TWM321104U - Modular probe device - Google Patents
Modular probe device Download PDFInfo
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- TWM321104U TWM321104U TW96206952U TW96206952U TWM321104U TW M321104 U TWM321104 U TW M321104U TW 96206952 U TW96206952 U TW 96206952U TW 96206952 U TW96206952 U TW 96206952U TW M321104 U TWM321104 U TW M321104U
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- probe
- fixing
- groove
- modular
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- 239000000523 sample Substances 0.000 title claims description 57
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims description 6
- 239000012811 non-conductive material Substances 0.000 claims description 4
- 239000007787 solid Substances 0.000 claims description 4
- 239000000919 ceramic Substances 0.000 claims description 3
- 229910010293 ceramic material Inorganic materials 0.000 claims description 3
- 239000000463 material Substances 0.000 claims description 2
- 239000007769 metal material Substances 0.000 claims description 2
- 238000013461 design Methods 0.000 description 8
- 238000010586 diagram Methods 0.000 description 7
- 238000012360 testing method Methods 0.000 description 5
- 238000005516 engineering process Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 1
- 210000003746 feather Anatomy 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 239000002689 soil Substances 0.000 description 1
- 239000004094 surface-active agent Substances 0.000 description 1
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- Measuring Leads Or Probes (AREA)
Description
M321104 八、新型說明: 【新型所屬之技術領域】 m作#、有關於—種模組化探 實固定探4十,使所有探針維持較佳i、置,尤指一種可確 針裝置。 土 ^、同平面度的模組化探 【先前技術】 習知的探針模組,請參閱證蚩 組化探針裝置及探針 曰^文第M2720 90號『模 化探針裝置係適於對-平面 颁丁的之面板進行測試,該模 十面 一基座; “木針裳置包括: ::仏針’母一該些探針具有一探針本體及 二:接觸端分別延伸於該探針本體之相對端 本體上具有多個定位開口,·以及, · ^木針 :個連桿,每—該些連桿對應橫跨於該些定位開口其 ▲之:上’且每一該些連桿之兩端固定於該基座上,以將 該些探針連結並安裝於該基座内。 、 雖然此種模組化探針之裝置,具有細間距、易掣作 易安裝維修以及測試精確度高;但其僅靠連桿將探針固l 仍有不足,以致於探針之平面度不佳,而無法獲: 觸阻抗。 t接 因此本創作人乃藉由多年從事相關產業之研發與製造 經驗,針對上述現有的問題加以探討研究, 二衣坆 1預:極的尋找 解決之方法,經多次測試及改良後,終於創 — 贝種可確 貫改進上述缺失之模組化探針裝置。 5 M321104 【新型内容】 名人解決之技術問韻赴·羽 『 n碭點.習知的『模組化探針裝置及探 ’’』其係於連桿將探針固定,而連 影響探斜之平面择 疋逖有不足,容易 ,十之+面度,進一步使接觸阻抗不佳。 知決問題之技術拉赴.但 知站.槌供一種杈組化探針裝置,直 係包括有-基座,該基座凹設有一容 其 : 又有别固定槽模組及-後固定槽模組,該 後固定槽杈組分別設有數前、後 M Λ0 + 曰 丑邊刖固定 9杈組朝容置槽水平延伸出有一凸塊; 〜其中該葉片式探針位於前接觸端之下部凹設有一凹 q ’該凹嵌部可供前固定槽模組之凸塊卡固; 觸端署其中該前、後固定槽可分別供葉片式探針之前、後接 該〜入’且各葉片式探針側邊凹設有至少兩定位槽部, 疋位槽部可供固定件橫跨並固定於基座上。 塊* '此’本創作之前固定槽模組與葉片式探針,利用凸 片2後部固定’再配合固定件定位葉片式探針,因此葉 木二不易位移,且於電性測試時可得到良好的平面度。 ,創 t、、先刚技術之功效:提供一種模組化探針裝置,本 位苹=固定槽模組可固定葉片式探針,且固定件亦可定 僅靠二探針’電性測試時可達良好之平面度;改良習知 連#將探針固定之缺點。 B有關本創作所採用之技術、手段及其功效,兹舉一較 的2例並配合圖式詳細說明於后,相信本創作上述之目 造及特徵,當可由之得一深入而具體的瞭解。 6 M321104 【實施方式】 本創作係提供一種模組化探 圖所示,其係包括: ^ 圖、第二 基座(1 〇),該基座(1 質、陶究材質或可加工塑膠所 2不導電金屬材 有-容置槽(11);該基座(1成 上設有一前固定槽模組(")及-二:槽:::卜 該前固定槽模組(")於基座( 、門,3)’ 前固定槽(1 2 i ) 1間$成有數 (12) 朝宏署Μ )’且該前固定样梭, 朝谷置槽(1 1 )水平延伸出有一凸塊。