TWM519740U - Testing station with upgrading function - Google Patents

Abstract

A testing station with an upgrading function includes an upgrading transformation board including a transformation board; and an unit-assembling module including a POGO tower for connecting and firmly stabilizing the transformation board; and a station body for providing a storage space to dispose the upgrading transformation board, such that the testing station processes a testing operation for units under test with different numbers of POGO pins.

Description

Test machine with upgrade function

This creation refers to a test machine with an upgrade function, especially a test machine that uses an upgraded transfer plate to perform test operations on different number of loop pins.

With the development of general-purpose electronic products, often with the latest functional development and more optimized system design, the hardware specifications of general-purpose electronic products will be upgraded and advanced. Accordingly, in order to adapt to the upgraded hardware specifications of general electronic products, the corresponding machine used by the manufacturer for production and testing will be updated with the relevant equipment, or additional machines will be added to meet the upgraded hardware specifications. Corresponding production costs and R&D training costs may increase significantly.

In this case, if the general wafer manufacturer can add the relevant improved method or the corresponding upgraded component module to the existing production and testing machine, it is not necessary to replace the existing production and testing machine. This will increase the service life and production efficiency of existing production or test machines. At the same time, it can effectively reduce and deduct the operating costs or consumables costs that may have been added. According to this, manufacturers can save the cost / The cost is invested in an advanced production R&D and development program to increase market competitiveness and form a benign production/development cycle.

Therefore, it has become an important issue in the field to provide a test machine with an upgrade function and an upgrade method thereof without eliminating the existing production or test machine while improving its service life and production efficiency.

Therefore, the main purpose of this creation is to provide a test machine with an upgrade function to appropriately extend the service life and production efficiency of existing production or test machines.

The present invention discloses a test machine with an upgrade function, including an upgrade transfer plate, including a rotary plate, and an assembly kit module including a test tower (POGO Tower) for connecting and stabilizing the rotary plate; And a machine body for providing an accommodation space for setting the upgrade transfer plate, so that the test machine performs one test operation of the number of different test objects of the ring stylus.

Certain terms are used throughout the description and following claims to refer to particular elements. It should be understood by those of ordinary skill in the art that manufacturers may refer to the same elements by different nouns. The scope of this specification and the subsequent patent application do not use the difference of the names as the means for distinguishing the elements, but the differences in the functions of the elements as the basis for the distinction. The term "including" as used throughout the specification and subsequent claims is an open term and should be interpreted as "including but not limited to".

Please refer to FIG. 1 , which is a schematic diagram of a test machine 1 according to one embodiment of the present invention. As shown in FIG. 1, the test machine 1 includes an upgrade flap 10 and a machine body 12, wherein the upgrade flap 10 includes a rotary plate 100 and an assembly kit module 102, and the base body 12 includes a base. The seat 120 and a test head block module 122. According to this, an object to be tested OB can be placed in the accommodating space SD of the susceptor 120 to perform the test operation of the object to be tested OB. The object to be tested OB in the embodiment can be a driver of a flat display. And the corresponding number of needles is included, and the operation specifications of the test machine 1 can be ND1 (including 1280 stitches), ND2 (including 1536 stitches) or ND3 (including 2304 stitches), and the related operations will be The following paragraphs are detailed.

Please refer to FIG. 2 again. FIG. 2 is a schematic diagram of the disassembly of the upgrade transfer plate 20 according to one embodiment of the present invention. Preferably, as shown in FIG. 1 , the upgrade flap 20 of the embodiment includes the rotary plate 100 , the assembly kit module 102 , and a base 1024 , and referring to FIG. 2 , the assembly kit of the embodiment The group 102 also includes a test tower (POGO Tower) 1020 and a reinforcement ring unit 1022. The reinforcing ring unit 1022 is configured to be connected to the upper surface of the upgraded rotating plate 20 so that the rotating plate 100 can be fixed between the reinforcing ring unit 1022 and the test tower 1020 through the tight structure of the reinforcing ring unit 1022. The transfer plate 100 is prevented from being deformed due to an external force during use or testing, and the substrate 1024 is used to carry the rotating plate 100 and the reinforcing ring unit 1022.

Please refer to FIG. 3 , which is a schematic diagram of the disassembly of the upgrade transfer plate 20 and another assembly kit module 30 according to one embodiment of the present invention. As shown in FIG. 3, the assembly kit module 30 of the present embodiment further includes an upper stabilization kit module 300 and a lower stability kit module 302, wherein the upper stabilization kit module 300 and the lower stabilization kit module 302 are In the embodiment, the upper stability kit module 300 further includes an upper accessory unit 3000~3010, and the lower stability kit module 302 further includes a lower accessory unit 3020~3022. The upper accessory units 3000 to 3010 and the lower accessory units 3020 to 3022 are sequentially stacked to connect the upgrade flap 20, and the upper fitting units 3000 to 3010 and the lower fitting units 3020 to 3022 in the present embodiment will be described one by one. Different names and their associated order of settings.

