TWM589795U - Test tool - Google Patents
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- TWM589795U TWM589795U TW108214781U TW108214781U TWM589795U TW M589795 U TWM589795 U TW M589795U TW 108214781 U TW108214781 U TW 108214781U TW 108214781 U TW108214781 U TW 108214781U TW M589795 U TWM589795 U TW M589795U
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- 238000012360 testing method Methods 0.000 title claims abstract description 46
- 230000007246 mechanism Effects 0.000 claims abstract description 87
- 238000003032 molecular docking Methods 0.000 abstract description 10
- 238000010586 diagram Methods 0.000 description 5
- 238000005259 measurement Methods 0.000 description 2
- 230000008054 signal transmission Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 1
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Abstract
本創作之測試治具包括底座、第一固定座、第一治具板、第二固定座及第二治具板。底座二側分別包括橫向設置之第一底座滑移機構、縱向設置之第二底座滑移機構。第一、第二固定座分別包括第一、第二固定座滑移機構,分別對應滑移於第一、第二底座滑移機構。第一、第二治具板分別設置於第一、第二固定座上。藉由第一固定座橫向微調移動,第二固定座縱向微調移動,在測試治具兩側之對接結構(第一電連接器與第二電連接器)進行微調移動、對接測試,可增加測試數據之穩定度、可靠度。The test fixture of this creation includes a base, a first fixing seat, a first fixture plate, a second fixing seat and a second fixture plate. The two sides of the base respectively include a first base sliding mechanism arranged horizontally and a second base sliding mechanism arranged vertically. The first and second fixed seats respectively include first and second fixed seat sliding mechanisms, respectively corresponding to the first and second base sliding mechanisms. The first and second jig plates are respectively arranged on the first and second fixing seats. With the lateral fine adjustment movement of the first fixed base and the longitudinal fine adjustment movement of the second fixed base, fine adjustment movement and docking tests are carried out on the docking structures (first electrical connector and second electrical connector) on both sides of the test fixture, which can increase the test Data stability and reliability.
Description
本創作係有關於一種測試治具,特別是關於一種電連接器測試治具。This creation is about a test fixture, especially a test fixture for electrical connectors.
目前電連接器的量測設備在量測時,需要將兩張電路板(PCB)上的第一電連接器與第二電連接器固定到治具上對接,再量測兩者之間的訊號傳輸。不過由於各款第一電連接器、第二電連接器的結構不同,需要使用不同的治具來固定,因此,適用性較為不足。At present, the measuring equipment of the electrical connector needs to fix the first electrical connector and the second electrical connector on the two circuit boards (PCB) to the jig for docking, and then measure the difference between the two Signal transmission. However, due to the different structures of the first electrical connector and the second electrical connector, different fixtures are required to fix them, so the applicability is relatively insufficient.
本創作一實施例提供一種測試治具,包括底座、第一固定座、第一治具板、第二固定座及第二治具板。底座包括第一底座滑移機構及第二底座滑移機構,第一底座滑移機構為橫向設置於底座一側,第二底座滑移機構為縱向設置於底座另一側。第一固定座包括第一固定座滑移機構,對應滑移於第一底座滑移機構。第一治具板設置於第一固定座。第二固定座包括第二固定座滑移機構,對應滑移於第二底座滑移機構。第二治具板設置於第二固定座。An embodiment of the present invention provides a test fixture, including a base, a first fixing seat, a first fixture plate, a second fixing seat, and a second fixture plate. The base includes a first base sliding mechanism and a second base sliding mechanism. The first base sliding mechanism is disposed laterally on one side of the base, and the second base sliding mechanism is longitudinally disposed on the other side of the base. The first fixed base includes a first fixed base sliding mechanism, corresponding to the first base sliding mechanism. The first jig plate is disposed on the first fixing seat. The second fixed base includes a second fixed base sliding mechanism corresponding to the second base sliding mechanism. The second jig plate is disposed on the second fixed seat.
