US20020079195A1 - Carrier positional displacement detecting mechanism - Google Patents
Carrier positional displacement detecting mechanism Download PDFInfo
- Publication number
- US20020079195A1 US20020079195A1 US10/022,082 US2208201A US2002079195A1 US 20020079195 A1 US20020079195 A1 US 20020079195A1 US 2208201 A US2208201 A US 2208201A US 2002079195 A1 US2002079195 A1 US 2002079195A1
- Authority
- US
- United States
- Prior art keywords
- carrier
- positional displacement
- detecting mechanism
- shaft
- contact
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 238000006073 displacement reaction Methods 0.000 title claims abstract description 44
- 238000001514 detection method Methods 0.000 claims description 15
- 230000003287 optical effect Effects 0.000 abstract description 6
- 239000000470 constituent Substances 0.000 description 5
- 239000000969 carrier Substances 0.000 description 4
- 238000010276 construction Methods 0.000 description 4
- 239000012050 conventional carrier Substances 0.000 description 4
- 230000002035 prolonged effect Effects 0.000 description 2
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 230000003028 elevating effect Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
- H01L21/681—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment using optical controlling means
Definitions
- the invention relates to a carrier positional displacement detecting mechanism which is suitable for positioning a carrier relative to a test board on which IC sockets are disposed in a horizontal conveyance type auto-handler.
- a horizontal conveyance type auto-handler for horizontally conveying a carrier on which ICs are mounted of auto-handlers which automatically supply ICs, upon completion of assembly thereof, to a test system and automatically classify and accommodate the ICs based on the result of a test.
- a conventional carrier positional displacement detection in the horizontal conveyance type auto-handler will be described next.
- FIG. 3 is a view showing a conventional carrier positional displacement detecting mechanism provided with IC sockets, carriers, contact pushers, and the like.
- FIG. 4 is a sectional view taken along guide pins in FIG. 3. As shown in FIGS. 3 and 4, a plurality of IC sockets 3 are provided on a test board 2 , while guide pins 3 a are provided upright on each IC socket. Guide pins 1 are provided upright on the test board 2 .
- a carrier 4 is conveyed horizontally by a conveyance mechanism, not shown, in the direction of an arrow A in FIG. 3 while a plurality of carrier dowels 5 for holding individual ICs 7 are provided on the carrier 4 .
- the carrier 4 conveyed onto the test board 2 is lowered toward the test board 2 by an elevating mechanism, not shown, in the direction of the arrow B in FIG. 4.
- the contact pusher 6 is lowered from the above of the carrier 4 so that the ICs 7 on the carrier 4 are forced to contact the IC sockets 3 by the contact pusher 6 , thereby testing the ICs 7 .
- the foregoing problem of the positional displacement of a carrier is solved by detecting a positional displacement of the carrier when the carrier is positioned relative to a test board, and it is an object of the invention to provide and advantageous carrier positional displacement detecting mechanism without taking time for detecting the position.
- a first aspect of the invention resides in a carrier positional displacement detecting mechanism provided in an auto-handler comprising, as shown in FIG. 1, a carrier ( 4 ) for mounting an IC thereon, and a measuring part ( 2 ) for measuring the IC mounted on the carrier ( 4 ), said carrier ( 4 ) having a positioning hole ( 4 a ), and a measuring part ( 2 ) having a projection ( 11 ) wherein the projection ( 11 ) is inserted into the positioning hole ( 4 a ) so as to position the carrier ( 4 ) relative to the measuring part ( 2 ), and wherein the carrier positional displacement detecting mechanism comprises positional displacement time contact means ( 8 ) projected from and disposed on each tip end of the projection ( 11 ) and capable of passing through the positioning hole ( 4 a ) only when the projection ( 11 ) and the positioning hole ( 4 a ) correspond to each other, and contact detection means ( 9 ) for detecting the contact between the positional displacement time contact means ( 8 ) and the carrier ( 4 ),
- the carrier positional displacement detecting mechanism is characterized in that the positional displacement time contact means ( 8 ) in the first aspect of the invention is a shaft projected from and biased by the projection ( 11 ) and the contact detection means ( 9 ) is in the first aspect of the invention is a sensor for detecting a rear end ( 8 b ) of the shaft ( 8 ).
- the carrier positional displacement detecting mechanism is characterized in that the positioning operation of the carrier ( 4 ) is stopped when the contact detection means ( 9 ) detects the carrier positional displacement signal.