且 而後固定槽模紙(13)於 側122); 後固定槽(1 3 i 门1 0 )兩側間形成有數 丄),亚使珂固定槽筑 定槽 (1 3 1 )之相互㈣“― 與後固 丨應’其中前、後固定槽模組(3 (13) 可由陶害榮 v 1 2 尤4耐磨耗材質或非導電材料 數葉片式探針(? n、t+ “成; 側邊 凹設有至少兩定位槽 ? ^ 0 } 21) 其中该疋位槽部广 可靠近於葉片式探私/ η ^ ( 2 1 : 、十(20)之前後兩端;另該葦 針(2 0 )前側端二 力成葉片式探 2 ),該耵接觸端Γ ] ^ κ 2 22)可置入前固定槽(1 2 1 )中 且葉片式探針ν丄Ζ1)中, U )位於前接觸端(2 2 )之下部朝内 凹設有一凹嵌部( 1朝内 ^ Λ , , W 3 ),該凹嵌部(2 3 )可供前固定槽 模組(12)之凸始 鬼(1 2 2 )卡固;又該葉片式探針(2 0 )後側端面之后;立 & #,朝外延伸出有後接觸端(2 4 ),並 使該後接觸端(9 ^ 可置入後固定槽(131)中,而 7 M321104 ¥ 抵靠於後固定槽(1 3 1 )底面,且使葉片式探針(2 Ο ) _ 橫跨於基座(1 0 )之容置槽(1 1 ); 至少一固定件(3 0 ),各固定件(3 0 )之係橫跨 設於各葉片式探針(2 0 )之定位槽部(2 1 ),且各固定 _ 件(3 0 )之兩端分別設於基座(1 0 )之兩側面上,其 、 中固定件(3 0 )可由陶瓷或非導電材料所形成。 藉由上述之設計,請參閱第三圖所示,當使用模組化 探針裝置時,係可將前接觸端(2 2 )與一平面顯示器之 ® 面板·( 4 0 )上的電極(4 1 )接觸,且後接觸端(2 4 ) 可與一軟性電路板(圖中未示)連接,而可進行電性測試。 另請參閱第四圖、第四A圖所示,係本創作凹嵌部與 凸塊結合之另一實施例,本創作之凹嵌部(2 3 )係可為 一 L型之設計,而前固定槽模組(1 2)之凸塊(1 2 2) 配合凹嵌部(23)為L型。 另請參閱第五圖所示,係本創作固定件之另一實施 φ例,係本創作之各固定件(3 0 )可為梯形之設計,而該 定位槽部(2 1 )可配合各固定件(3 0 )為梯形凹槽之 設計° - 另請參閱第六圖所示,係本創作固定件之又一實施 例,係本創作之各固定件(3 0 )可為圓形之設計,而該 定位槽部(2 1)可配合各固定件(30)為圓形凹槽之 設計。 另請參閱第七圖至第九圖所示,係本創作固定件之再 一實施例圖,係本創作之各固定件(3 0 )可為T型或倒 8 M321104 T型之設計,而該定位槽部(2 1 )可配合各固定件(3 • 0 )為丁型凹槽或倒T型凹槽之設計。 另請參閱第十圖所示,係本創作固定件之再一實施例 圖,係本創作之固定件(3 0 )可為片狀之設計,而該定 _ 位槽部(2 1 )可配合各固定件(3 0 )為片狀凹槽之設 計。 由於本創作之前固定槽模組(1 2 )與葉片式探針(2 0 ),利用凸塊(1 2 2 )與凹嵌部(2 3 )固定,再配合 • 固定件(3 0 )定位葉片式探針(2 0 ),因此葉片式探針 (2 0 )不易位移,於電性測試時可得到良好的平面度。 歸納上述所說,本創作同時具有上述眾多效能與實用 價值,並可有效提升整體的經濟效益,因此本創作確實為 一創意極佳的創作,且在相同技術領域中未見相同或近似 之產品公開使用,應已符合創作專利之要件,乃依法提出 申請,並請賜予本創作專利。 φ 【圖式簡單說明】 第一圖係本創作之立體外觀示意圖。 •第二圖係本創作之剖面示意圖。 -第三圖係本創作之使用狀態示意圖。 第四圖係本創作凹嵌部與凸塊結合之另一實施例示意圖。 第四A圖係本創作凹嵌部與凸塊結合之局部放大示意圖。 第五圖係本創作固定件之另一實施例示意圖。 第六圖係本創作固定件之又一實施例示意圖。 第七圖係本創作固定件之再一實施例示意圖。 9 M321104 第八圖係本創作固定件之再一實施例示意圖 . 第九圖係本創作固定件之再一實施例示意圖 第十圖係本創作固定件之再一實施例示意圖 【主要元件符號說明】 .(1〇)基座 v ( 1 1 )容置槽 (1 2 )前固定槽模組 (1 3 )後固定槽模組 • (121)前固定槽 (1 2 2 )凸塊 (1 3 1 )後固定槽 (2 0 )葉片式探針 (2 1 )定位槽部 (2 2 )前接觸端 (2 3 )凹嵌部 ^ ( 2 4 )後接觸端 (3 0 )固定件 '(4 0 )面板 ~ ( 4 1 )電極 10M321104 VIII, new description: [New technology field] m for #, there is a kind of modular exploration and fixed probe 40, so that all probes maintain better i, set, especially a needle device. Modular exploration of soil and flatness [Prior Art] For the known probe module, please refer to the Synthetic Probe Device and Probe 曰^文第M2720 90号The panel of the flat-panel is tested, and the mold has ten sides and a base; "the wooden needles include: :: needles", the probes have a probe body and two: the contact ends respectively extend a plurality of positioning openings on the opposite end body of the probe body, and a wooden needle: each of the links corresponding to the ▲ of the positioning openings: upper and Two ends of the connecting rods are fixed on the base to connect and mount the probes in the base. Although the device of the modular probe has fine pitch and is easy to handle Installation and maintenance and test accuracy are high; however, it is still insufficient to fix the probe by the connecting rod, so that the flatness of the probe is not good, and the impedance cannot be obtained: t. Therefore, the creator has been Engaged in research and development and manufacturing experience in related industries, and discussed and discussed the above existing problems. 1 Pre: The method of finding the solution is very successful. After many tests and improvements, it finally creates a modular probe device that can improve the above-mentioned missing. 