TWI912537B - Protective film forming film, composite sheet for forming protective film, method for manufacturing workpiece with protective film, and method for manufacturing workpiece with protective film. - Google Patents
Protective film forming film, composite sheet for forming protective film, method for manufacturing workpiece with protective film, and method for manufacturing workpiece with protective film.Info
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Abstract
本發明為一種保護膜形成膜(13)、具備保護膜形成膜(13)之保護膜形成用複合片、利用了保護膜形成膜(13)或保護膜形成用複合片之具保護膜之工件的製造方法、以及具保護膜之工件加工物的製造方法,此熱硬化性之保護膜形成膜(13)即使於表面形成有傷痕,仍可使得保護膜形成膜(13)經熱硬化後之保護膜之表面之傷痕變得不明顯。The present invention is a protective film forming film (13), a protective film forming composite sheet having a protective film forming film (13), a method for manufacturing a workpiece with a protective film using a protective film forming film (13) or a protective film forming composite sheet, and a method for manufacturing a workpiece with a protective film. Even if there are scratches on the surface of the thermosetting protective film forming film (13), the scratches on the surface of the protective film after thermosetting the protective film forming film (13) can still become inconspicuous.
Description
本發明係關於一種保護膜形成膜、保護膜形成用複合片、具保護膜之工件的製造方法、以及具保護膜之工件加工物的製造方法。 本申請案係基於2021年8月25日於日本提出申請之日本特願2021-137056號並主張優先權,將該申請案之內容援用於此。This invention relates to a protective film forming film, a composite sheet for forming a protective film, a method for manufacturing a workpiece having a protective film, and a method for manufacturing a processed workpiece having a protective film. This application is based on and claims priority to Japanese Patent Application No. 2021-137056 filed in Japan on August 25, 2021, the contents of which are incorporated herein by reference.
於半導體晶圓或絕緣體晶圓等晶圓中,有下述晶圓:於該晶圓的一面(電路面)形成有電路,進而於該面(電路面)上形成有凸塊等突狀電極。此種晶圓係藉由分割而成為晶片,藉由將該晶片之突狀電極連接於電路基板上之連接墊,而搭載於前述電路基板。 此種晶圓或晶片中,為了抑制龜裂之產生等破損,有時以保護膜來保護與電路面為相反側之面(內面)。In semiconductor wafers or insulator wafers, there are wafers in which a circuit is formed on one side (electrical surface), and bumps or other protruding electrodes are formed on that side (electrical surface). Such wafers are diced into chips, and the protruding electrodes of these chips are connected to bonding pads on a circuit substrate, thus mounting the wafers onto the aforementioned circuit substrate. In order to suppress damage such as cracking, a protective film is sometimes used to protect the side (inner surface) opposite to the electrical surface in such wafers or chips.
為了形成此種保護膜,於晶圓的內面貼附用以形成保護膜之保護膜形成膜。保護膜形成膜有時係積層於用以支撐該保護膜形成膜之支撐片上而以保護膜形成用複合片之狀態使用,亦有時係不積層於支撐片上而使用(參照專利文獻1)。繼而,於內面具備保護膜形成膜之晶圓(具保護膜形成膜之晶圓)係經由後續之各種步驟,而加工成於內面具備保護膜之晶片(具保護膜之晶片)。在這之間,具保護膜形成膜之晶圓必須輸送至進行後續步驟之場所、或保管之場所等目標場所。To form this protective film, a protective film forming film is attached to the inner surface of the wafer. Sometimes the protective film forming film is deposited on a support sheet to support it, and used as a protective film forming composite; other times it is used without being deposited on the support sheet (see Patent 1). Subsequently, the wafer with the protective film forming film on its inner surface (wafer with protective film forming film) is processed into a chip with a protective film on its inner surface (chip with protective film) through various subsequent steps. During this process, the wafer with the protective film forming film must be transported to a destination location, such as a location for subsequent steps or a storage location.
前述具保護膜之晶片例如可藉由下述方式製作:製作上述具保護膜形成膜之晶圓後,將晶圓加以分割而製作晶片,並切斷保護膜形成膜,藉此製作於內面具備切斷後之保護膜形成膜之晶片(具保護膜形成膜之晶片),於拾取具保護膜形成膜之晶片後,進而使切斷後之保護膜形成膜硬化來形成保護膜。亦可使切斷後之保護膜形成膜進行硬化,於形成具保護膜之晶片後,拾取具保護膜之晶片。The aforementioned wafer with a protective film can be manufactured, for example, by the following method: after manufacturing the wafer with the protective film, the wafer is diced to manufacture a wafer, and the protective film is cut off, thereby manufacturing a wafer (a wafer with a protective film) with the cut protective film on its inner surface. After picking up the wafer with the protective film, the cut protective film is then hardened to form the protective film. Alternatively, the cut protective film can be hardened, and after forming the wafer with the protective film, the wafer with the protective film is picked up.
而且,前述具保護膜之晶片例如亦可藉由下述方式製作:製作上述具保護膜形成膜之晶圓後,使其中之保護膜形成膜硬化而形成保護膜,繼而將晶圓加以分割而製作晶片,並切斷保護膜。 [先前技術文獻] [專利文獻]Furthermore, the aforementioned wafer with a protective film can also be manufactured, for example, by: fabricating the wafer with the protective film forming film, hardening the protective film forming film therein to form a protective film, then dicing the wafer to fabricate a wafer, and cutting off the protective film. [Prior Art Documents] [Patent Documents]
[專利文獻1]國際公開第2015/111632號。[Patent Document 1] International Publication No. 2015/111632.
[發明所欲解決之課題] 作為前述保護膜形成膜,可廣泛地利用熱硬化性之保護膜形成膜,該熱硬化性之保護膜形成膜係藉由加熱進行熱硬化而能夠形成保護膜。將熱硬化性之保護膜形成膜貼附於工件的內面時,從保護膜形成膜之與工件側為相反側介隔剝離膜或支撐片利用層壓輥等之按壓機構進行按壓。此時,例如若於剝離膜或支撐片與層壓輥之間混入粒子狀的異物,則有時有粒子狀的異物的按壓痕形成於保護膜形成膜的與工件側為相反側之表面。[Problem to be Solved by the Invention] As the aforementioned protective film forming film, thermosetting protective film forming films can be widely used. These thermosetting protective film forming films are formed by thermosetting through heating. When the thermosetting protective film forming film is attached to the inner surface of a workpiece, a release liner or support sheet is pressed from the side of the protective film forming film opposite to the workpiece side using a pressing mechanism such as a laminating roller. At this time, for example, if particulate foreign matter is mixed between the release liner or support sheet and the laminating roller, sometimes indentations of the particulate foreign matter are formed on the surface of the protective film forming film opposite to the workpiece side.
將具保護膜形成膜之晶圓作為一例,在輸送具保護膜形成膜之工件時,使保護膜形成膜的與工件側為相反側的露出面接觸於輸送機構,藉由前述輸送機構將前述具保護膜形成膜之工件以經固定之狀態進行輸送。 作為前述輸送機構,已知有例如於前述輸送機構之與具保護膜形成膜之工件之接觸部,藉由將具保護膜形成膜之工件加以吸附來進行固定之輸送機構,該情況為一例。 若利用此種輸送機構來輸送具保護膜形成膜之工件,有時於保護膜形成膜之輸送機構所為之固定處(更具體而言,於輸送機構中之固定部位的接觸處)形成輸送機構(前述固定部位)的接觸痕。例如當前述固定部位係平面形狀為圓形的吸附盤之情形時,有時圓形的吸附痕會形成於保護膜形成膜之露出面。Taking a wafer with a protective film as an example, when transporting a workpiece with a protective film, the exposed surface of the protective film, opposite to the workpiece side, contacts a transport mechanism, and the transport mechanism transports the workpiece in a fixed state. As such a transport mechanism, there is a known example where the workpiece is fixed by adsorbing it at the contact point between the transport mechanism and the workpiece. When using such a transport mechanism to transport a workpiece with a protective film, contact marks from the transport mechanism (specifically, at the contact point of the fixed portion within the transport mechanism) sometimes form at the fixing point of the protective film (the aforementioned fixing portion). For example, when the aforementioned fixed part is a circular adsorption plate, sometimes circular adsorption marks will form on the exposed surface of the protective film.
而且,若利用頂針銷等之頂起機構來拾取具保護膜形成膜之晶片,有時於保護膜形成膜之頂起機構所為之頂起處形成凹痕(針痕)。Furthermore, if a lifting mechanism such as a pin is used to pick up a wafer with a protective film forming film, sometimes a dent (pin mark) is formed at the lifting point made by the lifting mechanism of the protective film forming film.
之所以於保護膜形成膜之表面形成有按壓痕、接觸痕、吸附痕、凹痕等之傷痕,係因保護膜形成膜相對較柔軟。此種傷痕變得能夠明確地辨識之具保護膜形成膜之工件,不僅有外觀上的問題點,且有雷射印字性降低的疑慮。即使保護膜形成膜進行熱硬化而形成為保護膜後,傷痕仍變得能夠明確地辨識之具保護膜之工件,有外觀上的問題點以及雷射印字性降低的疑慮。另外,專利文獻1所揭示之保護膜形成膜並非必然可以解決此種問題點。The reason why scratches such as indentations, contact marks, adsorption marks, and dents form on the surface of the protective film is because the protective film is relatively soft. Workpieces with this type of scratch that are clearly identifiable not only have aesthetic problems but also raise concerns about reduced laser printing quality. Even after the protective film is thermo-cured to form a protective film, workpieces with the protective film where the scratches are still clearly identifiable have aesthetic problems and raise concerns about reduced laser printing quality. Furthermore, the protective film disclosed in Patent 1 does not necessarily solve these problems.
本發明的目的在於提供一種保護膜形成膜、具備前述保護膜形成膜之保護膜形成用複合片、利用了前述保護膜形成膜或保護膜形成用複合片之具保護膜之工件的製造方法、以及具保護膜之工件加工物的製造方法,即使熱硬化性之保護膜形成膜於表面形成有傷痕時,仍可使保護膜形成膜經熱硬化後之保護膜之表面之傷痕變得不明顯。 [用以解決課題之手段]The purpose of this invention is to provide a protective film forming film, a protective film forming composite sheet having the aforementioned protective film forming film, a method for manufacturing a workpiece with a protective film utilizing the aforementioned protective film forming film or protective film forming composite sheet, and a method for manufacturing a workpiece with a protective film, wherein even when the surface of the thermosetting protective film forming film has scratches, the scratches on the surface of the thermosetting protective film can still be made less noticeable. [Means for solving the problem]
本發明係包含以下的態樣。 [1]一種保護膜形成膜,具熱硬化性;於將前述保護膜形成膜之寬度4mm之試片取20mm之間隔以兩處加以保持,藉由拉伸模式一邊以頻率11Hz、升溫速度3℃/min、等速升溫之條件將前述試片自-50℃升溫至150℃為止,一邊測定前述試片之儲存彈性模數E’時,於90℃之前述試片之儲存彈性模數E’(90)為5MPa以下。 [2]如[1]所記載之保護膜形成膜,其中於將前述保護膜形成膜之寬度4mm之試片取20mm之間隔以兩處加以保持,藉由拉伸模式一邊以頻率11Hz、升溫速度3℃/min、等速升溫之條件將前述試片自-50℃升溫至150℃為止,一邊測定前述試片之tanδ時,於90℃之前述試片之tanδ(90)為0.34以上。The present invention includes the following aspects. [1] A protective film forming film with thermosetting properties; when a 4 mm wide sample of the aforementioned protective film forming film is held at two locations with a 20 mm interval, and the sample is heated from -50 °C to 150 °C in a stretching mode at a frequency of 11 Hz, a heating rate of 3 °C/min, and a constant heating rate, the storage elastic modulus E’ of the aforementioned sample is measured, and the storage elastic modulus E’(90) of the aforementioned sample is 5 MPa or less before 90 °C. [2] As described in [1], when a 4 mm wide sample of the aforementioned protective film is held at two locations with a 20 mm interval, and the sample is heated from -50 °C to 150 °C in a stretching mode at a frequency of 11 Hz, a heating rate of 3 °C/min, and a constant heating rate, the tanδ of the sample is measured. Before 90 °C, the tanδ(90) of the sample is 0.34 or higher.
[3]如[1]或[2]所記載之保護膜形成膜,其中於將前述保護膜形成膜經加熱硬化之熱硬化物之寬度5mm之試片取20mm之間隔以兩處加以保持,藉由拉伸模式一邊以頻率11Hz、升溫速度3℃/min、等速升溫之條件將前述試片自-60℃升溫至300℃為止,一邊測定前述試片之儲存彈性模數E’時,於23℃之前述試片之儲存彈性模數E’(23)為100MPa以上。 [4]如[1]至[3]中任一項所記載之保護膜形成膜,其中含有包含丙烯酸樹脂之聚合物成分(A);前述丙烯酸樹脂之玻璃轉移溫度未達10℃。 [5]如[1]至[4]中任一項所記載之保護膜形成膜,其中含有填充材(D);相對於前述保護膜形成膜之總質量,前述填充材(D)之含量之比率未達50質量%。[3] As described in [1] or [2], in which a 5 mm wide specimen of the thermocured product of the aforementioned protective film is taken and held at two locations with a 20 mm interval, and the specimen is heated from -60 °C to 300 °C in a stretching mode at a frequency of 11 Hz, a heating rate of 3 °C/min, and a constant heating rate, while the storage elastic modulus E’ of the aforementioned specimen is measured, the storage elastic modulus E’ (23) of the aforementioned specimen is 100 MPa or more before 23 °C. [4] As described in any of [1] to [3], the protective film contains a polymer component (A) comprising acrylic resin; the glass transition temperature of the aforementioned acrylic resin is less than 10 °C. [5] The protective film forming film described in any of [1] to [4] contains filler (D); the content of the filler (D) is less than 50% of the total mass of the protective film forming film.
[6]一種保護膜形成用複合片,係具備支撐片、及設置於前述支撐片的一面上之保護膜形成膜;前述保護膜形成膜係如[1]至[5]中任一項所記載之保護膜形成膜。[6] A composite sheet for forming a protective film has a support sheet and a protective film forming film disposed on one side of the support sheet; the protective film forming film is the protective film forming film described in any one of [1] to [5].
[7]一種具保護膜之工件的製造方法,前述具保護膜之工件係具備工件、及設置於前述工件中任一處之保護膜;前述製造方法係具有下述步驟:貼附步驟,係將如[1]至[5]中任一項所記載之保護膜形成膜、或如[6]所記載之保護膜形成用複合片中之保護膜形成膜貼附於前述工件的目標部位,藉此製作具備前述工件以及保護膜形成膜之具保護膜形成膜之工件;熱硬化步驟,於於前述貼附步驟後,使前述保護膜形成膜進行熱硬化,形成前述保護膜,藉此製作前述具保護膜之工件。 [8]一種具保護膜之工件加工物的製造方法,前述具保護膜之工件加工物係具備藉由將工件進行加工所獲得之工件加工物、及設置於前述工件加工物中任一處之保護膜;前述製造方法係具有下述步驟:貼附步驟,將如[1]至[5]中任一項所記載之保護膜形成膜、或如[6]所記載之保護膜形成用複合片中之保護膜形成膜貼附於前述工件的目標部位,藉此製作具備前述工件以及保護膜形成膜之具保護膜形成膜之工件;加工步驟,於前述貼附步驟後,將前述工件進行加工,藉此製作前述工件加工物;熱硬化步驟,於前述貼附步驟後,使前述保護膜形成膜進行熱硬化,藉此形成前述保護膜。 [發明功效][7] A method for manufacturing a workpiece with a protective film, wherein the workpiece with a protective film comprises a workpiece and a protective film disposed at any location of the workpiece; the manufacturing method comprises the following steps: an attachment step, wherein a protective film forming film as described in any of [1] to [5] or a protective film forming composite sheet as described in [6] is attached to a target portion of the workpiece, thereby producing a workpiece with a protective film forming film comprising the workpiece and the protective film forming film; a thermosetting step, wherein after the attachment step, the protective film forming film is thermoset to form the protective film, thereby producing the workpiece with the protective film. [8] A method for manufacturing a workpiece having a protective film, wherein the workpiece having a protective film comprises a workpiece obtained by processing a workpiece and a protective film disposed at any location on the workpiece; the manufacturing method comprises the following steps: an attachment step, wherein a protective film forming film as described in any of [1] to [5], or a protective film forming composite sheet as described in [6], is attached to a target area of the workpiece, thereby producing a workpiece having the workpiece and the protective film forming film; a processing step, wherein after the attachment step, the workpiece is processed to produce the workpiece; and a thermosetting step, wherein after the attachment step, the protective film forming film is thermoset to form the protective film. [Invention Benefits]
根據本發明,提供一種保護膜形成膜、具備前述保護膜形成膜之保護膜形成用複合片、利用了前述保護膜形成膜或保護膜形成用複合片之具保護膜之工件的製造方法、以及具保護膜之工件加工物的製造方法,即使熱硬化性之保護膜形成膜於表面形成有傷痕,仍可使保護膜形成膜經熱硬化之後之保護膜之表面之傷痕變得不明顯。According to the present invention, a protective film forming film, a protective film forming composite sheet having the aforementioned protective film forming film, a method for manufacturing a workpiece with a protective film utilizing the aforementioned protective film forming film or protective film forming composite sheet, and a method for manufacturing a workpiece with a protective film are provided. Even if the heat-curable protective film forming film has scratches on its surface, the scratches on the surface of the protective film after heat curing can still be made less noticeable.
◇保護膜形成膜 本發明之一實施形態之保護膜形成膜係熱硬化性之保護膜形成膜,於將前述保護膜形成膜之寬度4mm之試片取20mm之間隔以兩處加以保持,藉由拉伸模式一邊以頻率11Hz、升溫速度3℃/min、等速升溫之條件將前述試片自-50℃升溫至150℃為止,一邊測定前述試片之儲存彈性模數E’時,於90℃之前述試片之儲存彈性模數E’(90)為5MPa以下。 本實施形態之保護膜形成膜例如可如後述般,藉由與支撐片積層而構成保護膜形成用複合片。◇Protective Film Forming Membrane One embodiment of the present invention is a thermosetting protective film forming membrane. A 4mm wide sample of the aforementioned protective film forming membrane is held at two locations with a 20mm interval. While the sample is heated from -50℃ to 150℃ in a stretching mode at a frequency of 11Hz, a heating rate of 3℃/min, and a constant heating rate, the storage elastic modulus E’ of the sample is measured. At 90℃, the storage elastic modulus E’(90) of the sample is 5MPa or less. The protective film forming membrane of this embodiment can, for example, be laminated with a support sheet to form a composite sheet for forming a protective film, as described later.
藉由利用本實施形態之保護膜形成膜、或具備本實施形態之保護膜形成膜之保護膜形成用複合片,可製造由具備工件、及設置於前述工件中任一處之保護膜而成之具保護膜之工件。而且,可製造由具備工件加工物、及設置於前述工件加工物中任一處之保護膜而成之具保護膜之工件加工物。例如工件為晶圓之情形時,藉由利用前述保護膜形成膜或保護膜形成用複合片,可製造由具備晶片、及設置於前述晶片的內面之保護膜而成之具保護膜之晶片。By utilizing the protective film forming film of this embodiment, or a protective film forming composite sheet having the protective film forming film of this embodiment, a workpiece having a protective film can be manufactured, consisting of a workpiece and a protective film disposed at any location on the aforementioned workpiece. Furthermore, a workpiece processing object having a protective film can be manufactured, consisting of a workpiece processing object and a protective film disposed at any location on the aforementioned workpiece processing object. For example, when the workpiece is a wafer, by utilizing the aforementioned protective film forming film or protective film forming composite sheet, a wafer having a protective film can be manufactured, consisting of a wafer and a protective film disposed on the inner surface of the aforementioned wafer.
於本實施形態中,作為工件,例如可列舉半導體晶圓等晶圓、半導體裝置面板等。所謂半導體裝置面板,為半導體裝置之製造過程中所操作者,作為該半導體裝置面板之具體例,可列舉:利用一個或兩個以上之電子零件經密封樹脂密封之狀態的半導體裝置,將多個這些半導體裝置於圓形、矩形等形狀之區域內平面地配置而構成之半導體裝置面板。 於本說明書中,將對工件進行加工而成之物品稱為「工件加工物」。例如於工件為半導體晶圓之情形時,作為工件加工物,可列舉半導體晶片。In this embodiment, the workpiece can be exemplified by, for example, a semiconductor wafer or a semiconductor device panel. A semiconductor device panel is something manipulated during the manufacturing process of a semiconductor device. Specific examples of such a semiconductor device panel include: a semiconductor device panel constructed by planarly arranging multiple semiconductor devices within a circular, rectangular, or other shaped area, using one or more electronic components sealed with sealing resin. In this specification, the article formed by processing the workpiece is referred to as a "workpiece processed item." For example, when the workpiece is a semiconductor wafer, a semiconductor chip can be exemplified as a workpiece processed item.
於本說明書中,作為「晶圓」,可列舉:由矽、鍺、硒等之元素半導體或GaAs、GaP、InP、CdTe、ZnSe、SiC等之化合物半導體所構成之半導體晶圓;由藍寶石、玻璃、鈮酸鋰、鉭酸鋰等絕緣體所構成之絕緣體晶圓。 於這些晶圓的一面上形成有電路,於本說明書中,將如此形成有電路之側的晶圓之面稱為「電路面」。另外,將晶圓中的與電路面為相反側之面稱為「內面」。 晶圓係藉由切割等手段而經加工(分割)成為晶片。於本說明書中,與晶圓之情形同樣地,將形成有電路之側的晶片之面稱為「電路面」,將晶片中的與電路面為相反側之面稱為「內面」。 於晶圓的電路面及晶片的電路面,較佳為均設有凸塊、支柱等突狀電極。突狀電極較佳為由焊料所構成。In this specification, the term "wafer" can include: semiconductor wafers composed of elemental semiconductors such as silicon, germanium, and selenium, or compound semiconductors such as GaAs, GaP, InP, CdTe, ZnSe, and SiC; and insulating wafers composed of insulators such as sapphire, glass, lithium niobate, and lithium tantalum. Electrical circuits are formed on one side of these wafers; in this specification, the side of the wafer with the electrical circuits formed is called the "electrical surface." The side of the wafer opposite to the electrical surface is called the "inner surface." Wafers are processed (divided) into chips by means of dicing or other methods. In this specification, similar to the case of a wafer, the side of the chip where the circuit is formed is referred to as the "surface surface," and the side of the chip opposite to the surface surface is referred to as the "inner surface." Both the surface surfaces of the wafer and the surface surfaces of the chip are preferably provided with protruding electrodes such as bumps and pillars. These protruding electrodes are preferably made of solder.
進而,藉由利用前述具保護膜之晶片,而能夠製造基板裝置。 於本說明書中,所謂「基板裝置」,意指具保護膜之工件加工物於該工件加工物的電路面上的突狀電極中覆晶連接於電路基板上之連接墊而構成之基板裝置。例如若為利用半導體晶圓作為工件之情形時,則作為基板裝置可列舉具保護膜之半導體晶片覆晶連接而構成之半導體裝置。Furthermore, by utilizing the aforementioned chip with a protective film, a substrate device can be manufactured. In this specification, the term "substrate device" refers to a substrate device formed by flip-chip bonding of a workpiece with a protective film to a bonding pad on a circuit substrate in the protruding electrodes on the electrical surface of the workpiece. For example, if a semiconductor wafer is used as the workpiece, a semiconductor device formed by flip-chip bonding of a semiconductor chip with a protective film can be cited as an example of a substrate device.
本實施形態之保護膜形成膜係藉由於90℃之前述試片之儲存彈性模數E’(90)為5MPa以下,則即使利用本實施形態之保護膜形成膜來製造前述具保護膜之工件或前述具保護膜之工件加工物之步驟中,於熱硬化性之保護膜形成膜之表面形成有傷痕,仍可使保護膜形成膜經熱硬化後之保護膜之表面之傷痕變得不明顯。本實施形態之保護膜形成係藉由於90℃之前述試片之儲存彈性模數E’(90)為5MPa以下,則在使保護膜形成膜進行加熱硬化而作成保護膜時,在進行加熱硬化前之90℃,保護膜形成膜之流動性較常溫時更增大,可修復於保護膜形成膜之表面所產生之傷痕,亦即,可認為是由於本實施形態之保護膜形成膜之自我修復性優異,結果可使保護膜之表面的傷痕變得不明顯。於本說明書中,所謂「常溫」,意指不特別冷或特別熱之溫度、亦即平常之溫度,例如可列舉15℃至25℃之溫度等。The protective film forming film of this embodiment is formed by the fact that the storage elastic modulus E’(90) of the aforementioned test piece is less than 5MPa before 90°C. Therefore, even if there are scratches on the surface of the thermosetting protective film forming film during the process of manufacturing the aforementioned workpiece with a protective film or the aforementioned workpiece with a protective film using the protective film forming film of this embodiment, the scratches on the surface of the protective film after thermosetting can still become inconspicuous. The protective film formation of this embodiment is achieved by using a storage elastic modulus E’(90) of less than 5 MPa for the aforementioned test piece before 90°C. When the protective film is heat-cured to form a protective film, the fluidity of the protective film is greater at 90°C before heat curing than at room temperature. This can repair the damage on the surface of the protective film. In other words, it can be considered that due to the excellent self-healing properties of the protective film formed in this embodiment, the damage on the surface of the protective film becomes less noticeable. In this specification, "room temperature" means a temperature that is neither particularly cold nor particularly hot, that is, a normal temperature, such as temperatures from 15°C to 25°C.
本實施形態之保護膜形成膜於90℃之前述試片之儲存彈性模數E’(90)為5MPa以下,較佳為3MPa以下,更佳為2MPa以下,又更佳為0.4MPa以下,尤佳為0.2MPa以下。The protective film of this embodiment has a storage elastic modulus E’(90) of 5 MPa or less, preferably 3 MPa or less, more preferably 2 MPa or less, even more preferably 0.4 MPa or less, and even more preferably 0.2 MPa or less when the protective film is formed at 90°C.
本實施形態之保護膜形成膜具有熱硬化性,藉由熱硬化而作為保護膜發揮功能。藉由將常溫之保護膜形成膜加熱至100℃以上之溫度為止,繼而冷卻至達到常溫為止,而製成加熱、冷卻後之保護膜形成膜,於將加熱、冷卻後之保護膜形成膜之硬度與加熱前之保護膜形成膜之硬度於相同溫度進行比較時,加熱、冷卻後之保護膜形成膜更硬之情形時,該保護膜形成膜為熱硬化性。The protective film forming film of this embodiment is thermosetting, and performs its function as a protective film through thermosetting. The protective film forming film is produced by heating a room-temperature protective film forming film to a temperature above 100°C and then cooling it back to room temperature. When the hardness of the heated and cooled protective film forming film is compared with the hardness of the unheated protective film forming film at the same temperature, and the heated and cooled protective film forming film is harder, the protective film forming film is thermosetting.
本實施形態之保護膜形成膜較佳係具有於90℃不硬化,反而軟化之性質。亦即,於將前述保護膜形成膜之寬度4mm之試片取20mm之間隔以兩處加以保持,藉由拉伸模式一邊以頻率11Hz、升溫速度3℃/min、等速升溫之條件將前述試片自-50℃升溫至150℃為止,一邊測定前述試片之儲存彈性模數E’時,前述試片之儲存彈性模數E’(90)較佳係小於於70℃之前述試片之儲存彈性模數E’(70)。The protective film formed in this embodiment preferably has the property of not hardening at 90°C, but softening instead. That is, when the test piece with a width of 4 mm of the aforementioned protective film is held at two locations with a 20 mm interval, and the test piece is heated from -50°C to 150°C in a stretching mode at a frequency of 11 Hz, a heating rate of 3°C/min, and a constant heating rate, while the storage elastic modulus E’ of the aforementioned test piece is measured, the storage elastic modulus E’(90) of the aforementioned test piece is preferably less than the storage elastic modulus E’(70) of the aforementioned test piece at 70°C.
本實施形態之保護膜形成膜較佳係於70℃之前述試片之儲存彈性模數E’(70)為8MPa以下,更佳為3.5MPa以下,又更佳為3MPa以下,尤佳為2MPa以下。The protective film of this embodiment preferably has a storage elastic modulus E’(70) of 8 MPa or less before 70°C, more preferably 3.5 MPa or less, even more preferably 3 MPa or less, and most preferably 2 MPa or less.
本實施形態之保護膜形成膜係於將前述保護膜形成膜之寬度4mm之試片取20mm之間隔以兩處加以保持,藉由拉伸模式一邊以頻率11Hz、升溫速度3℃/min、等速升溫之條件將前述試片自-50℃升溫至150℃為止,一邊測定前述試片之tanδ時,於90℃之前述試片之tanδ(90)較佳為0.20以上,更佳為0.24以上,又更佳為0.34以上。藉由於90℃之前述試片之tanδ(90)之值為前述下限值以上,有保護膜形成膜之自我修復性優異之傾向。推測這是由於90℃之保護膜形成膜之黏性成分的貢獻變大。The protective film forming film of this embodiment is formed by holding two 4mm wide test pieces of the aforementioned protective film forming film at 20mm intervals. The test pieces are heated from -50℃ to 150℃ in a stretching mode at a frequency of 11Hz, a heating rate of 3℃/min, and a constant heating rate. While measuring the tanδ of the test pieces, the tanδ (90) of the test pieces before 90℃ is preferably 0.20 or higher, more preferably 0.24 or higher, and even more preferably 0.34 or higher. Because the tanδ (90) value of the test pieces before 90℃ is above the aforementioned lower limit, the protective film forming film tends to have excellent self-repairing properties. This is presumably due to the increased contribution of the viscous components of the protective film forming film at 90℃.
本實施形態之保護膜形成膜係於將前述保護膜形成膜之寬度4mm之試片取20mm之間隔以兩處加以保持,藉由拉伸模式一邊以頻率11Hz、升溫速度3℃/min、等速升溫之條件將前述試片自-50℃升溫至150℃為止,一邊測定前述試片之tanδ時,於70℃之前述試片之tanδ(70)較佳為0.35以上,更佳為0.40以上,又更佳為0.50以上。藉由於70℃之前述試片之tanδ(70)之值為前述下限值以上,有保護膜形成膜之自我修復性優異之傾向。推測這是由於70℃之保護膜形成膜之黏性成分的貢獻變大。The protective film forming membrane of this embodiment is formed by holding two 4mm wide test pieces of the aforementioned protective film forming membrane at 20mm intervals. The test pieces are heated from -50℃ to 150℃ in a stretching mode at a frequency of 11Hz, a heating rate of 3℃/min, and a constant heating rate. While measuring the tanδ of the test pieces, the tanδ (70) of the test pieces at 70℃ is preferably 0.35 or higher, more preferably 0.40 or higher, and even more preferably 0.50 or higher. Because the tanδ (70) value of the test pieces at 70℃ is above the aforementioned lower limit, the protective film forming membrane tends to have excellent self-repairing properties. This is presumably due to the increased contribution of the viscous components of the protective film forming membrane at 70℃.
將本實施形態之保護膜形成膜經加熱硬化之熱硬化物之寬度5mm之試片取20mm之間隔以兩處加以保持,藉由拉伸模式一邊以頻率11Hz、升溫速度3℃/min、等速升溫之條件將前述試片自-60℃升溫至300℃為止,一邊測定前述試片之儲存彈性模數E’時,於23℃之前述試片之儲存彈性模數E’(23)較佳為100MPa以上,更佳為200MPa以上,又更佳為300MPa以上。若熱硬化後之保護膜之儲存彈性模數E’(23)過低之情形時,於將具保護膜之晶片等之具保護膜之工件加工物包裝於載體帶並進行輸送之情形時,柔軟的保護膜碰撞載體帶的內壁,有產生傷痕或凹陷之虞。而且,於硬化後拾取具保護膜之晶片之步驟中,熱硬化後之保護膜之儲存彈性模數E’(23)較高者可減低拾取時的針痕。A 5mm wide specimen of the thermocured material formed by heating and curing the protective film of this embodiment was taken and held at two locations with a 20mm interval. The specimen was heated from -60℃ to 300℃ in a stretching mode at a frequency of 11Hz, a heating rate of 3℃/min and a constant heating rate. At the same time, the storage elastic modulus E’ of the specimen was measured. The storage elastic modulus E’ (23) of the specimen before 23℃ is preferably 100MPa or more, more preferably 200MPa or more, and even more preferably 300MPa or more. If the storage elastic modulus E’(23) of the heat-cured protective film is too low, when the workpiece with protective film, such as a wafer with protective film, is packaged on a carrier belt and transported, the soft protective film may collide with the inner wall of the carrier belt, causing scratches or dents. Moreover, in the step of picking up the wafer with protective film after curing, a higher storage elastic modulus E’(23) of the heat-cured protective film can reduce needle marks during picking.
保護膜形成膜可由一層(單層)所構成,亦可由兩層以上之多層所構成。保護膜形成膜由多層所構成之情形時,這些多層可彼此相同亦可不同,這些多層之組合並無特別限定。保護膜形成膜由儲存彈性模數E’的控制的容易性以及製造成本之方面來看較佳為由一層(單層)所構成。The protective film can be composed of a single layer or multiple layers. When the protective film is composed of multiple layers, these layers can be the same or different from each other, and there is no particular limitation on the combination of these layers. From the perspective of ease of control of the storage elastic modulus E' and manufacturing cost, the protective film is preferably composed of a single layer.
本說明書中,不限於保護膜形成膜之情形,所謂「多層可彼此相同亦可不同」,意指「可使所有層相同,亦可使所有層不同,亦可僅一部分層相同」,進而所謂「多層互不相同」,意指「各層之構成材料及厚度之至少一者互不相同」。In this manual, the term "multiple layers may be the same or different from each other" is not limited to the case of protective film formation. It means that "all layers may be the same, all layers may be different, or only some layers may be the same." Furthermore, the term "multiple layers are different from each other" means that "at least one of the constituent materials and thicknesses of each layer is different from each other."
保護膜形成膜之試片之儲存彈性模數E’之測定係可藉由將多片前述保護膜形成膜加以積層並切出而製作寬度4mm之積層物,將該積層物用作試片而進行測定。The storage elastic modulus E' of the protective film forming film specimen can be determined by laminating multiple of the aforementioned protective film forming films and cutting them out to produce a laminate with a width of 4 mm, and using the laminate as a specimen for measurement.
