TWM638948U - Buffer detection module and device - Google Patents
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Abstract
本創作提供一種檢測裝置,其包含有一個基座、至少一個檢測模組、一個驅動組、一個真空模組以及一個真空驅動組,倘若欲針對一個電子產品位在底部之檢測區進行電性檢測時,係透過該電子產品之檢測區對應於該檢測裝置之基座的該真空模組並抵靠在該真空模組的一個軟性環件等技術特徵,如此一來,將讓欲進行電性檢測之電子產品放置在該檢測裝置之基座上時,而能有效達到緩衝的效果,進而使該電子產品後續得以獲得更為穩定的電性檢測之功效。 The invention provides a detection device, which includes a base, at least one detection module, a driving group, a vacuum module and a vacuum driving group, if it is desired to perform electrical testing on the detection area at the bottom of an electronic product At the same time, through the technical features such as the vacuum module corresponding to the base of the detection device through the detection area of the electronic product and abutting against a soft ring of the vacuum module, in this way, the electrical When the electronic product to be detected is placed on the base of the detection device, the effect of buffering can be effectively achieved, so that the electronic product can subsequently obtain a more stable electrical detection effect.
Description
本創作係與電子產品測試技術相關,特別是指一種適用檢測電子產品之緩衝式檢測模組及裝置。 This creation is related to electronic product testing technology, especially a kind of buffer detection module and device suitable for testing electronic products.
目前所使用的電子產品檢測模組種類繁多,為了能夠在製造完成後進一步地確保產品可以正常且完整的運作,所以,在電子產品出貨之前都需要先經過一定程序性的電性檢測;然而,有時一些特殊規格的電子產品,其待測區域位在底部的關係,因此,要如何改善並適配於特殊規格電子產品之位在底部待測區域且能有效地進行該特殊規格電子產品之電性檢測,實則本創作亟欲改善之目的。 There are many types of electronic product testing modules currently in use. In order to further ensure the normal and complete operation of the product after the completion of the manufacturing, it is necessary to go through a certain program of electrical testing before the electronic product is shipped; however , sometimes for some electronic products with special specifications, the area to be tested is at the bottom. Therefore, how to improve and adapt to the position of electronic products with special specifications at the bottom area to be tested and effectively carry out the electronic products with special specifications The electrical testing is actually the purpose of this creation to improve.
而為了要解決先前技術所述之問題,本創作係提供一種檢測裝置,藉由其包含的一個適配於特殊規格電子產品之位在底部檢測區的檢測模組的技術特徵,將能有效地改善並提升特殊規格電子產品之電性檢測良率;此外,更藉由該檢測裝置所包含的一個真空模組,讓該電子產品位在底部之檢測區對應於該檢測裝置之真空模組並抵靠在該真空模組之軟性環件等技術特徵,如此一來,將讓欲進行電性檢測之電子產品放置在該檢測裝置上時而能有效達到緩衝的效果。 In order to solve the problems described in the prior art, this invention provides a detection device, which will be able to effectively Improve and enhance the electrical testing yield of electronic products with special specifications; in addition, through a vacuum module included in the testing device, the testing area at the bottom of the electronic product corresponds to the vacuum module of the testing device and The technical features such as the soft ring against the vacuum module, in this way, can effectively achieve the effect of cushioning when the electronic product to be tested for electrical properties is placed on the testing device.
