[go: up one dir, main page]

US20140354992A1 - Localized surface plasmon resonance sensing system with particles arranged in anisotropic periodic manner - Google Patents

Localized surface plasmon resonance sensing system with particles arranged in anisotropic periodic manner Download PDF

Info

Publication number
US20140354992A1
US20140354992A1 US14/080,953 US201314080953A US2014354992A1 US 20140354992 A1 US20140354992 A1 US 20140354992A1 US 201314080953 A US201314080953 A US 201314080953A US 2014354992 A1 US2014354992 A1 US 2014354992A1
Authority
US
United States
Prior art keywords
light
lspr
test specimen
metal nanoparticle
metal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
US14/080,953
Other languages
English (en)
Inventor
Chun-Hung Lin
Wen-Yu Chen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Cheng Kung University NCKU
Original Assignee
National Cheng Kung University NCKU
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by National Cheng Kung University NCKU filed Critical National Cheng Kung University NCKU
Assigned to NATIONAL CHENG KUNG UNIVERSITY reassignment NATIONAL CHENG KUNG UNIVERSITY ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: CHEN, WEN-YU, LIN, CHUN-HUNG
Publication of US20140354992A1 publication Critical patent/US20140354992A1/en
Priority to US14/877,944 priority Critical patent/US9678009B2/en
Abandoned legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G01N21/553—Attenuated total reflection and using surface plasmons
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G01N21/553—Attenuated total reflection and using surface plasmons
    • G01N21/554—Attenuated total reflection and using surface plasmons detecting the surface plasmon resonance of nanostructured metals, e.g. localised surface plasmon resonance

