photo) shows the case where there is “stain”. It can be observed that the edge of the linear circuit is disturbed.
- Ni is a component contained in the roughened layer, heat resistant layer, weather resistant layer, and rust preventive layer of the surface treatment layer as described above, and is an extremely important component in the surface treatment layer of copper foil. And it is a component effective in "sinking" which is a problem to be solved by the present invention. Therefore, in the copper foil with a surface treatment layer of the present invention, the total amount of Ni in the surface treatment layer is preferably 450 to 1100 ⁇ g / dm 2 .
- Ni contained in the roughening treatment layer since it is necessary for Ni contained in the roughening treatment layer to make the surface of the surface-treated copper foil appear black, Ni needs to be contained in an amount of 50 ⁇ g / dm 2 or more. Furthermore, since Ni is also included in the heat-resistant layer and the weather-resistant layer, the total amount of Ni is required to be 450 ⁇ g / dm 2 or more. However, if the total amount of Ni exceeds 1100 ⁇ g / dm 2 , the alkali etching property is deteriorated and rough particles remain on the surface of the substrate resin during circuit etching. Therefore, the amount of Ni is 1100 ⁇ g / dm 2 or less. Is desirable.
- the copper foil with a surface treatment layer of the present invention desirably has a total Co amount in the surface treatment layer of 770 to 2500 ⁇ g / dm 2 .
- the total Co amount / (total Zn amount + total Ni amount) is preferably 3.0 or less. Even if the total Co amount is in the above range, the “penetration” tends to deteriorate when the total Co amount is large relative to the total of the total Zn amount and the total Ni amount as other main components. Because.
- the total Cr amount in the surface treatment layer is preferably 50 to 120 ⁇ g / dm 2 .
- the Cr amount in this range has the effect of suppressing the penetration amount.
- the effective Ni for the roughened layer of the copper foil with a surface-treated layer of the present invention is 50 to 550 ⁇ g / dm 2 .
- a roughened layer made of Co, Cu, or Ni is effective.
- the roughening layer may be an aggregate of fine particles of a ternary alloy composed of Cu, Co, and Ni having an average particle diameter of 0.05 to 0.60 ⁇ m.
- the roughening layer is composed of a primary particle layer of Cu having an average particle size of 0.25 to 0.45 ⁇ m and Cu, Co, and Ni having an average particle size of 0.05 to 0.25 ⁇ m formed thereon. It can be set as the secondary particle layer which consists of a ternary system alloy.
- the conditions for forming the roughened layer, the heat-resistant layer made of the Ni—Co layer, the weather-resistant layer containing Zn, Ni, and Cr and the rust-preventing layer can be formed using the following conditions for electrolytic plating.
- metal layer plating may be performed between the copper foil and the primary particles before forming the primary particles.
- a copper plating layer and a copper alloy plating layer are typically considered.
- the copper plating layer when using only copper sulfate and an aqueous copper sulfate solution mainly composed of sulfuric acid, sulfuric acid, an organic sulfur compound having a mercapto group, a surfactant such as polyethylene glycol, and a chloride ion The method of forming a copper plating layer by electroplating using the copper sulfate aqueous solution which combined these.
- Liquid composition Co 1 to 20 g / liter, Ni 1 to 20 g / liter pH: 1 to 4 Temperature: 30-60 ° C Current density (D k ): 1 to 20 A / dm 2 Time: 1-5 seconds
- Liquid composition Ni 1-30 g / liter, Zn 1-30 g / liter pH: 2-5 Temperature: 30-50 ° C Current density (D k ): 1 to 3 A / dm 2 Time: 1-5 seconds
- Liquid composition K 2 Cr 2 O 7 : 1 to 10 g / liter, Zn: 0 to 10 g / liter pH: 2 to 5 Temperature: 30-50 ° C Current density (D k ): 0.01 to 5 A / dm 2 Time: 1-5 seconds
- the immersion chromate treatment can be performed at a plating current density of 0 A / dm 2 .
- silane coupling treatment A silane coupling treatment for applying a silane coupling agent to at least the roughened surface on the anticorrosive layer is performed.
- the silane coupling agent include olefin silanes, epoxy silanes, acrylic silanes, amino silanes, and mercapto silanes, which can be appropriately selected and used.
- the application method may be any of spraying a silane coupling agent solution, coating with a coater, dipping, pouring and the like. Since these are already known techniques (see, for example, Japanese Patent Publication No. 60-15654), details are omitted.
- a primary particle layer of Cu having an average particle diameter of 0.25 to 0.45 ⁇ m and Cu, Co, and Ni having an average particle diameter of 0.05 to 0.25 ⁇ m formed thereon are formed.
- a secondary particle layer made of a ternary alloy was formed.
- the roughened particle size was evaluated by observing the roughened particles of the copper foil with surface treatment at a magnification of 30000 times with an electron microscope (SEM).
- SEM electron microscope
- the amount of Ni deposited at the roughening treatment stage was 50 to 250 ⁇ g / dm 2 . The results are shown in Table 1 below.
- Example 1 The heat-resistant layer composed of the Ni—Co layer, the weather-resistant layer containing Zn, Ni, and Cr, the rust-preventing layer, and the silane coupling treatment were performed within the range of the above conditions.
- the conditions for forming the heat-resistant layer, weather-resistant layer and rust-proof layer are shown below.
- a polyamic acid (U varnish A manufactured by Ube Industries) was applied onto the surface-treated copper foil produced as described above, dried at 100 ° C. and cured at 315 ° C. to form a copper-clad laminate composed of a polyimide resin substrate.
