TWI896261B - Optical detection apparatus - Google Patents

Abstract

The present invention provides an optical detection apparatus, which includes a component conveyor, a lower visual detection mechanism, two transporting mechanisms configured to transport a plurality of electronic components between the component conveyor and the lower visual detection mechanism, and a composite device that is located at one side of the two transporting mechanisms. The composite device includes an upper visual detection mechanism and a surrounding surface detection mechanism. The electronic components can be transported to the composite device after lower surfaces of the electronic components are detected by the lower visual detection mechanism, and the composite device is movable relative to the detection conveyor, such that the upper visual detection mechanism and the surrounding surface detection mechanism are operated to detect upper surfaces and surrounding lateral surfaces of the electronic components.

Description

Optical testing equipment

The present invention relates to a detection device, and in particular to an optical detection device.

Existing optical inspection equipment requires at least six inspection stations to inspect the outer surface of an electronic component. Specifically, to inspect the circumferential side of an electronic component, the existing optical inspection equipment must place the individual electronic component inside a reflector to achieve circumferential inspection. However, the structure of existing optical inspection equipment makes the inspection process time-consuming and requires a large amount of factory space.

Therefore, the inventors believed that the above-mentioned defects could be improved. Therefore, they conducted intensive research and applied scientific principles, and finally proposed the present invention, which has a rational design and effectively improves the above-mentioned defects.

An embodiment of the present invention provides an optical inspection device that can effectively improve the defects that may occur in existing optical inspection devices.

The present invention discloses an optical inspection device comprising: a workbench; a material conveyor belt mounted on the workbench and configured to transport a tray carrying a plurality of electronic components along a first direction, so that the tray can be moved between a first position, a second position, and a third position; a first transfer mechanism mounted on the workbench and configured to pick up and transport the plurality of electronic components from the tray at the first position along a second direction perpendicular to the first direction; and a visual inspection mechanism mounted on the workbench and configured to: The first transfer mechanism is located on one side of the lower visual detection mechanism; wherein the lower visual detection mechanism is used to receive the plurality of electronic components transmitted from the first transfer mechanism and detect the lower surfaces of the plurality of electronic components; a second transfer mechanism is installed on the workbench, and the second transfer mechanism is located on the other side of the lower visual detection mechanism; wherein the second transfer mechanism is used to transfer the plurality of electronic components that have completed the detection by the lower visual detection mechanism to the material tray located at the second position; and a composite device is installed The composite device is mounted on the workbench and is located on a side of the second transfer mechanism far away from the first transfer mechanism; wherein the composite device includes: an upper visual detection mechanism, which can be used to detect the upper surface of the plurality of electronic components in the tray located at the third position; and a circular side detection mechanism, including: a housing; a camera installed in the housing; a conical reflector located in the housing and below the camera; and an annular reflector located in the housing and corresponding to the conical reflector configuration; wherein the The imaging optical path of the camera, through reflection from the conical reflector and the annular reflector, defines an imaging space outside the housing, which is used to detect the annular side surfaces of the plurality of electronic components in the tray at the third position. When the tray carries the plurality of electronic components and is at the third position, the hybrid device can move relative to the component conveyor, enabling the upper visual inspection mechanism and the annular side surface inspection mechanism to inspect the upper surfaces and annular side surfaces of the plurality of electronic components.

