TWM618100U - Structure improvement of testing machine - Google Patents

Abstract

This model relates to a structural improvement of a testing machine. The main structure includes an entry switch. The entry switch has an entry external part and first to fourth entry connections. The side of the entry switch is provided with first to second Four test switches, the first to fourth test switches have first to fourth test terminals, first to fourth input terminals, first to fourth output terminals, first to fourth auxiliary terminals, and first to fourth test switches, respectively One to fourth impedance ends, and an output switch is arranged on the side of the fourth test switch, and the output switch has an output external part and first to fourth output connection parts. With the above structure, the user can use the first to fourth test switches to connect up to four test objects for testing, thereby achieving a test device with high life cycle, low insertion loss, and low harmonic distortion.

Description

Structure improvement of testing machine

This model is to provide a structural improvement of a testing machine, especially a structural improvement of a testing machine that can reduce the probability of damage and improve the accuracy of the test.

By the way, with the progress of the times, the types of chips will continue to increase, and the fineness will also continue to improve. And due to the improvement of the fineness, the requirements of the corresponding testing institutions will also be relatively improved.

When performing high-power RF tests, the harmonic performance of the test machine itself will directly affect the test results. At present, most of the industry uses mechanical switches to directly perform test actions to meet the required test conditions. However, most of the general mechanical switches have the problems of large size and short service period. Therefore, some people will choose solid-state switches to use. The performance on the insertion loss will be poor.

Therefore, how to solve the above-mentioned conventional problems and deficiencies is the direction that the applicants of this new model and related manufacturers engaged in this industry urgently want to study and improve.

Therefore, in view of the above-mentioned deficiencies, the applicant of the present model has collected relevant information, evaluated and considered by multiple parties, and based on the accumulated years of experience in this industry, through continuous trials and revisions, he designed this kind of better at the same time. It is the patentee of the structure improvement of the testing machine with high test effect and high life cycle.

The main purpose of the present invention is to use a plurality of micro-electromechanical switches to form a switch matrix, thereby simultaneously having a better test effect and a higher life cycle.

To achieve the above objective, the main structure of the present invention includes: an entry switch, a first test switch set at the side of the entry switch, and a second test switch set at the side of the first test switch , A third test switch set on the side of the second test switch, a fourth test switch set on the side of the third test switch, and a fourth test switch set on the side of the fourth test switch Output cut A converter, wherein the access switch has an access external part, a first access connection part connected with the access external part, a second access connection part connected with the access external part, and a second access connection part connected with the access external part. A third entry connection portion connected to the entry and external portion, and a fourth entry connection portion connected to the entry and external portion; and the first test switch has a first test end, a first test end and the first entry A first input terminal connected to the connecting portion, a first output terminal connected to the first test terminal, a first auxiliary terminal connected to the first test terminal, and a first test terminal connected to the first test terminal The first impedance terminal; the second test switch has a second test terminal, a second input terminal connected to the second test terminal and the second entry connecting portion, and a first test terminal connected to the second test terminal Two output terminals, a second auxiliary terminal connected with the second test terminal, and a second impedance terminal connected with the second test terminal; the third test switch has a third test terminal, a second auxiliary terminal connected with the second test terminal; Three test terminals and a third input terminal connected to the third entry connecting portion, a third output terminal connected to the third test terminal, a third auxiliary terminal connected to the third test terminal, and a A third impedance terminal connected to the third test terminal; the fourth test switch has a fourth test terminal, a fourth input terminal connected to the fourth test terminal and the fourth entry connecting portion, and a fourth input terminal connected to the fourth test terminal. A fourth output terminal connected to the fourth test terminal, a fourth auxiliary terminal connected to the fourth test terminal, and a fourth impedance terminal connected to the fourth test terminal; the output switch has an output External part, a first output connection part connected with the output external part and the first output terminal, a second output connection part connected with the output external part and the second output terminal, and a second output connection part connected with the output external part and the second output terminal A third output connection part connected to the third output terminal and a fourth output connection part connected to the output external part and the fourth output terminal.

With the above-mentioned structure, the user can connect the signal input end of the test instrument to the access external part of the access switch, and at the same time connect the signal receiving end of the test instrument to the output external part of the output switch. And connect the four tested objects to the first test terminal of the first test switch, the second test terminal of the second test switch, the third test terminal of the third test switch, and the fourth test switch. On the fourth test terminal.

