WO2004049159A2 - Einrichtung und verfahren zur analyse von eingebetteten systemen - Google Patents
Einrichtung und verfahren zur analyse von eingebetteten systemen Download PDFInfo
- Publication number
- WO2004049159A2 WO2004049159A2 PCT/EP2003/012630 EP0312630W WO2004049159A2 WO 2004049159 A2 WO2004049159 A2 WO 2004049159A2 EP 0312630 W EP0312630 W EP 0312630W WO 2004049159 A2 WO2004049159 A2 WO 2004049159A2
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- memory
- cpu
- data
- analysis device
- embedded system
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/30—Monitoring
- G06F11/34—Recording or statistical evaluation of computer activity, e.g. of down time, of input/output operation ; Recording or statistical evaluation of user activity, e.g. usability assessment
- G06F11/3466—Performance evaluation by tracing or monitoring
- G06F11/348—Circuit details, i.e. tracer hardware
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/2221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test input/output devices or peripheral units
Definitions
- the invention relates to an analysis device according to the preamble of claim 1, an embedded system according to the preamble of claim 12 and a method for analyzing an embedded system with an analysis device.
- test operations can be carried out using a "boundary scan” test method.
- This method enables processing of the processor (Smglesteppmg), the setting of breakpoints and the setting of so-called atchpoints.
- BESTATIGUNGSKOPIE Also known is the so-called trace interface, in which the use of a bond-out chip for real-time analysis enables the forwarding of all relevant CPU bus signals (address, data and control signals) via housing pins, for example to an external logic analysis device.
- a bond-out chip is a microcontroller (MCU) in another housing, in which the processor bus (data, address and control signals) is bonded to the outside.
- MCU microcontroller
- the object of the present invention is therefore to provide an analysis device for embedded systems which can also be used in the fast embedded systems which are customary today.
- the invention is based on the following considerations: On the one hand, the internal system state of an embedded system can be described or analyzed by its current data memory content (RAM). It follows from this that if this memory content can be copied to an external data memory in real time, there is a possibility of further processing and evaluating the system state from there by a downstream evaluation unit.
- RAM current data memory content
- a copy of the internal system status is preferably written to an external memory in real time.
- the analysis device is preferably part of an embedded system, which is used in particular in electronic control units for motor vehicle brake systems.
- essential components of the system such as e.g. one or more CPU 's and memory partially or fully redundant. This increases the operational security of the embedded system.
- the data is preferably not logged in such a way that the entire memory content or the content of an entire memory area is transmitted, but only the changes in the memory, in particular all write accesses of the CPU and / or the periphery, are transmitted. In this way, the bandwidth required for data output can be reduced.
- the system also preferably includes means for direct data output by the CPU.
- means for direct data output there are in particular means for automatic replication of the data in the background by the Analysis module provided. This has the advantage of increased flexibility in data output.
- a universal data input and output module is proposed according to the invention, which is set up in such a way that data exchange with an embedded system can be carried out in real time without this (even temporarily) having to be stopped (non -intrusive).
- the analysis device Compared to the software debugging devices known from the prior art, the analysis device according to the invention has the advantage that when developing control algorithms such. B. for motor vehicle brake systems, the dynamic system behavior, in particular the control variables can be tracked during debugging. It is also advantageous that for the use of an embedded system in a hardware-in-the-loop simulator or in a rapid prototyping system, data can be entered into the embedded system.
- the invention further relates to a method for analyzing an embedded system described above with an analysis device according to claim 12.
- the method has the advantage that the processing speed of the embedded system is not reduced by the debugging processes running in the background. This enables real-time processing of the data even during debugging.
- the method according to the invention preferably also comprises steps for real-time output of the complete data storage content. Further preferred embodiments result from the subclaims.
- FIG 1 shows an embedded system 9 with an analysis device 4 according to the invention.
- Embedded system 9 comprises one or more CPU's 1, a RAM 3, an analysis device 4 and a debugging interface 5. To simplify the block diagram, other common functional elements of the embedded system, such as ROM, clock generation, 10, etc., are not shown ,
- the analysis device has three functional modes, which are described below.
