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TWI886761B - Continuous manufacturing device and method with substrate cleaning function - Google Patents

Continuous manufacturing device and method with substrate cleaning function Download PDF

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Publication number
TWI886761B
TWI886761B TW113102267A TW113102267A TWI886761B TW I886761 B TWI886761 B TW I886761B TW 113102267 A TW113102267 A TW 113102267A TW 113102267 A TW113102267 A TW 113102267A TW I886761 B TWI886761 B TW I886761B
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substrate
desmearing
dry film
perform
film
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TW113102267A
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Chinese (zh)
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TW202520404A (en
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陳敏堯
陳盈儒
張垂弘
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大陸商芯愛科技(南京)有限公司
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    • H10P72/0441
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/36Removing material
    • B23K26/38Removing material by boring or cutting
    • B23K26/382Removing material by boring or cutting by boring
    • H10P70/00
    • H10P72/0451
    • H10P76/00

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  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Plasma & Fusion (AREA)
  • Mechanical Engineering (AREA)
  • Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
  • Manufacturing Of Printed Wiring (AREA)

Abstract

The invention discloses a continuous manufacturing device and method with substrate cleaning function. A laser drilling apparatus (process) performs a laser drilling operation in a substrate to form a hole, and a desmearing apparatus (process) performs a desmear cleaning operation at the hole of the substrate. Furthermore, a film sticking apparatus (process) performs a film sticking operation of a dry film on the substrate, and an exposure and developing apparatus (process) perform an exposure and developing operation on the dry film of the substrate. In addition, a stripping and desmearing apparatus (process) sequentially performs a stripping operation on the dry film of the substrate and a desmearing cleaning operation on a smear of the dry film in a continuous manner or an on-line manner.

Description

具基板清潔功能之連續式製作設備及方法 Continuous manufacturing equipment and method with substrate cleaning function

本發明係有關一種用於基板之製作技術,尤指一種具基板清潔功能之連續式製作設備及方法。 The present invention relates to a manufacturing technology for substrates, and in particular to a continuous manufacturing device and method with substrate cleaning function.

在基板之製作與清潔方法中,一般會先於前端之除膠渣站對基板之通孔進行除膠渣(desmear)清潔,再依序進行基板之化學鍍銅(簡稱“化銅”)作業、基板之乾膜(dried film)之貼膜作業、乾膜之曝光作業、乾膜之顯影作業與基板之電鍍作業等,然後於後端之剝膜站對基板之乾膜進行剝膜(stripping)作業。 In the manufacturing and cleaning method of the substrate, the desmearing station at the front end is generally used to clean the through holes of the substrate, and then the chemical copper plating (abbreviated as "cupric") operation of the substrate, the film lamination operation of the substrate dry film, the exposure operation of the dry film, the development operation of the dry film and the electroplating operation of the substrate are carried out in sequence, and then the stripping operation of the substrate dry film is carried out at the stripping station at the back end.

惟,對基板之乾膜進行剝膜作業後,通常會產生基板之乾膜有剝膜不潔或殘留乾膜之情形,故需透過第一次離線(off-line)方式將基板從後端之剝膜站移動至前端之除膠渣站以進行乾膜之除膠渣清潔作業,再透過第二次離線(off-line)方式將基板從前端之除膠渣站移動至後端之微蝕站以進行基板之微蝕作業。 However, after the dry film on the substrate is stripped, the dry film on the substrate is usually not clean or has residual dry film. Therefore, the substrate needs to be moved from the stripping station at the back end to the degumming station at the front end to perform the degumming cleaning operation of the dry film, and then the substrate needs to be moved from the degumming station at the front end to the micro-etching station at the back end to perform the micro-etching operation of the substrate through the second off-line method.

圖1為習知技術中有關基板之製作與清潔方法之流程示意圖,並包括下列步驟S01至步驟S11。 FIG1 is a schematic diagram of the process of the substrate manufacturing and cleaning method in the prior art, and includes the following steps S01 to S11.

如步驟S01至步驟S02所示,先在基板中形成通孔,再於前端之除膠渣站對基板之通孔進行除膠渣清潔作業。 As shown in step S01 to step S02, a through hole is first formed in the substrate, and then the through hole of the substrate is cleaned by degumming residue at the front end degumming residue station.

如步驟S03至步驟S07所示,依序進行基板之化學鍍銅(化銅)作業、基板之乾膜之貼膜作業、乾膜之曝光作業、乾膜之顯影作業與基板之電鍍作業等。 As shown in step S03 to step S07, the chemical copper plating (copperization) operation of the substrate, the film lamination operation of the substrate, the exposure operation of the dry film, the development operation of the dry film and the electroplating operation of the substrate are performed in sequence.

如步驟S08至步驟S09所示,於後端之剝膜站對基板之乾膜進行剝膜作業,此時會產生基板之乾膜有剝膜不潔或殘留乾膜之情形,故需透過第一次離線(off-line)方式將基板從後端之剝膜站移動至前端之除膠渣站,以在前端之除膠渣站中對基板進行乾膜之除膠渣清潔作業(見步驟S02)。 As shown in step S08 to step S09, the dry film of the substrate is stripped at the rear film stripping station. At this time, the dry film of the substrate may be stripped uncleanly or have residual dry film. Therefore, the substrate needs to be moved from the rear film stripping station to the front glue removal station through the first off-line method to perform glue removal and cleaning of the dry film of the substrate in the front glue removal station (see step S02).

如步驟S10至步驟S11所示,當完成乾膜之除膠渣清潔作業時,再透過第二次離線(off-line)方式將基板從前端之除膠渣站移動至後端之微蝕站,以在後端之微蝕站進行基板之微蝕作業。 As shown in step S10 to step S11, when the degumming and cleaning operation of the dry film is completed, the substrate is moved from the front-end degumming station to the rear-end micro-etching station through a second off-line method to perform the micro-etching operation of the substrate at the rear-end micro-etching station.

換言之,習知技術需在前端之除膠渣站分別對基板之通孔與乾膜兩者進行除膠渣清潔作業,故會導致前端之除膠渣站之除膠渣清潔作業之工作量爆增及處理速度緩慢。 In other words, the conventional technology requires the front-end degumming station to perform degumming cleaning operations on both the through-holes and the dry film of the substrate, which will lead to an increase in the workload of the front-end degumming station and a slow processing speed.

再者,習知技術需將基板透過第一次離線(off-line)方式從後端之剝膜站移動至前端之除膠渣站以進行乾膜之除膠渣清潔作業,再將基板透過第二次離線(off-line)方式從前端之除膠渣站移動至後端之微蝕站以進行基板之微蝕作業,導致基板之整體作業顯得相當繁複、不順暢且耗費大量移動時間。 Furthermore, the conventional technology requires the substrate to be moved from the film stripping station at the back end to the degumming station at the front end through the first off-line method to perform the degumming and cleaning operation of the dry film, and then the substrate is moved from the degumming station at the front end to the micro-etching station at the back end through the second off-line method to perform the micro-etching operation of the substrate, resulting in the overall operation of the substrate being quite complicated, unsmooth and consuming a lot of movement time.