The test instrument can send the first test signal and import it into the switch, and then let the first test signal enter one of the tested objects through the external connection part, the first input connection part, the first input terminal, and the first test terminal. , And after the first test signal passes through the test object, it will return to the test instrument via the first test terminal, the first output terminal, the first output connection part, and the output external part, thereby switching the connection for the first test The device to be tested is tested.

At the same time, the second test signal from the test instrument will also be imported into the switch, and then Let the second test signal enter one of the tested objects through the external connection part, the second input connection part, the second input terminal, and the second test terminal. After the second test signal passes the test object, it will pass the second test The terminal, the second output terminal, the second output connection part, and the output external part are returned to the test instrument, so as to test the object under test connected to the second test switch.

As mentioned above, the test object connected to the third test switch can receive the third test signal through the external connection part, the third input connection part, the third input terminal, and the third test terminal, and then the third test signal The third test terminal, the third output terminal, the third output connection part, and the output external part lead back to the test instrument, thereby performing a test action.

The test object connected to the fourth test switch can receive the fourth test signal through the external connection part, the fourth input connection part, the fourth input terminal, and the fourth test terminal, and then pass the fourth test signal through the fourth test signal. The test terminal, the fourth output terminal, the fourth output connection part, and the output external part are led back to the test instrument, thereby performing a test action.

If the first test switch, the second test switch, the third test switch, or the fourth test switch is not connected to the test object, the connected signal can be connected to the first impedance terminal and the second impedance terminal , The third impedance end, or the fourth impedance end to assist the test action.

And since the access switch, the first test switch, the second test switch, the third test switch, the fourth test switch, and the output switch are all one-in and four-out micro-electromechanical switches, it can be used Multiple micro-electromechanical switches are combined into a switch matrix to perform the test action. If the number of tests is less than four, the connection position can be turned to the corresponding impedance to use the effect of the impedance. Reduce the effect of interference to increase the accuracy of the test, so that the advantages of higher life cycle, low insertion loss, and low harmonic distortion can be achieved at the same time.

And while testing again, the user can connect the first auxiliary terminal, the second auxiliary terminal, the third auxiliary terminal, and the fourth auxiliary terminal to a network analyzer respectively to perform the measurement of the scattering parameter (S parameter) in parallel. Test actions, thereby increasing the convenience of use, can perform two types of test functions at the same time.

With the above-mentioned technology, it is possible to break through the problem that the conventional testing machine cannot have a better test effect and a longer life cycle at the same time, so as to achieve the practical advancement of the above-mentioned advantages.

1: Enter the switcher

11: Enter the external department

12: The first entry into the connection part

13: The second entry into the connection part

14: The third entry into the connection part

15: The fourth entry into the connection part

2: The first test switch

21: The first test terminal

22: The first input

23: The first output

24: First auxiliary terminal

25: The first impedance terminal

3: The second test switch

31: The second test terminal

32: second input

33: second output

34: second auxiliary terminal

35: second impedance terminal

4: The third test switch

41: The third test terminal

42: third input

43: third output

44: third auxiliary terminal

45: third impedance terminal

5: The fourth test switch

51: The fourth test terminal

52: Fourth input

53: Fourth output

54: Fourth auxiliary terminal

55: Fourth impedance terminal

6: Output switcher

61: Output external part

62: The first output connection

63: The second output connection part

64: Third output connection part

65: Fourth output connection part

7: Test equipment

8: network analyzer

A, B, C, D: test object

The first figure is a three-dimensional view of the preferred embodiment of the new model.

The second figure is a top view of the preferred embodiment of the new model.

The third figure is a schematic diagram of the connection in the first aspect of the preferred embodiment of the new invention.

The fourth figure is a schematic diagram of signal transmission in the first aspect of the preferred embodiment of the new invention.

The fifth figure is a schematic diagram of the second aspect of the connection of the preferred embodiment of the new invention.

The sixth figure is a schematic diagram of the third aspect of the connection of the preferred embodiment of the new invention.

The seventh figure is a schematic diagram of signal transmission in the third aspect of the preferred embodiment of the new invention.

In order to achieve the above-mentioned purpose and effect, the technical means and structure adopted by the present invention are drawn to illustrate the characteristics and functions of the preferred embodiment of the present invention in detail as follows, so as to fully understand.