- function mode 1 the analysis device also reads all write accesses of the CPU 1 from the data memory 3. All write accesses of the CPU 1 to data memory 3 are thus automatically written to the external data memory 6 via a parallel interface 5 via a parallel interface 5 by the proposed extended data output / input unit 4 (EDP, enhanced data port) via CPU bus 2.
- EDP extended data output / input unit 4
- the controller must have at least the same bandwidth as the memory 3 used.
- the controller also has, in particular, a connection to the control bus and to the address bus, so that, according to a preferred embodiment of the method, only specially selected address areas and / or specially selected data types can be tracked for analysis. For the tap of the data and the As a result, data transfer does not have to be executed by CPU 1.
- the external data memory 6 is preferably designed as a dual-port memory and generally contains an exact image of the memory areas observed in RAM 3 or of the entire memory content of RAM 3.
- Memory 6 can also be a ring memory which receives the incoming memory Stores data stream for later (offline) analysis.
- External interface 5 preferably has a bandwidth that is smaller than the bandwidth of the CPU bus.
- FIFO memory 8 which is arranged within the data output unit 4, ensures that the tapped data is buffered over time. In this way, accesses to interface 5 can also be output in which a cache line or a CPU register dump is written back when the function begins.
- analysis device 4 also reads all read accesses from CPU 1 to the data memory. This mode largely corresponds to function mode 1, but there are the following differences: All read accesses are automatically output via interface 5. Analysis unit 4 registers all processes, such as read cycles, write cycles, etc., which are visible on the CPU bus (read along). In function mode 2, CPU 1 actively performs a memory dump, which, however, is accompanied by a slight tolerable loss of runtime. By reading the analysis unit 4, the number of clock cycles that are required for the output of data words for analysis are reduced or even avoided entirely. CPU 1 reads the data memory contents into the non-drawn registers of the CPU. The data present in the registers can then be written in analysis unit 4. The mode of operation described here essentially corresponds to function mode 3 described below.
- CPU 1 reads the data memory content into the CPU registers.
- the data output unit 4 which overhears the data bus, automatically outputs the corresponding data, i.e. no explicit write cycle is required for data output for analysis.
- function mode 3 there is a direct write to the data output unit or a direct read from the data output unit.
- Function mode 3 thus corresponds to function mode 1, except for the fact that the data are actively output externally by the CPU 1 to the analysis unit 4 or actively read in from there, which, however, requires additional clock cycles.
- the analysis unit can transmit data from the external memory 6 to typical debugging applications, such as e.g. Real-time monitoring of system status 10, offline analysis to create a complete data memory image via module 11, flash download via communication channel 12 (programming the program memory), parameter variation during operation of the embedded system, transmission of system stimuli, rapid prototyping and hardware-in-the -Loop simulation will be transmitted.
- typical debugging applications such as e.g. Real-time monitoring of system status 10, offline analysis to create a complete data memory image via module 11, flash download via communication channel 12 (programming the program memory), parameter variation during operation of the embedded system, transmission of system stimuli, rapid prototyping and hardware-in-the -Loop simulation will be transmitted.