5 M321104 [New content] The technical solution of celebrity solving ·Feathers n n points. The well-known "modular probe device and probe ''" is attached to the connecting rod to fix the probe, and even the plane that affects the exploration is insufficient, easy, ten + The degree of contact further makes the contact impedance poor. The technique of knowing the problem is pulled. However, the station is provided with a 杈 grouping probe device, and the straight system includes a pedestal, and the pedestal is recessed to provide a: There is a fixed slot module and a rear fixed slot module. The rear fixed slot group is respectively provided with a plurality of front and rear M Λ 0 + 曰 刖 刖 刖 fixed 9 杈 group extending horizontally with a bump toward the accommodating slot; The blade probe is recessed at a lower portion of the front contact end and has a recess q'. The recessed portion can be used for the bump of the front fixing slot module; the front and rear fixing slots of the blade end can be separately used for blade detection. Before and after the needle, the at least one positioning groove is recessed on the side of each of the vane probes. The clamp groove portion can be used for the fixing member to straddle and be fixed on the base. Block * 'This' before the creation of the fixed slot module and the blade probe, using the rear portion of the tab 2 fixed 're-fitted with the fixing member to locate the blade Needle, therefore, Yemu II is not easy to displace, and can obtain good flatness during electrical test. The effect of Teng, first and first technology: Provide a modular probe device, the position of the flat = fixed slot module can be fixed The blade type probe, and the fixing member can also be determined by the two probes only when the electrical test can achieve a good flatness; the improvement of the conventional joint # fixed the shortcomings of the probe. B related to the technology and means used in this creation And its efficacy, I will give you a more detailed description of the two cases, and I believe that the above-mentioned creations and features of this creation can be obtained from an in-depth and specific understanding. 6 M321104 [Embodiment] This creation department A modular probing diagram is provided, which includes: ^ Figure, second pedestal (1 〇), the pedestal (1 quality, ceramic material or machinable plastic 2 non-conductive metal material has - accommodate Slot (11); the base (1 is provided with a front fixed slot die (") and - 2: Slot::: The front fixed slot module (") on the base (, door, 3)' front fixed slot (1 2 i) 1 between $ into a number (12) Hong Department Μ) 'and the front fixed sample shuttle, a bump is extended horizontally toward the valley slot (1 1 ). And then the grooved molding paper (13) is fixed on the side 122); the rear fixing groove (1 3 i door 10) is formed with a plurality of sides), and the sub-fixing groove is fixed to the groove (1 3 1 ) (4) " And the rear solids should be 'the front and rear fixed slot modules (3 (13) can be made of ceramics v 1 2 especially 4 wear-resistant materials or non-conductive materials number of blade probes (? n, t + " into; side The edge concave is provided with at least two positioning grooves? ^ 0 } 21) wherein the clamping groove portion is wide enough to be close to the blade type private inspection / η ^ ( 2 1 : , 10 (20) before and after the two ends; 2 0) the front side end of the two force into a blade type probe 2), the 耵 contact end Γ ] ^ κ 2 22) can be placed in the front fixed groove (1 2 1 ) and the blade probe ν 丄Ζ 1), U) A recessed portion (1 inward, W, W3) is recessed inwardly of the lower portion of the front contact end (2 2 ), and the recessed portion (23) is convex for the front fixing slot module (12) The beginning ghost (1 2 2 ) is stuck; and the blade probe (20) is behind the rear end face; the vertical &#, the extension end has a rear contact end (2 4 ), and the rear contact end ( 9 ^ can be placed in the rear fixing groove (131), while 7 M321104 ¥ is resisted Fixing the bottom surface of the groove (1 3 1 ), and making the blade probe (2 Ο ) _ straddle the accommodating groove (1 1 ) of the base (10); at least one fixing member (30), each fixing member (3 0 ) is disposed across the positioning groove portion (2 1 ) of each of the vane probes (20), and both ends of each fixed_piece (30) are respectively disposed on the base (10) On both sides, the middle and middle fixing members (30) may be formed of ceramic or non-conductive materials. With the above design, please refer to the third figure, when using the modular probe device, the front can be The contact end (2 2 ) is in contact with the electrode ( 4 1 ) on the panel of the flat panel display ( 4 0 ), and the rear contact end (2 4 ) can be connected to a flexible circuit board (not shown). It can be electrically tested. Please refer to the fourth figure and the fourth figure A, which is another embodiment of the combination of the concave portion and the protrusion. The concave portion (23) of the present invention can be one. The design of the L-shape, and the projections of the front fixing groove module (1 2) (1 2 2) and the concave fitting portion (23) are L-shaped. Please also refer to the fifth figure, which is another An implementation of φ cases, this is the creation Each fixing member (30) can be a trapezoidal design, and the positioning groove portion (2 1 ) can be matched with each fixing member (30) as a trapezoidal groove design. - Please also refer to the sixth figure. In another embodiment of the creation of the fixing member, each fixing member (30) of the present invention can be a circular design, and the positioning groove portion (21) can be matched with each fixing member (30) as a circular groove. design. Please also refer to the seventh embodiment to the ninth figure, which is a further embodiment of the present invention, and the fixing members (30) of the present invention can be T-shaped or inverted 8 M321104 T-shaped design, and The positioning groove portion (2 1 ) can be matched with each fixing member (3 • 0) as a D-shaped groove or an inverted T-shaped groove. Please refer to the tenth figure, which is a further embodiment of the present invention. The fixing member (30) of the present invention can be a sheet-like design, and the fixed-position groove portion (2 1 ) can be The fixing member (30) is designed as a sheet-like groove. Since the fixed slot module (1 2 ) and