Please refer to the first and second figures, which are the three-dimensional view and the top view of the preferred embodiment of the present invention. From the figures, it can be clearly seen that the present invention includes:

An entry switch 1, and the entry switch 1 has an entry external portion 11, a first entry connection portion 12 connected to the entry external portion 11, a second entry connection portion 13 connected to the entry external portion 11, A third entry connecting portion 14 connected to the entry outer portion 11, and a fourth entry connecting portion 15 connected to the entry outer portion 11;

A first test switch 2 is provided at the side of the entry switch 1, and the first test switch 2 has a first test terminal 21, a first test terminal 21 and a first entry connection part 12 connected to the first test switch 2 An input terminal 22, a first output terminal 23 connected to the first test terminal 21, a first auxiliary terminal 24 connected to the first test terminal 21, and a first auxiliary terminal 24 connected to the first test terminal 21 The impedance terminal 25, and the first impedance terminal 25 is for connecting a 50 ohm (ohms) impedance device;

A second test switch 3 arranged at the side of the first test switch 2, and the second test switch 3 has a second test terminal 31, a second test terminal 31 and a second access connecting portion 13 connected The second input terminal 32, a second output terminal 33 connected to the second test terminal 31, a second auxiliary terminal 34 connected to the second test terminal 31, and a second auxiliary terminal 34 connected to the second test terminal 31 The second impedance terminal 35, and the second impedance terminal 35 is for connecting a 50 ohm (ohms) impedance device;

A third test switch 4 arranged at the side of the second test switch 3, and the third test switch 4 has a third test terminal 41, and is connected to the third test terminal 41 and the third entry connecting portion 14 A third input terminal 42, a third output terminal 43 connected to the third test terminal 41, a third auxiliary terminal 44 connected to the third test terminal 41, and a third auxiliary terminal 44 connected to the third test terminal 41 The third impedance terminal 45, and the third impedance terminal 45 is for connecting a 50 ohm (ohms) impedance device;

A fourth test switch 5 arranged at the side of the third test switch 4, and the fourth test switch 5 has a fourth test terminal 51, and is connected to the fourth test terminal 51 and the fourth entry connecting portion 15 The fourth input terminal 52, a fourth output terminal 53 connected to the fourth test terminal 51, a fourth auxiliary terminal 54 connected to the fourth test terminal 51, and a fourth auxiliary terminal 54 connected to the fourth test terminal 51 The fourth impedance terminal 55, and the fourth impedance terminal 55 is for connecting a 50 ohm (ohms) resistor; and

An output switch 6 arranged on the side of the fourth test switch 5, and the output switch 6 has an output external part 61, a first output connection connected to the output external part 61 and the first output terminal 23 Section 62, a second output connection portion 63 connected to the output external portion 61 and the second output terminal 33, a third output connection portion 64 connected to the output external portion 61 and the third output terminal 43, and an The fourth output connecting portion 65 to which the output external portion 61 and the fourth output terminal 53 are connected.

And in this embodiment, the entry switch 1, the first test switch 2, the second test switch 3, the third test switch 4, the fourth test switch 5, and the output switch 6 are all models MM 5130 The MEMS switch allows the user to control the internal connection effect separately through MEMS technology.

Through the above description, we can understand the structure of this technology, and according to the corresponding cooperation of this structure, it can achieve the advantages of improving the life cycle, reducing the insertion loss, and low harmonic distortion at the same time. The detailed explanation will be given below. Description.

Please also refer to the first to seventh figures, which are the three-dimensional view to the third aspect of the signal transmission schematic diagram of the preferred embodiment of the new invention. When the above-mentioned components are assembled, it can be clearly seen from the figure. As shown in the third and fourth figures, which is the test mode of the first aspect of this embodiment, a test instrument 7 is connected to the input external part 11 of the input switch 1 and the output of the output switch 6 Connect the four test objects to the test terminal of each test switch at the same time on the external part 61 (in this embodiment, the test object A is connected to the first test terminal 21 of the first test switch 2, and the The test object B is connected to the second test end 31 of the second test switch 3, the test object C is connected to the third test end 41 of the third test switch 4, and the test object D is connected to the fourth Test the fourth test terminal 51 of the switch 5).