另外,習知技術無法以連續方式或在線(on-line)方式迅速地製作與清潔基板,亦會提高基板在二次離線(off-line)之過程中可能發生折損、毀壞或遺失之風險,從而降低基板之製作良率。 In addition, conventional technology cannot rapidly manufacture and clean substrates in a continuous or on-line manner, and will also increase the risk of substrates being damaged, destroyed or lost during the secondary off-line process, thereby reducing the substrate manufacturing yield.

因此,如何克服上述習知技術之種種問題,實已成為目前業界亟待克服之難題。 Therefore, how to overcome the above-mentioned problems of known technology has become a difficult problem that the industry needs to overcome urgently.

鑑於上述習知技術之種種缺失,本發明提供一種具基板清潔功能之連續式製作設備,係包括:雷射鑽孔裝置與除膠渣裝置,係由雷射鑽孔裝置對基板進行雷射鑽孔作業以形成通孔,再由除膠渣裝置對基板之通孔處之膠渣進行除膠渣清潔作業;貼膜裝置、曝光裝置與顯影裝置,係在除膠渣裝置對基板之通孔處之膠渣進行除膠渣清潔作業後,由貼膜裝置對基板進行乾膜之貼膜作業,再由曝光裝置與顯影裝置分別對基板之乾膜進行曝光作業與顯影作業;以及剝膜與除膠渣裝置,係在曝光裝置與顯影裝置分別對基板之乾膜進行曝光作業與顯影作業後,由剝膜與除膠渣裝置以連續方式或在線(on-line)方式依序對基板之乾膜進行剝膜作業與對乾膜之膠渣進行除膠渣清潔作業。 In view of the above-mentioned deficiencies of the prior art, the present invention provides a continuous manufacturing device with a substrate cleaning function, which includes: a laser drilling device and a desmearing device, wherein the laser drilling device performs a laser drilling operation on the substrate to form a through hole, and then the desmearing device performs a desmearing and cleaning operation on the desmearing at the through hole of the substrate; a film pasting device, an exposure device and a developing device, wherein after the desmearing device performs a desmearing and cleaning operation on the desmearing at the through hole of the substrate, The film laminating device performs the film laminating operation on the substrate, and then the exposure device and the developing device respectively perform the exposure operation and the developing operation on the dry film of the substrate; and the film stripping and glue residue removal device, after the exposure device and the developing device respectively perform the exposure operation and the developing operation on the dry film of the substrate, the film stripping and glue residue removal device sequentially performs the film stripping operation on the dry film of the substrate and the glue residue removal operation on the dry film in a continuous manner or on-line manner.

本發明亦提供一種具基板清潔功能之連續式製作方法,係包括:使用雷射鑽孔工藝對基板進行雷射鑽孔作業以形成通孔,再使用除膠渣工藝對基板之通孔處之膠渣進行除膠渣清潔作業;在使用除膠渣工藝對基板之通孔處之膠渣進行除膠渣清潔作業後,使用貼膜工藝對基板進行乾膜之貼膜作業,再使用曝光工藝與顯影工藝分別對基板之乾膜進行曝光作 業與顯影作業;以及在使用曝光工藝與顯影工藝分別對基板之乾膜進行曝光作業與顯影作業後,使用剝膜與除膠渣工藝以連續方式或在線(on-line)方式依序對基板之乾膜進行剝膜作業與對乾膜之膠渣進行除膠渣清潔作業。 The present invention also provides a continuous manufacturing method with a substrate cleaning function, which includes: using a laser drilling process to perform a laser drilling operation on a substrate to form a through hole, and then using a desmearing process to perform a desmearing and cleaning operation on the through hole of the substrate; after using the desmearing and cleaning operation on the through hole of the substrate, using a filming process to perform a dry film filming operation on the substrate. , and then use the exposure process and the development process to perform exposure and development operations on the dry film of the substrate respectively; and after using the exposure process and the development process to perform exposure and development operations on the dry film of the substrate respectively, use the film stripping and glue residue removal process to perform film stripping operations on the dry film of the substrate and glue residue removal and cleaning operations on the glue residue of the dry film in a continuous manner or on-line manner.

前述具基板清潔功能之連續式製作設備及方法中,更包括在使用雷射鑽孔裝置(雷射鑽孔工藝)對基板進行雷射鑽孔作業以形成通孔前,使用增層裝置或壓合裝置分別對基板之核心板進行增層作業或壓合作業以形成多層板。 The aforementioned continuous manufacturing equipment and method with substrate cleaning function further includes using a layer-adding device or a pressing device to perform a layer-adding operation or a pressing operation on the core board of the substrate to form a multi-layer board before using a laser drilling device (laser drilling process) to perform a laser drilling operation on the substrate to form a through hole.

前述具基板清潔功能之連續式製作設備及方法中,更包括在使用除膠渣裝置(除膠渣工藝)對基板之通孔處之膠渣進行除膠渣清潔作業後,使用化學鍍銅材料對基板或通孔進行化學鍍銅作業以形成銅層。 The aforementioned continuous manufacturing equipment and method with substrate cleaning function further includes using a desmearing device (desmearing process) to perform desmearing and cleaning operations on the through-holes of the substrate, and then using a chemical copper plating material to perform a chemical copper plating operation on the substrate or the through-holes to form a copper layer.

前述具基板清潔功能之連續式製作設備及方法中,更包括在使用曝光裝置(曝光工藝)與顯影裝置(顯影工藝)對基板之乾膜進行曝光作業與顯影作業後,使用電鍍裝置(電鍍工藝)對基板進行電鍍作業以形成電鍍層。 The aforementioned continuous manufacturing equipment and method with substrate cleaning function further includes using an exposure device (exposure process) and a developing device (developing process) to perform exposure and development operations on the dry film of the substrate, and then using a plating device (plating process) to perform plating operations on the substrate to form a plating layer.

前述具基板清潔功能之連續式製作設備及方法中,更包括在使用剝膜與除膠渣裝置(剝膜與除膠渣工藝)透過連續方式或在線(on-line)方式依序對基板之乾膜進行剝膜作業與對乾膜之膠渣進行除膠渣清潔作業後,使用微蝕裝置(微蝕工藝)對基板之表面進行微蝕作業。 The aforementioned continuous manufacturing equipment and method with substrate cleaning function further includes using a film stripping and desmearing device (film stripping and desmearing process) to perform film stripping operations on the dry film of the substrate and desmearing and cleaning operations on the glue residue of the dry film in a continuous manner or on-line manner, and then using a micro-etching device (micro-etching process) to perform micro-etching operations on the surface of the substrate.