- FIG. 1 is view showing a state where the position of a carrier in a carrier positional displacement detecting mechanism according to a preferred embodiment of the invention is displaced.
- FIG. 2 is view showing a state where the position of a carrier is in a carrier positional displacement detecting mechanism according to a preferred embodiment of the invention is in a normal position.
- FIG. 3 is a view showing a conventional carrier positional displacement detecting mechanism provided with IC sockets, carriers, contact pushers, and the like.
- FIG. 4 is a sectional view taken along guide pins in FIG. 3.
- FIG. 1 is view showing a state where the position of a carrier in a carrier positional displacement detecting mechanism according to a preferred embodiment of the invention is displaced, wherein FIG. 1(A) shows a state before the carrier is lowered, and FIG. 1(B) shows a state after the carrier is lowered.
- FIG. 2 is view showing a state where the position of a carrier is in a carrier positional displacement detecting mechanism according to a preferred embodiment of the invention is in a normal position, wherein FIG. 2(A) shows a state before the carrier is lowered, and FIG. 2(B) shows a state after the carrier is lowered.
- Basic constituents such as a test board, carriers, contact pushers, and the like are substantially the same as those set forth in the prior art of the invention (see FIGS. 3 and 4), and the improvement of the invention resides in the constituent of guide pins provided on the test board and the neighborhood thereof. Accordingly, the constituents of the test board and carriers, and the like as described in the prior art are depicted by the same reference numerals and the explanation thereof is omitted.
- a guide pin 11 (positioning projection) is provided on a carrier 4 instead of the guide pin 1 as explained in the prior art with reference to FIGS. 1 and 2, and it is inserted into a guide hole 4 a of the carrier 4 for positioning the carrier 4 .
- a through hole 1 a is formed on the center of the guide pin 11 , and a shaft 8 or contact means at positional displacement time (hereinafter referred to as positional displacement time contact means) is inserted into the through hole 11 a to be freely movable up and down.
- a compression coil spring 10 (hereinafter simply referred to as a spring 10 ) is provided inside the through hole 11 a for protruding and biasing the shaft 8 upward.
- the tip end 8 a of the shaft 8 protrudes more than that of the guide pin 11
- the rear end 8 b of the shaft 8 protrudes downward (lower side of the test board 2 ) more than the lower end of the guide pin 11 .
- An optical sensor 9 (contact detection means) is provided at the position where the rear end 8 b of the shaft 8 is forced to enter and extract from the through hole 11 a when the shaft 8 is moved up and down.
- the carrier positional displacement detecting mechanism is structured by the constituents set forth above.
- the contact detection means may be replaced by a contact-type or non-contact type contact detection means.
- the carrier 4 In a normal operation, as shown in FIG. 2(A), the carrier 4 , on which a non -measured IC 7 (not shown) is mounted, is conveyed onto the test board 2 (measuring part). Since the carrier 4 is correctly positioned on the test board 2 in the case as illustrated in FIG. 2(A), when the carrier 4 is lowered toward the test board 2 , the guide pin 11 is inserted and engaged in the positioning hole 4 a of the carrier 4 so that the carrier 4 is properly positioned onto the test board 2 as shown in FIG. 2(B).
- the tip end 8 a of the shaft 8 does not contact the carrier 4 and the like, the shaft 8 does not move up and down, and hence the rear end 8 b of the shaft 8 does not intercept the optical sensor 9 . That is, in this case, the positional displacement of the carrier 4 is not detected, and hence the lowering operation and the like of the carrier 4 are not interrupted.
- the optical sensor 9 When the optical sensor 9 is intercepted, it outputs a carrier positional displacement detection signal.
- the carrier 4 is once raised up to the conveyance position and adjusted in position, then it is lowered again, and the positioning operation of the carrier 4 is resumed again.
- the optical sensor 9 outputs the detection signal only in the case where the position of the carrier 4 is displaced when the carrier 4 is actually lowered, so that the lowering of the carrier 4 is interrupted. That is, additional time for detecting position of the carrier 4 is not required, and hence an index time is not prolonged, which is very convenient.
- the positional displacement time contact means contacts the carrier 4 , and the contact detection means outputs the positional displacement detection signal.
- the positional displacement of the carrier 4 is detected.
- it is possible to take measures for interrupting the lowering of the carrier 4 so that the deformation or breakage of the carrier 4 can be prevented in advance.
- additional time for detecting position of the carrier 4 is not required, and hence the operation time is not extended, which is very convenient.
