TWM657039U - Continuous manufacturing device with substrate cleaning function - Google Patents
Continuous manufacturing device with substrate cleaning function Download PDFInfo
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- TWM657039U TWM657039U TW113200700U TW113200700U TWM657039U TW M657039 U TWM657039 U TW M657039U TW 113200700 U TW113200700 U TW 113200700U TW 113200700 U TW113200700 U TW 113200700U TW M657039 U TWM657039 U TW M657039U
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- B—PERFORMING OPERATIONS; TRANSPORTING
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- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/36—Removing material
- B23K26/38—Removing material by boring or cutting
- B23K26/382—Removing material by boring or cutting by boring
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Abstract
Description
本創作係有關一種用於基板之製作技術,尤指一種具基板清潔功能之連續式製作設備。 This work is about a manufacturing technology for substrates, especially a continuous manufacturing equipment with substrate cleaning function.
在基板之製作與清潔方法中,一般會先於前端之除膠渣站對基板之通孔進行除膠渣(desmear)清潔,再依序進行基板之化學鍍銅(簡稱“化銅”)作業、基板之乾膜(dried film)之貼膜作業、乾膜之曝光作業、乾膜之顯影作業與基板之電鍍作業等,然後於後端之剝膜站對基板之乾膜進行剝膜(stripping)作業。 In the manufacturing and cleaning method of the substrate, the desmearing station at the front end is generally used to clean the through holes of the substrate, and then the chemical copper plating (abbreviated as "cupric") operation of the substrate, the film bonding operation of the substrate dry film, the exposure operation of the dry film, the development operation of the dry film and the electroplating operation of the substrate are carried out in sequence, and then the stripping operation of the substrate dry film is carried out at the stripping station at the back end.
惟,對基板之乾膜進行剝膜作業後,通常會產生基板之乾膜有剝膜不潔或殘留乾膜之情形,故需透過第一次離線(off-line)方式將基板從後端之剝膜站移動至前端之除膠渣站以進行乾膜之除膠渣清潔作業,再透過第二次離線(off-line)方式將基板從前端之除膠渣站移動至後端之微蝕站以進行基板之微蝕作業。 However, after the dry film on the substrate is stripped, the dry film on the substrate is usually not clean or has residual dry film. Therefore, the substrate needs to be moved from the stripping station at the back end to the degumming station at the front end to perform the degumming cleaning operation of the dry film, and then the substrate needs to be moved from the degumming station at the front end to the micro-etching station at the back end to perform the micro-etching operation of the substrate through the second off-line method.
圖1為習知技術中有關基板之製作與清潔方法之流程示意圖,並包括下列步驟S01至步驟S11。 FIG1 is a schematic diagram of the process of the substrate manufacturing and cleaning method in the prior art, and includes the following steps S01 to S11.
如步驟S01至步驟S02所示,先在基板中形成通孔,再於前端之除膠渣站對基板之通孔進行除膠渣清潔作業。 As shown in step S01 to step S02, a through hole is first formed in the substrate, and then the through hole of the substrate is cleaned by degumming residue at the front end degumming residue station.
如步驟S03至步驟S07所示,依序進行基板之化學鍍銅(化銅)作業、基板之乾膜之貼膜作業、乾膜之曝光作業、乾膜之顯影作業與基板之電鍍作業等。 As shown in step S03 to step S07, the chemical copper plating (copperization) operation of the substrate, the film lamination operation of the substrate, the exposure operation of the dry film, the development operation of the dry film and the electroplating operation of the substrate are performed in sequence.
如步驟S08至步驟S09所示,於後端之剝膜站對基板之乾膜進行剝膜作業,此時會產生基板之乾膜有剝膜不潔或殘留乾膜之情形,故需透過第一次離線(off-line)方式將基板從後端之剝膜站移動至前端之除膠渣站,以在前端之除膠渣站中對基板進行乾膜之除膠渣清潔作業(見步驟S02)。 As shown in step S08 to step S09, the dry film of the substrate is stripped at the rear film stripping station. At this time, the dry film of the substrate may be stripped uncleanly or have residual dry film. Therefore, the substrate needs to be moved from the rear film stripping station to the front glue removal station through the first off-line method to perform glue removal and cleaning of the dry film of the substrate in the front glue removal station (see step S02).
如步驟S10至步驟S11所示,當完成乾膜之除膠渣清潔作業時,再透過第二次離線(off-line)方式將基板從前端之除膠渣站移動至後端之微蝕站,以在後端之微蝕站進行基板之微蝕作業。 As shown in step S10 to step S11, when the degumming and cleaning operation of the dry film is completed, the substrate is moved from the front-end degumming station to the rear-end micro-etching station through a second off-line method to perform the micro-etching operation of the substrate at the rear-end micro-etching station.