在一實施例中,第一治具板用於設置第一電路板,第一電路板包括第一電連接器,第二治具板用於設置第二電路板,第二電路板包括第二電連接器,第一電連接器與第二電連接器用於透過第一治具板與第二治具板彼此對接。In an embodiment, the first jig board is used to set a first circuit board, the first circuit board includes a first electrical connector, the second jig board is used to set a second circuit board, and the second circuit board includes a second The electrical connector, the first electrical connector and the second electrical connector are used for docking with each other through the first jig board and the second jig board.
在一實施例中,第一治具板包括複數第一邊框,各第一邊框圍成框架結構,複數第一邊框用於固定第一電路板二側。In an embodiment, the first jig board includes a plurality of first frames, each first frame encloses a frame structure, and the plurality of first frames is used to fix the two sides of the first circuit board.
在一實施例中,第一治具板為直立置放於第一固定座或水平置放於第一固定座。In an embodiment, the first jig plate is placed upright on the first fixing base or horizontally on the first fixing base.
在一實施例中,第二治具板包括複數第二邊框,各第二邊框圍成框架結構,複數第二邊框用於固定第二電路板二側。In an embodiment, the second jig board includes a plurality of second frames, each second frame surrounds a frame structure, and the plurality of second frames is used to fix the two sides of the second circuit board.
在一實施例中,第二治具板為直立置放於第二固定座或水平置放於第二固定座。In an embodiment, the second jig plate is placed upright on the second fixing base or horizontally on the second fixing base.
在一實施例中,第一底座滑移機構係為滑槽,第一固定座滑移機構係為滑塊,滑塊對應滑移於滑槽。In an embodiment, the first base sliding mechanism is a chute, and the first fixed base sliding mechanism is a slider, and the slider slides correspondingly in the chute.
在一實施例中,第一底座滑移機構係為滑塊,第一固定座滑移機構係為滑槽,滑塊對應滑移於滑槽。In an embodiment, the first base sliding mechanism is a slider, and the first fixed base sliding mechanism is a sliding slot, and the sliding block slides correspondingly in the sliding slot.
在一實施例中,第二底座滑移機構係為滑槽,第二固定座滑移機構係為滑塊,滑塊對應滑移於滑槽。In one embodiment, the second base sliding mechanism is a chute, and the second fixed base sliding mechanism is a slider, and the slider slides correspondingly in the chute.
在一實施例中,第二底座滑移機構係為滑塊,第二固定座滑移機構係為滑槽,滑塊對應滑移於滑槽。In an embodiment, the second base sliding mechanism is a slider, and the second fixed base sliding mechanism is a sliding slot, and the sliding block slides correspondingly in the sliding slot.
在一實施例中,測試治具更包括複數鎖具,分別鎖入於第一固定座之鎖孔、第二固定座之鎖孔至底座上固定。In an embodiment, the test fixture further includes a plurality of locks, which are respectively locked into the lock holes of the first fixing base and the lock holes of the second fixing base to the base.
本創作一實施例藉由測試治具一側的第一固定座可橫向水平微調移動,另一側的第二固定座可縱向水平微調移動,在測試治具兩側之對接結構(第一電連接器與第二電連接器)進行微調移動、對接測試,可增加測試數據之穩定度、可靠度。In one embodiment of the present invention, the first fixing seat on one side of the test fixture can be horizontally and horizontally finely adjusted to move, and the second fixing seat on the other side can be vertically and horizontally finely adjusted to move. Connector and the second electrical connector) for fine-tuning mobile and docking tests, which can increase the stability and reliability of the test data.