由上可知,本發明所述具基板清潔功能之連續式製作設備及方法中,主要是將「對基板之乾膜進行剝膜作業」與「對乾膜之膠渣進行除膠渣清潔作業」兩者設計在一個共同製程或連續製作程序中,亦即使用 剝膜與除膠渣裝置(剝膜與除膠渣工藝)以連續方式或在線(on-line)方式依序對基板之乾膜進行剝膜作業與對乾膜之膠渣進行除膠渣清潔作業,且在完成此共同製程或連續製作程序後,才能使用微蝕裝置(微蝕工藝)對基板之表面進行微蝕作業,據此確保對基板之乾膜之膠渣進行除膠渣清潔作業後不會有殘留膠渣之問題。同時,本發明能有效率且迅速地製作與清潔基板,亦能提升對乾膜之膠渣之除膠渣清潔作業之處理速度,也能有效地降低基板於製作與清潔過程中可能發生折損、毀壞或遺失之情形,進而提高基板之製作良率。 As can be seen from the above, the continuous manufacturing equipment and method with substrate cleaning function described in the present invention mainly designs "stripping the dry film on the substrate" and "removing the glue residue from the dry film" in a common process or continuous manufacturing procedure, that is, using the film stripping and glue residue removal device (film stripping and glue residue removal process) in a continuous manner or in-line (o n-line) method is used to sequentially perform film stripping operations on the dry film of the substrate and glue residue removal and cleaning operations on the dry film, and only after completing this common process or continuous manufacturing procedure can the micro-etching device (micro-etching process) be used to perform micro-etching operations on the surface of the substrate, thereby ensuring that there will be no glue residue left after the glue residue removal and cleaning operations on the dry film of the substrate. At the same time, the present invention can efficiently and quickly manufacture and clean substrates, and can also improve the processing speed of the glue residue removal and cleaning operations on the dry film, and can also effectively reduce the possibility of damage, destruction or loss of the substrate during the manufacturing and cleaning process, thereby improving the manufacturing yield of the substrate.

再者,本發明能使用雷射鑽孔裝置(雷射鑽孔工藝)自動地對基板進行雷射鑽孔作業以形成通孔,再使用除膠渣裝置(除膠渣工藝)對基板之通孔處之膠渣進行除膠渣清潔作業,有利於迅速地清除基板之通孔處之膠渣。 Furthermore, the present invention can use a laser drilling device (laser drilling process) to automatically perform laser drilling operations on the substrate to form through holes, and then use a desmearing device (desmearing process) to perform desmearing and cleaning operations on the through holes of the substrate, which is conducive to quickly removing the desmearing at the through holes of the substrate.

另外,本發明能使用貼膜裝置(貼膜工藝)自動地對基板進行乾膜之貼膜作業,再使用曝光裝置(曝光工藝)與顯影裝置(顯影工藝)有效地對基板之乾膜進行曝光作業與顯影作業。 In addition, the present invention can use a film laminating device (film laminating process) to automatically perform a dry film laminating operation on a substrate, and then use an exposure device (exposure process) and a developing device (developing process) to effectively perform an exposure operation and a developing operation on the dry film of the substrate.

10:連續式製作設備 10: Continuous production equipment

11:增層裝置 11: Add-on device

12:壓合裝置 12: Pressing device

13:雷射鑽孔裝置 13: Laser drilling device

14:除膠渣裝置 14: Glue residue removal device

15:化學鍍銅材料 15:Chemical copper plating materials

16:貼膜裝置 16: Film sticking device

17:曝光裝置 17: Exposure device

18:顯影裝置 18: Development device

19:電鍍裝置 19: Electroplating device

20:剝膜與除膠渣裝置 20: Film stripping and glue residue removal device

21:微蝕裝置 21: Micro-etching device

30:基板 30:Substrate

31:核心板 31: Core board

32:多層板 32:Multi-layer board

33:通孔 33:Through hole

34:膠渣 34: glue residue

35:銅層 35: Copper layer

36:乾膜 36: Dry film

37:電鍍層 37: Electroplating

38:膠渣 38: glue residue

S01至S11:步驟 S01 to S11: Steps

S21至S31:步驟 S21 to S31: Steps

圖1為習知技術中有關基板之製作與清潔方法之流程示意圖。 Figure 1 is a schematic diagram of the process of substrate manufacturing and cleaning methods in the prior art.

圖2為本發明所述具基板清潔功能之連續式製作設備之方塊示意圖。 Figure 2 is a block diagram of the continuous manufacturing equipment with substrate cleaning function described in the present invention.

圖3為本發明所述具基板清潔功能之連續式製作方法之流程示意圖。 Figure 3 is a schematic diagram of the process of the continuous manufacturing method with substrate cleaning function described in the present invention.

以下藉由特定的具體實施例說明本發明之實施方式,熟悉此技藝之人士可由本說明書所揭示之內容輕易地瞭解本發明之其他優點及功效。 The following is a specific and concrete example to illustrate the implementation of the present invention. People familiar with this technology can easily understand other advantages and effects of the present invention from the content disclosed in this manual.

須知,本說明書所附圖式所繪示之結構、比例、大小等,均僅用以配合說明書所揭示之內容,以供熟悉此技藝之人士之瞭解與閱讀,並非用以限定本發明可實施之限定條件,故不具技術上之實質意義,任何結構之修飾、比例關係之改變或大小之調整,在不影響本發明所能產生之功效及所能達成之目的下,均應仍落在本發明所揭示之技術內容得能涵蓋之範圍內。同時,本說明書中所引用之如「上」、「下」、「一」、「第一」及「第二」等用語,亦僅為便於敘述之明瞭,而非用以限定本發明可實施之範圍,其相對關係之改變或調整,在無實質變更技術內容下,當亦視為本發明可實施之範疇。 It should be noted that the structures, proportions, sizes, etc. depicted in the drawings attached to this specification are only used to match the contents disclosed in the specification for understanding and reading by people familiar with this technology, and are not used to limit the restrictive conditions for the implementation of the present invention. Therefore, they have no substantial technical significance. Any modification of the structure, change of the proportion relationship or adjustment of the size should still fall within the scope of the technical content disclosed by the present invention without affecting the effects and purposes that can be achieved by the present invention. At the same time, the terms such as "upper", "lower", "one", "first" and "second" used in this specification are only for the convenience of description, and are not used to limit the scope of implementation of the present invention. Changes or adjustments to their relative relationships, without substantial changes to the technical content, should also be regarded as the scope of implementation of the present invention.

圖2為本發明所述具基板清潔功能之連續式製作設備10之方塊示意圖。如圖所示,具基板清潔功能之連續式製作設備10可包括或依序包括至少一(如複數)增層裝置11、一壓合裝置12、一雷射鑽孔裝置13、一除膠渣裝置14、至少一(如複數)化學鍍銅材料15、一貼膜裝置16、一曝光裝置17、一顯影裝置18、一電鍍裝置19、一剝膜與除膠渣裝置20以及一微蝕裝置21,並能採用例如半加成技術(Semi-Additive Process;SAP)或 改良半加成技術(Modified Semi-Additive Process;MSAP)來製作基板30。同時,本發明所述「至少一」代表一個以上(如一、二、三或四個以上),且「複數」代表二個以上(如二、三、四或十個以上)。 FIG2 is a block diagram of the continuous manufacturing equipment 10 with substrate cleaning function of the present invention. As shown in the figure, the continuous manufacturing equipment 10 with substrate cleaning function may include or sequentially include at least one (such as multiple) layer-building device 11, a pressing device 12, a laser drilling device 13, a degumming device 14, at least one (such as multiple) chemical copper plating material 15, a film-attaching device 16, an exposure device 17, a developing device 18, an electroplating device 19, a film stripping and degumming device 20 and a micro-etching device 21, and can adopt, for example, semi-additive process (SAP) or modified semi-additive process (MSAP) to manufacture substrate 30. At the same time, the "at least one" mentioned in the present invention means more than one (such as one, two, three or four or more), and "plurality" means more than two (such as two, three, four or ten or more).