For example, the upper accessory unit 3000 is a clamp base cover and is disposed on the upgrade rotary plate 20; the upper accessory unit 3001 is a clamp base fixing ring, and is disposed on the upper assembly module 300. The upper accessory unit 3002 is a table rotating seat bearing and is disposed on the upper accessory unit 3001; the upper accessory unit 3003 is a table rotating seat, including the upper accessory unit 3002; the upper accessory unit 3004 is a clip The upper table cover bearing is disposed on the upper accessory unit 3000; the upper accessory unit 3005 is a table rotating seat handle and is disposed on the upper accessory unit 3003; the upper accessory unit 3006 is a positioning block and is disposed on the upper accessory The upper fitting unit 3007 is a test tower guiding bolt and is disposed on the upper fitting unit 3000; the upper fitting unit 3008 is a sensor blocking piece and is disposed on the upper fitting unit 3003; the upper fitting The unit 3009 is a clamp seat cover bearing and is disposed on the upper accessory unit 3000; the upper accessory unit 3010 is an inductor cover. And arranged to correspond to the upper accessory unit 3008. The lower accessory unit 3022 is a clamp base base and is disposed under the upgrade rotary plate 20; the lower accessory unit 3021 is an upgraded transfer plate dedicated platform and is disposed below. The accessory unit 3022 is lower; the lower accessory unit 3020 is a chassis and is disposed under the lower accessory unit 3021.

In this case, the ring type design of the clamp base fixing ring (ie, the upper fitting unit 3000) and the upgraded rotating plate exclusive seat (ie, the lower fitting unit 3021) in the embodiment can be used for the upper and lower structure locking or ring. The upgrade flap 20 is fixed, and the sensor shutter (ie, the upper accessory unit 3008) can be used to verify whether the operation of the lock adapter 20 is completed between the upper stabilizer kit 300 and the lower stabilizer kit 302. In order to allow the test machine 1 to perform the test operation of the object to be tested OB. In other words, in this embodiment, the user only needs to utilize the ring structure design of the upper accessory unit 3000~3010 and the lower accessory unit 3020~3022, and sequentially install and connect the lock to the upgrade flap 20 to complete the upper stability kit. The assembly operation of the module 300 and the lower stability kit module 302, as for the locking relationship between the upper accessory units 3000~3010 and the lower accessory units 3020~3022, for example, can be assembled with the male and female threads through common mechanism fittings. It is not intended to limit the scope of this creation.

Preferably, in the embodiment, the upper accessory unit 3005 forms a seat swivel handle, which can correspondingly provide a lever fulcrum for the user to apply force, and is matched with the ring shape of the upper stable kit module 300 and the lower stabilizer kit module 302. The user can directly push and pull the upper accessory unit 3005, so that the upper stability kit module 300 and the lower stability kit module 302 perform a clockwise rotation operation or a counterclockwise rotation operation to rotate the upper stability kit module 300. Connecting/disengaging the upper surface of the upgrade flap 20, or rotating the lower stabilizer kit 302 off/off the lower surface of the upgrade flap 20, thereby locking the upper stabilizer kit 300 and the lower stabilizer kit 302 up and down and The upgraded transfer plate 20 is coated, and accordingly, the user can appropriately perform the upgrade operation of the transfer plate according to the product specifications of the different objects to be tested, thereby greatly improving the operation convenience and practical expandability of the product.

In addition, in the embodiment, a side cross-sectional view of the upgraded rotating plate 20 and the assembly kit module 30 can be further described with reference to the contents depicted in FIG. 4, and a combined drawing is completed as shown in FIG. The schematic diagram of the assembled transfer plate 20 and the assembly kit module 30 assembled in this embodiment is shown. Accordingly, the assembled upgraded transfer plate 20 and the assembly kit module 30 can be appropriately locked to the test head block module 122 instead of the original transfer plate module to provide the number of different test pins of the ring. Test operation.

In addition, please refer to FIG. 6 , which is a cross-sectional view of a test head block module 122 according to an embodiment of the present invention. As shown in FIG. 6 , the test head block module 122 includes a plurality of probes, wherein the ring stylus OP disposed on the inner annular disk and arranged in the same center is the original test area before the upgrade. The ring stylus AP, which is arranged on the outer annular disk and arranged in the same center, is a new test area for one of the upgrades. Accordingly, in this embodiment, only the upgrade transfer plate 20 needs to be additionally provided to form an assembly with the assembly kit module 30, so that the test machine 1 can perform the test operation of the flat display driver with different number of stylus pins, for example, the embodiment. Upgrading the transfer plate 20 allows the test machine 1 to be used with different probe sizes such as ND1, ND2 or ND3. Compared with the prior art, this embodiment can greatly increase the number of probes used by the test machine to test the flat display driver without eliminating the test machine originally used, thereby improving the service life and production efficiency.