- the carrier positional displacement detecting mechanism with a simple construction comprising the shaft and the sensor for detecting the rear end of the shaft.
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- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Measuring Leads Or Probes (AREA)
- Warehouses Or Storage Devices (AREA)
Abstract
In a horizontal conveyance type auto-handler, the operation of a carrier is stopped when a positional displacement of the carrier relative to a test board is detected. A shaft is provided on a center of a guide pin on the test board. When the carrier which is displaced relative to the test board is lowered, the shaft is pushed down by the carrier, and the lowering of the shaft is detected by an optical sensor, thereby stopping the lowering operation of the carrier.
Description
- 1. Field of the Invention:
- The invention relates to a carrier positional displacement detecting mechanism which is suitable for positioning a carrier relative to a test board on which IC sockets are disposed in a horizontal conveyance type auto-handler.
- 2. Description of the Prior Art:
- There is a horizontal conveyance type auto-handler for horizontally conveying a carrier on which ICs are mounted of auto-handlers which automatically supply ICs, upon completion of assembly thereof, to a test system and automatically classify and accommodate the ICs based on the result of a test. A conventional carrier positional displacement detection in the horizontal conveyance type auto-handler will be described next.
- FIG. 3 is a view showing a conventional carrier positional displacement detecting mechanism provided with IC sockets, carriers, contact pushers, and the like. FIG. 4 is a sectional view taken along guide pins in FIG. 3. As shown in FIGS. 3 and 4, a plurality of
IC sockets 3 are provided on atest board 2, whileguide pins 3a are provided upright on each IC socket.Guide pins 1 are provided upright on thetest board 2. - A
carrier 4 is conveyed horizontally by a conveyance mechanism, not shown, in the direction of an arrow A in FIG. 3 while a plurality ofcarrier dowels 5 for holdingindividual ICs 7 are provided on thecarrier 4. Thecarrier 4 conveyed onto thetest board 2 is lowered toward thetest board 2 by an elevating mechanism, not shown, in the direction of the arrow B in FIG. 4. - When the
carrier 4 is lowered,guide pins 1 on thetest board 2 are inserted into and engaged inholes 4a defined in thecarrier 4. As a result, theentire carrier 4 is positioned relative to thetest board 2. Thereafter,guide pins 3 a on theIC sockets 3 are inserted into and engaged in carrierdowel guide holes 5 a defined in eachcarrier dowel 5 corresponding to eachIC socket 3, so thatindividual ICs 7 are positioned relative to theIC sockets 3. - After positioning of each
IC 7 relative to eachIC socket 3, thecontact pusher 6 is lowered from the above of thecarrier 4 so that theICs 7 on thecarrier 4 are forced to contact theIC sockets 3 by thecontact pusher 6, thereby testing theICs 7. - However, according to the conventional carrier positional displacement detecting mechanism having the construction set forth above, if the
carrier 4 conveyed onto thetest board 2 is lowered while it is not located at a normal position owing to a faulty operation of the conveyance mechanism or setting error by an operator, there occurs a problem that theguide pins 1 on thetest board 2 are not inserted or engaged into theguide holes 4 a, and further thecontact pusher 6 is lowered, so that thecarrier 4 is sandwiched between thecontact pusher 6 and theguide pins 1. - To solve the foregoing inconvenience, for example, it is conceived such a construction the position of the
carrier 4 is detected by a sensor which is installed previously, then thecarrier 4 is lowered toward thetest board 2. However, this construction has a drawback that it takes time for detecting the position of thecarrier 4 by the sensor, causing a problem that index time is prolonged. - In view of the foregoing circumstances, the foregoing problem of the positional displacement of a carrier is solved by detecting a positional displacement of the carrier when the carrier is positioned relative to a test board, and it is an object of the invention to provide and advantageous carrier positional displacement detecting mechanism without taking time for detecting the position.
- A first aspect of the invention resides in a carrier positional displacement detecting mechanism provided in an auto-handler comprising, as shown in FIG. 1, a carrier ( 4) for mounting an IC thereon, and a measuring part (2) for measuring the IC mounted on the carrier (4), said carrier (4) having a positioning hole (4 a), and a measuring part (2) having a projection (11) wherein the projection (11) is inserted into the positioning hole (4 a) so as to position the carrier (4) relative to the measuring part (2), and wherein the carrier positional displacement detecting mechanism comprises positional displacement time contact means (8) projected from and disposed on each tip end of the projection (11) and capable of passing through the positioning hole (4 a) only when the projection (11) and the positioning hole (4 a) correspond to each other, and contact detection means (9) for detecting the contact between the positional displacement time contact means (8) and the carrier (4) and outputting a carrier positional displacement signal.