而為達成上述目的,本創作係提供一種檢測裝置,其包含有一個基座、至少一個檢測模組、一個驅動組、一個真空模組以及一個真空驅動組。此外,該至少一檢測模組係包括有一個固定座、一個支撐座、一個滑軌組、一個探針座、一個彈簧以及一個作動組件;而該至少一檢測模組係藉由該固定座組設在該基座上,且該至少一檢測模組之固定座係設有一個作動部,而該支撐座係組設在該固定座上,該滑軌組的一側係組設在該支撐座上,該探針座係樞設在該滑軌組的另一側,使該探針座藉由該滑軌組而在該支撐座上朝著該固定座之作動部的方向呈往復滑移運動,其中,該探針座的一側係設有一扎針部,且該探針座之扎針部係相對應於該固定座之作動部的位置,該彈簧之二端係各別抵接於該固定座之作動部與該探針座二者構件之間;而該至少一檢測模組之作動組件係包括有一個作動板件、一個樞接件以及一個作動桿,該作動板件係藉由該樞接件樞設於該固定座之作動部,使該作動組件之作動板件與該支撐座係隔著該固定座之作動部呈相對設置,該作動桿係經穿設該作動板件的一端與該固定座之作動部後而固接於該探針座。而該驅動組係連接於該至少一檢測模組,且該驅動組係提供該至少一檢測模組所需之動力。而該真空模組係設置在該基座上,且靠近於該至少一檢測模組之探針座的該扎針部的位置,其中,該真空模組係設有一個軟性環件。而該真空驅動組係連接於該真空模組,且該真空驅動組係提供該真空模組所需之真空氣流。 To achieve the above purpose, the invention provides a detection device, which includes a base, at least one detection module, a driving group, a vacuum module and a vacuum driving group. In addition, the at least one detection module system includes a fixed base, a support base, a slide rail set, a probe base, a spring and an actuating component; and the at least one detection module system uses the fixed base set It is arranged on the base, and the fixed base of the at least one detection module is provided with an actuating part, and the support base is set on the fixed base, and one side of the slide rail set is set on the support On the seat, the probe seat is pivotally arranged on the other side of the slide rail group, so that the probe seat reciprocates on the support seat toward the direction of the actuating part of the fixed seat through the slide rail group Moving movement, wherein, one side of the probe seat is provided with a needle piercing part, and the needle piercing part of the probe seat is corresponding to the position of the action part of the fixed seat, and the two ends of the spring are respectively abutted against Between the actuating part of the fixing base and the probe holder; and the actuating assembly of the at least one detection module includes an actuating plate, a pivot and an actuating rod, and the actuating plate is borrowed The pivoting part is pivotally arranged on the actuating part of the fixed seat, so that the actuating plate of the actuating component and the supporting seat are arranged oppositely through the actuating part of the fixed seat, and the actuating rod is passed through the actuating plate One end of the piece and the action part of the fixed base are fixed on the probe base. The drive group is connected to the at least one detection module, and the drive group provides the power required by the at least one detection module. And the vacuum module is arranged on the base, and is close to the position of the needle pricking part of the probe holder of the at least one detection module, wherein the vacuum module is provided with a soft ring. The vacuum driving group is connected to the vacuum module, and the vacuum driving group provides the vacuum air flow required by the vacuum module.
本創作係先將欲進行電性檢測的一個電子產品之檢測區放置在該檢測裝置之基座上,由於該電子產品之檢測區係位在底部的因 素,因此,係藉由讓該電子產品之檢測區對應於該檢測裝置之基座的該真空模組並抵靠在該真空模組之軟性環件等技術特徵,如此一來,將讓欲進行電性檢測之電子產品放置在該檢測裝置之基座上時而能有效達到緩衝的效果。此外,當該檢測裝置因接收源自於外部的氣壓或者油壓等外部動力而讓該真空驅動組產生動力,並足以產生讓該真空模組吸附欲進行電子檢測的該電子產品之檢測區的真空氣流,將讓欲進行電性檢測的該電子產品之檢測區與該真空模組之軟性環件二者之間達到更為緊密地抵接的狀態,進而使該電子產品後續得以獲得更為穩定的電性檢測之功效。 In this creation, the detection area of an electronic product to be electrically tested is first placed on the base of the detection device, because the detection area of the electronic product is located at the bottom Therefore, by making the detection area of the electronic product correspond to the vacuum module of the base of the detection device and abut against the technical features such as the soft ring of the vacuum module, in this way, the desired When electronic products for electrical testing are placed on the base of the testing device, the effect of cushioning can be effectively achieved. In addition, when the detection device receives external power such as air pressure or oil pressure from the outside to generate power for the vacuum drive group, it is sufficient to generate a detection area for the vacuum module to absorb the electronic product to be electronically detected. The vacuum airflow will make the detection area of the electronic product to be electrically tested and the soft ring of the vacuum module more tightly contacted, so that the electronic product can be further obtained in the future. The effect of stable electrical detection.