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Debugging And Monitoring (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Abstract
Description
Claims
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP03782193A EP1565825A2 (de) | 2002-11-22 | 2003-11-12 | Einrichtung und verfahren zur analyse von eingebetteten systemen |
| US10/535,598 US20060150021A1 (en) | 2002-11-22 | 2003-11-12 | Device and method for analyzing embedded systems |
| DE10393102T DE10393102D2 (de) | 2002-11-22 | 2003-11-12 | Einrichtung und Verfahren zur Analyse von eingebetteten Systemen |
| JP2004554338A JP2006507586A (ja) | 2002-11-22 | 2003-11-12 | 埋め込みシステムの解析装置及び方法 |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE10254788.2 | 2002-11-22 | ||
| DE10254788 | 2002-11-22 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| WO2004049159A2 true WO2004049159A2 (de) | 2004-06-10 |
| WO2004049159A3 WO2004049159A3 (de) | 2005-05-19 |
Family
ID=32335768
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/EP2003/012630 Ceased WO2004049159A2 (de) | 2002-11-22 | 2003-11-12 | Einrichtung und verfahren zur analyse von eingebetteten systemen |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20060150021A1 (de) |
| EP (1) | EP1565825A2 (de) |
| JP (1) | JP2006507586A (de) |
| DE (1) | DE10393102D2 (de) |
| WO (1) | WO2004049159A2 (de) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102005055229A1 (de) * | 2004-11-26 | 2006-06-08 | Continental Teves Ag & Co. Ohg | Festverdrahteter elektronischer Digitalschaltkreis |
| DE102005020899A1 (de) * | 2005-05-04 | 2006-11-16 | Siemens Ag | Verfahren und Vorrichtung zur Messung der Testabdeckung bei Multithreading-Programmen |
| WO2007139733A2 (en) | 2006-05-22 | 2007-12-06 | Ideal Aerosmith Inc. | Simulation system including motion controller |
| US7702400B2 (en) | 2006-05-22 | 2010-04-20 | Ideal Aerosmith, Inc. | Motion controllers and simulation systems including motion controllers |
| DE102011007437A1 (de) | 2010-11-15 | 2012-05-16 | Continental Teves Ag & Co. Ohg | Verfahren und Schaltungsanrodnung zur Datenübertragung zwischen Prozessorbausteinen |
| CN107102921A (zh) * | 2017-03-23 | 2017-08-29 | 北京航天自动控制研究所 | 一种面向带I/O型数字量异步端口SoC的数字量监测方法 |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7725922B2 (en) * | 2006-03-21 | 2010-05-25 | Novell, Inc. | System and method for using sandboxes in a managed shell |
| US7743414B2 (en) * | 2006-05-26 | 2010-06-22 | Novell, Inc. | System and method for executing a permissions recorder analyzer |
| US7805707B2 (en) * | 2006-07-21 | 2010-09-28 | Novell, Inc. | System and method for preparing runtime checks |
| US7739735B2 (en) * | 2006-07-26 | 2010-06-15 | Novell, Inc. | System and method for dynamic optimizations using security assertions |
| US7856654B2 (en) * | 2006-08-11 | 2010-12-21 | Novell, Inc. | System and method for network permissions evaluation |
| US7823186B2 (en) * | 2006-08-24 | 2010-10-26 | Novell, Inc. | System and method for applying security policies on multiple assembly caches |
| US20080056139A1 (en) * | 2006-09-06 | 2008-03-06 | Mentor Graphics Corporation | Network traffic monitoring using embedded target-side analyzer during embedded software development |
| JP4856023B2 (ja) * | 2007-08-08 | 2012-01-18 | パナソニック株式会社 | リアルタイムウォッチ装置及びその方法 |
| JP2010538338A (ja) * | 2007-08-31 | 2010-12-09 | エアバス オペラシオン | シミュレーション・システムからの命令と診断モジュールからの命令を実行できる電子機器ボードと、それに関連するシミュレーション方法 |
| TWI388979B (zh) * | 2009-09-18 | 2013-03-11 | Asustek Comp Inc | 電腦系統及監控裝置 |
| CN104090833B (zh) * | 2014-06-20 | 2016-10-05 | 英业达科技有限公司 | 服务器及其讯号解析装置 |