換言之,習知技術需在前端之除膠渣站分別對基板之通孔與乾膜兩者進行除膠渣清潔作業,故會導致前端之除膠渣站之除膠渣清潔作業之工作量爆增及處理速度緩慢。 In other words, the conventional technology requires the front-end degumming station to perform degumming cleaning operations on both the through-holes and the dry film of the substrate, which will lead to an increase in the workload of the front-end degumming station and a slow processing speed.
再者,習知技術需將基板透過第一次離線(off-line)方式從後端之剝膜站移動至前端之除膠渣站以進行乾膜之除膠渣清潔作業,再將基板透過第二次離線(off-line)方式從前端之除膠渣站移動至後端之微蝕站以進行基板之微蝕作業,導致基板之整體作業顯得相當繁複、不順暢且耗費大量移動時間。 Furthermore, the conventional technology requires the substrate to be moved from the film stripping station at the back end to the degumming station at the front end through the first off-line method to perform the degumming and cleaning operation of the dry film, and then the substrate is moved from the degumming station at the front end to the micro-etching station at the back end through the second off-line method to perform the micro-etching operation of the substrate, resulting in the overall operation of the substrate being quite complicated, unsmooth and consuming a lot of movement time.
另外,習知技術無法以連續方式或在線(on-line)方式迅速地製作與清潔基板,亦會提高基板在二次離線(off-line)之過程中可能發生折損、毀壞或遺失之風險,從而降低基板之製作良率。 In addition, conventional technology cannot rapidly manufacture and clean substrates in a continuous or on-line manner, and will also increase the risk of substrates being damaged, destroyed or lost during the secondary off-line process, thereby reducing the substrate manufacturing yield.
因此,如何克服上述習知技術之種種問題,實已成為目前業界亟待克服之難題。 Therefore, how to overcome the above-mentioned problems of known technology has become a difficult problem that the industry needs to overcome urgently.
鑑於上述習知技術之種種缺失,本創作提供一種具基板清潔功能之連續式製作設備,係包括:雷射鑽孔裝置與除膠渣裝置,係由雷射鑽孔裝置對基板進行雷射鑽孔作業以形成通孔,再由除膠渣裝置對基板之通孔處之膠渣進行除膠渣清潔作業;貼膜裝置、曝光裝置與顯影裝置,係在除膠渣裝置對基板之通孔處之膠渣進行除膠渣清潔作業後,由貼膜裝置對基板進行乾膜之貼膜作業,再由曝光裝置與顯影裝置分別對基板之乾膜進行曝光作業與顯影作業;以及剝膜與除膠渣裝置,係在曝光裝置與顯影裝置分別對基板之乾膜進行曝光作業與顯影作業後,由剝膜與除膠渣裝置以連續方式或在線(on-line)方式依序對基板之乾膜進行剝膜作業與對乾膜之膠渣進行除膠渣清潔作業。 In view of the various deficiencies of the above-mentioned prior art, the present invention provides a continuous manufacturing device with a substrate cleaning function, which includes: a laser drilling device and a desmearing device, wherein the laser drilling device performs a laser drilling operation on the substrate to form a through hole, and then the desmearing device performs a desmearing and cleaning operation on the desmearing at the through hole of the substrate; a film pasting device, an exposure device and a developing device, wherein after the desmearing device performs a desmearing and cleaning operation on the desmearing at the through hole of the substrate, The film laminating device performs the film laminating operation on the substrate, and then the exposure device and the developing device respectively perform the exposure operation and the developing operation on the dry film of the substrate; and the film stripping and glue residue removal device, after the exposure device and the developing device respectively perform the exposure operation and the developing operation on the dry film of the substrate, the film stripping and glue residue removal device sequentially performs the film stripping operation on the dry film of the substrate and the glue residue removal operation on the dry film in a continuous manner or on-line manner.
前述具基板清潔功能之連續式製作設備中,更包括在使用雷射鑽孔裝置對基板進行雷射鑽孔作業以形成通孔前,使用增層裝置或壓合裝置分別對基板之核心板進行增層作業或壓合作業以形成多層板。 The aforementioned continuous manufacturing equipment with substrate cleaning function further includes using a layer-adding device or a pressing device to perform layer-adding operations or pressing operations on the core board of the substrate to form a multi-layer board before using a laser drilling device to perform laser drilling operations on the substrate to form a through hole.
前述具基板清潔功能之連續式製作設備中,更包括在使用除膠渣裝置對基板之通孔處之膠渣進行除膠渣清潔作業後,使用化學鍍銅材料對基板或通孔進行化學鍍銅作業以形成銅層。 The aforementioned continuous manufacturing equipment with substrate cleaning function further includes using a desmearing device to perform desmearing and cleaning operations on the through-holes of the substrate, and then using a chemical copper plating material to perform a chemical copper plating operation on the substrate or the through-holes to form a copper layer.