保護膜之試片之儲存彈性模數E’之測定係可藉由將多片前述保護膜形成膜加以積層並切出而製作寬度5mm之積層物,使該積層物進行加熱硬化而作成保護膜之積層物,然後將保護膜之積層物用作試片而進行測定。保護膜之儲存彈性模數E’之測定亦可藉由將多片前述保護膜形成膜加以積層並進行加熱硬化而作成保護膜並切出,製作寬度4mm之積層物,將該積層物用作試片而進行測定。The storage elastic modulus E' of the protective film specimen can be determined by laminating multiple sheets of the aforementioned protective film forming film and cutting them out to create a laminate with a width of 5 mm. This laminate is then heated and hardened to form a protective film laminate, which is then used as a specimen for measurement. Alternatively, the storage elastic modulus E' of the protective film can be determined by laminating multiple sheets of the aforementioned protective film forming film and heating and hardening them to create a protective film. This laminate is then cut out to create a laminate with a width of 4 mm, which is then used as a specimen for measurement.
更具體而言,將前述試片取20mm之間隔以兩處加以保持,於該狀態下一邊將試片以升溫速度3℃/min自-10℃等速升溫至170℃為止,一邊在頻率11Hz的條件下測定試片之儲存彈性模數E’。所謂將試片取20mm之間隔以兩處加以保持,意指試片之儲存彈性模數E’的測定對象部分之長度為20mm。More specifically, the aforementioned test piece was held at two locations with a 20mm interval. While holding the test piece at this location, the temperature was increased at a constant rate of 3℃/min from -10℃ to 170℃, and the storage elastic modulus E' of the test piece was measured at a frequency of 11Hz. The phrase "held at two locations with a 20mm interval" means that the length of the portion of the test piece used to measure the storage elastic modulus E' is 20mm.
前述試片之於前述兩處之保持例如可利用公知之夾具等保持機構來進行。The aforementioned test piece can be held at the aforementioned two locations using, for example, a known holding mechanism such as a clamp.
前述試片(積層物)之厚度係只要不妨礙前述試驗之實施,且不損及前述儲存彈性模數E’之測定精度,則並無特別限定。 通常,前述試片之厚度較佳為190μm至210μm,更佳為195μm至205μm,尤佳為200μm。The thickness of the aforementioned test piece (layer) is not particularly limited, as long as it does not hinder the implementation of the aforementioned test and does not impair the accuracy of the measurement of the aforementioned storage elastic modulus E’. Generally, the thickness of the aforementioned test piece is preferably 190 μm to 210 μm, more preferably 195 μm to 205 μm, and even more preferably 200 μm.
構成前述試片之保護膜形成膜之片數並無特別限定,可根據各保護膜形成膜之厚度而任意選擇。 例如藉由利用厚度為40μm之5片保護膜形成膜或保護膜,而可製作前述試片。然而,該情況為一例,所利用之保護膜形成膜或保護膜之片數與厚度並不限定於此。There is no particular limitation on the number of protective film sheets constituting the aforementioned test piece, and they can be arbitrarily selected according to the thickness of each protective film sheet. For example, the aforementioned test piece can be made by using 5 protective film sheets or protective films with a thickness of 40 μm. However, this is just one example, and the number and thickness of the protective film sheets or protective films used are not limited thereto.
前述試片之儲存彈性模數E’(90)以及儲存彈性模數E’(70)可藉由調節前述保護膜形成膜之含有成分之種類及其含量而調節。 例如,於保護膜形成膜含有後述之聚合物成分(A)之情形時,藉由調節聚合物成分(A)所具有之構成單元之種類及其量,而能夠更容易地調節試片之儲存彈性模數E’。更具體而言,例如藉由利用具有一定量以上之自丙烯酸2-乙基己酯所衍生之構成單元的丙烯酸樹脂作為聚合物成分(A),並調節該丙烯酸樹脂之含量,而能夠更容易地調節試片之儲存彈性模數E’。The storage elastic modulus E’(90) and storage elastic modulus E’(70) of the aforementioned test piece can be adjusted by adjusting the type and content of the components contained in the aforementioned protective film forming film. For example, when the protective film forming film contains the polymer component (A) described later, the storage elastic modulus E’ of the test piece can be adjusted more easily by adjusting the type and amount of the constituent units of the polymer component (A). More specifically, for example, by using an acrylic resin having a certain amount or more of constituent units derived from 2-ethylhexyl acrylate as the polymer component (A) and adjusting the content of the acrylic resin, the storage elastic modulus E’ of the test piece can be adjusted more easily.
聚合物成分(A)包含丙烯酸樹脂之情形時,藉由調節丙烯酸樹脂之玻璃轉移溫度,而能夠更容易調節試片之儲存彈性模數E’。丙烯酸樹脂之玻璃轉移溫度越低,有試片之儲存彈性模數E’(90)以及儲存彈性模數E’(70)變越小之傾向。 而且,例如保護膜形成膜含有後述之填充材(D)之情形時,藉由利用經表面修飾之球狀的填充材(D)來調節平均粒徑以及含量,而能夠更容易調節試片之儲存彈性模數E’(90)以及儲存彈性模數E’(70)。典型而言,填充材(D)之平均粒徑越大,有試片之儲存彈性模數E’(90)以及儲存彈性模數E’(70)變越小之傾向。When the polymer component (A) contains acrylic resin, the storage elastic modulus E’ of the sample can be more easily adjusted by adjusting the glass transition temperature of the acrylic resin. The lower the glass transition temperature of the acrylic resin, the smaller the storage elastic modulus E’(90) and storage elastic modulus E’(70) of the sample tend to be. Moreover, when the protective film forming film contains the filler (D) described later, the storage elastic modulus E’(90) and storage elastic modulus E’(70) of the sample can be more easily adjusted by using surface-modified spherical filler (D) to adjust the average particle size and content. Typically, the larger the average particle size of the filler (D), the smaller the storage elastic modulus E’(90) and storage elastic modulus E’(70) of the specimen tend to be.
保護膜形成膜之厚度較佳為未達50μm,更佳為未達45μm。The thickness of the protective film is preferably less than 50 μm, and more preferably less than 45 μm.
保護膜形成膜之厚度就能夠形成保護性能更高之保護膜之方面而言,較佳為10μm以上,更佳為15μm以上,例如亦可為20μm以上。In terms of the thickness of the protective film, which can form a protective film with higher protective performance, it is preferably 10μm or more, more preferably 15μm or more, and for example, it can also be 20μm or more.
保護膜形成膜之厚度可於將上述任一上限值與下限值任意組合而設定之範圍內適當調節。例如,於一實施形態中,保護膜形成膜之厚度亦可為5μm以上至未達50μm、以及5μm以上至未達45μm之任一者。The thickness of the protective film can be appropriately adjusted within a range set by arbitrarily combining any of the above-mentioned upper and lower limits. For example, in one embodiment, the thickness of the protective film can be either 5 μm or more but less than 50 μm, or 5 μm or more but less than 45 μm.
於本說明書中,所謂「保護膜形成膜之厚度」,意指保護膜形成膜總體之厚度,例如所謂由多層所構成之保護膜形成膜之厚度,意指構成保護膜形成膜之所有層之合計厚度。In this specification, the term "thickness of the protective film" refers to the overall thickness of the protective film. For example, the term "thickness of a protective film composed of multiple layers" refers to the total thickness of all the layers that make up the protective film.
於本說明書中,不限於保護膜形成膜之情形,所謂「厚度」,只要無特別說明,則為於對象物中隨機選出之5處測定的厚度之平均所表示之值,可依據JIS(Japanese Industrial Standards;日本工業標準)K7130利用定壓厚度測定器獲取。In this manual, not limited to the case of protective film formation, the term "thickness" unless otherwise specified is the average value of the thickness measured at 5 randomly selected locations on the object, which can be obtained using a constant pressure thickness gauge according to JIS (Japanese Industrial Standards) K7130.
於本實施形態中,藉由將前述保護膜形成膜進行加熱所獲得之熱硬化物,較佳係作為保護膜而發揮功能。In this embodiment, the thermocured material obtained by heating the aforementioned protective film is preferably used as a protective film.
將前述保護膜形成膜貼附於晶圓的目標部位並進行熱硬化而形成保護膜時之硬化條件,只要保護膜成為充分發揮功能之程度之硬化度,則並無特別限定,只要根據保護膜形成膜之種類而適當選擇即可。When the aforementioned protective film is attached to the target area of the wafer and thermally cured to form the protective film, there are no particular limitations on the curing conditions, as long as the protective film is cured to the extent that it can fully perform its function. It can be appropriately selected according to the type of protective film.
例如保護膜形成膜之熱硬化時之加熱溫度較佳為100℃至180℃,更佳為110℃至160℃,尤佳為120℃至140℃。另外,前述熱硬化時之加熱時間較佳為0.5h至5h,更佳為0.5h至4h,尤佳為1h至3h。For example, the heating temperature for the thermosetting of the protective film is preferably 100°C to 180°C, more preferably 110°C to 160°C, and even more preferably 120°C to 140°C. In addition, the heating time for the aforementioned thermosetting is preferably 0.5h to 5h, more preferably 0.5h to 4h, and even more preferably 1h to 3h.
[保護膜形成用組成物] 前述保護膜形成膜可利用含有該保護膜形成膜之構成材料的保護膜形成用組成物(更具體而言為熱硬化性保護膜形成用組成物)來形成。例如,保護膜形成膜可藉由於該保護膜形成膜之形成對象面塗敷保護膜形成用組成物,根據需要加以乾燥來形成。[Composition for forming a protective film] The aforementioned protective film forming film can be formed using a composition for forming a protective film (more specifically, a thermosetting composition for forming a protective film) containing the constituent material of the protective film forming film. For example, the protective film forming film can be formed by applying the composition for forming a protective film to the object surface of the protective film forming film and drying it as needed.
前述保護膜形成膜亦可除了熱硬化性以外,還具有能量線硬化性。The aforementioned protective film can also have energy line curing properties in addition to thermocuring properties.
於本說明書中,所謂「能量線」,意指電磁波或帶電粒子束中具有能量量子者,作為能量線之例,可列舉紫外線、放射線、電子束等。紫外線例如可藉由利用高壓水銀燈、熔合燈(fusion lamp)、氙氣燈、黑光或LED(Light Emitting Diode,發光二極體)燈等作為紫外線源而照射。關於電子束,可照射藉由電子束加速器等而產生者。 於本說明書中,所謂「能量線硬化性」,意指藉由照射能量線而硬化之性質,所謂「非能量線硬化性」,意指即便照射能量線亦不硬化之性質。In this manual, the term "energy line" refers to electromagnetic waves or beams of charged particles containing energy quanta. Examples of energy lines include ultraviolet rays, radiation, and electron beams. Ultraviolet rays can be emitted by irradiating objects using high-pressure mercury lamps, fusion lamps, xenon lamps, black light, or LED (Light Emitting Diode) lamps. Electron beams can be emitted by irradiating objects produced by electron beam accelerators. In this manual, "energy line hardening property" refers to the property of hardening by irradiation of energy lines, while "non-energy line hardening property" refers to the property of not hardening even when irradiated with energy lines.
於保護膜形成膜中,相對於保護膜形成膜之總質量,保護膜形成膜之一種或兩種以上之後述之含有成分之合計含量之比率不超過100質量%。 同樣地,於保護膜形成用組成物中,相對於保護膜形成用組成物之總質量,保護膜形成用組成物之一種或兩種以上之後述之含有成分之合計含量之比率不超過100質量%。In the protective film forming film, the percentage of the total content of one or more of the following ingredients in the protective film forming film does not exceed 100% by mass relative to the total mass of the protective film forming film. Similarly, in the protective film forming composition, the percentage of the total content of one or more of the following ingredients in the protective film forming composition does not exceed 100% by mass relative to the total mass of the protective film forming composition.
保護膜形成用組成物之塗敷只要藉由公知之方法進行即可,例如可列舉:利用氣刀塗佈機、刮刀塗佈機、棒式塗佈機、凹版塗佈機、輥式塗佈機、輥刀式塗佈機、簾幕式塗佈機、模頭塗佈機、刀式塗佈機、網版塗佈機、繞線棒(Meyer bar)式塗佈機、輕觸式塗佈機等各種塗佈機之方法。The coating of the protective film forming component can be carried out by known methods, such as: using air knife coating machine, doctor blade coating machine, rod coating machine, gravure coating machine, roller coating machine, roller blade coating machine, curtain coating machine, die coating machine, knife coating machine, screen coating machine, Meyer bar coating machine, touch coating machine, and other coating machine methods.
保護膜形成用組成物之乾燥條件並無特別限定。其中,於保護膜形成用組成物含有後述之溶媒之情形時,較佳為加熱乾燥。另外,含有溶媒之保護膜形成用組成物例如較佳為以70℃至130℃且10秒鐘至5分鐘之條件進行加熱乾燥。然而,保護膜形成用組成物為熱硬化性,故而較佳為以該組成物自身、及由該組成物所形成之熱硬化性之保護膜形成膜不發生熱硬化之方式加熱乾燥。There are no particular limitations on the drying conditions of the protective film forming composition. However, when the protective film forming composition contains the solvent described later, heat drying is preferred. Furthermore, the protective film forming composition containing the solvent is preferably heat-dried at 70°C to 130°C for 10 seconds to 5 minutes. However, since the protective film forming composition is thermosetting, it is preferable to heat-dry it in a manner that neither the composition itself nor the thermosetting protective film formed by the composition undergoes thermosetting.
作為較佳之保護膜形成膜,例如可列舉:含有聚合物成分(A)、熱硬化性成分(B)及填充材(D)之保護膜形成膜。聚合物成分(A)係被視為聚合性化合物進行聚合反應而形成之成分。熱硬化性成分(B)係以熱作為反應之觸發而能夠進行硬化(聚合)反應之成分。再者,於本說明書中,聚合反應中亦包含縮聚反應。 以下,對保護膜形成用組成物之組成加以詳細說明。As a preferred protective film forming film, an example is a protective film forming film containing a polymer component (A), a thermosetting component (B), and a filler (D). The polymer component (A) is a component that is considered to be formed by the polymerization reaction of a polymeric compound. The thermosetting component (B) is a component that can undergo a curing (polymerization) reaction triggered by heat. Furthermore, in this specification, the polymerization reaction also includes a condensation reaction. The composition of the protective film forming component will be explained in detail below.
[保護膜形成用組成物(III)] 作為較佳之保護膜形成用組成物,例如可列舉:含有前述聚合物成分(A)、熱硬化性成分(B)及填充材(D)之保護膜形成用組成物(III)(於本說明書中,有時簡稱為「組成物(III)」)等。[Composition for forming protective film (III)] As a preferred composition for forming protective film, examples include: composition (III) for forming protective film containing the aforementioned polymer component (A), thermosetting component (B) and filler (D) (sometimes referred to as "composition (III)" in this specification).
[聚合物成分(A)] 聚合物成分(A)為用以對保護膜形成膜賦予造膜性或可撓性等之聚合物化合物。再者,於本說明書中,聚合物化合物中亦包含縮聚反應之產物。[Polymer Component (A)] Polymer component (A) is a polymer compound used to impart film-forming properties or flexibility to the protective film. Furthermore, in this specification, the polymer compound also includes products of the condensation reaction.
組成物(III)以及保護膜形成膜所含有之聚合物成分(A)可僅為一種,亦可為兩種以上,於為兩種以上之情形時,這些聚合物成分(A)之組合及比率可任意地選擇。The polymer component (A) contained in the composition (III) and the protective film forming film may be only one type or two or more types. In the case of two or more types, the combination and ratio of these polymer components (A) may be arbitrarily selected.
作為聚合物成分(A),例如可列舉:丙烯酸樹脂、胺基甲酸酯樹脂、苯氧樹脂、聚矽氧樹脂、飽和聚酯樹脂等,較佳為丙烯酸樹脂。As a polymer component (A), examples include: acrylic resin, amino formaldehyde resin, phenoxy resin, polysiloxane resin, saturated polyester resin, etc., with acrylic resin being preferred.
作為聚合物成分(A)中之前述丙烯酸樹脂,可列舉公知之丙烯酸聚合物。 丙烯酸樹脂之重量平均分子量(Mw)較佳為10000至2000000,更佳為100000至1500000,進而佳為200000至1200000,尤佳為300000至1000000。 藉由丙烯酸樹脂之重量平均分子量為前述下限值以上,而更容易賦予造膜性。藉由丙烯酸樹脂之重量平均分子量為前述上限值以下,而更容易減小前述儲存彈性模數E’(90)以及前述儲存彈性模數E’(70)。As the aforementioned acrylic resin in polymer component (A), known acrylic polymers can be listed. The weight-average molecular weight (Mw) of the acrylic resin is preferably from 10,000 to 2,000,000, more preferably from 100,000 to 1,500,000, further preferably from 200,000 to 1,200,000, and even more preferably from 300,000 to 1,000,000. By having a weight-average molecular weight of the acrylic resin above the aforementioned lower limit, it is easier to impart film-forming properties. By having a weight-average molecular weight of the acrylic resin below the aforementioned upper limit, it is easier to reduce the aforementioned storage elastic modulus E’(90) and the aforementioned storage elastic modulus E’(70).
於本說明書中,所謂「重量平均分子量」,只要無特別說明,則為藉由凝膠滲透層析(GPC)法所測定之聚苯乙烯換算值。In this manual, the term "weight average molecular weight" refers to the polystyrene equivalent determined by gel osmosis chromatography (GPC) unless otherwise specified.
丙烯酸樹脂之玻璃轉移溫度(Tg)較佳為-80℃以上至未達10℃,更佳為-70℃以上至5℃以下,又更佳為-60℃以上至0℃以下,尤佳為-60℃以上至-5℃以下。藉由丙烯酸樹脂之Tg為前述下限值以上,而例如抑制保護膜形成膜之熱硬化物與支撐片之密接性,支撐片之剝離性適度提高。藉由丙烯酸樹脂之Tg為前述上限值以下,而更容易減小前述儲存彈性模數E’(90)以及前述儲存彈性模數E’(70)。The glass transition temperature (Tg) of the acrylic resin is preferably above -80°C to below 10°C, more preferably above -70°C to below 5°C, even more preferably above -60°C to below 0°C, and particularly preferably above -60°C to below -5°C. By having the Tg of the acrylic resin above the aforementioned lower limit, the adhesion between the thermosetting material of the protective film and the support sheet is inhibited, for example, and the peelability of the support sheet is appropriately improved. By having the Tg of the acrylic resin below the aforementioned upper limit, it is easier to reduce the aforementioned storage elastic modulus E’(90) and the aforementioned storage elastic modulus E’(70).
丙烯酸樹脂具有m種(m為2以上之整數)構成單元,於對衍生出這些構成單元之m種單體分別依序分配1至m中任一個不重複之編號而命名為「單體m」之情形時,丙烯酸樹脂之玻璃轉移溫度(Tg)可利用以下所示之Fox公式而算出。Acrylic resin has m types of constituent units (m is an integer greater than 2). When the m types of monomers from which these constituent units are derived are assigned a unique number from 1 to m and named "monomer m", the glass transition temperature (Tg) of the acrylic resin can be calculated using the Fox formula shown below.
(式中,Tg為丙烯酸樹脂之玻璃轉移溫度;m為2以上之整數;Tgk為單體m之均聚物之玻璃轉移溫度;Wk為丙烯酸樹脂中的自單體m衍生之構成單元m之質量分率,其中,Wk滿足下述式)。 (In the formula, Tg is the glass transition temperature of acrylic resin; m is an integer greater than or equal to 2; Tgk is the glass transition temperature of the homopolymer of monomer m; Wk is the mass fraction of the constituent unit m derived from monomer m in acrylic resin, wherein Wk satisfies the following formula).
(式中,m及Wk與前述相同)。 (In the formula, m and Wk are the same as those mentioned above).
作為前述Tgk,可使用高分子資料手冊、黏著手冊或聚合物手冊(Polymer Handbook)等所記載之值。例如,丙烯酸甲酯之均聚物之Tgk為10℃,甲基丙烯酸甲酯之均聚物之Tgk為105℃,丙烯酸2-羥乙酯之均聚物之Tgk為-15℃,甲基丙烯酸縮水甘油酯之均聚物之Tgk為41℃,丙烯酸2-乙基己酯之均聚物之Tgk為-70℃,丙烯酸之均聚物之Tgk為103℃,丙烯腈之均聚物之Tgk為97℃,丙烯酸正丁酯之均聚物之Tgk為-54℃,甲基丙烯酸2-乙基己酯之均聚物之Tgk為-10℃,丙烯酸乙酯之均聚物之Tgk為-24℃。The aforementioned Tg k can be the value recorded in polymer data manuals, adhesive manuals, or polymer handbooks. For example, the Tg k of methyl acrylate homopolymer is 10°C, the Tg k of methyl methacrylate homopolymer is 105°C, the Tg k of 2-hydroxyethyl acrylate homopolymer is -15°C, the Tg k of glycidyl methacrylate homopolymer is 41°C, the Tg k of 2-ethylhexyl acrylate homopolymer is -70°C, the Tg k of acrylic acid homopolymer is 103°C, the Tg k of acrylonitrile homopolymer is 97°C, the Tg k of n-butyl acrylate homopolymer is -54°C, the Tg k of 2-ethylhexyl methacrylate homopolymer is -10°C, and the Tg k of ethyl acrylate homopolymer is -24°C.
作為丙烯酸樹脂,例如可列舉:一種或兩種以上之(甲基)丙烯酸酯之聚合物;選自前述(甲基)丙烯酸酯、(甲基)丙烯酸、伊康酸、乙酸乙烯酯、丙烯腈、苯乙烯及N-羥甲基丙烯醯胺等中的兩種以上之單體之共聚物等。構成丙烯酸樹脂之單體為兩種以上之情形時,這些單體之組合及比率可任意地選擇。Examples of acrylic resins include: polymers of one or more (meth)acrylates; copolymers of two or more monomers selected from the aforementioned (meth)acrylates, (meth)acrylic acid, itaconic acid, vinyl acetate, acrylonitrile, styrene, and N-hydroxymethylacrylamide. When the acrylic resin consists of two or more monomers, the combination and ratio of these monomers can be arbitrarily selected.
作為構成丙烯酸樹脂之前述(甲基)丙烯酸酯,例如可列舉:(甲基)丙烯酸甲酯、(甲基)丙烯酸乙酯、(甲基)丙烯酸正丙酯、(甲基)丙烯酸異丙酯、(甲基)丙烯酸正丁酯、(甲基)丙烯酸異丁酯、(甲基)丙烯酸第二丁酯、(甲基)丙烯酸第三丁酯、(甲基)丙烯酸戊酯、(甲基)丙烯酸己酯、(甲基)丙烯酸庚酯、(甲基)丙烯酸2-乙基己酯、(甲基)丙烯酸異辛酯、(甲基)丙烯酸正辛酯、(甲基)丙烯酸正壬酯、(甲基)丙烯酸異壬酯、(甲基)丙烯酸癸酯、(甲基)丙烯酸十一烷基酯、(甲基)丙烯酸十二烷基酯((甲基)丙烯酸月桂酯)、(甲基)丙烯酸十三烷基酯、(甲基)丙烯酸十四烷基酯((甲基)丙烯酸肉豆蔻酯)、(甲基)丙烯酸十五烷基酯、(甲基)丙烯酸十六烷基酯((甲基)丙烯酸棕櫚酯)、(甲基)丙烯酸十七烷基酯、(甲基)丙烯酸十八烷基酯((甲基)丙烯酸硬脂酯)等構成烷基酯之烷基為碳數1至18之鏈狀結構的(甲基)丙烯酸烷基酯;(甲基)丙烯酸異冰片酯、(甲基)丙烯酸二環戊酯等(甲基)丙烯酸環烷基酯;(甲基)丙烯酸苄酯等(甲基)丙烯酸芳烷基酯;(甲基)丙烯酸二環戊烯酯等(甲基)丙烯酸環烯基酯;(甲基)丙烯酸二環戊烯氧基乙酯等(甲基)丙烯酸環烯氧基烷基酯;(甲基)丙烯酸醯亞胺;(甲基)丙烯酸縮水甘油酯等含縮水甘油基之(甲基)丙烯酸酯;(甲基)丙烯酸羥甲酯、(甲基)丙烯酸2-羥乙酯、(甲基)丙烯酸2-羥丙酯、(甲基)丙烯酸3-羥丙酯、(甲基)丙烯酸2-羥丁酯、(甲基)丙烯酸3-羥丁酯、(甲基)丙烯酸4-羥丁酯等含羥基之(甲基)丙烯酸酯;(甲基)丙烯酸N-甲胺基乙酯等含經取代之胺基之(甲基)丙烯酸酯等。此處,所謂「經取代之胺基」,意指具有胺基之一個或兩個氫原子經氫原子以外之基取代的結構之基。As constituents of acrylic resins, the aforementioned (meth)acrylates include, for example: methyl (meth)acrylate, ethyl (meth)acrylate, n-propyl (meth)acrylate, isopropyl (meth)acrylate, n-butyl (meth)acrylate, isobutyl (meth)acrylate, dibutyl (meth)acrylate, terbutyl (meth)acrylate, pentyl (meth)acrylate, hexyl (meth)acrylate, heptyl (meth)acrylate, 2-ethylhexyl (meth)acrylate, isooctyl (meth)acrylate, and so on. (Meth)octyl acrylate, (Meth)nonyl acrylate, (Meth)isononyl acrylate, (Meth)decyl acrylate, (Meth)undecyl acrylate, (Meth)dodecyl acrylate ((Meth)lauryl acrylate), (Meth)tridecyl acrylate, (Meth)tetradecyl acrylate ((Meth)myristyl acrylate), (Meth)pentadecanyl acrylate, (Meth)hexadecyl acrylate ((Meth)palmitoyl acrylate), (Meth)heptadecyl acrylate, (Meth)oct ... Alkyl methacrylates, such as octadecyl acrylate ((meth)acrylate stearate), etc., in which the alkyl group has a chain structure with 1 to 18 carbon atoms; cycloalkyl methacrylates, such as isobornyl methacrylate and dicyclopentyl methacrylate; aralkyl methacrylates, such as benzyl methacrylate; cycloalkenyl methacrylates, such as dicyclopentenyl methacrylate; cycloalkenyl methacrylates, such as dicyclopentenoxyethyl methacrylate; cycloalkenoxyalkyl methacrylates, such as dicyclopentenoxyethyl methacrylate; Acrylimide; glycidyl acrylate and other (meth)acrylates containing glycidyl groups; hydroxymethyl methacrylate, 2-hydroxyethyl methacrylate, 2-hydroxypropyl methacrylate, 3-hydroxypropyl methacrylate, 2-hydroxybutyl methacrylate, 3-hydroxybutyl methacrylate, 4-hydroxybutyl methacrylate and other (meth)acrylates containing hydroxyl groups; N-methylaminoethyl methacrylate and other (meth)acrylates containing substituted amino groups. Here, "substituted amino group" refers to a structural group having one or two hydrogen atoms of an amino group substituted with a group other than a hydrogen atom.
於本說明書中,所謂「(甲基)丙烯酸」,為包含「丙烯酸」及「甲基丙烯酸」兩者之概念。關於與(甲基)丙烯酸類似之用語亦同樣,例如所謂「(甲基)丙烯醯基」,為包含「丙烯醯基」及「甲基丙烯醯基」兩者之概念,所謂「(甲基)丙烯酸酯」,為包含「丙烯酸酯」及「甲基丙烯酸酯」兩者之概念。In this specification, the term "(meth)acrylic acid" includes both "acrylic acid" and "methacrylic acid". Similarly, similar terms include "(meth)acrylic acid", which includes both "acrylic" and "methacrylic", and "(meth)acrylate", which includes both "acrylate" and "methacrylate".
丙烯酸樹脂亦可具有乙烯基、(甲基)丙烯醯基、胺基、羥基、羧基、異氰酸酯基等能夠與其他化合物鍵結之官能基。丙烯酸樹脂之前述官能基可經由後述之交聯劑(F)來與其他化合物鍵結,亦可不經由交聯劑(F)而與其他化合物直接鍵結。Acrylic resins may also possess functional groups such as vinyl, (meth)acrylic, amino, hydroxyl, carboxyl, and isocyanate groups, which can bond with other compounds. The aforementioned functional groups of acrylic resins can bond with other compounds through the crosslinking agent (F) described later, or they can bond directly with other compounds without the crosslinking agent (F).
作為較佳之丙烯酸樹脂之一例,可列舉:具有自丙烯酸2-乙基己酯所衍生之構成單元之丙烯酸樹脂(α)。As an example of a better acrylic resin, one can be listed: acrylic resin (α) having a constituent unit derived from 2-ethylhexyl acrylate.
於前述丙烯酸樹脂(α)中,相對於構成丙烯酸樹脂(α)之構成單元之總量,自前述丙烯酸2-乙基己酯所衍生之構成單元之比率(含量)較佳為10質量%至90質量%,例如可為25質量%至85質量%、40質量%至80質量%、以及50質量%至75質量%的任一者。In the aforementioned acrylic resin (α), the ratio (content) of the constituent units derived from the aforementioned 2-ethylhexyl acrylate relative to the total amount of the constituent units constituting the acrylic resin (α) is preferably 10% by mass to 90% by mass, for example, it can be any one of 25% by mass to 85% by mass, 40% by mass to 80% by mass, and 50% by mass to 75% by mass.
於本發明中,作為聚合物成分(A),可不利用丙烯酸樹脂而單獨利用丙烯酸樹脂以外之熱塑化性樹脂(以下,有時簡稱為「熱塑化性樹脂」),亦可與丙烯酸樹脂併用。藉由利用前述熱塑化性樹脂,有時保護膜自支撐片之剝離性提高,或保護膜形成膜容易追隨被黏附體之凹凸面。In this invention, the polymer component (A) may be a thermoplastic resin other than acrylic resin (hereinafter, sometimes simply referred to as "thermoplastic resin"), or it may be used in combination with acrylic resin. By using the aforementioned thermoplastic resin, the peelability of the protective film from the self-supporting sheet is sometimes improved, or the protective film forms a film that easily follows the uneven surface of the adhered object.
前述熱塑化性樹脂之重量平均分子量較佳為1000至100000,更佳為3000至80000。The weight-average molecular weight of the aforementioned thermoplastic resin is preferably between 1,000 and 100,000, and more preferably between 3,000 and 80,000.
前述熱塑化性樹脂之玻璃轉移溫度(Tg)較佳為-30℃至150℃,更佳為-20℃至120℃。The glass transition temperature (Tg) of the aforementioned thermoplastic resin is preferably -30°C to 150°C, and more preferably -20°C to 120°C.
作為前述熱塑化性樹脂,例如可列舉:聚酯、聚胺基甲酸酯、苯氧樹脂、聚丁烯、聚丁二烯、聚苯乙烯等。Examples of the aforementioned thermoplastic resins include: polyester, polyurethane, phenoxy resin, polybutene, polybutadiene, polystyrene, etc.
組成物(III)及保護膜形成膜所含有之前述熱塑化性樹脂可僅為一種,亦可為兩種以上,於為兩種以上之情形時,這些熱塑化性樹脂之組合及比率可任意地選擇。The thermoplastic resin contained in component (III) and the protective film forming film may be only one type or two or more types. In the case of two or more types, the combination and ratio of these thermoplastic resins may be arbitrarily selected.
於組成物(III)中,不受聚合物成分(A)之種類的影響,相對於溶媒以外之所有成分之總含量,聚合物成分(A)之含量之比率較佳為10質量%至85質量%,更佳為15質量%至70質量%,例如可為15質量%至45質量%及15質量%至35質量%的任一個,亦可為20質量%至70質量%及25質量%至70質量%的任一個。 此內容係與下述情況為相同含意:保護膜形成膜中,不受聚合物成分(A)之種類的影響,相對於保護膜形成膜之總質量,聚合物成分(A)之含量之比率較佳為10質量%至85質量%,更佳為15質量%至70質量%,例如可為15質量%至45質量%及15質量%至35質量%的任一個,亦可為20質量%至70質量%及25質量%至70質量%的任一個。 這一情況係基於:於自含有溶媒之樹脂組成物去除溶媒而形成樹脂膜之過程中,溶媒以外之成分之量通常不變化;於樹脂組成物與樹脂膜中,溶媒以外之成分彼此之含量之比率相同。因此,於本說明書中,以下不限於保護膜形成膜之情形,關於溶媒以外之成分之含量,僅記載自樹脂組成物去除溶媒之樹脂膜中之含量。In composition (III), regardless of the type of polymer component (A), the content of polymer component (A) relative to the total content of all components other than the solvent is preferably from 10% to 85% by mass, more preferably from 15% to 70% by mass, for example, it can be any one of 15% to 45% by mass and 15% to 35% by mass, or any one of 20% to 70% by mass and 25% to 70% by mass. This content has the same meaning as the following: In the protective film forming membrane, regardless of the type of polymer component (A), the content ratio of polymer component (A) relative to the total mass of the protective film forming membrane is preferably 10% to 85% by mass, more preferably 15% to 70% by mass, for example, any one of 15% to 45% by mass and 15% to 35% by mass, or any one of 20% to 70% by mass and 25% to 70% by mass. This is based on the fact that: in the process of removing the solvent from the resin composition containing the solvent to form a resin film, the amount of components other than the solvent usually does not change; and in the resin composition and the resin film, the content ratio of components other than the solvent is the same. Therefore, in this specification, the following is not limited to the case of protective film formation. The content of components other than solvent is only recorded in the resin film after the solvent has been removed from the resin composition.
聚合物成分(A)有時亦相當於熱硬化性成分(B)。於本發明中,於組成物(III)含有此種相當於聚合物成分(A)及熱硬化性成分(B)兩者之成分之情形時,視為組成物(III)含有聚合物成分(A)及熱硬化性成分(B)。Polymer component (A) is sometimes equivalent to thermosetting component (B). In this invention, when composition (III) contains such a component that is equivalent to both polymer component (A) and thermosetting component (B), composition (III) is deemed to contain both polymer component (A) and thermosetting component (B).
[熱硬化性成分(B)] 熱硬化性成分(B)為用以使保護膜形成膜硬化之成分。 組成物(III)及保護膜形成膜所含有之熱硬化性成分(B)可僅為一種,亦可為兩種以上,於為兩種以上之情形時,這些熱硬化性成分(B)之組合及比率可任意地選擇。[Thermosetting Component (B)] Thermosetting component (B) is a component used to harden the protective film forming membrane. The thermosetting component (B) contained in composition (III) and the protective film forming membrane may be only one type or two or more types. In the case of two or more types, the combination and ratio of these thermosetting components (B) can be arbitrarily selected.
