WO2008123301A1 - X-ray generator employing hemimorphic crystal - Google Patents
X-ray generator employing hemimorphic crystal Download PDFInfo
- Publication number
- WO2008123301A1 WO2008123301A1 PCT/JP2008/055710 JP2008055710W WO2008123301A1 WO 2008123301 A1 WO2008123301 A1 WO 2008123301A1 JP 2008055710 W JP2008055710 W JP 2008055710W WO 2008123301 A1 WO2008123301 A1 WO 2008123301A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- vacuum vessel
- hemimorphic crystal
- electric field
- hemimorphic
- ray generator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/08—Deviation, concentration or focusing of the beam by electric or magnetic means
- G21K1/087—Deviation, concentration or focusing of the beam by electric or magnetic means by electrical means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
- H01J35/06—Cathodes
- H01J35/065—Field emission, photo emission or secondary emission cathodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2235/00—X-ray tubes
- H01J2235/06—Cathode assembly
- H01J2235/062—Cold cathodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2235/00—X-ray tubes
- H01J2235/08—Targets (anodes) and X-ray converters
- H01J2235/086—Target geometry
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- X-Ray Techniques (AREA)
Abstract
An X-ray generator includes: a vacuum vessel (1) containing a low-pressure gas atmosphere; at least one hemimorphic crystal arranged in the vacuum vessel; temperature increasing means (3, 7, 8, 9) for increasing the temperature of the hemimorphic crystal; a cold cathode electron source (4) arranged within a reach of the electric field generated from the hemimorphic crystal thermally excited by the temperature increasing means in the vacuum vessel and emitting electrons by electric field emission; and a metal target (6) for generating X-rays arranged within a reach of the electric field generated from the hemimorphic crystal in the vacuum vessel. With this compact configuration, it is possible to stably generate X-rays having an intensity above a certain level for a long time without requiring a large-scale device such as a high-voltage power source or a vacuum pumping device. Moreover, no heat is generated when an electron source is operating and no contamination is caused in the vacuum vessel.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009509140A JP5019302B2 (en) | 2007-03-26 | 2008-03-26 | X-ray generator using heteropolar crystal |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007079570 | 2007-03-26 | ||
| JP2007-079570 | 2007-03-26 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2008123301A1 true WO2008123301A1 (en) | 2008-10-16 |
Family
ID=39830790
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/JP2008/055710 Ceased WO2008123301A1 (en) | 2007-03-26 | 2008-03-26 | X-ray generator employing hemimorphic crystal |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JP5019302B2 (en) |
| WO (1) | WO2008123301A1 (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2010116709A1 (en) * | 2009-04-07 | 2010-10-14 | 有限会社アドテックセンシングリサーチ | X-ray generator and composite device using the same and x-ray generating method |
| WO2012005338A3 (en) * | 2010-07-09 | 2012-03-15 | 有限会社アドテックセンシングリサーチ | X-ray generating device |
| WO2013058342A1 (en) * | 2011-10-18 | 2013-04-25 | 株式会社Bsr | Charged particle emission device and x-ray generator using the device |
| DE202013005768U1 (en) | 2013-06-21 | 2013-07-22 | Technische Universität Bergakademie Freiberg | Device for generating X-radiation by means of pyroelectric material |
| US8755493B2 (en) | 2009-08-07 | 2014-06-17 | The Regents Of The University Of California | Apparatus for producing X-rays for use in imaging |
| US10712296B2 (en) | 2016-12-23 | 2020-07-14 | Orion Engineering Limited | Handheld material analyser |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2951444B1 (en) | 2009-10-19 | 2012-08-17 | Stork Food Systems France | DEVICE FOR PRODUCING LOTS OF PRODUCTS FOR THEIR LOADING IN RECEPTACLES |
| JP5682918B2 (en) * | 2011-01-20 | 2015-03-11 | 独立行政法人産業技術総合研究所 | Elemental quantitative analysis method and elemental quantitative analyzer by X-ray absorption edge method |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001176378A (en) * | 1999-12-20 | 2001-06-29 | Sharp Corp | Cold cathode and method of manufacturing the same |
| JP2004087304A (en) * | 2002-08-27 | 2004-03-18 | Mitsubishi Electric Corp | Cold cathode electron source and display device using the same |
| JP2004095311A (en) * | 2002-08-30 | 2004-03-25 | Ishikawajima Harima Heavy Ind Co Ltd | Electron beam generator |
| WO2006103822A1 (en) * | 2005-03-29 | 2006-10-05 | Kyoto University | X-ray generator using hemimorphic crystal |
-
2008
- 2008-03-26 WO PCT/JP2008/055710 patent/WO2008123301A1/en not_active Ceased
- 2008-03-26 JP JP2009509140A patent/JP5019302B2/en not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001176378A (en) * | 1999-12-20 | 2001-06-29 | Sharp Corp | Cold cathode and method of manufacturing the same |
| JP2004087304A (en) * | 2002-08-27 | 2004-03-18 | Mitsubishi Electric Corp | Cold cathode electron source and display device using the same |
| JP2004095311A (en) * | 2002-08-30 | 2004-03-25 | Ishikawajima Harima Heavy Ind Co Ltd | Electron beam generator |
| WO2006103822A1 (en) * | 2005-03-29 | 2006-10-05 | Kyoto University | X-ray generator using hemimorphic crystal |
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2010116709A1 (en) * | 2009-04-07 | 2010-10-14 | 有限会社アドテックセンシングリサーチ | X-ray generator and composite device using the same and x-ray generating method |
| JP4688978B2 (en) * | 2009-04-07 | 2011-05-25 | 有限会社アドテックセンシングリサーチ | X-ray generation apparatus, composite apparatus using the same, and X-ray generation method |
| EP2418671A4 (en) * | 2009-04-07 | 2014-05-21 | Adtech Sensing Res Inc | X-ray generator and composite device using the same and x-ray generating method |
| US8917814B2 (en) | 2009-04-07 | 2014-12-23 | Mikio Takai | X-ray generator and composite device using the same and X-ray generating method |
| US8755493B2 (en) | 2009-08-07 | 2014-06-17 | The Regents Of The University Of California | Apparatus for producing X-rays for use in imaging |
| WO2012005338A3 (en) * | 2010-07-09 | 2012-03-15 | 有限会社アドテックセンシングリサーチ | X-ray generating device |
| US8976932B2 (en) | 2010-07-09 | 2015-03-10 | Bsr Co., Ltd. | X-ray generating device |
| WO2013058342A1 (en) * | 2011-10-18 | 2013-04-25 | 株式会社Bsr | Charged particle emission device and x-ray generator using the device |
| DE202013005768U1 (en) | 2013-06-21 | 2013-07-22 | Technische Universität Bergakademie Freiberg | Device for generating X-radiation by means of pyroelectric material |
| US10712296B2 (en) | 2016-12-23 | 2020-07-14 | Orion Engineering Limited | Handheld material analyser |
Also Published As
| Publication number | Publication date |
|---|---|
| JPWO2008123301A1 (en) | 2010-07-15 |
| JP5019302B2 (en) | 2012-09-05 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 121 | Ep: the epo has been informed by wipo that ep was designated in this application |
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| NENP | Non-entry into the national phase |
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| 122 | Ep: pct application non-entry in european phase |
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