前述具基板清潔功能之連續式製作設備中,更包括在使用曝光裝置與顯影裝置對基板之乾膜進行曝光作業與顯影作業後,使用電鍍裝置對基板進行電鍍作業以形成電鍍層。 The aforementioned continuous manufacturing equipment with substrate cleaning function further includes using an exposure device and a developing device to perform exposure and development operations on the dry film of the substrate, and then using a plating device to perform plating operations on the substrate to form a plating layer.
前述具基板清潔功能之連續式製作設備及方法中,更包括在使用剝膜與除膠渣裝置透過連續方式或在線(on-line)方式依序對基板之乾膜進行剝 膜作業與對乾膜之膠渣進行除膠渣清潔作業後,使用微蝕裝置對基板之表面進行微蝕作業。 The aforementioned continuous manufacturing equipment and method with substrate cleaning function further includes using a film stripping and desmearing device to sequentially perform film stripping operations on the dry film of the substrate and desmearing operations on the glue residue of the dry film in a continuous manner or on-line manner, and then using a micro-etching device to perform micro-etching operations on the surface of the substrate.
由上可知,本創作所述具基板清潔功能之連續式製作設備中,主要是將「對基板之乾膜進行剝膜作業」與「對乾膜之膠渣進行除膠渣清潔作業」兩者設計在一個共同製程或連續製作程序中,亦即使用剝膜與除膠渣裝置以連續方式或在線(on-line)方式依序對基板之乾膜進行剝膜作業與對乾膜之膠渣進行除膠渣清潔作業,且在完成此共同製程或連續製作程序後,才能使用微蝕裝置對基板之表面進行微蝕作業,據此確保對基板之乾膜之膠渣進行除膠渣清潔作業後不會有殘留膠渣之問題。同時,本創作能有效率且迅速地製作與清潔基板,亦能提升對乾膜之膠渣之除膠渣清潔作業之處理速度,也能有效地降低基板於製作與清潔過程中可能發生折損、毀壞或遺失之情形,進而提高基板之製作良率。 As can be seen from the above, in the continuous manufacturing equipment with substrate cleaning function described in this invention, the "film stripping operation on the dry film of the substrate" and the "glue removal and cleaning operation on the glue residue of the dry film" are mainly designed in a common process or continuous manufacturing procedure, that is, the film stripping operation and glue removal and cleaning operation on the dry film of the substrate are performed in sequence in a continuous manner or on-line manner using the film stripping and glue removal devices, and only after completing this common process or continuous manufacturing procedure can the micro-etching operation be performed on the surface of the substrate using the micro-etching device, thereby ensuring that there will be no problem of residual glue residue after the glue residue removal and cleaning operation on the dry film of the substrate. At the same time, this invention can efficiently and quickly manufacture and clean substrates, and can also improve the processing speed of the glue residue removal and cleaning operation of the dry film. It can also effectively reduce the possibility of damage, destruction or loss of the substrate during the manufacturing and cleaning process, thereby improving the manufacturing yield of the substrate.
再者,本創作能使用雷射鑽孔裝置自動地對基板進行雷射鑽孔作業以形成通孔,再使用除膠渣裝置對基板之通孔處之膠渣進行除膠渣清潔作業,有利於迅速地清除基板之通孔處之膠渣。 Furthermore, the invention can use a laser drilling device to automatically perform laser drilling operations on the substrate to form through holes, and then use a desmearing device to perform desmearing and cleaning operations on the through holes of the substrate, which is conducive to quickly removing the desmearing at the through holes of the substrate.
另外,本創作能使用貼膜裝置自動地對基板進行乾膜之貼膜作業,再使用曝光裝置與顯影裝置有效地對基板之乾膜進行曝光作業與顯影作業。 In addition, this invention can use the film laminating device to automatically perform dry film laminating operations on the substrate, and then use the exposure device and the developing device to effectively perform exposure operations and developing operations on the dry film of the substrate.
10:連續式製作設備 10: Continuous production equipment
11:增層裝置 11: Add-on device
12:壓合裝置 12: Pressing device
13:雷射鑽孔裝置 13: Laser drilling device
14:除膠渣裝置 14: Glue residue removal device
15:化學鍍銅材料 15:Chemical copper plating materials
16:貼膜裝置 16: Film sticking device
17:曝光裝置 17: Exposure device
18:顯影裝置 18: Development device
19:電鍍裝置 19: Electroplating device
20:剝膜與除膠渣裝置 20: Film stripping and glue residue removal device
21:微蝕裝置 21: Micro-etching device
30:基板 30: Substrate
31:核心板 31: Core board
32:多層板 32:Multi-layer board
33:通孔 33:Through hole
34:膠渣 34: glue residue
35:銅層 35: Copper layer
36:乾膜 36: Dry film
37:電鍍層 37: Electroplating
38:膠渣 38: glue residue
S01至S11:步驟 S01 to S11: Steps
S21至S31:步驟 S21 to S31: Steps
圖1為習知技術中有關基板之製作與清潔方法之流程示意圖。 Figure 1 is a schematic diagram of the process of substrate manufacturing and cleaning methods in the prior art.