1:檢測裝置 1: Detection device
100:基座 100: base
200:檢測模組 200: detection module
10:固定座 10: Fixed seat
15:作動部 15: Action department
17:固定部 17: fixed part
19:鎖固件 19: Locking piece
20:支撐座 20: Support seat
21:鎖制件 21: Locking parts
30:滑軌組 30: slide rail group
40:探針座 40: probe seat
41:扎針部 41: Acupuncture Department
43:電性檢測電路板 43:Electrical detection circuit board
45:固定件 45:Fixer
50:彈簧 50: spring
60:作動組件 60: Actuating components
61:作動板件 61: Actuating plate
63:樞接件 63: Pivot piece
65:作動桿 65: Actuating rod
300:驅動組 300: drive group
400:真空模組 400: vacuum module
70:真空作動部 70: Vacuum operating part
71:凸垣 71: convex wall
73:真空通道 73: Vacuum channel
80:軟性環件 80: soft ring
500:真空驅動組 500: Vacuum drive group
900:電子產品 900: Electronics
901:檢測區 901: detection area
903:電性檢測部 903: Electrical Testing Department
圖1係為本創作較佳實施例之立體示意圖,主要係揭露一種檢測裝置且並未進行電性檢測前的狀態。 Fig. 1 is a three-dimensional schematic diagram of a preferred embodiment of the present invention, mainly disclosing a detection device and the state before electrical detection is performed.
圖2係為圖1另一方向的立體示意圖。 FIG. 2 is a schematic perspective view of another direction in FIG. 1 .
圖3係為圖1之部分構件放大暨立體示意圖,主要係揭露該檢測裝置之一種檢測模組及其主要子構件的狀態。 Fig. 3 is an enlarged and three-dimensional schematic diagram of some components in Fig. 1, which mainly discloses the state of a detection module of the detection device and its main sub-components.
圖4係為圖3之剖視示意圖。 FIG. 4 is a schematic cross-sectional view of FIG. 3 .
圖5係為類似圖3之立體暨部分構件剖視示意圖,主要係揭露該檢測裝置之檢測模組已對應於一電子產品之檢測區的狀態。 FIG. 5 is a perspective view similar to FIG. 3 and a schematic cross-sectional view of some components, which mainly discloses the state that the detection module of the detection device has corresponded to the detection area of an electronic product.
圖6係為圖5之部分構件剖視示意圖,主要係揭露該檢測裝置之檢測模組的一扎針部對應於該電子產品之檢測區邊緣的一電性檢測部。 FIG. 6 is a schematic cross-sectional view of some components in FIG. 5 , which mainly discloses that a needle piercing part of the detection module of the detection device corresponds to an electrical detection part at the edge of the detection area of the electronic product.
圖7係為類似圖5之立體暨部分構件剖視示意圖,主要係揭露該檢測裝置之檢測模組與該電子產品之電性檢測部進行電性導接後的狀態。 FIG. 7 is a perspective view similar to FIG. 5 and a schematic cross-sectional view of some components, which mainly discloses the state after the detection module of the detection device is electrically connected to the electrical detection part of the electronic product.
圖8係為圖7之部分構件放大暨剖視示意圖。 FIG. 8 is an enlarged and cross-sectional schematic diagram of some components in FIG. 7 .
圖9係為圖7之剖視示意圖。 FIG. 9 is a schematic cross-sectional view of FIG. 7 .
申請人首先在此說明,於整篇說明書中,包括以下介紹的實施例以及申請專利範圍的各請求項中,有關方向性的名詞皆以本案〔圖示簡單說明〕中所列各圖式的方向為基準。其次,在以下將要介紹之實施例及圖式中,相同之元件標號,代表相同或近似之元件或其結構特徵。而且,有關本創作的詳細構造、特點、組裝或使用、製造等方式,將於後續的實施方式詳細說明中予以描述,然,在本創作領域中具有通常知識者應能瞭解,該等詳細說明及本創作所列舉的實施例,係僅用於支持說明本創作實能據以實現,並非用以限制本創作之申請專利範圍。 The applicant first explains here that in the entire specification, including the embodiments described below and the claims of the scope of the patent application, the nouns related to direction are all represented by the figures listed in this case [simple description of illustrations] Orientation is the basis. Secondly, in the embodiments and drawings to be described below, the same component numbers represent the same or similar components or their structural features. Moreover, the detailed structure, characteristics, assembly or use, and manufacturing methods of this creation will be described in the subsequent detailed description of the implementation. However, those with ordinary knowledge in the field of this creation should understand that these detailed descriptions And the examples listed in this creation are only used to support and illustrate the actual realization of this creation, and are not used to limit the scope of patent applications for this creation.