The present invention also discloses an optical inspection device, which includes: a workbench; a material conveyor belt mounted on the workbench and used to transport a material tray carrying multiple electronic components along a first direction so that the material tray can move between a first position, a second position, and a third position; a first transfer mechanism mounted on the workbench and used to pick up and transport multiple electronic components from the material tray at the first position along a second direction perpendicular to the first direction. The electronic components are mounted on the workbench, and the first transfer mechanism is located on one side of the lower visual detection mechanism. The lower visual detection mechanism is configured to receive the plurality of electronic components transmitted from the first transfer mechanism and detect the bottom surfaces of the plurality of electronic components. A second transfer mechanism is mounted on the workbench, and the second transfer mechanism is located on the other side of the lower visual detection mechanism. The second transfer mechanism is used to transfer the plurality of electronic components that have completed the inspection of the lower visual inspection mechanism to the material tray located at the second position; and a composite device installed on the workbench and located on a side of the second transfer mechanism far away from the first transfer mechanism; wherein the composite device includes: an upper visual inspection mechanism that can be used to detect the upper surface of the plurality of electronic components in the material tray located at the third position; and a side ring The inspection mechanism defines an imaging space located outside the inspection mechanism for inspecting the circumferential side surfaces of the plurality of electronic components in the tray located at the third position. When the tray carries the plurality of electronic components and is located at the third position, the composite device is movable relative to the component conveyor belt so that the upper visual inspection mechanism and the circumferential side surface inspection mechanism can inspect the upper surface and circumferential side surfaces of the plurality of electronic components.

In summary, the optical inspection device disclosed in the embodiments of the present invention integrates the upper visual inspection mechanism and the circumferential side inspection mechanism in the same axial direction through the composite inspection device, thereby improving the inspection performance of the optical inspection device and reducing the overall size of the optical inspection device.

Furthermore, the optical inspection device disclosed in the embodiments of the present invention employs a circumferential side surface inspection mechanism that can directly image the circumferential side surfaces of multiple electronic components located outside the circumferential side surface inspection mechanism through the imaging space. This eliminates the need to inspect the circumferential side surfaces of the electronic components one by one, thereby effectively improving inspection performance.

To further understand the features and technical contents of the present invention, please refer to the following detailed description and drawings of the present invention. However, such description and drawings are only used to illustrate the present invention and are not intended to limit the scope of protection of the present invention.

100: Optical testing equipment

1: Material conveyor belt

11: Feeding tray

2: First transfer mechanism

21: Track

22: Extractor

3: Second transfer mechanism

31: Track

32: Extractor

4: Lower visual detection mechanism

41:Jig

42: Light Projector

43: Optical Receiver

44: Processing Module

5: Composite device

51: Third transfer mechanism

511: Track

512: Extractor

52: Upper visual detection mechanism

53: Circumferential side detection mechanism

531: Shell

532: Camera

533: Conical reflector

5331: First Reflector

534: Ring reflector

5341: Second reflector

6: Material separation unit

7: Tray conveyor belt

8: Workbench

D1: First Direction

D2: Second Direction

H: Height direction

P1: First position

P2: Second position

P3: Third position

L: Structured Light

S: Imaging space

P: Imaging optical path

C: Center axis

σ: Reflection angle

200: Electronic components

200a: Components tested

201: Lower surface

202: Upper surface

203: Circumferential side

Figure 1 is a side view schematic diagram of an optical detection device according to an embodiment of the present invention.

Figure 2 is a schematic top view of an optical detection device according to an embodiment of the present invention.

Figure 3 is a schematic diagram of the subsequent operation of Figure 2.

Figure 4 is a schematic diagram of the subsequent operation of Figure 3.

Figure 5 is a partially enlarged cross-sectional schematic diagram of Figure 4.

Figure 6 is a schematic diagram of the subsequent operation of Figure 4.

Figure 7 is a schematic diagram of the subsequent operation of Figure 6.

Figure 8 is a schematic diagram of the subsequent operation of Figure 7.

Figure 9 is a partially enlarged cross-sectional view of Figure 8.

Figure 10 is a schematic diagram of the subsequent operation of Figure 8.

The following describes the implementation of the "optical detection device" disclosed in this invention through specific embodiments. Those skilled in the art will appreciate the advantages and benefits of this invention from the disclosure herein. This invention may be implemented or applied through various other specific embodiments, and the details herein may be modified and altered based on different perspectives and applications without departing from the spirit of this invention. Furthermore, the accompanying figures are for schematic illustration only and are not intended to be drawn to actual size. This is to be noted in advance. The following embodiments further illustrate the relevant technical aspects of this invention, but the disclosure is not intended to limit the scope of protection of this invention.

It should be understood that while terms such as "first," "second," and "third" may be used herein to describe various elements or features, these elements or features should not be limited by these terms. These terms are primarily used to distinguish one element from another, or one feature from another. Furthermore, the term "or" as used herein may include any one or more combinations of the associated listed items, as appropriate.

Please refer to Figures 1 to 10 , which illustrate an embodiment of the present invention. As shown in Figures 1 and 2 , this embodiment discloses an optical inspection device 100 comprising a material conveyor belt 1, a first transfer mechanism 2 spanning the material conveyor belt 1, a second transfer mechanism 3 parallel to the first transfer mechanism 2, a visual inspection mechanism 4 located between the first transfer mechanism 2 and the second transfer mechanism 3, a composite device 5 spanning the material conveyor belt 1, a plurality of material separation units 6 parallel to and located on one side of the material conveyor belt 1, a tray conveyor belt 7 parallel to and located on the other side of the material conveyor belt 1, and a workbench 8 for mounting the aforementioned components.

In other words, the material conveyor belt 1, the first transfer mechanism 2, the second transfer mechanism 3, the lower visual inspection mechanism 4, the composite device 5, the plurality of material separation units 6, and the tray conveyor belt 7 are all mounted on the workbench 8, but the present invention is not limited thereto. For example, in other embodiments not shown, the optical inspection apparatus 100 may omit the plurality of material separation units 6 and the tray conveyor belt 7 based on actual needs.

In this embodiment, the material conveyor belt 1 is used to transport at least one material tray 11 along a first direction D1. The material tray 11 carries a plurality of electronic components 200 and is movable (along the material conveyor belt 1) between a first position P1, a second position P2, and a third position P3. In this embodiment, the material conveyor belt 1 substantially spans the entire workbench 8 along the first direction D1. It should be noted that, to facilitate understanding of this embodiment, the number of material trays 11 on the material conveyor belt 1 is described below as one, but the present invention is not limited thereto.

To facilitate understanding of the transfer structure layout of the optical inspection apparatus 100 in this embodiment, a brief description of the various mechanisms included in the composite device 5 is provided. In this embodiment, the composite device 5 includes a third transfer mechanism 51, an upper visual inspection mechanism 52 mounted on the third transfer mechanism 51, and a circumferential side inspection mechanism 53 mounted on the third transfer mechanism 51. In other words, the composite device 5 in this embodiment includes both transfer and multiple inspection functions, but the present invention is not limited to this.

The first transfer mechanism 2, the second transfer mechanism 3, and the composite device 5 (e.g., the third transfer mechanism 51) are arranged parallel to each other and are each mounted on the workbench 8 along a second direction D2 perpendicular to the first direction D1. The composite device 5 is located on the side of the second transfer mechanism 3 that is farther from the first transfer mechanism 2 (i.e., the second transfer mechanism 3 is located between the first transfer mechanism 2 and the composite device 5). The composite device 5 (e.g., the third transfer mechanism 51) spans the material conveyor belt 1, the plurality of material distribution units 6, and the tray conveyor belt 7.

Furthermore, in this embodiment, the first transfer mechanism 2, the second transfer mechanism 3, and the third transfer mechanism 51 each include a rail 21, 31, 511 and a grabber 22, 32, 512 movably mounted on the rail 21, 31, 511. The rails 21, 31, 511 are mounted on the workbench 8 and arranged along the second direction D2, and the grabbers 22, 32, 512 are used to grab a plurality of the electronic components 200. Furthermore, the movement path of the grabber 22 of the first transfer mechanism 2 passes through the first position P1 of the material conveyor 1, the movement path of the grabber 32 of the second transfer mechanism 3 passes through the second position P2 of the material conveyor 1, and the movement path of the grabber 512 of the third transfer mechanism 51 passes through the third position P3 of the material conveyor 1.