圖2為本創作所述具基板清潔功能之連續式製作設備之方塊示意圖。 Figure 2 is a block diagram of the continuous manufacturing equipment with substrate cleaning function described in this invention.
圖3為本創作所述具基板清潔功能之連續式製作方法之流程示意圖。 Figure 3 is a schematic diagram of the process of the continuous manufacturing method with substrate cleaning function described in this invention.
以下藉由特定的具體實施例說明本創作之實施方式,熟悉此技藝之人士可由本說明書所揭示之內容輕易地瞭解本創作之其他優點及功效。 The following is a specific and concrete example to illustrate the implementation of this invention. People familiar with this technology can easily understand the other advantages and effects of this invention from the content disclosed in this manual.
須知,本說明書所附圖式所繪示之結構、比例、大小等,均僅用以配合說明書所揭示之內容,以供熟悉此技藝之人士之瞭解與閱讀,並非用以限定本創作可實施之限定條件,故不具技術上之實質意義,任何結構之修飾、比例關係之改變或大小之調整,在不影響本創作所能產生之功效及所能達成之目的下,均應仍落在本創作所揭示之技術內容得能涵蓋之範圍內。同時,本說明書中所引用之如「上」、「下」、「一」、「第一」及「第二」等用語,亦僅為便於敘述之明瞭,而非用以限定本創作可實施之範圍,其相對關係之改變或調整,在無實質變更技術內容下,當亦視為本創作可實施之範疇。 It should be noted that the structures, proportions, sizes, etc. depicted in the drawings attached to this manual are only used to match the contents disclosed in the manual for people familiar with this technology to understand and read, and are not used to limit the conditions under which this creation can be implemented. Therefore, they have no substantive technical significance. Any modification of the structure, change of the proportion relationship or adjustment of the size should still fall within the scope of the technical content disclosed by this creation without affecting the effect and purpose that can be achieved by this creation. At the same time, the terms such as "upper", "lower", "one", "first" and "second" used in this manual are only for the convenience of description, and are not used to limit the scope of implementation of this creation. Changes or adjustments to their relative relationships, without substantially changing the technical content, should also be regarded as the scope of implementation of this creation.
圖2為本創作所述具基板清潔功能之連續式製作設備10之方塊示意圖。如圖所示,具基板清潔功能之連續式製作設備10可包括或依序包括至少一(如複數)增層裝置11、一壓合裝置12、一雷射鑽孔裝置13、一除膠渣裝置14、至少一(如複數)化學鍍銅材料15、一貼膜裝置16、一曝光裝置17、一顯影裝置18、一電鍍裝置19、一剝膜與除膠渣裝置20以及一微蝕裝置21,並能採用例如半加成技術(Semi-Additive Process;SAP)或改良半加成技術(Modified Semi-Additive Process;MSAP)來製作基板30。同時,本創作所述「至少一」代表
一個以上(如一、二、三或四個以上),且「複數」代表二個以上(如二、三、四或十個以上)。
FIG2 is a block diagram of the
詳言之,具基板清潔功能之連續式製作設備10可同時包括基板製作功能與基板清潔功能,以在基板30之製作與清潔之整體過程中,能藉由具基板清潔功能之連續式製作設備10迅速地以連續方式或在線(on-line)方式一併製作與清潔基板30,且此連續方式或線上(on-line)方式可為不中斷方式、非離線(off-line)方式等。
In detail, the
增層裝置11或壓合裝置12:可分別用於基板30之核心板31之增層作業或壓合作業以形成多層板32。例如,增層裝置11可藉由塗佈或噴塗增層原料形成增層膜(Build-up Film;如ABF增層膜)或絕緣增層膜。壓合裝置12可為壓合機、複材壓合機等,以壓合增層膜或絕緣增層膜,而所壓合的增層膜或絕緣增層膜可為以膜材方式提供且直接壓合者,或者是壓合經塗佈或噴塗增層原料形成的增層膜或絕緣增層膜。換言之,具基板清潔功能之連續式製作設備10可包括增層裝置11及/或壓合裝置12。多層板32可為多層基板、多層印刷電路板(PCB)、多層線路結構等,且多層代表至少二層(如二、三、四或五層以上)。