- The carrier positional displacement detecting mechanism according to the second aspect of the invention is characterized in that the positional displacement time contact means ( 8) in the first aspect of the invention is a shaft projected from and biased by the projection (11) and the contact detection means (9) is in the first aspect of the invention is a sensor for detecting a rear end (8 b) of the shaft (8).
- The carrier positional displacement detecting mechanism according to the third aspect of the invention is characterized in that the positioning operation of the carrier ( 4) is stopped when the contact detection means (9) detects the carrier positional displacement signal.
- The reference numerals set forth here are provided for comparing with the attached drawings, but they do not constituents of the invention.
- FIG. 1 is view showing a state where the position of a carrier in a carrier positional displacement detecting mechanism according to a preferred embodiment of the invention is displaced.
- FIG. 2 is view showing a state where the position of a carrier is in a carrier positional displacement detecting mechanism according to a preferred embodiment of the invention is in a normal position.
- FIG. 3 is a view showing a conventional carrier positional displacement detecting mechanism provided with IC sockets, carriers, contact pushers, and the like.
- FIG. 4 is a sectional view taken along guide pins in FIG. 3.
- FIG. 1 is view showing a state where the position of a carrier in a carrier positional displacement detecting mechanism according to a preferred embodiment of the invention is displaced, wherein FIG. 1(A) shows a state before the carrier is lowered, and FIG. 1(B) shows a state after the carrier is lowered. FIG. 2 is view showing a state where the position of a carrier is in a carrier positional displacement detecting mechanism according to a preferred embodiment of the invention is in a normal position, wherein FIG. 2(A) shows a state before the carrier is lowered, and FIG. 2(B) shows a state after the carrier is lowered.
- Basic constituents such as a test board, carriers, contact pushers, and the like are substantially the same as those set forth in the prior art of the invention (see FIGS. 3 and 4), and the improvement of the invention resides in the constituent of guide pins provided on the test board and the neighborhood thereof. Accordingly, the constituents of the test board and carriers, and the like as described in the prior art are depicted by the same reference numerals and the explanation thereof is omitted.
- A guide pin 11 (positioning projection) is provided on a
carrier 4 instead of theguide pin 1 as explained in the prior art with reference to FIGS. 1 and 2, and it is inserted into aguide hole 4 a of thecarrier 4 for positioning thecarrier 4. A through hole 1 a is formed on the center of theguide pin 11, and a shaft 8 or contact means at positional displacement time (hereinafter referred to as positional displacement time contact means) is inserted into the throughhole 11 a to be freely movable up and down. - A compression coil spring 10 (hereinafter simply referred to as a spring 10) is provided inside the through
hole 11 a for protruding and biasing the shaft 8 upward. The tip end 8 a of the shaft 8 protrudes more than that of theguide pin 11, and therear end 8 b of the shaft 8 protrudes downward (lower side of the test board 2) more than the lower end of theguide pin 11. An optical sensor 9 (contact detection means) is provided at the position where therear end 8 b of the shaft 8 is forced to enter and extract from the throughhole 11 a when the shaft 8 is moved up and down. The carrier positional displacement detecting mechanism is structured by the constituents set forth above. The contact detection means may be replaced by a contact-type or non-contact type contact detection means. - In a normal operation, as shown in FIG. 2(A), the
carrier 4, on which a non -measured IC 7 (not shown) is mounted, is conveyed onto the test board 2 (measuring part). Since thecarrier 4 is correctly positioned on thetest board 2 in the case as illustrated in FIG. 2(A), when thecarrier 4 is lowered toward thetest board 2, theguide pin 11 is inserted and engaged in thepositioning hole 4 a of thecarrier 4 so that thecarrier 4 is properly positioned onto thetest board 2 as shown in FIG. 2(B). - As shown in FIGS. 2(A) and 2(B), the