After that, the user can control the test instrument 7 to transmit the test signal to the entry switch 1, and the test instrument 7 can send out high-power first test signal to fourth test signal filter mode Group as an example. The first test signal enters the test object A through the external connection part 11, the first input connection part 12, the first input terminal 22, and the first test terminal 21, and after the first test signal passes the test object A , It will be sent back to the testing instrument 7 through the first test terminal 21, the first output terminal 23, the first output connection part 62, and the output external part 61, so as to test the test object A through the first test signal action.

In contrast, the second test signal generated by the test instrument 7 enters the test object B through the external connection part 11, the second input connection part 13, the second input terminal 32, and the second test terminal 31, and then enters the object B under test. The test object B is sent back to the testing instrument 7 via the second test terminal 31, the second output terminal 33, the second output connection part 63, and the output external part 61 to perform a test action on the test object B.

The third test signal generated by the test instrument 7 enters the test object C through the external connection part 11, the third input connection part 14, the third input terminal 42, and the third test terminal 41, and then from the test object C It is sent back to the testing instrument 7 via the third test terminal 41, the third output terminal 43, the third output connection part 64, and the output external part 61 to perform a test action on the test object C.

The fourth test signal generated by the test instrument 7 enters the test object D through the external connection part 11, the fourth input connection part 15, the fourth input terminal 52, and the fourth test terminal 51, and then passes through the test object D The fourth test terminal 51, the fourth output terminal 53, the fourth output connection part 65, and the output external part 61 are sent back to the test instrument 7 to perform a test action on the test object D.

In this way, six microelectromechanical switches can be used to generate a double pole four throw (DP4T) switch matrix through the above-mentioned actions to perform test actions on four test objects at the same time, and due to this technology It uses a switch matrix composed of micro-electromechanical switches, so it can simultaneously have the advantages of high life cycle, low insertion loss, and low harmonic distortion.

And this case is related to the first entry connecting portion 12, the first test end 21, the first auxiliary end 24, the second test end 31, the second auxiliary end 34, the third test end 41, the third auxiliary end 44, and the fourth test end 51. The connectors connected to the fourth auxiliary terminal 54 and the output external part 61 all use vertical connectors, which can achieve better impedance matching and stability.

The user can also connect the first auxiliary terminal 24, the second auxiliary terminal 34, the third auxiliary terminal 44, and the fourth auxiliary terminal 54 to a network analyzer 8 as shown in the fifth figure, which is the example of this embodiment In the second aspect of the test mode, the corresponding test signal can be transmitted to the test object A to the test object D via the network analyzer 8, so as to perform the measurement of the scattering parameter (S parameter) in parallel. Multiple types of measurement actions can be performed at the same time, thereby increasing the convenience of use.

If there are less than four objects under test, and the test switch is not connected to the object under test, the connection effect can be changed to the position of the impedance end to reduce the interference signal by using a 50 ohm (ohms) impedance device to achieve The advantage of reducing harmonic distortion, as shown in Figure 6 and Figure 7, is the test mode of the third aspect of this embodiment. The third aspect has only two test objects (using test object B) And the test object C as an example), so when the first test switch 2 and the fourth test switch 5 that are not connected to the test object will change the test terminal to connect to the impedance terminal, the first test switch of this embodiment The test switch 2 connects the first test terminal 21, the first input terminal 22, the first output terminal 23, and the first impedance terminal 25, and the fourth test switch 5 connects the fourth test terminal 51, the fourth The input terminal 52, the fourth output terminal 53, and the fourth impedance terminal 55 are connected, so that the 50 ohm (ohms) resistor connected to the first impedance terminal 25 and the fourth impedance terminal 55 can be used to reduce harmonic distortion. The effect is to improve the convenience of use and the accuracy of the test.

However, the above descriptions are only the preferred embodiments of the present model, and are not limited to the patent scope of the present model. Therefore, all simple modifications and equivalent structural changes made by using the description and schematic content of the present model shall be the same. Included in the scope of the patent for this new model, combined to Chen Ming.

To sum up, the structural improvement of the testing machine of this new model can indeed achieve its efficacy and purpose when used. Therefore, this model is truly a new model with excellent practicability. In order to meet the requirements of a new patent application, an application is filed in accordance with the law. , I hope that the review committee will grant this model as soon as possible to protect the applicant’s hard work. If the review committee has any doubts, please feel free to write instructions.