| EP3227790A4 (de) | 2014-12-05 | 2018-12-26 | Honeywell International Inc. | Überwachungs- und steuerungssystem unter verwendung von cloud-diensten |
| CN119621521B (zh) * | 2025-02-17 | 2025-07-18 | 北谷电子股份有限公司 | 用于嵌入式系统的数据存储分析装置 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5771240A (en) * | 1996-11-14 | 1998-06-23 | Hewlett-Packard Company | Test systems for obtaining a sample-on-the-fly event trace for an integrated circuit with an integrated debug trigger apparatus and an external pulse pin |
| US6142683A (en) * | 1997-04-08 | 2000-11-07 | Advanced Micro Devices, Inc. | Debug interface including data steering between a processor, an input/output port, and a trace logic |
| US6769076B1 (en) * | 2000-02-07 | 2004-07-27 | Freescale Semiconductor, Inc. | Real-time processor debug system |
| US6732311B1 (en) * | 2000-05-04 | 2004-05-04 | Agere Systems Inc. | On-chip debugger |
| US6748558B1 (en) * | 2000-05-10 | 2004-06-08 | Motorola, Inc. | Performance monitor system and method suitable for use in an integrated circuit |
| JP2002163127A (ja) * | 2000-11-27 | 2002-06-07 | Mitsubishi Electric Corp | トレース制御回路 |
| DE10119265A1 (de) * | 2001-04-20 | 2002-10-31 | Infineon Technologies Ag | Programmgesteuerte Einheit |
| US6834360B2 (en) * | 2001-11-16 | 2004-12-21 | International Business Machines Corporation | On-chip logic analyzer |
-
2003
- 2003-11-12 JP JP2004554338A patent/JP2006507586A/ja not_active Withdrawn
- 2003-11-12 DE DE10393102T patent/DE10393102D2/de not_active Expired - Lifetime
- 2003-11-12 WO PCT/EP2003/012630 patent/WO2004049159A2/de not_active Ceased
- 2003-11-12 EP EP03782193A patent/EP1565825A2/de not_active Withdrawn
- 2003-11-12 US US10/535,598 patent/US20060150021A1/en not_active Abandoned
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102005055229A1 (de) * | 2004-11-26 | 2006-06-08 | Continental Teves Ag & Co. Ohg | Festverdrahteter elektronischer Digitalschaltkreis |
| DE102005020899A1 (de) * | 2005-05-04 | 2006-11-16 | Siemens Ag | Verfahren und Vorrichtung zur Messung der Testabdeckung bei Multithreading-Programmen |
| WO2007139733A2 (en) | 2006-05-22 | 2007-12-06 | Ideal Aerosmith Inc. | Simulation system including motion controller |
| WO2007139733A3 (en) * | 2006-05-22 | 2008-04-03 | Ideal Aerosmith Inc | Simulation system including motion controller |
| US7702400B2 (en) | 2006-05-22 | 2010-04-20 | Ideal Aerosmith, Inc. | Motion controllers and simulation systems including motion controllers |
| DE102011007437A1 (de) | 2010-11-15 | 2012-05-16 | Continental Teves Ag & Co. Ohg | Verfahren und Schaltungsanrodnung zur Datenübertragung zwischen Prozessorbausteinen |
| WO2012065760A1 (de) | 2010-11-15 | 2012-05-24 | Continental Teves Ag & Co. Ohg | Verfahren und schaltungsanordnung zur datenübertragung zwischen prozessorbausteinen |
| CN107102921A (zh) * | 2017-03-23 | 2017-08-29 | 北京航天自动控制研究所 | 一种面向带I/O型数字量异步端口SoC的数字量监测方法 |
| CN107102921B (zh) * | 2017-03-23 | 2020-05-12 | 北京航天自动控制研究所 | 一种面向带I/O型数字量异步端口SoC的数字量监测方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2004049159A3 (de) | 2005-05-19 |
| JP2006507586A (ja) | 2006-03-02 |
| EP1565825A2 (de) | 2005-08-24 |
| US20060150021A1 (en) | 2006-07-06 |
| DE10393102D2 (de) | 2005-07-21 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| EP1565825A2 (de) | Einrichtung und verfahren zur analyse von eingebetteten systemen | |
| EP1720100B1 (de) | Verfahren und Vorrichtung zur Emulation einer programmierbaren Einheit | |
| DE69915377T2 (de) | Auf-chip fehlersuchsystem | |
| DE4313594C2 (de) | Mikroprozessor | |