詳言之,具基板清潔功能之連續式製作設備10可同時包括基板製作功能與基板清潔功能,以在基板30之製作與清潔之整體過程中,能藉由具基板清潔功能之連續式製作設備10迅速地以連續方式或在線(on-line)方式一併製作與清潔基板30,且此連續方式或線上(on-line)方式可為不中斷方式、非離線(off-line)方式等。 In detail, the continuous manufacturing equipment 10 with substrate cleaning function can include substrate manufacturing function and substrate cleaning function at the same time, so that in the overall process of manufacturing and cleaning the substrate 30, the continuous manufacturing equipment 10 with substrate cleaning function can quickly manufacture and clean the substrate 30 in a continuous manner or in an on-line manner, and this continuous manner or on-line manner can be a non-interrupted manner, a non-off-line manner, etc.

增層裝置11或壓合裝置12:可分別用於基板30之核心板31之增層作業或壓合作業以形成多層板32。例如,增層裝置11可藉由塗佈或噴塗增層原料形成增層膜(Build-up Film;如ABF增層膜)或絕緣增層膜。壓合裝置12可為壓合機、複材壓合機等,以壓合增層膜或絕緣增層膜,而所壓合的增層膜或絕緣增層膜可為以膜材方式提供且直接壓合者,或者是壓合經塗佈或噴塗增層原料形成的增層膜或絕緣增層膜。換言之,具基板清潔功能之連續式製作設備10可包括增層裝置11及/或壓合裝置12。多層板32可為多層基板、多層印刷電路板(PCB)、多層線路結構等,且多層代表至少二層(如二、三、四或五層以上)。 The build-up device 11 or the pressing device 12 can be used for the build-up operation or the pressing operation of the core board 31 of the substrate 30 to form a multi-layer board 32. For example, the build-up device 11 can form a build-up film (such as ABF build-up film) or an insulating build-up film by coating or spraying a build-up material. The laminating device 12 may be a laminating machine, a composite laminating machine, etc., for laminating a build-up film or an insulating build-up film, and the build-up film or insulating build-up film to be laminarized may be provided in the form of a film material and directly laminarized, or may be a build-up film or insulating build-up film formed by coating or spraying a build-up material. In other words, the continuous manufacturing equipment 10 with a substrate cleaning function may include a build-up device 11 and/or a laminating device 12. The multi-layer board 32 may be a multi-layer substrate, a multi-layer printed circuit board (PCB), a multi-layer circuit structure, etc., and multi-layer represents at least two layers (such as two, three, four or five layers or more).

雷射鑽孔裝置13:可對基板30(如多層板32)進行雷射鑽孔作業以形成至少一(如複數)通孔33,且此雷射鑽孔裝置13之雷射鑽孔作業會在基板30之通孔33處形成或殘留膠渣34。例如,雷射鑽孔裝置13可為雷射鑽孔機、雷射微孔加工機等,且通孔33可為開孔、開口、導通孔、貫穿孔、盲孔、凹槽等。 Laser drilling device 13: can perform laser drilling operation on substrate 30 (such as multi-layer board 32) to form at least one (such as multiple) through hole 33, and the laser drilling operation of this laser drilling device 13 will form or leave slag 34 at the through hole 33 of substrate 30. For example, laser drilling device 13 can be a laser drilling machine, laser micro-hole processing machine, etc., and through hole 33 can be an opening, opening, conductive hole, through hole, blind hole, groove, etc.

除膠渣裝置14:可設在前端之除膠渣站上,以由除膠渣裝置14對基板30(如多層板32)之通孔33處之膠渣34進行除膠渣清潔作業。例如,除膠渣裝置14可為除膠渣機、電漿(plasma)除膠渣裝置等。 Glue removal device 14: can be installed on the front end of the glue removal station, so that the glue removal device 14 can remove glue residue 34 at the through hole 33 of the substrate 30 (such as the multi-layer board 32). For example, the glue removal device 14 can be a glue removal machine, a plasma glue removal device, etc.

化學鍍銅材料15:可用於基板30(如多層板32)或其通孔33之化學鍍銅(簡稱“化銅”)作業以形成銅層35及導電通孔或導電盲孔。例如,化學鍍銅材料15可為化學鍍銅溶液等,且銅層35可為銅箔、銅線、銅線路層等。 Chemical copper plating material 15: can be used for chemical copper plating (abbreviated as "copper plating") operation of substrate 30 (such as multi-layer board 32) or its through hole 33 to form copper layer 35 and conductive through hole or conductive blind hole. For example, chemical copper plating material 15 can be chemical copper plating solution, etc., and copper layer 35 can be copper foil, copper wire, copper line layer, etc.

貼膜裝置16:可在除膠渣裝置14對基板30(如多層板)之通孔33處之膠渣34進行除膠渣清潔作業後,由貼膜裝置16對基板30或其銅層35進行乾膜36之貼膜作業(如壓膜或覆蓋作業)。例如,貼膜裝置16可為貼膜機、自動貼膜機、(自動)壓膜機等,且乾膜36可為光阻層、乾膜光阻、光刻膠乾膜、蝕刻阻劑、負型光刻膠乾膜、負型水溶性乾膜光阻等。 Film pasting device 16: After the desmearing device 14 performs desmearing and cleaning operations on the through hole 33 of the substrate 30 (such as a multi-layer board), the film pasting device 16 performs a film pasting operation (such as lamination or covering operation) of the dry film 36 on the substrate 30 or its copper layer 35. For example, the film pasting device 16 can be a film pasting machine, an automatic film pasting machine, an (automatic) laminating machine, etc., and the dry film 36 can be a photoresist layer, a dry film photoresist, a photoresist dry film, an etching resist, a negative photoresist dry film, a negative water-soluble dry film photoresist, etc.

曝光裝置17與顯影裝置18:可依序對基板30之乾膜36進行曝光作業與顯影作業以形成圖案化之乾膜36。例如,曝光裝置17可為曝光機、自動曝光機等,且顯影裝置18可為顯影機、自動顯影機、光阻顯影機等。 Exposure device 17 and development device 18: can sequentially perform exposure operation and development operation on the dry film 36 of the substrate 30 to form a patterned dry film 36. For example, the exposure device 17 can be an exposure machine, an automatic exposure machine, etc., and the development device 18 can be a developer, an automatic developer, a photoresist developer, etc.

在不同實施例中,曝光裝置17與顯影裝置18兩者可為不同裝置,但兩者亦可整合為同時具有曝光功能與顯影功能之單一曝光顯影裝置。 In different embodiments, the exposure device 17 and the developing device 18 may be different devices, but the two may also be integrated into a single exposure and developing device having both exposure and developing functions.

電鍍裝置19:可對基板30進行電鍍作業以形成電鍍層37。例如,電鍍裝置19可為基板電鍍裝置等,且電鍍層37可為電鍍金層或電鍍銅層等。 Electroplating device 19: Electroplating operation can be performed on substrate 30 to form electroplated layer 37. For example, electroplating device 19 can be a substrate electroplating device, etc., and electroplated layer 37 can be an electroplated gold layer or an electroplated copper layer, etc.

