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WO2008090627A1 - 電流制限付き電圧発生器および半導体試験装置 - Google Patents

電流制限付き電圧発生器および半導体試験装置 Download PDF

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Publication number
WO2008090627A1
WO2008090627A1 PCT/JP2007/051295 JP2007051295W WO2008090627A1 WO 2008090627 A1 WO2008090627 A1 WO 2008090627A1 JP 2007051295 W JP2007051295 W JP 2007051295W WO 2008090627 A1 WO2008090627 A1 WO 2008090627A1
Authority
WO
WIPO (PCT)
Prior art keywords
voltage
current
constant
clamper
voltage generator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2007/051295
Other languages
English (en)
French (fr)
Inventor
Shoji Kojima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to US12/090,614 priority Critical patent/US7834607B2/en
Priority to KR1020077027335A priority patent/KR100929605B1/ko
Priority to JP2007550622A priority patent/JP4629112B2/ja
Priority to PCT/JP2007/051295 priority patent/WO2008090627A1/ja
Priority to TW096143247A priority patent/TW200836036A/zh
Publication of WO2008090627A1 publication Critical patent/WO2008090627A1/ja
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/12005—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details comprising voltage or current generators
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G11C5/147—Voltage reference generators, voltage or current regulators; Internally lowered supply levels; Compensation for voltage drops
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Control Of Voltage And Current In General (AREA)
  • Amplifiers (AREA)
  • Continuous-Control Power Sources That Use Transistors (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Emergency Protection Circuit Devices (AREA)

Abstract

　この発明は、電流制限値が任意に設定可能であり、電流制限特性が良好で、かつ、その電流制限の温度依存性が小さな電流制限機能付き電圧発生器などを提供することにある。そして、この発明は、オペアンプ１と、入力抵抗２と、出力抵抗３と、帰還抵抗４と、クランパ１０と、クランパ６とを備え、入力端子７に入力電圧Ｖｉｎを印加し、負荷接続端子８に負荷９が接続される。クランパ１０は、定電圧を生成するとともに、出力抵抗３に流れる電流を制限するための定電圧発生回路１２１、１２４と、定電圧発生回路１２１、１２４で生成する定電圧を外部から可変する可変抵抗器１２２、１４２と、を含んでいる。定電圧発生回路１２１、１２４は、その電流／電圧特性が印加電圧に対して電流が急激に変化する所定の急峻な特性を持っている。
PCT/JP2007/051295 2007-01-26 2007-01-26 電流制限付き電圧発生器および半導体試験装置 Ceased WO2008090627A1 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
US12/090,614 US7834607B2 (en) 2007-01-26 2007-01-26 Voltage generator with current limiting and semiconductor testing device
KR1020077027335A KR100929605B1 (ko) 2007-01-26 2007-01-26 전류 제한부 전압 발생기 및 반도체 시험 장치
JP2007550622A JP4629112B2 (ja) 2007-01-26 2007-01-26 電流制限付き電圧発生器および半導体試験装置
PCT/JP2007/051295 WO2008090627A1 (ja) 2007-01-26 2007-01-26 電流制限付き電圧発生器および半導体試験装置
TW096143247A TW200836036A (en) 2007-01-26 2007-11-15 A voltage generator with current restrictor and semiconductor testing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/051295 WO2008090627A1 (ja) 2007-01-26 2007-01-26 電流制限付き電圧発生器および半導体試験装置

Publications (1)

Publication Number Publication Date
WO2008090627A1 true WO2008090627A1 (ja) 2008-07-31

Family

ID=39644208

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/051295 Ceased WO2008090627A1 (ja) 2007-01-26 2007-01-26 電流制限付き電圧発生器および半導体試験装置

Country Status (5)

Country Link
US (1) US7834607B2 (ja)
JP (1) JP4629112B2 (ja)
KR (1) KR100929605B1 (ja)
TW (1) TW200836036A (ja)
WO (1) WO2008090627A1 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2023552842A (ja) * 2020-12-09 2023-12-19 アナログ・ディヴァイシス・インターナショナル・アンリミテッド・カンパニー Ａｔｅシステムの範囲切替不具合軽減
US12540975B2 (en) 2021-12-02 2026-02-03 Analog Devices International Unlimited Company 125V switch glitch mitigation