Definitions

  • the present invention relates to a localized surface plasmon resonance (LSPR) sensing system with particles arranged in an anisotropic period, especially to a LSPR sensing system in which the spectra of two orthogonal polarizations of transmitted light or reflected light are a bit different due to metal nanoparticles arranged in an anisotropic period in a metal nanoparticle layer of the test specimen.
  • LSPR localized surface plasmon resonance
  • the LSPR is a collective oscillation of free electrons in metal nanoparticles when excited by electromagnetic waves.
  • the LSPR induces peaks or troughs in spectra of absorption, scattering, transmittance or reflectance at the resonance frequency.
  • the resonance frequency of metal nanoparticles will shift due to delicate change of refractive index of the environment which can be caused by binding of molecules on nanoparticles or change of solution density of chemical substances, etc.
  • the refractive index changes can be learned by monitoring the spectral shift of resonance frequency.
  • the LSPR technique with advantages of high sensitivity and real-time detection has been widely used in chemical and biological sensors.
  • the sensitivity of sensor is defined as the spectral shift divided by a refractive index change.
  • the capability of sensor is also concerned with the full width at half maximum (FWHM) of the peak/trough.
  • FWHM full width at half maximum
  • a figure of merit (FOM) defined as the sensitivity divided by the FWHM is widely used to characterize the sensor performance. It can be expected that the sensor with narrower bandwidth has better quality/performance among sensors with the same sensitivity.
  • the LSPR sensors offer small FOM typically ranging from 1 to 2 owing to the broad line shape of LSPR.
  • many methods for restraining the FWHM to improve the FOM have been proposed.
  • Leif J. Sherry et al. (Nano Lett. 5, 2034 (2005)) observed a higher order mode of nanocubes excited by the contact of the substrate. The mode possesses a FWHM narrower than the dipole mode, and thus resulting in a higher FOM.
  • Peter Offermans et al. (ACS Nano 5, 5151 (2011)) demonstrated an enhanced FOM of sensor of periodic arranged nanoparticles. The coupling of Wood-Rayleigh anomaly and the LSPR restrains the FWHM of the sensor.
  • a primary object of the present invention to provide a LSPR sensing system with particles arranged in an anisotropic period in which the spectra of two orthogonal polarization states of transmitted light or reflected light are slightly split in spectra due to anisotropic arrangement of nanoparticles in a metal nanoparticle layer.
  • a phase difference with a quite narrow bandwidth is generated between two orthogonal polarization states of the emergent light so as to increase the FOM of the sensing system dramatically.
  • the embodiments according to the present invention enable the use of test specimens of one layer metal structure and the setup of a simple optical path in normal incidence. Therefore the present invention overcomes the shortcomings of the prior art.
  • a LSPR sensing system with particles arranged in an anisotropic periodic manner is revealed.
  • the system features on that a phase signal of LSPR is generated by metal nanoparticles arranged anisotropically and the sensing is accomplished by measuring the spectral position of the phase signal.
  • the system of the present invention includes at least one light source generating an incident light, a polarizer for polarizing the incident light, a test specimen, an analyzer that filters out the polarization state of an emergent light passing through the test specimen, a monochromator disposed on a light path of the system and used to acquire the spectral information, and an optical detection system that receives light emerging from the test specimen and detects spectrum of a phase signal of the emergent light.
  • the above test specimen includes a metal nanoparticle layer formed by a plurality of metal nanoparticles arranged thereon periodically.
  • the periodic arrangement doesn't have 4-fold rotational symmetry (90 degrees), in other words, the nanoparticle layer is anisotropic.
  • the metal nanoparticle layer is in contact with the analyte and is excited by the incident light to sustain the LSPR.
  • the spectra of two perpendicular polarization states of transmitted light or reflected light are slightly split away from each other due to anisotropic periodic arrangement of the metal nanoparticles on the metal nanoparticle layer.
  • a signal with quite narrow bandwidth is generated in the phase difference spectrum.
  • the FWHM of the phase difference spectrum is narrower than the FWHM obtained by measuring the transmittance or reflectance. Therefore the FOM is dramatically increased and the performance of the refractive index sensor is hence improved.
  • the metal nanoparticle is made from metals including gold, silver, copper, aluminum, palladium, platinum, tin, white gold, etc.
  • the shape of the metal nanoparticle can be a square, a circle, a rectangle, or an ellipse.
  • the preferred length of the period along the X axis and the period thereof along the Y axis match the requirement of: 1>the length of the short side/the length of the long side>0.8.
  • the layer of nanoparticles can be a porous layer of nanoholes.
  • the light is multichromatic to enable the spectral measurement and the light emerging from the test specimen can be transmitted light or reflected light.
  • a preferred setup of optical path is to detect the transmitted light from the specimen under normal incidence, and hence the optical path is simple to implement and there is no need to use a rotary arm.
  • the light output from the test specimen is a superposition of two orthogonal polarization states.