The build-up
雷射鑽孔裝置13:可對基板30(如多層板32)進行雷射鑽孔作業以形成至少一(如複數)通孔33,且此雷射鑽孔裝置13之雷射鑽孔作業會在基板30之通孔33處形成或殘留膠渣34。例如,雷射鑽孔裝置13可為雷射鑽孔機、雷射微孔加工機等,且通孔33可為開孔、開口、導通孔、貫穿孔、盲孔、凹槽等。
Laser drilling device 13: can perform laser drilling operation on substrate 30 (such as multi-layer board 32) to form at least one (such as multiple) through
除膠渣裝置14:可設在前端之除膠渣站上,以由除膠渣裝置14對基板30(如多層板32)之通孔33處之膠渣34進行除膠渣清潔作業。例如,除膠渣裝置14可為除膠渣機、電漿(plasma)除膠渣裝置等。
Glue removal device 14: can be installed on the front end of the glue removal station, so that the
化學鍍銅材料15:可用於基板30(如多層板32)或其通孔33之化學鍍銅(簡稱“化銅”)作業以形成銅層35及導電通孔或導電盲孔。例如,化學鍍銅材料15可為化學鍍銅溶液等,且銅層35可為銅箔、銅線、銅線路層等。
Chemical copper plating material 15: can be used for chemical copper plating (abbreviated as "copper plating") operation of substrate 30 (such as multi-layer board 32) or its through
貼膜裝置16:可在除膠渣裝置14對基板30(如多層板)之通孔33處之膠渣34進行除膠渣清潔作業後,由貼膜裝置16對基板30或其銅層35進行乾膜36之貼膜作業(如壓膜或覆蓋作業)。例如,貼膜裝置16可為貼膜機、自動貼膜機、(自動)壓膜機等,且乾膜36可為光阻層、乾膜光阻、光刻膠乾膜、蝕刻阻劑、負型光刻膠乾膜、負型水溶性乾膜光阻等。
Film pasting device 16: After the
曝光裝置17與顯影裝置18:可依序對基板30之乾膜36進行曝光作業與顯影作業以形成圖案化之乾膜36。例如,曝光裝置17可為曝光機、自動曝光機等,且顯影裝置18可為顯影機、自動顯影機、光阻顯影機等。
在不同實施例中,曝光裝置17與顯影裝置18兩者可為不同裝置,但兩者亦可整合為同時具有曝光功能與顯影功能之單一曝光顯影裝置。
In different embodiments, the
電鍍裝置19:可對基板30進行電鍍作業以形成電鍍層37。例如,電鍍裝置19可為基板電鍍裝置等,且電鍍層37可為電鍍金層或電鍍銅層等。
Electroplating device 19: Electroplating operation can be performed on
剝膜與除膠渣裝置20:可設在後端之剝膜與除膠渣站上,以在曝光裝置17與顯影裝置18依序對基板30之乾膜36進行曝光作業與顯影作業後,以連續方式或在線(on-line)方式由剝膜與除膠渣裝置20依序對基板30之乾膜36進行剝膜作業與對乾膜36之膠渣38進行除膠渣清潔作業。因為剝膜與除膠渣裝置20對基板30之乾膜36進行剝膜作業後會形成或殘留乾膜36之膠渣38,故需再使用剝膜與除膠渣裝置20對乾膜36之膠渣38進行除膠渣清潔作業。例如,連續方式或在線(on-line)方式可為不中斷方式、非離線(off-line)方式等。
The film stripping and glue
在不同實施例中,剝膜與除膠渣裝置20可為同時具有剝膜功能與除膠渣清潔功能之單一剝膜與除膠渣裝置,亦可為一具有剝膜功能之剝膜裝置與一具有除膠渣清潔功能之除膠渣裝置兩者之組合。例如,剝膜裝置可為剝膜機、自動剝膜機、乾膜剝膜劑等,除膠渣裝置可為除膠渣機、電漿(plasma)除膠渣裝置等。
In different embodiments, the film stripping and glue
微蝕裝置21:可設在後端之微蝕站上,以在剝膜與除膠渣裝置20以連續方式或在線(on-line)方式依序對基板30之乾膜36進行剝膜作業與對乾膜36之膠渣38進行除膠渣清潔作業後,由微蝕裝置21使用微蝕材料對基板30之表面進行微蝕作業,且此微蝕作業能清潔或去除基板30之表面之氧化物、污漬、油脂等。例如,微蝕材料可為微蝕劑、微蝕溶液等。
Micro-etching device 21: can be set on the micro-etching station at the rear end, so that after the film stripping and glue
基板30:可為半導體基板、矽基板、鋁基板、玻璃基板、陶瓷基板、銅箔基板、印刷電路板(PCB)、載板、硬板、軟板、承載件等,且基板30之核心板31可為核心層、核心基板、單層板、雙面板等。
Substrate 30: can be a semiconductor substrate, silicon substrate, aluminum substrate, glass substrate, ceramic substrate, copper foil substrate, printed circuit board (PCB), carrier, hard board, soft board, carrier, etc., and the
要特別說明者,基板30並非本創作之保護標的,故本創作未繪示且未限定基板30之實際產品、結構、組成、元件、材料、特徵或功能等,而僅以基板30之基本組件或常見元件(如核心板31、多層板32、通孔33、膠渣34、銅層35、乾膜36、電鍍層37、膠渣38等)加以說明。
It should be noted that the
另外,在實際應用上,本創作所述基板30可包括各種不同的產品、結構、組成、元件、材料、特徵或功能等,而非僅限定於本創作圖2所示之基本組件或常見元件(如核心板31、多層板32、通孔33、膠渣34、銅層35、乾膜36、電鍍層37、膠渣38等),併予敘明。
In addition, in practical applications, the