剝膜與除膠渣裝置20:可設在後端之剝膜與除膠渣站上,以在曝光裝置17與顯影裝置18依序對基板30之乾膜36進行曝光作業與顯影作業後,以連續方式或在線(on-line)方式由剝膜與除膠渣裝置20依序對基板30之乾膜36進行剝膜作業與對乾膜36之膠渣38進行除膠渣清潔作業。因為剝膜與除膠渣裝置20對基板30之乾膜36進行剝膜作業後會形成或殘留乾膜36之膠渣38,故需再使用剝膜與除膠渣裝置20對乾膜36之膠渣38進行除膠渣清潔作業。例如,連續方式或在線(on-line)方式可為不中斷方式、非離線(off-line)方式等。 The film stripping and glue residue removal device 20 can be arranged on the rear end of the film stripping and glue residue removal station, so that after the exposure device 17 and the developing device 18 sequentially perform the exposure operation and the developing operation on the dry film 36 of the substrate 30, the film stripping and glue residue removal device 20 sequentially performs the film stripping operation on the dry film 36 of the substrate 30 and performs the glue residue removal and cleaning operation on the glue residue 38 of the dry film 36 in a continuous manner or on-line manner. Because the glue residue 38 of the dry film 36 will be formed or remain after the film stripping and glue residue removal device 20 performs the film stripping operation on the dry film 36 of the substrate 30, the film stripping and glue residue removal device 20 needs to be used again to perform the glue residue removal and cleaning operation on the glue residue 38 of the dry film 36. For example, the continuous mode or the online mode may be an uninterrupted mode, a non-offline mode, etc.

在不同實施例中,剝膜與除膠渣裝置20可為同時具有剝膜功能與除膠渣清潔功能之單一剝膜與除膠渣裝置,亦可為一具有剝膜功能之剝膜裝置與一具有除膠渣清潔功能之除膠渣裝置兩者之組合。例如,剝膜裝置可為剝膜機、自動剝膜機、乾膜剝膜劑等,除膠渣裝置可為除膠渣機、電漿(plasma)除膠渣裝置等。 In different embodiments, the film stripping and glue residue removal device 20 can be a single film stripping and glue residue removal device having both film stripping and glue residue removal cleaning functions, or a combination of a film stripping device having a film stripping function and a glue residue removal device having a glue residue removal cleaning function. For example, the film stripping device can be a film stripping machine, an automatic film stripping machine, a dry film stripping agent, etc., and the glue residue removal device can be a glue residue removal machine, a plasma glue residue removal device, etc.

微蝕裝置21:可設在後端之微蝕站上,以在剝膜與除膠渣裝置20以連續方式或在線(on-line)方式依序對基板30之乾膜36進行剝膜作業與對乾膜36之膠渣38進行除膠渣清潔作業後,由微蝕裝置21使用微蝕材料對基板30之表面進行微蝕作業,且此微蝕作業能清潔或去除基板30之表面之氧化物、污漬、油脂等。例如,微蝕材料可為微蝕劑、微蝕溶液等。 Micro-etching device 21: can be set on the micro-etching station at the rear end, so that after the film stripping and desmearing device 20 sequentially strips the dry film 36 of the substrate 30 and desmears the glue residue 38 of the dry film 36 in a continuous manner or on-line manner, the micro-etching device 21 uses the micro-etching material to perform micro-etching on the surface of the substrate 30, and this micro-etching operation can clean or remove oxides, stains, grease, etc. on the surface of the substrate 30. For example, the micro-etching material can be a micro-etching agent, a micro-etching solution, etc.

基板30:可為半導體基板、矽基板、鋁基板、玻璃基板、陶瓷基板、銅箔基板、印刷電路板(PCB)、載板、硬板、軟板、承載件等,且基板30之核心板31可為核心層、核心基板、單層板、雙面板等。 Substrate 30: can be a semiconductor substrate, silicon substrate, aluminum substrate, glass substrate, ceramic substrate, copper foil substrate, printed circuit board (PCB), carrier, hard board, soft board, carrier, etc., and the core board 31 of substrate 30 can be a core layer, core substrate, single-layer board, double-layer board, etc.

要特別說明者,基板30並非本發明之保護標的,故本發明未繪示且未限定基板30之實際產品、結構、組成、元件、材料、特徵或功能等,而僅以基板30之基本組件或常見元件(如核心板31、多層板32、通孔33、膠渣34、銅層35、乾膜36、電鍍層37、膠渣38等)加以說明。 It should be noted that the substrate 30 is not the subject of protection of the present invention. Therefore, the present invention does not illustrate or limit the actual product, structure, composition, components, materials, features or functions of the substrate 30, but only describes the basic components or common components of the substrate 30 (such as the core board 31, the multi-layer board 32, the through hole 33, the slag 34, the copper layer 35, the dry film 36, the electroplating layer 37, the slag 38, etc.).

另外,在實際應用上,本發明所述基板30可包括各種不同的產品、結構、組成、元件、材料、特徵或功能等,而非僅限定於本發明圖2所示之基本組件或常見元件(如核心板31、多層板32、通孔33、膠渣34、銅層35、乾膜36、電鍍層37、膠渣38等),併予敘明。 In addition, in practical applications, the substrate 30 of the present invention may include various products, structures, components, elements, materials, features or functions, etc., rather than being limited to the basic components or common components (such as core board 31, multi-layer board 32, through hole 33, slag 34, copper layer 35, dry film 36, electroplating layer 37, slag 38, etc.) shown in FIG. 2 of the present invention, and will be described.

圖3為本發明所述具基板清潔功能之連續式製作方法之流程示意圖,並參閱圖2一併說明。同時,具基板清潔功能之連續式製作方法之主要技術內容如下,其餘技術內容相同於上方圖2所示具基板清潔功能之連續式製作設備10之詳細說明,於此不再重覆敘述。 FIG3 is a schematic diagram of the process of the continuous manufacturing method with substrate cleaning function described in the present invention, and is described together with FIG2. At the same time, the main technical contents of the continuous manufacturing method with substrate cleaning function are as follows. The remaining technical contents are the same as the detailed description of the continuous manufacturing equipment 10 with substrate cleaning function shown in FIG2 above, and will not be repeated here.

具基板清潔功能之連續式製作方法可同時包括基板製作功能與基板清潔功能,以在基板30之製作與清潔之整個過程中,能藉由具基板清潔功能之連續式製作方法迅速地以連續方式或在線(on-line)方式一併製作與清潔基板30,且此連續方式或在線(on-line)方式可為不中斷方式、非離線(off-line)方式等。 The continuous manufacturing method with substrate cleaning function can include substrate manufacturing function and substrate cleaning function at the same time, so that during the whole process of manufacturing and cleaning the substrate 30, the continuous manufacturing method with substrate cleaning function can quickly manufacture and clean the substrate 30 in a continuous manner or an on-line manner, and this continuous manner or on-line manner can be a non-interrupted manner, a non-off-line manner, etc.

具基板清潔功能之連續式製作方法可透過連續方式或在線(on-line)方式依序執行下列步驟S21至步驟S31,亦可依照不同需求或實際製程調整與增減步驟S21至步驟S31之先後順序及步驟數量。 The continuous manufacturing method with substrate cleaning function can sequentially execute the following steps S21 to S31 in a continuous or on-line manner, and can also adjust and increase or decrease the order and number of steps from S21 to S31 according to different requirements or actual processes.