The upper visual inspection mechanism 52 and the circumferential side inspection mechanism 53 are preferably arranged along the second direction D2 and mounted on the grabber 512 of the third transfer mechanism 51, thereby enabling movement relative to the material conveyor belt 1. However, the present invention is not limited to this. For example, in other embodiments not shown, the upper visual inspection mechanism 52 and/or the circumferential side inspection mechanism 53 may also be movably mounted on the track 511 of the third transfer mechanism 51, enabling independent movement relative to the material conveyor belt 1, as required. Alternatively, the upper visual inspection mechanism 52 and the circumferential side inspection mechanism 53 may each be equipped with a separate transfer mechanism.

The above is a brief description of the transfer structure layout of the optical inspection device 100 in this embodiment. The following describes the remaining structural details and operational functions of the optical inspection device 100. As shown in Figures 3 to 6, the downward vision detection mechanism 4 is positioned above the movement path of the capturer 32 of the first transfer mechanism 2 and the second transfer mechanism 3. In other words, the first transfer mechanism 2 is located on one side of the downward vision detection mechanism 4, while the second transfer mechanism 3 is located on the other side of the downward vision detection mechanism 4.

The first transfer mechanism 2 (e.g., the picker 22) is used to pick up and transfer the plurality of electronic components 200 from the tray 11 located at the first position P1 along the second direction D2. The lower vision inspection mechanism 4 is used to receive the plurality of electronic components 200 transferred from the first transfer mechanism 2 and inspect the lower surfaces 201 of the plurality of electronic components 200 (e.g., Figure 5). The second transfer mechanism 3 is used to transfer the plurality of electronic components 200 inspected by the lower vision inspection mechanism 4 to the tray 11 located at the second position P2, thereby transporting the tray 11 from the second position P2 to the third position P3 via the component conveyor belt 1.

It should be noted that the specific architecture of the downward vision detection mechanism 4 can be adjusted and varied according to actual needs. However, to facilitate understanding of this embodiment, the following description will use one possible architecture of the downward vision detection mechanism 4, but the present invention is not limited to this. As shown in Figure 5, the downward vision detection mechanism 4 in this embodiment includes a fixture 41, a light projector 42 facing the bottom side of the fixture 41, multiple light receivers 43 corresponding to the light projector 42, and a processing module 44 electrically coupled to the multiple light receivers 43.

More specifically, the jig 41 is used to support multiple electronic components 200, with the bottom surfaces 201 of the multiple electronic components 200 exposed outside the jig 41. The light projector 42 is used to emit structured light L based on interference fringes toward the bottom surface 201 (e.g., multiple contacts) of each electronic component 200. Multiple light receivers 43 are used to receive the structured light L reflected by each electronic component 200 to generate a signal. The processing module 44 receives the signal and generates a three-dimensional structure corresponding to the bottom surface 201 of each electronic component 200. Furthermore, in this embodiment, the processing module 44 may present the three-dimensional surface in the form of point cloud data, which can be displayed on a screen (not shown), but the present invention is not limited to the above.

As shown in Figures 7 to 9 , the upper visual detection mechanism 52 in this embodiment can be used to detect the upper surfaces 202 of the plurality of electronic components 200 within the tray 11 at the third position P3. The specific structure of the upper visual detection mechanism 52 can also be adjusted based on actual needs. However, for ease of understanding, the structure of the upper visual detection mechanism 52 in this embodiment is similar to that of the lower visual detection mechanism 4 shown in Figure 5 , and therefore will not be further described below.

The circumferential side surface detection mechanism 53 defines an imaging space S outside of it for detecting the circumferential side surfaces 203 of the plurality of electronic components 200 within the tray 11 at the third position P3. In other words, the circumferential side surface detection mechanism 53 can directly image the circumferential side surfaces 203 of the plurality of electronic components 200 located outside the circumferential side surface detection mechanism 53 through the imaging space S, eliminating the need to inspect the circumferential side surfaces 203 of each electronic component 200 individually, thereby effectively improving detection performance. Alternatively, any detection mechanism that requires placing electronic components within a space enclosed by a reflector is different from the circumferential side surface detection mechanism 53 provided in this embodiment.