為使本創作之目的、技術特徵及優點,能更為相關技術領域人員所了解並得以實施本創作,在此配合所附圖式,於後續之說明書闡明本創作之技術特徵與實施方式,並列舉較佳實施例進一步說明,然以下實施例說明並非用以限定本創作,且以下文中所對照之圖式,係表達與本創作特徵有關之示意。In order to make the purpose, technical features and advantages of this creation more familiar to those in the relevant technical field and to be able to implement this creation, the technical characteristics and implementation of this creation are explained in the following description in conjunction with the drawings attached hereto, and The preferred embodiments are listed for further description. However, the following embodiment descriptions are not intended to limit the creation, and the drawings referred to in the following are expressions related to the characteristics of the creation.
請同時參閱圖1至圖2,圖1為外觀示意圖、圖2為分解示意圖,其為測試治具100的第一實施例,本實施例中,測試治具100包括底座1、第一固定座2、第一治具板31、第二固定座4及第二治具板51。Please also refer to FIG. 1 to FIG. 2, FIG. 1 is a schematic diagram of the appearance, and FIG. 2 is an exploded schematic diagram, which is the first embodiment of the
請同時參閱圖2至圖3,圖3為第一治具板31與第二治具板51直立置放之俯視示意圖,本實施例中,底座1包括第一底座滑移機構11及第二底座滑移機構12,第一底座滑移機構11為橫向(X軸)設置於底座1一側,第二底座滑移機構12為縱向(Y軸)設置於底座1另一側。Please refer to FIGS. 2 to 3 at the same time. FIG. 3 is a schematic top view of the
本實施例中,第一固定座2包括第一固定座滑移機構21,其可對應滑移於第一底座滑移機構11,第一治具板31設置於第一固定座2上方,第二固定座4包括第二固定座滑移機構42,其可對應滑移於第二底座滑移機構12,第二治具板51設置於第二固定座4上方。In this embodiment, the first
本實施例中,更詳細的說,第一治具板31包括複數第一邊框311,各第一邊框311圍成一矩形且中空的框架結構。在此,複數第一邊框311上設置有複數鎖孔,供複數鎖接件(螺絲)鎖入並鎖固在第一固定座2上的複數鎖孔,將第一治具板31固定於第一固定座2上。上述第一治具板31與第一固定座2為二件式,但非以此為限,在一些實施例中,第一治具板31與第一固定座2可為一體式結構。In this embodiment, in more detail, the
請同時參閱圖2至圖3,本實施例中,更詳細的說,第一治具板31與第一固定座2相互垂直(倒T字型),第一治具板31為直立置放於第一固定座2上方,非以此為限。請同時參閱圖4,圖4為第一實施例之第一治具板31與第二治具板51水平置放之俯視示意圖,進一步地第一治具板31可水平置放於第一固定座2,意即第一治具板31並排設置於第一固定座2上方(呈現二字型)。Please refer to FIGS. 2 to 3 at the same time. In this embodiment, in more detail, the
請同時參閱圖2至圖3,本實施例中,更詳細的說,第二治具板51包括複數第二邊框511,各第二邊框511圍成一矩形且中空的框架結構。在此,複數第二邊框511上設置有複數鎖孔,供複數鎖接件鎖入並鎖固在第二固定座4上的複數鎖孔,將第二治具板51固定於第二固定座4上。上述第二治具板51與第二固定座4為二件式,但非以此為限,在一些實施例中,第二治具板51與第二固定座4可為一體式結構。Please also refer to FIGS. 2 to 3. In this embodiment, in more detail, the
