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WO2008149990A1 - 位相測定装置、スキュー測定装置、位相測定方法、およびスキュー測定方法 - Google Patents

位相測定装置、スキュー測定装置、位相測定方法、およびスキュー測定方法 Download PDF

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Publication number
WO2008149990A1
WO2008149990A1 PCT/JP2008/060484 JP2008060484W WO2008149990A1 WO 2008149990 A1 WO2008149990 A1 WO 2008149990A1 JP 2008060484 W JP2008060484 W JP 2008060484W WO 2008149990 A1 WO2008149990 A1 WO 2008149990A1
Authority
WO
WIPO (PCT)
Prior art keywords
phase
jitter
signal
skew
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2008/060484
Other languages
English (en)
French (fr)
Inventor
Masahiro Ishida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP2009517915A priority Critical patent/JPWO2008149990A1/ja
Publication of WO2008149990A1 publication Critical patent/WO2008149990A1/ja
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922—Timing generation or clock distribution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/31709—Jitter measurements; Jitter generators

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Dc Digital Transmission (AREA)
  • Synchronisation In Digital Transmission Systems (AREA)

Abstract

　被測定信号の位相を測定する位相測定装置であって、被測定信号を、与えられるサンプリングクロックのタイミングでサンプリングするサンプリング部と、サンプリング部に入力される被測定信号及びサンプリングクロックの少なくとも一方にジッタを印加するジッタ印加部と、サンプリング部におけるサンプリング結果に基づいて、被測定信号の位相を算出する位相算出部とを備え、ジッタ印加部は、被測定信号又はサンプリングクロックのエッジの位相を遅らせるジッタ成分の分布と、進ませるジッタ成分の分布とが略対称となるジッタを印加する位相測定装置を提供する。
PCT/JP2008/060484 2007-06-06 2008-06-06 位相測定装置、スキュー測定装置、位相測定方法、およびスキュー測定方法 Ceased WO2008149990A1 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2009517915A JPWO2008149990A1 (ja) 2007-06-06 2008-06-06 位相測定装置、スキュー測定装置、位相測定方法、およびスキュー測定方法

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/758,676 US7638997B2 (en) 2007-06-06 2007-06-06 Phase measurement apparatus
US11/758,676 2007-06-06

Publications (1)

Publication Number Publication Date
WO2008149990A1 true WO2008149990A1 (ja) 2008-12-11

Family

ID=40093794

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/060484 Ceased WO2008149990A1 (ja) 2007-06-06 2008-06-06 位相測定装置、スキュー測定装置、位相測定方法、およびスキュー測定方法

Country Status (3)

Country Link
US (1) US7638997B2 (ja)
JP (1) JPWO2008149990A1 (ja)
WO (1) WO2008149990A1 (ja)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102072987B (zh) * 2010-11-13 2013-06-12 天津大学 短区间正弦信号的相位估计法及其实验装置
US8248297B1 (en) * 2011-04-11 2012-08-21 Advanced Testing Technologies, Inc. Phase noise measurement system and method
US9164134B2 (en) * 2012-11-13 2015-10-20 Nvidia Corporation High-resolution phase detector

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0682484A (ja) * 1992-01-16 1994-03-22 Sony Tektronix Corp 等価時間サンプリング装置
JP2001289892A (ja) * 2000-01-31 2001-10-19 Advantest Corp ジッタ測定装置及びその方法
WO2003036313A1 (en) * 2001-10-25 2003-05-01 Advantest Corporation Clock/skew measurement apparatus and clock/skew measurement method
JP2004239754A (ja) * 2003-02-06 2004-08-26 Advantest Corp 複数サンプリングデジタイザのチャンネル間スキュー補正装置及び補正方法
JP2004279155A (ja) * 2003-03-14 2004-10-07 Advantest Corp サンプリングデジタイザを使ったジッタ試験装置、方法及びこのサンプリングデジタイザを備えた半導体試験装置
WO2005074304A1 (en) * 2004-01-23 2005-08-11 Sunrise Telecom Incorporated Method and apparatus for measuring jitter

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7127018B2 (en) 2001-03-20 2006-10-24 Advantest Corporation Apparatus for and method of measuring clock skew
US7590170B2 (en) * 2004-09-29 2009-09-15 Teradyne, Inc. Method and apparatus for measuring jitter
US20080247451A1 (en) * 2007-03-13 2008-10-09 Advantest Corporation Measurement apparatus, measurement method, test apparatus, electronic device, and recording medium

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0682484A (ja) * 1992-01-16 1994-03-22 Sony Tektronix Corp 等価時間サンプリング装置
JP2001289892A (ja) * 2000-01-31 2001-10-19 Advantest Corp ジッタ測定装置及びその方法
WO2003036313A1 (en) * 2001-10-25 2003-05-01 Advantest Corporation Clock/skew measurement apparatus and clock/skew measurement method
JP2004239754A (ja) * 2003-02-06 2004-08-26 Advantest Corp 複数サンプリングデジタイザのチャンネル間スキュー補正装置及び補正方法
JP2004279155A (ja) * 2003-03-14 2004-10-07 Advantest Corp サンプリングデジタイザを使ったジッタ試験装置、方法及びこのサンプリングデジタイザを備えた半導体試験装置
WO2005074304A1 (en) * 2004-01-23 2005-08-11 Sunrise Telecom Incorporated Method and apparatus for measuring jitter

Also Published As

Publication number Publication date
US7638997B2 (en) 2009-12-29
US20080303509A1 (en) 2008-12-11
JPWO2008149990A1 (ja) 2010-08-26

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