tip end 8 a of the shaft 8 does not contact thecarrier 4 and the like, the shaft 8 does not move up and down, and hence therear end 8 b of the shaft 8 does not intercept the optical sensor 9. That is, in this case, the positional displacement of thecarrier 4 is not detected, and hence the lowering operation and the like of thecarrier 4 are not interrupted. - Then, although the
carrier 4 is lowered even if the position of the conveyedcarrier 4 is displaced from thetest board 2 as shown in FIG. 1(A), theguide pin 11 provided on thetest board 2 is neither inserted and nor engaged in thepositioning hole 4 a of thecarrier 4, and hence thetip end 8 a of the shaft 8 is brought into contact with the portion other than thepositioning hole 4 a of the 4 as shown in FIG. 1(B). As a result, the shaft 8 is moved downward while resisting thespring 10, so that therear end 8 b of the shaft 8 intercepts the optical sensor 9. - When the optical sensor 9 is intercepted, it outputs a carrier positional displacement detection signal. A controller of an autohandler, not shown, interrupts the lowering of the
carrier 4 based on the carrier positional displacement detection signal. As a result, the inconvenience that thecarrier 4 is sandwiched between the contact pressure and the guide pin is solved. Thereafter, thecarrier 4 is once raised up to the conveyance position and adjusted in position, then it is lowered again, and the positioning operation of thecarrier 4 is resumed again. - As mentioned in detail above, since the invention adopts the carrier positional displacement detecting mechanism, even if the position of the
carrier 4 is not detected in advance before thecarrier 4 is lowered, the optical sensor 9 outputs the detection signal only in the case where the position of thecarrier 4 is displaced when thecarrier 4 is actually lowered, so that the lowering of thecarrier 4 is interrupted. That is, additional time for detecting position of thecarrier 4 is not required, and hence an index time is not prolonged, which is very convenient. - According to the invention, only in the case where the position of the
carrier 4 is displaced when thecarrier 4 is actually lowered, the positional displacement time contact means contacts thecarrier 4, and the contact detection means outputs the positional displacement detection signal. In such a manner, the positional displacement of thecarrier 4 is detected. When the positional displacement of thecarrier 4 is detected, it is possible to take measures for interrupting the lowering of thecarrier 4, so that the deformation or breakage of thecarrier 4 can be prevented in advance. Further, additional time for detecting position of thecarrier 4 is not required, and hence the operation time is not extended, which is very convenient. - Further, according to the invention, it is possible to structure the carrier positional displacement detecting mechanism with a simple construction comprising the shaft and the sensor for detecting the rear end of the shaft.
Claims (3)
1. A carrier positional displacement detecting mechanism provided in an auto-handler comprising a carrier for mounting an IC thereon, and a measuring part for measuring the IC mounted on the carrier, said carrier having a positioning hole, and a measuring part having a projection wherein the projection is inserted into the positioning hole so as to position the carrier relative to the measuring part, said carrier positional displacement detecting mechanism comprising:
positional displacement time contact means projected from and disposed on each tip end of the projection and capable of passing through the positioning hole only when the projection and the positioning hole correspond to each other; and
contact detection means for detecting the contact between the positional displacement time contact means and the carrier and outputting a carrier positional displacement signal.
2. The carrier positional displacement detecting mechanism according to claim 1 , wherein the positional displacement time contact means is a shaft projected from and biased by the projection and the contact detection means is a sensor for detecting a rear end of the shaft.