請同時參閱圖2至圖3,本實施例中,更詳細的說,第二治具板51與第二固定座4相互垂直(倒T字型),第二治具板51為直立置放於第二固定座4上方,非以此為限。請同時參閱圖4,進一步地第二治具板51可水平置放於第二固定座4,意即第二治具板51並排設置於第二固定座4上方(呈現二字型)。Please refer to FIGS. 2 to 3 at the same time. In this embodiment, in more detail, the
本實施例中,更詳細的說,底座1為一長方形塊體,在底座1表面的左側、右側(如在X軸上的相對兩側)分別設置有第一底座滑移機構11及第二底座滑移機構12。In this embodiment, in more detail, the
請同時參閱圖2、圖3及圖5,圖5為局部外觀示意圖,本實施例中,更詳細的說,第一底座滑移機構11係為一滑槽111,非以此為限。在此,滑槽111橫向設置於底座1表面的一側,意即在底座1表面凹陷形成狹長型的凹槽,並且以一個滑槽111設置(或可以二個以上數量設置)。另外,第一固定座滑移機構21係為滑塊211,滑塊211對應滑移於滑槽111。在此,滑塊211橫向設置於第一固定座2底面,意即在第一固定座2底面突出形成長方型的突塊,並且以一個滑塊211設置(或可以二個以上數量設置)。Please refer to FIG. 2, FIG. 3 and FIG. 5 at the same time. FIG. 5 is a partial schematic view. In this embodiment, in more detail, the first
上述底座1表面凹陷形成滑槽111、第一固定座2底面突出有滑塊211的方式僅是舉例。請參閱圖13及圖14所示,圖13為使用滑軌結構之滑移機構之分解示意圖(一)、圖14為使用滑軌結構之滑移機構之分解示意圖(二),在一些實施態樣中,可在底座1表面與第一固定座2底面另外安裝相對應的滑軌使用,供第一固定座2於底座1上滑移。詳言之,第一底座滑移機構11係為滑軌113,第一固定座滑移機構21係為與滑軌113相配合之滑塊座213,非以此為限。在一些實施態樣中,第一底座滑移機構11的滑軌113與第一固定座滑移機構21的滑塊座213可以互換,也就是說,第一底座滑移機構11係為滑塊座114,第一固定座滑移機構21係為與滑塊座114相配合之滑軌214。The manner in which the
請同時參閱圖11,圖11為另一滑移機構之側視示意圖,在一些實施例中,更詳細的說,第一底座滑移機構11係為一滑塊112,非以此為限。在此,滑塊112橫向(如圖2與圖3的X軸方向)設置於底座1表面的一側,意即在底座1表面突出形成長方型的突塊,並且以一個滑塊112設置(或可以二個以上數量設置)。另外,第一固定座滑移機構21係為滑槽212,滑塊112對應滑移於滑槽212。在此,滑槽212橫向設置於第一固定座2底面,意即在第一固定座2底面凹陷形成狹長型的凹槽,並且以一個滑槽212設置(或可以二個以上數量設置)。Please also refer to FIG. 11. FIG. 11 is a schematic side view of another sliding mechanism. In some embodiments, in more detail, the first
請同時參閱圖2、圖3及圖5,本實施例中,更詳細的說,第二底座滑移機構12係為一滑槽121,非以此為限。在此,滑槽121縱向(如Y軸方向)設置於底座1表面的另一側,意即在底座1表面凹陷形成狹長型的凹槽,並且以二個滑槽121設置(或可以一個或三個以上數量設置)。另外,第二固定座滑移機構42係為滑塊421,滑塊421對應滑移於滑槽121。在此,滑塊421縱向設置於第二固定座4底面,意即在第二固定座4底面突出形成長方型的突塊,並且以二個滑塊421設置(或可以一個或三個以上數量設置)。Please refer to FIG. 2, FIG. 3 and FIG. 5 at the same time. In this embodiment, in more detail, the second
上述底座1表面凹陷形成滑槽121、第二固定座4底面突出有滑塊421的方式僅是舉例。請參閱圖13及圖14所示,在一些實施態樣中,可在底座1表面與第二固定座4底面另外安裝相對應的滑軌使用,供第二固定座4於底座1上滑移。詳言之,第二底座滑移機構12係為滑軌123,第二固定座滑移機構42係為與滑軌123相配合之滑塊座423,非以此為限。在一些實施態樣中,第二底座滑移機構12的滑軌123與第二固定座滑移機構42的滑塊座423可以互換,也就是說,第二底座滑移機構12係為滑塊座124,第二固定座滑移機構42係為與滑塊座124相配合之滑軌424。The manner in which the sliding