  • the phase signal the optical detection system measured is a difference between phases of the two orthogonal polarization states.
  • the present system detects changes of environmental refractive index by the spectral shift in the phase difference spectrum.
  • the spectral shift of the present system can be indicated as wavelength change, frequency change and photon energy change.
  • FIG. 1 is a schematic drawing showing structure of an embodiment of a LSPR sensing system according to the present invention
  • FIG. 2 is a schematic drawing showing a periodic arrangement of metal nanoparticles on a metal nanoparticle layer of an embodiment and the periodic arrangement doesn't have 4-fold rotational symmetry (90 degrees) according to the present invention
  • FIG. 3 is a schematic drawing showing a unit of a metal nanoparticle layer of an embodiment according to the present invention.
  • FIG. 4 is a diagram showing simulated phases of X and Y polarization states of light passing through a test specimen as functions of wavelength in an embodiment according to the present invention
  • FIG. 5 is a diagram showing the phase difference between X and Y polarization states of light passing through a test specimen as a function of wavelength in an embodiment according to the present invention
  • FIG. 6 is a diagram showing the simulated transmittances of X and Y polarizations as functions of wavelength in an embodiment according to the present invention
  • FIG. 7 is a diagram showing the phase differences ⁇ for nanoparticles in test specimen embedded in different environments with refractive indices of 1.33, 1.38, and 1.43;
  • FIG. 8 is a diagram showing a relationship between simulated FOMs of X polarization, Y polarization, and phase difference, and a length of a long side of a unit of an embodiment according to the present invention
  • FIG. 9 is a diagram showing a relationship between FOM increase ratio and a length of a long side of a unit of an embodiment according to the present invention.
  • LSPR is a collective oscillation of free electrons in metallic nanostructures.
  • the excitation of LSPRs results in characteristic peaks and troughs in spectra of transmittance and reluctance.
  • the phase of the transmittance and reflectance would be manipulated by the LSPR thus resulting in optical phenomena such as steep phase transition and phase retardation.
  • the phase variations of LSPR are possible to be measured using ellipsometry.
  • the main optical components of the ellipsometer include a light source, a polarizer, an analyzer, a monochromator, and a detector.
  • the use of compensators in the optical path of ellipsometer is optional, depending on the applications.
  • An ellipsometer measures the complex ratio between two perpendicular components of electric field of light such as E x and E y . That is
  • tan( ⁇ ) is the amplitude ratio and ⁇ is the phase difference.
  • FIG. 1 a block diagram of an embodiment of a LSPR sensing system according to the present invention is revealed.
  • the system features on that a phase signal of LSPR is generated by metal nanoparticles 311 arranged in an anisotropic manner and the spectral shift of the phase signal is monitored by ellipsometry to detect the change of the environment of nanoparticles.
  • the LSPR sensing system of the present invention includes a light source 1 , a polarizer 2 , a test specimen 3 , an analyzer 4 , a monochromator 5 , and an optical detection system 6 .
  • the light source 1 is used for generating an incident light 11 .
  • the light generated is not a monochromatic light.
  • the bandwidth of the light is narrowed and the center wavelength is selected in the optical path by the monochromator 5 for generating the spectra.
  • the polarizer 2 is for polarizing the above incident light 11 .
  • the test specimen 3 includes a metal nanoparticle layer 31 formed by a plurality of metal nanoparticles 311 that is made from gold, silver, copper, aluminum, palladium, platinum, tin, white gold, etc.
  • a schematic drawing showing an embodiment of a metal nanoparticle is disclosed.
  • the periodic arrangement of the metal nanoparticles 311 in the metal nanoparticle layer 31 doesn't have 4-fold rotational symmetry.
  • the metal nanoparticle layer 31 includes a plurality of units 312 , as shown in FIG. 3 .
  • the length of the side of the unit 312 along the Y-axis is defined as a long side (L1) of the unit 312 while the length of the side of the unit 312 along the X-axis is defined as a short side (L2) of the unit 312 .
  • the long side (L1) is not equal to the short side (L2).
  • the preferred ratio between the short side (L2) of the unit and the long side (L1) of the unit meets a requirement of 1>a length of a short side (L2)/a length of a long side (L1)>0.8.
  • the shape of the nanoparticle 311 is not limited; it can be a circle, a ellipse, a rectangle, etc. In this preferred embodiment, the shape of nanoparticle 311 is square.
  • the metal nanoparticle layer 31 is in contact with analytes and is excited by the incident light 11 so as to sustain LSPR.
  • the analyzer 4 is used to filter out the polarization state of the emergent light after it passes through the test specimen 3 .
  • the emergent light from the test specimen 3 is either transmitted light or reflected light. In this embodiment, it's transmitted light.
  • the monochromator 5 is arranged at a light path of the LSPR sensing system and used for resolving the wavelength of light to generate spectrum.
  • the monochromator 5 is arranged behind the analyzer 4 , but not limited to this position.
