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WO1988009510A1 - Procede de determination de la duree electrique de sections de signaux - Google Patents

Procede de determination de la duree electrique de sections de signaux Download PDF

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Publication number
WO1988009510A1
WO1988009510A1 PCT/DE1988/000271 DE8800271W WO8809510A1 WO 1988009510 A1 WO1988009510 A1 WO 1988009510A1 DE 8800271 W DE8800271 W DE 8800271W WO 8809510 A1 WO8809510 A1 WO 8809510A1
Authority
WO
WIPO (PCT)
Prior art keywords
pulse
receiver
signal
time
signal path
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/DE1988/000271
Other languages
German (de)
English (en)
Inventor
Klaus Welzhofer
Antun Vuksic
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Siemens Corp
Original Assignee
Siemens AG
Siemens Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG, Siemens Corp filed Critical Siemens AG
Publication of WO1988009510A1 publication Critical patent/WO1988009510A1/fr
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
    • G01R29/027—Indicating that a pulse characteristic is either above or below a predetermined value or within or beyond a predetermined range of values
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G01R31/3191—Calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay

Definitions

  • the invention relates to a method for determining the electrical propagation time of signal paths, which in each case at one end at a connection point, e.g. for an integrated module, are connected and each have a transmitter and a receiver at the other end.
  • Automatic test machines are used, e.g. Check integrated circuits for correctness.
  • the automatic tester has connection points, e.g. Contact elements, into which the circuit to be tested, called the device under test, is inserted.
  • the test object is then fed test signals from the automatic test machine, and the response signals which are then emitted by the test object are taken and compared with target signals.
  • the test signals and the response signals are transmitted via signal paths, one signal path being assigned to a connection point of the test object.
  • Each signal path has a transmitter for generating test signals and a receiver for evaluating the response signals.
  • each signal path is operated in one direction or the other.
  • all signal paths at the connection point for the test object also called the test object seam, must have the same electrical length, i.e. the signal paths involved in the test for actuation or transmission (the connections of the test object are inputs) with formatting logic, Driver etc. or reception case (the connections of the test object are outputs) with cable, comparator, error logic etc. should II 1
  • the - 14.5.87 each have the same electrical transit time, or take into account the falsification of the driver pulse edges and their passage through the circuit switching threshold of the device under test under different load conditions. However, since the individual signal paths have different transit times, the signals transmitted via the signal paths must be corrected. This process is called "deskewing".
  • the correction can be carried out using complex external measurement methods. For example, pulses can be fed into or taken from the device under test via an integrated relay switching matrix in conjunction with special drivers and comparator circuits and the runtime of the individual signal path can be determined.
  • this method is complex and does not take into account the fact that the additionally inserted circuits also have a running time.
  • the object on which the invention is based is to specify a method in which a correction value for correcting the different transit times of signal paths can be obtained in the case of transmission without great additional outlay. This object is achieved in a method according to the preamble of patent claim 1 by the features of the characterizing part of patent claim 1.
  • the advantage of the method according to the invention lies in the fact that a short-circuit bridge is at most required as an additional element, with the aid of which the transit time of the signal path can be determined in the case of reception. If the runtime is known in the case of receipt, then no additional elements are required; those in the test car are sufficient mat already existing units. Another advantage is that it is automatically taken into account if there is a greater capacitive load at the test object input, since the reflected pulse represents the pulse quality (edge shape) actually present at the test object input. With the help of the method, the transit time of the electrical signal path is thus detected as it actually exists under load.
  • FIG. 1 shows a model in which a test specimen is arranged between two signal paths
  • FIG. 2 shows a pulse diagram in which voltages are plotted over time t and which shows the pulse ratios on the signal paths
  • FIG. 3 shows a plurality of signal paths used to determine the
  • FIG. 4 are a pulse diagram in which voltages are plotted against time t and which shows the pulse ratios on the signal paths in FIG. 3.
  • a signal path SS consists of a transmitter S, a receiver E and a line L. At one end, the line L, the transmitter S and the receiver E are connected. At the other end of line L, a connection point AS is provided for a DUT. In the case of transmission, the transmitter S is switched on and the receiver is blocked; in the case of reception, the situation is reversed.
  • the running times of the individual components are also shown in FIG. 1.
  • the transit time of the transmitter for example transmitter S1
  • TS1 the transit time of line L1 TL1 and the transit time of receiver E1 TE1.
  • a signal e.g. a test signal, must be sent via the transmitter S1 in the runtime TS1, the line L1 with the runtime TL1 to the connection point AS1, and from there via the device under test DUT the transit time TX to the connection point AS2 and from there via line L2 with the transit time TL2 and the receiver E2 with the transit time TE2.
  • the transit times TS1 and TL1 must be known or ascertainable. If the transit times TL2 and TE2 or TS2 can still be determined, then the transit time TX of the device under test DUT can also be determined.
  • Transit time in the case of transmission can be determined via the signal path SS1.
  • a transmission pulse is generated by the transmitter S1, which has the form at line A1 according to line 1 of FIG. 2.
  • This pulse arrives at point B1 of the signal path via a resistor R. Since a voltage division is carried out at this point, the pulse then has the form shown in line 2 of FIG. 2.
  • the amplitude of the pulse has been halved.
  • the pulse now runs from point B1 via line L1 to point C1 of the signal path. It arrives delayed by the term TL1.
  • the pulse train at point C1 of the signal path is shown in line 3 of FIG. 2.
  • the pulse is reflected and runs back via line L1 to point B1 of the signal path SS1. Accordingly, a reflected pulse from C1 and the pulse already present at B1 overlap to form a pulse as shown in the second line of FIG. 2.
  • the reflected pulse arrives at point B1 delayed by the transit time TL1 of line L1.