圖3為本創作所述具基板清潔功能之連續式製作方法之流程示意圖,並參閱圖2一併說明。同時,具基板清潔功能之連續式製作方法之主要技術內容如下,其餘技術內容相同於上方圖2所示具基板清潔功能之連續式製作設備10之詳細說明,於此不再重覆敘述。
FIG3 is a schematic diagram of the process of the continuous manufacturing method with substrate cleaning function described in this invention, and is described together with FIG2. At the same time, the main technical contents of the continuous manufacturing method with substrate cleaning function are as follows. The remaining technical contents are the same as the detailed description of the
具基板清潔功能之連續式製作方法可同時包括基板製作功能與基板清潔功能,以在基板30之製作與清潔之整個過程中,能藉由具基板清潔功能之連續式製作方法迅速地以連續方式或在線(on-line)方式一併製作與清潔基板30,且此連續方式或在線(on-line)方式可為不中斷方式、非離線(off-line)方式等。
The continuous manufacturing method with substrate cleaning function can include substrate manufacturing function and substrate cleaning function at the same time, so that during the whole process of manufacturing and cleaning the
具基板清潔功能之連續式製作方法可透過連續方式或在線(on-line)方式依序執行下列步驟S21至步驟S31,亦可依照不同需求或實際製程調整與增減步驟S21至步驟S31之先後順序及步驟數量。 The continuous manufacturing method with substrate cleaning function can sequentially execute the following steps S21 to S31 in a continuous or on-line manner, and can also adjust and increase or decrease the order and number of steps from S21 to S31 according to different requirements or actual processes.
如圖3之步驟S21所示,提供基板30之核心板31。
As shown in step S21 of FIG. 3 , a
如圖3之步驟S22所示,使用增層裝置11或由壓合裝置12使用壓合工藝對基板30之核心板31進行增層作業或壓合作業以形成多層板32。
As shown in step S22 of FIG. 3 , a layer-adding
如圖3之步驟S23所示,由雷射鑽孔裝置13使用雷射鑽孔工藝,以對基板30(如多層板32)進行雷射鑽孔作業以形成至少一(如複數)通孔33,且此雷射鑽孔裝置13之雷射鑽孔作業會在基板30之通孔33處形成或殘留膠渣34。
As shown in step S23 of FIG. 3 , the
如圖3之步驟S24所示,可由在前端之除膠渣站上之除膠渣裝置14使用除膠渣工藝,以對基板30(如多層板32)之通孔33處之膠渣34進行除膠渣清潔作業。
As shown in step S24 of FIG. 3 , the
如圖3之步驟S25所示,使用化學鍍銅材料15或化學鍍銅工藝對基板30(如多層板32)或其通孔33進行化學鍍銅(簡稱“化銅”)作業以形成銅層35。
As shown in step S25 of FIG. 3 , a chemical
如圖3之步驟S26所示,由貼膜裝置16使用貼膜工藝對基板30或其銅層35進行乾膜36之貼膜作業(如壓膜或覆蓋作業)。
As shown in step S26 of FIG. 3 , the
如圖3之步驟S27至步驟S28所示,先由曝光裝置17使用曝光工藝對基板30之乾膜36進行曝光作業,再由顯影裝置18使用顯影工藝對基板30之乾膜36進行顯影作業以形成圖案化之乾膜36。
As shown in step S27 to step S28 of FIG. 3 , the
如圖3之步驟S29所示,由電鍍裝置19使用電鍍工藝對基板30進行電鍍作業以形成電鍍層37。
As shown in step S29 of FIG. 3 , the
如圖3之步驟S30所示,可由在後端之剝膜與除膠渣站上之剝膜與除膠渣裝置20使用剝膜與除膠渣工藝,以連續方式或在線(on-line)方式依序對基板30之乾膜36進行剝膜作業與對乾膜36之膠渣38進行除膠渣清潔作業。因為剝膜與除膠渣裝置20之剝膜工藝對基板30之乾膜36進行剝膜作業後會形成或殘留乾膜36之膠渣38,故需再使用剝膜與除膠渣裝置20之除膠渣工藝對乾膜36之膠渣38進行除膠渣清潔作業。
As shown in step S30 of FIG. 3 , the film stripping and
如圖3之步驟S31所示,可由在後端之微蝕站上之微蝕裝置21使用微蝕工藝,以對基板30之表面進行微蝕作業,且此微蝕作業能清潔或去除基板30之表面之氧化物、污漬、油脂等。
As shown in step S31 of FIG. 3 , the
綜上,本創作所述具基板清潔功能之連續式製作設備至少具有下列特色、優點或技術功效。 In summary, the continuous manufacturing equipment with substrate cleaning function described in this invention has at least the following characteristics, advantages or technical effects.