Referring to FIG. 1 again, when the user wants to perform the test operation of the object to be tested OB, the user places an object to be tested OB in the receiving space SD of the base 120, and the object to be tested OB includes a plurality of objects. Corresponding to one of the pinhole wafer units. Further, in the embodiment, the machine body 12 further includes a controller, and when the user generates a control command through the controller to perform a vertical displacement operation on the susceptor 120, the object to be tested placed in the accommodating space SD The OB will operate with the vertical displacement of the susceptor 120, correspondingly connected to the plurality of probes of the test head block module 122, and the plurality of probes are appropriately inserted into the corresponding pinholes of the wafer unit for testing. The test operation of the object, and then obtain the relevant results report of the circuit inspection and product characteristics of the object to be tested.

In summary, the present invention provides a test machine having an upgrade method, which can be operated by a combination of an upgrade transfer plate and a related accessory module, and an additional test is added to the original test area before the upgrade. The test area is used for the test operation of the test object with different number of ring needles, so that the relevant manufacturing or equipment manufacturers can test the products of different hardware specifications without eliminating the existing test machine, and improve the existing test machine. Service life and production efficiency.

The above descriptions are only preferred embodiments of the present invention, and all changes and modifications made by the scope of the patent application of the present invention should be covered by the present invention.

1‧‧‧Testing machine
10, 20‧‧‧ upgrade transfer board
100‧‧‧Transfer
102, 30‧‧‧ Assembly kit module
1020‧‧‧Test tower
1022‧‧‧Reinforcement ring unit
1024‧‧‧Base
12‧‧‧ machine body
120‧‧‧Base
122‧‧‧Measurement head block module
300‧‧‧Top Stabilization Kit Module
3000~3010‧‧‧Upper accessory unit
302‧‧‧Under the stable kit module
3020~3022‧‧‧ below accessory unit
SD‧‧‧ accommodating space
OB‧‧‧ test object
AP, OP‧‧‧ ring stylus

Figure 1 is a schematic diagram of a test machine of one of the creative embodiments. FIG. 2 is a schematic diagram of disassembly of an upgrade transfer board according to one embodiment of the present invention. FIG. 3 is a schematic diagram of disassembly of an upgraded transfer board and an assembly kit module according to an embodiment of the present invention. 4 is a side cross-sectional view of the upgraded transfer plate and an assembly kit module of the first embodiment of the present invention. Figure 5 is a combination of the upgraded transfer board and an assembly kit module of the first embodiment of the present invention. Figure 6 is a cross-sectional view showing a test head block module of one of the creative embodiments.

1‧‧‧Testing machine

10‧‧‧Upgrade transfer board

100‧‧‧Transfer

102‧‧‧Assembly kit module

12‧‧‧ machine body

120‧‧‧Base

122‧‧‧Measurement head block module

SD‧‧‧ accommodating space

OB‧‧‧ test object

Claims (9)

An upgraded test machine includes: an upgrade transfer plate, including; a transfer plate; and an assembly kit module including a test tower (POGO Tower) for connecting and stabilizing the transfer plate; And a machine body for providing an accommodation space for setting the upgrade transfer plate, so that the test machine performs one test operation of the number of different test objects of the ring stylus. The testing machine of claim 1, wherein the assembly kit module further comprises a reinforcing ring unit for connecting an upper surface of the upgrading rotating plate, so that the rotating plate is fixed to the reinforcing ring unit and the test tower In order to avoid deformation of the rotating plate. The test machine of claim 1, wherein the assembly kit module further comprises an upper stability kit module and a lower stability kit module, wherein the upper stability kit module and the lower stability kit module correspond to A ring design. The test machine of claim 3, wherein the upper stability kit module comprises a clamp base fixing ring, the lower stability kit module comprises an upgraded transfer plate exclusive seat, and the clamp base fixed ring The ring design corresponding to the upgraded transfer plate exclusive seat is used to lock the upgrade transfer plate by the upper and lower structures. The test machine of claim 3, wherein the upper stability kit module further comprises a table swivel handle for performing a clockwise rotation operation of the upper stability kit module and the lower stability kit module or A counterclockwise rotation operation. The test machine of claim 5, wherein the clockwise rotation operation or the counterclockwise rotation operation rotates the upper stability kit module to an upper surface of the upgrade flap or the lower stabilizer kit module rotates Connecting a lower surface of the upgrade flap to lock the upper stability kit module and the lower stability kit module up and down and covering the upgrade flap. The test machine of claim 3, wherein the upper stability kit module further comprises a sensor cutout for verifying whether the upgrade between the upper stability kit module and the lower stability kit module has been completed. The operation corresponding to the transfer board. The test machine of claim 1, wherein the machine body further comprises a base and a test head base module, wherein the upgrade turntable is locked to the test head base module, the test head base module The pedestal includes a plurality of probes, and the pedestal includes the accommodating space for placing the object to be tested, and when the susceptor performs a vertical displacement operation, the object to be tested is electrically connected to the test head block module. The plurality of probes perform the test operation. The test machine of claim 1, wherein the upgrade transfer plate is used to increase the number of probes corresponding to the test machine for testing a flat display driver.