the blade probe (20) before the creation, the bump (1 2 2 ) is fixed with the concave fitting portion (23), and then the fixing member (30) is positioned. The blade probe (20), so the blade probe (20) is not easily displaced, and good flatness can be obtained during electrical testing. In summary, the creation has many of the above-mentioned effects and practical values, and can effectively improve the overall economic benefits. Therefore, this creation is indeed an excellent creation, and there is no identical or similar product in the same technical field. The public use shall have met the requirements for the creation of a patent, and the application shall be made in accordance with the law, and the patent for this creation shall be given. φ [Simple description of the diagram] The first diagram is a three-dimensional appearance of the creation. • The second picture is a schematic cross-section of the creation. - The third picture is a schematic diagram of the state of use of this creation. The fourth figure is a schematic view of another embodiment of the combination of the concave portion and the projection. The fourth A picture is a partial enlarged schematic view of the combination of the concave portion and the convex portion of the present invention. The fifth figure is a schematic view of another embodiment of the present invention. The sixth figure is a schematic view of still another embodiment of the present invention. The seventh figure is a schematic diagram of still another embodiment of the present invention. 9 M321104 The eighth figure is a schematic diagram of still another embodiment of the present invention. The ninth figure is a schematic view of another embodiment of the present invention. The tenth figure is a schematic diagram of another embodiment of the present invention. 】 (1〇) pedestal v ( 1 1 ) accommodating groove (1 2 ) front fixing groove module (1 3 ) rear fixing groove module • (121) front fixing groove (1 2 2 ) convex block (1 3 1) Rear fixing groove (2 0) Blade probe (2 1 ) Positioning groove part (2 2 ) Front contact end (2 3 ) Concave fitting part ^ ( 2 4 ) Rear contact end (3 0 ) Fixing piece ' (4 0 ) panel ~ ( 4 1 ) electrode 10
Claims (1)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW96206952U TWM321104U (en) | 2007-05-01 | 2007-05-01 | Modular probe device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW96206952U TWM321104U (en) | 2007-05-01 | 2007-05-01 | Modular probe device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TWM321104U true TWM321104U (en) | 2007-10-21 |
Family
ID=39228228
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW96206952U TWM321104U (en) | 2007-05-01 | 2007-05-01 | Modular probe device |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TWM321104U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI461700B (en) * | 2012-08-06 | 2014-11-21 |
-
2007
- 2007-05-01 TW TW96206952U patent/TWM321104U/en not_active IP Right Cessation
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI461700B (en) * | 2012-08-06 | 2014-11-21 |
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| MK4K | Expiration of patent term of a granted utility model |