如圖3之步驟S21所示,提供基板30之核心板31。 As shown in step S21 of FIG. 3 , a core board 31 of a substrate 30 is provided.

如圖3之步驟S22所示,使用增層裝置11或由壓合裝置12使用壓合工藝對基板30之核心板31進行增層作業或壓合作業以形成多層板32。 As shown in step S22 of FIG. 3 , a layer-adding device 11 or a pressing device 12 uses a pressing process to add layers or press the core board 31 of the substrate 30 to form a multi-layer board 32.

如圖3之步驟S23所示,由雷射鑽孔裝置13使用雷射鑽孔工藝,以對基板30(如多層板32)進行雷射鑽孔作業以形成至少一(如複數)通孔33,且此雷射鑽孔裝置13之雷射鑽孔作業會在基板30之通孔33處形成或殘留膠渣34。 As shown in step S23 of FIG. 3 , the laser drilling device 13 uses a laser drilling process to perform a laser drilling operation on the substrate 30 (such as a multi-layer board 32) to form at least one (such as multiple) through holes 33, and the laser drilling operation of the laser drilling device 13 will form or leave slag 34 at the through hole 33 of the substrate 30.

如圖3之步驟S24所示,可由在前端之除膠渣站上之除膠渣裝置14使用除膠渣工藝,以對基板30(如多層板32)之通孔33處之膠渣34進行除膠渣清潔作業。 As shown in step S24 of FIG. 3 , the desmearing device 14 at the front end desmearing station can use a desmearing process to perform a desmearing and cleaning operation on the through hole 33 of the substrate 30 (such as a multi-layer board 32).

如圖3之步驟S25所示,使用化學鍍銅材料15或化學鍍銅工藝對基板30(如多層板32)或其通孔33進行化學鍍銅(簡稱“化銅”)作業以形成銅層35。 As shown in step S25 of FIG. 3 , a chemical copper plating material 15 or a chemical copper plating process is used to perform a chemical copper plating (abbreviated as "copper plating") operation on a substrate 30 (such as a multi-layer board 32) or its through hole 33 to form a copper layer 35.

如圖3之步驟S26所示,由貼膜裝置16使用貼膜工藝對基板30或其銅層35進行乾膜36之貼膜作業(如壓膜或覆蓋作業)。 As shown in step S26 of FIG. 3 , the film laminating device 16 uses a film laminating process to perform a dry film 36 laminating operation (such as lamination or covering operation) on the substrate 30 or its copper layer 35 .

如圖3之步驟S27至步驟S28所示,先由曝光裝置17使用曝光工藝對基板30之乾膜36進行曝光作業,再由顯影裝置18使用顯影工藝對基板30之乾膜36進行顯影作業以形成圖案化之乾膜36。 As shown in step S27 to step S28 of FIG. 3 , the exposure device 17 first uses an exposure process to expose the dry film 36 of the substrate 30, and then the developing device 18 uses a developing process to develop the dry film 36 of the substrate 30 to form a patterned dry film 36.

如圖3之步驟S29所示,由電鍍裝置19使用電鍍工藝對基板30進行電鍍作業以形成電鍍層37。 As shown in step S29 of FIG. 3 , the electroplating device 19 uses an electroplating process to perform electroplating on the substrate 30 to form an electroplating layer 37.

如圖3之步驟S30所示,可由在後端之剝膜與除膠渣站上之剝膜與除膠渣裝置20使用剝膜與除膠渣工藝,以連續方式或在線(on-line) 方式依序對基板30之乾膜36進行剝膜作業與對乾膜36之膠渣38進行除膠渣清潔作業。因為剝膜與除膠渣裝置20之剝膜工藝對基板30之乾膜36進行剝膜作業後會形成或殘留乾膜36之膠渣38,故需再使用剝膜與除膠渣裝置20之除膠渣工藝對乾膜36之膠渣38進行除膠渣清潔作業。 As shown in step S30 of FIG. 3 , the film stripping and degumming device 20 at the rear end of the film stripping and degumming station can use the film stripping and degumming process to sequentially perform film stripping operations on the dry film 36 of the substrate 30 and degumming and cleaning operations on the glue residue 38 of the dry film 36 in a continuous manner or on-line manner. Because the film stripping process of the film stripping and degumming device 20 will form or remain the glue residue 38 of the dry film 36 after the film stripping operation on the dry film 36 of the substrate 30, the degumming and degumming process of the film stripping and degumming device 20 is required to perform degumming and cleaning operations on the glue residue 38 of the dry film 36.

如圖3之步驟S31所示,可由在後端之微蝕站上之微蝕裝置21使用微蝕工藝,以對基板30之表面進行微蝕作業,且此微蝕作業能清潔或去除基板30之表面之氧化物、污漬、油脂等。 As shown in step S31 of FIG. 3 , the micro-etching device 21 on the rear micro-etching station can use a micro-etching process to perform micro-etching operations on the surface of the substrate 30, and this micro-etching operation can clean or remove oxides, stains, grease, etc. on the surface of the substrate 30.

綜上,本發明所述具基板清潔功能之連續式製作設備及方法至少具有下列特色、優點或技術功效。 In summary, the continuous manufacturing equipment and method with substrate cleaning function described in the present invention has at least the following characteristics, advantages or technical effects.

一、本發明能使用雷射鑽孔裝置(雷射鑽孔工藝)自動地對基板進行雷射鑽孔作業以形成通孔,再使用除膠渣裝置(除膠渣工藝)對基板之通孔處之膠渣進行除膠渣清潔作業,有利於迅速地清除基板之通孔處之膠渣。 1. The present invention can use a laser drilling device (laser drilling process) to automatically perform laser drilling operations on a substrate to form a through hole, and then use a desmearing device (desmearing process) to perform desmearing and cleaning operations on the through hole of the substrate, which is conducive to quickly removing the desmearing at the through hole of the substrate.

二、本發明能使用貼膜裝置(貼膜工藝)自動地對基板進行乾膜之貼膜作業,再使用曝光裝置(曝光工藝)與顯影裝置(顯影工藝)有效地對基板之乾膜進行曝光作業與顯影作業。 Second, the present invention can use a film laminating device (film laminating process) to automatically perform dry film laminating operations on a substrate, and then use an exposure device (exposure process) and a developing device (developing process) to effectively perform exposure operations and developing operations on the dry film of the substrate.

三、本發明能將「對基板之乾膜進行剝膜作業」與「對乾膜之膠渣進行除膠渣清潔作業」兩者設計在一個共同製程或連續製作程序中,亦即使用剝膜與除膠渣裝置(剝膜與除膠渣工藝)以連續方式或在線(on-line)方式依序對基板之乾膜進行剝膜作業與對乾膜之膠渣進行除膠渣清潔作業,且在完成此共同製程或連續製作程序後,才能使用微蝕裝置(微蝕工 藝)對基板之表面進行微蝕作業,據此確保對基板之乾膜之膠渣進行除膠渣清潔作業後不會有殘留膠渣之問題。 3. The present invention can design "stripping the dry film on the substrate" and "removing the glue residue from the dry film" into a common process or continuous manufacturing procedure, that is, using a stripping and desmearing device (stripping and desmearing process) to strip the dry film on the substrate and remove the glue residue from the dry film in a continuous manner or on-line manner, and only after completing this common process or continuous manufacturing procedure can the micro-etching device (micro-etching process) be used to perform micro-etching on the surface of the substrate, thereby ensuring that there will be no problem of residual glue residue after removing the glue residue from the dry film on the substrate.