  • the monochromator 5 can be disposed on the light path the present system passes such as the position between the light generator 1 and the polarizer 2 or the position between the polarizer 2 and the test specimen 3 . As long as the monochromator 5 provides the same effect, the position of the monochromator 5 is not limited.
  • the optical detection system 6 is for receiving the light emergent from the test specimen 3 and detecting the phase signal spectrum of the emergent light.
  • the emergent light from the test specimen 3 is a superposition of two orthogonal polarization states of the light.
  • the phase signal the optical detection system 6 measured is a difference between phases of the two orthogonal polarizations.
  • the phase signal has a spectral shift when the refractive index of the environment around the nanoparticles changes.
  • the present system detects the change of environmental refractive index by monitoring the spectral shift.
  • the spectral shift of the phase signal can be represented as one of the follows: wavelength change, frequency change and photon energy change.
  • the test specimen 3 is formed by a layer of silver square nanoparticles 31 deposited on a glass substrate.
  • the metal nanoparticle layer 31 is considered to be formed by a plurality of units 312 .
  • Each unit 312 includes one metal nanoparticle 311 .
  • the length of the metal nanoparticle 311 along the X axis and the length thereof along the Y axis are both 250 nm and the environmental refractive index is 1.33.
  • the length of the short side of the unit 312 (L2) is 500 nm while the length of the long side of the unit 312 (L1) is 550 nm.
  • the spectra of X and Y polarizations of light passing through the test specimen 3 are given by rigorous coupled wave analysis.
  • phase spectrum of Y polarization ( . . . dotted line in FIG. 4 ) is shifted to a shorter wavelength, relative to the simulated phase spectrum of X polarization (—— solid line), due to the metal nanoparticles 311 of the metal nanoparticle layer 31 arranged in the anisotropic periodic manner on surface of the test specimen 3 .
  • the phase spectra of X and Y polarizations show steep variations at around 1050 nm wavelength, which are phase transitions induced by the LSPRs. Because of the phase transition phenomenon, a small spectral shift results in an enormous difference between the phases of X and Y polarizations.
  • the phase difference ⁇ is the difference between the phase of the X polarization and that of the Y polarization shown in FIG. 4 .
  • the phase difference can be measured by the system of ellipsometer revealed in FIG. 1 . There is a signal with a very narrow bandwidth in the spectrum of the phase difference and its FWHM is 39.7 nm.
  • FIG. 6 the simulated transmittances of the X and Y polarizations are disclosed. The FWHM of the X polarized light and that of the Y polarized light are respectively 394 nm and 379 nm. The FWHM of the phase difference spectrum is much narrower than the FWHMs of the transmittances measured. Thus the FOM of the sensing system is significantly increased.
  • phase differences ⁇ for nanoparticles 311 in test specimen 3 embedded in different environments with refractive indices of 1.33 (—— solid line), 1.38 (- - - dash line), and 1.43 ( . . . dotted line) is shown.
  • the spectral position of phase difference ⁇ is red shifted with the increase of environmental refractive index.
  • the presented embodiment of LSPR sensing system monitors the spectral shift of phase difference ⁇ while the test specimen 3 is in contact with analyte.
  • the spectral shift of phase difference ⁇ indicates the variation of the environmental refractive index.
  • FIG. 8 a diagram showing relationship between the length of the long side (L1) of the unit 312 and the simulated FOMs of X polarization, Y polarization, and phase difference ⁇ is revealed.
  • the length of the short side (L2) of the unit 312 is 500 nm; and the length of the long side (L1) of the unit 312 is varied from 510 nm to 600 nm.
  • the FOM of phase difference (- ⁇ - diamond dots) is much higher than the FOM of X polarization (- ⁇ - circle dots) and the FOM of Y polarization (- ⁇ - square dots).
  • FOM of phase difference is about 10 when the length of the short side (L2) of the unit/the length of the long side (L1) of the unit is equal to 0.91 while the length of the long side (L1) of the unit is 550 nm. As the length of the long side (L1) further approaches 510 nm, the FOM increases to exceeding 10.
  • FIG. 9 a diagram showing relationship between the length of the long side (L1) of the unit and the FOM increase ratio is revealed.
  • the FOM increase ratio is defined as FOM of the phase difference divided by average FOM of X and Y polarizations. It can be learned in FIG. 8 and FIG. 9 that FOM is 16.2 and FOM increase ratio is 14.3 when the length of the long side (L1) of the unit 312 is 520 nm. When the length of the long side (L1) of the unit 312 is 510 nm, the FOM is 18.0 and the FOM increase ratio is 15.0.
  • phase sensing technology promises a signal-to-noise ratio higher than the intensity sensing technology.
  • the present invention is expected to obtain a lower detection limit relative to the technology of intensity sensing.
  • the optical path is in normal incidence so that the rotary arm is not required and the optical design is simple.
  • the rectangle shape of the metal nanoparticle 311 is only a preferred embodiment of the present invention.
  • the shape of metal nanoparticle 311 is not limited.
  • the arrangement of the metal nanoparticles 311 is also not limited to a rectangular array. They can be arranged into a hexagonal array.
  • the metal nanoparticles 311 which form the metal nanoparticle layer 31 are only an embodiment of the present invention.
  • the metal nanoparticle layer 31 can also be a porous structure of nanoholes with a similar effect and technical advantages as the above embodiment.