請同時參閱圖12,圖12為另一滑移機構之前視示意圖,在一些實施例中,更詳細的說,第二底座滑移機構12係為一滑塊122,非以此為限。在此,滑塊122縱向設置於底座1表面的另一側,意即在底座1表面突出形成長方型的突塊,並且以二個滑塊122設置(或可以一個或三個以上數量設置)。另外,第二固定座滑移機構42係為滑槽422,滑塊122對應滑移於滑槽422。在此,滑槽422縱向設置於第二固定座4底面,意即在第二固定座4底面凹陷形成狹長型的凹槽,並且以二個滑槽422設置(或可以一個或三個以上數量設置)。Please also refer to FIG. 12, which is a schematic front view of another sliding mechanism. In some embodiments, in more detail, the second
本實施例中,更詳細的說,測試治具100更包括複數鎖具6(如螺絲),分別鎖入於第一固定座2之鎖孔26、第二固定座4之鎖孔46至底座1上固定。在此,第一固定座2之鎖孔26與第二固定座4之鎖孔46為長條形狀。在本實施例中,第一固定座2的鎖孔26是橫向(如圖2與圖3的X軸方向)延伸,且第二固定座4的鎖孔46是縱向(如圖2與圖3的Y軸方向)延伸。當第一固定座2或第二固定座4移動後,將鎖具6鎖入於第一固定座2之鎖孔26、第二固定座4之鎖孔46至底座1上鎖緊固定,此時,鎖具6可在長條形狀鎖孔26、鎖孔46內的任一位置固定,並供第一固定座2或第二固定座4微調移動後定位。In this embodiment, in more detail, the
本實施例中,當鬆開第一固定座2上的鎖具6時,可橫向微調移動第一固定座2,依其需求向左或向右移動。到達定位後,再鎖緊鎖具6,將第一固定座2固定於底座1上定位。另外,當鬆開第二固定座4上的鎖具6時,可縱向微調移動第二固定座4,依其需求向前或向後移動。到達定位後,再鎖緊鎖具6,將第二固定座4固定於底座1上定位。In this embodiment, when the
藉由測試治具100一側的第一固定座2可橫向水平微調移動,另一側的第二固定座4可縱向水平微調移動,在測試治具100兩側的第一固定座2與第二固定座4分別設置對接結構(第一電連接器33與第二電連接器53),兩對接結構可透過第一固定座2與第二固定座4進行微調移動、對齊並對接以進行測試,可增加測試數據之穩定度、可靠度。且其測試治具100兩側設置的對接結構並不限任何連接器的形式、規格,具有廣泛適用的效果。By means of the
請同時參閱圖6至圖9,圖6為第一治具板31與第二治具板51直立置放之俯視示意圖、圖7為第一電連接器33與第二電連接器53插接時之前視示意圖、圖8為第一電連接器33與第二電連接器53脫離時之前視示意圖、圖9為圖8之8-8引線之剖面示意圖,其為測試治具100的第二實施例,第二實施例與第一實施例差別在於:第二實施例的第一治具板31用於設置第一電路板32、第二治具板51用於設置第二電路板52。換言之,第一實施例的測試治具100不包含電路板,第二實施例的測試治具100包含電路板。Please refer to FIGS. 6 to 9 at the same time. FIG. 6 is a schematic top view of the
本實施例中,第一電連接器33可為公端電連接器或母端電連接器,第二電連接器53可為與第一電連接器33相配合插接之公端電連接器或母端電連接器。意即,當第一電連接器33為公端電連接器時,第二電連接器53為相配合插接之母端電連接器;當第一電連接器33為母端電連接器時,第二電連接器53為相配合插接之公端電連接器。在一些實施例中,第一電連接器33與第二電連接器53為可彼此匹配的任何種類的連接器。In this embodiment, the first
本實施例中,複數第一邊框311、複數第二邊框511各圍成一矩形且中空的框架結構,複數第一邊框311用於固定第一電路板32二側,複數第二邊框511用於固定第二電路板52二側。以此框架結構有利於第一電路板32及第二電路板52的安裝與固定。在此,第一治具板31為直立置放於第一固定座2上,第一電路板32為直立固接在第一治具板31側邊,第一電路板32與第一治具板31並排。第二治具板51為直立置放於第二固定座4上,第二電路板52為直立固接在第二治具板51側邊,第二電路板52與第二治具板51並排。In this embodiment, the plural
