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USD354923S - Probing head for an electrical test probe - Google Patents

Probing head for an electrical test probe Download PDF

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Publication number
USD354923S
USD354923S US29/018,212 US1821294F USD354923S US D354923 S USD354923 S US D354923S US 1821294 F US1821294 F US 1821294F US D354923 S USD354923 S US D354923S
Authority
US
United States
Prior art keywords
test probe
electrical test
probing head
probing
head
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US29/018,212
Inventor
Mark W. Nightingale
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Priority to US29/018,212 priority Critical patent/USD354923S/en
Assigned to TEKTRONIX, INC. reassignment TEKTRONIX, INC. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: NIGHTINGALE, MARK W.
Application granted granted Critical
Publication of USD354923S publication Critical patent/USD354923S/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

FIG. 1 is a top, front, and left side perspective view of the probing head for an electrical test probe showing my new design;
FIG. 2 is a left side elevation view having a mirrored right side elevation view of the probing head for an electrical test probe showing my new design;
FIG. 3 is a top plan view thereof;
FIG. 4 is a bottom plan view thereof;
FIG. 5 is a front elevation view thereof; and,
FIG. 6 is a rear elevation view thereof.

Claims (1)

  1. The ornamental design for a probing head for an electrical test probe, as shown and described.
US29/018,212 1994-01-31 1994-01-31 Probing head for an electrical test probe Expired - Lifetime USD354923S (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US29/018,212 USD354923S (en) 1994-01-31 1994-01-31 Probing head for an electrical test probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US29/018,212 USD354923S (en) 1994-01-31 1994-01-31 Probing head for an electrical test probe

Publications (1)

Publication Number Publication Date
USD354923S true USD354923S (en) 1995-01-31

Family

ID=65238770

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/018,212 Expired - Lifetime USD354923S (en) 1994-01-31 1994-01-31 Probing head for an electrical test probe

Country Status (1)

Country Link
US (1) USD354923S (en)

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD371747S (en) 1995-06-12 1996-07-16 Strader Philip J Tester for testing Christmas tree light bulbs and sockets
USD444721S1 (en) 2000-07-31 2001-07-10 Lecroy Corporation Electrical test probe probing head
US6400167B1 (en) 2000-08-21 2002-06-04 Tektronix, Inc. Probe tip adapter for a measurement probe
USD474415S1 (en) 2002-07-16 2003-05-13 Snap-On Technologies, Inc. Test lead head
US6603297B1 (en) 2000-08-21 2003-08-05 Tektronix, Inc. Probe tip adapter for a measurement probe
USD565444S1 (en) * 2007-01-29 2008-04-01 Sonora Medical Systems, Inc. Testing device for acoustic probes and systems
USD700086S1 (en) * 2012-09-07 2014-02-25 Rohde & Schwarz Gmbh & Co. Kg Oscilloscope probe
USD947693S1 (en) 2019-09-20 2022-04-05 Tektronix, Inc. Measurement probe head assembly
USD958678S1 (en) * 2020-06-05 2022-07-26 Autel Intelligent Technology Corp., Ltd. Tread wear detecting device
USD970370S1 (en) * 2020-06-05 2022-11-22 Autel Intelligent Technology Corp., Ltd. Tread wear detecting device

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4034293A (en) 1974-03-04 1977-07-05 Electroglas, Inc. Micro-circuit test probe
US4151465A (en) 1977-05-16 1979-04-24 Lenz Seymour S Variable flexure test probe for microelectronic circuits
US4491788A (en) 1981-07-27 1985-01-01 Tektronix, Inc. Miniature electrical probe
US4533864A (en) 1983-04-21 1985-08-06 Northern Telecom Limited Test instrument with flexibly connected head
US4701702A (en) 1984-03-08 1987-10-20 Feinmetall Gmbh Contact pin having a spring under tension

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4034293A (en) 1974-03-04 1977-07-05 Electroglas, Inc. Micro-circuit test probe
US4151465A (en) 1977-05-16 1979-04-24 Lenz Seymour S Variable flexure test probe for microelectronic circuits
US4491788A (en) 1981-07-27 1985-01-01 Tektronix, Inc. Miniature electrical probe
US4533864A (en) 1983-04-21 1985-08-06 Northern Telecom Limited Test instrument with flexibly connected head
US4701702A (en) 1984-03-08 1987-10-20 Feinmetall Gmbh Contact pin having a spring under tension

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD371747S (en) 1995-06-12 1996-07-16 Strader Philip J Tester for testing Christmas tree light bulbs and sockets
USD444721S1 (en) 2000-07-31 2001-07-10 Lecroy Corporation Electrical test probe probing head
US6400167B1 (en) 2000-08-21 2002-06-04 Tektronix, Inc. Probe tip adapter for a measurement probe
US6603297B1 (en) 2000-08-21 2003-08-05 Tektronix, Inc. Probe tip adapter for a measurement probe
USD474415S1 (en) 2002-07-16 2003-05-13 Snap-On Technologies, Inc. Test lead head
USD565444S1 (en) * 2007-01-29 2008-04-01 Sonora Medical Systems, Inc. Testing device for acoustic probes and systems
USD700086S1 (en) * 2012-09-07 2014-02-25 Rohde & Schwarz Gmbh & Co. Kg Oscilloscope probe
USD947693S1 (en) 2019-09-20 2022-04-05 Tektronix, Inc. Measurement probe head assembly
USD958678S1 (en) * 2020-06-05 2022-07-26 Autel Intelligent Technology Corp., Ltd. Tread wear detecting device
USD970370S1 (en) * 2020-06-05 2022-11-22 Autel Intelligent Technology Corp., Ltd. Tread wear detecting device

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