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USD346122S - Probing head for an electrical test probe - Google Patents

Probing head for an electrical test probe Download PDF

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Publication number
USD346122S
USD346122S US29/005,282 US528293F USD346122S US D346122 S USD346122 S US D346122S US 528293 F US528293 F US 528293F US D346122 S USD346122 S US D346122S
Authority
US
United States
Prior art keywords
test probe
electrical test
probing head
probing
head
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US29/005,282
Inventor
Mark W. Nightingale
Jonathan E. Myers
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Priority to US29/005,282 priority Critical patent/USD346122S/en
Assigned to TEKTRONIX, INC. reassignment TEKTRONIX, INC. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: MYERS, JONATHAN E., NIGHTINGALE, MARK W.
Application granted granted Critical
Publication of USD346122S publication Critical patent/USD346122S/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

FIG. 1 is a left side elevation view of the probing head for an electrical test probe showing our new design;
FIG. 2 is a right side elevation view thereof;
FIG. 3 is a top plan view thereof;
FIG. 4 is a bottom plan view thereof;
FIG. 5 is a front elevation view thereof; and,
FIG. 6 is a rear elevation view thereof.
The cord member has been broken away indicating an indeterminate length.

Claims (1)

  1. The ornamental design for a probing head for an electrical test probe, as shown and described.
US29/005,282 1993-03-01 1993-03-01 Probing head for an electrical test probe Expired - Lifetime USD346122S (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US29/005,282 USD346122S (en) 1993-03-01 1993-03-01 Probing head for an electrical test probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US29/005,282 USD346122S (en) 1993-03-01 1993-03-01 Probing head for an electrical test probe

Publications (1)

Publication Number Publication Date
USD346122S true USD346122S (en) 1994-04-19

Family

ID=70846529

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/005,282 Expired - Lifetime USD346122S (en) 1993-03-01 1993-03-01 Probing head for an electrical test probe

Country Status (1)

Country Link
US (1) USD346122S (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD391503S (en) 1996-12-23 1998-03-03 Samuel Van Dyk Expandable wire current tester
USD427091S (en) * 1999-10-29 2000-06-27 Fluke Corporation Electrical probe
USD427535S (en) * 1999-10-29 2000-07-04 Fluke Corporation Electrical probe
USD427922S (en) * 1999-10-29 2000-07-11 Fluke Corporation Electrical probe
USD1042181S1 (en) * 2021-12-17 2024-09-17 SensePeek AB Electricity measuring instrument
USD1042182S1 (en) * 2021-12-17 2024-09-17 SensePeek AB Electricity measuring instrument

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4978921A (en) 1989-05-01 1990-12-18 General Electric Company Electrode probe for use in aqueous environments of high temperature and high radiation
US5032787A (en) 1989-11-03 1991-07-16 Everett/Charles Contact Products, Inc. Electrical test probe having rotational control of the probe shaft
US5041781A (en) 1989-12-28 1991-08-20 Stack Electronics Co., Ltd. Assembly to be fitted in a cylinder of a probe

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4978921A (en) 1989-05-01 1990-12-18 General Electric Company Electrode probe for use in aqueous environments of high temperature and high radiation
US5032787A (en) 1989-11-03 1991-07-16 Everett/Charles Contact Products, Inc. Electrical test probe having rotational control of the probe shaft
US5041781A (en) 1989-12-28 1991-08-20 Stack Electronics Co., Ltd. Assembly to be fitted in a cylinder of a probe

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
Tektronix, Passive Voltage Probes, ©1990, p.411, provided by applicant.

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD391503S (en) 1996-12-23 1998-03-03 Samuel Van Dyk Expandable wire current tester
USD427091S (en) * 1999-10-29 2000-06-27 Fluke Corporation Electrical probe
USD427535S (en) * 1999-10-29 2000-07-04 Fluke Corporation Electrical probe
USD427922S (en) * 1999-10-29 2000-07-11 Fluke Corporation Electrical probe
USD1042181S1 (en) * 2021-12-17 2024-09-17 SensePeek AB Electricity measuring instrument
USD1042182S1 (en) * 2021-12-17 2024-09-17 SensePeek AB Electricity measuring instrument

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