本實施例中,更詳細的說,測試治具100更包括複數鎖接件7(螺絲),分別鎖入於第一電路板32之鎖孔327、第二電路板52之鎖孔527至複數第一邊框311、複數第二邊框511上固定。在此,第一電路板32之鎖孔327與第二電路板52之鎖孔527橫向延伸(如圖2與圖3的X軸方向)為長條形狀,可供各鎖接件7鎖入長條形狀鎖孔327、鎖孔527內的任一位置固定,並供第一電路板32及第二電路板52於複數第一邊框311及複數第二邊框511上微調移動位置後定位,增加適用性。在一些實施例中,第一電路板32的鎖孔327或第二電路板52的鎖孔527可在高度方向(如圖2與圖3的垂直於X軸與Y軸的方向)延伸為長條形狀,使第一電路板32或第二電路板52可在高度方向上相對於第一治具板31或第二治具板51微調移動,再透過鎖接件鎖入長條形鎖孔327、鎖孔527內固定。In this embodiment, in more detail, the
本實施例中,第一電路板32包括第一電連接器33,第二電路板52包括第二電連接器53,第一電連接器33與第二電連接器53用於透過第一治具板31與第二治具板51彼此對接。在此,第一電連接器33裝設在第一電路板32的側端的中央處,第二電連接器53裝設在第二電路板52的側端的中央處,微調移動第一電連接器33與第二電連接器53後可對應插接。In this embodiment, the
本實施例中,第一電連接器33裝設在第一電路板32側端的中央處,第二電連接器53裝設在第二電路板52側端的中央處的位置關係非以此為限。在一些實施態樣中,第一電連接器33與第二電連接器53可依據設計或測試所需,而固定在第一電路板32與第二電路板52上的其他特定位置。In this embodiment, the first
本實施例中,第一電連接器33與第二電連接器53為高速傳輸訊號用的電連接器,例如應用於SlimSAS、SAS或SFP。In this embodiment, the first
本實施例中,左側第一固定座2可橫向左右移動,右側第二固定座4可縱向前後移動,其中第一電連接器33與第二電連接器53可分別固定於第一電路板32與第二電路板52上,第一電路板32可固定於左側第一治具板31及位於第一固定座2上方、且第二電路板52可固定於右側第二治具板51及位於第二固定座4上方,藉由調整移動左側第一固定座2的左右位置與右側第二固定座4的前後位置,可使第一電連接器33與第二電連接器53彼此微調移動、對齊並連接。在此,第一固定座2與第二固定座4設計可左右方向與前後方向的短距離調整移動,可增加測試治具100量測的可靠度及共用性。改善傳統電連接器的測試治具多無固定座,無法調整位置,測試驗證時較不穩定對接、量測的問題。In this embodiment, the
請同時參閱圖6,本實施例中,更詳細的說,第一治具板31與第一固定座2相互垂直(倒T字型),第一治具板31為直立置放於第一固定座2上方,非以此為限。另外,第二治具板51與第二固定座4相互垂直(倒T字型),第二治具板51為直立置放於第二固定座4上方,非以此為限。請同時參閱圖10,圖10為第一治具板31與第二治具板51水平置放之俯視示意圖,進一步地第一治具板31可水平置放於第一固定座2,意即第一治具板31並排設置於第一固定座2上方(呈現二字型)。進一步地第二治具板51可水平置放於第二固定座4,意即第二治具板51並排設置於第二固定座4上方(呈現二字型)。Please refer to FIG. 6 at the same time. In this embodiment, in more detail, the
本創作一實施例藉由測試治具一側的第一固定座可橫向水平微調移動,另一側的第二固定座可縱向水平微調移動,在測試治具兩側之對接結構(第一電連接器與第二電連接器)進行微調移動、對接測試,可增加測試數據之穩定度、可靠度,並可提高測試治具的適用性與便利性。In one embodiment of the present invention, the first fixing seat on one side of the test fixture can be horizontally and horizontally finely adjusted to move, and the second fixing seat on the other side can be vertically and horizontally finely adjusted to move. Connector and the second electrical connector) for fine-tuning mobile and docking tests, which can increase the stability and reliability of the test data and improve the applicability and convenience of the test fixture.