1: Enter the switcher

2: The first test switch

3: The second test switch

4: The third test switch

5: The fourth test switch

6: Output switcher

Claims (10)

A structural improvement of a testing machine, which mainly includes: An entry switch, the entry switch has an entry and external part, a first entry and connection part connected with the entry and external part, a second entry and connection part connected with the entry and external part, and a connection with the entry and external part. A third entry connection part connected to the external part, and a fourth entry connection part connected to the external part; A first test switch, the first test switch is arranged at the side of the entry switch, and the first test switch has a first test terminal, a first test terminal and a first entry connection part Connected to the first input terminal, a first output terminal connected to the first test terminal, a first auxiliary terminal connected to the first test terminal, and a first test terminal connected to the first test terminal An impedance end; A second test switch, the second test switch is arranged at the side of the first test switch, and the second test switch has a second test terminal, a second test terminal and the second entry A second input terminal connected to the connecting portion, a second output terminal connected to the second test terminal, a second auxiliary terminal connected to the second test terminal, and a second auxiliary terminal connected to the second test terminal的 second impedance terminal; A third test switch, the third test switch is arranged at the side of the second test switch, and the third test switch has a third test terminal, a third test terminal and the third entry A third input terminal connected to the connecting portion, a third output terminal connected to the third test terminal, a third auxiliary terminal connected to the third test terminal, and a third auxiliary terminal connected to the third test terminal The third impedance terminal; A fourth test switch, the fourth test switch is arranged at the side of the third test switch, and the fourth test switch has a fourth test terminal, a fourth test terminal, and the fourth entry A fourth input terminal connected to the connecting portion, a fourth output terminal connected to the fourth test terminal, a fourth auxiliary terminal connected to the fourth test terminal, and a fourth auxiliary terminal connected to the fourth test terminal And an output switch, the output switch is arranged at the side of the fourth test switch, and the output switch has an output external part, an output external part and the first A first output connection part connected to the output terminal, a second output connection part connected to the output external part and the second output terminal, and a third output connection to the output external part and the third output terminal The connecting portion and a fourth output connecting portion connected with the output external portion and the fourth output terminal. For example, the structure improvement of the testing machine described in item 1 of the scope of patent application, in which the access switch is a micro-electromechanical switch, and the access external part, the first access connection part, and the second access connection part can be modified. , The communication relationship between the third entry connecting portion and the fourth entry connecting portion. For example, the structure improvement of the testing machine described in item 1 of the scope of patent application, wherein the first test switch is a micro-electromechanical switch, and is used to modify the first test terminal, the first input terminal, and the first output The connection relationship between the terminal, the first auxiliary terminal, and the first impedance terminal. For example, the structure improvement of the testing machine described in item 1 of the scope of patent application, wherein the second test switch is a micro-electromechanical switch, and is used to modify the second test terminal, the second input terminal, and the second output The connection relationship between the terminal, the second auxiliary terminal, and the second impedance terminal. For example, the structure improvement of the testing machine described in item 1 of the scope of patent application, wherein the third test switch is a micro-electromechanical switch, and is used to modify the third test terminal, the third input terminal, and the third output Connection between the terminal, the third auxiliary terminal, and the third impedance terminal. For example, the structure improvement of the testing machine described in item 1 of the scope of patent application, wherein the fourth test switch is a micro-electromechanical switch, and is used to modify the fourth test terminal, the fourth input terminal, and the fourth output Connection relationship between the terminal, the fourth auxiliary terminal, and the fourth impedance terminal. For example, the structure improvement of the testing machine described in item 1 of the scope of patent application, wherein the output switch is a micro-electromechanical switch, and is used to modify the output external part, the first output connection part, and the second output connection part , The communication relationship between the third output connection portion and the fourth output connection portion. The structure improvement of the testing machine described in item 1 of the scope of patent application, wherein the first impedance terminal, the second impedance terminal, the third impedance terminal, and the fourth impedance terminal are connected to a 50 ohm (ohms) The impedance device. The structure improvement of the testing machine described in item 1 of the scope of patent application, wherein the entry switch, the first test switch, the second test switch, the third test switch, the fourth test switch, And the output switch is a model MM 5130 switch. As for the structural improvement of the testing machine described in item 1 of the scope of patent application, the first auxiliary terminal, the second auxiliary terminal, the third auxiliary terminal, and the fourth auxiliary terminal are for connecting a network analyzer.

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