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WO2008123301A1 - 異極像結晶を用いたｘ線発生装置 - Google Patents

異極像結晶を用いたｘ線発生装置 Download PDF

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Publication number
WO2008123301A1
WO2008123301A1 PCT/JP2008/055710 JP2008055710W WO2008123301A1 WO 2008123301 A1 WO2008123301 A1 WO 2008123301A1 JP 2008055710 W JP2008055710 W JP 2008055710W WO 2008123301 A1 WO2008123301 A1 WO 2008123301A1
Authority
WO
WIPO (PCT)
Prior art keywords
vacuum vessel
hemimorphic crystal
electric field
hemimorphic
ray generator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2008/055710
Other languages
English (en)
French (fr)
Inventor
Yoshiaki Ito
Shinzo Yoshikado
Yoshikazu Nakanishi
Shinji Fukao
Shigeo Ito
Takeshi Tonegawa
Yohei Fujimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Futaba Corp
Doshisha Co Ltd
Kyoto University NUC
Original Assignee
Futaba Corp
Doshisha Co Ltd
Kyoto University NUC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Futaba Corp, Doshisha Co Ltd, Kyoto University NUC filed Critical Futaba Corp
Priority to JP2009509140A priority Critical patent/JP5019302B2/ja
Publication of WO2008123301A1 publication Critical patent/WO2008123301A1/ja
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/08—Deviation, concentration or focusing of the beam by electric or magnetic means
    • G21K1/087—Deviation, concentration or focusing of the beam by electric or magnetic means by electrical means
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/06—Cathodes
    • H01J35/065—Field emission, photo emission or secondary emission cathodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2235/00—X-ray tubes
    • H01J2235/06—Cathode assembly
    • H01J2235/062—Cold cathodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2235/00—X-ray tubes
    • H01J2235/08—Targets (anodes) and X-ray converters
    • H01J2235/086—Target geometry

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • X-Ray Techniques (AREA)

Abstract

 本発明のＸ線発生装置は、内部に低圧ガス雰囲気を維持する真空容器(１)と、真空容器内に配置された少なくとも１つの異極像結晶(２)と、異極像結晶の温度を昇降させる温度昇降手段(３)、(７)、(８)、(９)と、真空容器内における、温度昇降手段によって熱励起された異極像結晶から生じる電界の到達範囲内に備えられ、電界放出により電子を放出する冷陰極電子源(４)と、真空容器内における異極像結晶から生じる電界の到達範囲内に配置されたＸ線発生用金属ターゲット(６)を備える。 この構成によって、高圧電源装置や真空排気装置等の大掛かりな装置を一切備えることなく、また、電子源用の付加的な電源を使用することなく、コンパクトな構成でもって一定レベル以上の強度のＸ線を長時間に渡って安定的に発生させることができる。また、電子源の作動時に熱が発生することもなく、しかも、真空容器内に不都合な汚染を生じさせることもない。
PCT/JP2008/055710 2007-03-26 2008-03-26 異極像結晶を用いたｘ線発生装置 Ceased WO2008123301A1 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2009509140A JP5019302B2 (ja) 2007-03-26 2008-03-26 異極像結晶を用いたｘ線発生装置

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007079570 2007-03-26
JP2007-079570 2007-03-26

Publications (1)

Publication Number Publication Date
WO2008123301A1 true WO2008123301A1 (ja) 2008-10-16

Family

ID=39830790

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/055710 Ceased WO2008123301A1 (ja) 2007-03-26 2008-03-26 異極像結晶を用いたｘ線発生装置

Country Status (2)