一、本創作能使用雷射鑽孔裝置自動地對基板進行雷射鑽孔作業以形成通孔,再使用除膠渣裝置對基板之通孔處之膠渣進行除膠渣清潔作業,有利於迅速地清除基板之通孔處之膠渣。 1. This invention can use a laser drilling device to automatically perform laser drilling operations on a substrate to form a through hole, and then use a desmearing device to perform desmearing and cleaning operations on the through hole of the substrate, which is conducive to quickly removing the desmearing at the through hole of the substrate.
二、本創作能使用貼膜裝置自動地對基板進行乾膜之貼膜作業,再使用曝光裝置與顯影裝置有效地對基板之乾膜進行曝光作業與顯影作業。 Second, this invention can use the film laminating device to automatically perform dry film laminating operations on the substrate, and then use the exposure device and the developing device to effectively perform exposure operations and developing operations on the dry film of the substrate.
三、本創作能將「對基板之乾膜進行剝膜作業」與「對乾膜之膠渣進行除膠渣清潔作業」兩者設計在一個共同製程或連續製作程序中,亦即使用剝膜與除膠渣裝置以連續方式或在線(on-line)方式依序對基板之乾膜進行剝膜作業與對乾膜之膠渣進行除膠渣清潔作業,且在完成此共同製程或連續製作程序後,才能使用微蝕裝置對基板之表面進行微蝕作業,據此確保對基板之乾膜之膠渣進行除膠渣清潔作業後不會有殘留膠渣之問題。 3. This invention can design "stripping the dry film on the substrate" and "removing the glue residue from the dry film" into a common process or continuous manufacturing procedure, that is, using the stripping and desmearing devices to strip the dry film on the substrate and remove the glue residue from the dry film in a continuous manner or on-line manner, and only after completing this common process or continuous manufacturing procedure can the micro-etching device be used to perform micro-etching on the surface of the substrate, thereby ensuring that there will be no residual glue residue after removing the glue residue from the dry film on the substrate.
四、習知技術需在前端之除膠渣站分別對基板之通孔與乾膜兩者進行除膠渣清潔作業,導致除膠渣站之除膠渣清潔作業之工作量爆增及處理速度緩慢。相對地,本創作直接在後端之剝膜與除膠渣站上使用剝膜與除膠渣裝置,以連續方式或在線(on-line)方式對基板之乾膜及其膠渣依序進行剝膜作業與除膠渣清潔作業,故能有效率且迅速地製作與清潔基板,亦能提升對乾膜之膠渣之除膠渣清潔作業之處理速度。 4. The prior art requires the front-end degumming station to perform degumming and cleaning operations on both the through-holes and the dry film of the substrate, resulting in an increase in the workload of the degumming and cleaning operations at the degumming and cleaning stations and a slow processing speed. In contrast, the present invention directly uses a film stripping and degumming device at the back-end film stripping and degumming stations to perform film stripping and degumming and cleaning operations on the dry film and its glue residue in a continuous or on-line manner, so that the substrate can be efficiently and quickly manufactured and cleaned, and the processing speed of the degumming and cleaning operations on the glue residue of the dry film can also be improved.
五、習知技術需將基板透過第一次離線(off-line)方式與第二次離線(off-line)方式反覆地在前端之除膠渣站與後端之剝膜站之間來回移動,導致基板之整體作業顯得相當繁複、不順暢且耗費大量移動時間。相對地,本創作直接使用剝膜與除膠渣裝置,以連續方式或在線(on-line)方式對基板之乾膜及其膠渣 依序進行剝膜作業與除膠渣清潔作業,能使基板之整體作業顯得相當順暢,亦不會耗費基板之大量移動時間。 5. The known technology requires the substrate to be repeatedly moved back and forth between the front-end degumming station and the back-end film stripping station through the first off-line method and the second off-line method, which makes the overall operation of the substrate quite complicated, not smooth and consumes a lot of movement time. In contrast, the present invention directly uses the film stripping and degumming device to perform film stripping and degumming cleaning operations on the dry film and its glue residue of the substrate in a continuous manner or on-line manner, which can make the overall operation of the substrate quite smooth and does not consume a lot of substrate movement time.