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nanotechnology (AREA)
  • Engineering & Computer Science (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
US14/080,953 2013-05-30 2013-11-15 Localized surface plasmon resonance sensing system with particles arranged in anisotropic periodic manner Abandoned US20140354992A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US14/877,944 US9678009B2 (en) 2013-05-30 2015-10-08 Method for localized surface plasmon resonance sensing system

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
TW102119090A TWI498541B (zh) 2013-05-30 2013-05-30 具不對稱週期粒子排列之定域化表面電漿共振檢測系統
TW102119090 2013-05-30

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US14/877,944 Continuation US9678009B2 (en) 2013-05-30 2015-10-08 Method for localized surface plasmon resonance sensing system

Publications (1)

Publication Number Publication Date
US20140354992A1 true US20140354992A1 (en) 2014-12-04

Family

ID=51984751

Family Applications (2)

Application Number Title Priority Date Filing Date
US14/080,953 Abandoned US20140354992A1 (en) 2013-05-30 2013-11-15 Localized surface plasmon resonance sensing system with particles arranged in anisotropic periodic manner
US14/877,944 Expired - Fee Related US9678009B2 (en) 2013-05-30 2015-10-08 Method for localized surface plasmon resonance sensing system

Family Applications After (1)

Application Number Title Priority Date Filing Date
US14/877,944 Expired - Fee Related US9678009B2 (en) 2013-05-30 2015-10-08 Method for localized surface plasmon resonance sensing system

Country Status (2)

Country Link
US (2) US20140354992A1 (zh)
TW (1) TWI498541B (zh)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9667034B1 (en) 2016-06-27 2017-05-30 Elwha Llc Enhanced photoluminescence
CN106840401A (zh) * 2017-02-04 2017-06-13 德州学院 多功能光学多道分析实验系统
US9851618B1 (en) 2016-06-27 2017-12-26 Elwha Llc Enhanced photoluminescence
WO2021093220A1 (zh) * 2019-11-14 2021-05-20 量准（上海）医疗器械有限公司 一种采用金纳米孔阵列芯片的生物检测装置及检测方法
WO2022171454A1 (en) * 2021-02-11 2022-08-18 ams Sensors Germany GmbH Sensor device and sensor arrangement

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI879607B (zh) * 2024-06-14 2025-04-01 國立虎尾科技大學 新型表面電漿波相位感測器

Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070058982A1 (en) * 2005-09-13 2007-03-15 Toshikazu Onishi Surface emitting laser, photodetector and optical communication system using the same
US20080160287A1 (en) * 2005-02-17 2008-07-03 Hiroaki Misawa Metal Structure and Production Method Therefor
US20080213130A1 (en) * 2005-06-10 2008-09-04 Gilupi Gmbh Diagnostic-nanosensor and its use in medicine
US20090002701A1 (en) * 2007-06-26 2009-01-01 Fattal David A Electric-field-enhancement structure and detection apparatus using same
US20100178713A1 (en) * 2006-01-18 2010-07-15 Canon Kabushiki Kaisha Target substance-detecting element
US20100233825A1 (en) * 2007-11-02 2010-09-16 Canon Kabushiki Kaisha Chemical sensor element, sensing apparatus, and sensing method
US20100259754A1 (en) * 2007-11-01 2010-10-14 Attomarker Limited Method of optimising the sensitivity of a surface plasmon ellipsometry apparatus
US20110205542A1 (en) * 2010-02-24 2011-08-25 Itt Defense And Electronics Optical Sensors Including Surface Modified Phase-Change Materials for Detection of Chemical, Biological and Explosive Compounds
US20110216320A1 (en) * 2008-11-28 2011-09-08 Korea Research Institute Of Standards And Science Multi-channel surface plasmon resonance sensor using beam profile ellipsometry
US20120069336A1 (en) * 2009-05-04 2012-03-22 Theodore Peter Rakitzis Intra-cavity ellipsometer system and method
US20130092823A1 (en) * 2011-10-17 2013-04-18 Seiko Epson Corporation Optical device and detection apparatus

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000121551A (ja) * 1998-10-16 2000-04-28 Mitsubishi Chemicals Corp 濃度測定装置
DE10126152C2 (de) * 2001-05-30 2003-12-24 Inst Mikrotechnik Mainz Gmbh Ortsaufgelöstes Ellipsometrie-Verfahren zur quantitativen und/oder qualitativen Bestimmung von Probenänderungen, Biochip und Meßanordnung
WO2004057314A2 (en) * 2002-12-20 2004-07-08 Fiso Technologies Inc. Polarisation interferometric method and sensor for detecting a chemical substance
TWI284734B (en) * 2005-12-20 2007-08-01 Nat Univ Chung Cheng Sensing apparatus containing noble metal and sensing system and method thereof
JP2007286045A (ja) * 2006-03-20 2007-11-01 Canon Inc 検出装置、検出素子用基板、検出素子、検出素子用キット及び検出方法
TW201027065A (en) 2009-01-06 2010-07-16 Lai-Kwan Chau Localized plasmon resonance sensing element and system thereof
TW201104237A (en) 2009-07-16 2011-02-01 Univ Nat Taiwan Localized surface plasmon resonance sensor and fabrication thereof and method for forming a metal neon-structure
US20130329272A1 (en) 2011-02-09 2013-12-12 Nippon Steel & Sumikin Chemical Co., Ltd. Metal fine-particle dispersed composite, method for fabricating the same, and substrate capable of inducing localized surface plasmon resonance

Patent Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080160287A1 (en) * 2005-02-17 2008-07-03 Hiroaki Misawa Metal Structure and Production Method Therefor
US20080213130A1 (en) * 2005-06-10 2008-09-04 Gilupi Gmbh Diagnostic-nanosensor and its use in medicine
US20070058982A1 (en) * 2005-09-13 2007-03-15 Toshikazu Onishi Surface emitting laser, photodetector and optical communication system using the same
US20100178713A1 (en) * 2006-01-18 2010-07-15 Canon Kabushiki Kaisha Target substance-detecting element
US20090002701A1 (en) * 2007-06-26 2009-01-01 Fattal David A Electric-field-enhancement structure and detection apparatus using same
US20100259754A1 (en) * 2007-11-01 2010-10-14 Attomarker Limited Method of optimising the sensitivity of a surface plasmon ellipsometry apparatus
US20100233825A1 (en) * 2007-11-02 2010-09-16 Canon Kabushiki Kaisha Chemical sensor element, sensing apparatus, and sensing method
US20110216320A1 (en) * 2008-11-28 2011-09-08 Korea Research Institute Of Standards And Science Multi-channel surface plasmon resonance sensor using beam profile ellipsometry
US20120069336A1 (en) * 2009-05-04 2012-03-22 Theodore Peter Rakitzis Intra-cavity ellipsometer system and method
US20110205542A1 (en) * 2010-02-24 2011-08-25 Itt Defense And Electronics Optical Sensors Including Surface Modified Phase-Change Materials for Detection of Chemical, Biological and Explosive Compounds
US20130092823A1 (en) * 2011-10-17 2013-04-18 Seiko Epson Corporation Optical device and detection apparatus

