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USD320361S - Wafer probe plate holder - Google Patents

Wafer probe plate holder Download PDF

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Publication number
USD320361S
USD320361S US07/360,754 US36075489F USD320361S US D320361 S USD320361 S US D320361S US 36075489 F US36075489 F US 36075489F US D320361 S USD320361 S US D320361S
Authority
US
United States
Prior art keywords
plate holder
wafer probe
probe plate
wafer
holder
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US07/360,754
Inventor
Wataru Karasawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Ltd
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Priority to US07/360,754 priority Critical patent/USD320361S/en
Assigned to TOKYO ELECTRON LIMITED reassignment TOKYO ELECTRON LIMITED ASSIGNMENT OF ASSIGNORS INTEREST. Assignors: KARASAWA, WATARU
Application granted granted Critical
Publication of USD320361S publication Critical patent/USD320361S/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

FIG. 1 is a front elevational view of a wafer probe plate holder showing my new design, the rear, right and left side elevational views being identical;
FIG. 2 is a top plan view;
FIG. 3 is a bottom plan view; and
FIG. 4 is a cross sectional view thereof taken along line 4-4' of FIG. 2 thereof.

Claims (1)

  1. The ornamental design for a wafer probe plate holder, as shown and described.
US07/360,754 1989-06-02 1989-06-02 Wafer probe plate holder Expired - Lifetime USD320361S (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US07/360,754 USD320361S (en) 1989-06-02 1989-06-02 Wafer probe plate holder

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/360,754 USD320361S (en) 1989-06-02 1989-06-02 Wafer probe plate holder

Publications (1)

Publication Number Publication Date
USD320361S true USD320361S (en) 1991-10-01

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ID=70292256

Family Applications (1)

Application Number Title Priority Date Filing Date
US07/360,754 Expired - Lifetime USD320361S (en) 1989-06-02 1989-06-02 Wafer probe plate holder

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US (1) USD320361S (en)

Cited By (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD563329S1 (en) * 2005-09-20 2008-03-04 Matsushita Electric Industrial Co., Ltd. Diaphragm for a switch
USD563328S1 (en) * 2005-09-20 2008-03-04 Matsushita Electric Industrial Co., Ltd. Diaphragm for a switch
USD639755S1 (en) * 2010-01-20 2011-06-14 Celadon Systems, Inc. Top contact layout board in an electrical system
USD639757S1 (en) * 2010-08-16 2011-06-14 Celadon Systems, Inc. Top contact layout board in an electrical system
USD654033S1 (en) * 2010-01-20 2012-02-14 Celadon Systems, Inc. Grooved wire support for a probe test core
USD664170S1 (en) 2011-03-04 2012-07-24 Applied Materials, Inc. Cleaning plate for inducing turbulent flow of a processing chamber cleaning glass
USD691974S1 (en) * 2011-12-22 2013-10-22 Tokyo Electron Limited Holding pad for transferring a wafer
USD693319S1 (en) * 2011-12-22 2013-11-12 Tokyo Electron Limited Holding pad for transferring a wafer
USD703162S1 (en) * 2012-10-17 2014-04-22 Sumitomo Electric Industries, Ltd. Wafer holder for stepper
USD713363S1 (en) * 2013-12-31 2014-09-16 Celadon Systems, Inc. Support for a probe test core
USD716742S1 (en) * 2013-09-13 2014-11-04 Asm Ip Holding B.V. Substrate supporter for semiconductor deposition apparatus
US8910644B2 (en) 2010-06-18 2014-12-16 Applied Materials, Inc. Method and apparatus for inducing turbulent flow of a processing chamber cleaning gas
USD722031S1 (en) * 2013-12-31 2015-02-03 Celadon Systems, Inc. Top contact layout board in an electrical system
USD724553S1 (en) * 2013-09-13 2015-03-17 Asm Ip Holding B.V. Substrate supporter for semiconductor deposition apparatus
USD784937S1 (en) * 2014-11-13 2017-04-25 Tokyo Electron Limited Dummy wafer
USD785576S1 (en) 2014-11-13 2017-05-02 Tokyo Electron Limited Dummy wafer
USD786810S1 (en) 2014-11-13 2017-05-16 Tokyo Electron Limited Dummy wafer
USD854506S1 (en) * 2018-03-26 2019-07-23 Veeco Instruments Inc. Chemical vapor deposition wafer carrier with thermal cover
USD858469S1 (en) * 2018-03-26 2019-09-03 Veeco Instruments Inc. Chemical vapor deposition wafer carrier with thermal cover
USD860147S1 (en) * 2018-03-26 2019-09-17 Veeco Instruments Inc. Chemical vapor deposition wafer carrier with thermal cover
USD860146S1 (en) 2017-11-30 2019-09-17 Veeco Instruments Inc. Wafer carrier with a 33-pocket configuration
USD863239S1 (en) * 2018-03-26 2019-10-15 Veeco Instruments Inc. Chemical vapor deposition wafer carrier with thermal cover
USD866491S1 (en) * 2018-03-26 2019-11-12 Veeco Instruments Inc. Chemical vapor deposition wafer carrier with thermal cover
USD873782S1 (en) * 2016-05-17 2020-01-28 Electro Scientific Industries, Inc Component carrier plate
USD913256S1 (en) * 2019-07-31 2021-03-16 Eryn Smith Antenna pattern for a semiconductive substrate carrier
USD926716S1 (en) * 2019-07-31 2021-08-03 Eryn Smith Antenna pattern for a semiconductive substrate carrier
USD1090499S1 (en) * 2024-02-27 2025-08-26 Avery Dennison Retail Information Services Llc Antenna
USD1092453S1 (en) * 2024-04-22 2025-09-09 Avery Dennison Retail Information Services Llc Antenna
USD1100698S1 (en) * 2024-02-05 2025-11-04 Asm Ip Holding B.V. Substrate calibration fixture