- a fine pattern circuit was formed on this copper clad laminate with a general copper chloride-hydrochloric acid etching solution.
- the fine pattern circuit board was immersed in an aqueous solution of 10 wt% sulfuric acid and 2 wt% hydrogen peroxide for 5 minutes, and then the interface between the resin substrate and the copper foil circuit was observed with an optical microscope to evaluate the penetration. As a result of the soaking evaluation, the soaking width was good at ⁇ 5 ⁇ m.
- Example 2 The amount of Ni deposited at the roughening stage was 50 to 250 ⁇ g / dm 2 as described above.
- the heat-resistant layer composed of the Ni—Co layer, the weather-resistant layer containing Zn, Ni, and Cr, the rust-preventing layer, and the silane coupling treatment were performed within the range of the above conditions. The conditions for forming the heat-resistant layer, weather-resistant layer and rust-proof layer are shown below.
- Example 3 The amount of Ni deposited at the roughening stage was 50 to 250 ⁇ g / dm 2 as described above.
- the heat-resistant layer composed of the Ni—Co layer, the weather-resistant layer containing Zn, Ni, and Cr, the rust-preventing layer, and the silane coupling treatment were performed within the range of the above conditions. The conditions for forming the heat-resistant layer, weather-resistant layer and rust-proof layer are shown below.
- the normal peel strength was 0.90 kg / cm
- the hydrochloric acid degradation resistance was 25 (Loss%). Residual particles were not observed and the alkali etching property was good ( ⁇ ).
- the results are shown in Table 1.
- the total Cr deposition was 89 ⁇ g / dm 2
- the total Co deposition was 1771 ⁇ g / dm 2
- the total Zn deposition was 158 ⁇ g / dm 2 .
- Example 4 The amount of Ni deposited at the roughening stage was 50 to 250 ⁇ g / dm 2 as described above.
- the heat-resistant layer composed of the Ni—Co layer, the weather-resistant layer containing Zn, Ni, and Cr, the rust-preventing layer, and the silane coupling treatment were performed within the range of the above conditions.
- the conditions for forming the heat-resistant layer, weather-resistant layer and rust-proof layer are shown below.
- the normal peel strength was 0.90 kg / cm
- the hydrochloric acid degradation resistance was 22 (Loss%)
- Alkali etching property was also good ( ⁇ ).
- Table 1 the total Cr deposition amount was 90 ⁇ g / dm 2
- the total Co deposition amount was 1772 ⁇ g / dm 2
- the total Zn deposition amount was 223 ⁇ g / dm 2 .
- Example 5 The amount of Ni deposited at the roughening stage was 50 to 250 ⁇ g / dm 2 as described above.
- the heat-resistant layer composed of the Ni—Co layer, the weather-resistant layer containing Zn, Ni, and Cr, the rust-preventing layer, and the silane coupling treatment were performed within the range of the above conditions. The conditions for forming the heat-resistant layer, weather-resistant layer and rust-proof layer are shown below.
- Example 6 Roughening treatment was performed on the rolled copper foil of 18 ⁇ m under the conditions shown below.
- Liquid composition Cu 10-20 g / liter, Co 5-10 g / liter, Ni 5-15 g / liter pH: 2-4 Temperature: 30-50 ° C Current density (D k ): 20 to 60 A / dm 2 Time: 0.5-5 seconds
- an aggregate of finely roughened particles of a ternary alloy composed of Cu, Co, and Ni having an average particle diameter of 0.10 to 0.60 ⁇ m was formed.
- the roughened particle size was evaluated by observing the roughened particles of the copper foil with surface treatment at a magnification of 30000 times with an electron microscope (SEM).
- SEM electron microscope
- the amount of Ni deposited in the roughening stage was 200 to 400 ⁇ g / dm 2 .
- the heat-resistant layer composed of the Ni—Co layer, the weather-resistant layer containing Zn, Ni, and Cr, the rust-preventing layer, and the silane coupling treatment were performed within the range of the above conditions.
- the conditions for forming the heat-resistant layer, weather-resistant layer and rust-proof layer are shown below.
- the normal peel strength was 0.88 kg / cm
- hydrochloric acid deterioration resistance ⁇ 10 (Loss%) or less, which was very good.
- Alkali etching property was also good ( ⁇ ).
- Table 1 The results are shown in Table 1.
- the total Cr deposition amount was 110 ⁇ g / dm 2
- the total Co deposition amount was 2480 ⁇ g / dm 2
- the total Zn deposition amount was 240 ⁇ g / dm 2 .
- Example 7 A roughening treatment was performed on 18 ⁇ m rolled copper foil under the following conditions.
- Liquid composition Cu 10-20 g / liter, Co 5-10 g / liter, Ni 8-20 g / liter pH: 2-4 Temperature: 30-50 ° C Current density (D k ): 20 to 60 A / dm 2 Time: 0.5-5 seconds
- an aggregate of finely roughened particles of a ternary alloy composed of Cu, Co, and Ni having an average particle diameter of 0.05 to 0.35 ⁇ m was formed.
- the roughened particle size was evaluated by observing the roughened particles of the copper foil with surface treatment at a magnification of 30000 times with an electron microscope (SEM).
- SEM electron microscope
- the amount of Ni deposited in the roughening stage was 300 to 550 ⁇ g / dm 2 .
- the heat-resistant layer composed of the Ni—Co layer, the weather-resistant layer containing Zn, Ni, and Cr, the rust-preventing layer, and the silane coupling treatment were performed within the range of the above conditions.