雖然本創作以前述之較佳實施例揭露如上,然其並非用以限定本創作,任何熟習本領域技藝者,在不脫離本創作之精神和範圍內,當可作些許之更動與潤飾,因此本創作之專利保護範圍須視本說明書所附之申請專利範圍所界定者為準。Although this creation is disclosed above with the above preferred embodiments, it is not intended to limit this creation. Any person who is familiar with the art in this field can make some changes and retouching without departing from the spirit and scope of this creation. The scope of patent protection for this creation shall be subject to the scope defined in the patent application attached to this specification.
100‧‧‧測試治具
1‧‧‧底座
11‧‧‧第一底座滑移機構
111‧‧‧滑槽
112‧‧‧滑塊
113‧‧‧滑軌
114‧‧‧滑塊座
12‧‧‧第二底座滑移機構
121‧‧‧滑槽
122‧‧‧滑塊
123‧‧‧滑軌
124‧‧‧滑塊座
2‧‧‧第一固定座
21‧‧‧第一固定座滑移機構
211‧‧‧滑塊
212‧‧‧滑槽
213‧‧‧滑塊座
214‧‧‧滑軌
26‧‧‧鎖孔
31‧‧‧第一治具板
311‧‧‧第一邊框
32‧‧‧第一電路板
327‧‧‧鎖孔
33‧‧‧第一電連接器
4‧‧‧第二固定座
42‧‧‧第二固定座滑移機構
421‧‧‧滑塊
422‧‧‧滑槽
423‧‧‧滑塊座
424‧‧‧滑軌
46‧‧‧鎖孔
51‧‧‧第二治具板
511‧‧‧第二邊框
52‧‧‧第二電路板
527‧‧‧鎖孔
53‧‧‧第二電連接器
6‧‧‧鎖具
7‧‧‧鎖接件
100‧‧‧
[圖1] 係為本創作之第一實施例之外觀示意圖。 [圖2] 係為本創作之第一實施例之分解示意圖。 [圖3] 係為本創作之第一實施例之第一治具板與第二治具板直立置放之俯視示意圖。 [圖4] 係為本創作之第一實施例之第一治具板與第二治具板水平置放之俯視示意圖。 [圖5] 係為本創作之第一實施例之局部外觀示意圖。 [圖6] 係為本創作之第二實施例之第一治具板與第二治具板直立置放之俯視示意圖。 [圖7] 係為本創作之第二實施例之第一電連接器與第二電連接器插接時之前視示意圖。 [圖8] 係為本創作之第二實施例之第一電連接器與第二電連接器脫離時之前視示意圖。 [圖9] 係為圖8之8-8引線之剖面示意圖。 [圖10] 係為本創作之第二實施例之第一治具板與第二治具板水平置放之俯視示意圖。 [圖11] 係為本創作之另一滑移機構之側視示意圖。 [圖12] 係為本創作之另一滑移機構之前視示意圖。 [圖13] 係為本創作之使用滑軌結構之滑移機構之分解示意圖(一)。 [圖14] 係為本創作之使用滑軌結構之滑移機構之分解示意圖(二)。 [Figure 1] This is a schematic diagram of the appearance of the first embodiment of the creation. [Figure 2] This is an exploded schematic view of the first embodiment of the creation. [Fig. 3] This is a schematic plan view of the first jig plate and the second jig plate placed upright in the first embodiment of this creation. [FIG. 4] This is a schematic plan view of the first jig plate and the second jig plate horizontally placed in the first embodiment of the present creation. [FIG. 5] This is a partial schematic view of the first embodiment of this creation. [Fig. 6] This is a schematic plan view of the first jig plate and the second jig plate placed upright in the second embodiment of this creation. [FIG. 7] It is a schematic front view when the first electrical connector and the second electrical connector of the second embodiment of the present invention are inserted. [FIG. 8] It is a schematic front view when the first electrical connector and the second electrical connector of the second embodiment of the present invention are detached. [Figure 9] This is a schematic cross-sectional view of the 8-8 lead of Figure 8. [Fig. 10] This is a schematic plan view