  • the runtime TL1 can now be there by determining that it is determined via the receiver E1 when the transmit pulse at point B1 exceeds, for example, 50% of its amplitude and then when the reflected pulse at point B1 exceeds 50% of its amplitude. This measurement gives a pulse of the form shown in line 7 of FIG. 2 at the output K1 of the receiver E1.
  • the two measured values 3 and 7 result, which are subtracted from one another.
  • the value for TL results from halving the difference.
  • the first measured value is designated in FIG. 2 with K1 (25%), the second measured value with K1 (75%). This is because the first measured value is generated when the pulse at point B1 exceeds 25% of the total amplitude, the second measured value when the pulse exceeds 75% of its total amplitude.
  • the point in time of the arrival of a signal at point C1 can be determined by determining the second measured value Kl (75%) and the sum TL1 + TE1 thereof is subtracted. This is indicated in line 7 of FIG. 2.
  • the transmission pulse which has been fed to the DUT, passes through the DUT and reaches the output C2 of the DUT. From there it is transmitted via line L2 with the runtime TL2 to the receiver E2 and appears at the output of the receiver E2 after the runtime TE2.
  • the signal that occurs at the output of the receiver E2 is designated K2 and is shown in line 8 of FIG. 2.
  • the signals at point C2 (line 4) and at point B2 (line 5) are also shown.
  • the pulse occurs delayed by the transit time TX at point C2 at the output of the DUT to reduce the run Time TL2 continues to be delayed at point B2 and the delay TE2 is delayed at the output of receiver E at point K2.
  • the transit time TX can be calculated by the DUT without difficulty.
  • the time of the occurrence of the pulse at K2 is again determined with the aid of a sampling clock CL, the transit time TL2 + TE2 is known and thus the time of the occurrence of the pulse at point C2 results from the difference of the third measured value (occurrence of the pulse at K2 ) minus the sum of the term TL2 + TE2.
  • the transit times of the signal paths SS in the case of reception can also be determined with the help of the signal paths themselves. This will be explained with reference to FIGS. 3 and 4.
  • FIG. 3 there are, for example, eight signal paths SS, which are each constructed in accordance with FIG. 1. In reality, there are many more signal paths in a test machine, eg 1024 signal paths.
  • the connection points AS are now short-circuited with the aid of a short-circuit bridge KB. Then all channels S except for the. Transmitter of the signal path to be measured switched on, all receivers E except the receiver of the signal path to be measured switched off.
  • the transmitter S1 of this signal path is switched off and the receiver E1 of this signal path is switched on tet.
  • the switched-on transmitters S of the signal paths not to be measured are activated at the same time and emit a signal at output A. Since the individual transmitters S can already have different running times, the pulses appear at the output of the active transmitters S at different times. This is indicated in line Z1 of FIG. 4, for example the first pulse edge is the pulse edge that appears at the output A2 of the signal path SS2.
  • the last pulse edge of line Z1 is the pulse edge that appears at output A8 of signal path SS8.
  • the pulse diagram of the first line is a superposition of the pulses occurring at points A of the signal paths in their temporal relationship to one another.
  • the pulse edges shown in the second line of Z2 Fig. 4 then occur at point B of the signal paths SS.
  • there is a voltage divider at point B which halves the amplitude of the pulse at point A.
  • the first pulse is the pulse at point B2 of the signal path SS2
  • the last pulse is the pulse at point B8 of the eighth signal path SS8.
  • the individual pulses of the different signal paths are again shown superimposed in the second line Z2 FIG. 4.
  • the pulse edge at point B is now transmitted via lines L to point D of connection point AS. After a running time determined by line L, the pulse edge appears at point D, as shown in FIG. 4, line Z3. Since the connection points AS are short-circuited with the short-circuit bridge KB, the pulses transmitted via the lines L overlap to form a central pulse Z1, which is built up from the pulse edges transmitted via the signal path SS and pulse edges reflected at point D. The shape of this central pulse Z1 hardly changes when other signal paths are measured, because of the large number of signal paths the pulses are sent, differences in the running time of the individual signal stretches are compensated.
  • the central pulse Z1 at point D runs over the.
  • Line L1 of the signal path SS1 continues and arrives at point B1 of the signal path SS1 after the running time TL1 of line L1.
  • the pulse edge of the central pulse thus also reaches the receiver E1.
  • the receiver E1 can emit a signal.
  • the time of occurrence of this signal is determined using the sampling clock CL. That is, a signal corresponding to the sixth line Z6 of FIG. 4 appears at the output of the receiver E1 when the central pulse exceeds the reference voltage UR and a sampling clock CL is present at the same time. In the exemplary embodiment in FIG. 4, this is the sampling clock 4.
  • This value is stored in a table and is a measure of the transit time of a pulse from point D to the output of the receiver E1, and thus corresponds to the transit time in the case of reception.
  • the method just described is repeated for all signal paths SS, the transmitters of the signal paths not to be measured always being activated simultaneously and only the receiver of the signal path to be measured being switched on. If the sampling clock CL is always started at the same time as when the transmitter S was activated, then the number of sampling clocks can be determined for each signal path when the pulse edge of the central pulse occurs at the receiver of the signal path to be measured. In this way, one obtains relative values for the different transit times of the signal routes, which are indicative of the different transit times of the signal routes. If these measured values are still standardized, e.g. to the smallest measured value, then the signals transmitted via the signal paths in the case of reception can be corrected with the aid of this normalized value of each signal path.
  • circuit arrangements used in the process e.g. to generate sampling clocks are usually available in test machines and are therefore not explained.
  • the procedure for determining the transit time in the transmission case using the transit time values that apply to the reception case is very precise.
  • This method also takes into account the flanking of the pulse edges, which is caused at the test specimen input with a corresponding capacitive load.
  • This capacitive load has an effect on a pulse flattening, which is transmitted back to the receiver as a reflected pulse flank and correspondingly later leads to the signal K1 (75%). Since all measured values relate to a sampling clock CL and its delay resolution, the calibration becomes more precise the more linear the sampling clock and the finer its delay resolution.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

En particulier dans des équipements de contrôle automatique de circuits intégrés, toutes les sections de signaux devraient idéalement avoir au joint de la pièce à contrôler la même longueur électrique. Les sections de signaux utilisées pendant le contrôle comprennent, dans le cas du déclenchement ou de la transmission, une logique de mise en forme, une commande et un câble, et dans le cas de la réception, un câble, un comparateur, une logique de détection d'erreurs, etc. Si les sections de signaux ont des durées électriques diverses, dans le cas de la transmission les signaux à émettre doivent être corrigés. Selon un procédé de détermination de la durée électrique de sections de signaux ayant chacune un émetteur et un récepteur et à l'autre extrémité des points de connexion, par exemple d'un circuit intégré, l'émetteur (S1) de la section de signaux (SS1) produit une impulsion de tansmission qui est transmise à travers la section de signaux jusqu'au point de connexion (AS1) avec la pièce à contrôler (DUT). La première mesure effectuée au moyen du récepteur (E1) concerne le moment auquel l'impulsion de transmission dépasse 50 % de l'amplitude de l'impulsion de transmission. La deuxième mesure effectuée au moyen du récepteur (E1) concerne le moment auquel une impulsion en provenance de l'entrée de la pièce à contrôler et réfléchie suite à l'impulsion de transmission dépasse 50 % de l'impulsion réfléchie. Le moment où l'impulsion de transmission pénètre dans la pièce à contrôler, et par conséquent la durée électrique dans le cas de la transmission, est déterminé en soustrayant la première mesure de la seconde mesure.
PCT/DE1988/000271 1987-05-29 1988-05-05 Procede de determination de la duree electrique de sections de signaux Ceased WO1988009510A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DEP3718114.9 1987-05-29
DE19873718114 DE3718114A1 (de) 1987-05-29 1987-05-29 Verfahren zur feststellung der elektrischen laufzeit von signalstrecken