四、習知技術需在前端之除膠渣站分別對基板之通孔與乾膜兩者進行除膠渣清潔作業,導致除膠渣站之除膠渣清潔作業之工作量爆增及處理速度緩慢。相對地,本發明直接在後端之剝膜與除膠渣站上使用剝膜與除膠渣裝置(剝膜與除膠渣工藝),以連續方式或在線(on-line)方式對基板之乾膜及其膠渣依序進行剝膜作業與除膠渣清潔作業,故能有效率且迅速地製作與清潔基板,亦能提升對乾膜之膠渣之除膠渣清潔作業之處理速度。 4. The prior art requires the front-end degumming station to perform degumming and cleaning operations on both the through-holes and the dry film of the substrate, resulting in an increase in the workload of the degumming and cleaning operations at the degumming and cleaning stations and a slow processing speed. In contrast, the present invention directly uses a film stripping and degumming device (film stripping and degumming process) at the back-end film stripping and degumming stations to perform film stripping and degumming and cleaning operations on the dry film and its glue residue in a continuous or on-line manner, so that the substrate can be efficiently and quickly manufactured and cleaned, and the processing speed of the degumming and cleaning operations on the glue residue of the dry film can also be improved.

五、習知技術需將基板透過第一次離線(off-line)方式與第二次離線(off-line)方式反覆地在前端之除膠渣站與後端之剝膜站之間來回移動,導致基板之整體作業顯得相當繁複、不順暢且耗費大量移動時間。相對地,本發明直接使用剝膜與除膠渣裝置(剝膜與除膠渣工藝),以連續方式或在線(on-line)方式對基板之乾膜及其膠渣依序進行剝膜作業與除膠渣清潔作業,能使基板之整體作業顯得相當順暢,亦不會耗費基板之大量移動時間。 5. The prior art requires the substrate to be repeatedly moved back and forth between the front-end degumming station and the back-end film stripping station through the first off-line method and the second off-line method, which makes the overall operation of the substrate quite complicated, not smooth and consumes a lot of movement time. In contrast, the present invention directly uses a film stripping and degumming device (film stripping and degumming process) to perform film stripping and degumming cleaning operations on the dry film and its glue residue of the substrate in a continuous manner or on-line manner, which can make the overall operation of the substrate quite smooth and does not consume a lot of substrate movement time.

六、習知技術無法以連續方式或在線(on-line)方式迅速地製作與清潔基板,亦會提高基板在二次離線(off-line)之過程中可能發生折損、毀壞或遺失之風險,從而降低基板之製作良率。相對地,本發明直接使用剝膜與除膠渣裝置(剝膜與除膠渣工藝),以連續方式或在線(on-line)方式對基板之乾膜及其膠渣依序進行剝膜作業與除膠渣清潔作業,故能迅速地製 作與清潔基板,亦能有效地降低基板於製作與清潔過程中可能發生折損、毀壞或遺失之情形,進而提高基板之製作良率。 6. The prior art cannot rapidly produce and clean substrates in a continuous or on-line manner, and will also increase the risk of substrates being damaged, destroyed or lost during the secondary off-line process, thereby reducing the substrate production yield. In contrast, the present invention directly uses a film stripping and degumming device (film stripping and degumming process) to sequentially strip the dry film and its glue residue on the substrate in a continuous or on-line manner, thereby rapidly producing and cleaning the substrate, and effectively reducing the risk of substrates being damaged, destroyed or lost during the production and cleaning process, thereby improving the substrate production yield.

七、本發明能在使用剝膜與除膠渣裝置(剝膜與除膠渣工藝)透過連續方式或在線方式依序對基板之乾膜進行剝膜作業與對乾膜之膠渣進行除膠渣清潔作業後,使用微蝕裝置(微蝕工藝)與微蝕材料對基板之表面進行微蝕作業,以利有效地清潔或去除基板之表面之氧化物、污漬、油脂等。 7. The present invention can use a film stripping and glue residue removal device (film stripping and glue residue removal process) to perform film stripping operations on the dry film of the substrate and glue residue removal operations on the dry film in a continuous manner or in an online manner, and then use a micro-etching device (micro-etching process) and a micro-etching material to perform micro-etching operations on the surface of the substrate, so as to effectively clean or remove oxides, stains, grease, etc. on the surface of the substrate.

上述實施例係用以例示性說明本發明之原理及其功效,而非用於限制本發明。任何熟習此項技藝之人士均可在不違背本發明之精神及範疇下,對上述實施例進行修改。因此本發明之權利保護範圍,應如隨附之申請專利範圍所列。 The above embodiments are used to illustrate the principles and effects of the present invention, but are not used to limit the present invention. Anyone familiar with this technology can modify the above embodiments without violating the spirit and scope of the present invention. Therefore, the scope of protection of the present invention should be as listed in the attached patent application scope.

10:連續式製作設備 10: Continuous production equipment

11:增層裝置 11: Add-on device

12:壓合裝置 12: Pressing device

13:雷射鑽孔裝置 13: Laser drilling device

14:除膠渣裝置 14: Glue residue removal device

15:化學鍍銅材料 15:Chemical copper plating materials

16:貼膜裝置 16: Film sticking device

17:曝光裝置 17: Exposure device

18:顯影裝置 18: Development device

19:電鍍裝置 19: Electroplating device

20:剝膜與除膠渣裝置 20: Film stripping and glue residue removal device

21:微蝕裝置 21: Micro-etching device

30:基板 30:Substrate

31:核心板 31: Core board

32:多層板 32: Multi-layer board

33:通孔 33:Through hole

34:膠渣 34: glue residue

35:銅層 35: Copper layer

36:乾膜 36: Dry film

37:電鍍層 37: Electroplating

38:膠渣 38: glue residue

Claims (10)