六、習知技術無法以連續方式或在線(on-line)方式迅速地製作與清潔基板,亦會提高基板在二次離線(off-line)之過程中可能發生折損、毀壞或遺失之風險,從而降低基板之製作良率。相對地,本創作直接使用剝膜與除膠渣裝置,以連續方式或在線(on-line)方式對基板之乾膜及其膠渣依序進行剝膜作業與除膠渣清潔作業,故能迅速地製作與清潔基板,亦能有效地降低基板於製作與清潔過程中可能發生折損、毀壞或遺失之情形,進而提高基板之製作良率。 6. The prior art cannot rapidly produce and clean substrates in a continuous or on-line manner, and will also increase the risk of substrates being damaged, destroyed or lost during the secondary off-line process, thereby reducing the substrate production yield. In contrast, the present invention directly uses a film stripping and degumming device to sequentially strip the dry film and its glue residue on the substrate in a continuous or on-line manner, so that the substrate can be rapidly produced and cleaned, and the substrate can also be effectively reduced from being damaged, destroyed or lost during the production and cleaning process, thereby improving the substrate production yield.
七、本創作能在使用剝膜與除膠渣裝置透過連續方式或在線方式依序對基板之乾膜進行剝膜作業與對乾膜之膠渣進行除膠渣清潔作業後,使用微蝕裝置與微蝕材料對基板之表面進行微蝕作業,以利有效地清潔或去除基板之表面之氧化物、污漬、油脂等。 7. This invention can use a film stripping and glue residue removal device to perform film stripping operations on the dry film of the substrate and glue residue removal operations on the dry film in a continuous or online manner, and then use a micro-etching device and micro-etching materials to perform micro-etching operations on the surface of the substrate, so as to effectively clean or remove oxides, stains, grease, etc. on the surface of the substrate.
上述實施例係用以例示性說明本創作之原理及其功效,而非用於限制本創作。任何熟習此項技藝之人士均可在不違背本創作之精神及範疇下,對上述實施例進行修改。因此本創作之權利保護範圍,應如隨附之申請專利範圍所列。 The above embodiments are used to illustrate the principle and effect of this creation, but not to limit this creation. Anyone familiar with this technology can modify the above embodiments without violating the spirit and scope of this creation. Therefore, the scope of protection of the rights of this creation should be as listed in the attached patent application scope.
10:連續式製作設備 10: Continuous production equipment
11:增層裝置 11: Add-on device
12:壓合裝置 12: Pressing device
13:雷射鑽孔裝置 13: Laser drilling device
14:除膠渣裝置 14: Glue residue removal device
15:化學鍍銅材料 15:Chemical copper plating materials
16:貼膜裝置 16: Film sticking device
17:曝光裝置 17: Exposure device
18:顯影裝置 18: Development device
19:電鍍裝置 19: Electroplating device
20:剝膜與除膠渣裝置 20: Film stripping and glue residue removal device
21:微蝕裝置 21: Micro-etching device
30:基板 30: Substrate
31:核心板 31: Core board
32:多層板 32:Multi-layer board
33:通孔 33:Through hole
34:膠渣 34: glue residue
35:銅層 35: Copper layer
36:乾膜 36: Dry film
37:電鍍層 37: Electroplating
38:膠渣 38: glue residue
Claims (5)
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10804254B2 (en) * | 2018-06-29 | 2020-10-13 | Taiwan Semiconductor Manufacturing Company, Ltd. | Fan-out package with cavity substrate |
| US12040266B2 (en) * | 2021-08-30 | 2024-07-16 | Taiwan Semiconductor Manufacturing Company, Ltd. | Package substrate, package using the same, and method of manufacturing the same |
| CN118538632A (en) * | 2023-11-03 | 2024-08-23 | 芯爱科技(南京)有限公司 | Continuous manufacturing equipment and method with substrate cleaning function |
-
2023
- 2023-11-03 CN CN202311459056.9A patent/CN118538632A/en active Pending
-
2024
- 2024-01-19 TW TW113102267A patent/TWI886761B/en active
- 2024-01-19 TW TW113200700U patent/TWM657039U/en unknown
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI886761B (en) * | 2023-11-03 | 2025-06-11 | 大陸商芯愛科技(南京)有限公司 | Continuous manufacturing device and method with substrate cleaning function |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI886761B (en) | 2025-06-11 |
| CN118538632A (en) | 2024-08-23 |
| TW202520404A (en) | 2025-05-16 |
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