作為熱硬化性成分(B),例如可列舉環氧系熱硬化性樹脂、熱硬化性聚醯亞胺樹脂、不飽和聚酯樹脂等,較佳為環氧系熱硬化性樹脂。 於本說明書中,所謂熱硬化性聚醯亞胺樹脂,為藉由熱硬化而形成聚醯亞胺樹脂之聚醯亞胺前驅物、與熱硬化性聚醯亞胺之總稱。Examples of thermosetting components (B) include epoxy thermosetting resins, thermosetting polyimide resins, and unsaturated polyester resins, with epoxy thermosetting resins being preferred. In this specification, the term "thermosetting polyimide resin" refers to both the polyimide precursors that form polyimide resins through thermosetting and the thermosetting polyimides themselves.
[環氧系熱硬化性樹脂] 環氧系熱硬化性樹脂係由環氧樹脂(B1)及熱硬化劑(B2)所構成。 組成物(III)及保護膜形成膜所含有之環氧系熱硬化性樹脂可僅為一種,亦可為兩種以上,於為兩種以上之情形時,這些環氧系熱硬化性樹脂之組合及比率可任意地選擇。[Epoxy Thermosetting Resin] The epoxy thermosetting resin is composed of epoxy resin (B1) and thermosetting agent (B2). The epoxy thermosetting resin contained in component (III) and the protective film forming film may be only one type or two or more types. In the case of two or more types, the combination and ratio of these epoxy thermosetting resins can be arbitrarily selected.
・環氧樹脂(B1) 作為環氧樹脂(B1),可列舉公知之環氧樹脂,例如可列舉:多官能系環氧樹脂、聯苯化合物、雙酚A二縮水甘油醚及其氫化物、鄰甲酚酚醛清漆環氧樹脂、二環戊二烯型環氧樹脂、聯苯型環氧樹脂、雙酚A型環氧樹脂、雙酚F型環氧樹脂、伸苯基骨架型環氧樹脂等二官能以上之環氧化合物。• Epoxy resins (B1) As epoxy resins (B1), known epoxy resins can be listed, such as: multifunctional epoxy resins, biphenyl compounds, bisphenol A diglycidyl ether and its hydrogenates, o-cresol phenolic varnish epoxy resins, dicyclopentadiene type epoxy resins, biphenyl type epoxy resins, bisphenol A type epoxy resins, bisphenol F type epoxy resins, phenyl skeleton type epoxy resins, and other epoxy compounds with more than two functions.
作為環氧樹脂(B1),亦可利用具有不飽和烴基之環氧樹脂。As an epoxy resin (B1), epoxy resins with unsaturated hydrocarbon groups can also be used.
環氧樹脂(B1)之數量平均分子量並無特別限定,就保護膜形成膜之硬化性、以及保護膜之強度及耐熱性之方面而言,較佳為300至30000,更佳為300至10000,尤佳為300至3000。 環氧樹脂(B1)之環氧當量較佳為100g/eq至1000g/eq,更佳為150g/eq至950g/eq。The number-average molecular weight of the epoxy resin (B1) is not particularly limited, but in terms of the curability of the protective film, as well as the strength and heat resistance of the protective film, it is preferably 300 to 30,000, more preferably 300 to 10,000, and even more preferably 300 to 3,000. The epoxy equivalent of the epoxy resin (B1) is preferably 100 g/eq to 1,000 g/eq, more preferably 150 g/eq to 950 g/eq.
環氧樹脂(B1)可單獨利用一種,亦可併用兩種以上,於併用兩種以上之情形時,這些環氧樹脂(B1)之組合及比率可任意地選擇。Epoxy resin (B1) can be used alone or in combination with two or more. When two or more are used together, the combination and ratio of these epoxy resins (B1) can be arbitrarily selected.
・熱硬化劑(B2) 熱硬化劑(B2)作為對環氧樹脂(B1)之硬化劑發揮功能。 作為熱硬化劑(B2),例如可列舉於一分子中具有兩個以上之能夠與環氧基反應之官能基的化合物。作為前述官能基,例如可列舉酚性羥基、醇性羥基、胺基、羧基、酸基經酐化而成之基等,較佳為酚性羥基、胺基、或酸基經酐化而成之基,更佳為酚性羥基或胺基。• Thermosetting Agent (B2) Thermosetting agent (B2) functions as a curing agent for epoxy resin (B1). Examples of thermosetting agents (B2) include compounds having two or more functional groups capable of reacting with epoxy groups in a single molecule. Examples of the aforementioned functional groups include phenolic hydroxyl groups, alcoholic hydroxyl groups, amino groups, carboxyl groups, and groups formed by anhydride conversion of acid groups. Phenolic hydroxyl groups, amino groups, or groups formed by anhydride conversion of acid groups are preferred, and phenolic hydroxyl groups or amino groups are even more preferred.
熱硬化劑(B2)中,作為具有酚性羥基之酚系硬化劑,例如可列舉:多官能酚樹脂、聯苯酚、酚醛清漆型酚樹脂、二環戊二烯型酚樹脂、芳烷基型酚樹脂等。 熱硬化劑(B2)中,作為具有胺基之胺系硬化劑,例如可列舉二氰二胺等。Among thermosetting agents (B2), phenolic curing agents containing phenolic hydroxyl groups include, for example, polyfunctional phenolic resins, biphenol, phenolic varnish-type phenolic resins, dicyclopentadiene-type phenolic resins, and aralkyl-type phenolic resins. Among thermosetting agents (B2), amine curing agents containing amino groups include, for example, dicyandiamine.
熱硬化劑(B2)亦可具有不飽和烴基。Thermosetting agents (B2) may also have unsaturated hydrocarbon groups.
於利用酚系硬化劑作為熱硬化劑(B2)之情形時,就保護膜自支撐片之剝離性提高之方面而言,熱硬化劑(B2)較佳為軟化點或玻璃轉移溫度高。When using a phenolic curing agent as a thermosetting agent (B2), the thermosetting agent (B2) is preferably one with a high softening point or glass transition temperature, in terms of improving the peelability of the protective film's self-supporting sheet.
熱硬化劑(B2)中,例如多官能酚樹脂、酚醛清漆型酚樹脂、二環戊二烯型酚樹脂、芳烷基型酚樹脂等樹脂成分之數量平均分子量較佳為300至30000,更佳為400至10000,尤佳為500至3000。 熱硬化劑(B2)中,例如聯苯酚、二氰二胺等非樹脂成分之分子量並無特別限定,例如較佳為60至500。In the thermosetting agent (B2), the average molecular weight of resin components such as polyfunctional phenolic resins, phenolic varnish-type phenolic resins, dicyclopentadiene-type phenolic resins, and aralkyl-type phenolic resins is preferably 300 to 30,000, more preferably 400 to 10,000, and even more preferably 500 to 3,000. The molecular weight of non-resin components in the thermosetting agent (B2), such as biphenol and dicyandiamine, is not particularly limited, but is preferably 60 to 500.
熱硬化劑(B2)可單獨利用一種,亦可併用兩種以上,於併用兩種以上之情形時,這些熱硬化劑(B2)之組合及比率可任意地選擇。The thermosetting agent (B2) can be used alone or in combination with two or more. When two or more are used together, the combination and ratio of these thermosetting agents (B2) can be arbitrarily selected.
於保護膜形成膜中,相對於環氧樹脂(B1)之含量100質量份,熱硬化劑(B2)之含量較佳為0.1質量份至100質量份,更佳為0.5質量份至50質量份,例如亦可為0.5質量份至25質量份、0.5質量份至10質量份及0.5質量份至5質量份的任一個。藉由熱硬化劑(B2)之前述含量為前述下限值以上,而更容易進行保護膜形成膜之硬化。藉由熱硬化劑(B2)之前述含量為前述上限值以下,而降低保護膜形成膜之吸濕率,利用保護膜形成膜所得之封裝體之可靠性進一步提高。In the protective film forming film, the content of thermosetting agent (B2) is preferably 0.1 to 100 parts by mass relative to 100 parts by mass of epoxy resin (B1), more preferably 0.5 to 50 parts by mass, and for example, any one of 0.5 to 25 parts by mass, 0.5 to 10 parts by mass, and 0.5 to 5 parts by mass. By having the aforementioned content of thermosetting agent (B2) at or above the aforementioned lower limit, the curing of the protective film forming film is easier. By having the aforementioned content of thermosetting agent (B2) at or below the aforementioned upper limit, the moisture absorption rate of the protective film forming film is reduced, further improving the reliability of the encapsulation obtained using the protective film forming film.
於保護膜形成膜中,相對於聚合物成分(A)以及熱硬化性成分(B)之總含量100質量份,熱硬化性成分(B)之含量(例如環氧樹脂(B1)以及熱硬化劑(B2)之總含量)較佳為10質量份至100質量份,更佳為20質量份至70質量份,又更佳為25質量份至55質量份,尤佳為30質量份至45質量份。藉由熱硬化性成分(B)之前述含量為前述下限值以上,而例如更容易增大熱硬化後之保護膜之儲存彈性模數E’(23)。藉由熱硬化性成分(B)之前述含量為前述上限值以下,而例如更容易減小前述儲存彈性模數E’(90)。In the protective film forming film, relative to the total content of polymer component (A) and thermosetting component (B) of 100 parts by mass, the content of thermosetting component (B) (e.g., the total content of epoxy resin (B1) and thermosetting agent (B2)) is preferably 10 to 100 parts by mass, more preferably 20 to 70 parts by mass, even more preferably 25 to 55 parts by mass, and particularly preferably 30 to 45 parts by mass. By having the aforementioned content of thermosetting component (B) above the aforementioned lower limit, it is easier, for example, to increase the storage elastic modulus E’ (23) of the thermosetting protective film. By having the aforementioned content of thermosetting component (B) below the aforementioned upper limit, it is easier, for example, to decrease the aforementioned storage elastic modulus E’ (90).
[填充材(D)] 組成物(III)及保護膜形成膜較佳為含有填充材(D)。藉由保護膜形成膜含有填充材(D),而能夠更容易地調節前述試片之儲存彈性模數E’。更具體而言,藉由調節保護膜形成膜所含有之填充材(D)之平均粒徑、及保護膜形成膜之填充材(D)之含量,而能夠更容易地調節前述試片之儲存彈性模數E’。而且,藉由保護膜形成膜含有填充材(D),保護膜形成膜及保護膜之熱膨脹係數之調整變容易,藉由相對於保護膜之形成對象物使該熱膨脹係數最適化,利用保護膜形成膜所得的具保護膜之晶片之可靠性進一步提高。而且,藉由保護膜形成膜含有填充材(D),亦能夠降低保護膜之吸濕率,或提高散熱性。[Fill (D)] Composition (III) and the protective film forming film preferably contain filler (D). By containing filler (D) in the protective film forming film, the storage elastic modulus E' of the aforementioned test piece can be adjusted more easily. More specifically, by adjusting the average particle size of the filler (D) contained in the protective film forming film and the content of the filler (D) in the protective film forming film, the storage elastic modulus E' of the aforementioned test piece can be adjusted more easily. Moreover, by containing filler (D) in the protective film forming film, the adjustment of the coefficient of thermal expansion of the protective film forming film and the protective film becomes easier, and by optimizing the coefficient of thermal expansion relative to the forming object of the protective film, the reliability of the wafer with the protective film obtained by using the protective film forming film is further improved. Furthermore, by using a protective film containing filler (D), the moisture absorption rate of the protective film can be reduced, or its heat dissipation can be improved.
填充材(D)可為有機填充材及無機填充材的任一種,較佳為無機填充材。 作為較佳之無機填充材,例如可列舉:二氧化矽、氧化鋁、滑石、碳酸鈣、鈦白、鐵丹、碳化矽、氮化硼等之粉末;將這些無機填充材球形化而得之珠粒;這些無機填充材之表面改質品;這些無機填充材之單晶纖維;玻璃纖維等。 這些之中,無機填充材較佳為二氧化矽或氧化鋁,更佳為二氧化矽。The filler (D) can be either organic or inorganic, preferably inorganic. Examples of preferred inorganic fillers include: powders of silicon dioxide, alumina, talc, calcium carbonate, titanium dioxide, iron oxide, silicon carbide, boron nitride, etc.; beads obtained by spheroidizing these inorganic fillers; surface-modified products of these inorganic fillers; single-crystal fibers of these inorganic fillers; glass fibers, etc. Among these, the inorganic filler is preferably silicon dioxide or alumina, more preferably silicon dioxide.
就保護膜形成用組成物中的填充材(D)對除填充材(D)以外之成分的分散性提高之方面而言,前述二氧化矽較佳為經有機基進行了表面修飾之二氧化矽,更佳為經乙烯基、環氧基、苯基或甲基丙烯酸基進行了表面修飾之二氧化矽,尤佳為經乙烯基或環氧基進行了表面修飾之二氧化矽。Regarding the improvement of the dispersibility of the filler (D) in the composition for forming the protective film on components other than the filler (D), the aforementioned silica is preferably silica with an organic surface modification, more preferably silica with a vinyl, epoxy, phenyl or methacrylate surface modification, and even more preferably silica with a vinyl or epoxy surface modification.
就保護膜形成用組成物中的填充材(D)對除填充材(D)以外之成分的分散性提高之方面而言,填充材(D)之平均粒徑較佳為0.05μm至2μm,更佳為0.2μm至0.9μm,尤佳為0.4μm至0.7μm。藉由填充材(D)之平均粒徑為前述下限值以上,而有能更減小前述儲存彈性模數E’(90)以及儲存彈性模數E’(70)之傾向。Regarding the improvement of the dispersibility of the filler (D) in the composition for forming the protective film to components other than the filler (D), the average particle size of the filler (D) is preferably 0.05 μm to 2 μm, more preferably 0.2 μm to 0.9 μm, and even more preferably 0.4 μm to 0.7 μm. By having the average particle size of the filler (D) at or above the aforementioned lower limit, there is a tendency to further reduce the aforementioned storage elastic modulus E’(90) and storage elastic modulus E’(70).
於本說明書中,所謂「平均粒徑」只要無特別說明,則意指藉由雷射繞射散射法所求出之粒度分佈曲線中的累計值50%時之粒徑(D50)之值。In this manual, unless otherwise specified, "average particle size" refers to the particle size ( D50 ) at 50% of the cumulative value in the particle size distribution curve obtained by laser diffraction.
組成物(III)以及保護膜形成膜所含有之填充材(D)可僅為一種,亦可為兩種以上,於為兩種以上之情形時,這些填充材(D)之組合及比率可任意地選擇。The filler (D) contained in the composition (III) and the protective film forming film may be one or more types. In the case of two or more types, the combination and ratio of these fillers (D) can be arbitrarily selected.
於利用填充材(D)之情形時,於保護膜形成膜中,相對於保護膜形成膜之總質量,填充材(D)之含量之比率較佳為30質量%以上至70質量%以下,例如可為35質量%以上至70質量%以下、35質量%以上至65質量%以下、以及35質量%以上至59質量%以下的任一者,亦可為35質量%以上至未達50質量%。藉由前述比率為此種範圍,變得更容易將上述的前述儲存彈性模數E’(90)、前述儲存彈性模數E’(70)、以及熱硬化後之保護膜之儲存彈性模數E’(23)調節為上述的範圍。於保護膜形成膜中,相對於保護膜形成膜之總質量,填充材(D)之含量之比率較佳為40質量%以上至70質量%以下,例如可為45質量%以上至70質量%以下、45質量%以上至65質量%以下、以及45質量%以上至59質量%以下的任一者,亦可為45質量%以上至未達50質量%。When using filler (D), the content of filler (D) in the protective film forming film is preferably 30% to 70% by mass relative to the total mass of the protective film forming film. For example, it can be any one of 35% to 70% by mass, 35% to 65% by mass, and 35% to 59% by mass, or 35% to less than 50% by mass. By using the above-mentioned ratio within this range, it becomes easier to adjust the above-mentioned storage elastic modulus E’ (90), the above-mentioned storage elastic modulus E’ (70), and the storage elastic modulus E’ (23) of the thermosetting protective film to the above-mentioned range. In the protective film forming film, the content of filler (D) relative to the total mass of the protective film forming film is preferably 40% to 70% by mass, for example, it can be any one of 45% to 70% by mass, 45% to 65% by mass, and 45% to 59% by mass, or it can be 45% to less than 50% by mass.
[硬化促進劑(C)] 組成物(III)及保護膜形成膜亦可含有硬化促進劑(C)。硬化促進劑(C)係用以調整組成物(III)之硬化速度的成分。 作為較佳之硬化促進劑(C),例如可列舉:三乙二胺、苄基二甲胺、三乙醇胺、二甲胺基乙醇、三(二甲胺基甲基)苯酚等三級胺;2-甲基咪唑、2-苯基咪唑、2-苯基-4-甲基咪唑、2-苯基-4,5-二羥甲基咪唑、2-苯基-4-甲基-5-羥甲基咪唑等咪唑類(一個以上之氫原子經氫原子以外之基取代的咪唑);三丁基膦、二苯基膦、三苯基膦等有機膦類(一個以上之氫原子經有機基取代的膦);四苯基鏻四苯基硼酸鹽、三苯基膦四苯基硼酸鹽等四苯基硼鹽等。[Curving Accelerator (C)] The component (III) and the protective film forming film may also contain a curing accelerator (C). The curing accelerator (C) is a component used to adjust the curing rate of the component (III). Examples of preferred hardening accelerators (C) include: tertiary amines such as triethylenediamine, benzyldimethylamine, triethanolamine, dimethylaminoethanol, and tris(dimethylaminomethyl)phenol; imidazoles (imidazoles in which one or more hydrogen atoms are substituted with groups other than hydrogen atoms) such as 2-methylimidazole, 2-phenylimidazole, 2-phenyl-4-methylimidazole, 2-phenyl-4,5-dihydroxymethylimidazole, and 2-phenyl-4-methyl-5-hydroxymethylimidazole; organophosphines (phosphines in which one or more hydrogen atoms are substituted with organic groups) such as tributylphosphine, diphenylphosphine, and triphenylphosphine; and tetraphenylborates such as tetraphenylphosphonium tetraphenylborate and triphenylphosphine tetraphenylborate.
組成物(III)以及保護膜形成膜所含有之硬化促進劑(C)可僅為一種,亦可為兩種以上,於為兩種以上之情形時,這些硬化促進劑(C)之組合及比率可任意地選擇。The curing accelerator (C) contained in the composition (III) and the protective film forming film may be one or more. In the case of two or more, the combination and ratio of these curing accelerators (C) may be arbitrarily selected.
於利用硬化促進劑(C)之情形時,於保護膜形成膜中,相對於熱硬化性成分(B)之含量100質量份,硬化促進劑(C)之含量較佳為0.01質量份至10質量份,更佳為0.1質量份至7質量份。藉由硬化促進劑(C)之前述含量為前述下限值以上,而更顯著地獲得由利用硬化促進劑(C)所得之功效,更容易增大熱硬化後之保護膜之儲存彈性模數E’(23)。藉由硬化促進劑(C)之含量為前述上限值以下,例如抑制高極性之硬化促進劑(C)於高溫、高濕度條件下於保護膜形成膜中移動至與被黏附體之接著界面側而偏析之功效變高。結果,利用保護膜形成膜所得之具保護膜之晶片之可靠性進一步提高。When using a curing accelerator (C), in the protective film forming film, the content of the curing accelerator (C) is preferably 0.01 to 10 parts by mass relative to 100 parts by mass of the thermosetting component (B), and more preferably 0.1 to 7 parts by mass. By having the content of the curing accelerator (C) above the aforementioned lower limit, the effects obtained by using the curing accelerator (C) are more significantly obtained, and the storage elastic modulus E’(23) of the thermosetting protective film is more easily increased. By having the content of the curing accelerator (C) below the aforementioned upper limit, for example, the effect of inhibiting the highly polar curing accelerator (C) from migrating to the interface with the adherend in the protective film forming film under high temperature and high humidity conditions and segregating therein is improved. As a result, the reliability of the wafer with protective film obtained by forming a protective film is further improved.
[偶合劑(E)] 組成物(III)及保護膜形成膜亦可含有偶合劑(E)。藉由利用具有可與無機化合物或有機化合物反應之官能基者作為偶合劑(E),而能夠提高由保護膜形成膜所形成之保護膜對被黏附體之接著性。而且,藉由利用偶合劑(E),可於前述保護膜不損及耐熱性之前提下提高耐水性。[Coupling Agent (E)] Composition (III) and the protective film forming film may also contain a coupling agent (E). By using a coupling agent (E) having functional groups that can react with inorganic or organic compounds, the adhesion of the protective film formed by the protective film forming film to the substrate can be improved. Moreover, by using a coupling agent (E), the water resistance can be improved without compromising the aforementioned heat resistance of the protective film.
偶合劑(E)較佳為具有能夠與聚合物成分(A)、熱硬化性成分(B)等所具有之官能基反應的官能基之化合物,更佳為矽烷偶合劑。The coupling agent (E) is preferably a compound having a functional group that can react with the functional groups of the polymer component (A), the thermosetting component (B), etc., and is more preferably a silane coupling agent.
作為較佳之前述矽烷偶合劑,例如可列舉:3-縮水甘油氧基丙基三甲氧基矽烷、3-縮水甘油氧基丙基甲基二乙氧基矽烷、3-縮水甘油氧基丙基三乙氧基矽烷、3-縮水甘油氧基甲基二乙氧基矽烷、2-(3,4-環氧環己基)乙基三甲氧基矽烷、3-甲基丙烯醯氧基丙基三甲氧基矽烷、3-胺基丙基三甲氧基矽烷、3-(2-胺基乙基胺基)丙基三甲氧基矽烷、3-(2-胺基乙基胺基)丙基甲基二乙氧基矽烷、3-(苯基胺基)丙基三甲氧基矽烷、3-苯胺基丙基三甲氧基矽烷、3-脲基丙基三乙氧基矽烷、3-巰基丙基三甲氧基矽烷、3-巰基丙基甲基二甲氧基矽烷、雙(3-三乙氧基矽基丙基)四硫化物、甲基三甲氧基矽烷、甲基三乙氧基矽烷、乙烯基三甲氧基矽烷、乙烯基三乙醯氧基矽烷、咪唑矽烷等。Preferred silane coupling agents include, for example: 3-glycidoxypropyltrimethoxysilane, 3-glycidoxypropylmethyldiethoxysilane, 3-glycidoxypropyltriethoxysilane, 3-glycidoxymethyldiethoxysilane, 2-(3,4-epoxycyclohexyl)ethyltrimethoxysilane, 3-methacryloxypropyltrimethoxysilane, 3-aminopropyltrimethoxysilane, and 3-(2-aminoethylamino)propyltrimethoxysilane. Silane, 3-(2-aminoethylamino)propylmethyldiethoxysilane, 3-(phenylamino)propyltrimethoxysilane, 3-anilinepropyltrimethoxysilane, 3-ureopropyltriethoxysilane, 3-caprylylpropyltrimethoxysilane, 3-caprylylpropylmethyldimethoxysilane, bis(3-triethoxysilylpropyl)tetrasulfide, methyltrimethoxysilane, methyltriethoxysilane, vinyltrimethoxysilane, vinyltriethoxysilane, imidazolylsilane, etc.
作為較佳之前述矽烷偶合劑,亦可列舉於一分子中具有多個烷氧基矽基之寡聚物型矽烷偶合劑。 前述寡聚物型矽烷偶合劑不易揮發,且於一分子中具有多個烷氧基矽基,故而於有效提高耐久性之方面而言較佳。 作為前述寡聚物型矽烷偶合劑,例如可列舉:作為含環氧基之寡聚物型矽烷偶合劑之「X-41-1053」、「X-41-1059A」、「X-41-1056」及「X-40-2651」(均為信越化學公司製造);作為含巰基之寡聚物型矽烷偶合劑之「X-41-1818」、「X-41-1810」及「X-41-1805」(均為信越化學公司製造)等。As a preferred alternative to the aforementioned silane coupling agents, oligomeric silane coupling agents having multiple alkoxysilane groups per molecule can also be listed. These oligomeric silane coupling agents are less volatile and have multiple alkoxysilane groups per molecule, thus they are superior in terms of effectively improving durability. Examples of the aforementioned oligomeric silane coupling agents include: "X-41-1053", "X-41-1059A", "X-41-1056" and "X-40-2651" (all manufactured by Shin-Etsu Chemical Co., Ltd.) which are epoxy-containing oligomeric silane coupling agents; and "X-41-1818", "X-41-1810" and "X-41-1805" (all manufactured by Shin-Etsu Chemical Co., Ltd.) which are guanidine-containing oligomeric silane coupling agents.
組成物(III)以及保護膜形成膜所含有之偶合劑(E)可僅為一種,亦可為兩種以上,於為兩種以上之情形時,這些偶合劑(E)之組合及比率可任意地選擇。The coupling agent (E) contained in the composition (III) and the protective film forming film may be only one or more. In the case of two or more, the combination and ratio of these coupling agents (E) may be arbitrarily selected.
於利用偶合劑(E)之情形時,於保護膜形成膜中,相對於聚合物成分(A)及熱硬化性成分(B)之總含量100質量份,偶合劑(E)之含量較佳為0.03質量份至10質量份,更佳為0.05質量份至5質量份,尤佳為0.1質量份至2質量份。藉由偶合劑(E)之前述含量為前述下限值以上,而更顯著地獲得填充材(D)於樹脂之分散性提高、或保護膜形成膜與被黏附體之接著性提高等由利用偶合劑(E)所得之功效。藉由偶合劑(E)之前述含量為前述上限值以下,而進一步抑制逸氣之產生。When using a coupling agent (E), in the protective film forming film, relative to 100 parts by mass of the total content of polymer component (A) and thermosetting component (B), the content of coupling agent (E) is preferably 0.03 to 10 parts by mass, more preferably 0.05 to 5 parts by mass, and even more preferably 0.1 to 2 parts by mass. By having the aforementioned content of coupling agent (E) at or above the aforementioned lower limit, the effects obtained by using coupling agent (E), such as improved dispersibility of filler (D) in resin or improved adhesion between the protective film forming film and the substrate, are more significantly obtained. By having the aforementioned content of coupling agent (E) at or below the aforementioned upper limit, the generation of gas escape is further suppressed.
[交聯劑(F)] 於利用上述丙烯酸樹脂等具有能夠與其他化合物鍵結之乙烯基、(甲基)丙烯醯基、胺基、羥基、羧基、異氰酸酯基等官能基之成分作為聚合物成分(A)之情形時,組成物(III)及保護膜形成膜亦可含有交聯劑(F)。交聯劑(F)為用以使聚合物成分(A)中之前述官能基與其他化合物鍵結而交聯之成分,藉由如此交聯,而能夠調節保護膜形成膜之黏著力及凝聚力。[Crosslinking Agent (F)] When using the above-mentioned acrylic resin or other components having functional groups such as vinyl, (meth)acrylic, amino, hydroxyl, carboxyl, and isocyanate groups that can bond with other compounds as polymer component (A), the composition (III) and the protective film forming film may also contain a crosslinking agent (F). The crosslinking agent (F) is a component used to crosslink the aforementioned functional groups in polymer component (A) with other compounds, thereby regulating the adhesion and cohesion of the protective film forming film.
作為交聯劑(F),例如可列舉:有機多元異氰酸酯化合物、有機多元亞胺化合物、金屬螯合系交聯劑(具有金屬螯合結構之交聯劑)、氮丙啶系交聯劑(具有氮丙啶基之交聯劑)等。Examples of crosslinking agents (F) include: organic polyisocyanate compounds, organic polyimine compounds, metal chelate crosslinking agents (crosslinking agents with metal chelate structures), aziridine crosslinking agents (crosslinking agents with aziridine groups), etc.
組成物(III)以及保護膜形成膜所含有之交聯劑(F)可僅為一種,亦可為兩種以上,於為兩種以上之情形時,這些交聯劑(F)之組合及比率可任意地選擇。The crosslinking agent (F) contained in the component (III) and the protective film forming film may be only one type or two or more types. In the case of two or more types, the combination and ratio of these crosslinking agents (F) may be arbitrarily selected.
就減小前述儲存彈性模數E’(90)以及前述儲存彈性模數E’(70)之方面而言,較佳為組成物(III)不含交聯劑(F),或者於組成物(III)中,相對於聚合物成分(A)之含量100質量份,交聯劑(F)之含量為例如未達0.01質量份等,亦即交聯劑(F)之含量少。 相對於此,於利用一定量以上之交聯劑(F)之情形時,於組成物(III)中,相對於聚合物成分(A)之含量100質量份,交聯劑(F)之含量較佳為0.01質量份至20質量份,更佳為0.1質量份至10質量份,尤佳為0.5質量份至5質量份。藉由交聯劑(F)之前述含量為前述下限值以上,而更顯著地獲得由利用交聯劑(F)所得之功效。藉由交聯劑(F)之前述含量為前述上限值以下,而可更容易減小前述儲存彈性模數E’(90)以及前述儲存彈性模數E’(70)。Regarding reducing the aforementioned storage elastic modulus E’(90) and the aforementioned storage elastic modulus E’(70), it is preferable that composition (III) does not contain crosslinking agent (F), or that in composition (III), the content of crosslinking agent (F) is, for example, less than 0.01 parts by mass relative to 100 parts by mass of polymer component (A), that is, the content of crosslinking agent (F) is low. In contrast, when using a certain amount or more of crosslinking agent (F), in composition (III), the content of crosslinking agent (F) is preferably 0.01 parts by mass to 20 parts by mass relative to 100 parts by mass of polymer component (A), more preferably 0.1 parts by mass to 10 parts by mass, and even more preferably 0.5 parts by mass to 5 parts by mass. By having the crosslinking agent (F) at a level above the aforementioned lower limit, the effects obtained from using the crosslinking agent (F) are more significantly achieved. By having the crosslinking agent (F) at a level below the aforementioned upper limit, the aforementioned storage elastic modulus E’(90) and the aforementioned storage elastic modulus E’(70) can be reduced more easily.
[能量線硬化性樹脂(G)] 組成物(III)及保護膜形成膜亦可含有能量線硬化性樹脂(G)。保護膜形成膜藉由含有能量線硬化性樹脂(G),而能夠藉由能量線之照射使特性變化。The [energy-curing resin (G)] component (III) and the protective film forming film may also contain energy-curing resin (G). By containing energy-curing resin (G), the protective film forming film can change its properties by irradiation with energy rays.
能量線硬化性樹脂(G)為能量線硬化性化合物、或者可視為由能量線硬化性化合物所合成之寡聚物或聚合物(聚合體)。 作為前述能量線硬化性化合物,例如可列舉於分子內具有至少一個聚合性雙鍵之化合物,較佳為具有(甲基)丙烯醯基之丙烯酸酯系化合物。Line-curing resin (G) is a line-curing compound, or can be considered as an oligomer or polymer (polymer) synthesized from a line-curing compound. Examples of such line-curing compounds include compounds having at least one polymerizable double bond within the molecule, preferably acrylate compounds having a (meth)acrylic group.
作為前述丙烯酸酯系化合物,例如可列舉:三羥甲基丙烷三(甲基)丙烯酸酯、四羥甲基甲烷四(甲基)丙烯酸酯、季戊四醇三(甲基)丙烯酸酯、季戊四醇四(甲基)丙烯酸酯、二季戊四醇單羥基五(甲基)丙烯酸酯、二季戊四醇六(甲基)丙烯酸酯、1,4-丁二醇二(甲基)丙烯酸酯、1,6-己二醇二(甲基)丙烯酸酯等含鏈狀脂肪族骨架之(甲基)丙烯酸酯;二(甲基)丙烯酸二環戊酯等含環狀脂肪族骨架之(甲基)丙烯酸酯;聚乙二醇二(甲基)丙烯酸酯等聚伸烷基二醇(甲基)丙烯酸酯;寡聚酯(甲基)丙烯酸酯;(甲基)丙烯酸胺基甲酸酯寡聚物;環氧改質(甲基)丙烯酸酯;前述聚伸烷基二醇(甲基)丙烯酸酯以外之聚醚(甲基)丙烯酸酯;伊康酸寡聚物等。Examples of the aforementioned acrylate compounds include, for instance, trimethylolpropane tri(meth)acrylate, tetramethylmethane tetra(meth)acrylate, pentaerythritol tri(meth)acrylate, pentaerythritol tetra(meth)acrylate, dipentaerythritol monohydroxypenta(meth)acrylate, dipentaerythritol hexa(meth)acrylate, 1,4-butanediol di(meth)acrylate, and 1,6-hexanediol di(meth)acrylate, which contain chain aliphatic compounds. Methacrylates with a cyclic aliphatic backbone; methacrylates containing a cyclic aliphatic backbone, such as dicyclopentyl methacrylate; polyalkylene glycol (methacrylates) such as polyethylene glycol dimethacrylate; oligopolyester (methacrylates); (meth)acrylate aminocarbamate oligomers; epoxy-modified (meth)acrylates; polyether (meth)acrylates other than the aforementioned polyalkylene glycol (meth)acrylates; isoconic acid oligomers, etc.
前述能量線硬化性化合物之重量平均分子量較佳為100至30000,更佳為300至10000。The weight-average molecular weight of the aforementioned energy line hardening compound is preferably 100 to 30,000, and more preferably 300 to 10,000.
用於合成前述寡聚物或聚合物之前述能量線硬化性化合物可僅為一種,亦可為兩種以上,於為兩種以上之情形時,這些能量線硬化性化合物之組合及比率可任意地選擇。The aforementioned energy line hardening compound used to synthesize the aforementioned oligomers or polymers may be one or more. In the case of two or more, the combination and ratio of these energy line hardening compounds may be arbitrarily selected.
組成物(III)以及保護膜形成膜所含有之能量線硬化性樹脂(G)可僅為一種,亦可為兩種以上,於為兩種以上之情形時,這些能量線硬化性樹脂(G)之組合及比率可任意地選擇。The energy line curing resin (G) contained in component (III) and the protective film forming film may be one or more types. In the case of two or more types, the combination and ratio of these energy line curing resins (G) may be arbitrarily selected.
於利用能量線硬化性樹脂(G)之情形時,於組成物(III)中,相對於組成物(III)之總質量,能量線硬化性樹脂(G)之含量之比率較佳為1質量%至30質量%,更佳為5質量%至25質量%,尤佳為10質量%至20質量%。When using energy line curing resin (G), the content of energy line curing resin (G) in composition (III) relative to the total mass of composition (III) is preferably 1% to 30% by mass, more preferably 5% to 25% by mass, and even more preferably 10% to 20% by mass.
[光聚合起始劑(H)] 組成物(III)及保護膜形成膜於含有能量線硬化性樹脂(G)之情形時,為了高效率地進行能量線硬化性樹脂(G)之聚合反應,亦可含有光聚合起始劑(H)。When the [photopolymerization initiator (H)] component (III) and the protective film forming film contain energy line curing resin (G), in order to carry out the polymerization reaction of energy line curing resin (G) efficiently, the photopolymerization initiator (H) may also be included.
作為組成物(III)中之光聚合起始劑(H),例如可列舉:安息香、安息香甲醚、安息香乙醚、安息香異丙醚、安息香異丁醚、安息香苯甲酸、安息香苯甲酸甲酯、安息香二甲基縮酮等安息香化合物;苯乙酮、2-羥基-2-甲基-1-苯基丙烷-1-酮、2,2-二甲氧基-1,2-二苯基乙烷-1-酮、2-羥基-1-(4-(4-(2-羥基-2-甲基丙醯基)苄基)苯基)-2-甲基丙烷-1-酮、2-(二甲胺基)-1-(4-嗎啉基苯基)-2-苄基-1-丁酮等苯乙酮化合物;雙(2,4,6-三甲基苯甲醯基)苯基氧化膦、2,4,6-三甲基苯甲醯基二苯基氧化膦等醯基氧化膦化合物;苄基苯基硫醚、一硫化四甲基秋蘭姆等硫醚化合物;1-羥基環己基苯基酮等α-縮酮化合物;偶氮雙異丁腈等偶氮化合物;二茂鈦等二茂鈦化合物;噻噸酮等噻噸酮化合物;過氧化物化合物;二乙醯等二酮化合物;苯偶醯;二苯偶醯;二苯甲酮;2,4-二乙基噻噸酮;1,2-二苯基甲烷;2-羥基-2-甲基-1-[4-(1-甲基乙烯基)苯基]丙酮;1-氯蒽醌、2-氯蒽醌等醌化合物。 而且,作為光聚合起始劑(H),例如亦可列舉胺等光敏化劑等。Examples of photopolymerization initiators (H) in composition (III) include: benzoin, benzoin methyl ether, benzoin ethyl ether, benzoin isopropyl ether, benzoin isobutyl ether, benzoin benzoic acid, methyl benzoate, benzoin dimethyl ketone, and other benzoin compounds; acetophenone compounds such as 2-hydroxy-2-methyl-1-phenylpropane-1-one, 2,2-dimethoxy-1,2-diphenylethane-1-one, 2-hydroxy-1-(4-(4-(2-hydroxy-2-methylpropenyl)benzyl)phenyl)-2-methylpropane-1-one, 2-(dimethylamino)-1-(4-morpholinylphenyl)-2-benzyl-1-butanone; bis(2 Acrylphosphine oxide compounds such as 4,6-trimethylbenzoyl)phenylphosphine oxide and 2,4,6-trimethylbenzoyldiphenylphosphine oxide; sulfide compounds such as benzylphenyl sulfide and tetramethylthiuram monosulfide; α-ketone compounds such as 1-hydroxycyclohexylphenyl ketone; azo compounds such as azobisisobutyronitrile; titanium eccentricate compounds such as titanium eccentricate; thiotonone compounds such as thiotonone; peroxide compounds; diacetyl compounds such as diacetyl; benzohexyl; dibenzohexyl; benzophenone; 2,4-diethylthiotonone; 1,2-diphenylmethane; 2-hydroxy-2-methyl-1-[4-(1-methylvinyl)phenyl]propanone; quinone compounds such as 1-chloroanthraquinone and 2-chloroanthraquinone. Furthermore, photosensitizers such as levulinamide can also be used as photopolymerization initiators (H).
組成物(III)以及保護膜形成膜所含有之光聚合起始劑(H)可僅為一種,亦可為兩種以上,於為兩種以上之情形時,這些光聚合起始劑(H)之組合及比率可任意地選擇。The photopolymerization initiator (H) contained in the composition (III) and the protective film forming film may be one or more. In the case of two or more, the combination and ratio of these photopolymerization initiators (H) may be arbitrarily selected.
於利用光聚合起始劑(H)之情形時,於組成物(III)中,相對於能量線硬化性樹脂(G)之含量100質量份,光聚合起始劑(H)之含量較佳為0.1質量份至20質量份,更佳為1質量份至10質量份,尤佳為2質量份至5質量份。When using a photopolymerization initiator (H), in composition (III), the content of the photopolymerization initiator (H) is preferably 0.1 to 20 parts by mass relative to 100 parts by mass of the energy line curing resin (G), more preferably 1 to 10 parts by mass, and even more preferably 2 to 5 parts by mass.
[著色劑(I)] 組成物(III)及保護膜形成膜較佳為含有著色劑(I)。藉由含有著色劑(I),而能夠容易地調節保護膜形成膜及保護膜之光穿透性。[Colorant (I)] Composition (III) and the protective film forming film preferably contain colorant (I). By containing colorant (I), the light transmittance of the protective film forming film and the protective film can be easily adjusted.
作為著色劑(I),例如可列舉無機系顏料、有機系顏料、有機系染料等公知之著色劑。As coloring agents (I), examples include known coloring agents such as inorganic pigments, organic pigments, and organic dyes.
作為前述有機系顏料及有機系染料,例如可列舉:胺鎓系色素、花青系色素、部花青系色素、克酮鎓系色素、角鯊烯鎓系色素、薁鎓系色素、聚次甲基系色素、萘醌系色素、吡喃鎓系色素、酞菁系色素、萘酞菁系色素、萘內醯胺系色素、偶氮系色素、縮合偶氮系色素、靛藍系色素、芘酮系色素、苝系色素、二噁嗪系色素、喹吖啶酮系色素、異吲哚啉酮系色素、喹酞酮系色素、吡咯系色素、硫靛藍系色素、金屬錯合物系色素(金屬錯鹽染料)、二硫醇金屬錯合物系色素、吲哚苯酚系色素、三烯丙基甲烷系色素、蒽醌系色素、萘酚系色素、甲亞胺系色素、苯并咪唑酮系色素、皮蒽酮系色素以及士林(threne)系色素等。Examples of organic pigments and dyes mentioned above include: amine-based pigments, anthocyanin-based pigments, quinone-based pigments, squalene-based pigments, azuron-based pigments, polymethyl pigments, naphthoquinone-based pigments, pyranone-based pigments, phthalocyanine-based pigments, naphthylphthalocyanine-based pigments, naphthyllactone-based pigments, azo-based pigments, condensed azo-based pigments, indigo-based pigments, pyrenone-based pigments, perylene-based pigments, and dioxazine-based pigments. Pigments include quinacridone pigments, isoindolineone pigments, quinolineone pigments, pyrrole pigments, indigo pigments, metal complex pigments (metal chromate dyes), dithiol metal complex pigments, indolephenol pigments, triallylmethane pigments, anthraquinone pigments, naphthol pigments, methylimine pigments, benzimidazole pigments, pinantrone pigments, and threne pigments, etc.
作為前述無機系顏料,例如可列舉:碳黑、鈷系色素、鐵系色素、鉻系色素、鈦系色素、釩系色素、鋯系色素、鉬系色素、釕系色素、鉑系色素、ITO(Indium Tin Oxide,氧化銦錫)系色素、ATO系(Antimony Tin Oxide,氧化銻錫)系色素等。Examples of inorganic pigments mentioned above include: carbon black, cobalt-based pigments, iron-based pigments, chromium-based pigments, titanium-based pigments, vanadium-based pigments, zirconium-based pigments, molybdenum-based pigments, ruthenium-based pigments, platinum-based pigments, ITO (Indium Tin Oxide) pigments, and ATO (Antimony Tin Oxide) pigments.
組成物(III)以及保護膜形成膜所含有之著色劑(I)可僅為一種,亦可為兩種以上,於為兩種以上之情形時,這些著色劑(I)之組合及比率可任意地選擇。The colorant (I) contained in the composition (III) and the protective film forming film may be only one type or two or more types. In the case of two or more types, the combination and ratio of these colorants (I) can be arbitrarily selected.
於利用著色劑(I)之情形時,保護膜形成膜之著色劑(I)之含量只要根據目的適當調節即可。例如,藉由調節保護膜形成膜之著色劑(I)之含量,來調節保護膜形成膜之光穿透性,而能夠調節對保護膜形成膜或保護膜進行雷射印字之情形之印字辨識性。而且,藉由調節保護膜形成膜之著色劑(I)之含量,而亦能夠提高保護膜之創意性,或不易看到晶圓的內面之磨削痕。若考慮這些方面,則保護膜形成膜中,相對於保護膜形成膜之總質量,著色劑(I)之含量之比率較佳為0.1質量%至10質量%,更佳為0.1質量%至7.5質量%,尤佳為0.1質量%至5質量%。藉由前述比率為前述下限值以上,而更顯著地獲得由利用著色劑(I)所得之功效。例如,於自被黏附體剝離保護膜形成膜時,能夠藉由目視容易地確認保護膜形成膜有無殘存於被黏附體。藉由前述比率為前述上限值以下,而抑制著色劑(I)之過度使用。When using a colorant (I), the amount of colorant (I) in the protective film forming film can be adjusted appropriately according to the purpose. For example, by adjusting the amount of colorant (I) in the protective film forming film, the light transmittance of the protective film forming film can be adjusted, thereby adjusting the print legibility when laser printing is performed on the protective film forming film or the protective film. Moreover, by adjusting the amount of colorant (I) in the protective film forming film, the creativity of the protective film can also be improved, or the grinding marks on the inner surface of the wafer can be made less visible. Taking these aspects into consideration, the ratio of colorant (I) content in the protective film to the total mass of the protective film is preferably 0.1% to 10% by mass, more preferably 0.1% to 7.5% by mass, and even more preferably 0.1% to 5% by mass. By setting the aforementioned ratio above the aforementioned lower limit, the effects obtained by using colorant (I) are more significantly achieved. For example, when the protective film is peeled off from the adherend, it is easy to visually confirm whether any residue of the protective film remains on the adherend. By setting the aforementioned ratio below the aforementioned upper limit, the excessive use of colorant (I) is suppressed.
[通用添加劑(J)] 組成物(III)及保護膜形成膜亦可於不損及本發明功效之範圍內,含有通用添加劑(J)。 通用添加劑(J)可為公知者,可根據目的而任意選擇,並無特別限定,作為較佳之添加劑,例如可列舉:塑化劑、抗靜電劑、抗氧化劑、吸氣劑、紫外線吸收劑等。[General Additive (J)] The composition (III) and the protective film may also contain a general additive (J) to the extent that it does not impair the efficacy of the invention. The general additive (J) may be known and may be selected arbitrarily according to the purpose without particular limitation. Preferred additives include, for example: plasticizers, antistatic agents, antioxidants, getters, ultraviolet absorbers, etc.
組成物(III)以及保護膜形成膜所含有之通用添加劑(J)可僅為一種,亦可為兩種以上,於為兩種以上之情形時,這些通用添加劑(J)之組合及比率可任意地選擇。 組成物(III)及保護膜形成膜之通用添加劑(J)之含量並無特別限定,只要根據目的適當選擇即可。The component (III) and the protective film forming film may contain only one or more general additives (J). In the case of two or more, the combination and ratio of these general additives (J) can be arbitrarily selected. There is no particular limitation on the content of the general additives (J) in the component (III) and the protective film forming film, as long as they are appropriately selected according to the purpose.
[溶媒] 組成物(III)較佳為更含有溶媒。含有溶媒之組成物(III)係操作性變良好。 於本說明書中,所謂「溶媒」,只要無特別說明,則設為下述概念:不僅為使對象成分溶解者,亦包含使對象成分分散之分散媒。[Soluble] Composition (III) preferably contains a solvent. Composition (III) containing a solvent has better workability. In this specification, the term "solvent" is defined as not only as a substance that dissolves the object component, but also as a dispersion medium that disperses the object component.
前述溶媒並無特別限定,作為較佳者,例如可列舉:甲苯、二甲苯等烴;甲醇、乙醇、2-丙醇、異丁基醇(2-甲基丙烷-1-醇)、1-丁醇等醇;乙酸乙酯等酯;丙酮、甲基乙基酮等酮;四氫呋喃等醚;二甲基甲醯胺、N-甲基吡咯啶酮等醯胺(具有醯胺鍵之化合物)等。 組成物(III)所含有之溶媒可僅為一種,亦可為兩種以上,於為兩種以上之情形時,這些溶媒之組合及比率可任意地選擇。The aforementioned solvents are not particularly limited, but preferred examples include: hydrocarbons such as toluene and xylene; alcohols such as methanol, ethanol, 2-propanol, isobutyl alcohol (2-methylpropane-1-ol), and 1-butanol; esters such as ethyl acetate; ketones such as acetone and methyl ethyl ketone; ethers such as tetrahydrofuran; and amides (compounds containing amide bonds) such as dimethylformamide and N-methylpyrrolidone. Component (III) may contain only one type of solvent or two or more types. In the case of two or more types, the combination and ratio of these solvents can be arbitrarily selected.
組成物(III)所含有之溶媒中,作為更佳之溶媒,例如就能夠將組成物(III)中之含有成分更均勻地混合之方面而言,可列舉甲基乙基酮、甲苯、乙酸乙酯等。Among the solvents contained in composition (III), those that are better solvents, for example, that can mix the components contained in composition (III) more evenly, include methyl ethyl ketone, toluene, ethyl acetate, etc.
組成物(III)之溶媒之含量並無特別限定,例如只要根據溶媒以外之成分之種類而適當選擇即可。There is no particular limitation on the amount of solvent in component (III). For example, it can be appropriately selected according to the type of components other than the solvent.
[保護膜形成用組成物(III)的製造方法] 組成物(III)係藉由將用以構成該組成物之各成分加以調配而獲得。 各成分之調配時之添加順序並無特別限定,亦可同時添加兩種以上之成分。 於調配時混合各成分之方法並無特別限定,只要自下述方法等公知之方法中適當選擇即可:使攪拌子或攪拌翼等旋轉而進行混合之方法;利用混合機進行混合之方法;施加超音波進行混合之方法。 各成分之添加及混合時之溫度以及時間只要各調配成分不劣化,則並無特別限定,只要適當調節即可,溫度較佳為15℃至30℃。[Manufacturing Method of Component (III) for Protective Film Formation] Component (III) is obtained by blending the various components constituting the component. There is no particular limitation on the order in which the components are added, and two or more components may be added simultaneously. There is no particular limitation on the method of mixing the components during blending, as long as a suitable method is selected from the following known methods: mixing by rotating a stir bar or stirring blade; mixing using a mixer; mixing by applying ultrasound. There is no particular limitation on the temperature and time during the addition and mixing of the components, as long as the components do not deteriorate, and they may be adjusted appropriately. The preferred temperature is 15°C to 30°C.
◎保護膜形成膜之例 圖1係示意性地表示本實施形態之保護膜形成膜之一例的剖面圖。再者,以下之說明中所用之圖有時為了容易理解本發明之特徵,為方便起見而將成為要部之部分放大表示,各構成要素之尺寸比率等未必與實際相同。◎Example of protective film formation Figure 1 is a schematic cross-sectional view showing an example of a protective film formation according to the present embodiment. Furthermore, in the following description, some parts that are important are sometimes enlarged for ease of understanding of the features of the present invention, and the size ratios of each component may not be the same as the actual dimensions.
此處所示之保護膜形成膜13於一面(於本說明書中,有時稱為「第一面」)13a上具備第一剝離膜151,於與前述第一面13a為相反側的另一面(於本說明書中,有時稱為「第二面」)13b上具備第二剝離膜152。 此種保護膜形成膜13例如適於以輥狀保存。The protective film forming film 13 shown here has a first peeling film 151 on one side (sometimes referred to as the "first side" in this specification) 13a, and a second peeling film 152 on the other side (sometimes referred to as the "second side" in this specification) 13b, which is opposite to the first side 13a. This protective film forming film 13 is suitable for storage, for example, in a roller shape.
於測定利用保護膜形成膜13所製作之前述試片之儲存彈性模數E’時,於90℃之前述試片之儲存彈性模數E’(90)為5MPa以下。When measuring the storage elastic modulus E’ of the aforementioned test piece made by forming the protective film 13, the storage elastic modulus E’(90) of the aforementioned test piece at 90°C is less than 5 MPa.
保護膜形成膜13可利用上述保護膜形成用組成物而形成。The protective film forming film 13 can be formed using the above-mentioned protective film forming composition.
第一剝離膜151及第二剝離膜152均可為公知之剝離膜。 第一剝離膜151及第二剝離膜152可彼此相同,例如亦可為自保護膜形成膜13剝離時所需要之剝離力互不相同等而互不相同。Both the first peeling membrane 151 and the second peeling membrane 152 can be known peeling membranes. The first peeling membrane 151 and the second peeling membrane 152 can be the same as each other, or they can be different from each other, for example, they can be different because the peeling force required when the self-protective membrane forming membrane 13 is different.
圖1所示之保護膜形成膜13係將第一剝離膜151及第二剝離膜152的任一者去掉,所生成之露出面成為對工件(圖示省略)的任一部位之貼附面。另外,於利用後述之支撐片或切割片之情形時,將第一剝離膜151及第二剝離膜152的剩餘另一者去掉,所生成之保護膜形成膜13的露出面成為前述支撐片或切割片之貼附面。The protective film forming film 13 shown in Figure 1 is formed by removing either the first release film 151 or the second release film 152, and the resulting exposed surface becomes the attachment surface for any part of the workpiece (not shown). Alternatively, when using a support sheet or cutting sheet as described later, the remaining one of the first release film 151 and the second release film 152 is removed, and the exposed surface of the resulting protective film forming film 13 becomes the attachment surface for the aforementioned support sheet or cutting sheet.
於圖1中,顯示剝離膜設置於保護膜形成膜13的兩面(第一面13a、第二面13b)之例,但剝離膜亦可僅設置於保護膜形成膜13的任一面,亦即僅設置於第一面13a或僅設置於第二面13b。Figure 1 shows an example where the peeling membrane is disposed on both sides (first side 13a, second side 13b) of the protective film forming membrane 13. However, the peeling membrane may also be disposed on only one side of the protective film forming membrane 13, that is, only on the first side 13a or only on the second side 13b.
本實施形態之保護膜形成膜有以下幾個態樣。 「1」一種保護膜形成膜,具熱硬化性;於將前述保護膜形成膜之寬度4mm之試片取20mm之間隔以兩處加以保持,藉由拉伸模式一邊以頻率11Hz、升溫速度3℃/min、等速升溫之條件將前述試片自-50℃升溫至150℃為止,一邊測定前述試片之儲存彈性模數E’時,於90℃之前述試片之儲存彈性模數E’(90)為5MPa以下、3MPa以下、2MPa以下、0.4MPa以下、以及0.2MPa以下的任一者。The protective film forming membrane of this embodiment has the following forms. "1" A protective film forming membrane with thermosetting properties; when a 4 mm wide sample of the aforementioned protective film forming membrane is held at two locations with a 20 mm interval, and the sample is heated from -50 °C to 150 °C in a stretching mode at a frequency of 11 Hz, a heating rate of 3 °C/min, and a constant heating rate, the storage elastic modulus E' of the aforementioned sample is measured. Before 90 °C, the storage elastic modulus E' (90) of the aforementioned sample is any one of 5 MPa or less, 3 MPa or less, 2 MPa or less, 0.4 MPa or less, and 0.2 MPa or less.
「2」如「1」所記載之保護膜形成膜,其中於將前述保護膜形成膜之寬度4mm之試片取20mm之間隔以兩處加以保持,藉由拉伸模式一邊以頻率11Hz、升溫速度3℃/min、等速升溫之條件將前述試片自-50℃升溫至150℃為止,一邊測定前述試片之tanδ時,於90℃之前述試片之tanδ(90)為0.20以上、0.24以上、以及0.34以上之任一者。"2" As described in "1", the protective film forming film is formed by taking a 4 mm wide test piece of the aforementioned protective film forming film and holding it at two locations with a 20 mm interval. The test piece is heated from -50°C to 150°C in a stretching mode at a frequency of 11 Hz, a heating rate of 3°C/min, and a constant heating rate. When the tanδ of the test piece is measured, the tanδ (90) of the test piece before 90°C is any one of 0.20 or more, 0.24 or more, and 0.34 or more.
「3」如「1」或「2」所記載之保護膜形成膜,其中於將前述保護膜形成膜經加熱硬化之熱硬化物之寬度5mm之試片取20mm之間隔以兩處加以保持,藉由拉伸模式一邊以頻率11Hz、升溫速度3℃/min、等速升溫之條件將前述試片自-60℃升溫至300℃為止,一邊測定前述試片之儲存彈性模數E’時,於23℃之前述試片之儲存彈性模數E’(23)為100MPa以上、200MPa以上、以及300MPa以上之任一者。"3" As described in "1" or "2", in which a 5 mm wide specimen of the heat-cured material of the aforementioned protective film is held at two locations with a 20 mm interval, and the specimen is heated from -60°C to 300°C in a stretching mode at a frequency of 11 Hz, a heating rate of 3°C/min and a constant heating rate, while the storage elastic modulus E' of the aforementioned specimen is measured, the storage elastic modulus E' (23) of the aforementioned specimen before 23°C is any one of 100 MPa or more, 200 MPa or more, and 300 MPa or more.
「4」如「1」至「3」中任一項所記載之保護膜形成膜,其中含有包含丙烯酸樹脂之聚合物成分(A);前述丙烯酸樹脂之玻璃轉移溫度未達10℃,為-80℃以上至未達10℃、-70℃以上至5℃以下、-60℃以上至0℃以下、以及-60℃以上至-5℃以下的任一者。"4" The protective film formed as described in any of "1" to "3" contains a polymer component (A) comprising acrylic resin; wherein the glass transition temperature of the aforementioned acrylic resin is not 10°C, and is any one of -80°C or higher to less than 10°C, -70°C or higher to less than 5°C, -60°C or higher to less than 0°C, and -60°C or higher to less than -5°C.
「5」如「1」至「4」中任一項所記載之保護膜形成膜,其中含有填充材(D);相對於前述保護膜形成膜之總質量,前述填充材(D)之含量之比率為未達50質量%、30質量%以上至70質量%以下、35質量%以上至70質量%以下、35質量%以上至65質量%以下、35質量%以上至59質量%以下、以及35質量%以上至未達50質量%的任一者。"5" The protective film forming film as described in any of "1" to "4" contains filler (D); the content of the filler (D) relative to the total mass of the aforementioned protective film forming film is any one of less than 50% by mass, more than 30% by mass and less than 70% by mass, more than 35% by mass and less than 70% by mass, more than 35% by mass and less than 65% by mass, more than 35% by mass and less than 59% by mass, and more than 35% by mass and less than 50% by mass.
「6」如「1」至「5」中任一項所記載之保護膜形成膜,其中含有聚合物成分(A);相對於前述保護膜形成膜之總質量,前述聚合物成分(A)之含量之比率為10質量%至85質量%、15質量%至70質量%、15質量%至45質量%、15質量%至35質量%、20質量%至70質量%、以及25質量%至70質量%的任一者。"6" is a protective film forming film as described in any of "1" to "5", wherein the polymer component (A) is present; the content of the polymer component (A) relative to the total mass of the aforementioned protective film forming film is any one of 10% to 85% by mass, 15% to 70% by mass, 15% to 45% by mass, 15% to 35% by mass, 20% to 70% by mass, and 25% to 70% by mass.
「7」如「1」至「6」中任一項所記載之保護膜形成膜,其中含有聚合物成分(A)以及熱硬化性成分(B);相對於前述聚合物成分(A)以及前述熱硬化性成分(B)之總含量100質量份,前述熱硬化性成分(B)之含量為10質量份至100質量份、20質量份至70質量份、25質量份至55質量份、以及30質量份至45質量份的任一者。"7" is a protective film formed as described in any of "1" to "6", which contains a polymer component (A) and a thermosetting component (B); the content of the thermosetting component (B) is any one of 10 to 100 parts by mass, 20 to 70 parts by mass, 25 to 55 parts by mass, and 30 to 45 parts by mass, relative to the total content of the polymer component (A) and the thermosetting component (B) of 100 parts by mass.
「8」如「1」至「7」中任一項所記載之保護膜形成膜,其中於將前述保護膜形成膜之寬度4mm之試片取20mm之間隔以兩處加以保持,藉由拉伸模式一邊以頻率11Hz、升溫速度3℃/min、等速升溫之條件將前述試片自-50℃升溫至150℃為止,一邊測定前述試片之儲存彈性模數E’時,於90℃之前述試片之儲存彈性模數E’(90)小於於70℃之前述試片之儲存彈性模數E’(70)。 「9」如「8」所記載之保護膜形成膜,其中前述儲存彈性模數E’(70)為8MPa以下、3.5MPa以下、3MPa以下、以及2MPa以下的任一者。"8" As described in any of "1" to "7", wherein when a 4 mm wide sample of the aforementioned protective film is held at two locations with a 20 mm interval, and the sample is heated from -50°C to 150°C in a stretching mode at a frequency of 11 Hz, a heating rate of 3°C/min, and a constant heating rate, the storage elastic modulus E' of the sample is measured, and the storage elastic modulus E'(90) of the sample before 90°C is less than the storage elastic modulus E'(70) of the sample before 70°C. "9" As described in "8", wherein the aforementioned storage elastic modulus E'(70) is any one of 8 MPa or less, 3.5 MPa or less, 3 MPa or less, and 2 MPa or less.
本實施形態之保護膜形成膜藉由與後述之支撐片併用,而可構成能夠一併進行保護膜之形成與工件的加工(例如切割)之保護膜形成用複合片。以下對此種保護膜形成用複合片加以說明。The protective film forming film of this embodiment, when used in conjunction with the support sheet described later, can constitute a composite sheet for forming a protective film that can simultaneously perform the formation of a protective film and the processing (e.g., cutting) of a workpiece. This composite sheet for forming a protective film will be described below.
◇保護膜形成用複合片 本發明之一實施形態之保護膜形成用複合片係具備支撐片、及設置於前述支撐片的一面上之保護膜形成膜,前述保護膜形成膜為上述本發明之一實施形態之保護膜形成膜。 本實施形態之保護膜形成用複合片可藉由該複合片中之保護膜形成膜而貼附於工件的目標部位(例如晶圓的內面)。◇ Composite Sheet for Protective Film Formation One embodiment of the present invention comprises a composite sheet for protective film formation, having a support sheet and a protective film forming film disposed on one side of the support sheet, wherein the protective film forming film is the protective film forming film of one embodiment of the present invention. The composite sheet for protective film formation of this embodiment can be attached to a target area of a workpiece (e.g., the inner surface of a wafer) by means of the protective film forming film in the composite sheet.
於本說明書中,即使在保護膜形成膜硬化之後,亦只要維持著支撐片與保護膜形成膜之熱硬化物之積層結構,則將該積層結構體稱為「保護膜形成用複合片」。In this specification, even after the protective film has hardened, as long as the laminated structure of the thermocured material of the support sheet and the protective film is maintained, the laminated structure is referred to as a "composite sheet for forming a protective film".
以下針對構成前述保護膜形成用複合片之各層加以詳細說明。The following provides a detailed description of each layer of the composite sheet that constitutes the aforementioned protective film.
◎支撐片 前述支撐片可由一層(單層)所構成,亦可由兩層以上之多層所構成。於支撐片由多層所構成之情形時,這些多層之構成材料及厚度可彼此相同亦可不同,這些多層之組合只要不損及本發明功效,則並無特別限定。◎Supporting Sheet The aforementioned supporting sheet may be composed of one layer (single layer) or multiple layers (two or more layers). When the supporting sheet is composed of multiple layers, the constituent materials and thicknesses of these multiple layers may be the same or different from each other. There are no particular limitations on the combination of these multiple layers as long as it does not impair the function of the invention.
支撐片可為透明及非透明的任一種,亦可根據目的而著色。 於保護膜形成膜具有能量線硬化性之情形時,支撐片較佳為使能量線穿透。Support sheets can be either transparent or opaque, and can also be colored depending on the purpose. When the protective film forming film has energy line hardening properties, the support sheet is preferably designed to allow energy lines to pass through.
作為支撐片,例如可列舉:具備基材與設置於前述基材的一面上之黏著劑層之支撐片;僅由基材所構成之支撐片等。於支撐片具備黏著劑層之情形時,黏著劑層於保護膜形成用複合片中係配置於基材與保護膜形成膜之間。Examples of support sheets include: a support sheet having a substrate and an adhesive layer disposed on one side of the substrate; and a support sheet consisting only of a substrate. When the support sheet has an adhesive layer, the adhesive layer is disposed between the substrate and the protective film forming film in the composite sheet for forming the protective film.
於利用具備基材及黏著劑層之支撐片之情形時,能夠於保護膜形成用複合片中,容易地調節支撐片與保護膜形成膜之間的密接性及剝離性。 於利用僅由基材所構成之支撐片之情形時,能夠以低成本製造保護膜形成用複合片。When using a support sheet having a substrate and an adhesive layer, the adhesion and peelability between the support sheet and the protective film forming film can be easily adjusted in the protective film forming composite sheet. When using a support sheet consisting only of a substrate, the protective film forming composite sheet can be manufactured at low cost.
以下,一邊參照圖式,一邊對本實施形態之保護膜形成用複合片之例按此種支撐片之種類分別進行說明。Hereinafter, with reference to the drawings, examples of composite sheets for forming protective films in this embodiment will be explained according to the types of such support sheets.
◎保護膜形成用複合片之一例 圖2係示意性地表示本實施形態之保護膜形成用複合片之一例的剖面圖。 再者,圖2以後之圖中,對於與已說明之圖中所示相同之構成要素,標註與該已說明之圖之情形相同之符號,省略詳細說明。◎An Example of a Composite Sheet for Forming a Protective Film Figure 2 is a schematic cross-sectional view showing an example of a composite sheet for forming a protective film according to this embodiment. Furthermore, in the figures following Figure 2, for the same constituent elements as shown in the previously described figures, the same symbols are used as in the previously described figures, and detailed explanations are omitted.
此處所示之保護膜形成用複合片101係具備支撐片10、及設置於支撐片10的一面(於本說明書中,有時稱為「第一面」)10a上之保護膜形成膜13而構成。 支撐片10係具備基材11、及設置於基材11的一面(第一面)11a上之黏著劑層12而構成。保護膜形成用複合片101中,黏著劑層12配置於基材11與保護膜形成膜13之間。 亦即,保護膜形成用複合片101係將基材11、黏著劑層12及保護膜形成膜13依序於這些之厚度方向積層而構成。 支撐片10的第一面10a係與黏著劑層12中的與基材11側為相反側之面(於本說明書中,有時稱為「第一面」)12a相同。The protective film forming composite sheet 101 shown here comprises a support sheet 10 and a protective film forming film 13 disposed on one side (sometimes referred to as the "first side") 10a of the support sheet 10. The support sheet 10 comprises a substrate 11 and an adhesive layer 12 disposed on one side (first side) 11a of the substrate 11. In the protective film forming composite sheet 101, the adhesive layer 12 is disposed between the substrate 11 and the protective film forming film 13. That is, the protective film forming composite sheet 101 is formed by sequentially laminating the substrate 11, the adhesive layer 12 and the protective film forming film 13 in their thickness directions. The first surface 10a of the support sheet 10 is the same as the side of the adhesive layer 12 opposite to the side of the substrate 11 (sometimes referred to as the "first surface" in this specification) 12a.
保護膜形成用複合片101進而於保護膜形成膜13上具備治具用接著劑層16及剝離膜15。 於保護膜形成用複合片101中,於黏著劑層12的第一面12a之全面或大致全面積層有保護膜形成膜13,於保護膜形成膜13中的與黏著劑層12側為相反側之面(於本說明書中,有時稱為「第一面」)13a的一部分、亦即周緣部附近之區域積層有治具用接著劑層16。進而,於保護膜形成膜13的第一面13a中未積層有治具用接著劑層16之區域、及治具用接著劑層16中的與保護膜形成膜13側為相反側之面(於本說明書中,有時稱為「第一面」)16a積層有剝離膜15。於保護膜形成膜13中的與第一面13a為相反側之面(於本說明書中,有時稱為「第二面」)13b設有支撐片10。The protective film forming composite sheet 101 further has a jig adhesive layer 16 and a peeling film 15 on the protective film forming film 13. In the protective film forming composite sheet 101, the protective film forming film 13 is deposited on the entire or substantially entire first surface 12a of the adhesive layer 12, and the jig adhesive layer 16 is deposited on a portion of the side of the protective film forming film 13 opposite to the side of the adhesive layer 12 (sometimes referred to as the "first surface" in this specification), that is, in the area near the periphery. Furthermore, a peeling film 15 is deposited on the area of the first surface 13a of the protective film forming film 13 where the fixture adhesive layer 16 is not deposited, and on the surface of the fixture adhesive layer 16 opposite to the protective film forming film 13 (sometimes referred to as the "first surface" in this specification) 16a. A support sheet 10 is provided on the surface of the protective film forming film 13 opposite to the first surface 13a (sometimes referred to as the "second surface" in this specification) 13b.
不限於保護膜形成用複合片101之情形,本實施形態之保護膜形成用複合片中,剝離膜(例如圖2所示之剝離膜15)為任意之構成,本實施形態之保護膜形成用複合片可具備剝離膜,亦可不具備。Not limited to the protective film forming composite sheet 101, in the protective film forming composite sheet of this embodiment, the peeling membrane (e.g., the peeling membrane 15 shown in FIG2) can be of any configuration. The protective film forming composite sheet of this embodiment may or may not have a peeling membrane.
治具用接著劑層16係用於將保護膜形成用複合片101固定於環形框等治具。 治具用接著劑層16例如可具有含有接著劑成分或黏著劑成分之單層結構,亦可具有多層結構,該多層結構係具備成為芯材之片材、及設置於前述片材的兩面之含有接著劑成分或黏著劑成分之層。The adhesive layer 16 for the fixture is used to fix the protective film forming composite sheet 101 to a fixture such as an annular frame. The adhesive layer 16 for the fixture may have a single-layer structure containing adhesive or adhesive components, or it may have a multi-layer structure, which has a sheet that serves as the core material and layers containing adhesive or adhesive components disposed on both sides of the aforementioned sheet.
保護膜形成用複合片101係以去掉剝離膜15之狀態,於保護膜形成膜13的第一面13a貼附工件的目標部位,進而將治具用接著劑層16的第一面16a貼附於環形框等治具而使用。The protective film forming composite sheet 101 is used to attach the target part of the workpiece to the first surface 13a of the protective film forming film 13 with the peeling film 15 removed, and then attach the first surface 16a of the adhesive layer 16 of the fixture to the fixture such as the ring frame.
如上文所述,於利用具備保護膜形成膜13之保護膜形成用複合片101來製造前述具保護膜之工件或前述具保護膜之工件加工物之步驟中,即使於熱硬化性之保護膜形成膜之表面形成有傷痕,仍可使得保護膜形成膜13經熱硬化之後之保護膜之表面之傷痕變得不明顯。As described above, in the step of manufacturing the aforementioned workpiece with a protective film or the aforementioned processed workpiece with a protective film using the protective film forming composite sheet 101 with the protective film forming film 13, even if there are scratches on the surface of the thermosetting protective film forming film, the scratches on the surface of the protective film after the protective film forming film 13 is thermosetting can still become inconspicuous.
圖3係示意性地表示本實施形態之保護膜形成用複合片之另一例的剖面圖。 此處所示之保護膜形成用複合片102除了保護膜形成膜之形狀及大小不同,且治具用接著劑層積層於黏著劑層的第一面而非保護膜形成膜的第一面之方面以外,與圖2所示之保護膜形成用複合片101相同。Figure 3 is a schematic cross-sectional view showing another example of the protective film forming composite sheet of this embodiment. The protective film forming composite sheet 102 shown here is the same as the protective film forming composite sheet 101 shown in Figure 2, except that the shape and size of the protective film forming film are different, and the adhesive layer of the fixture is deposited on the first side of the adhesive layer rather than the first side of the protective film forming film.
更具體而言,於保護膜形成用複合片102中,保護膜形成膜23積層於黏著劑層12的第一面12a的一部分區域、亦即黏著劑層12之寬度方向(圖3中之左右方向)的中央側之區域。進而,於黏著劑層12的第一面12a中未積層有保護膜形成膜23之區域,以將保護膜形成膜23自寬度方向之外側非接觸地包圍之方式積層有治具用接著劑層16。另外,於保護膜形成膜23中的與黏著劑層12側為相反側之面(於本說明書中,有時稱為「第一面」)23a、及治具用接著劑層16的第一面16a,積層有剝離膜15。於保護膜形成膜23的與第一面23a為相反側之面(於本說明書中,有時稱為「第二面」)23b設有支撐片10。More specifically, in the protective film forming composite sheet 102, the protective film forming film 23 is deposited on a portion of the first surface 12a of the adhesive layer 12, that is, the central area of the adhesive layer 12 in the width direction (left-right direction in FIG. 3). Furthermore, in the area of the first surface 12a of the adhesive layer 12 where the protective film forming film 23 is not deposited, a jig adhesive layer 16 is deposited in such a way that the protective film forming film 23 is non-contactly surrounded from the outside of the width direction. Additionally, a release film 15 is laminated on the side of the protective film forming film 23 opposite to the adhesive layer 12 (sometimes referred to as the "first side" in this specification) 23a and the first side 16a of the fixture adhesive layer 16. A support sheet 10 is provided on the side of the protective film forming film 23 opposite to the first side 23a (sometimes referred to as the "second side" in this specification) 23b.
圖4係示意性地表示本實施形態之保護膜形成用複合片之進而另一例的剖面圖。 此處所示之保護膜形成用複合片103除了不具備治具用接著劑層16之方面以外,與圖3所示之保護膜形成用複合片102相同。Figure 4 is a schematic cross-sectional view showing another example of the protective film forming composite sheet of this embodiment. The protective film forming composite sheet 103 shown here is the same as the protective film forming composite sheet 102 shown in Figure 3, except that it does not have the adhesive layer 16 for the jig.
圖5係示意性地表示本實施形態之保護膜形成用複合片之進而另一例的剖面圖。 此處所示之保護膜形成用複合片104除了具備支撐片20代替支撐片10而構成之方面以外,與圖2所示之保護膜形成用複合片101相同。Figure 5 is a schematic cross-sectional view showing another example of the protective film forming composite sheet of this embodiment. The protective film forming composite sheet 104 shown here is the same as the protective film forming composite sheet 101 shown in Figure 2, except that it is constructed with a support sheet 20 instead of a support sheet 10.
支撐片20係僅由基材11所構成。 亦即,保護膜形成用複合片104係將基材11及保護膜形成膜13於這些之厚度方向積層而構成。 支撐片20的保護膜形成膜13側之面(其中一面)20a係與基材11的第一面11a相同。The support sheet 20 is composed solely of the substrate 11. That is, the protective film forming composite sheet 104 is formed by laminating the substrate 11 and the protective film forming film 13 in their thickness directions. The side surface (one side) 20a of the protective film forming film 13 of the support sheet 20 is the same as the first side surface 11a of the substrate 11.
本實施形態之保護膜形成用複合片不限定於圖1至圖5所示,亦可於不損及本發明功效之範圍內,將圖1至圖5所示之一部分構成變更或刪除,或者對迄今為止所說明的保護膜形成用複合片進一步追加其他構成。The protective film forming composite sheet of this embodiment is not limited to that shown in Figures 1 to 5. Within the scope of not impairing the effectiveness of the invention, one part shown in Figures 1 to 5 may be modified or deleted, or other components may be added to the protective film forming composite sheet described so far.
繼而,對構成支撐片之各層加以更詳細說明。Then, the layers that make up the support sheet are explained in more detail.
○基材 前述基材為片狀或膜狀,作為該基材之構成材料,例如可列舉各種樹脂。 作為前述樹脂,例如可列舉:低密度聚乙烯(LDPE;low density polyethylene)、直鏈低密度聚乙烯(LLDPE;linear low density polyethylene)、高密度聚乙烯(HDPE;high density polyethylene)等聚乙烯;聚丙烯、聚丁烯、聚丁二烯、聚甲基戊烯、降冰片烯樹脂等聚乙烯以外之聚烯烴;乙烯-乙酸乙烯酯共聚物、乙烯-(甲基)丙烯酸共聚物、乙烯-(甲基)丙烯酸酯共聚物、乙烯-降冰片烯共聚物等乙烯系共聚物(利用乙烯作為單體而得之共聚物);聚氯乙烯、氯乙烯共聚物等氯乙烯系樹脂(利用氯乙烯作為單體而得之樹脂);聚苯乙烯;聚環烯烴;聚對苯二甲酸乙二酯、聚萘二甲酸乙二酯、聚對苯二甲酸丁二酯、聚間苯二甲酸乙二酯、聚2,6-萘二甲酸乙二酯、所有構成單元具有芳香族環式基之全芳香族聚酯等聚酯;兩種以上之前述聚酯之共聚物;聚(甲基)丙烯酸酯;聚胺基甲酸酯;聚丙烯酸胺基甲酸酯;聚醯亞胺;聚醯胺;聚碳酸酯;氟樹脂;聚縮醛;改質聚苯醚;聚苯硫醚;聚碸;聚醚酮等。 而且,作為前述樹脂,例如亦可列舉前述聚酯與除此以外之樹脂之混合物等聚合物合金。前述聚酯與除此以外之樹脂之聚合物合金較佳為聚酯以外之樹脂之量為相對較少之量。 而且,作為前述樹脂,例如亦可列舉:至此為止所例示之前述樹脂的一種或兩種以上交聯而成之交聯樹脂;利用至此為止所例示之前述樹脂的一種或兩種以上之離子聚合物等改質樹脂。 前述樹脂就耐熱性優異之方面而言,較佳為聚丙烯或聚對苯二甲酸丁二酯。○ Substrate The aforementioned substrate is in sheet or film form, and various resins can be listed as constituent materials of the substrate. Examples of such resins include: polyethylene such as low-density polyethylene (LDPE), linear low-density polyethylene (LLDPE), and high-density polyethylene (HDPE); polyolefins other than polyethylene such as polypropylene, polybutene, polybutadiene, polymethylpentene, and norbornene resins; ethylene-based copolymers (polymers obtained using ethylene as a monomer) such as ethylene-vinyl acetate copolymer, ethylene-(meth)acrylic acid copolymer, ethylene-(meth)acrylic acid copolymer, and ethylene-norbornene copolymer; vinyl chloride-based resins (resins obtained using vinyl chloride as a monomer) such as polyvinyl chloride and vinyl chloride copolymers; polystyrene... Ethylene; polycyclic aromatic hydrocarbons; polyethylene terephthalate, polyethylene naphthalate, polyethylene butylene terephthalate, polyethylene isophthalate, polyethylene 2,6-naphthalate, and other fully aromatic polyesters whose constituent units have aromatic cyclic groups; copolymers of two or more of the aforementioned polyesters; poly(meth)acrylates; polyurethane; polyurethane acrylates; polyimide; polyamide; polycarbonate; fluororesins; polyacetal; modified polyphenylene ether; polyphenylene sulfide; polyetherketone; etc. Furthermore, polymer alloys, such as mixtures of the aforementioned polyesters and other resins, can also be listed as polymer alloys. Preferably, in polymer alloys of the aforementioned polyesters and other resins, the amount of resins other than polyesters is relatively small. Furthermore, examples of the aforementioned resins include, for instance, crosslinked resins formed by crosslinking one or more of the resins described so far; and modified resins using one or more ionic polymers of the resins described so far. In terms of excellent heat resistance, polypropylene or polybutylene terephthalate is preferred among the aforementioned resins.
構成基材之樹脂可僅為一種,亦可為兩種以上,於為兩種以上之情形時,這些樹脂之組合及比率可任意地選擇。The resin constituting the substrate may be one type or two or more types. In the case of two or more types, the combination and ratio of these resins can be arbitrarily selected.
基材可由一層(單層)所構成,亦可由兩層以上之多層所構成,於由多層所構成之情形時,這些多層可彼此相同亦可不同,這些多層之組合並無特別限定。The substrate can be composed of one layer (single layer) or multiple layers (two or more layers). When it is composed of multiple layers, these multiple layers can be the same or different from each other, and there is no particular limitation on the combination of these multiple layers.
基材之厚度較佳為50μm至300μm,更佳為60μm至100μm。藉由基材之厚度為此種範圍,保護膜形成用複合片之可撓性、及對晶圓之貼附適性進一步提高。 此處,所謂「基材之厚度」,意指基材總體之厚度,例如所謂由多層所構成之基材之厚度,意指構成基材之所有層之合計厚度。The thickness of the substrate is preferably 50 μm to 300 μm, and more preferably 60 μm to 100 μm. By using a substrate thickness within this range, the flexibility of the composite sheet used for forming the protective film and its suitability for wafer bonding are further improved. Here, "substrate thickness" refers to the overall thickness of the substrate, such as the thickness of a multi-layer substrate, which refers to the total thickness of all the layers that make up the substrate.
基材亦可除了前述樹脂等主要之構成材料以外,含有填充材、著色劑、抗氧化劑、有機滑劑、觸媒、軟化劑(塑化劑)等公知之各種添加劑。In addition to the aforementioned main constituent materials such as resins, the substrate may also contain various known additives such as fillers, colorants, antioxidants, organic lubricants, catalysts, and plasticizers.
基材可為透明及非透明的任一種,亦可根據目的而著色,亦可蒸鍍有其他層。 於保護膜形成膜具有能量線硬化性之情形時,基材較佳為使能量線穿透。The substrate can be either transparent or opaque, and can be colored or coated with other layers depending on the purpose. When the protective film has energy line hardening properties, the substrate is preferably designed to allow energy lines to pass through.
基材亦可為了調節與設置於該基材之上的層(例如黏著劑層、保護膜形成膜或前述其他層)之密接性,而對表面實施有下述處理:利用噴砂處理、溶劑處理等之凹凸化處理;電暈放電處理、電子束照射處理、電漿處理、臭氧-紫外線照射處理、火焰處理、鉻酸處理、熱風處理等氧化處理;親油處理;親水處理等。而且,基材亦可表面經底塗處理。The substrate may also undergo surface treatments to adjust its adhesion to layers disposed on it (e.g., adhesive layers, protective film forming films, or other aforementioned layers), such as: roughening treatments using sandblasting, solvent treatment, etc.; oxidation treatments such as corona discharge treatment, electron beam irradiation treatment, plasma treatment, ozone-ultraviolet irradiation treatment, flame treatment, chromic acid treatment, hot air treatment, etc.; oleophilic treatment; hydrophilic treatment, etc. Furthermore, the substrate may also undergo a surface primer treatment.
基材亦可藉由含有特定範圍之成分(例如樹脂等),而於至少一面具有黏著性。The substrate can also have adhesiveness on at least one side by containing a specific range of components (such as resin).
基材可藉由公知之方法製造。例如,含有樹脂之基材可藉由將含有前述樹脂之樹脂組成物加以成形而製造。The substrate can be manufactured by known methods. For example, a resin-containing substrate can be manufactured by molding a resin composition containing the aforementioned resin.
○黏著劑層 前述黏著劑層為片狀或膜狀,含有黏著劑。 作為前述黏著劑,例如可列舉:丙烯酸樹脂、胺基甲酸酯樹脂、橡膠系樹脂、聚矽氧樹脂、環氧系樹脂、聚乙烯醚、聚碳酸酯、酯系樹脂等黏著性樹脂。○ Adhesive Layer The aforementioned adhesive layer is in sheet or film form and contains an adhesive. Examples of such adhesives include: acrylic resins, carbamate resins, rubber-based resins, polysiloxane resins, epoxy resins, polyvinyl ether, polycarbonate, ester-based resins, and other adhesive resins.
黏著劑層可由一層(單層)所構成,亦可由兩層以上之多層所構成,於由多層所構成之情形時,這些多層可彼此相同亦可不同,這些多層之組合並無特別限定。The adhesive layer can consist of a single layer or multiple layers. When it consists of multiple layers, these multiple layers can be the same or different from each other, and there are no particular restrictions on the combination of these multiple layers.
黏著劑層之厚度並無特別限定,較佳為1μm至100μm,更佳為1μm至60μm,尤佳為1μm至30μm。 此處,所謂「黏著劑層之厚度」,意指黏著劑層總體之厚度,例如所謂由多層所構成之黏著劑層之厚度,意指構成黏著劑層之所有層之合計厚度。The thickness of the adhesive layer is not particularly limited, but it is preferably 1 μm to 100 μm, more preferably 1 μm to 60 μm, and even more preferably 1 μm to 30 μm. Here, the term "thickness of the adhesive layer" refers to the overall thickness of the adhesive layer, such as the thickness of an adhesive layer composed of multiple layers, which means the total thickness of all the layers that make up the adhesive layer.
黏著劑層可為透明及非透明的任一種,亦可根據目的而著色。 於保護膜形成膜具有能量線硬化性之情形時,黏著劑層較佳為使能量線穿透。The adhesive layer can be either transparent or opaque, and can also be colored depending on the purpose. When the protective film has energy line hardening properties, the adhesive layer is preferably designed to allow the energy lines to pass through.
黏著劑層可為能量線硬化性及非能量線硬化性的任一種。能量線硬化性黏著劑層係能夠調節硬化前及硬化後之物性。例如,藉由在後述的具保護膜之晶片之拾取前使能量線硬化性黏著劑層硬化,而可更容易地拾取該具保護膜之晶片。The adhesive layer can be either line-cured or non-line-cured. A line-cured adhesive layer allows for adjustment of its properties before and after curing. For example, by curing the line-cured adhesive layer before picking up the protective film wafer (described later), the protective film wafer can be picked up more easily.
於本說明書中,即便於能量線硬化性黏著劑層進行能量線硬化之後,亦只要維持基材與能量線硬化性黏著劑層之硬化物的積層結構,則將該積層結構體稱為「支撐片」。In this specification, even after the energy line curing adhesive layer has been energy line cured, as long as the laminated structure of the substrate and the cured energy line curing adhesive layer is maintained, the laminated structure is referred to as a "support sheet".
黏著劑層可利用含有黏著劑之黏著劑組成物而形成。例如,於黏著劑層之形成對象面塗敷黏著劑組成物,根據需要加以乾燥,藉此可於目標部位形成黏著劑層。黏著劑組成物中的於常溫不氣化之成分彼此之含量之比率通常與黏著劑層中的前述成分彼此之含量之比率相同。An adhesive layer can be formed using an adhesive composition containing an adhesive. For example, an adhesive composition is applied to the object surface to which the adhesive layer is to be formed, and then dried as needed, thereby forming an adhesive layer on the target area. The ratio of the non-vaporizable components in the adhesive composition to each other at room temperature is usually the same as the ratio of the aforementioned components to each other in the adhesive layer.
於黏著劑層中,相對於黏著劑層之總質量,黏著劑層之一種或兩種以上之後述的含有成分之合計含量之比率不超過100質量%。 同樣地,於黏著劑組成物中,相對於黏著劑組成物之總質量,黏著劑組成物之一種或兩種以上之後述的含有成分之合計含量之比率不超過100質量%。In the adhesive layer, the percentage of the total content of one or more of the ingredients described below in the adhesive layer does not exceed 100% by mass relative to the total mass of the adhesive layer. Similarly, in the adhesive composition, the percentage of the total content of one or more of the ingredients described below in the adhesive composition does not exceed 100% by mass relative to the total mass of the adhesive composition.
黏著劑組成物之塗敷及乾燥例如可藉由與上述保護膜形成用組成物之塗敷及乾燥之情形相同之方法進行。The application and drying of the adhesive composition can be carried out, for example, by the same method as the application and drying of the composition for forming the protective film described above.
於黏著劑層為能量線硬化性之情形時,作為能量線硬化性之黏著劑組成物,例如可列舉下述黏著劑組成物等:黏著劑組成物(I-1),含有非能量線硬化性之黏著性樹脂(I-1a)(以下,有時簡稱為「黏著性樹脂(I-1a)」)及能量線硬化性化合物;黏著劑組成物(I-2),含有於非能量線硬化性之黏著性樹脂(I-1a)之側鏈導入有不飽和基的能量線硬化性之黏著性樹脂(I-2a)(以下,有時簡稱為「黏著性樹脂(I-2a)」);以及黏著劑組成物(I-3),含有前述黏著性樹脂(I-2a)及能量線硬化性化合物。When the adhesive layer is energy-line hardening, the energy-line hardening adhesive composition may include, for example, the following adhesive compositions: adhesive composition (I-1), containing a non-energy-line hardening adhesive resin (I-1a) (hereinafter sometimes simply referred to as "adhesive resin (I-1a)") and an energy-line hardening compound; adhesive composition (I-2), containing an energy-line hardening adhesive resin (I-2a) (hereinafter sometimes simply referred to as "adhesive resin (I-2a)") with unsaturated groups introduced into the side chains of the non-energy-line hardening adhesive resin (I-1a); and adhesive composition (I-3), containing the aforementioned adhesive resin (I-2a) and an energy-line hardening compound.
於黏著劑層為非能量線硬化性之情形時,作為非能量線硬化性之黏著劑組成物,例如可列舉:含有前述非能量線硬化性之黏著性樹脂(I-1a)的黏著劑組成物(I-4)等。When the adhesive layer is non-energy-line curing, examples of non-energy-line curing adhesive compositions include adhesive compositions (I-4) containing the aforementioned non-energy-line curing adhesive resin (I-1a).
[非能量線硬化性之黏著性樹脂(I-1a)] 前述黏著性樹脂(I-1a)較佳為丙烯酸樹脂。[Non-energy-line hardening adhesive resin (I-1a)] The aforementioned adhesive resin (I-1a) is preferably an acrylic resin.
作為前述丙烯酸樹脂,例如可列舉:至少具有源自(甲基)丙烯酸烷基酯之構成單元的丙烯酸聚合物。 作為前述(甲基)丙烯酸烷基酯,例如可列舉構成烷基酯之烷基之碳數為1至20的(甲基)丙烯酸烷基酯,前述烷基較佳為直鏈狀或分支鏈狀。Examples of the aforementioned acrylic resins include acrylic polymers having at least one constituent unit derived from an alkyl methacrylate. Examples of the aforementioned alkyl methacrylates include alkyl methacrylates in which the alkyl group forming the alkyl ester has 1 to 20 carbon atoms, preferably in a linear or branched form.
前述丙烯酸聚合物較佳為除了源自(甲基)丙烯酸烷基酯之構成單元以外,進而具有源自含官能基單體之構成單元。 作為前述含官能基單體,例如可列舉:藉由前述官能基與後述之交聯劑反應而成為交聯起點的單體。The aforementioned acrylic polymer is preferably composed of, in addition to the constituent units derived from (meth)acrylate alkyl esters, constituent units derived from functionalized monomers. Examples of such functionalized monomers include monomers that become crosslinking starting points through the reaction of the aforementioned functional groups with the crosslinking agent described later.
作為前述含官能基單體,例如可列舉:含羥基單體、含羧基單體、含胺基單體、含環氧基單體等。Examples of functionalized monomers include hydroxyl monomers, carboxyl monomers, amine monomers, and epoxy monomers.
前述丙烯酸聚合物亦可除了源自(甲基)丙烯酸烷基酯之構成單元、及源自含官能基單體之構成單元以外,進而具有源自其他單體之構成單元。 前述其他單體只要能夠與(甲基)丙烯酸烷基酯等共聚,則並無特別限定。 作為前述其他單體,例如可列舉:苯乙烯、α-甲基苯乙烯、乙烯基甲苯、甲酸乙烯酯、乙酸乙烯酯、丙烯腈、丙烯醯胺等。The aforementioned acrylic polymers may also have constituent units derived from (meth)acrylate alkyl esters, and constituent units derived from functionalized monomers, as well as constituent units derived from other monomers. There are no particular limitations on the aforementioned other monomers, as long as they can copolymerize with (meth)acrylate alkyl esters, etc. Examples of such other monomers include: styrene, α-methylstyrene, vinyltoluene, vinyl formate, vinyl acetate, acrylonitrile, acrylamide, etc.
於前述黏著劑組成物(I-1)、黏著劑組成物(I-2)、黏著劑組成物(I-3)及黏著劑組成物(I-4)(以下包括這些黏著劑組成物而簡稱為「黏著劑組成物(I-1)至黏著劑組成物(I-4)」)中,前述丙烯酸聚合物等前述丙烯酸樹脂所具有之構成單元可僅為一種,亦可為兩種以上,於為兩種以上之情形時,這些構成單元之組合及比率可任意地選擇。In the aforementioned adhesive composition (I-1), adhesive composition (I-2), adhesive composition (I-3) and adhesive composition (I-4) (hereinafter referred to as "adhesive composition (I-1) to adhesive composition (I-4)"), the aforementioned acrylic polymer and other acrylic resins may have only one type of constituent unit or more than two types. In the case of more than two types, the combination and ratio of these constituent units can be arbitrarily selected.
於前述丙烯酸聚合物中,相對於構成單元之總量,源自含官能基單體之構成單元之量之比率較佳為1質量%至35質量%。In the aforementioned acrylic polymer, the ratio of the amount of the constituent unit containing the functional group to the total amount of the constituent unit is preferably 1% to 35% by mass.
黏著劑組成物(I-1)或黏著劑組成物(I-4)所含有之黏著性樹脂(I-1a)可僅為一種,亦可為兩種以上,於為兩種以上之情形時,這些黏著性樹脂(I-1a)之組合及比率可任意地選擇。The adhesive resin (I-1a) contained in the adhesive composition (I-1) or adhesive composition (I-4) may be only one type or two or more types. In the case of two or more types, the combination and ratio of these adhesive resins (I-1a) may be arbitrarily selected.
於由黏著劑組成物(I-1)或黏著劑組成物(I-4)所形成之黏著劑層中,相對於前述黏著劑層之總質量,黏著性樹脂(I-1a)之含量之比率較佳為5質量%至99質量%。In the adhesive layer formed by adhesive composition (I-1) or adhesive composition (I-4), the content of adhesive resin (I-1a) is preferably 5% to 99% by mass relative to the total mass of the aforementioned adhesive layer.
[能量線硬化性之黏著性樹脂(I-2a)] 前述黏著性樹脂(I-2a)例如係藉由使具有能量線聚合性不飽和基之含不飽和基化合物與黏著性樹脂(I-1a)中之官能基反應而獲得。[Energy Line Hardening Adhesive Resin (I-2a)] The aforementioned adhesive resin (I-2a) is obtained, for example, by reacting an unsaturated compound containing an energy line polymerizable unsaturated group with the functional groups in the adhesive resin (I-1a).
前述含不飽和基化合物為除了前述能量線聚合性不飽和基以外,進而具有藉由與黏著性樹脂(I-1a)中之官能基反應而能夠與黏著性樹脂(I-1a)鍵結之基的化合物。 作為前述能量線聚合性不飽和基,例如可列舉(甲基)丙烯醯基、乙烯基(ethenyl)、烯丙基(2-丙烯基)等,較佳為(甲基)丙烯醯基。 作為能夠與黏著性樹脂(I-1a)中之官能基鍵結之基,例如可列舉:能夠與羥基或胺基鍵結之異氰酸酯基及縮水甘油基、以及能夠與羧基或環氧基鍵結之羥基及胺基等。The aforementioned unsaturated group-containing compounds are compounds that, in addition to the aforementioned energy-line polymerizable unsaturated groups, further possess a group capable of bonding with the adhesive resin (I-1a) through reaction with the functional groups in the adhesive resin (I-1a). Examples of the aforementioned energy-line polymerizable unsaturated groups include (meth)acrylyl, ethenyl, and allyl (2-propenyl), with (meth)acrylyl being preferred. Examples of groups capable of bonding with the functional groups in the adhesive resin (I-1a) include isocyanate groups and glycidyl groups capable of bonding with hydroxyl or amino groups, and hydroxyl and amino groups capable of bonding with carboxyl or epoxy groups.
作為前述含不飽和基化合物,例如可列舉:(甲基)丙烯醯氧基乙基異氰酸酯、(甲基)丙烯醯基異氰酸酯、(甲基)丙烯酸縮水甘油酯等。Examples of compounds containing unsaturated groups include (meth)acryloyloxyethyl isocyanate, (meth)acryloyl isocyanate, and (meth)acrylate glycidyl ester.
黏著劑組成物(I-2)或黏著劑組成物(I-3)所含有之黏著性樹脂(I-2a)可僅為一種,亦可為兩種以上,於為兩種以上之情形時,這些黏著性樹脂(I-2a)之組合及比率可任意地選擇。The adhesive resin (I-2a) contained in the adhesive composition (I-2) or adhesive composition (I-3) may be only one type or two or more types. In the case of two or more types, the combination and ratio of these adhesive resins (I-2a) may be arbitrarily selected.
於由黏著劑組成物(I-2)或黏著劑組成物(I-3)所形成之黏著劑層中,相對於前述黏著劑層之總質量,黏著性樹脂(I-2a)之含量之比率較佳為5質量%至99質量%。In the adhesive layer formed by adhesive composition (I-2) or adhesive composition (I-3), the content of adhesive resin (I-2a) is preferably 5% to 99% by mass relative to the total mass of the aforementioned adhesive layer.
[能量線硬化性化合物] 作為前述黏著劑組成物(I-1)或黏著劑組成物(I-3)所含有之前述能量線硬化性化合物,可列舉:具有能量線聚合性不飽和基且能夠藉由能量線之照射而硬化之單體或寡聚物。[Energy-line hardening compounds] The energy-line hardening compounds contained in the aforementioned adhesive composition (I-1) or adhesive composition (I-3) can be listed as: monomers or oligomers having energy-line polymerizable unsaturated groups and capable of being hardened by energy-line irradiation.
能量線硬化性化合物中,作為單體,例如可列舉:三羥甲基丙烷三(甲基)丙烯酸酯、季戊四醇(甲基)丙烯酸酯、季戊四醇四(甲基)丙烯酸酯、二季戊四醇六(甲基)丙烯酸酯、1,4-丁二醇二(甲基)丙烯酸酯、1,6-己二醇(甲基)丙烯酸酯等多元(甲基)丙烯酸酯;(甲基)丙烯酸胺基甲酸酯;聚酯(甲基)丙烯酸酯;聚醚(甲基)丙烯酸酯;環氧(甲基)丙烯酸酯等。 能量線硬化性化合物中,作為寡聚物,例如可列舉作為上述所例示之單體之聚合物的寡聚物等。Examples of monomers in energy line curing compounds include: trimethylolpropane tri(meth)acrylate, pentaerythritol (meth)acrylate, pentaerythritol tetra(meth)acrylate, dipentaerythritol hexa(meth)acrylate, 1,4-butanediol di(meth)acrylate, 1,6-hexanediol (meth)acrylate, and other poly(meth)acrylates; (meth)acrylate aminocarbamates; polyester (meth)acrylates; polyether (meth)acrylates; epoxy (meth)acrylates, etc. Examples of oligomers in energy line curing compounds include oligomers that are polymers of the monomers exemplified above.
黏著劑組成物(I-1)或黏著劑組成物(I-3)所含有之前述能量線硬化性化合物可僅為一種,亦可為兩種以上,於為兩種以上之情形時,這些能量線硬化性化合物之組合及比率可任意地選擇。The adhesive composition (I-1) or adhesive composition (I-3) may contain only one or more of the aforementioned energy line hardening compounds. In the case of two or more, the combination and ratio of these energy line hardening compounds may be arbitrarily selected.
於由黏著劑組成物(I-1)或黏著劑組成物(I-3)所形成之黏著劑層中,相對於前述黏著劑層之總質量,前述能量線硬化性化合物之含量之比率較佳為1質量%至95質量%。In the adhesive layer formed by adhesive composition (I-1) or adhesive composition (I-3), the content of the aforementioned energy line hardening compound is preferably 1% to 95% by mass relative to the total mass of the aforementioned adhesive layer.
[交聯劑] 於利用除了源自(甲基)丙烯酸烷基酯之構成單元以外進而具有源自含官能基單體之構成單元的前述丙烯酸聚合物作為黏著性樹脂(I-1a)之情形時,黏著劑組成物(I-1)或黏著劑組成物(I-4)較佳為進而含有交聯劑。 而且,例如於利用與黏著性樹脂(I-1a)中同樣的具有源自含官能基單體之構成單元的前述丙烯酸聚合物作為黏著性樹脂(I-2a)之情形時,黏著劑組成物(I-2)或黏著劑組成物(I-3)亦可進而含有交聯劑。[Crosslinking Agent] When using the aforementioned acrylic polymer as an adhesive resin (I-1a) that has, in addition to the constituent units derived from (meth)acrylate alkyl esters, also a constituent unit derived from a functional group, the adhesive composition (I-1) or adhesive composition (I-4) preferably contains a crosslinking agent. Moreover, for example, when using the aforementioned acrylic polymer as an adhesive resin (I-2a) that has the same constituent units derived from functional groups as in adhesive resin (I-1a), the adhesive composition (I-2) or adhesive composition (I-3) may also contain a crosslinking agent.
前述交聯劑例如與前述官能基反應,將黏著性樹脂(I-1a)彼此或黏著性樹脂(I-2a)彼此加以交聯。 作為交聯劑,例如可列舉:甲苯二異氰酸酯、六亞甲基二異氰酸酯、二甲苯二異氰酸酯、這些二異氰酸酯之加合物等異氰酸酯系交聯劑(具有異氰酸酯基之交聯劑);乙二醇縮水甘油醚等環氧系交聯劑(具有縮水甘油基之交聯劑);六[1-(2-甲基)-氮丙啶基]三磷雜三嗪等氮丙啶系交聯劑(具有氮丙啶基之交聯劑);鋁螯合物等金屬螯合系交聯劑(具有金屬螯合結構之交聯劑);異氰脲酸酯系交聯劑(具有異氰脲酸骨架之交聯劑)等。The aforementioned crosslinking agent, for example, reacts with the aforementioned functional groups to crosslink adhesive resins (I-1a) with each other or adhesive resins (I-2a) with each other. Examples of crosslinking agents include: toluene diisocyanate, hexamethylene diisocyanate, xylene diisocyanate, and adducts of these diisocyanates (crosslinking agents with isocyanate groups); epoxy crosslinking agents such as ethylene glycol glycidyl ether (crosslinking agents with glycidyl groups); aziridine crosslinking agents such as hexa[1-(2-methyl)aziridinyl]triphosphatrazine (crosslinking agents with aziridine groups); metal chelating crosslinking agents such as aluminum chelates (crosslinking agents with metal chelating structures); and isocyanurate crosslinking agents (crosslinking agents with an isocyanuric acid skeleton).
黏著劑組成物(I-1)至黏著劑組成物(I-4)所含有之交聯劑可僅為一種,亦可為兩種以上,於為兩種以上之情形時,這些交聯劑之組合及比率可任意地選擇。The crosslinking agent contained in the adhesive composition (I-1) to the adhesive composition (I-4) may be only one type or two or more types. In the case of two or more types, the combination and ratio of these crosslinking agents can be arbitrarily selected.
於前述黏著劑組成物(I-1)或黏著劑組成物(I-4)中,相對於黏著性樹脂(I-1a)之含量100質量份,交聯劑之含量較佳為0.01質量份至50質量份。 於前述黏著劑組成物(I-2)或黏著劑組成物(I-3)中,相對於黏著性樹脂(I-2a)之含量100質量份,交聯劑之含量較佳為0.01質量份至50質量份。In the aforementioned adhesive composition (I-1) or adhesive composition (I-4), the content of crosslinking agent is preferably 0.01 to 50 parts by weight relative to 100 parts by weight of adhesive resin (I-1a). In the aforementioned adhesive composition (I-2) or adhesive composition (I-3), the content of crosslinking agent is preferably 0.01 to 50 parts by weight relative to 100 parts by weight of adhesive resin (I-2a).
[光聚合起始劑] 黏著劑組成物(I-1)、黏著劑組成物(I-2)及黏著劑組成物(I-3)(以下包括這些黏著劑組成物而簡稱為「黏著劑組成物(I-1)至黏著劑組成物(I-3)」)亦可進而含有光聚合起始劑。含有光聚合起始劑之黏著劑組成物(I-1)至黏著劑組成物(I-3)即便照射紫外線等能量相對較低之能量線,亦充分進行硬化反應。[Photopolymerization Initiator] Adhesive components (I-1), (I-2), and (I-3) (hereinafter referred to as "Adhesive Components (I-1) to Adhesive Components (I-3)") may further contain a photopolymerization initiator. Adhesive components (I-1) to (I-3) containing a photopolymerization initiator undergo sufficient hardening reaction even when irradiated with relatively low-energy rays such as ultraviolet light.
作為前述光聚合起始劑,例如可列舉與上述光聚合起始劑(H)同樣之光聚合起始劑。As a photopolymerization initiator, for example, other photopolymerization initiators similar to the aforementioned photopolymerization initiator (H) can be listed.
黏著劑組成物(I-1)至黏著劑組成物(I-3)所含有之光聚合起始劑可僅為一種,亦可為兩種以上,於為兩種以上之情形時,這些光聚合起始劑之組合及比率可任意地選擇。The photopolymerization initiator contained in the adhesive composition (I-1) to the adhesive composition (I-3) may be only one type or two or more types. In the case of two or more types, the combination and ratio of these photopolymerization initiators may be arbitrarily selected.
於黏著劑組成物(I-1)中,相對於前述能量線硬化性化合物之含量100質量份,光聚合起始劑之含量較佳為0.01質量份至20質量份。 於黏著劑組成物(I-2)中,相對於黏著性樹脂(I-2a)之含量100質量份,光聚合起始劑之含量較佳為0.01質量份至20質量份。 於黏著劑組成物(I-3)中,相對於黏著性樹脂(I-2a)及前述能量線硬化性化合物之總含量100質量份,光聚合起始劑之含量較佳為0.01質量份至20質量份。In the adhesive composition (I-1), the content of photopolymerization initiator is preferably 0.01 to 20 parts by mass relative to 100 parts by mass of the aforementioned energy line curing compound. In the adhesive composition (I-2), the content of photopolymerization initiator is preferably 0.01 to 20 parts by mass relative to 100 parts by mass of the adhesive resin (I-2a). In the adhesive composition (I-3), the content of photopolymerization initiator is preferably 0.01 to 20 parts by mass relative to 100 parts by mass of the total content of the adhesive resin (I-2a) and the aforementioned energy line curing compound.
[其他添加劑] 黏著劑組成物(I-1)至黏著劑組成物(I-4)亦可於不損及本發明功效之範圍內,含有不相當於上述任一成分之其他添加劑。 作為前述其他添加劑,例如可列舉:抗靜電劑、抗氧化劑、軟化劑(塑化劑)、填充材(填料)、防鏽劑、著色劑(顏料、染料)、敏化劑、增黏劑、反應延遲劑、交聯促進劑(觸媒)等公知之添加劑。 再者,所謂反應延遲劑,例如為抑制因混入黏著劑組成物(I-1)至黏著劑組成物(I-4)中之觸媒之作用造成保存中之黏著劑組成物(I-1)至黏著劑組成物(I-4)中進行非目標之交聯反應之成分。作為反應延遲劑,例如可列舉藉由對觸媒之螯合而形成螯合錯合物之化合物,更具體而言,可列舉於一分子中具有兩個以上之羰基(-C(=O)-)之化合物。[Other Additives] Adhesive compositions (I-1) to (I-4) may also contain other additives not equivalent to any of the above-mentioned components, to the extent that the efficacy of the invention is not impaired. Examples of such other additives include, for example, antistatic agents, antioxidants, softeners (plasticizers), fillers, rust inhibitors, colorants (pigments, dyes), sensitizers, tackifiers, reaction retarders, crosslinking promoters (catalysts), and other known additives. Furthermore, a reaction retarder is, for example, a component that inhibits unintended cross-linking reactions in the adhesive components (I-1) to (I-4) during storage due to the catalytic action of the catalyst mixed in with the adhesive components (I-1) to (I-4). Examples of reaction retarders include compounds that form chelate complexes by chelating the catalyst; more specifically, compounds having two or more carbonyl groups (-C(=O)-) in one molecule.
黏著劑組成物(I-1)至黏著劑組成物(I-4)所含有之其他添加劑可僅為一種,亦可為兩種以上,於為兩種以上之情形時,這些其他添加劑之組合及比率可任意地選擇。The adhesive composition (I-1) to adhesive composition (I-4) may contain only one or more other additives. In the case of two or more additives, the combination and ratio of these other additives may be arbitrarily selected.
黏著劑組成物(I-1)至黏著劑組成物(I-4)之其他添加劑之含量並無特別限定,只要根據添加劑之種類而適當選擇即可。There are no particular limitations on the content of other additives in adhesive compositions (I-1) to adhesive compositions (I-4), as long as they are selected appropriately according to the type of additive.
[溶媒] 黏著劑組成物(I-1)至黏著劑組成物(I-4)亦可含有溶媒。黏著劑組成物(I-1)至黏著劑組成物(I-4)藉由含有溶媒,而提高相對於塗敷對象面之塗敷適性。[Soluble] Adhesive components (I-1) to adhesive components (I-4) may also contain a solvent. Adhesive components (I-1) to adhesive components (I-4) improve their application suitability relative to the application surface by containing a solvent.
前述溶媒較佳為有機溶媒,作為前述有機溶媒,例如可列舉:甲基乙基酮、丙酮等酮;乙酸乙酯等酯(羧酸酯);四氫呋喃、二噁烷等醚;環己烷、正己烷等脂肪族烴;甲苯、二甲苯等芳香族烴;1-丙醇、2-丙醇等醇等。The aforementioned solvent is preferably an organic solvent. Examples of such organic solvents include: ketones such as methyl ethyl ketone and acetone; esters (carboxylic acid esters) such as ethyl acetate; ethers such as tetrahydrofuran and dioxane; aliphatic hydrocarbons such as cyclohexane and n-hexane; aromatic hydrocarbons such as toluene and xylene; and alcohols such as 1-propanol and 2-propanol.
黏著劑組成物(I-1)至黏著劑組成物(I-4)所含有之溶媒可僅為一種,亦可為兩種以上,於為兩種以上之情形時,這些溶媒之組合及比率可任意地選擇。The adhesive composition (I-1) to adhesive composition (I-4) may contain only one type of solvent or two or more types of solvent. In the case of two or more types of solvent, the combination and ratio of these solvents may be arbitrarily selected.
黏著劑組成物(I-1)至黏著劑組成物(I-4)之溶媒之含量並無特別限定,只要適當調節即可。There is no particular limitation on the content of solvent in adhesive components (I-1) to adhesive components (I-4), as long as it is adjusted appropriately.
○黏著劑組成物的製造方法 黏著劑組成物例如除了調配成分之種類不同之方面以外,可藉由與上文所說明之保護膜形成用組成物之情形相同的方法製造。○ Method for manufacturing adhesive composition Adhesive composition, except for the different types of formulations, can be manufactured by the same method as the protective film forming composition described above.
◇保護膜形成用複合片的製造方法 前述保護膜形成用複合片可藉由下述方式製造:將上述各層以成為對應之位置關係之方式積層,根據需要而調節一部分或所有層之形狀。各層之形成方法如上文所說明。◇ Manufacturing method of composite sheet for forming protective film The aforementioned composite sheet for forming protective film can be manufactured by laminating the above layers in a corresponding positional relationship, and adjusting the shape of some or all of the layers as needed. The formation method of each layer is as described above.
例如,於製造支撐片時當於基材上積層黏著劑層之情形時,只要於基材上塗敷上述黏著劑組成物,根據需要加以乾燥即可。 而且,藉由下述方法亦能夠於基材上積層黏著劑層:於剝離膜上塗敷黏著劑組成物,根據需要加以乾燥,藉此於剝離膜上預先形成黏著劑層,將該黏著劑層的露出面與基材的一表面貼合。此時,黏著劑組成物較佳為塗敷於剝離膜的剝離處理面。而且,該情形之剝離膜只要於保護膜形成用複合片之製造過程或使用過程的任一時機去掉即可。 至此為止,列舉於基材上積層黏著劑層之情形為例,但上述方法例如亦可應用於在基材上積層黏著劑層以外之其他層之情形。For example, when an adhesive layer is deposited on a substrate during the manufacture of a support sheet, the adhesive composition described above can simply be applied to the substrate and dried as needed. Furthermore, an adhesive layer can also be deposited on the substrate by applying an adhesive composition to a release film and drying it as needed, thereby pre-forming an adhesive layer on the release film, and then adhering the exposed surface of the adhesive layer to a surface of the substrate. In this case, the adhesive composition is preferably applied to the release-treated surface of the release film. Moreover, in this situation, the release film can be removed at any time during the manufacturing or use of the composite sheet for forming the protective film. So far, we have taken the case of an adhesive layer being laminated on a substrate as an example, but the above method can also be applied to cases where other layers besides an adhesive layer are laminated on a substrate.
另一方面,例如於已積層於基材上之黏著劑層之上進而積層保護膜形成膜之情形時,可於黏著劑層上塗敷保護膜形成用組成物,直接形成保護膜形成膜。保護膜形成膜以外之層亦可利用用以形成該層之組成物,藉由同樣之方法於黏著劑層之上積層該層。如此,於已積層於基材上之任一層(以下有時簡稱為「第一層」)上形成新的層(以下簡稱為「第二層」)而形成連續兩層之積層結構(換言之,第一層及第二層之積層結構)之情形時,可應用於前述第一層上塗敷用以形成前述第二層之組成物,根據需要加以乾燥之方法。 然而,第二層較佳為利用用以形成該第二層之組成物而於剝離膜上預先形成,將該已形成之第二層中的與接觸於前述剝離膜之側為相反側之露出面來與第一層的露出面貼合,藉此形成連續兩層之積層結構。此時,前述組成物較佳為塗敷於剝離膜之剝離處理面。剝離膜只要於形成積層結構後,根據需要而去掉即可。 此處,列舉於黏著劑層上積層保護膜形成膜之情形為例,但例如於黏著劑層上積層保護膜形成膜以外之層(膜)之情形等時,成為對象之積層結構可任意選擇。On the other hand, when a protective film is deposited on top of an adhesive layer already deposited on a substrate, a protective film forming component can be applied to the adhesive layer to directly form the protective film forming film. Layers other than the protective film forming film can also be formed using the same component used to form those layers, deposited on the adhesive layer using the same method. Thus, when a new layer (hereinafter referred to as "second layer") is formed on any layer already deposited on the substrate (hereinafter sometimes referred to as "first layer") to form a laminated structure of two consecutive layers (in other words, a laminated structure of the first layer and the second layer), the method of applying the composition for forming the second layer to the first layer and drying it as needed can be applied. However, the second layer is preferably pre-formed on the release film using the composition for forming the second layer, and the exposed surface of the already formed second layer, which is opposite to the side in contact with the release film, is adhered to the exposed surface of the first layer, thereby forming a laminated structure of two consecutive layers. In this case, the aforementioned composition is preferably applied to the peeling treatment surface of the peeling membrane. The peeling membrane can be removed as needed after the lamination structure is formed. Here, the case of forming a protective film on the adhesive layer is taken as an example, but in cases such as forming a layer (film) other than the protective film on the adhesive layer, the lamination structure can be arbitrarily chosen.
如此,構成保護膜形成用複合片之基材以外之層均能夠藉由預先形成於剝離膜上並貼合於目標層的表面之方法來積層,故而只要根據需要適當選擇採用此種步驟之層而製造保護膜形成用複合片即可。In this way, all layers other than the substrate constituting the composite sheet for forming the protective film can be deposited by pre-forming on the release film and attaching it to the surface of the target layer. Therefore, the composite sheet for forming the protective film can be manufactured by appropriately selecting the layers using this step as needed.
再者,保護膜形成用複合片通常係以於與支撐片為相反側之最表層(例如保護膜形成膜)的表面貼合有剝離膜之狀態來保管。因此,於該剝離膜(較佳為剝離處理面)上塗敷保護膜形成用組成物等用以形成構成最表層之層的組成物,根據需要加以乾燥,藉此於剝離膜上預先形成構成最表層之層,於該層中的與接觸於剝離膜之側為相反側的露出面上積層其餘各層,不將剝離膜去掉而保持貼合之狀態,藉此可獲得具剝離膜之保護膜形成用複合片。Furthermore, protective film forming composite sheets are typically stored with a release film adhered to the surface of the outermost layer (e.g., the protective film forming film) opposite to the support sheet. Therefore, a protective film forming component or other component used to form the outermost layer is applied to the release film (preferably the peeling treatment surface), and dried as needed, thereby pre-forming the outermost layer on the release film. The remaining layers are then deposited on the exposed surface of this layer opposite to the side in contact with the release film. By maintaining the adhered state without removing the release film, a protective film forming composite sheet with a release film can be obtained.
◇具保護膜之工件的製造方法(保護膜形成膜以及保護膜形成用複合片之使用方法) 前述保護膜形成膜以及保護膜形成用複合片係可用於製造由具備工件、及設置於前述工件中任一處之保護膜而成之具保護膜之工件。◇ Method for manufacturing a workpiece with a protective film (method of using a protective film forming film and a composite sheet for forming a protective film) The aforementioned protective film forming film and the composite sheet for forming a protective film can be used to manufacture a workpiece with a protective film, which consists of a workpiece and a protective film disposed at any part of the aforementioned workpiece.
本實施形態之具保護膜之工件的製造方法係具有下述步驟:貼附步驟,將未構成前述保護膜形成用複合片之保護膜形成膜、或前述保護膜形成用複合片中之保護膜形成膜貼附於前述工件的目標部位,藉此製作由具備前述工件以及保護膜形成膜而成之具保護膜形成膜之工件;熱硬化步驟,於前述貼附步驟後,使前述保護膜形成膜進行熱硬化,形成前述保護膜,藉此製作前述具保護膜之工件。 工件為晶圓之情形時,作為前述具保護膜之工件,可列舉由具備晶圓及設置於前述晶圓的內面之保護膜而成之具保護膜之晶圓。 前述具保護膜之晶圓的製造方法係具有下述步驟:貼附步驟,將未構成前述保護膜形成用複合片之保護膜形成膜、或前述保護膜形成用複合片中之保護膜形成膜貼附於前述晶圓的內面,製作由具備前述晶圓、以及設置於前述晶圓的內面之前述保護膜形成膜而成之具保護膜形成膜之工件;熱硬化步驟,於前述貼附步驟後,使前述保護膜形成膜進行熱硬化,形成前述保護膜,藉此製作前述具保護膜之工件。The method for manufacturing a workpiece with a protective film according to this embodiment includes the following steps: an attachment step, in which a protective film forming film, which does not constitute the aforementioned protective film forming composite sheet, or a protective film forming film in the aforementioned protective film forming composite sheet, is attached to a target area of the aforementioned workpiece, thereby producing a workpiece with a protective film forming film formed by having the aforementioned workpiece and the protective film forming film; and a thermosetting step, in which, after the aforementioned attachment step, the aforementioned protective film forming film is thermoset to form the aforementioned protective film, thereby producing the aforementioned workpiece with a protective film. When the workpiece is a wafer, a wafer with a protective film formed by having a wafer and a protective film disposed on the inner surface of the aforementioned wafer can be cited as an example of a workpiece with a protective film. The aforementioned method for manufacturing a wafer with a protective film includes the following steps: an attachment step, in which a protective film forming film that does not constitute the aforementioned protective film forming composite, or a protective film forming film in the aforementioned protective film forming composite, is attached to the inner surface of the aforementioned wafer to produce a workpiece having a protective film forming film, which is formed by having the aforementioned wafer and the aforementioned protective film forming film disposed on the inner surface of the aforementioned wafer; and a thermosetting step, in which, after the aforementioned attachment step, the aforementioned protective film forming film is thermoset to form the aforementioned protective film, thereby producing the aforementioned workpiece having a protective film.
[具保護膜之晶圓的製造方法(製造方法(1-1))] 以下,作為具保護膜之工件的製造方法,列舉具保護膜之晶圓的製造方法為例,一邊引用圖式一邊加以說明。[Manufacturing Method of Wafer with Protective Film (Manufacturing Method (1-1))] Hereinafter, as a manufacturing method of workpiece with protective film, the manufacturing method of wafer with protective film will be given as an example, and the explanation will be carried out with reference to the drawings.
圖6係用以示意性地說明本實施形態之具保護膜之晶圓的製造方法中利用保護膜形成膜之情形的製造方法之一例(於本說明書中,有時稱為「製造方法(1-1)」)的剖面圖。此處,對利用如圖1所示之保護膜形成膜13之情形加以說明。Figure 6 is a cross-sectional view illustrating one example of a manufacturing method in which a protective film is formed in the manufacturing method of a wafer with a protective film according to the present embodiment (sometimes referred to as "manufacturing method (1-1)" in this specification). Here, the case of forming film 13 using the protective film shown in Figure 1 will be explained.
於前述製造方法(1-1)之前述貼附步驟中,首先,如圖6(a)所示,使用移除了第一剝離膜151而於一面(在此為第二面13b)具備有第二剝離膜152、另一面(在此為第一面13a)呈露出狀態之保護膜形成膜13,將該保護膜形成膜13之第一面13a貼附於晶圓9的內面9b,如圖6(c)所示,製作具保護膜形成膜之晶圓901。In the attachment step described in the aforementioned manufacturing method (1-1), firstly, as shown in FIG6(a), a protective film forming film 13 with the first release film 151 removed and having a second release film 152 on one side (here, the second side 13b) and the other side (here, the first side 13a) exposed is attached to the inner side 9b of the wafer 9, as shown in FIG6(c), to produce a wafer 901 with a protective film forming film.
圖6(a)中之箭頭係表示保護膜形成膜13往晶圓9之貼附方向。 此時,晶圓9較佳係例如此處所示般設置於能夠調節自身的溫度之台8上,藉由台8之加熱將晶圓9預先進行加熱,並於該經加熱之狀態的晶圓9貼附保護膜形成膜13。 晶圓9為了於內面9b貼附保護膜形成膜13,而將具備突狀電極90的電路面9a側朝向台8並設置於台8上。此外,此處省略晶圓9的電路的圖示。In Figure 6(a), the arrows indicate the direction in which the protective film 13 is attached to the wafer 9. Preferably, the wafer 9 is placed on a temperature-regulating platform 8, as shown here, to preheat the wafer 9, and the protective film 13 is attached to the heated wafer 9. To attach the protective film 13 to its inner surface 9b, the wafer 9 is positioned with the surface area 9a, which has protruding electrodes 90, facing the platform 8. The circuit diagram of the wafer 9 is omitted here.
將保護膜形成膜13貼附於晶圓9的內面時,從保護膜形成膜13的與晶圓9側為相反側介隔第二剝離膜152以層壓輥161等之按壓機構進行按壓。When the protective film forming film 13 is attached to the inner surface of the wafer 9, it is pressed from the side of the protective film forming film 13 opposite to the side of the wafer 9 by a pressing mechanism such as a lamination roller 161.
保護膜形成膜13向晶圓9之貼附條件並無特別限定。通常,貼附時之保護膜形成膜13之溫度(貼附溫度)較佳為20℃至100℃,貼附保護膜形成膜13之速度(貼附速度)較佳為0.1m/min至2m/min,於貼附時對保護膜形成膜13施加之壓力(貼附壓力)較佳為0.1MPa至0.6MPa。There are no particular limitations on the attachment conditions of the protective film forming film 13 to the wafer 9. Generally, the temperature of the protective film forming film 13 during attachment (attachment temperature) is preferably 20°C to 100°C, the attachment speed of the protective film forming film 13 is preferably 0.1 m/min to 2 m/min, and the pressure applied to the protective film forming film 13 during attachment (attachment pressure) is preferably 0.1 MPa to 0.6 MPa.
如圖6(b)以及圖6(c)所示,從向晶圓9貼附後之保護膜形成膜13去掉第二剝離膜152。例如從保護膜形成膜13的與晶圓9側為相反側介隔第二剝離膜152以層壓輥161進行按壓時,於第二剝離膜152與層壓輥161之間有時混入粒子狀的異物17,故有時粒子狀的異物17的按壓痕18會形成於保護膜形成膜13的與晶圓9側為相反側之表面13b。As shown in Figures 6(b) and 6(c), the second release film 152 is removed from the protective film 13 after it has been attached to the wafer 9. For example, when the second release film 152 is separated from the protective film 13 by a lamination roller 161, particulate foreign matter 17 may sometimes be mixed between the second release film 152 and the lamination roller 161. Therefore, sometimes the pressing marks 18 of the particulate foreign matter 17 will be formed on the surface 13b of the protective film 13 opposite to the wafer 9.
前述製造方法(1-1)之前述貼附步驟後,於前述熱硬化步驟中,使向晶圓9貼附後的保護膜形成膜13進行熱硬化,形成保護膜13’,如圖6(d)所示,藉此製作具保護膜之晶圓902。In the aforementioned manufacturing method (1-1), after the attachment step, the protective film forming film 13 attached to the wafer 9 is thermally cured in the aforementioned thermosetting step to form a protective film 13', as shown in FIG6(d), thereby producing a wafer 902 with a protective film.
於熱硬化步驟中保護膜形成膜之加熱條件,只要使保護膜形成膜進行熱硬化並形成保護膜,保護膜成為充分發揮功能之程度之硬化度,則並無特別限定。於熱硬化步驟中保護膜形成膜之加熱溫度較佳為100℃至180℃,更佳為110℃至160℃,尤佳為120℃至140℃。於熱硬化步驟中保護膜形成膜之加熱時間較佳為0.5h至5h,更佳為0.5h至4h,尤佳為1h至3h。The heating conditions for the protective film formation in the thermosetting step are not particularly limited, as long as the protective film is thermoset and forms a protective film to the extent that the protective film fully performs its function. The heating temperature for the protective film formation in the thermosetting step is preferably 100°C to 180°C, more preferably 110°C to 160°C, and even more preferably 120°C to 140°C. The heating time for the protective film formation in the thermosetting step is preferably 0.5h to 5h, more preferably 0.5h to 4h, and even more preferably 1h to 3h.
於利用先前之保護膜形成膜之情形時,按壓痕18形成於保護膜形成膜13的與晶圓9側為相反側之表面13b之情形時,即使歷經熱硬化步驟,按壓痕18仍然殘留,導致製作出不良品。 相對於此,於利用本實施形態之保護膜形成膜之製造方法(1-1)之情形時,假使於保護膜形成膜13之表面形成有按壓痕18等傷痕之情形,仍可藉由進行熱硬化步驟,利用因加熱所致之自我修復性的功效而縮小傷痕,使保護膜13’之表面的傷痕變得不明顯。When using the previous protective film forming method, if an indentation 18 is formed on the surface 13b of the protective film forming film 13 opposite to the wafer 9, the indentation 18 will remain even after a thermosetting process, resulting in defective products. In contrast, when using the protective film forming film manufacturing method (1-1) of this embodiment, if indentations 18 or other damage are formed on the surface of the protective film forming film 13, the damage can be reduced by performing a thermosetting process, utilizing the self-repairing effect caused by heating, making the damage on the surface of the protective film 13' less noticeable.
前述製造方法(1-1)較佳係於前述貼附步驟後且前述熱硬化步驟前具有加熱步驟,此加熱步驟係在不使保護膜形成膜13進行熱硬化之條件下將保護膜形成膜13進行加熱。在不使保護膜形成膜13進行熱硬化之條件下將保護膜形成膜13進行加熱,藉此可縮小保護膜形成膜13之表面的傷痕,使保護膜13’之表面的傷痕變得更不明顯。The aforementioned manufacturing method (1-1) preferably includes a heating step after the aforementioned attachment step and before the aforementioned thermosetting step. This heating step involves heating the protective film forming film 13 without thermosetting it. Heating the protective film forming film 13 without thermosetting it reduces surface scratches on the protective film forming film 13, making the surface scratches on the protective film 13' less noticeable.
於加熱步驟中保護膜形成膜之加熱條件,只要能夠不使保護膜形成膜13熱硬化,而使保護膜形成膜13之表面的傷痕縮小,則並無特別限定。於加熱步驟中保護膜形成膜之加熱溫度較佳為75℃至105℃,更佳為80℃至100℃,尤佳為85℃至95℃。於加熱步驟中保護膜形成膜之加熱時間較佳為0.5h至5h,更佳為0.5h至4h,尤佳為1h至3h。The heating conditions for forming the protective film in the heating step are not particularly limited, as long as they prevent the protective film 13 from thermally hardening and reduce the surface scratches of the protective film 13. The heating temperature for forming the protective film in the heating step is preferably 75°C to 105°C, more preferably 80°C to 100°C, and even more preferably 85°C to 95°C. The heating time for forming the protective film in the heating step is preferably 0.5h to 5h, more preferably 0.5h to 4h, and even more preferably 1h to 3h.
利用上述所獲得之具保護膜之晶圓902,分割晶圓9並切斷保護膜13’,可藉此製作具保護膜之晶片(圖示省略)。Using the wafer 902 with protective film obtained above, wafer 9 is diced and protective film 13' is cut, thereby producing a chip with protective film (illustration omitted).
至此為止,作為製造方法(1-1),對利用保護膜形成膜之情形的具保護膜之晶圓的製造方法進行了說明,但亦可代替保護膜形成膜而利用具備保護膜形成膜之保護膜形成用複合片來製造具保護膜之晶圓。Up to this point, as a manufacturing method (1-1), a method for manufacturing a wafer with a protective film using a protective film forming film has been explained. However, a composite wafer for forming a protective film with a protective film forming film can also be used instead of a protective film forming film to manufacture a wafer with a protective film forming film.
[具保護膜之晶圓的製造方法(製造方法(1-2))] 圖7係用以示意性地說明於本實施形態之具保護膜之晶圓的製造方法中,利用未構成保護膜形成用複合片之保護膜形成膜,而進而具有輸送步驟之情形的製造方法之一例(於本說明書中有時稱為「製造方法(1-2)」)的剖面圖。此處,對利用如圖1所示之保護膜形成膜13之情形進行說明。[Method for Manufacturing a Wafer with a Protective Film (Manufacturing Method (1-2))] Figure 7 is a cross-sectional view schematically illustrating one example of a manufacturing method in this embodiment of the method for manufacturing a wafer with a protective film, in which a protective film forming film is formed using a protective film that does not constitute a protective film forming composite, and a transport step is performed (sometimes referred to in this specification as "manufacturing method (1-2)"). Here, the case of using the protective film forming film 13 as shown in Figure 1 will be explained.
製造方法(1-2)之前述貼附步驟,可以利用層壓輥之方法等與製造方法(1-1)之前述貼附步驟相同方法來進行。 藉由前述製造方法(1-2)之前述貼附步驟,如圖7(a)所示般製作具保護膜形成膜之晶圓901。 即使於圖7(a)中也與圖6(c)相同,有時未圖示之按壓痕18等傷痕會形成於保護膜形成膜13的與晶圓9側為相反側之表面13b。The attachment step described in manufacturing method (1-2) can be performed using the same method as the attachment step described in manufacturing method (1-1), such as a lamination roller. Using the attachment step described in manufacturing method (1-2), a wafer 901 with a protective film is fabricated as shown in FIG. 7(a). Even in FIG. 7(a), as in FIG. 6(c), sometimes indentations such as pressure marks 18 (not shown) are formed on the surface 13b of the protective film 13, which is opposite to the wafer 9.
於前述輸送步驟中,繼而如圖7(b)所示,使具保護膜形成膜之晶圓901中之保護膜形成膜13的露出面(在此為第二面13b)接觸於用以輸送具保護膜形成膜之晶圓901所使用之輸送機構7,藉由輸送機構7,將具保護膜形成膜之晶圓901進行固定。 輸送機構7可為公知者,例如於輸送機構7與輸送對象物(在此為具保護膜形成膜之晶圓901)之接觸部中,可藉由使用吸附輸送對象物進行固定之機構(例如所謂吸附臂等)作為輸送機構7。作為該情形之前述接觸部,可列舉吸附盤。然而,輸送機構7並非限定於此,亦可藉由吸附輸送對象物以外的方式進行固定。 此外,在此僅顯示輸送機構7而省略剖面。In the aforementioned transport step, then as shown in FIG. 7(b), the exposed surface (here, the second surface 13b) of the protective film forming film 13 in the wafer 901 with the protective film forming film is brought into contact with the transport mechanism 7 used to transport the wafer 901 with the protective film forming film, thereby fixing the wafer 901 with the protective film forming film by the transport mechanism 7. The transport mechanism 7 can be any known type. For example, at the contact portion between the transport mechanism 7 and the transport object (here, the wafer 901 with the protective film forming film), a mechanism for fixing the transport object by adsorption (such as a so-called adsorption arm) can be used as the transport mechanism 7. As the aforementioned contact portion in this case, an adsorption tray can be cited as an example. However, the conveying mechanism 7 is not limited to this; it can also be fixed by means other than adsorption of the conveyed object. Furthermore, only the conveying mechanism 7 is shown here, and cross-sections are omitted.
於前述輸送步驟中,繼而如圖7(c)所示,將藉由輸送機構7所固定之狀態的具保護膜形成膜之晶圓901從台8扯離。 圖7(c)中之箭頭係表示具保護膜形成膜之晶圓901從台8進行扯離之方向。In the aforementioned transport step, then as shown in Figure 7(c), the wafer 901 with the protective film formed, which is fixed by the transport mechanism 7, is pulled away from the platform 8. The arrows in Figure 7(c) indicate the direction in which the wafer 901 with the protective film formed is pulled away from the platform 8.
另外,如圖7(d)所示,進而直接將具保護膜形成膜之晶圓901以藉由輸送機構7所固定之狀態進行輸送。此外,在圖7(d)中,以箭頭表示具保護膜形成膜之晶圓901的輸送方向,但此為輸送方向之一例,輸送方向並非僅限於該方向。Furthermore, as shown in Figure 7(d), the wafer 901 with the protective film forming film is then directly transported in a fixed state by the transport mechanism 7. In addition, in Figure 7(d), the transport direction of the wafer 901 with the protective film forming film is indicated by arrows, but this is only one example of the transport direction, and the transport direction is not limited to this direction.
於前述輸送步驟中,繼而如圖7(e)所示,於對目標場所之輸送後的具保護膜形成膜之晶圓901中,解除輸送機構7所為之固定狀態,將輸送機構7從具保護膜形成膜之晶圓901扯離。 如以上所述,前述輸送步驟結束。In the aforementioned transport step, then as shown in FIG7(e), the fixed state of the transport mechanism 7 is released from the wafer 901 with the protective film formed after transport to the target site, and the transport mechanism 7 is pulled away from the wafer 901 with the protective film formed. As described above, the aforementioned transport step is completed.
於前述輸送步驟結束後之具保護膜形成膜之晶圓901中之保護膜形成膜13(更具體而言,保護膜形成膜13的第二面13b)之中與輸送機構7中之固定部位的接觸處有時會形成有起因於輸送機構7的接觸之接觸痕19。例如若前述固定部位為平面形狀為圓形的吸附盤之情形時,有時圓形的接觸痕19形成於保護膜形成膜13的露出面。After the aforementioned conveying steps are completed, contact marks 19 may sometimes form at the contact point between the protective film forming film 13 (more specifically, the second surface 13b of the protective film forming film 13) in the wafer 901 with the protective film forming film and the fixing part in the conveying mechanism 7, due to contact with the conveying mechanism 7. For example, if the aforementioned fixing part is a planar suction tray with a circular shape, sometimes circular contact marks 19 are formed on the exposed surface of the protective film forming film 13.
前述製造方法(1-2)之前述輸送步驟後,於前述熱硬化步驟中,使對晶圓9之貼附後的保護膜形成膜13進行熱硬化,形成保護膜13’,如圖7(f)所示,藉此製作具保護膜之晶圓902。 製造方法(1-2)的熱硬化步驟可以與製造方法(1-1)的熱硬化步驟之情形相同方法來進行。Following the aforementioned transport step in the aforementioned manufacturing method (1-2), the protective film 13 attached to the wafer 9 is thermally cured in the aforementioned thermosetting step to form a protective film 13', as shown in FIG. 7(f), thereby producing a wafer 902 with a protective film. The thermosetting step in manufacturing method (1-2) can be performed in the same manner as the thermosetting step in manufacturing method (1-1).
利用先前之保護膜形成膜之情形時,若按壓痕18、接觸痕19等傷痕形成於保護膜形成膜13的與晶圓9側為相反側之表面13b之情形時,即使經過熱硬化步驟仍會留下傷痕,導致製作出不良品。 相對於此,利用本實施形態之保護膜形成膜之製造方法(1-2)之情形時,假使於保護膜形成膜13之表面形成有傷痕之情形,仍可藉由進行熱硬化步驟,因加熱所致之自我修復性的功效而使傷痕縮小,保護膜13’之表面的傷痕變得不明顯。When using the previous protective film forming method, if scratches such as indentation 18 and contact marks 19 are formed on the surface 13b of the protective film forming film 13 opposite to the wafer 9, these scratches will remain even after the thermosetting step, resulting in defective products. In contrast, when using the protective film forming film manufacturing method (1-2) of this embodiment, if scratches are formed on the surface of the protective film forming film 13, the scratches can be reduced by performing the thermosetting step due to the self-repairing effect caused by heating, and the scratches on the surface of the protective film 13' become less noticeable.
前述製造方法(1-2)較佳係於前述輸送步驟後且前述熱硬化步驟前,具有在不使保護膜形成膜13進行熱硬化之條件下將保護膜形成膜13進行加熱之加熱步驟。在不使保護膜形成膜13進行熱硬化之條件下將保護膜形成膜13進行加熱,可藉此使保護膜形成膜13之表面的傷痕縮小,保護膜13’之表面的傷痕變得更不明顯。 製造方法(1-2)的加熱步驟可以與製造方法(1-1)的加熱步驟之情形相同方法來進行。Preferably, the aforementioned manufacturing method (1-2) includes a heating step after the aforementioned conveying step and before the aforementioned thermosetting step, in which the protective film forming film 13 is heated without thermosetting the protective film forming film 13. Heating the protective film forming film 13 without thermosetting it can reduce the size of scratches on the surface of the protective film forming film 13, making the scratches on the surface of the protective film 13' less noticeable. The heating step in manufacturing method (1-2) can be performed in the same manner as the heating step in manufacturing method (1-1).
可利用上述所獲得之具保護膜之晶圓902,分割晶圓9並切斷保護膜13’,藉此製作具保護膜之晶片(圖示省略)。The wafer 902 with the protective film obtained above can be used to cleave wafer 9 and cut the protective film 13' to produce a chip with the protective film (illustration omitted).
[具保護膜之工件的製造方法的變形例] 本實施形態之具保護膜之工件的製造方法,亦可於不損及本發明功效之範圍內,具有不相當於前述貼附步驟、前述輸送步驟、前述加熱步驟、前述熱硬化步驟之任一步驟之其他步驟。 前述其他步驟可根據目的而任意選擇,並無特別限定。 進行前述其他步驟之時機,可根據前述其他步驟的內容而適當選擇。[Variations on the Manufacturing Method of a Workpiece with a Protective Film] The manufacturing method of a workpiece with a protective film in this embodiment may also include other steps, without impairing the effectiveness of the invention, that are not equivalent to any of the aforementioned attaching step, conveying step, heating step, or thermosetting step. These other steps can be arbitrarily selected according to the purpose and are not particularly limited. The timing of performing these other steps can be appropriately selected according to the content of the other steps.
作為前述具保護膜之晶圓的製造方法中之前述其他步驟之一例,若為利用在電路面設有背面研磨帶者作為前述晶圓之情形,則可列舉於前述貼附步驟前,自前述晶圓的電路面去掉背面研磨帶之背面研磨帶去除步驟。 前述背面研磨帶可為公知之背面研磨帶,前述背面研磨帶對晶圓的電路面之貼附、及自晶圓的電路面之去除可藉由公知之方法進行。As an example of the other steps mentioned above in the aforementioned method for manufacturing a wafer with a protective film, if the wafer is equipped with a back polishing tape on the electrical surface, a back polishing tape removal step can be listed, which removes the back polishing tape from the electrical surface of the wafer before the aforementioned attachment step. The aforementioned back polishing tape can be a known back polishing tape, and the attachment of the back polishing tape to the electrical surface of the wafer and its removal from the electrical surface of the wafer can be performed by known methods.
至此為止,作為前述製造方法(1-1)以及前述製造方法(1-2),對利用如圖1所示之保護膜形成膜13之情形進行了說明,但於本實施形態之具保護膜之工件的製造方法中,亦可利用如圖2所示之保護膜形成用複合片101、如圖3所示之保護膜形成用複合片102、如圖4所示之保護膜形成用複合片103、如圖5所示之保護膜形成用複合片104等為代表之保護膜形成用複合片。 於利用前述保護膜形成用複合片之情形時,基於前述保護膜形成用複合片與如圖1所示之保護膜形成膜13之構成之差異,本實施形態之具保護膜之工件的製造方法亦可具有於任一時機進行之前述其他步驟。Up to this point, the manufacturing methods (1-1) and (1-2) described above have explained the case of forming film 13 using the protective film shown in FIG1. However, in the manufacturing method of the workpiece with a protective film in this embodiment, protective film forming composite sheets such as the protective film forming composite sheet 101 shown in FIG2, the protective film forming composite sheet 102 shown in FIG3, the protective film forming composite sheet 103 shown in FIG4, and the protective film forming composite sheet 104 shown in FIG5 can also be used. When using the aforementioned protective film forming composite sheets, based on the difference in the composition between the aforementioned protective film forming composite sheets and the protective film forming film 13 shown in FIG1, the manufacturing method of the workpiece with a protective film in this embodiment can also include performing the other steps mentioned above at any time.
◇具保護膜之工件加工物的製造方法(保護膜形成膜以及保護膜形成用複合片之使用方法) 前述保護膜形成膜以及保護膜形成用複合片係可用於製造由具備藉由將工件進行加工所獲得之具備工件加工物、及設置於前述工件加工物中任一處之保護膜而成之具保護膜之工件加工物。 本實施形態之具保護膜之工件加工物的製造方法在具有藉由對工件進行加工而製作工件加工物之步驟之方面,與上述的具保護膜之工件的製造方法不同。◇Method for manufacturing a workpiece with a protective film (Method for using a protective film forming film and a composite sheet for forming a protective film) The aforementioned protective film forming film and composite sheet for forming a protective film can be used to manufacture a workpiece with a protective film, which consists of a workpiece obtained by processing a workpiece and a protective film disposed at any location on the aforementioned workpiece. The method for manufacturing a workpiece with a protective film in this embodiment differs from the method for manufacturing a workpiece with a protective film described above in that it includes a step of manufacturing a workpiece by processing a workpiece.
本實施形態之具保護膜之工件加工物的製造方法,係具有下述步驟:貼附步驟,將未構成前述保護膜形成用複合片之前述保護膜形成膜、或前述保護膜形成用複合片中之保護膜形成膜貼附於前述工件的目標部位,藉此製作由具備前述工件以及保護膜形成膜而成之具保護膜形成膜之工件;加工步驟,於前述貼附步驟後,將前述工件進行加工,藉此製作前述工件加工物;熱硬化步驟,於前述貼附步驟後,使前述保護膜形成膜進行熱硬化,藉此形成前述保護膜。 工件為晶圓之情形時,作為前述具保護膜之工件加工物,可列舉由具備晶片、及設置於前述晶片的內面之保護膜而成之具保護膜之晶片。 前述具保護膜之晶片的製造方法,係具有下述步驟:貼附步驟,將未構成前述保護膜形成用複合片之保護膜形成膜、或前述保護膜形成用複合片中之保護膜形成膜貼附於晶圓的內面,藉此製作由具備前述晶圓、設置於前述晶圓的內面之前述保護膜形成膜而成之具保護膜形成膜之晶圓;加工步驟(亦可稱為「分割步驟」),於前述貼附步驟後,分割前述晶圓,藉此製作晶片;熱硬化步驟,於前述貼附步驟後,使前述保護膜形成膜進行熱硬化,藉此形成前述保護膜。The method for manufacturing a workpiece with a protective film according to this embodiment includes the following steps: an attachment step, in which the aforementioned protective film forming film, which does not constitute the aforementioned protective film forming composite sheet, or the protective film forming film in the aforementioned protective film forming composite sheet, is attached to the target area of the aforementioned workpiece, thereby producing a workpiece with a protective film forming film formed by having the aforementioned workpiece and the protective film forming film; a processing step, in which the aforementioned workpiece is processed after the attachment step, thereby producing the aforementioned workpiece; and a thermosetting step, in which the aforementioned protective film forming film is thermoset after the attachment step, thereby forming the aforementioned protective film. When the workpiece is a wafer, the aforementioned workpiece with a protective film can be exemplified by a wafer having a wafer and a protective film disposed on the inner surface of the wafer. The aforementioned method for manufacturing a wafer with a protective film comprises the following steps: an attachment step, in which a protective film forming film that does not constitute the aforementioned protective film forming composite, or a protective film forming film in the aforementioned protective film forming composite, is attached to the inner surface of a wafer, thereby producing a wafer with a protective film forming film formed by having the aforementioned wafer and the aforementioned protective film forming film disposed on the inner surface of the aforementioned wafer; a processing step (also known as a "dicing step"), in which the aforementioned wafer is diced after the aforementioned attachment step, thereby producing a wafer; and a thermosetting step, in which the aforementioned protective film forming film is thermoset after the aforementioned attachment step, thereby forming the aforementioned protective film.
[具保護膜之晶片的製造方法(製造方法(2-1))] 以下,作為具保護膜之工件加工物的製造方法,列舉具保護膜之晶片的製造方法為例,一邊引用圖式一邊加以說明。 圖8係用以示意性地說明本實施形態之具保護膜之晶片的製造方法中利用未構成保護膜形成用複合片之保護膜形成膜之情形的製造方法之一例(於本說明書中,有時稱為「製造方法(2-1)」)之剖面圖。此處,對利用如圖1所示之保護膜形成膜13之情形加以說明。[Manufacturing Method of a Wafer with Protective Film (Manufacturing Method (2-1))] Hereinafter, as a method for manufacturing a workpiece with a protective film, a method for manufacturing a wafer with a protective film will be described as an example, with reference to the drawings. Figure 8 is a cross-sectional view schematically illustrating one example of a manufacturing method in this embodiment of the method for manufacturing a wafer with a protective film using a protective film forming film that does not constitute a composite sheet for forming a protective film (sometimes referred to as "manufacturing method (2-1)" in this specification). Here, the case of using a protective film forming film 13 as shown in Figure 1 will be described.
於前述製造方法(2-1)之前述貼附步驟中,如圖8(a)所示,將移除了第一剝離膜151之保護膜形成膜13之表面13a貼附於晶圓9的內面9b,藉此製作具保護膜形成膜之晶圓901。In the attachment step prior to the aforementioned manufacturing method (2-1), as shown in FIG8(a), the surface 13a of the protective film forming film 13 with the first peeling film 151 removed is attached to the inner surface 9b of the wafer 9, thereby producing a wafer 901 with a protective film forming film.
製造方法(2-1)之前述貼附步驟可以利用層壓輥之方法等與製造方法(1-1)之前述貼附步驟之相同方法來進行。 於製造方法(2-1)之前述貼附步驟中,亦與製造方法(1-1)之前述貼附步驟相同,有時有未圖示之按壓痕18等傷痕形成於保護膜形成膜13的與晶圓9側為相反側之表面13b。The attachment step described in manufacturing method (2-1) can be performed using the same method as the attachment step described in manufacturing method (1-1), such as the lamination roller method. In the attachment step described in manufacturing method (2-1), as in manufacturing method (1-1), sometimes indentations such as pressure marks 18 (not shown) are formed on the surface 13b of the protective film forming film 13 that is opposite to the wafer 9 side.
於前述製造方法(2-1)之前述貼附步驟後且前述加工步驟前,如圖8(b)所示,從具保護膜形成膜之晶圓901去掉第二剝離膜152,於藉此所新產生之露出面(亦即保護膜形成膜13的第二面13b)貼附切割片80。切割片80係具備基材81、及設置於基材81其中一面之黏著劑層82。於本步驟中,將黏著劑層82的與基材81側為相反側之面(於本說明書中,有時稱為「第一面」)82a貼附於保護膜形成膜13的第二面13b。黏著劑層82的第一面82a係與切割片80的第一面80a相同。 如此,前述製造方法(2-1)係具有切割片貼附步驟,係於前述貼附步驟與前述加工步驟之間,於前述具保護膜形成膜之晶圓中之前述保護膜形成膜之與前述晶圓側為相反側之面貼附切割片。Before the attachment step and the processing step described in the aforementioned manufacturing method (2-1), as shown in FIG8(b), the second release film 152 is removed from the wafer 901 with the protective film forming film, and the cutting disc 80 is attached to the newly exposed surface (i.e., the second surface 13b of the protective film forming film 13). The cutting disc 80 has a substrate 81 and an adhesive layer 82 disposed on one side of the substrate 81. In this step, the side of the adhesive layer 82 opposite to the side of the substrate 81 (sometimes referred to as the "first surface" in this specification) 82a is attached to the second surface 13b of the protective film forming film 13. The first surface 82a of the adhesive layer 82 is the same as the first surface 80a of the cutting disc 80. Thus, the aforementioned manufacturing method (2-1) includes a dicing attachment step, in which a dicing piece is attached to the side of the protective film that is opposite to the wafer side in the aforementioned wafer with the protective film forming film between the aforementioned attachment step and the aforementioned processing step.
切割片80亦可為與保護膜形成用複合片101中之支撐片10具有相同構成者。 此處顯示了利用切割片80之情形,但於製造方法(2-1)中,亦可利用例如僅由基材所構成之切割片等屬於切割片80以外的公知的切割片。The cutting disc 80 may also be the same as the support disc 10 in the composite sheet 101 for forming the protective film. The use of the cutting disc 80 is shown here, but in the manufacturing method (2-1), a known cutting disc other than the cutting disc 80 may also be used, such as a cutting disc made only of a substrate.
切割片80對保護膜形成膜13之貼附,可以公知的方法來進行,例如與於製造方法(1-1)之前述貼附步驟中保護膜形成膜13對晶圓9之貼附之情形相同方法來進行。The attachment of the protective film forming film 13 to the cutting disc 80 can be carried out by a known method, for example, by the same method as the attachment of the protective film forming film 13 to the wafer 9 in the attachment step described earlier in manufacturing method (1-1).
將切割片80貼附於保護膜形成膜13之表面13b時,例如有時於切割片80與層壓輥161之間混入粒子狀的異物17,未圖示之按壓痕18等傷痕會形成於保護膜形成膜13的與晶圓9側為相反側之表面13b。When the dicing die 80 is attached to the surface 13b of the protective film forming film 13, for example, particulate foreign matter 17 may be mixed between the dicing die 80 and the laminating roller 161, and scratches such as indentations 18 (not shown) may be formed on the surface 13b of the protective film forming film 13 that is opposite to the wafer 9.
前述製造方法(2-1)之前述貼附步驟後,於前述加工步驟中,藉由分割晶圓9來製作晶片90。 而且,前述貼附步驟後,於切斷步驟中,切斷保護膜形成膜13。 藉由進行前述加工步驟以及切斷步驟,如圖8(c)所示,製作由具備晶片90、及設置於晶片90之內面90b之切斷後之保護膜形成膜130而成之具保護膜形成膜之晶片913,並製作於支撐片10上以整齊排列之狀態保持有多個這些具保護膜形成膜之晶片913所構成之具保護膜形成膜之晶片群903。 圖8(c)中符號130a係表示切斷後之保護膜形成膜130的第一面,對應於保護膜形成膜13的第一面13a。而且,符號130b係表示切斷後之保護膜形成膜130的第二面,對應於保護膜形成膜13的第二面13b。Following the aforementioned bonding step in the aforementioned manufacturing method (2-1), the wafer 90 is fabricated by dicing the wafer 9 in the aforementioned processing step. Furthermore, following the aforementioned bonding step, the protective film forming film 13 is cut in the cutting step. By performing the aforementioned processing step and cutting step, as shown in FIG8(c), a wafer 913 with a protective film forming film is fabricated, consisting of a wafer 90 and a cut protective film forming film 130 disposed on the inner surface 90b of the wafer 90. A wafer group 903 with a protective film forming film is fabricated and held in an orderly manner on the support sheet 10, consisting of multiple wafers 913 with protective film forming films. In Figure 8(c), symbol 130a represents the first side of the protective film forming film 130 after it has been cut, corresponding to the first side 13a of the protective film forming film 13. Furthermore, symbol 130b represents the second side of the protective film forming film 130 after it has been cut, corresponding to the second side 13b of the protective film forming film 13.
於製造方法(2-1)中,較佳係於前述貼附步驟後同時進行前述加工步驟與前述切斷步驟、或進行前述加工步驟後再進行前述切斷步驟。 於製造方法(2-1)中,當晶圓的加工(分割)與保護膜形成膜之切斷不管順序為何而能以不中斷的方式藉由相同操作而連續進行之情形時,視為同時進行加工步驟以及切斷步驟。In manufacturing method (2-1), it is preferable to perform the aforementioned processing step and the aforementioned cutting step simultaneously after the aforementioned attachment step, or to perform the aforementioned processing step and then perform the aforementioned cutting step. In manufacturing method (2-1), when wafer processing (division) and the cutting of the protective film formation film can be performed continuously in the same manner without interruption by the same operation, regardless of the order, it is considered that the processing step and the cutting step are performed simultaneously.
前述加工步驟及切斷步驟均可根據進行這些步驟之順序藉由公知之方法進行。The aforementioned processing and cutting steps can be performed using known methods in the order in which they are performed.
例如,於同時進行加工步驟及切斷步驟之情形時,可藉由利用刀片之刀片切割、利用雷射照射之雷射切割、或藉由噴附包含研磨劑之水而進行的水切割等各種切割,同時進行晶圓9之分割與保護膜形成膜13之切斷。 而且,藉由下述方式亦可同時進行晶圓9的分割與保護膜形成膜13的切斷:對於藉由隱形切割(stealth dicing,註冊商標)形成改質層且未進行分割之晶圓9、與保護膜形成膜13,一併進行於相對於這些之表面平行的方向拉伸之所謂擴展(expand)。此種擴展較佳為於-20℃至5℃等之低溫下進行。For example, when processing and cutting steps are performed simultaneously, wafer 9 can be diced and protective film 13 can be cut simultaneously using various cutting methods such as blade cutting, laser cutting using laser irradiation, or water cutting by spraying water containing abrasive. Furthermore, wafer 9 dicing and protective film 13 cutting can also be performed simultaneously by: for wafer 9, which has a modified layer formed by stealth dicing (registered trademark) and has not been diced, and the protective film 13, a so-called expansion is performed simultaneously, stretching in a direction parallel to their surfaces. This expansion is preferably performed at a low temperature such as -20°C to 5°C.
所謂隱形切割(註冊商標),為如下方法。亦即,首先於晶圓的內部設定分割預定部位,以該部位為焦點,以聚焦於該焦點之方式照射雷射光,藉此於晶圓的內部形成改質層。晶圓之改質層係與晶圓的其他部位不同,藉由雷射光之照射而變質,強度變弱。因此,藉由對晶圓施加力,而於晶圓的內部之改質層中產生向晶圓的兩面方向延伸之龜裂,成為晶圓分割之起點。繼而,對晶圓施加力,於前述改質層之部位中分割晶圓,而製作晶片。Stealth dicing (registered trademark) is a method as follows: First, a predetermined dicing area is defined inside the wafer. Laser light is then focused onto this area, creating a modified layer inside the wafer. This modified layer differs from other parts of the wafer; it is altered and weakened by laser light irradiation. Therefore, by applying force to the wafer, cracks extending towards both sides of the wafer are created within the modified layer, forming the starting point for wafer dicing. Then, force is applied to the wafer to dice it at the aforementioned modified layer, thus producing a chip.
例如藉由於製造方法(2-1)中進行前述加工步驟以及切斷步驟,如圖8(c)所示,製作具保護膜形成膜之晶片913,並製作於切割片80上以整齊排列之狀態保持多個這些具保護膜形成膜之晶片913所構成之具保護膜形成膜之晶片群903。For example, by performing the aforementioned processing steps and cutting steps in manufacturing method (2-1), as shown in FIG8(c), a wafer 913 with a protective film forming film is manufactured, and a wafer group 903 with a protective film forming film is formed by holding multiple wafers 913 with protective film forming film in a neat arrangement on the dicing wafer 80.
藉由於製造方法(2-1)之前述加工步驟以及切斷步驟後進行前述熱硬化步驟,如圖8(d)所示,製作具保護膜之晶片913’,並製作於切割片80上以整齊排列之狀態保持有多個這些具保護膜之晶片913’所構成之具保護膜之晶片群904。By performing the aforementioned thermosetting step after the processing step and cutting step in manufacturing method (2-1), as shown in FIG8(d), a protective film wafer 913' is manufactured, and a protective film wafer group 904 is formed by holding multiple such protective film wafers 913' in a neatly arranged state on the dicing wafer 80.
圖8(d)中,符號130a’係表示保護膜130’的第一面,對應於切斷後之保護膜形成膜130的第一面130a。而且,符號130b’係表示保護膜130’的第二面,對應於切斷後之保護膜形成膜130的第二面130b。In Figure 8(d), symbol 130a’ represents the first side of the protective film 130’, corresponding to the first side 130a of the protective film formed after cutting. Moreover, symbol 130b’ represents the second side of the protective film 130’, corresponding to the second side 130b of the protective film formed after cutting.
製造方法(2-1)的熱硬化步驟可以與製造方法(1-1)的熱硬化步驟之情形相同方法來進行。The thermosetting step in manufacturing method (2-1) can be performed in the same manner as the thermosetting step in manufacturing method (1-1).
於製造方法(2-1)之情形也利用了上述的實施形態之保護膜形成膜,故與製造方法(1-1)之情形相同,假使於保護膜形成膜13之表面形成有按壓痕18等傷痕之情形時,仍可藉由進行熱硬化步驟,而藉由因加熱所致之自我修復性的功效而使傷痕縮小,保護膜13’之表面的傷痕變得不明顯。In the case of manufacturing method (2-1), the protective film forming film of the above embodiment is also used. Therefore, similar to the case of manufacturing method (1-1), if there are scratches such as indentations 18 on the surface of the protective film forming film 13, the scratches can still be reduced by performing a heat curing step and by the self-repairing effect caused by heating, and the scratches on the surface of the protective film 13' become less noticeable.
前述製造方法(2-1)較佳係於前述貼附步驟後且前述加工步驟前、或於前述加工步驟後且前述熱硬化步驟前,具有在不使保護膜形成膜130進行熱硬化之條件下加熱保護膜形成膜130之加熱步驟。藉由在不使保護膜形成膜130進行熱硬化之條件下加熱保護膜形成膜130,可使保護膜形成膜130之表面的傷痕縮小,可使保護膜130’之表面的傷痕變得更不明顯。 製造方法(2-1)的加熱步驟可以與製造方法(1-1)的加熱步驟之情形相同方法來進行。The aforementioned manufacturing method (2-1) preferably includes a heating step that heats the protective film forming film 130 without subjecting it to heat curing, either after the aforementioned attachment step and before the aforementioned processing step, or after the aforementioned processing step and before the aforementioned thermosetting step. By heating the protective film forming film 130 without subjecting it to heat curing, scratches on the surface of the protective film forming film 130 can be reduced, and scratches on the surface of the protective film 130' can be made less noticeable. The heating step in manufacturing method (2-1) can be performed in the same manner as the heating step in manufacturing method (1-1).
於前述加熱步驟以及前述熱硬化步驟中,可將具保護膜形成膜之晶片群903以表面(例如切斷後之保護膜形成膜130的第一面130a、晶片90的內面90b)以相對於水平方向成為平行的方式配置(所謂「橫置」),加熱保護膜形成膜130進行熱硬化。 另一方面,於前述加熱步驟以及前述熱硬化步驟中,亦可將具保護膜形成膜之晶片群903以表面(與上述相同)相對於水平方向成正交(換言之,相對於鉛直方向成為平行)的方式進行配置(所謂「縱置」),加熱保護膜形成膜130進行熱硬化。於如此將具保護膜形成膜之晶片群903縱置並進行加熱之情形時,與橫置並進行加熱之情形相比,可抑制切割片80中保持著具保護膜之晶片913’之區域產生垂弛。In the aforementioned heating step and the aforementioned thermosetting step, the wafer group 903 with the protective film forming film can be arranged with its surfaces (e.g., the first surface 130a of the cut protective film forming film 130 and the inner surface 90b of the wafer 90) parallel to the horizontal direction (so-called "horizontal"), and the protective film forming film 130 can be heated for thermosetting. On the other hand, in the aforementioned heating step and the aforementioned thermosetting step, the wafer group 903 with the protective film forming film can also be arranged with its surfaces (same as above) orthogonal to the horizontal direction (in other words, parallel to the vertical direction) (so-called "vertical"), and the protective film forming film 130 can be heated for thermosetting. When the wafer group 903 with the protective film forming film is arranged longitudinally and heated, compared with the case of being arranged horizontally and heated, sagging can be suppressed in the area of the wafer 913' with the protective film in the dicing die 80.
製造方法(2-1)之前述熱硬化步驟後,如圖8(e)所示,藉由進行將具保護膜之晶片群904中之具保護膜之晶片913’從切割片80扯離而拾取之拾取步驟,可取出目標之具保護膜之晶片913’。 於製造方法(2-1)之前述拾取步驟中,於具保護膜之晶片913’中之保護膜130’的第二面130b’與切割片80中之黏著劑層82的第一面82a之間產生剝離。Following the thermosetting step described in manufacturing method (2-1), as shown in Figure 8(e), the target protective film wafer 913' can be removed by picking it up from the dicing die 80 in the protective film wafer group 904 through a picking step. In the picking step described in manufacturing method (2-1), a peeling occurs between the second surface 130b' of the protective film 130' in the protective film wafer 913' and the first surface 82a of the adhesive layer 82 in the dicing die 80.
具保護膜之晶片913’係可以公知的方法來拾取。 具保護膜之晶片913’可以利用頂針銷等之頂起機構進行拾取。此處表示利用真空筒夾等扯離機構800,將具保護膜之晶片913’於箭頭P方向進行扯離之情形。 此外,僅表示扯離機構800而省略剖面。The wafer 913' with a protective film can be picked up using known methods. The wafer 913' with a protective film can be picked up using a lifting mechanism such as a ejector pin. Here, we illustrate the case where a pulling mechanism 800, such as a vacuum clamp, is used to pull the wafer 913' with a protective film in the direction of arrow P. Furthermore, only the pulling mechanism 800 is shown, and its cross-section is omitted.
[具保護膜之晶片的製造方法(製造方法(2-2))] 圖9係用以示意性地說明本實施形態之具保護膜之晶片的製造方法中利用了保護膜形成用複合片中之保護膜形成膜之情形的製造方法之一例(於本說明書中,有時稱為「製造方法(2-2)」)之剖面圖。此處,對利用如圖2所示之保護膜形成用複合片101之情形加以說明。[Manufacturing Method of a Chip with a Protective Film (Manufacturing Method (2-2))] Figure 9 is a cross-sectional view schematically illustrating one example of a manufacturing method (sometimes referred to as "Manufacturing Method (2-2)") in which a protective film forming composite sheet is used in the manufacturing method of a chip with a protective film according to this embodiment is employed. Here, the case of using the protective film forming composite sheet 101 as shown in Figure 2 will be explained.
於前述製造方法(2-2)之前述貼附步驟中,如圖9(a)所示,藉由將保護膜形成用複合片101中之保護膜形成膜13(更具體而言,移除了剝離膜15之保護膜形成膜13)貼附於晶圓9的內面9b,製作具保護膜形成膜之晶圓901。In the attachment step described in the aforementioned manufacturing method (2-2), as shown in FIG9(a), a wafer 901 with a protective film is manufactured by attaching the protective film forming film 13 (more specifically, the protective film forming film 13 with the peeling film 15 removed) of the protective film forming composite 101 to the inner surface 9b of the wafer 9.
於製造方法(2-2)中,除了前述貼附步驟以後,利用具備支撐片10之具保護膜形成膜之晶圓901來代替上述具備切割片80之具保護膜形成膜之晶圓901之方面、以及於熱硬化步驟之前進行拾取步驟之方面以外,可以與製造方法(2-1)之情形相同方法來進行加工步驟以及切斷步驟。In manufacturing method (2-2), apart from the aforementioned aspect of replacing the wafer 901 with a protective film forming film with a support sheet 10 with the aforementioned protective film forming film with a support sheet 10 after the attachment step, and the aspect of performing a pick-up step before the thermosetting step, the processing steps and cutting steps can be performed in the same manner as in manufacturing method (2-1).
例如於製造方法(2-2)中,藉由進行前述加工步驟以及切斷步驟,如圖9(b)所示,製作具保護膜形成膜之晶片913,並製作於支撐片10上以整齊排列之狀態保持有多個這些具保護膜形成膜之晶片913所構成之具保護膜形成膜之晶片群905。 具保護膜形成膜之晶片群905,除了具備支撐片10來代替切割片80之方面以外,係與製造方法(2-1)中具保護膜形成膜之晶片群903相同。 晶圓9的分割方法亦可與例如製造方法(2-1)之前述加工步驟中晶圓9的分割方法相同。 於製造方法(2-2)中,保護膜形成膜13的切斷亦可為公知的方法,例如亦可以與製造方法(2-1)之前述切斷步驟中保護膜形成膜13的切斷方法相同。For example, in manufacturing method (2-2), by performing the aforementioned processing steps and dicing steps, as shown in FIG. 9(b), a wafer 913 with a protective film is fabricated, and a wafer group 905 consisting of multiple wafers 913 with protective film forming films is fabricated on the support sheet 10 in a neatly arranged state. The wafer group 905 with protective film forming films is the same as the wafer group 903 with protective film forming films in manufacturing method (2-1), except that the support sheet 10 is used instead of the dicing sheet 80. The dicing method of wafer 9 can also be the same as the dicing method of wafer 9 in the aforementioned processing steps of manufacturing method (2-1). In manufacturing method (2-2), the cutting of the protective film forming film 13 can also be a known method, for example, it can be the same as the cutting method of the protective film forming film 13 in the cutting step described above in manufacturing method (2-1).
藉由利用所獲得之前述具保護膜形成膜之晶片913,將具保護膜形成膜之晶片913從支撐片10扯離而拾取,如圖9(c),可取出具保護膜形成膜之晶片913。此時之步驟亦可以與於製造方法(2-1)所說明之拾取步驟相同。 於製造方法(2-2)之前述拾取步驟中,在具保護膜形成膜之晶片913中之保護膜形成膜130的第二面130b與支撐片10中之黏著劑層12的第一面12a之間產生剝離。By using the obtained wafer 913 with the protective film formation film, the wafer 913 with the protective film formation film is peeled off from the support sheet 10 and picked up, as shown in FIG. 9(c). The wafer 913 with the protective film formation film can be removed. The steps at this time can also be the same as the picking steps described in manufacturing method (2-1). In the picking steps described in manufacturing method (2-2), peeling occurs between the second surface 130b of the protective film formation film 130 in the wafer 913 with the protective film formation film and the first surface 12a of the adhesive layer 12 in the support sheet 10.
若將具保護膜形成膜之晶片913利用頂針銷等之頂起機構進行拾取,則有時於保護膜形成膜130的頂起機構所為之頂起處形成有凹痕(針痕)等傷痕。If the wafer 913 with the protective film forming film is picked up using a lifting mechanism such as a pin, sometimes a dent (pin mark) or other scratches are formed at the lifting point of the protective film forming film 130.
前述製造方法(2-2)的拾取步驟之後,於前述熱硬化步驟中,使具保護膜形成膜之晶片913中之保護膜形成膜130進行熱硬化而形成保護膜130’,藉此製作具保護膜之晶片913’。After the picking step in the aforementioned manufacturing method (2-2), in the aforementioned thermosetting step, the protective film forming film 130 in the wafer 913 with the protective film forming film is thermoset to form a protective film 130', thereby manufacturing a wafer 913' with a protective film.
圖9(d)中,符號130a’係表示保護膜130’的第一面,對應於切斷後之保護膜形成膜130的第一面130a。而且,符號130b’係表示保護膜130’的第二面,對應於切斷後之保護膜形成膜130的第二面130b。In Figure 9(d), symbol 130a’ represents the first side of the protective film 130’, corresponding to the first side 130a of the protective film formed after cutting. Moreover, symbol 130b’ represents the second side of the protective film 130’, corresponding to the second side 130b of the protective film formed after cutting.
製造方法(2-2)的熱硬化步驟可以與製造方法(1-1)的熱硬化步驟之情形相同方法來進行。The thermosetting step in manufacturing method (2-2) can be performed in the same manner as the thermosetting step in manufacturing method (1-1).
利用先前之保護膜形成膜之情形時,若未圖示之凹痕等之傷痕形成於保護膜形成膜13的與晶圓9側為相反側之表面130b之情形時,即使經過熱硬化步驟仍會留下傷痕,導致製作出不良品。 相對於此,利用本實施形態之保護膜形成膜之製造方法(2-2)之情形時,假使於保護膜形成膜13之表面形成有傷痕,仍可藉由進行熱硬化步驟,因加熱所致之自我修復性的功效而使傷痕縮小,保護膜13’之表面的傷痕變得不明顯。When using the previous protective film forming method, if scratches such as dents (not shown) are formed on the surface 130b of the protective film forming film 13, which is opposite to the wafer 9, the scratches will remain even after the thermosetting step, resulting in defective products. In contrast, when using the protective film forming film manufacturing method (2-2) of this embodiment, if scratches are formed on the surface of the protective film forming film 13, the scratches can be reduced by performing the thermosetting step due to the self-repairing effect caused by heating, and the scratches on the surface of the protective film 13' become less noticeable.
前述製造方法(2-2)較佳係於前述拾取步驟後且前述熱硬化步驟前,具有在不使保護膜形成膜130進行熱硬化之條件下加熱保護膜形成膜130之加熱步驟。藉由在不使保護膜形成膜130進行熱硬化之條件下加熱保護膜形成膜130,可使保護膜形成膜130之表面的傷痕縮小,保護膜130’之表面的傷痕變得更不明顯。 製造方法(2-2)的加熱步驟可以與製造方法(1-1)的加熱步驟之情形相同方法來進行。Preferably, the aforementioned manufacturing method (2-2) includes a heating step after the aforementioned picking step and before the aforementioned thermosetting step, in which the protective film forming film 130 is heated without thermosetting the protective film forming film 130. By heating the protective film forming film 130 without thermosetting the protective film forming film 130, the scratches on the surface of the protective film forming film 130 can be reduced, and the scratches on the surface of the protective film 130' become less noticeable. The heating step in manufacturing method (2-2) can be performed in the same manner as the heating step in manufacturing method (1-1).
至此為止,作為前述製造方法(2-2),對利用如圖2所示之保護膜形成用複合片101之情形加以說明,但於本實施形態之具保護膜之工件加工物的製造方法中,亦可利用如圖3所示之保護膜形成用複合片102、如圖4所示之保護膜形成用複合片103、如圖5所示之保護膜形成用複合片104等為代表之其他保護膜形成用複合片。 利用前述其他保護膜形成用複合片之情形時,基於前述其他保護膜形成用複合片與如圖2所示之保護膜形成用複合片101之構成的差異,本實施形態之具保護膜之工件加工物的製造方法亦可具有於任一時機進行之前述其他步驟。Up to this point, the manufacturing method (2-2) described above has explained the case using the protective film forming composite sheet 101 shown in FIG. 2. However, in the manufacturing method of the workpiece with a protective film in this embodiment, other protective film forming composite sheets, such as the protective film forming composite sheet 102 shown in FIG. 3, the protective film forming composite sheet 103 shown in FIG. 4, and the protective film forming composite sheet 104 shown in FIG. 5, can also be used. When using the aforementioned other protective film forming composite sheets, based on the differences in the composition between the aforementioned other protective film forming composite sheets and the protective film forming composite sheet 101 shown in FIG. 2, the manufacturing method of the workpiece with a protective film in this embodiment can also perform the aforementioned other steps at any time.
至此為止,作為前述製造方法(2-2),對利用保護膜形成用複合片之情形的具保護膜之晶片的製造方法加以說明,但即使利用未構成保護膜形成用複合片之保護膜形成膜來代替保護膜形成用複合片,仍可製造具保護膜之晶片。Up to this point, as described in the aforementioned manufacturing method (2-2), a method for manufacturing a wafer with a protective film using a protective film forming composite has been explained. However, even if a protective film forming film that does not constitute a protective film forming composite is used instead of the protective film forming composite, a wafer with a protective film can still be manufactured.
[具保護膜之工件加工物的製造方法的變形例] 本實施形態之具保護膜之工件加工物的製造方法,亦可於不損及本發明功效之範圍內,具有不相當於前述貼附步驟、前述加工步驟、前述切斷步驟、前述加熱步驟、前述熱硬化步驟、前述拾取步驟、前述切割片貼附步驟之任一步驟的其他步驟。 前述其他步驟可根據目的而任意選擇,並無特別限定。 進行前述其他步驟之時機,可根據前述其他步驟的內容而適當選擇。[Variations on the Manufacturing Method of a Workpiece with a Protective Film] The manufacturing method of a workpiece with a protective film of this embodiment may also include other steps, without impairing the effectiveness of the invention, that are not equivalent to any of the aforementioned attachment step, processing step, cutting step, heating step, thermosetting step, pickup step, or cutting disc attachment step. These other steps can be arbitrarily selected according to the purpose and are not particularly limited. The timing of performing these other steps can be appropriately selected according to their content.
作為前述具保護膜之晶片的製造方法中的前述其他步驟之一例,可列舉:背面研磨帶貼附步驟,於前述貼附步驟前,於前述晶圓的電路面貼附背面研磨帶;以及背面研磨帶去除步驟,於前述背面研磨帶貼附步驟後且前述加工步驟前及前述切斷步驟前,自前述晶圓的電路面去掉背面研磨帶。 前述背面研磨帶可為公知之背面研磨帶,前述背面研磨帶對晶圓的電路面之貼附、及自晶圓的電路面之去除可藉由公知之方法進行。As an example of the aforementioned other steps in the method for manufacturing a wafer with a protective film, the following steps can be listed: a back-side polishing tape attachment step, in which a back-side polishing tape is attached to the electrical surface of the wafer before the attachment step; and a back-side polishing tape removal step, in which the back-side polishing tape is removed from the electrical surface of the wafer after the attachment step and before the processing step and the cutting step. The back-side polishing tape can be a known type of back-side polishing tape, and the attachment and removal of the back-side polishing tape from the electrical surface of the wafer can be performed by known methods.
於本說明書中,僅「貼附步驟」之記載意指不相當於「切割片貼附步驟」及「背面研磨帶貼附步驟」的任一個,而為上述的將前述保護膜形成膜、或前述保護膜形成用複合片中的保護膜形成膜貼附於工件的目標部位(例如晶圓的內面)之步驟。In this specification, the term "attachment step" is not equivalent to either "dicing disc attachment step" or "back grinding tape attachment step," but refers to the aforementioned step of attaching the protective film forming film, or the protective film forming film in the aforementioned protective film forming composite sheet, to the target area of the workpiece (e.g., the inner surface of a wafer).
作為前述具保護膜之晶片的製造方法中的前述其他步驟之另一例,可列舉:印字步驟,於前述貼附步驟後且前述拾取步驟前,於前述保護膜形成膜或保護膜中的與前述晶圓側為相反側、或與前述晶片側為相反側之面,進行雷射印字。 對保護膜形成膜或保護膜之雷射印字可藉由公知之方法進行。As another example of the aforementioned other steps in the method for manufacturing a wafer with a protective film, a printing step is provided, performed after the aforementioned attachment step and before the aforementioned pick-up step, on the side of the protective film forming film or the protective film opposite to the wafer side or the wafer side. Laser printing on the protective film forming film or the protective film can be performed using known methods.
◇基板裝置的製造方法(具保護膜之工件加工物之使用方法) 藉由上述的製造方法獲得具保護膜之工件加工物之後,除了利用該具保護膜之工件加工物來代替先前之具保護膜之工件加工物之方面以外,可以與先前之基板裝置的製造方法相同方法來製造基板裝置。◇Method for manufacturing substrate device (method for using workpiece with protective film) After obtaining workpiece with protective film by the above manufacturing method, except that the workpiece with protective film is used to replace the previous workpiece with protective film, the substrate device can be manufactured in the same way as the previous substrate device manufacturing method.
作為此種基板裝置的製造方法,例如可列舉具有下述覆晶連接步驟之製造方法:使利用前述保護膜形成膜所獲得之具保護膜之工件加工物上的突狀電極接觸於電路基板上之連接墊,藉此將前述突狀電極與前述電路基板上之連接墊加以電性連接。 [實施例]As a method for manufacturing such a substrate device, one example is a method that includes the following flip-chip interconnection step: a protruding electrode on a workpiece with a protective film, obtained by forming the aforementioned protective film, is brought into contact with a connecting pad on a circuit substrate, thereby electrically connecting the protruding electrode to the connecting pad on the circuit substrate. [Example]
以下,藉由具體實施例對本發明加以更詳細說明。然而,本發明不受以下所示之實施例之任何限定。The present invention will now be described in more detail with reference to specific embodiments. However, the present invention is not limited to the embodiments shown below.
[樹脂之製造原料] 將本實施例及比較例中簡稱的樹脂之製造原料之正式名稱示於以下。 MA:丙烯酸甲酯 HEA:丙烯酸2-羥乙酯 2EHA:丙烯酸2-乙基己酯 2EHMA:甲基丙烯酸2-乙基己酯 GMA:甲基丙烯酸縮水甘油酯 MMA:甲基丙烯酸甲酯 BA:丙烯酸正丁酯 EA:丙烯酸乙酯[Raw Materials for Resin Manufacturing] The formal names of the raw materials for resin manufacturing, as abbreviated in this embodiment and comparative example, are shown below. MA: Methyl acrylate HEA: 2-Hydroxyethyl acrylate 2EHA: 2-Ethylhexyl acrylate 2EHMA: 2-Ethylhexyl methacrylate GMA: Glycidyl methacrylate MMA: Methyl methacrylate BA: n-Butyl acrylate EA: Ethyl acrylate
[保護膜形成用組成物之製造原料] 將用於製造保護膜形成用組成物之原料示於以下。[Raw Materials for Manufacturing Components for Protective Film Formation] The raw materials used to manufacture components for protective film formation are shown below.
[聚合物成分(A)] (A)-1:將2EHA(65質量份)、MMA(25質量份)以及HEA(10質量份)加以共聚而成之丙烯酸系聚合物(重量平均分子量:50萬,玻璃轉移溫度:-38℃) (A)-2:將BA(40質量份)、EA(25質量份)、MMA(30質量份)以及GMA(5質量份)加以共聚而成之丙烯酸系聚合物(重量平均分子量:50萬,玻璃轉移溫度:-9℃) (A)-3:將2EHA(30質量份)、EA(35質量份)、MMA(30質量份)以及GMA(5質量份)加以共聚而成之丙烯酸系聚合物(重量平均分子量:50萬,玻璃轉移溫度:-12℃) (A)-4:將2EHA(73質量份)、MA(12質量份)、GMA(3質量份)以及HEA(12質量份)加以共聚而成之共聚物(重量平均分子量:55萬,玻璃轉移溫度:-55℃) (A)-5:將2EHA(12質量份)、MA(73質量份)、GMA(3質量份)以及HEA(12質量份)加以共聚而成之共聚物(重量平均分子量:55萬,玻璃轉移溫度:-5℃) (A)-6:將2EHMA(85質量份)、MA(7質量份)以及HEA(8質量份)加以共聚而成之共聚物(重量平均分子量:65萬,玻璃轉移溫度:-9℃) (A)-7:將BA(60質量份)、MA(10質量份)、GMA(17質量份)以及HEA(13質量份)加以共聚而成之共聚物(重量平均分子量:50萬,玻璃轉移溫度:-31℃) (A)-8:將MA(87質量份)以及HEA(13質量份)加以共聚而成之共聚物(重量平均分子量:45萬,玻璃轉移溫度:6℃)[Polymer Composition (A)] (A)-1: An acrylic polymer copolymerized from 2EHA (65 parts by mass), MMA (25 parts by mass), and HEA (10 parts by mass) (weight average molecular weight: 500,000, glass transition temperature: -38°C) (A)-2: An acrylic polymer copolymerized from BA (40 parts by mass), EA (25 parts by mass), MMA (30 parts by mass), and GMA (5 parts by mass) (weight average molecular weight: 500,000, glass transition temperature: -9°C) (A)-3: An acrylic polymer copolymerized from 2EHA (30 parts by mass), EA (35 parts by mass), MMA (30 parts by mass), and GMA (5 parts by mass) (weight average molecular weight: 500,000, glass transition temperature: -12°C) (A)-4: A copolymer formed by copolymerizing 2EHA (73 parts by mass), MA (12 parts by mass), GMA (3 parts by mass), and HEA (12 parts by mass) (weight average molecular weight: 550,000, glass transition temperature: -55℃). (A)-5: A copolymer formed by copolymerizing 2EHA (12 parts by mass), MA (73 parts by mass), GMA (3 parts by mass), and HEA (12 parts by mass) (weight average molecular weight: 550,000, glass transition temperature: -5℃). (A)-6: A copolymer formed by copolymerizing 2EHMA (85 parts by mass), MA (7 parts by mass), and HEA (8 parts by mass) (weight average molecular weight: 650,000, glass transition temperature: -9℃). (A)-7: A copolymer formed by copolymerizing BA (60 parts by mass), MA (10 parts by mass), GMA (17 parts by mass), and HEA (13 parts by mass) (weight average molecular weight: 500,000, glass transition temperature: -31℃). (A)-8: A copolymer formed by copolymerizing MA (87 parts by mass) and HEA (13 parts by mass) (weight average molecular weight: 450,000, glass transition temperature: 6℃).
[環氧樹脂(B1)] (B1)-1:雙酚A型環氧樹脂(三菱化學公司製「jER828」,環氧當量:184g/eq至194g/eq) (B1)-2:二環戊二烯型環氧樹脂(DIC公司製「Epiclone HP-7200」,環氧當量:254g/eq至264g/eq) (B1)-3:雙酚型環氧樹脂(三菱化學公司製「jER1055」,環氧當量:800g/eq至900g/eq) (B1)-4:二環戊二烯型環氧樹脂(日本化藥公司製「XD-1000」,環氧當量:248g/eq) (B1)-5:二環戊二烯型環氧樹脂(DIC公司製「Epiclone HP-7200HH」,環氧當量:274g/eq至286g/eq) [熱硬化劑(B2)] (B2)-1:二氰二胺(熱活性潛伏性環氧樹脂硬化劑,三菱化學公司製「DICY7」)[Epoxy Resins (B1)] (B1)-1: Bisphenol A type epoxy resin (Mitsubishi Chemical Co., Ltd. "jER828", epoxy equivalent: 184g/eq to 194g/eq) (B1)-2: Dicyclopentadiene type epoxy resin (DIC Corporation "Epiclone HP-7200", epoxy equivalent: 254g/eq to 264g/eq) (B1)-3: Bisphenol type epoxy resin (Mitsubishi Chemical Co., Ltd. "jER1055", epoxy equivalent: 800g/eq to 900g/eq) (B1)-4: Dicyclopentadiene type epoxy resin (Nippon Kayaku Co., Ltd. "XD-1000", epoxy equivalent: 248g/eq) (B1)-5: Dicyclopentadiene type epoxy resin (DIC Corporation's "Epiclone HP-7200HH", epoxy equivalent: 274g/eq to 286g/eq) [Thermosetting agent (B2)] (B2)-1: Dicyandiamine (Thermoactive latent epoxy resin curing agent, Mitsubishi Chemical Corporation's "DICY7")
[硬化促進劑(C)] (C)-1:2-苯基-4,5-二羥甲基咪唑(四國化成工業公司製「Curezole 2PHZ」) [填充材(D)] (D)-1:二氧化矽填料(Admatechs公司製「SC2050MA」,經環氧基進行了表面修飾之球狀二氧化矽填料,平均粒徑:0.5μm) (D)-2:將二氧化矽填料(股份有限公司龍森製「SV-10」(平均粒徑:10μm的球狀二氧化矽填料)進行粉碎而成,粉碎後之平均粒徑:2.0μm) (D)-3:二氧化矽填料(Admatechs公司製「SC105G-MMQ」,經乙烯基進行了表面修飾之球狀二氧化矽填料,平均粒徑:0.3μm) (E)-1:具有環氧基、甲基以及甲氧基之寡聚物型矽烷偶合劑(信越化學工業公司製「X-41-1056」,環氧當量280g/eq) [著色劑(I)] (I)-1:有機系黑色顏料(大日精化工業公司製「6377黑」) (I)-2:碳黑(三菱化學公司製「MA-600」)[Curing Accelerator (C)] (C)-1: 2-Phenyl-4,5-dihydroxymethylimidazolium (Curezole 2PHZ manufactured by Shikoku Chemical Industry Co., Ltd.) [Filler (D)] (D)-1: Silica filler (SC2050MA manufactured by Admatechs Co., Ltd., spherical silica filler with epoxy-modified surface, average particle size: 0.5μm) (D)-2: Silica filler (SV-10 manufactured by Ryusen Co., Ltd. (spherical silica filler with an average particle size of 10μm) is pulverized, and the average particle size after pulverization is 2.0μm) (D)-3: Silica filler (Admatechs "SC105G-MMQ", spherical silica filler with vinyl-modified surface, average particle size: 0.3μm) (E)-1: Oligomeric silane coupling agent with epoxy, methyl and methoxy groups (Shin-Etsu Chemical Co., Ltd. "X-41-1056", epoxy equivalent 280g/eq) [Coloring agent (I)] (I)-1: Organic black pigment (Dai-Nippon Seika Co., Ltd. "6377 Black") (I)-2: Carbon black (Mitsubishi Chemical Co., Ltd. "MA-600")
[實施例1] [保護膜形成膜之製造] [保護膜形成用組成物(III)-1之製造] 使聚合物成分(A)-1(30.1質量份)、環氧樹脂(B1)-1(12.0質量份)、環氧樹脂(B1)-2(6.0質量份)、熱硬化劑(B2)-1(0.4質量份)、硬化促進劑(C)-1(0.4質量份)、填充材(D)-1(48.1質量份)、偶合劑(E)-1(0.4質量份)以及著色劑(I)-1(2.5質量份)溶解或分散於甲基乙基酮,於23℃攪拌,藉此獲得溶媒以外之所有成分的合計濃度為60質量%之熱硬化性之保護膜形成用組成物(III)-1。此處所示之甲基乙基酮以外之成分之調配量全部為不含溶媒之目標物的調配量。[Example 1] [Manufacturing of Protective Film Forming Film] [Manufacturing of Component (III)-1 for Protective Film Formation] Polymer component (A)-1 (30.1 parts by mass), epoxy resin (B1)-1 (12.0 parts by mass), epoxy resin (B1)-2 (6.0 parts by mass), thermosetting agent (B2)-1 (0.4 parts by mass), curing accelerator (C)-1 (0.4 parts by mass), filler (D)-1 (48.1 parts by mass), coupling agent (E)-1 (0.4 parts by mass), and colorant (I)-1 (2.5 parts by mass) are dissolved or dispersed in methyl ethyl ketone and stirred at 23°C to obtain a thermosetting protective film forming component (III)-1 with a total concentration of 60% by mass for all components other than the solvent. The amounts of components other than methyl ethyl ketone shown here are all solvent-free target amounts.
[保護膜形成膜之製造] 利用藉由聚矽氧處理將聚對苯二甲酸乙二酯製膜之單面進行了剝離處理之剝離膜(第二剝離膜,琳得科公司製「SP-PET502150」,厚度50μm),於該剝離膜之前述剝離處理面塗敷上述所獲得之保護膜形成用組成物(III)-1,於100℃乾燥2分鐘,藉此製造厚度40μm之熱硬化性之保護膜形成膜。[Preparation of Protective Film Forming Film] Using a release membrane (second release membrane, manufactured by Lintec Corporation, "SP-PET502150", 50μm thick) on one side of a polyethylene terephthalate film treated with polysiloxane, the aforementioned protective film forming component (III)-1 was applied to the release-treated side of the release membrane and dried at 100°C for 2 minutes, thereby producing a thermosetting protective film forming film with a thickness of 40μm.
進而,於所獲得之保護膜形成膜之不具備第二剝離膜之側的露出面,以貼附速度2m/min、貼附溫度60℃、貼附壓力0.5MPa的條件貼合剝離膜(第一剝離膜,琳得科公司製「SP-PET381031」,厚度38μm)的剝離處理面,藉此製造由具備保護膜形成膜、設置於前述保護膜形成膜的一面之第一剝離膜、及設置於前述保護膜形成膜之另一面之第二剝離膜而構成之具剝離膜之保護膜形成膜。Furthermore, on the exposed surface of the obtained protective film forming film that does not have the second peeling film, a peeling treatment surface of the peeling film (first peeling film, manufactured by Lintec Corporation "SP-PET381031", thickness 38μm) is bonded at an bonding speed of 2m/min, a bonding temperature of 60°C, and a bonding pressure of 0.5MPa. This process creates a protective film forming film with a peeling film, consisting of a protective film forming film, a first peeling film disposed on one side of the aforementioned protective film forming film, and a second peeling film disposed on the other side of the aforementioned protective film forming film.
[保護膜形成膜之評價] [保護膜形成膜之儲存彈性模數E’(70)以及E’(90)之測定] 利用上述所得之5片具剝離膜之保護膜形成膜,一邊去掉這些之第一剝離膜或第二剝離膜,一邊將保護膜形成膜的露出面彼此逐漸依序貼合,藉此製作由第二剝離膜、5片保護膜形成膜(合計之厚度200μm)及第二剝離膜依序積層而構成之積層物。另外,從該積層物以使長度方向成為保護膜形成膜之MD方向之方式切出寬度為4mm且長度為30mm的切片。 繼而,自該切片去掉最表面的2片第二剝離膜,將所得者作為試片。 繼而,利用動態黏彈性自動測定裝置(A&D公司製造之「Rheovibron DDV-01FP」),藉由拉伸法(拉伸模式)以夾頭間距離20mm、頻率11Hz、升溫速度3℃/min、等速升溫之測定條件,於-50℃至150℃之溫度區域中測定前述試片之儲存彈性模數E’。其中,將於70℃之儲存彈性模數E’(70)以及於90℃之儲存彈性模數E’(90)示於表1。而且,將此時之於70℃之tanδ(70)以及於90℃之tanδ(90)示於表1。[Evaluation of the protective film forming film] [Determination of the storage elastic modulus E’(70) and E’(90) of the protective film forming film] Using the five protective film forming films with peeling membranes obtained above, while removing the first or second peeling membrane, the exposed surfaces of the protective film forming films were sequentially laminated together to create a laminate consisting of a second peeling membrane, five protective film forming films (total thickness 200 μm), and the second peeling membrane. In addition, slices with a width of 4 mm and a length of 30 mm were cut from the laminate with the length direction aligned with the MD direction of the protective film forming film. Next, the two outermost second exfoliating membranes were removed from the slice, and the resulting material was used as a test piece. Then, using a dynamic viscoelasticity automatic measuring device (A&D Corporation's "Rheovibron DDV-01FP"), the storage elastic modulus E' of the aforementioned test piece was measured in the temperature range of -50°C to 150°C under the following conditions: clamp spacing of 20 mm, frequency of 11 Hz, heating rate of 3°C/min, and constant heating. The storage elastic modulus E'(70) at 70°C and the storage elastic modulus E'(90) at 90°C are shown in Table 1. Furthermore, the tanδ(70) at 70°C and the tanδ(90) at 90°C are shown in Table 1.
[保護膜之儲存彈性模數E’(23)之測定] 與上述同樣的方式,製作由第二剝離膜、5片保護膜形成膜(合計之厚度200μm)、及第二剝離膜依序積層而構成之積層物,由該積層物以使長度方向成為保護膜形成膜之MD方向之方式切出寬度為5mm且長度為30mm的切片。 將該切片於90℃進行2h的加熱後,進而,於130℃進行2h的加熱(2階段加熱),繼而從該切片去掉最表面的2片第二剝離膜,將所獲得者作為試片。 繼而利用動態黏彈性測定裝置(TA Instrument公司製「DMAQ800」),藉由拉伸法(拉伸模式)以夾頭間距離20mm、頻率11Hz、升溫速度3℃/min、等速升溫之測定條件,於-60℃至300℃之溫度區域中,測定前述試片之儲存彈性模數E’。其中,將於23℃之儲存彈性模數E’(23)示於表1。[Determination of the storage elastic modulus E’(23) of the protective film] In the same manner as above, a laminate consisting of a second release membrane, five protective film forming films (total thickness 200 μm) and a second release membrane were sequentially laminated. A slice with a width of 5 mm and a length of 30 mm was cut from the laminate with the length direction aligned with the MD direction of the protective film forming film. The slice was heated at 90°C for 2 h, and then heated at 130°C for 2 h (two-stage heating). The two outermost second release membranes were then removed from the slice, and the obtained sample was used as a test piece. Subsequently, using a dynamic viscoelasticity measuring device (TA Instruments "DMAQ800"), the storage elastic modulus E' of the aforementioned specimen was measured in the temperature range of -60°C to 300°C under the following conditions: clamp spacing of 20 mm, frequency of 11 Hz, heating rate of 3°C/min, and constant heating. The storage elastic modulus E'(23) at 23°C is shown in Table 1.
[自我修復性(A)之評價] 利用貼片機(琳得科股份有限公司製,RAD-3600F/12),從上述所獲得之具剝離膜之保護膜形成膜去掉第一剝離膜,從第二剝離膜之側挾帶厚度40μm、縱0.25mm、寬0.25mm的雜物(極小的矽異物)以層壓輥進行按壓,藉此將露出之保護膜形成膜貼附於矽晶圓(直徑8吋,厚度350μm,♯2000磨削)的磨削面,以製作矽晶圓、保護膜形成膜以及第二剝離膜依序積層之積層物。剝離第二剝離膜,以雷射顯微鏡(KEYENCE公司製,VK-9700)觀察保護膜形成膜之表面的結果,因雜物的嵌入而觀察到於保護膜形成膜之表面有深度約2.03μm(亦即,加熱前的傷痕的深度)的傷痕。[Evaluation of self-repairability (A)] Using a pick-and-place machine (Lintec Corporation, RAD-3600F/12), the first release film was removed from the protective film forming film with a release film obtained above. Impurities (tiny silicon foreign objects) with a thickness of 40μm, a length of 0.25mm, and a width of 0.25mm were carried from the side of the second release film and pressed with lamination rollers. In this way, the exposed protective film forming film was attached to the grinding surface of the silicon wafer (8-inch diameter, 350μm thickness, ♯2000 grinding) to create a stack of silicon wafer, protective film forming film, and second release film stacked in sequence. The second exfoliation membrane was peeled off, and the surface of the protective film was observed using a laser microscope (KEYENCE, VK-9700). Due to the embedding of impurities, a scratch with a depth of about 2.03 μm (that is, the depth of the scratch before heating) was observed on the surface of the protective film.
將於表面形成有傷痕之保護膜形成膜於90℃加熱2h。同樣地,以雷射顯微鏡觀察加熱後的保護膜形成膜之表面的結果,於保護膜形成膜之表面觀察到深度約0.26μm(亦即,加熱後的傷痕的深度)的傷痕。The protective film with scratches on its surface was heated at 90°C for 2 hours. Similarly, the surface of the protective film after heating was observed with a laser microscope, and scratches with a depth of about 0.26 μm (that is, the depth of the scratches after heating) were observed on the surface of the protective film.
利用下述式,以將小數點以下第一位之值經四捨五入而以整數算出因於90℃加熱2h所致之自我修復率(A)[%]。 自我修復率(A)[%]={(加熱前的傷痕的深度-加熱後的傷痕的深度)/加熱前的傷痕的深度}×100The self-repair rate (A) [%] resulting from heating at 90°C for 2 hours is calculated using the following formula, rounding the first decimal place to the nearest integer. Self-repair rate (A) [%] = {(depth of the wound before heating - depth of the wound after heating) / depth of the wound before heating} × 100
而且,將自我修復率(A)[%]、以及如下基準之評價結果示於表1。 A:100%至80% B:79%至60% C:59%至35% D:34%至15% E:14%至0%Furthermore, the self-repair rate (A) [%] and the evaluation results based on the following criteria are shown in Table 1. A: 100% to 80% B: 79% to 60% C: 59% to 35% D: 34% to 15% E: 14% to 0%
[自我修復性(C)之評價] 與上述相同,將於表面形成有加熱前的傷痕的深度2.07μm的傷痕之保護膜形成膜於90℃加熱2h,之後,於130℃加熱2h而作成保護膜。同樣地,以雷射顯微鏡觀察保護膜之表面的結果,於保護膜之表面觀察到深度約0.18μm(亦即,經90℃加熱後進而加熱硬化後之傷痕的深度)的傷痕。[Evaluation of Self-Healing Property (C)] As described above, a protective film with a 2.07 μm deep scratch on its surface before heating was formed. The film was then heated at 90°C for 2 hours, followed by heating at 130°C for 2 hours. Similarly, the surface of the protective film was observed using a laser microscope. A scratch with a depth of approximately 0.18 μm (i.e., the depth of the scratch after heating at 90°C and then heat-hardening) was observed on the surface of the protective film.
利用下述式,以將小數點以下第一位之值經四捨五入而以整數算出因於130℃加熱2h所致之自我修復率(C)[%]。 自我修復率(C)[%]={(加熱前的傷痕的深度-90℃加熱後進而加熱硬化後之傷痕的深度)/加熱前的傷痕的深度}×100The self-repair rate (C) [%] resulting from heating at 130℃ for 2 hours is calculated using the following formula, rounding off the first decimal place. Self-repair rate (C) [%] = {(depth of the scratch before heating - depth of the scratch after heating to 90℃ and then hardening) / depth of the scratch before heating} × 100
將自我修復率(C)[%]、以及如下基準之評價結果示於表1。 A:100%至80% B:79%至60% C:59%至35% D:34%至15% E:14%至0%Table 1 shows the self-repair rate (C) [%] and the evaluation results based on the following criteria: A: 100% to 80% B: 79% to 60% C: 59% to 35% D: 34% to 15% E: 14% to 0%
[自我修復性(B)之評價] 與上述相同,將於表面形成有加熱前的傷痕的深度2.01μm的傷痕之保護膜形成膜,於130℃加熱2h而作成保護膜。同樣地,以雷射顯微鏡觀察保護膜之表面的結果,於保護膜之表面觀察到深度約0.80μm(亦即,加熱硬化後之傷痕的深度)的傷痕。[Evaluation of Self-Healing (B)] As described above, a protective film with a 2.01 μm deep scratch on its surface before heating was formed and heated at 130°C for 2 hours to create the protective film. Similarly, the surface of the protective film was observed using a laser microscope, and a scratch with a depth of approximately 0.80 μm (i.e., the depth of the scratch after heat hardening) was observed on the surface of the protective film.
利用下述式,以將小數點以下第一位之值經四捨五入而以整數算出因於130℃加熱2h所致之自我修復率(B)[%]。 自我修復率(B)[%]={(加熱前的傷痕的深度-加熱硬化後之傷痕的深度)/加熱前的傷痕的深度}×100The self-repair rate (B) [%] resulting from heating at 130°C for 2 hours is calculated using the following formula, rounding the first decimal place to the nearest integer. Self-repair rate (B) [%] = {(depth of the scratch before heating - depth of the scratch after heat hardening) / depth of the scratch before heating} × 100
將自我修復率(B)[%]、以及如下基準之之評價結果示於表1。 (評價基準) A:100%至80% B:79%至60% C:59%至35% D:34%至15% E:14%至0%The self-repair rate (B) [%] and the evaluation results based on the following criteria are shown in Table 1. (Evaluation Criteria) A: 100% to 80% B: 79% to 60% C: 59% to 35% D: 34% to 15% E: 14% to 0%
[保護膜形成膜之製造、以及保護膜形成膜之評價] [實施例2至實施例7、比較例1至比較例2] 保護膜形成膜之含有成分與含量,除了以如表1或表2所示般變更調配成分的種類之方面以外,係以與實施例1之情形相同方法來製造保護膜形成膜以及保護膜形成用複合片,並評價保護膜形成膜。結果示於表1或表2。[Manufacturing and Evaluation of Protective Film Forming Film] [Examples 2 to 7, Comparative Examples 1 to 2] The protective film forming film and the composite sheet for forming the protective film were manufactured in the same manner as in Example 1, except that the types of ingredients were changed as shown in Table 1 or Table 2. The protective film forming film was evaluated. The results are shown in Table 1 or Table 2.
[表1]
[表2]
如由上述結果所表明,比較例1至比較例2的保護膜形成膜於90℃進行2h的加熱,未觀測到自我修復性的功效。而且,比較例1至比較例2的保護膜形成膜藉由通常的加熱硬化條件的於130℃進行2h的加熱,未觀測到自我修復性的功效。即使藉由於90℃進行2h的加熱、以及於130℃進行2h的加熱,仍未觀測到自我修復性的功效。As the results above indicate, no self-repairing effect was observed in the protective film-forming films of Comparative Examples 1 and 2 after heating at 90°C for 2 hours. Furthermore, no self-repairing effect was observed in the protective film-forming films of Comparative Examples 1 and 2 after heating at 130°C for 2 hours under normal heat curing conditions. Even after heating at 90°C for 2 hours and at 130°C for 2 hours, no self-repairing effect was observed.
相對於此,實施例1至實施例7的保護膜形成膜藉由於90℃進行2h的加熱,觀測到自我修復性的功效。而且,實施例1至實施例7的保護膜形成膜藉由通常的加熱硬化條件的於130℃進行2h的加熱,觀測到自我修復性的功效。進而,相較於通常的加熱硬化條件的於130℃進行2h的加熱,藉由於90℃進行2h的加熱、以及於130℃進行2h的加熱,觀測到優異之自我修復性的功效。因此,利用本發明的保護膜形成膜、或具備本發明的保護膜形成膜之保護膜形成用複合片來製造具保護膜之工件或具保護膜之工件加工物之步驟中,即使於保護膜形成膜之表面形成有傷痕時,仍可使保護膜形成膜經熱硬化後之保護膜之表面之傷痕變得不明顯。 [產業可利用性]In contrast, the protective film forming films of Examples 1 to 7 exhibited self-repairing properties when heated at 90°C for 2 hours. Furthermore, the protective film forming films of Examples 1 to 7 also exhibited self-repairing properties when heated at 130°C for 2 hours under normal heat curing conditions. Moreover, compared to heating at 130°C for 2 hours under normal heat curing conditions, superior self-repairing properties were observed when heated at 90°C for 2 hours and at 130°C for 2 hours. Therefore, in the process of manufacturing workpieces with protective films or processed workpieces with protective films using the protective film forming film of the present invention, or a composite sheet for forming protective films having the protective film forming film of the present invention, even if scratches are formed on the surface of the protective film forming film, the scratches on the surface of the protective film after thermosetting can still become less noticeable. [Industrial Applicability]
本發明能夠用於製造以半導體裝置為代表之各種基板裝置。This invention can be used to manufacture various substrate devices, such as semiconductor devices.
7:輸送機構 8:台 9:晶圓 9a:晶圓的電路面 9b:晶圓的內面 10,20:支撐片 10a,20a:支撐片的一面(第一面) 11,81:基材 11a:基材的一面(第一面) 12,82:黏著劑層 12a,82a:黏著劑層的第一面 13,23:保護膜形成膜(熱硬化性之保護膜形成膜) 13a,23a:保護膜形成膜的一面(第一面) 13b,23b:保護膜形成膜的另一面(第二面) 13’,130’:保護膜 13b’,130b’:保護膜的第二面 130:切斷後之保護膜形成膜 130a:切斷後之保護膜形成膜的第一面 130b:切斷後之保護膜形成膜的第二面 130a’:保護膜的第一面 15:剝離膜 16:治具用接著劑層 16a:治具用接著劑層的第一面 17:異物 18:按壓痕 19:接觸痕 80:切割片 80a:切割片的第一面 90:晶片 90b:晶片的內面 101,102,103,104:保護膜形成用複合片 151:第一剝離膜 152:第二剝離膜 161:層壓輥 800:扯離機構 901:具保護膜形成膜之晶圓 902:具保護膜之晶圓 903,905:具保護膜形成膜之晶片群 904:具保護膜之晶片群 913:具保護膜形成膜之晶片 913’:具保護膜之晶片 P:扯離方向7: Conveying mechanism 8: Platform 9: Wafer 9a: Wafer's electrical surface 9b: Inner surface of the wafer 10, 20: Support sheet 10a, 20a: One side of the support sheet (first side) 11, 81: Substrate 11a: One side of the substrate (first side) 12, 82: Adhesive layer 12a, 82a: First side of the adhesive layer 13, 23: Protective film forming film (thermosetting protective film forming film) 13a, 23a: One side of the protective film forming film (first side) 13b, 23b: The other side of the protective film forming film (second side) 13’, 130’: Protective film 13b’, 130b’: Second side of the protective film 130: Protective film forming film after cutting 130a: First side of the protective film formed after cutting 130b: Second side of the protective film formed after cutting 130a’: First side of the protective film 15: Peeling film 16: Adhesive layer for fixture 16a: First side of adhesive layer for fixture 17: Foreign matter 18: Indentation 19: Contact mark 80: Die 80a: First side of the die 90: Wafer 90b: Inner surface of the wafer 101, 102, 103, 104: Composite sheet for forming the protective film 151: First peeling film 152: Second peeling film 161: Lamination roller 800: Peeling mechanism 901: Wafer with protective film forming film 902: Wafer with protective film 903, 905: Wafer array with protective film formation 904: Wafer array with protective film 913: Wafer with protective film formation 913’: Wafer with protective film P: Pull-off direction
[圖1]係示意性地表示本發明之一實施形態之保護膜形成膜之一例的剖面圖。 [圖2]係示意性地表示本發明之一實施形態之保護膜形成用複合片之一例的剖面圖。 [圖3]係示意性地表示本發明之一實施形態之保護膜形成用複合片之另一例的剖面圖。 [圖4]係示意性地表示本發明之一實施形態之保護膜形成用複合片之進而另一例的剖面圖。 [圖5]係示意性地表示本發明之一實施形態之保護膜形成用複合片之進而另一例的剖面圖。 [圖6]係用以示意性地說明本發明之一實施形態之具保護膜之晶圓的製造方法之一例的剖面圖。 [圖7]係用以示意性地說明本發明之一實施形態之具保護膜之晶圓的製造方法之另一例的剖面圖。 [圖8]係用以示意性地說明本發明之一實施形態之具保護膜之晶片的製造方法之一例的剖面圖。 [圖9]係用以示意性地說明本發明之一實施形態之具保護膜之晶片的製造方法之另一例的剖面圖。[Figure 1] is a schematic cross-sectional view illustrating an example of a protective film forming film according to an embodiment of the present invention. [Figure 2] is a schematic cross-sectional view illustrating an example of a composite sheet for forming a protective film according to an embodiment of the present invention. [Figure 3] is a schematic cross-sectional view illustrating another example of a composite sheet for forming a protective film according to an embodiment of the present invention. [Figure 4] is a schematic cross-sectional view illustrating yet another example of a composite sheet for forming a protective film according to an embodiment of the present invention. [Figure 5] is a schematic cross-sectional view illustrating yet another example of a composite sheet for forming a protective film according to an embodiment of the present invention. [Figure 6] is a cross-sectional view illustrating an example of a method for manufacturing a wafer with a protective film according to an embodiment of the present invention. [Figure 7] is a cross-sectional view illustrating another example of a method for manufacturing a wafer with a protective film according to an embodiment of the present invention. [Figure 8] is a cross-sectional view illustrating another example of a method for manufacturing a chip with a protective film according to an embodiment of the present invention. [Figure 9] is a cross-sectional view illustrating another example of a method for manufacturing a chip with a protective film according to an embodiment of the present invention.
13:保護膜形成膜(熱硬化性之保護膜形成膜) 13: Protective film formation (thermosetting protective film formation)
13a:保護膜形成膜的一面(第一面) 13a: Protective film forming one side of the film (first side)
13b:保護膜形成膜的另一面(第二面) 13b: The protective film forms the other side (second side) of the membrane.
151:第一剝離膜 151: First membrane exfoliation
152:第二剝離膜 152: Second exfoliation membrane
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