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WO2009072549A1 - Appareil de contrôle de la température, procédé de contrôle de la température et programme pour contrôler la température - Google Patents

Appareil de contrôle de la température, procédé de contrôle de la température et programme pour contrôler la température Download PDF

Info

Publication number
WO2009072549A1
WO2009072549A1 PCT/JP2008/072028 JP2008072028W WO2009072549A1 WO 2009072549 A1 WO2009072549 A1 WO 2009072549A1 JP 2008072028 W JP2008072028 W JP 2008072028W WO 2009072549 A1 WO2009072549 A1 WO 2009072549A1
Authority
WO
WIPO (PCT)
Prior art keywords
temperature
temperature control
chip
control apparatus
program
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2008/072028
Other languages
English (en)
Japanese (ja)
Inventor
Yusuke Tsukahara
Eiji Kawata
Masahiko Amano
Nobuo Sasaki
Yusuke Nakamura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toppan Inc
RIKEN
Original Assignee
Toppan Printing Co Ltd
RIKEN
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toppan Printing Co Ltd, RIKEN filed Critical Toppan Printing Co Ltd
Priority to JP2009544704A priority Critical patent/JP5540705B2/ja
Publication of WO2009072549A1 publication Critical patent/WO2009072549A1/fr
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
    • B01L7/00—Heating or cooling apparatus; Heat insulating devices
    • B01L7/52—Heating or cooling apparatus; Heat insulating devices with provision for submitting samples to a predetermined sequence of different temperatures, e.g. for treating nucleic acid samples
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
    • B01L3/00—Containers or dishes for laboratory use, e.g. laboratory glassware; Droppers
    • B01L3/50—Containers for the purpose of retaining a material to be analysed, e.g. test tubes
    • B01L3/502—Containers for the purpose of retaining a material to be analysed, e.g. test tubes with fluid transport, e.g. in multi-compartment structures
    • B01L3/5027—Containers for the purpose of retaining a material to be analysed, e.g. test tubes with fluid transport, e.g. in multi-compartment structures by integrated microfluidic structures, i.e. dimensions of channels and chambers are such that surface tension forces are important, e.g. lab-on-a-chip
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
    • G05D23/00—Control of temperature
    • G05D23/19—Control of temperature characterised by the use of electric means
    • G05D23/1927—Control of temperature characterised by the use of electric means using a plurality of sensors
    • G05D23/193—Control of temperature characterised by the use of electric means using a plurality of sensors sensing the temperaure in different places in thermal relationship with one or more spaces
    • G05D23/1931—Control of temperature characterised by the use of electric means using a plurality of sensors sensing the temperaure in different places in thermal relationship with one or more spaces to control the temperature of one space
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
    • G05D23/00—Control of temperature
    • G05D23/19—Control of temperature characterised by the use of electric means
    • G05D23/20—Control of temperature characterised by the use of electric means with sensing elements having variation of electric or magnetic properties with change of temperature
    • G05D23/24—Control of temperature characterised by the use of electric means with sensing elements having variation of electric or magnetic properties with change of temperature the sensing element having a resistance varying with temperature, e.g. a thermistor
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
    • B01J2219/00—Chemical, physical or physico-chemical processes in general; Their relevant apparatus
    • B01J2219/00781—Aspects relating to microreactors
    • B01J2219/00873—Heat exchange
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
    • B01J2219/00—Chemical, physical or physico-chemical processes in general; Their relevant apparatus
    • B01J2219/00781—Aspects relating to microreactors
    • B01J2219/0095—Control aspects
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
    • B01L2200/00—Solutions for specific problems relating to chemical or physical laboratory apparatus
    • B01L2200/14—Process control and prevention of errors
    • B01L2200/143—Quality control, feedback systems
    • B01L2200/147—Employing temperature sensors
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
    • B01L3/00—Containers or dishes for laboratory use, e.g. laboratory glassware; Droppers
    • B01L3/50—Containers for the purpose of retaining a material to be analysed, e.g. test tubes
    • B01L3/502—Containers for the purpose of retaining a material to be analysed, e.g. test tubes with fluid transport, e.g. in multi-compartment structures
    • B01L3/5027—Containers for the purpose of retaining a material to be analysed, e.g. test tubes with fluid transport, e.g. in multi-compartment structures by integrated microfluidic structures, i.e. dimensions of channels and chambers are such that surface tension forces are important, e.g. lab-on-a-chip
    • B01L3/502715—Containers for the purpose of retaining a material to be analysed, e.g. test tubes with fluid transport, e.g. in multi-compartment structures by integrated microfluidic structures, i.e. dimensions of channels and chambers are such that surface tension forces are important, e.g. lab-on-a-chip characterised by interfacing components, e.g. fluidic, electrical, optical or mechanical interfaces