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9667034B1 (en) 2016-06-27 2017-05-30 Elwha Llc Enhanced photoluminescence
US9715159B1 (en) 2016-06-27 2017-07-25 Elwha Llc Enhanced photoluminescence from plasmonic apparatus with two resonant cavity wavelengths
US9851618B1 (en) 2016-06-27 2017-12-26 Elwha Llc Enhanced photoluminescence
CN106840401A (zh) * 2017-02-04 2017-06-13 德州学院 多功能光学多道分析实验系统
WO2021093220A1 (zh) * 2019-11-14 2021-05-20 量准（上海）医疗器械有限公司 一种采用金纳米孔阵列芯片的生物检测装置及检测方法
WO2022171454A1 (en) * 2021-02-11 2022-08-18 ams Sensors Germany GmbH Sensor device and sensor arrangement

Also Published As

Publication number Publication date
TW201445129A (zh) 2014-12-01
US20160033402A1 (en) 2016-02-04
US9678009B2 (en) 2017-06-13
TWI498541B (zh) 2015-09-01

Similar Documents

Publication Publication Date Title
US20140354993A1 (en) Localized surface plasmon resonance sensing system with anisotropic particles
US9678009B2 (en) Method for localized surface plasmon resonance sensing system
US9518926B2 (en) Optical sensor with enhanced sensitivity
US10801956B2 (en) Resonant periodic structures and methods of using them as filters and sensors
US10048200B2 (en) Optical sensor based with multilayered plasmonic structure comprising a nanoporous metallic layer
EP2449363B1 (en) Optical sensing device and method for detecting samples
US9671327B2 (en) Ultrasensitive biochemical sensing device and method of sensing analytes
CA2409486A1 (en) Coupled plasmon-waveguide resonance spectroscopic device
CN106053390A (zh) 含吸收介质石墨烯的表面缺陷腔光子晶体折射率传感器
CN102654457B (zh) 一种折射率传感器及其探测方法
US9658164B2 (en) Optical sensing chip having three-dimensional nanostructure array
CN108258428A (zh) 用于电磁波滤波器的超材料
Canpean et al. Multifunctional plasmonic sensors on low-cost subwavelength metallic nanoholes arrays
US20140327909A1 (en) Method for exciting a sub-wavelength inclusion structure
KR100911626B1 (ko) 바이오 센서 측정 장치
Simone Hybrid modes in multilayer/antenna architecture set side-band-selective molecular Raman scattering
EP3051277A2 (en) Electric-field enhancement element, analysis device, and eletronic apparatus
CN107014776A (zh) 基于超连续谱光源的液体折射率测量装置及方法
CN113916795B (zh) 一种基于线偏振入射的tcd光谱测量生物传感器及测试方法
CN216747377U (zh) 一种基于线偏振入射的tcd光谱测量生物传感器
CN109443704A (zh) 一种相位增强的光学强度检测方法和系统
Shi et al. Spectral, amplitude and phase sensitivity of a plasmonic gas sensor in a metallic photonic crystal slab geometry: comparison of the near and far field phase detection strategies
CN112881312B (zh) 一种同时监测溶液变化和传感器固/液界面变化的检测装置
CN108120697B (zh) 基于纳米线表面等离激元的折射率测量方法及传感器系统
CN106247953A (zh) 一种同时测量相位和古斯‑汉欣位移的方法及装置

Legal Events

Date Code Title Description
AS Assignment

Owner name: NATIONAL CHENG KUNG UNIVERSITY, TAIWAN

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:LIN, CHUN-HUNG;CHEN, WEN-YU;REEL/FRAME:031735/0250

Effective date: 20131115

STCB Information on status: application discontinuation

Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION