TWI461700B - - Google Patents
Info
- Publication number
- TWI461700B TWI461700B TW101128225A TW101128225A TWI461700B TW I461700 B TWI461700 B TW I461700B TW 101128225 A TW101128225 A TW 101128225A TW 101128225 A TW101128225 A TW 101128225A TW I461700 B TWI461700 B TW I461700B
- Authority
- TW
- Taiwan
Links
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW101128225A TW201407167A (en) | 2012-08-06 | 2012-08-06 | Blade type micro probe structure and manufacturing method thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW101128225A TW201407167A (en) | 2012-08-06 | 2012-08-06 | Blade type micro probe structure and manufacturing method thereof |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201407167A TW201407167A (en) | 2014-02-16 |
| TWI461700B true TWI461700B (en) | 2014-11-21 |
Family
ID=50550437
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW101128225A TW201407167A (en) | 2012-08-06 | 2012-08-06 | Blade type micro probe structure and manufacturing method thereof |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TW201407167A (en) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW584925B (en) * | 2001-08-20 | 2004-04-21 | Taiwan Semiconductor Mfg | Manufacturing method for micro-probe |
| TWM321104U (en) * | 2007-05-01 | 2007-10-21 | Premtek Int Inc | Modular probe device |
| US20090058441A1 (en) * | 2005-08-09 | 2009-03-05 | Kabushiki Kaisha Nihon Micronics | Electrical test probe |
| US7557593B2 (en) * | 2006-03-07 | 2009-07-07 | Kabushiki Kaisha Nihon Micronics | Probe for electrical test and probe assembly |
| TW201202710A (en) * | 2010-05-19 | 2012-01-16 | Gunsei Kimoto | Probe |
| WO2012099383A2 (en) * | 2011-01-21 | 2012-07-26 | Pro-2000 Co. Ltd. | Probe block |
-
2012
- 2012-08-06 TW TW101128225A patent/TW201407167A/en unknown
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW584925B (en) * | 2001-08-20 | 2004-04-21 | Taiwan Semiconductor Mfg | Manufacturing method for micro-probe |
| US20090058441A1 (en) * | 2005-08-09 | 2009-03-05 | Kabushiki Kaisha Nihon Micronics | Electrical test probe |
| US7557593B2 (en) * | 2006-03-07 | 2009-07-07 | Kabushiki Kaisha Nihon Micronics | Probe for electrical test and probe assembly |
| TWM321104U (en) * | 2007-05-01 | 2007-10-21 | Premtek Int Inc | Modular probe device |
| TW201202710A (en) * | 2010-05-19 | 2012-01-16 | Gunsei Kimoto | Probe |
| WO2012099383A2 (en) * | 2011-01-21 | 2012-07-26 | Pro-2000 Co. Ltd. | Probe block |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201407167A (en) | 2014-02-16 |