of the first jig plate and the second jig plate horizontally placed in the second embodiment of this creation. [Figure 11] It is a schematic side view of another sliding mechanism of this creation. [Figure 12] This is a schematic front view of another sliding mechanism for this creation. [Figure 13] It is an exploded schematic view (1) of the slide mechanism using slide rail structure for this creation. [Figure 14] This is an exploded schematic view (2) of the slide mechanism using slide rail structure for this creation.
100‧‧‧測試治具 100‧‧‧Test Fixture
1‧‧‧底座 1‧‧‧Base
11‧‧‧第一底座滑移機構 11‧‧‧ First base sliding mechanism
111‧‧‧滑槽 111‧‧‧Chute
12‧‧‧第二底座滑移機構 12‧‧‧Second base sliding mechanism
121‧‧‧滑槽 121‧‧‧Chute
2‧‧‧第一固定座 2‧‧‧First fixed seat
21‧‧‧第一固定座滑移機構 21‧‧‧The first fixed seat sliding mechanism
211‧‧‧滑塊 211‧‧‧slider
26‧‧‧鎖孔 26‧‧‧Keyhole
31‧‧‧第一治具板 31‧‧‧The first jig board
311‧‧‧第一邊框 311‧‧‧First border
4‧‧‧第二固定座 4‧‧‧Second fixed seat
42‧‧‧第二固定座滑移機構 42‧‧‧Second fixed seat sliding mechanism
421‧‧‧滑塊 421‧‧‧slider
46‧‧‧鎖孔 46‧‧‧Keyhole
51‧‧‧第二治具板 51‧‧‧Second Fixture Board
511‧‧‧第二邊框 511‧‧‧Second border
6‧‧‧鎖具 6‧‧‧Lock
Claims (13)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW108214781U TWM589795U (en) | 2019-11-07 | 2019-11-07 | Test tool |
| CN202020689048.9U CN212410642U (en) | 2019-11-07 | 2020-04-29 | Test Fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW108214781U TWM589795U (en) | 2019-11-07 | 2019-11-07 | Test tool |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TWM589795U true TWM589795U (en) | 2020-01-21 |
Family
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| Application Number | Title | Priority Date | Filing Date |
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| TW108214781U TWM589795U (en) | 2019-11-07 | 2019-11-07 | Test tool |
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| TW (1) | TWM589795U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI847391B (en) * | 2022-11-28 | 2024-07-01 | 英業達股份有限公司 | Detection system for slimsas slot and method thereof |
-
2019
- 2019-11-07 TW TW108214781U patent/TWM589795U/en unknown
-
2020
- 2020-04-29 CN CN202020689048.9U patent/CN212410642U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI847391B (en) * | 2022-11-28 | 2024-07-01 | 英業達股份有限公司 | Detection system for slimsas slot and method thereof |
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| Publication number | Publication date |
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| CN212410642U (en) | 2021-01-26 |
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