Landscapes

  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Clinical Laboratory Science (AREA)
  • Physics & Mathematics (AREA)
  • Hematology (AREA)
  • Analytical Chemistry (AREA)
  • Dispersion Chemistry (AREA)
  • Remote Sensing (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • Molecular Biology (AREA)
  • Physical Or Chemical Processes And Apparatus (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Apparatus Associated With Microorganisms And Enzymes (AREA)
  • Control Of Temperature (AREA)

Abstract

L'invention concerne un appareil de contrôle de la température pour une puce destinée à être utilisée pour une réaction chimique. L'appareil de contrôle de la température est muni d'une puce destinée à stocker un réactif ; d'un élément de mesure de la température de la section inférieure destiné à mesurer la température au niveau d'un contact externe du côté inférieur de la puce ; d'un élément de mesure de la température de la section supérieure destiné à mesurer la température au niveau d'un contact externe du côté supérieur de la puce ; et d'une section d'estimation de la température, qui est connectée à l'élément de mesure de la température de la section inférieure et à l'élément de mesure de la température de la section supérieure et qui estime la température du réactif stocké dans la puce en utilisant un algorithme d'estimation de la température.
PCT/JP2008/072028 2007-12-07 2008-12-04 Appareil de contrôle de la température, procédé de contrôle de la température et programme pour contrôler la température Ceased WO2009072549A1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2009544704A JP5540705B2 (ja) 2007-12-07 2008-12-04 温度制御装置、温度制御方法、ならびにそのプログラム

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007-317159 2007-12-07
JP2007317159 2007-12-07

Publications (1)

Publication Number Publication Date
WO2009072549A1 true WO2009072549A1 (fr) 2009-06-11

Family

ID=40717726

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/072028 Ceased WO2009072549A1 (fr) 2007-12-07 2008-12-04 Appareil de contrôle de la température, procédé de contrôle de la température et programme pour contrôler la température

Country Status (2)

Country Link
JP (1) JP5540705B2 (fr)
WO (1) WO2009072549A1 (fr)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2012132451A1 (fr) * 2011-03-31 2012-10-04 富士フイルム株式会社 Dispositif d'analyse
JP2013524790A (ja) * 2010-04-20 2013-06-20 コーベット リサーチ プロプライエタリー リミテッド 温度制御方法及び装置
WO2018150648A1 (fr) * 2017-02-20 2018-08-23 株式会社日立製作所 Dispositif de réglage de température et dispositif d'amplification d'acide nucléique

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003185506A (ja) * 2001-12-21 2003-07-03 Hitachi Cable Ltd 路面温度推定方法
JP2007240413A (ja) * 2006-03-10 2007-09-20 Konica Minolta Medical & Graphic Inc マイクロ流体チップ

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004325141A (ja) * 2003-04-22 2004-11-18 Rikogaku Shinkokai 熱分析方法および熱分析装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003185506A (ja) * 2001-12-21 2003-07-03 Hitachi Cable Ltd 路面温度推定方法
JP2007240413A (ja) * 2006-03-10 2007-09-20 Konica Minolta Medical & Graphic Inc マイクロ流体チップ

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
PALISOC, A. L. ET AL.: "Thermal properties of the multilayer infinite plate structure", J. APPL. PHYS., vol. 64, no. L, 1988, pages 410 - 415 *

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013524790A (ja) * 2010-04-20 2013-06-20 コーベット リサーチ プロプライエタリー リミテッド 温度制御方法及び装置
WO2012132451A1 (fr) * 2011-03-31 2012-10-04 富士フイルム株式会社 Dispositif d'analyse
JP2012215465A (ja) * 2011-03-31 2012-11-08 Fujifilm Corp 分析装置
US9562859B2 (en) 2011-03-31 2017-02-07 Fujifilm Corporation Analysis device
WO2018150648A1 (fr) * 2017-02-20 2018-08-23 株式会社日立製作所 Dispositif de réglage de température et dispositif d'amplification d'acide nucléique
JPWO2018150648A1 (ja) * 2017-02-20 2019-08-08 株式会社日立製作所 温度調節装置および核酸増幅装置

Also Published As

Publication number Publication date
JPWO2009072549A1 (ja) 2011-04-28
JP5540705B2 (ja) 2014-07-02

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