It should be noted that the specific structure of the circumferential side detection mechanism 53 can be adjusted and varied based on actual needs. However, to facilitate understanding of this embodiment, the following description will use one possible structure of the circumferential side detection mechanism 53, but the present invention is not limited to this. As shown in Figure 9, the circumferential side detection mechanism 53 in this embodiment includes a housing 531, a camera 532 mounted within the housing 531, a conical reflector 533 located within the housing 531 and below the camera 532, and an annular reflector 534 located within the housing 531 and corresponding to the conical reflector 533.

More specifically, the circumferential side surface detection mechanism 53 is mounted on the third transfer mechanism 51 via the housing 531, and the camera 532 is positioned directly above the conical reflector 533 along a height direction H perpendicular to the first direction D1 and the second direction D2. Furthermore, the imaging optical path P of the camera 532, reflected by the conical reflector 533 and the annular reflector 534, defines an imaging space S outside the housing 531. This space is used to detect the circumferential side surfaces 203 of the plurality of electronic components 200 on the tray 11 at the third position P3.

As described above, when the material tray 11 carries a plurality of the electronic components 200 and is located at the third position P3, the composite device 5 can move relative to the material conveyor belt 1 (along the second direction D2) so that the upper visual inspection mechanism 52 and the circumferential side surface inspection mechanism 53 can be used to inspect the upper surfaces 202 and the circumferential side surfaces 203 of the plurality of electronic components 200.

Accordingly, in this embodiment, the optical inspection device 100 can integrate the upper visual inspection mechanism 52 and the circumferential side inspection mechanism 53 in the same axial direction through the composite device 5, thereby improving the inspection performance of the optical inspection device 100 and reducing the overall size of the optical inspection device 100.

Furthermore, to ensure that the annular side surface detection mechanism 53 has a better detection effect, the annular side surface detection mechanism 53 preferably has at least some of the following features: wherein the conical reflector 533 includes N first reflectors 5331, the annular reflector 534 includes N second reflectors 5341, and the positions of the N first reflectors 5331 correspond to the positions of the N second reflectors 5341 (e.g., the imaging optical path P is reflected twice by each first reflector 5331 and the corresponding second reflector 5341, overlapping to form the imaging space S outside the housing 531), and N is a positive integer greater than 5 (e.g., N is 8). More specifically, when the imaging light path P passes through the annular reflector 534 , each of the second reflective mirrors 5341 can face the imaging space S and form a reflection angle σ between 40 degrees and 50 degrees relative to the height direction H, but the present invention is not limited thereto.

Furthermore, the housing 531 defines a central axis C parallel to the height direction H, and the camera 532 is disposed on the central axis C. The conical reflector 533 exhibits N-fold rotational symmetry with respect to the central axis C, and the annular reflector 534 also exhibits N-fold rotational symmetry with respect to the central axis C. More specifically, the area encompassed by the plurality of first reflectors 5331 gradually increases in size as it moves away from the camera 532, and the bottom portion of the conical reflector 533 distal to the camera 532 is encompassed by the annular reflector 534, but the present invention is not limited thereto.

For example, in other embodiments not shown in the present invention, the annular reflector 534 may be spaced apart from the tapered reflector 533 along the height direction H; alternatively, the imaging optical path P of the annular side detection mechanism 53 may define the imaging space S outside the housing 531 through two or more reflections.

As described above, as shown in Figures 8 to 10 , each electronic component 200 is defined as an inspected component 200a after inspection on the lower surface 201, the upper surface 202, and the circumferential side surface 203. This component is located within the tray 11 at the third position P3. Furthermore, the third transfer mechanism 51 (e.g., the grabber 512) is movable between the material conveyor 1 and the plurality of sorting units 6. The third transfer mechanism 51 can selectively move at least one inspected component 200a from the tray 11 at the third position P3 to one of the plurality of sorting units 6.