- the conditions for forming the heat-resistant layer, weather-resistant layer and rust-proof layer are shown below.
- Example 1 A roughened layer was formed on 18 ⁇ m rolled copper foil under the same conditions as in Example 1-5.
- the amount of Ni deposited in the roughening stage was 50 to 250 ⁇ g / dm 2 .
- the heat-resistant layer composed of the Ni—Co layer, the weather-resistant layer containing Zn, Ni, and Cr, the rust-preventing layer, and the silane coupling treatment were performed within the range of the above conditions.
- the conditions for forming the heat-resistant layer, weather-resistant layer and rust-proof layer are shown below.
- the normal peel strength was 0.89 kg / cm and the hydrochloric acid degradation resistance was ⁇ 10 (Loss%) or less, which was good. Residual particles were also observed in the alkali etching property, which was poor (x). Moreover, comprehensive evaluation was unsatisfactory. This is thought to be due to the fact that the total amount of deposited Ni is too large and the Zn ratio is small.
- Table 1 the total Cr deposition was 81 ⁇ g / dm 2
- the total Co deposition was 2188 ⁇ g / dm 2
- the total Zn deposition was 82 ⁇ g / dm 2 .
- Example 2 A roughened layer was formed on 18 ⁇ m rolled copper foil under the same conditions as in Example 1-5.
- the amount of Ni deposited in the roughening stage was 50 to 250 ⁇ g / dm 2 .
- the heat-resistant layer composed of the Ni—Co layer, the weather-resistant layer containing Zn, Ni, and Cr, the rust-preventing layer, and the silane coupling treatment were performed within the range of the above conditions. The conditions for forming the heat-resistant layer, weather-resistant layer and rust-proof layer are shown below.
- Example 3 A roughened layer was formed on 18 ⁇ m rolled copper foil under the same conditions as in Example 1-5.
- the amount of Ni deposited in the roughening stage was 50 to 250 ⁇ g / dm 2 .
- the heat-resistant layer composed of the Ni—Co layer, the weather-resistant layer containing Zn, Ni, and Cr, the rust-preventing layer, and the silane coupling treatment were performed within the range of the above conditions. The conditions for forming the heat-resistant layer, weather-resistant layer and rust-proof layer are shown below.
- the normal peel strength was as good as 0.88 kg / cm, but the hydrochloric acid degradation resistance was 35 (Loss%), which was poor. Residual particles were also observed in the alkali etching property, which was poor (x).
- the overall evaluation was poor. This is thought to be due to the fact that the total amount of deposited Ni is small and the Zn ratio is large.
- the results are shown in Table 1.
- the total Cr deposition amount was 82 ⁇ g / dm 2
- the total Co deposition amount was 1204 ⁇ g / dm 2
- the total Zn deposition amount was 101 ⁇ g / dm 2 .
- Example 4 A roughened layer was formed on 18 ⁇ m rolled copper foil under the same conditions as in Example 1-5.
- the amount of Ni deposited in the roughening stage was 50 to 250 ⁇ g / dm 2 .
- the heat-resistant layer composed of the Ni—Co layer, the weather-resistant layer containing Zn, Ni, and Cr, the rust-preventing layer, and the silane coupling treatment were performed within the range of the conditions shown above. The conditions for forming the heat-resistant layer, weather-resistant layer and rust-proof layer are shown below.
- the normal peel strength was as good as 0.90 kg / cm, but the hydrochloric acid resistance against deterioration was 40 (Loss%), which was poor.
- the alkali etching property was good ( ⁇ ).
- the overall evaluation was poor. This is considered to be caused by a large Zn ratio.
- Table 1 the total Cr deposition amount was 122 ⁇ g / dm 2 , the total Co deposition amount was 1543 ⁇ g / dm 2 , and the total Zn deposition amount was 361 ⁇ g / dm 2 .
- Example 5 A roughening treatment layer was formed on 18 ⁇ m rolled copper foil under the same conditions as in Example 6. By performing the roughening treatment under the above conditions, an aggregate of finely roughened particles of a ternary alloy composed of Cu, Co, and Ni having an average particle diameter of 0.10 to 0.60 ⁇ m was formed. The amount of Ni deposited in the roughening stage was 200 to 400 ⁇ g / dm 2 .
- the heat-resistant layer composed of the Ni—Co layer, the weather-resistant layer containing Zn, Ni, and Cr, the rust-preventing layer, and the silane coupling treatment were performed within the range of the above conditions. The conditions for forming the heat-resistant layer, weather-resistant layer and rust-proof layer are shown below.
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Abstract
Description
本発明の印刷回路用銅箔は、例えばフレキシブルプリント配線版( Flexible Printed Circuit、以下FPC )及びファインパターン印刷回路に適する。
最終的に、所要の素子が半田付けされて、エレクトロニクスデバイス用の種々の印刷回路板を形成する。印刷回路板用銅箔は、樹脂基材と接着される面(粗化面)と非接着面(光沢面)とで異なるが、それぞれ多くの方法が提唱されている。
銅箔の粗化処理は、銅箔と基材との接着性を決定するものとして、大きな役割を担っている。この粗化処理としては、当初銅を電着する銅粗化処理が採用されていたが、その後、様々な技術が提唱され、耐熱剥離強度、耐塩酸性及び耐酸化性の改善を目的として銅-ニッケル粗化処理が一つの代表的処理方法として定着するようになっている。
そこで、ファインパターン用処理として、本件出願人は、先にCu-Co処理(特許文献2及び特許文献3参照)及びCu-Co-Ni処理(特許文献4参照)を開発した。
さらにZnは亜鉛-ニッケル合金層だけでなく、耐候層、防錆層全てに含有させることが可能であるため、耐候層、防錆層全ての全Zn量について、さらには上記全Ni量との比率について検討する必要があることが分かった。
電子機器の発展が進む中で、半導体デバイスの小型化、高集積化が更に進み、これらの印刷回路の製造工程で行われる処理が一段と厳しい要求がなされている。本願発明をこれらの要求にこたえる技術を提供することを課題とする。
1)銅箔または銅合金箔の上に、粗化(トリート)処理を施すことにより形成された粗化処理層、この粗化処理層の上に形成されたNi-Co層からなる耐熱層、及びこの耐熱層の上に形成されたZn、Ni、Crを含有する耐候層及び防錆層からなる複数の表面処理層を有し、前記表面処理層中の全Zn量/(全Zn量+全Ni量)が0.13以上0.23以下であることを特徴とする表面処理層付銅箔
2)前記表面処理層中の全Ni量が、450~1100μg/dm2であることを特徴とする上記1)に記載の表面処理層付銅箔
3)前記表面処理層中の全Co量が770~2500μg/dm2であり、全Co/(全Zn+全Ni)が3.0以下であることを特徴とする上記1)又は2)に記載の表面処理層付銅箔
4)前記表面処理層中の全Cr量が50~120μg/dm2であることを特徴とする上記1)~3)のいずれか一項に記載の表面処理層付銅箔
5)前記粗化処理層のNiが50~550μg/dm2であることを特徴とする上記1)~4)のいずれか一項に記載の表面処理層付銅箔
6)前記粗化処理層が、Co、Cu、Niの元素からなる粗化処理層であることを特徴とする上記1)~5)のいずれかに記載の表面処理層付銅箔
7)前記粗化処理層が平均粒子径0.05~0.60μmのCu、Co、Niからなる3元系合金の微細粒子からなることを特徴とする上記1)~5)のいずれか一項に記載の表面処理層付銅箔
8)前記粗化処理層が、平均粒子径0.25~0.45μmのCuの一次粒子層と、その上に形成された平均粒子径が0.05~0.25μmのCu、Co、Niからなる3元系合金からなる二次粒子層からなることを特徴とする上記1)~5)のいずれかに一項に記載の表面処理層付銅箔。
10)上記9)記載の印刷回路用銅箔を樹脂基板に積層接着した銅張積層板。
電子機器の発展が進む中で、半導体デバイスの小型化、高集積化が更に進み、これらの印刷回路の製造工程で行われる処理が一段と厳しい要求がなされている。本願発明をこれらの要求にこたえる優れた技術である。
本願発明の表面処理層付銅箔は、銅箔または銅合金箔の上に、粗化(トリート)処理を施すことにより形成された粗化処理層、この粗化処理層の上に形成されたNi-Co層からなる耐熱層、及びこの耐熱層の上に形成されたZn、Ni、Crを含有する耐候層及び防錆層からなる複数の表面処理層を有する。そして、前記表面処理層中の全Zn量/(全Zn量+全Ni量)が0.13以上0.23以下とする。
Znは、銅箔の表面処理層の中で耐候層、防錆層の構成成分であり、Niは粗化処理層、耐熱層、耐候層の構成成分であり、ZnとNiは銅箔の表面処理層の構成成分としては重要な成分である。
しかしながら、Znは耐候性に効果のある成分であるが、ファインパターン回路形成工程での耐薬品特性には好ましくない成分であり、回路形成のエッチングにおいて「染込み」が起こり易くなる。
一方、Niは「染込み」には効果のある成分であるが、多すぎるとアルカリエッチング性を低下させ、印刷回路用としては不適となる。
0.13未満の場合には、Znが少な過ぎるケースとNiが多過ぎるケースがあり、Znが少な過ぎるケースでは耐候性が悪くなり、Niが多過ぎるケースではエッチング性が問題となり、いずれのケースも好ましくない。一方、0.23を越える場合は耐酸性が悪化し易くなるので、エッチング時に「染込み」が起こり易くなり、好ましくない。
従って、本願発明の表面処理層付銅箔は、前記表面処理層中の全Ni量は、450~1100μg/dm2とすることが望ましい。
さらにNiは、耐熱層、耐候層にも含まれるため、全Ni量として450μg/dm2以上が必要である。但し、全Ni量が1100μg/dm2を超えると、アルカリエッチング性の低下や、回路エッチングの際に粗化粒子が基板樹脂表面に残存する問題が発生するので、Ni量は1100μg/dm2以下が望ましいと言える。
また、前記粗化処理層については、Co、Cu、Niの元素からなる粗化処理層が有効である。前記粗化処理層を、平均粒子径0.05~0.60μmの、Cu、Co、Niからなる3元系合金の微細粒子の集合体とすることもできる。
前記粗化処理層については、平均粒子径0.25~0.45μmのCuの一次粒子層と、その上に形成された平均粒子径が0.05~0.25μmのCu、Co、Niからなる3元系合金からなる二次粒子層とすることができる。
平均粒子径0.05~0.60μmのCu、Co、Niからなる3元系合金の微細粗化粒子集合体の粗化処理を施す場合
液組成:Cu10~20g/リットル、Co1~10g/リットル、Ni1~15g/リットル
pH:1~4
温度:30~50℃
電流密度(Dk):20~50A/dm2
時間:1~5秒
液組成:Cu10~20g/リットル、硫酸50~100g/リットル
pH:1~3
温度:25~50℃
電流密度(Dk):1~60A/dm2
時間:1~5秒
液組成:Cu10~20g/リットル、Co1~15g/リットル、Ni1~15g/リットル
pH:1~3
温度:30~50℃
電流密度(Dk):10~50A/dm2
時間:1~5秒
液組成:Co1~20g/リットル、Ni1~20g/リットル
pH:1~4
温度:30~60℃
電流密度(Dk):1~20A/dm2
時間:1~5秒
液組成:Ni1~30g/リットル、Zn1~30g/リットル
pH:2~5
温度:30~50℃
電流密度(Dk):1~3A/dm2
時間:1~5秒
液組成:K2Cr2O7:1~10g/リットル、Zn:0~10g/リットル
pH:2~5
温度:30~50℃
電流密度(Dk):0.01~5A/dm2
時間:1~5秒
防錆層上の少なくとも粗化面にシランカップリング剤を塗布するシランカップリング処理が施される。
このシランカップリング剤としては、オレフィン系シラン、エポキシ系シラン、アクリル系シラン、アミノ系シラン、メルカプト系シランを挙げることができるが、これらを適宜選択して使用することができる。
塗布方法はシランカップリング剤溶液のスプレーふきつけ、コーター塗布、浸漬、流しかけ等いずれでも良い。これらについては、既に公知の技術なので(例えば、特公昭60-15654号参照)、詳細は省略する。
実施例(及び比較例)については18μmの圧延銅箔を使用したが、本願発明に関しては銅箔の厚みは公知の銅箔の厚み全てに適用可能であることは容易に理解できるであろう。
18μmの圧延銅箔に下記に示す条件で粗化処理を施した。
(A)Cuの一次粒子層形成
液組成:Cu15g/リットル、硫酸75g/リットル
pH:1~3
温度:35℃
電流密度(Dk):40~60A/dm2
時間:0.05~3秒
液組成:Cu15g/リットル、Co8g/リットル、Ni8g/リットル
pH:1~3
温度:40℃
電流密度(Dk):20~40A/dm2
時間:0.05~3秒
粗化粒子サイズは表面処理付銅箔の粗化粒子を電子顕微鏡(SEM)の30000倍の倍率で観察を行い、粗化粒子サイズを評価した。
粗化処理段階のNi付着量は50~250μg/dm2であった。この結果を、下記表1に示す。
Ni-Co層からなる耐熱層、Zn、Ni、Crを含有する耐候層及び防錆層およびシランカップリング処理は、上記に示す条件の範囲で実施した。耐熱層、耐候層及び防錆層を形成する条件を下記に示す。
1)耐熱層(Ni-Co層)
電流密度(Dk):5~15A/dm2
時間:0.05~3.0秒
2)耐候層(Zn-Ni層)
電流密度(Dk):0.5~1.5A/dm2
時間:0.05~3.0秒
3)防錆層(Cr-Zn層)
電流密度(Dk):1~3A/dm2
時間:0.05~3.0秒
粗化処理層、耐熱層全てにおけるCo付着量から、Co/(Ni+Zn)=1.6であった。
次に、この銅張積層板を一般的な塩化銅-塩酸エッチング溶液によりファインパターン回路を形成した。このファインパターン回路基板を硫酸10wt%、過酸化水素2wt%からなる水溶液に5分間浸漬させた後、樹脂基板と銅箔回路の界面を光学顕微鏡にて観察して、染込み評価をおこなった。
染込み評価の結果、染みこみ幅:≦5μmで良好であった。
常態ピール強度は0.90kg/cm、耐塩酸劣化性は10(Loss%)以下であり、ともに良好であった。
アルカリエッチング評価の結果、粗化粒子の残存は観察されず、アルカリエッチング性も良好(○)であった。
なお、上記の各金属付着量の測定は、表面処理付銅箔の表面処理面を酸溶液に溶解させて、原子吸光分析(VARIAN製、AA240FS)にて評価を行ったものである。
粗化段階のNi付着量は、上記の通り50~250μg/dm2であった。
Ni-Co層からなる耐熱層、Zn、Ni、Crを含有する耐候層及び防錆層およびシランカップリング処理は、上記に示す条件の範囲で実施した。耐熱層、耐候層及び防錆層を形成する条件を下記に示す。
電流密度(Dk):5~9A/dm2
時間:0.05~3.0秒
2)耐候層(Zn-Ni層)
電流密度(Dk):0.05~0.7A/dm2
時間:0.05~3.0秒
3)防錆層(Cr-Zn層)
電流密度(Dk):1~3A/dm2
時間:0.05~3.0秒
以上の結果を表1に示す。この他、Cr付着量は全体で84μg/dm2、Co付着量は全体で1494μg/dm2、Zn付着量は全体で100μg/dm2であった。
粗化段階のNi付着量は、上記の通り50~250μg/dm2であった。
Ni-Co層からなる耐熱層、Zn、Ni、Crを含有する耐候層及び防錆層およびシランカップリング処理は、上記に示す条件の範囲で実施した。耐熱層、耐候層及び防錆層を形成する条件を下記に示す。
電流密度(Dk):6~11A/dm2
時間:0.05~3.0秒
2)耐候層(Zn-Ni層)
電流密度(Dk):0.05~0.7A/dm2
時間:0.05~3.0秒
3)防錆層(Cr-Zn層)
電流密度(Dk):2~4A/dm2
時間:0.05~3.0秒
以上の結果を表1に示す。この他、Cr付着量は全体で89μg/dm2、Co付着量は全体で1771μg/dm2、Zn付着量は全体で158μg/dm2であった。
粗化段階のNi付着量は、上記の通り50~250μg/dm2であった。
Ni-Co層からなる耐熱層、Zn、Ni、Crを含有する耐候層及び防錆層およびシランカップリング処理は、上記に示す条件の範囲で実施した。耐熱層、耐候層及び防錆層を形成する条件を下記に示す。
電流密度(Dk):6~11A/dm2
時間:0.05~3.0秒
2)耐候層(Zn-Ni層)
電流密度(Dk):1~3A/dm2
時間:0.05~3.0秒
3)防錆層(Cr-Zn層)
電流密度(Dk):0.05~1.0A/dm2
時間:0.05~3.0秒
以上の結果を表1に示す。この他、Cr付着量は全体で90μg/dm2、Co付着量は全体で1772μg/dm2、Zn付着量は全体で223μg/dm2であった。
粗化段階のNi付着量は、上記の通り50~250μg/dm2であった。
Ni-Co層からなる耐熱層、Zn、Ni、Crを含有する耐候層及び防錆層およびシランカップリング処理は、上記に示す条件の範囲で実施した。耐熱層、耐候層及び防錆層を形成する条件を下記に示す。
電流密度(Dk):7~12A/dm2
時間:0.05~3.0秒
2)耐候層(Zn-Ni層)
電流密度(Dk):0.6~1.5A/dm2
時間:0.05~3.0秒
3)防錆層(Cr-Zn層)
電流密度(Dk):1.0~3.0A/dm2
時間:0.05~3.0秒
以上の結果を表1に示す。この他、Cr付着量は全体で115μg/dm2、Co付着量は全体で1855μg/dm2、Zn付着量は全体で234μg/dm2であった。
18μmの圧延銅箔に、下記に示す条件で粗化処理を施した。
液組成:Cu10~20g/リットル、Co5~10g/リットル、Ni5~15g/リットル
pH:2~4
温度:30~50℃
電流密度(Dk):20~60A/dm2
時間:0.5~5秒
粗化段階のNi付着量は200~400μg/dm2であった。
1)耐熱層(Ni-Co層)
電流密度(Dk):8~16A/dm2
時間:0.05~3.0秒
2)耐候層(Zn-Ni層)
電流密度(Dk):2.0~4.0A/dm2
時間:0.05~3.0秒
3)防錆層(Cr-Zn層)
電流密度(Dk):0A/dm2
時間:0秒(浸漬クロメート処理)
以上の結果を、表1に示す。この他、Cr付着量は全体で110μg/dm2、Co付着量は全体で2480μg/dm2、Zn付着量は全体で240μg/dm2であった。
18μmの圧延銅箔に下記に示す条件で粗化処理を施した。
液組成:Cu10~20g/リットル、Co5~10g/リットル、Ni8~20g/リットル
pH:2~4
温度:30~50℃
電流密度(Dk):20~60A/dm2
時間:0.5~5秒
粗化段階のNi付着量は300~550μg/dm2であった。
1)耐熱層(Ni-Co層)
電流密度(Dk):8~16A/dm2
時間:0.05~3.0秒
2)耐候層(Zn-Ni層)
電流密度(Dk):1.5~3.5A/dm2
時間:0.05~3.0秒
3)防錆層(Cr-Zn層)
電流密度(Dk):0A/dm2
時間:0秒(浸漬クロメート処理)
以上の結果を、表1に示す。この他、Cr付着量は全体で55μg/dm2、Co付着量は全体で2170μg/dm2、Zn付着量は全体で217μg/dm2であった。
18μmの圧延銅箔に実施例1-5と同様の条件で粗化処理層を形成した。粗化段階のNi付着量は50~250μg/dm2であった。
Ni-Co層からなる耐熱層、Zn、Ni、Crを含有する耐候層及び防錆層およびシランカップリング処理は、上記に示す条件の範囲で実施した。耐熱層、耐候層及び防錆層を形成する条件を下記に示す。
電流密度(Dk):5~15A/dm2
時間:0.05~3.0秒
2)耐候層(Zn-Ni層)
電流密度(Dk):0.05~0.7A/dm2
時間:0.05~3.0秒
3)防錆層(Cr-Zn層)
電流密度(Dk):0.5~1.5A/dm2
時間:0.05~3.0秒
以上の結果を、表1に示す。この他、Cr付着量は全体で81μg/dm2、Co付着量は全体で2188μg/dm2、Zn付着量は全体で82μg/dm2であった。
18μmの圧延銅箔に実施例1-5と同様の条件で粗化処理層を形成した。粗化段階のNi付着量は50~250μg/dm2であった。
Ni-Co層からなる耐熱層、Zn、Ni、Crを含有する耐候層及び防錆層およびシランカップリング処理は、上記に示す条件の範囲で実施した。耐熱層、耐候層及び防錆層を形成する条件を下記に示す。
電流密度(Dk):5~15A/dm2
時間:0.05~3.0秒
2)耐候層(Zn-Ni層)
電流密度(Dk):0.1~1.0A/dm2
時間:0.05~3.0秒
3)防錆層(Cr-Zn層)
電流密度(Dk):0.5~1.5A/dm2
時間:0.05~3.0秒
以上の結果を、表1に示す。この他、Cr付着量は全体で84μg/dm2、Co付着量は全体で2113μg/dm2、Zn付着量は全体で134μg/dm2であった。
18μmの圧延銅箔に実施例1-5と同様の条件で粗化処理層を形成した。粗化段階のNi付着量は50~250μg/dm2であった。
Ni-Co層からなる耐熱層、Zn、Ni、Crを含有する耐候層及び防錆層およびシランカップリング処理は、上記に示す条件の範囲で実施した。耐熱層、耐候層及び防錆層を形成する条件を下記に示す。
電流密度(Dk):3.0~7.0A/dm2
時間:0.05~3.0秒
2)耐候層(Zn-Ni層)
電流密度(Dk):0.05~0.7A/dm2
時間:0.05~3.0秒
3)防錆層(Cr-Zn層)
電流密度(Dk):0.5~1.5A/dm2
時間:0.05~3.0秒
以上の結果を、表1に示す。この他、Cr付着量は全体で82μg/dm2、Co付着量は全体で1204μg/dm2、Zn付着量は全体で101μg/dm2であった。
18μmの圧延銅箔に実施例1-5と同様の条件で粗化処理層を形成した。粗化段階のNi付着量は50~250μg/dm2であった。
Ni-Co層からなる耐熱層、Zn、Ni、Crを含有する耐候層及び防錆層およびシランカップリング処理は、上記に示す条件の範囲で実施した。耐熱層、耐候層及び防錆層を形成する条件を下記に示す。
電流密度(Dk):5.0~10A/dm2
時間:0.05~3.0秒
2)耐候層(Zn-Ni層)
電流密度(Dk):0.7~2.0A/dm2
時間:0.05~3.0秒
3)防錆層(Cr-Zn層)
電流密度(Dk):0.8~2.5A/dm2
時間:0.05~3.0秒
以上の結果を、表1に示す。この他、Cr付着量は全体で122μg/dm2、Co付着量は全体で1543μg/dm2、Zn付着量は全体で361μg/dm2であった。
18μmの圧延銅箔に実施例6と同様の条件で粗化処理層を形成した。上記の条件で粗化処理を施すことで、平均粒子径0.10~0.60μmからなるCu、Co、Niからなる3元系合金の微細粗化粒子の集合体を形成した。
粗化段階のNi付着量は200~400μg/dm2であった。
Ni-Co層からなる耐熱層、Zn、Ni、Crを含有する耐候層及び防錆層およびシランカップリング処理は、上記に示す条件の範囲で実施した。耐熱層、耐候層及び防錆層を形成する条件を下記に示す。
電流密度(Dk):10~30A/dm2
時間:0.05~3.0秒
2)耐候層(Zn-Ni層)
電流密度(Dk):1.0~3.0A/dm2
時間:0.05~3.0秒
3)防錆層(Cr-Zn層)
電流密度(Dk):0A/dm2
時間:0秒(浸漬クロメート処理)
以上の結果を、表1に示す。この他、Cr付着量は全体で90μg/dm2、Co付着量は全体で2987μg/dm2、Zn付着量は全体で119μg/dm2であった。
Claims (10)
- 銅箔または銅合金箔の上に、粗化(トリート)処理を施すことにより形成された粗化処理層、この粗化処理層の上に形成されたNi-Co層からなる耐熱層、及びこの耐熱層の上に形成されたZn、Ni、Crを含有する耐候層及び防錆層からなる複数の表面処理層を有し、前記表面処理層中の全Zn/(全Zn+全Ni)が0.13以上0.23以下であることを特徴とする表面処理層付銅箔。
- 前記表面処理層中の全Ni量が、450~1100μg/dm2であることを特徴とする請求項1に記載の表面処理層付銅箔。
- 前記表面処理層中の全Co量が770~2500μg/dm2であり、全Co/(全Zn+全Ni)が3.0以下であることを特徴とする請求項1又は2に記載の表面処理層付銅箔。
- 前記表面処理層中の全Cr量が50~130μg/dm2であることを特徴とする請求項1~3のいずれか一項に記載の表面処理層付銅箔。
- 前記粗化処理層のNiが50~550μg/dm2であることを特徴とする請求項1~4のいずれか一項に記載の表面処理層付銅箔。
- 前記粗化処理層が、Co、Cu、Niの元素からなる粗化処理層であることを特徴とする請求項1~5のいずれかに記載の表面処理層付銅箔。
- 前記粗化処理層が平均粒子径0.05~0.60μmのCu、Co、Niからなる3元系合金の微細粒子からなることを特徴とする請求項1~5のいずれか一項に記載の表面処理層付銅箔。
- 前記粗化処理層が、平均粒子径0.25~0.45μmのCuの一次粒子層と、その上に形成された平均粒子径が0.05~0.25μmのCu、Co、Niからなる3元系合金からなる二次粒子層からなることを特徴とする請求項1~5のいずれか一項に記載の表面処理層付銅箔。
- 上記請求項1~8のいずれか一項に記載の表面処理層付銅箔からなる印刷回路用銅箔。
- 上記請求項9記載の印刷回路用銅箔を樹脂基板に積層接着した銅張積層板。
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020157027804A KR101999422B1 (ko) | 2011-03-30 | 2012-02-10 | 인쇄 회로용 동박 |
| JP2013507242A JP5676749B2 (ja) | 2011-03-30 | 2012-02-10 | 印刷回路用銅箔 |
| CN201280015481.2A CN103443335B (zh) | 2011-03-30 | 2012-02-10 | 印刷电路用铜箔 |
| US14/006,140 US20140057123A1 (en) | 2011-03-30 | 2012-02-10 | Copper foil for printed circuit |
| PH1/2013/501975A PH12013501975A1 (en) | 2011-03-30 | 2012-02-10 | Copper foil for printed circuit |
| KR1020137024410A KR20130121985A (ko) | 2011-03-30 | 2012-02-10 | 인쇄 회로용 동박 |
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| PCT/JP2012/053107 Ceased WO2012132577A1 (ja) | 2011-03-30 | 2012-02-10 | 印刷回路用銅箔 |
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| Country | Link |
|---|---|
| US (1) | US20140057123A1 (ja) |
| JP (2) | JP5676749B2 (ja) |
| KR (2) | KR101999422B1 (ja) |
| CN (1) | CN103443335B (ja) |
| MY (1) | MY165091A (ja) |
| PH (1) | PH12013501975A1 (ja) |
| TW (1) | TWI486491B (ja) |
| WO (1) | WO2012132577A1 (ja) |
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| CN103009713A (zh) * | 2012-11-28 | 2013-04-03 | 梅州市志浩电子科技有限公司 | 一种采用聚甲基丙烯酸甲酯为介质的热压合覆铜板、印刷电路板及其制作方法 |
| CN103501580A (zh) * | 2013-10-09 | 2014-01-08 | 北京科技大学 | 一种表面处理铜箔及其制备方法 |
| WO2014051123A1 (ja) * | 2012-09-28 | 2014-04-03 | Jx日鉱日石金属株式会社 | キャリア付銅箔及びキャリア付き銅箔を用いた銅張積層板 |
| KR20150021474A (ko) * | 2013-08-20 | 2015-03-02 | 제이엑스 닛코 닛세키 킨조쿠 가부시키가이샤 | 표면 처리 동박 및 그것을 사용한 적층판, 프린트 배선판, 전자 기기, 그리고 프린트 배선판의 제조 방법 |
| JP7434656B1 (ja) | 2023-08-31 | 2024-02-20 | Jx金属株式会社 | 表面処理銅箔、銅張積層板、及びプリント配線板の製造方法 |
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| MY161040A (en) | 2010-05-07 | 2017-04-14 | Jx Nippon Mining & Metals Corp | Copper foil for printed circuit |
| EP2624671A4 (en) | 2010-09-27 | 2016-12-21 | Jx Nippon Mining & Metals Corp | COPPER FOIL FOR FITTED PCB, METHOD FOR MAKING THIS COPPER FILM, RESIN COVER FOR FITTED PCB AND FITTED PCB |
| CN104779367A (zh) * | 2014-01-15 | 2015-07-15 | 金居开发铜箔股份有限公司 | 耐热性锂电池用铜箔及其制造方法 |
| JP2015134953A (ja) * | 2014-01-17 | 2015-07-27 | Jx日鉱日石金属株式会社 | 表面処理銅箔、キャリア付銅箔、プリント配線板、プリント回路板、銅張積層板及びプリント配線板の製造方法 |
| TWI593548B (zh) * | 2015-01-09 | 2017-08-01 | Jx Nippon Mining & Metals Corp | Attached to the metal substrate |
| CN108449868B (zh) * | 2017-02-07 | 2022-08-16 | Jx金属株式会社 | 表面处理铜箔、带载体的铜箔、层压体、印刷配线板的制造方法及电子机器的制造方法 |
| JP6413039B1 (ja) * | 2018-03-29 | 2018-10-24 | Jx金属株式会社 | 表面処理銅箔及び銅張積層板 |
| CN111971421B (zh) | 2018-04-27 | 2023-06-09 | Jx金属株式会社 | 表面处理铜箔、覆铜积层板及印刷配线板 |
| CN114752977B (zh) * | 2022-05-16 | 2023-06-27 | 东强(连州)铜箔有限公司 | 一种微观表面颗粒均匀的高抗剥电解铜箔及其制备方法 |
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| KR20150021474A (ko) * | 2013-08-20 | 2015-03-02 | 제이엑스 닛코 닛세키 킨조쿠 가부시키가이샤 | 표면 처리 동박 및 그것을 사용한 적층판, 프린트 배선판, 전자 기기, 그리고 프린트 배선판의 제조 방법 |
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| JP7434656B1 (ja) | 2023-08-31 | 2024-02-20 | Jx金属株式会社 | 表面処理銅箔、銅張積層板、及びプリント配線板の製造方法 |
| JP2025034865A (ja) * | 2023-08-31 | 2025-03-13 | Jx金属株式会社 | 表面処理銅箔、銅張積層板、及びプリント配線板の製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20130121985A (ko) | 2013-11-06 |
| JPWO2012132577A1 (ja) | 2014-07-24 |
| CN103443335A (zh) | 2013-12-11 |
| MY165091A (en) | 2018-02-28 |
| JP6013426B2 (ja) | 2016-10-25 |
| KR101999422B1 (ko) | 2019-07-11 |
| US20140057123A1 (en) | 2014-02-27 |
| PH12013501975A1 (en) | 2013-11-25 |
| JP2015034351A (ja) | 2015-02-19 |
| KR20150119489A (ko) | 2015-10-23 |
| JP5676749B2 (ja) | 2015-02-25 |
| TWI486491B (zh) | 2015-06-01 |
| TW201245508A (en) | 2012-11-16 |
| CN103443335B (zh) | 2016-09-21 |
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