| DE19742577C1 (de) | Schaltungsanordnung zur In-Circuit-Emulation eines Mikrocontrollers | |
| DE69415600T2 (de) | Mikrokontroller mit hardwaremässiger Fehlerbeseitigungsunterstützung nach dem Boundary-Scanverfahren | |
| EP1248198B1 (de) | Programmgesteuerte Einheit mit Emulations-Einheiten | |
| DE60023882T2 (de) | System auf einem Chip mit reprogrammierbarem Testgerät, Fehlerbeseitiger und Busüberwachung | |
| DE69801156T2 (de) | Mikroprozessorbetriebene anordnung mit cache-speicher zum aufnehmen von software-leistungsprofildaten | |
| DE69717824T2 (de) | Verfahren und vorrichtung zum software-test | |
| DE2328058A1 (de) | Digitale datenverarbeitungsanordnung | |
| DE69815006T2 (de) | Datenverarbeitungseinheit mit Fehlerbeseitungsmöglichkeiten | |
| DE102009058652A1 (de) | Verfahren zur Beeinflussung eines Steuergerätes und Manipulationseinheit | |
| EP1716490B1 (de) | Einrichtung und verfahren zur analyse von eingebetteten systemen für sicherheitskritische rechnersysteme in kraftfahrzeugen | |
| DE69714379T2 (de) | Integrierte Halbleiterspeicheranordnung und Kommunikationsverfahren dafür | |
| DE69411096T2 (de) | Entwicklungsunterstützungssystem für einen Mikrocomputer mit internem Cachespeicher | |
| DE3037475A1 (de) | Schnittstellenschaltungsanordnung fuer eine datenverarbeitungsanlage | |
| EP3647801A1 (de) | Verfahren zur überprüfung eines fpga-programms | |
| DE102020111259A1 (de) | On-chip-ausführung eines in-system-tests unter verwendung eines verallgemeinerten testbildes | |
| DE102004043063B4 (de) | Verfahren zum Betreiben eines Halbleiter-Bauelements mit einem Test-Modul | |
| DE19903302B4 (de) | Verfahren und Vorrichtung zur Überprüfung der Funktion eines Rechners | |
| DE102020111261A1 (de) | Feldadaptierbare in-system-testmechanismen | |
| CH694927A5 (de) | Verfahren und Vorrichtung zur Fehleranalyse digitaler Logikschatungen.. | |
| DE19544723C2 (de) | Prozessor-Analysesystem | |
| EP1248195B1 (de) | Verbindungsprüfung zwischen einer programmgesteuerten Einheit und einer Schaltung |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| AK | Designated states |
Kind code of ref document: A2 Designated state(s): DE JP US |
|
| AL | Designated countries for regional patents |
Kind code of ref document: A2 Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR IE IT LU MC NL PT SE SK TR |
|
| 121 | Ep: the epo has been informed by wipo that ep was designated in this application | ||
| WWE | Wipo information: entry into national phase |
Ref document number: 2003782193 Country of ref document: EP |
|
| WWE | Wipo information: entry into national phase |
Ref document number: 2004554338 Country of ref document: JP |
|
| REF | Corresponds to |
Ref document number: 10393102 Country of ref document: DE Date of ref document: 20050721 Kind code of ref document: P |
|
| WWE | Wipo information: entry into national phase |
Ref document number: 10393102 Country of ref document: DE |
|
| WWP | Wipo information: published in national office |
Ref document number: 2003782193 Country of ref document: EP |
|
| ENP | Entry into the national phase |
Ref document number: 2006150021 Country of ref document: US Kind code of ref document: A1 |
|
| WWE | Wipo information: entry into national phase |
Ref document number: 10535598 Country of ref document: US |
|
| WWP | Wipo information: published in national office |
Ref document number: 10535598 Country of ref document: US |
|
| WWW | Wipo information: withdrawn in national office |
Ref document number: 2003782193 Country of ref document: EP |