Accordingly, in this embodiment, the optical inspection apparatus 100 can use the third transfer mechanism 51 to classify the plurality of inspected components 200a according to the inspection results and move them to corresponding sorting units 6. For example, inspected components 200a without defects, inspected components 200a with defects on the lower surface 201, inspected components 200a with defects on the upper surface 202, and inspected components 200a with defects on the circumferential side 203 can each be stored in a separate sorting unit 6.

It should be noted that all components of the optical inspection device 100 in this embodiment can operate synchronously (for example, while the lower visual inspection mechanism 4 is inspecting a batch of electronic components 200, the upper visual inspection mechanism 52 and the circumferential surface inspection mechanism 53 can simultaneously inspect another batch of electronic components 200). This effectively improves the operating efficiency of the optical inspection device 100.

[Technical effects of the embodiments of the present invention]

In summary, the optical inspection device disclosed in the embodiments of the present invention integrates the upper visual inspection mechanism and the circumferential side inspection mechanism in the same axial direction through the composite inspection device, thereby improving the inspection performance of the optical inspection device and reducing the overall size of the optical inspection device.

Furthermore, the optical inspection device disclosed in the embodiments of the present invention employs a circumferential side surface inspection mechanism that can directly image the circumferential side surfaces of multiple electronic components located outside the circumferential side surface inspection mechanism through the imaging space. This eliminates the need to inspect the circumferential side surfaces of the electronic components one by one, thereby effectively improving inspection performance.

The contents disclosed above are merely preferred feasible embodiments of the present invention and do not limit the patent scope of the present invention. Therefore, any equivalent technical variations made using the contents of the description and drawings of the present invention are included in the patent scope of the present invention.

100: Optical testing equipment

1: Material conveyor belt

11: Feeding tray

2: First transfer mechanism

21: Track

22: Extractor

3: Second transfer mechanism

31: Track

32: Extractor

4: Lower visual detection mechanism

41:Jig

5: Composite device

51: Third transfer mechanism

511: Track

512: Extractor

52: Upper visual detection mechanism

53: Circumferential side detection mechanism

6: Material separation unit

7: Tray conveyor belt

8: Workbench

D1: First Direction

D2: Second Direction

P1: First position

P2: Second position

P3: Third position

200: Electronic components

Claims (10)