請先參閱圖1、圖2及圖5,為本創作較佳實施例所揭露之一種檢測裝置1,係適用於檢測一種電子產品900(例如:顯示器或面板等),該檢測裝置1係包含有一個呈長形板體的基座100、六個組設於該基座100上的檢測模組200、一個配合對應並各自連接該等六個檢測模組200的驅動組300、六個設置在該基座100上的真空模組400以及一個配合對應並各自連接該六個真空模組400的真空驅動組500;其中,四個該等檢測模組200係平行地間隔組設在該基座100之其中一短側邊的邊緣位置,且各自對應於組設在該基座100之同一短側邊上的四個該等真空
模組400的位置,而餘下的二該檢測模組200係兩兩相對應且組設在該基座100之另一短側邊的邊緣位置,且二該檢測模組200係各自對應於組設在該基座100之另一同一短側邊上的二該真空模組400;其中,該驅動組300係各別連接於六個該等檢測模組200的其中一側,使任一該檢測模組200係可受到所連接的該驅動組300之驅動而基於其所對應於該基座100之真空模組400的位置呈現往復滑移運動。而值得一提的是,係可視實際該電子產品900的尺寸大小,並將該電子產品900僅選擇一並且放置在該檢測裝置1之基座100的任一短側邊上的位置,進而僅選擇一該檢測模組200即可;當然,前述所列該等技術特徵係皆為凡所屬技術領域中具有通常知識者得經參酌本創作之較佳實施例後即能易於思及,或僅屬數量上之簡易變化,因此,皆非用以作為限定本創作所欲主張之技術特徵,合先敘明。
Please refer to Fig. 1, Fig. 2 and Fig. 5 first, which is a
請再一併參閱圖1至圖6,任一該檢測模組200係包括有一個呈長形板型體的固定座10、一個支撐座20、一個滑軌組30、一個探針座40、二個彈簧50以及一個作動組件60。
Please refer to Fig. 1 to Fig. 6 again, any of the
請再一併參閱圖3至圖6,而任一該檢測模組200之呈長形板型體的該固定座10係具有一個頂面以及相對於該頂面的一個底面,且該固定座10的二個相對短側邊係各別設置一個作動部15以及一個固定部17,其中,該固定座10係藉由若干個鎖固件19各別經穿設該固定座10之固定部17後而鎖固在該檢測裝置1之基座100上。而任一該檢測模組200之支撐座20係組設在該固定座10之作動部15上。而任一該檢測模組200之滑軌組30的一側係組設在該支撐座20上,且該探針座40係樞設在
該滑軌組30的另一側,使該探針座40係可藉由該滑軌組30而在該支撐座20上朝著該固定座10之作動部15的方向呈現往復滑移運動;較佳地,該支撐座20與該探針座40二者構件彼此之間係隔著該滑軌組30而呈現平行間隔設置;更佳地,該支撐座20係藉由一個鎖制件21鎖制於該支撐座20與組設在該支撐座20上的該滑軌組30之一側二者構件,用以達到該支撐座20與該滑軌組30二者構件之間的穩定性。而該二彈簧50係間隔地設置在該探針座40與該固定座10之作動部15二者之間,較佳地,使任一該彈簧50的二端係各別抵接在該探針座40與該固定座10之作動部15二者之間,當然,亦可視實際配置僅設置一該彈簧50即可。而值得一提的是,任一該檢測模組200之支撐座20係亦可組設在該固定座10之頂面的假想中心位置,且讓該支撐座20較靠近於該固定座10之作動部15的位置;又值得一提的是,任一該檢測模組200之滑軌組30係可為線性滑軌、導柱或其均等配合結構所構成,使該支撐座20與該探針座40二者彼此對應樞設於該滑軌組30的連接處,可配合該滑軌組30而由線性滑塊、導套、襯套或其均等配合結構所構成。當然,前述所列該等技術特徵係皆為凡所屬技術領域中具有通常知識者得經參酌本創作之較佳實施例後即能易於思及,或僅屬數量上之簡易變化,因此,皆非用以作為限定本創作所欲主張之技術特徵,合先敘明。
Please refer to Fig. 3 to Fig. 6 again, and the
請再一併參閱圖3至圖6,而任一該檢測模組200之探針座40係包括有一個扎針部41、一個電性檢測電路板43以及一個固定件45;該扎針部41係位在該探針座40的一側,係相對應於該固定座10之作動部15的位置,其中,該扎針部41係可視實際情況嵌設具有導電效益之FFC
探針組(Flexible Flat Cable,軟性扁平排線)或FPC探針組(Flex Printed Circuit,軟性印刷電路板)等電性檢測金屬構件,此外,該扎針部41係呈微朝上傾斜設置;該電性檢測電路板43的一側係電性連接於該扎針部41,該電性檢測電路板43的另一側係可用以電性接設於外部所對應的電性檢測儀器;該固定件45係用以固接於該扎針部41與該扎針部41電性連接於該電性檢測電路板43的一側的位置,使得該扎針部41與該電性檢測電路板43二者構件不會隨意移動。
Please refer to Fig. 3 to Fig. 6 again, and the