Publications (1)

Publication Number Publication Date
WO1988009510A1 true WO1988009510A1 (fr) 1988-12-01

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PCT/DE1988/000271 Ceased WO1988009510A1 (fr) 1987-05-29 1988-05-05 Procede de determination de la duree electrique de sections de signaux

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WO (1) WO1988009510A1 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0501722A3 (en) * 1991-02-26 1993-05-12 Verisys Incorporated Transmission line length measurement method and apparatus

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4314324C1 (de) * 1993-04-30 1994-07-28 Siemens Ag Verfahren zum kollisionsfreien Testbetrieb eines Prüflings

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2752331A1 (de) * 1977-06-10 1978-12-21 Elektronikus Verfahren und vorrichtung zur messung der dynamischen uebertragungseigenschaften von elektrischen schaltungen
DE2833608A1 (de) * 1978-07-31 1980-02-28 Siemens Ag Vorrichtung zum bestimmen der laufzeit in elektronischen schaltungen

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2752331A1 (de) * 1977-06-10 1978-12-21 Elektronikus Verfahren und vorrichtung zur messung der dynamischen uebertragungseigenschaften von elektrischen schaltungen
DE2833608A1 (de) * 1978-07-31 1980-02-28 Siemens Ag Vorrichtung zum bestimmen der laufzeit in elektronischen schaltungen

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0501722A3 (en) * 1991-02-26 1993-05-12 Verisys Incorporated Transmission line length measurement method and apparatus
US5321632A (en) * 1991-02-26 1994-06-14 Nippon Telegraph And Telephone Corporation Method and apparatus for measuring the length of a transmission line in accordance with a reflected waveform
EP0736773A3 (fr) * 1991-02-26 1996-10-16 Nippon Telegraph And Telephone Corporation Procédé et appareil de mesure de la longueur d'une ligne de transmission

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Publication number Publication date
DE3718114A1 (de) 1988-12-08

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