An optical inspection device comprises: A workbench; A material conveyor belt mounted on the workbench and configured to transport a tray carrying a plurality of electronic components along a first direction, so that the tray can be moved between a first position, a second position, and a third position; A first transfer mechanism mounted on the workbench and configured to retrieve and transfer the plurality of electronic components from the tray at the first position along a second direction perpendicular to the first direction; A lower visual inspection mechanism mounted on the workbench, with the first transfer mechanism located to one side of the lower visual inspection mechanism; wherein the lower visual inspection mechanism is configured to receive the plurality of electronic components transferred from the first transfer mechanism and inspect the lower surfaces of the plurality of electronic components; A second transfer mechanism mounted on the workbench and located on the other side of the lower visual inspection mechanism; wherein the second transfer mechanism is configured to transfer the plurality of electronic components inspected by the lower visual inspection mechanism to the tray located at the second position; and A composite device mounted on the workbench and located on a side of the second transfer mechanism remote from the first transfer mechanism; wherein the composite device comprises: An upper visual inspection mechanism configured to inspect the upper surfaces of the plurality of electronic components in the tray located at the third position; and A circumferential side inspection mechanism comprising: A housing defining a central axis parallel to a height direction perpendicular to the first and second directions; A camera mounted within the housing and positioned above the central axis; A conical reflector positioned within the housing and below the camera; and An annular reflector positioned within the housing and corresponding to the conical reflector. The imaging optical path of the camera, through reflections from the conical reflector and the annular reflector, defines an imaging space outside the housing for detecting the circumferential side surfaces of the plurality of electronic components within the tray at the third position. When the material tray carries a plurality of the electronic components and is located at the third position, the composite device can move relative to the material conveyor belt so that the upper visual inspection mechanism and the circumferential side inspection mechanism can be used to inspect the upper surfaces and circumferential side surfaces of the plurality of electronic components. The optical inspection equipment as described in claim 1, wherein the composite device further includes a third transfer mechanism mounted on the workbench, and the upper visual inspection mechanism and the circumferential side inspection mechanism are mounted on the third transfer mechanism so as to be able to move relative to the material conveyor belt. The optical inspection apparatus of claim 2, wherein the first transfer mechanism, the second transfer mechanism, and the third transfer mechanism each comprise: a rail mounted on the workbench and arranged along the second direction; and a picker movably mounted on the rail, the picker being configured to pick up the plurality of electronic components. The optical inspection apparatus of claim 2, wherein each electronic component is defined as an inspected component after inspection on the bottom surface, the top surface, and the circumferential side surface, and is located within the tray at the third position; wherein the optical inspection apparatus further comprises: a plurality of sorting units mounted on the workbench, and wherein the plurality of sorting units are located on one side of the material conveyor belt; wherein the third transfer mechanism is movable between the material conveyor belt and the plurality of sorting units; wherein the third transfer mechanism is operable to selectively move at least one of the inspected components from the tray at the third position to one of the plurality of sorting units. The optical inspection device as described in claim 4, wherein the optical inspection device further includes a material tray conveyor belt located on the other side of the material conveyor belt, which is parallel to the material conveyor belt. The optical detection device as described in claim 1, wherein the upper visual detection mechanism and the circumferential side detection mechanism are arranged along the second direction, and the camera is arranged directly above the conical reflector along the height direction. An optical detection device as described in claim 6, wherein the conical reflector includes N first reflectors, the annular reflector includes N second reflectors, and N is a positive integer greater than 5; wherein the conical reflector has N-fold rotational symmetry with respect to the central axis, and the annular reflector has N-fold rotational symmetry with respect to the central axis. An optical detection device as described in claim 7, wherein the area surrounded by the plurality of first reflectors gradually increases in a direction away from the camera, and the bottom of the conical reflector away from the camera is surrounded by the annular reflector. As described in claim 7, the optical detection device, wherein when the imaging light path passes through the annular reflector, each of the second reflective mirrors can be directed toward the imaging space and form a reflection angle between 40 degrees and 50 degrees relative to the height direction. An optical inspection device comprises: A workbench; A material conveyor belt mounted on the workbench and configured to transport a tray carrying a plurality of electronic components along a first direction, so that the tray can be moved between a first position, a second position, and a third position; A first transfer mechanism mounted on the workbench and configured to retrieve and transfer the plurality of electronic components from the tray at the first position along a second direction perpendicular to the first direction; A lower visual inspection mechanism mounted on the workbench, with the first transfer mechanism located to one side of the lower visual inspection mechanism; wherein the lower visual inspection mechanism is configured to receive the plurality of electronic components transferred from the first transfer mechanism and inspect the lower surfaces of the plurality of electronic components; A second transfer mechanism mounted on the workbench and located on the other side of the lower visual inspection mechanism; wherein the second transfer mechanism is used to transfer the plurality of electronic components inspected by the lower visual inspection mechanism to the material tray located at the second position; and A composite device mounted on the workbench and located on a side of the second transfer mechanism remote from the first transfer mechanism; wherein the composite device comprises: An upper visual inspection mechanism capable of inspecting the upper surfaces of the plurality of electronic components in the material tray located at the third position; and A circumferential side inspection mechanism defining an imaging space therein for inspecting the circumferential side surfaces of the plurality of electronic components in the material tray located at the third position; When the material tray carries a plurality of the electronic components and is located at the third position, the composite device can move relative to the material conveyor belt so that the upper visual inspection mechanism and the circumferential side inspection mechanism can be used to inspect the upper surfaces and circumferential side surfaces of the plurality of electronic components.