請再一併參閱圖3至圖6,而該作動組件60係包括有一個作動板件61、一個樞接件63以及一個作動桿65;該作動板件61係藉由該該樞接件63而樞設於該固定座10之作動部15,且作動組件60之作動板件61係與該支撐座20隔著該固定座10之作動部15呈相對設置,其中,該作動板件61係得藉由該樞接件63而基於該固定座10之作動部15呈現左右樞擺運動;該作動桿65的一端係經穿設該作動板件61的一端與該固定座10之作動部15後而固接於該探針座40。而值得一提的是,該作動組件60之作動桿65係可為一高度微調螺絲、一高度微調桿件或為其均等功效之構件或結構。
Please refer to Fig. 3 to Fig. 6 again, and the
請再一併參閱圖5及圖6,任一該真空模組400係包括有一個真空作動部70以及環覆於該真空作動部70周緣的軟性環件80,其中,該真空作動部70係凸設有複數間隔等距排列的凸垣71,使任該二凸垣71之間形成一個可供氣流流通之真空通道73。而值得一提的是,該檢測裝置1之任一該真空模組400的該真空作動部70係凹設於該基座100之中,且任一該真空模組400之軟性環件80彼此之間係亦呈間隔等距設置。
Please refer to Fig. 5 and Fig. 6 again, any one of the
以上為本創作較佳實施例所揭露之檢測裝置1及其各子構件的技術特徵,其後將繼續揭露若藉由本創作較佳實施例所揭露之檢測裝置1進行該電子產品900之檢測區901位於底部時的電性檢測,而其主要作動及其所欲達成之功效在於:
The above are the technical features of the
其一,請一併參閱圖1、圖2、圖5及圖6,首先,將欲進行電性檢測之電子產品900(例如:顯示器或面板等)放置在該檢測裝置1之基座100上,由於該電子產品900之檢測區901位在底部,因此,藉由讓該電子產品900之檢測區901係對應於該基座100之該等六個真空模組400的該真空作動部70的位置,並且抵靠於任一該真空模組400之軟性環件80等技術特徵,直至位在該電子產品900之檢測區901邊緣的電性檢測部903(例如:PAD)凸伸於該基座100,如此一來,即能達到適配於特殊規格的該電子產品900之檢測區901位在底部時電性檢測之功效。
One, please refer to Fig. 1, Fig. 2, Fig. 5 and Fig. 6 together, at first, place the electronic product 900 (for example: display or panel, etc.) to be tested electrically on the
其二,請再一併參閱圖1至圖6,接著,隨即啟動外部的氣壓或者油壓等外部動力而讓該檢測裝置1之真空驅動組500產生動力,使該真空驅動組500得以逕自地產生足以讓該等六個真空模組400之真空作動部70各自吸附該電子產品900之檢測區901的真空氣流,而藉由讓該電子產品900之檢測區901與任一該真空模組400之軟性環件80二者之間更為緊密地抵接的技術特徵,如此一來,將讓該電子產品900放置在該檢測裝置1之基座100上時而能有效達到緩衝的效果,進而使該電子產品900後續得以獲得更為穩定的電性檢測之功效。
Second, please refer to Fig. 1 to Fig. 6 together again, and then, start external air pressure or oil pressure and other external powers immediately to allow the
其三,請再一併參閱圖1至圖9,接著,隨即藉由啟動外部的氣壓或油壓等外部動力而讓該檢測裝置1之驅動組300產生動力的技
術特徵,使任一該檢測模組200之固定座10的該作動部15受到該驅動組300的動力而逐漸地朝設置在該檢測裝置1之基座100上的該電子產品900之檢測區901的方向推進運動,直至任一該檢測模組200之探針座40的該扎針部41對應於該電子產品900底部之檢測區901邊緣的電性檢測部903的位置為止,如此一來,即能透過本創作所提供的檢測裝置1之任一該檢測模組200得以達到初步概略性的對應於該電子產品900位在底部的該檢測區901的對應功效。
Thirdly, please refer to Fig. 1 to Fig. 9 together again, and then, by starting external power such as external air pressure or oil pressure, the technology of driving