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4219771A (en) 1978-02-21 1980-08-26 Texas Instruments Incorporated Four-quadrant, multiprobe-edge sensor for semiconductor wafer probing
US4649338A (en) 1980-02-28 1987-03-10 General Dynamics, Pomona Division Fine line circuitry probes and method of manufacture
US4649339A (en) 1984-04-25 1987-03-10 Honeywell Inc. Integrated circuit interface
US4755747A (en) 1984-06-15 1988-07-05 Canon Kabushiki Kaisha Wafer prober and a probe card to be used therewith
US4853627A (en) 1985-12-23 1989-08-01 Triquint Semiconductor, Inc. Wafer probes
US4862077A (en) 1987-04-29 1989-08-29 International Business Machines Corporation Probe card apparatus and method of providing same with reconfigurable probe card circuitry
US4961052A (en) 1989-01-07 1990-10-02 Mitsubishi Denki Kabushiki Kaisha Probing plate for wafer testing

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4219771A (en) 1978-02-21 1980-08-26 Texas Instruments Incorporated Four-quadrant, multiprobe-edge sensor for semiconductor wafer probing
US4649338A (en) 1980-02-28 1987-03-10 General Dynamics, Pomona Division Fine line circuitry probes and method of manufacture
US4649339A (en) 1984-04-25 1987-03-10 Honeywell Inc. Integrated circuit interface
US4755747A (en) 1984-06-15 1988-07-05 Canon Kabushiki Kaisha Wafer prober and a probe card to be used therewith
US4853627A (en) 1985-12-23 1989-08-01 Triquint Semiconductor, Inc. Wafer probes
US4862077A (en) 1987-04-29 1989-08-29 International Business Machines Corporation Probe card apparatus and method of providing same with reconfigurable probe card circuitry
US4961052A (en) 1989-01-07 1990-10-02 Mitsubishi Denki Kabushiki Kaisha Probing plate for wafer testing