Country Link
JP (1) JP5019302B2 (ja)
WO (1) WO2008123301A1 (ja)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010116709A1 (ja) * 2009-04-07 2010-10-14 有限会社アドテックセンシングリサーチ Ｘ線発生装置及びそれを用いる複合装置並びにｘ線発生方法
WO2012005338A3 (ja) * 2010-07-09 2012-03-15 有限会社アドテックセンシングリサーチ X線発生装置
WO2013058342A1 (ja) * 2011-10-18 2013-04-25 株式会社Ｂｓｒ 荷電粒子放射装置および同装置を用いたｘ線発生装置
DE202013005768U1 (de) 2013-06-21 2013-07-22 Technische Universität Bergakademie Freiberg Vorrichtung zur Erzeugung von Röntgenstrahlung mittels pyroelektrischen Materials
US8755493B2 (en) 2009-08-07 2014-06-17 The Regents Of The University Of California Apparatus for producing X-rays for use in imaging
US10712296B2 (en) 2016-12-23 2020-07-14 Orion Engineering Limited Handheld material analyser

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2951444B1 (fr) 2009-10-19 2012-08-17 Stork Food Systems France Dispositif de formation de lots de produits pour leur chargement dans des receptacles
JP5682918B2 (ja) * 2011-01-20 2015-03-11 独立行政法人産業技術総合研究所 Ｘ線吸収端法による元素別定量分析方法及び元素別定量分析装置

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001176378A (ja) * 1999-12-20 2001-06-29 Sharp Corp 冷陰極及びその製造方法
JP2004087304A (ja) * 2002-08-27 2004-03-18 Mitsubishi Electric Corp 冷陰極電子源及びそれを用いた表示装置
JP2004095311A (ja) * 2002-08-30 2004-03-25 Ishikawajima Harima Heavy Ind Co Ltd 電子線発生装置
WO2006103822A1 (ja) * 2005-03-29 2006-10-05 Kyoto University 異極像結晶を用いたｘ線発生装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001176378A (ja) * 1999-12-20 2001-06-29 Sharp Corp 冷陰極及びその製造方法
JP2004087304A (ja) * 2002-08-27 2004-03-18 Mitsubishi Electric Corp 冷陰極電子源及びそれを用いた表示装置
JP2004095311A (ja) * 2002-08-30 2004-03-25 Ishikawajima Harima Heavy Ind Co Ltd 電子線発生装置
WO2006103822A1 (ja) * 2005-03-29 2006-10-05 Kyoto University 異極像結晶を用いたｘ線発生装置

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010116709A1 (ja) * 2009-04-07 2010-10-14 有限会社アドテックセンシングリサーチ Ｘ線発生装置及びそれを用いる複合装置並びにｘ線発生方法
JP4688978B2 (ja) * 2009-04-07 2011-05-25 有限会社アドテックセンシングリサーチ Ｘ線発生装置及びそれを用いる複合装置並びにｘ線発生方法
EP2418671A4 (en) * 2009-04-07 2014-05-21 Adtech Sensing Res Inc X-RAY GENERATOR AND COMPOSITE DEVICE USING THE SAME AND METHOD FOR GENERATING X-RAYS
US8917814B2 (en) 2009-04-07 2014-12-23 Mikio Takai X-ray generator and composite device using the same and X-ray generating method
US8755493B2 (en) 2009-08-07 2014-06-17 The Regents Of The University Of California Apparatus for producing X-rays for use in imaging
WO2012005338A3 (ja) * 2010-07-09 2012-03-15 有限会社アドテックセンシングリサーチ X線発生装置
US8976932B2 (en) 2010-07-09 2015-03-10 Bsr Co., Ltd. X-ray generating device
WO2013058342A1 (ja) * 2011-10-18 2013-04-25 株式会社Ｂｓｒ 荷電粒子放射装置および同装置を用いたｘ線発生装置
DE202013005768U1 (de) 2013-06-21 2013-07-22 Technische Universität Bergakademie Freiberg Vorrichtung zur Erzeugung von Röntgenstrahlung mittels pyroelektrischen Materials
US10712296B2 (en) 2016-12-23 2020-07-14 Orion Engineering Limited Handheld material analyser

Also Published As

Publication number Publication date
JPWO2008123301A1 (ja) 2010-07-15
JP5019302B2 (ja) 2012-09-05

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