其四,請再一併參閱圖6至圖9,接著,可藉由微調任一該檢測模組200之作動組件60的該作動桿65的技術特徵,如此一來,讓任一該檢測模組200之探針座40的該扎針部41所嵌設之具有導電效益之FFC探針組(Flexible Flat Cable,軟性扁平排線)或FPC探針組(Flex Printed Circuit,軟性印刷電路板)等電性檢測金屬構件,可逐漸地朝該電子產品900底部之檢測區901邊緣的該電性檢測部903的位置靠近,進而達到微調校對之功效。
Fourthly, please refer to Fig. 6 to Fig. 9 together again, then, by fine-tuning the technical characteristics of the actuating
其五,請再一併參閱圖3至圖9,此時,由於原先該等檢測模組200之作動組件60的該作動板件61係持續地受到外部的氣壓或油壓等外部動力作用的技術特徵,使該等檢測模組200之作動組件60的該作動板件61係皆基於該樞接件63而呈現樞擺運動,而讓該作動組件60之作動板件61的一端係朝該固定座10之底面的方向靠近,並讓該作動組件60之作動桿65帶動該探針座40在該滑軌組30上朝該固定座10之作動部15的方向滑移靠近,直至任一該檢測模組200之該二彈簧50呈現一預定壓
縮形變的狀態為止,如此一來,讓任一該檢測模組200之探針座40的該扎針部41皆可達到電性檢測前的預先整備之功效。
Fifth, please refer to Fig. 3 to Fig. 9 together again. At this time, because the
其六,請再一併參閱圖1至圖9,接著,當該等檢測模組200之作動組件60的該作動板件61不再受到外部的氣壓或油壓等外部動力作用時,此時,將讓任一該檢測模組200之作動組件60的該作動板件61靠近該固定座10之底面的一端係朝初始位置的方向呈復歸運動,並讓該作動組件60之作動桿65帶動該探針座40在該滑軌組30上自遠離該固定座10之作動部15而朝初始位置的方向滑移復歸,且讓任一該檢測模組200之該二彈簧50皆自壓縮形變的狀態恢復為初始狀態,直至任一該檢測模組200之探針座40的該扎針部41電性接設於該電子產品900之檢測區901邊緣的該電性檢測部903的位置為止,如此一來,除可達到對該電子產品900進行背面或反向扎針之電性測試的功效之外,同理,本創作所揭露之檢測裝置及其各子構件亦能達到重複電性檢測之功效。
Sixth, please refer to Fig. 1 to Fig. 9 together again, then, when the
1:檢測裝置 1: Detection device
100:基座 100: base
200:檢測模組 200: detection module
400:真空模組 400: vacuum module
500:真空驅動組 500: Vacuum drive group
Claims (10)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW111212100U TWM638948U (en) | 2022-11-04 | 2022-11-04 | Buffer detection module and device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW111212100U TWM638948U (en) | 2022-11-04 | 2022-11-04 | Buffer detection module and device |
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| Publication Number | Publication Date |
|---|---|
| TWM638948U true TWM638948U (en) | 2023-03-21 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW111212100U TWM638948U (en) | 2022-11-04 | 2022-11-04 | Buffer detection module and device |
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| TW (1) | TWM638948U (en) |
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2022
- 2022-11-04 TW TW111212100U patent/TWM638948U/en unknown
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