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2475497B (en) * 2009-11-19 2012-03-28 Perpetuum Ltd Vibration energy harvester for converting mechanical vibrational energy into electrical energy
KR101528251B1 (ko) * 2014-06-25 2015-06-11 한국기계전기전자시험연구원 콤비형 스마트카드의 부채널 검사 장치 및 방법
KR101528253B1 (ko) * 2014-06-25 2015-06-11 한국기계전기전자시험연구원 스마트 카드의 접촉식 부채널 검사장치 및 방법
US9448571B2 (en) * 2014-12-12 2016-09-20 Filipower Integrated Technology, Inc. Voltage converting circuit having voltage feedback terminal
US9886047B2 (en) * 2015-05-01 2018-02-06 Rohm Co., Ltd. Reference voltage generation circuit including resistor arrangements
SG11201910036YA (en) * 2017-05-03 2019-11-28 Qualitau Inc Signal distribution apparatus
KR20240098732A (ko) 2022-12-21 2024-06-28 세메스 주식회사 비례제어 밸브 구동 회로 및 이를 갖는 비례제어 밸브 구동 시스템

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5422552A (en) * 1977-07-21 1979-02-20 Seiko Epson Corp Reference voltage source circuit
JP2002182755A (ja) * 2000-12-08 2002-06-26 Advantest Corp 電圧印加装置及び電流印加装置
JP2005293423A (ja) * 2004-04-02 2005-10-20 Syswave Corp 双方向電源回路

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5264781A (en) * 1992-03-05 1993-11-23 Ford Motor Company Current control/power limiter circuit
JP3457091B2 (ja) * 1995-03-17 2003-10-14 アジレント・テクノロジー株式会社 電圧電流特性測定装置
US5739678A (en) * 1996-12-18 1998-04-14 Lucent Technologies Inc. Voltage-to-current converter with rail-to-rail input range
JP2002123320A (ja) 2000-10-12 2002-04-26 Advantest Corp 電流制限機能付電圧発生器
JP3871659B2 (ja) * 2003-06-25 2007-01-24 ローム株式会社 電源回路
JP2006133109A (ja) * 2004-11-08 2006-05-25 Fujitsu Ltd 半導体試験装置
US7602161B2 (en) * 2006-05-05 2009-10-13 Standard Microsystems Corporation Voltage regulator with inherent voltage clamping
JP4707608B2 (ja) * 2006-05-19 2011-06-22 株式会社アドバンテスト 測定回路及び試験装置
US7579813B2 (en) * 2007-01-29 2009-08-25 Inventec Corporation Power regulator having a voltage regulator module and having a voltage buffer module to provide a constant voltage output
TW201013355A (en) * 2008-09-25 2010-04-01 Advanced Analog Technology Inc Low drop out regulator with fast current limit

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5422552A (en) * 1977-07-21 1979-02-20 Seiko Epson Corp Reference voltage source circuit
JP2002182755A (ja) * 2000-12-08 2002-06-26 Advantest Corp 電圧印加装置及び電流印加装置
JP2005293423A (ja) * 2004-04-02 2005-10-20 Syswave Corp 双方向電源回路

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2023552842A (ja) * 2020-12-09 2023-12-19 アナログ・ディヴァイシス・インターナショナル・アンリミテッド・カンパニー Ａｔｅシステムの範囲切替不具合軽減
US12540975B2 (en) 2021-12-02 2026-02-03 Analog Devices International Unlimited Company 125V switch glitch mitigation

Also Published As

Publication number Publication date
KR100929605B1 (ko) 2009-12-03
TWI352267B (ja) 2011-11-11
US20100164463A1 (en) 2010-07-01
US7834607B2 (en) 2010-11-16
TW200836036A (en) 2008-09-01
KR20080073636A (ko) 2008-08-11
JP4629112B2 (ja) 2011-02-09
JPWO2008090627A1 (ja) 2010-05-13

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