3. The carrier positional displacement detecting mechanism according to claim 1 , wherein the positioning operation of the carrier is stopped when the contact detection means detects the carrier positional displacement signal.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000-391402 | 2000-12-22 | ||
| JP2000391402A JP2002196039A (en) | 2000-12-22 | 2000-12-22 | Carrier displacement detection mechanism |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| US20020079195A1 true US20020079195A1 (en) | 2002-06-27 |
Family
ID=18857545
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US10/022,082 Abandoned US20020079195A1 (en) | 2000-12-22 | 2001-12-13 | Carrier positional displacement detecting mechanism |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US20020079195A1 (en) |
| JP (1) | JP2002196039A (en) |
| KR (1) | KR100451964B1 (en) |
| TW (1) | TWI221903B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20150165578A1 (en) * | 2013-12-12 | 2015-06-18 | Seagate Technology Llc | Positioning apparatus |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100815136B1 (en) * | 2006-11-10 | 2008-03-20 | 세크론 주식회사 | Strip Picker Device for Semiconductor Devices |
| JP5191924B2 (en) * | 2009-02-18 | 2013-05-08 | セイコーインスツル株式会社 | Semiconductor inspection equipment |
| JP5113275B2 (en) * | 2011-03-28 | 2013-01-09 | 京楽産業.株式会社 | Inspection preparation equipment for control boards for gaming machines |
| JP6203589B2 (en) * | 2013-09-30 | 2017-09-27 | 株式会社ディスコ | Chuck table |
| KR101629447B1 (en) | 2015-12-03 | 2016-06-10 | 이은보 | Lightweight stainless steel pipe roller |
| CN116443730B (en) * | 2023-06-13 | 2023-08-25 | 上海新创达半导体设备技术有限公司 | Auxiliary crown block compensation correction system and control method |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5800205A (en) * | 1995-02-28 | 1998-09-01 | Ando Electrical Co., Ltd. | Contact mechanism for IC testing |
| US5855829A (en) * | 1994-05-10 | 1999-01-05 | Procontrol Ag | Method and apparatus for controlling the nozzle engagement in an electric injection molding machine |
| US5901829A (en) * | 1995-12-27 | 1999-05-11 | Kabushiki Kaisha Shinano Electronics | Method of positioning an I.C. and IC handler utilizing said method |
| US6056530A (en) * | 1997-04-29 | 2000-05-02 | Axxicon Moulds Eindhoven B.V. | Device for manufacturing information carriers by injection moulding |
| US6445203B1 (en) * | 1998-12-08 | 2002-09-03 | Advantest Corporation | Electric device testing apparatus |
| US6537133B1 (en) * | 1995-03-28 | 2003-03-25 | Applied Materials, Inc. | Method for in-situ endpoint detection for chemical mechanical polishing operations |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2988808B2 (en) * | 1993-07-12 | 1999-12-13 | シャープ株式会社 | Frame test handler |
| JP3099254B2 (en) * | 1994-02-28 | 2000-10-16 | 安藤電気株式会社 | Suction hand with floating mechanism and transfer contact mechanism |
| JP2000338179A (en) * | 1999-05-27 | 2000-12-08 | Ando Electric Co Ltd | Automatic handler |
| KR200197286Y1 (en) * | 2000-04-14 | 2000-09-15 | 삼성전자주식회사 | Contact picker assembly for test handler |
-
2000
- 2000-12-22 JP JP2000391402A patent/JP2002196039A/en active Pending
-
2001
- 2001-12-13 US US10/022,082 patent/US20020079195A1/en not_active Abandoned
- 2001-12-13 TW TW090130862A patent/TWI221903B/en not_active IP Right Cessation
- 2001-12-20 KR KR10-2001-0081595A patent/KR100451964B1/en not_active Expired - Fee Related
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5855829A (en) * | 1994-05-10 | 1999-01-05 | Procontrol Ag | Method and apparatus for controlling the nozzle engagement in an electric injection molding machine |
| US5800205A (en) * | 1995-02-28 | 1998-09-01 | Ando Electrical Co., Ltd. | Contact mechanism for IC testing |
| US6537133B1 (en) * | 1995-03-28 | 2003-03-25 | Applied Materials, Inc. | Method for in-situ endpoint detection for chemical mechanical polishing operations |
| US5901829A (en) * | 1995-12-27 | 1999-05-11 | Kabushiki Kaisha Shinano Electronics | Method of positioning an I.C. and IC handler utilizing said method |
| US6056530A (en) * | 1997-04-29 | 2000-05-02 | Axxicon Moulds Eindhoven B.V. | Device for manufacturing information carriers by injection moulding |
| US6445203B1 (en) * | 1998-12-08 | 2002-09-03 | Advantest Corporation | Electric device testing apparatus |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20150165578A1 (en) * | 2013-12-12 | 2015-06-18 | Seagate Technology Llc | Positioning apparatus |
| US9666465B2 (en) * | 2013-12-12 | 2017-05-30 | Seagate Technology Llc | Positioning apparatus |
| US10541166B2 (en) | 2013-12-12 | 2020-01-21 | Seagate Technology Llc | Positioning apparatus |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI221903B (en) | 2004-10-11 |
| KR100451964B1 (en) | 2004-10-08 |
| KR20020051846A (en) | 2002-06-29 |
| JP2002196039A (en) | 2002-07-10 |
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| Date | Code | Title | Description |
|---|---|---|---|
| AS | Assignment |
Owner name: ANDO ELECTRIC CO., LTD., JAPAN Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:KUNINOBU, SEIJI;ARAKAWA, OSAMU;REEL/FRAME:012400/0879 Effective date: 20011203 |
|
| STCB | Information on status: application discontinuation |
Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION |