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WO2009025038A1 - 容器口部側面欠陥検査方法及び装置 - Google Patents

容器口部側面欠陥検査方法及び装置 Download PDF

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Publication number
WO2009025038A1
WO2009025038A1 PCT/JP2007/066249 JP2007066249W WO2009025038A1 WO 2009025038 A1 WO2009025038 A1 WO 2009025038A1 JP 2007066249 W JP2007066249 W JP 2007066249W WO 2009025038 A1 WO2009025038 A1 WO 2009025038A1
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WIPO (PCT)
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PCT/JP2007/066249
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English (en)
French (fr)
Inventor
Takashi Harada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toyo Glass Co Ltd
Original Assignee
Toyo Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toyo Glass Co Ltd filed Critical Toyo Glass Co Ltd
Priority to PCT/JP2007/066249 priority Critical patent/WO2009025038A1/ja
Priority to JP2007540848A priority patent/JP4676500B2/ja
Publication of WO2009025038A1 publication Critical patent/WO2009025038A1/ja
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/9054—Inspection of sealing surface and container finish

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

【課題】容器の口部側面の検査を、高精度で自動化できる検査方法及び検査装置を開発する。 【解決手段】回転する容器の口部側面に投光し、その透過光を縦方向に向けたラインセンサで受光し、ラインセンサの各ラインの取り込みデータＡがしわ筋判定値（ＴＡＬ）より大きい部分を有する場合、取り込みデータＡと、そのラインよりも所定の差分間隔（ＦＰ）進んだラインの取り込みデータＢを検査ゲート内において差分処理し、その差分データが所定の差分閾値（ＴＨ１）より大きいデータの素子数を求め、この操作を次々に所定の差分実施回数（ＶＳ１）繰り返し、差分実施回数（ＶＳ１）終了時における前記素子数の合計である差分総素子数が所定の差分素子数閾値（ＰＸＬ１）より大きい場合に、しわ筋の欠陥ありとして判定する。設定された差分実施回数（ＶＳ１）の複数のラインデータを総合して判定を行うので、しわ筋の欠陥を精度よく検出することができる。  
PCT/JP2007/066249 2007-08-22 2007-08-22 容器口部側面欠陥検査方法及び装置 Ceased WO2009025038A1 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
PCT/JP2007/066249 WO2009025038A1 (ja) 2007-08-22 2007-08-22 容器口部側面欠陥検査方法及び装置
JP2007540848A JP4676500B2 (ja) 2007-08-22 2007-08-22 容器口部側面欠陥検査方法及び装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/066249 WO2009025038A1 (ja) 2007-08-22 2007-08-22 容器口部側面欠陥検査方法及び装置

Publications (1)

Publication Number Publication Date
WO2009025038A1 true WO2009025038A1 (ja) 2009-02-26

Family

ID=40377949

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/066249 Ceased WO2009025038A1 (ja) 2007-08-22 2007-08-22 容器口部側面欠陥検査方法及び装置

Country Status (2)

Country Link
JP (1) JP4676500B2 (ja)
WO (1) WO2009025038A1 (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5108991B1 (ja) * 2012-02-27 2012-12-26 東洋ガラス株式会社 ガラス容器口リップ部傷の検査方法及び装置
KR20200142042A (ko) 2019-03-20 2020-12-21 도요 가라스 가부시키가이샤 용기 검사장치
CN118425176A (zh) * 2024-07-02 2024-08-02 洛阳市杨森工业控制技术有限公司 一种瓷瓶关键部位视觉检测线

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5546172A (en) * 1978-09-29 1980-03-31 Kirin Brewery Co Ltd Detector for foreign material
JPS57137844A (en) * 1981-02-20 1982-08-25 Kirin Brewery Co Ltd Detector for defect
JPS61107144A (ja) * 1984-10-31 1986-05-26 Kirin Brewery Co Ltd 容器の検査方法
JPH01253638A (ja) * 1988-03-31 1989-10-09 Matsushita Electric Ind Co Ltd 円盤状光学記録媒体の欠陥検査装置
JPH03502138A (ja) * 1988-10-26 1991-05-16 アイネックス‐ヴィステック・テクノロジーズ・インコーポレイテッド 端部及び隣合う側部を分析するための物品検査システム
JPH1194764A (ja) * 1997-09-19 1999-04-09 Mitsubishi Electric Engineering Co Ltd 外観検査装置
JPH11510256A (ja) * 1995-08-04 1999-09-07 イメージ プロセッシング システムズ，インク． びんのねじ山の検査システムおよびその作動方法
JP2002039960A (ja) * 2000-07-27 2002-02-06 Hitachi Ltd パターン欠陥検査方法及びその装置

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5546172A (en) * 1978-09-29 1980-03-31 Kirin Brewery Co Ltd Detector for foreign material
JPS57137844A (en) * 1981-02-20 1982-08-25 Kirin Brewery Co Ltd Detector for defect
JPS61107144A (ja) * 1984-10-31 1986-05-26 Kirin Brewery Co Ltd 容器の検査方法
JPH01253638A (ja) * 1988-03-31 1989-10-09 Matsushita Electric Ind Co Ltd 円盤状光学記録媒体の欠陥検査装置
JPH03502138A (ja) * 1988-10-26 1991-05-16 アイネックス‐ヴィステック・テクノロジーズ・インコーポレイテッド 端部及び隣合う側部を分析するための物品検査システム
JPH11510256A (ja) * 1995-08-04 1999-09-07 イメージ プロセッシング システムズ，インク． びんのねじ山の検査システムおよびその作動方法
JPH1194764A (ja) * 1997-09-19 1999-04-09 Mitsubishi Electric Engineering Co Ltd 外観検査装置
JP2002039960A (ja) * 2000-07-27 2002-02-06 Hitachi Ltd パターン欠陥検査方法及びその装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5108991B1 (ja) * 2012-02-27 2012-12-26 東洋ガラス株式会社 ガラス容器口リップ部傷の検査方法及び装置
WO2013128538A1 (ja) * 2012-02-27 2013-09-06 東洋ガラス株式会社 ガラス容器口リップ部傷の検査方法及び装置
KR20200142042A (ko) 2019-03-20 2020-12-21 도요 가라스 가부시키가이샤 용기 검사장치
CN118425176A (zh) * 2024-07-02 2024-08-02 洛阳市杨森工业控制技术有限公司 一种瓷瓶关键部位视觉检测线

Also Published As

Publication number Publication date
JP4676500B2 (ja) 2011-04-27
JPWO2009025038A1 (ja) 2010-11-18

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