一種具基板清潔功能之連續式製作設備,係包括: A continuous manufacturing equipment with substrate cleaning function includes: 雷射鑽孔裝置與除膠渣裝置,係由該雷射鑽孔裝置對基板進行雷射鑽孔作業以形成通孔,再由該除膠渣裝置對該基板之該通孔處之膠渣進行除膠渣清潔作業; The laser drilling device and the desmearing device are used to perform laser drilling on the substrate to form a through hole, and then the desmearing device is used to perform desmearing and cleaning operations on the desmearing at the through hole of the substrate; 貼膜裝置、曝光裝置與顯影裝置,係在該除膠渣裝置對該基板之該通孔處之膠渣進行該除膠渣清潔作業後,由該貼膜裝置對該基板進行乾膜之貼膜作業,再由該曝光裝置與該顯影裝置分別對該基板之該乾膜進行曝光作業與顯影作業;以及 The film laminating device, exposure device and developing device are used to laminating the substrate with a dry film after the desmearing device performs the desmearing and cleaning operation on the through hole of the substrate, and then the exposure device and the developing device perform the exposure operation and the developing operation on the dry film of the substrate respectively; and 剝膜與除膠渣裝置,係在該曝光裝置與該顯影裝置分別對該基板之該乾膜進行該曝光作業與該顯影作業後,由該剝膜與除膠渣裝置以連續方式或在線方式依序對該基板之該乾膜進行剝膜作業與對該乾膜之膠渣進行除膠渣清潔作業。 The film stripping and glue residue removal device is used to strip the dry film of the substrate and remove the glue residue from the dry film in a continuous or online manner after the exposure device and the development device respectively perform the exposure operation and the development operation on the dry film of the substrate. 如請求項1所述具基板清潔功能之連續式製作設備,更包括增層裝置或壓合裝置,係在該雷射鑽孔裝置對該基板進行該雷射鑽孔作業以形成該通孔前,藉由該增層裝置或該壓合裝置分別對該基板之核心板進行增層作業或壓合作業以形成多層板。 The continuous manufacturing equipment with substrate cleaning function as described in claim 1 further includes a layer-adding device or a pressing device, which adds layers or presses the core board of the substrate to form a multi-layer board by the layer-adding device or the pressing device before the laser drilling device performs the laser drilling operation on the substrate to form the through hole. 如請求項1所述具基板清潔功能之連續式製作設備,更包括化學鍍銅材料,係在該除膠渣裝置對該基板之該通孔處之膠渣進行該除膠渣清潔作業後,藉由該化學鍍銅材料對該基板或該通孔進行化學鍍銅作業以形成銅層。 The continuous manufacturing equipment with substrate cleaning function as described in claim 1 further includes a chemical copper plating material. After the desmearing device performs the desmearing cleaning operation on the through hole of the substrate, the chemical copper plating material performs a chemical copper plating operation on the substrate or the through hole to form a copper layer. 如請求項1所述具基板清潔功能之連續式製作設備,更包括電鍍裝置,係在該曝光裝置與該顯影裝置對該基板之該乾膜進行該曝光作業與該顯影作業後,由該電鍍裝置對該基板進行電鍍作業以形成電鍍層。 The continuous manufacturing equipment with substrate cleaning function as described in claim 1 further includes an electroplating device, which performs an electroplating operation on the substrate to form an electroplated layer after the exposure device and the developing device perform the exposure operation and the developing operation on the dry film of the substrate. 如請求項1所述具基板清潔功能之連續式製作設備,更包括微蝕裝置,係在該剝膜與除膠渣裝置透過該連續方式或在線方式依序對該基板之該乾膜進行該剝膜作業與對該乾膜之膠渣進行該除膠渣清潔作業後,由該微蝕裝置使用微蝕材料對該基板之表面進行微蝕作業。 The continuous manufacturing equipment with substrate cleaning function as described in claim 1 further includes a micro-etching device, which uses a micro-etching material to perform micro-etching on the surface of the substrate after the film stripping and desmearing device sequentially performs the film stripping operation on the dry film of the substrate and the desmearing cleaning operation on the glue residue of the dry film in the continuous manner or in-line manner. 一種具基板清潔功能之連續式製作方法,係包括: A continuous manufacturing method with substrate cleaning function includes: 使用雷射鑽孔工藝對基板進行雷射鑽孔作業以形成通孔,再使用除膠渣工藝對該基板之該通孔處之膠渣進行除膠渣清潔作業; Use a laser drilling process to perform laser drilling operations on the substrate to form a through hole, and then use a desmearing process to perform a desmearing and cleaning operation on the through hole of the substrate; 在使用該除膠渣工藝對該基板之該通孔處之膠渣進行該除膠渣清潔作業後,使用貼膜工藝對該基板進行乾膜之貼膜作業,再使用曝光工藝與顯影工藝分別對該基板之該乾膜進行曝光作業與顯影作業;以及 After using the desmearing process to perform the desmearing cleaning operation on the through hole of the substrate, using the film laminating process to perform the dry film laminating operation on the substrate, and then using the exposure process and the development process to perform the exposure operation and the development operation on the dry film of the substrate respectively; and 在使用該曝光工藝與該顯影工藝分別對該基板之該乾膜進行該曝光作業與該顯影作業後,使用剝膜與除膠渣工藝以連續方式或在線方式依序對該基板之該乾膜進行剝膜作業與對該乾膜之膠渣進行除膠渣清潔作業。 After the exposure process and the development process are used to perform the exposure operation and the development operation on the dry film of the substrate respectively, the film stripping and degumming process is used to sequentially perform the film stripping operation on the dry film of the substrate and the degumming and cleaning operation on the degumming residue of the dry film in a continuous manner or in an online manner. 如請求項6所述具基板清潔功能之連續式製作方法,更包括在使用該雷射鑽孔工藝對該基板進行該雷射鑽孔作業以形成該通孔前,使用增層裝置或壓合工藝分別對該基板之核心板進行增層作業或壓合作業以形成多層板。 The continuous manufacturing method with substrate cleaning function as described in claim 6 further includes using a layer-adding device or a pressing process to perform a layer-adding operation or a pressing operation on the core board of the substrate to form a multi-layer board before using the laser drilling process to perform the laser drilling operation on the substrate to form the through hole. 如請求項6所述具基板清潔功能之連續式製作方法,更包括在使用該除膠渣工藝對該基板之該通孔處之膠渣進行該除膠渣清潔作業後,使用化學鍍銅材料對該基板或該通孔進行化學鍍銅作業以形成銅層。 The continuous manufacturing method with substrate cleaning function as described in claim 6 further includes performing a chemical copper plating operation on the substrate or the through hole using a chemical copper plating material to form a copper layer after performing the desmearing cleaning operation on the smear at the through hole of the substrate using the desmearing process. 如請求項6所述具基板清潔功能之連續式製作方法,更包括在使用該曝光工藝與該顯影工藝對該基板之該乾膜進行該曝光作業與該顯影作業後,使用電鍍工藝對該基板進行電鍍作業以形成電鍍層。 The continuous manufacturing method with substrate cleaning function as described in claim 6 further includes performing an exposure operation and a development operation on the dry film of the substrate using the exposure process and the development process, and then performing an electroplating operation on the substrate using an electroplating process to form an electroplated layer. 如請求項6所述具基板清潔功能之連續式製作方法,更包括在使用該剝膜與除膠渣工藝透過該連續方式或在線方式依序對該基板之該乾膜進行該剝膜作業與對該乾膜之膠渣進行該除膠渣清潔作業後,使用微蝕工藝對該基板之表面進行微蝕作業。 The continuous manufacturing method with substrate cleaning function as described in claim 6 further includes using the film stripping and desmearing process to sequentially perform the film stripping operation on the dry film of the substrate and the desmearing cleaning operation on the glue residue of the dry film in the continuous manner or in-line manner, and then using the micro-etching process to perform micro-etching operation on the surface of the substrate.
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CN110660680A (en) * 2018-06-29 2020-01-07 台湾积体电路制造股份有限公司 Method of forming a semiconductor structure
TW202310217A (en) * 2021-08-30 2023-03-01 台灣積體電路製造股份有限公司 Package substrate, package, and method of forming semiconductor device
TWM657039U (en) * 2023-11-03 2024-06-21 大陸商芯愛科技(南京)有限公司 Continuous manufacturing device with substrate cleaning function

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