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WO2007030368A3 - Lattice-mismatched semiconductor structures on insulators and their fabrication methods - Google Patents

Lattice-mismatched semiconductor structures on insulators and their fabrication methods Download PDF

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Publication number
WO2007030368A3
WO2007030368A3 PCT/US2006/033859 US2006033859W WO2007030368A3 WO 2007030368 A3 WO2007030368 A3 WO 2007030368A3 US 2006033859 W US2006033859 W US 2006033859W WO 2007030368 A3 WO2007030368 A3 WO 2007030368A3
Authority
WO
WIPO (PCT)
Prior art keywords
lattice
insulators
mismatched semiconductor
semiconductor structures
fabrication methods
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US2006/033859
Other languages
French (fr)
Other versions
WO2007030368A2 (en
Inventor
Matthew T Currie
Anthony J Lochtefeld
Zhiyuan Cheng
Thomas A Langdo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Amber Wave Systems Inc
Original Assignee
Amber Wave Systems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US11/221,064 external-priority patent/US20070054467A1/en
Priority claimed from US11/220,482 external-priority patent/US7638842B2/en
Application filed by Amber Wave Systems Inc filed Critical Amber Wave Systems Inc
Publication of WO2007030368A2 publication Critical patent/WO2007030368A2/en
Publication of WO2007030368A3 publication Critical patent/WO2007030368A3/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • H10P90/1916—
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/60—Insulated-gate field-effect transistors [IGFET]
    • H10D30/791—Arrangements for exerting mechanical stress on the crystal lattice of the channel regions
    • H10D30/792—Arrangements for exerting mechanical stress on the crystal lattice of the channel regions comprising applied insulating layers, e.g. stress liners
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
    • H10D62/82—Heterojunctions
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
    • H10D62/82—Heterojunctions
    • H10D62/822—Heterojunctions comprising only Group IV materials heterojunctions, e.g. Si/Ge heterojunctions
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
    • H10D62/82—Heterojunctions
    • H10D62/824—Heterojunctions comprising only Group III-V materials heterojunctions, e.g. GaN/AlGaN heterojunctions
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/01—Manufacture or treatment
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/201—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates the substrates comprising an insulating layer on a semiconductor body, e.g. SOI
    • H10W10/181—
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/01—Manufacture or treatment
    • H10D84/0123—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs
    • H10D84/0126—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs
    • H10D84/0165—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs the components including complementary IGFETs, e.g. CMOS devices
    • H10D84/0167—Manufacturing their channels
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/01—Manufacture or treatment
    • H10D84/0123—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs
    • H10D84/0126—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs
    • H10D84/0165—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs the components including complementary IGFETs, e.g. CMOS devices
    • H10D84/0188—Manufacturing their isolation regions
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/01—Manufacture or treatment
    • H10D84/02—Manufacture or treatment characterised by using material-based technologies
    • H10D84/03—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology
    • H10D84/038—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology using silicon technology, e.g. SiGe

Landscapes

  • Recrystallisation Techniques (AREA)
  • Thin Film Transistor (AREA)

Abstract

Monolithic lattice-mismatched semiconductor heterostructures and methods for forming the same, such as by bonding patterned substrates with alternative active-area materials formed thereon to a rigid dielectric platform and then removing the highly- defective interface areas along with the underlying substrates to produce alternative active- area regions disposed over the insulator and substantially exhausted of misfit and threading dislocations.
PCT/US2006/033859 2005-09-07 2006-08-30 Lattice-mismatched semiconductor structures on insulators and their fabrication methods Ceased WO2007030368A2 (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US11/221,064 US20070054467A1 (en) 2005-09-07 2005-09-07 Methods for integrating lattice-mismatched semiconductor structure on insulators
US11/221,064 2005-09-07
US11/220,482 US7638842B2 (en) 2005-09-07 2005-09-07 Lattice-mismatched semiconductor structures on insulators
US11/220,482 2005-09-07

Publications (2)

Publication Number Publication Date
WO2007030368A2 WO2007030368A2 (en) 2007-03-15
WO2007030368A3 true WO2007030368A3 (en) 2007-11-15

Family

ID=37836348

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2006/033859 Ceased WO2007030368A2 (en) 2005-09-07 2006-08-30 Lattice-mismatched semiconductor structures on insulators and their fabrication methods

Country Status (1)

Country Link
WO (1) WO2007030368A2 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2929444B1 (en) * 2008-03-31 2010-08-20 Commissariat Energie Atomique METHOD FOR MANUFACTURING A MICROELECTRONIC STRUCTURE OF THE SEMICONDUCTOR TYPE ON INSULATION AND WITH DIFFERENTIATED PATTERNS, AND STRUCTURE THUS OBTAINED
US20100176482A1 (en) 2009-01-12 2010-07-15 International Business Machine Corporation Low cost fabrication of double box back gate silicon-on-insulator wafers with subsequent self aligned shallow trench isolation
US7767546B1 (en) 2009-01-12 2010-08-03 International Business Machines Corporation Low cost fabrication of double box back gate silicon-on-insulator wafers with built-in shallow trench isolation in back gate layer
EP2221853B1 (en) * 2009-02-19 2012-04-25 S.O.I. TEC Silicon Relaxation and transfer of strained material layers
US8587063B2 (en) * 2009-11-06 2013-11-19 International Business Machines Corporation Hybrid double box back gate silicon-on-insulator wafers with enhanced mobility channels
US9177967B2 (en) * 2013-12-24 2015-11-03 Intel Corporation Heterogeneous semiconductor material integration techniques

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050181549A1 (en) * 2004-02-17 2005-08-18 Barr Alexander L. Semiconductor structure having strained semiconductor and method therefor
US20060160291A1 (en) * 2005-01-19 2006-07-20 Sharp Laboratories Of America, Inc. Integration of biaxial tensile strained NMOS and uniaxial compressive strained PMOS on the same wafer

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050181549A1 (en) * 2004-02-17 2005-08-18 Barr Alexander L. Semiconductor structure having strained semiconductor and method therefor
US20060160291A1 (en) * 2005-01-19 2006-07-20 Sharp Laboratories Of America, Inc. Integration of biaxial tensile strained NMOS and uniaxial compressive strained PMOS on the same wafer

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
LIJUAN HUANG ET AL: "Electron and Hole Mobility Enhancement in Strained SOI by Wafer Bonding", IEEE TRANSACTIONS ON ELECTRON DEVICES, IEEE SERVICE CENTER, PISACATAWAY, NJ, US, vol. 49, no. 9, September 2002 (2002-09-01), pages 1566 - 1571, XP011072347, ISSN: 0018-9383 *
RIM K ET AL: "Fabrication and mobility characteristics of ultra-thin strained si directly on insulator (SSDOI) MOSFETs", INTERNATIONAL ELECTRON DEVICES MEETING 2003. IEDM. TECHNICAL DIGEST. WASHINGTON, DC, DEC 8 - 10, 2003, NEW YORK, NY : IEEE, US, 8 December 2003 (2003-12-08), pages 49 - 52, XP010683956, ISBN: 0-7803-7872-5 *
YANG M ET AL: "High Performance CMOS Fabricated on Hybrid Substrate With Different Crystal Orientations", INTERNATIONAL ELECTRON DEVICES MEETING 2003. IEDM. TECHNICAL DIGEST. WASHINGTON, DC, DEC 8 - 10, 2003, NEW YORK, NY : IEEE, US, 8 December 2003 (2003-12-08), pages 453 - 456, XP010684050, ISBN: 0-7803-7872-5 *

Also Published As

Publication number Publication date
WO2007030368A2 (en) 2007-03-15

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