Cited By (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD563328S1 (en) * 2005-09-20 2008-03-04 Matsushita Electric Industrial Co., Ltd. Diaphragm for a switch
USD563329S1 (en) * 2005-09-20 2008-03-04 Matsushita Electric Industrial Co., Ltd. Diaphragm for a switch
USD639755S1 (en) * 2010-01-20 2011-06-14 Celadon Systems, Inc. Top contact layout board in an electrical system
USD654033S1 (en) * 2010-01-20 2012-02-14 Celadon Systems, Inc. Grooved wire support for a probe test core
US8910644B2 (en) 2010-06-18 2014-12-16 Applied Materials, Inc. Method and apparatus for inducing turbulent flow of a processing chamber cleaning gas
USD639757S1 (en) * 2010-08-16 2011-06-14 Celadon Systems, Inc. Top contact layout board in an electrical system
USD664170S1 (en) 2011-03-04 2012-07-24 Applied Materials, Inc. Cleaning plate for inducing turbulent flow of a processing chamber cleaning glass
USD691974S1 (en) * 2011-12-22 2013-10-22 Tokyo Electron Limited Holding pad for transferring a wafer
USD693319S1 (en) * 2011-12-22 2013-11-12 Tokyo Electron Limited Holding pad for transferring a wafer
USD703162S1 (en) * 2012-10-17 2014-04-22 Sumitomo Electric Industries, Ltd. Wafer holder for stepper
USD716742S1 (en) * 2013-09-13 2014-11-04 Asm Ip Holding B.V. Substrate supporter for semiconductor deposition apparatus
USD724553S1 (en) * 2013-09-13 2015-03-17 Asm Ip Holding B.V. Substrate supporter for semiconductor deposition apparatus
USD713363S1 (en) * 2013-12-31 2014-09-16 Celadon Systems, Inc. Support for a probe test core
USD722031S1 (en) * 2013-12-31 2015-02-03 Celadon Systems, Inc. Top contact layout board in an electrical system
USD784937S1 (en) * 2014-11-13 2017-04-25 Tokyo Electron Limited Dummy wafer
USD786810S1 (en) 2014-11-13 2017-05-16 Tokyo Electron Limited Dummy wafer
USD785576S1 (en) 2014-11-13 2017-05-02 Tokyo Electron Limited Dummy wafer
USD873782S1 (en) * 2016-05-17 2020-01-28 Electro Scientific Industries, Inc Component carrier plate
USD860146S1 (en) 2017-11-30 2019-09-17 Veeco Instruments Inc. Wafer carrier with a 33-pocket configuration
USD863239S1 (en) * 2018-03-26 2019-10-15 Veeco Instruments Inc. Chemical vapor deposition wafer carrier with thermal cover
USD860147S1 (en) * 2018-03-26 2019-09-17 Veeco Instruments Inc. Chemical vapor deposition wafer carrier with thermal cover
USD858469S1 (en) * 2018-03-26 2019-09-03 Veeco Instruments Inc. Chemical vapor deposition wafer carrier with thermal cover
USD866491S1 (en) * 2018-03-26 2019-11-12 Veeco Instruments Inc. Chemical vapor deposition wafer carrier with thermal cover
USD854506S1 (en) * 2018-03-26 2019-07-23 Veeco Instruments Inc. Chemical vapor deposition wafer carrier with thermal cover
USD913256S1 (en) * 2019-07-31 2021-03-16 Eryn Smith Antenna pattern for a semiconductive substrate carrier
USD926716S1 (en) * 2019-07-31 2021-08-03 Eryn Smith Antenna pattern for a semiconductive substrate carrier
USD1100698S1 (en) * 2024-02-05 2025-11-04 Asm Ip Holding B.V. Substrate calibration fixture
USD1090499S1 (en) * 2024-02-27 2025-08-26 Avery Dennison Retail Information Services Llc Antenna
USD1092453S1 (en) * 2024-04-22 2025-09-09 Avery Dennison Retail Information Services Llc Antenna

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