TWI894611B - Electrical test equipment - Google Patents

Abstract

An electrical testing device includes a main body unit having a frame plate defining a space, a conductive unit fixed to the space, and a positioning unit mounted on the main body unit. The frame plate has a plurality of positioning holes and through-holes. The conductive unit includes a plurality of conductive members capable of producing restorable deformation. The positioning unit includes a limiting plate, a plurality of positioning members, and a plurality of internal supports. The limiting plate has a plurality of through slots for the conductive members to extend through, a plurality of alignment holes corresponding to the positioning holes, and a plurality of through holes corresponding to the through-holes. The positioning members are arranged in the positioning holes and the alignment holes to position the limiting plate. The inner supports are penetrated by the penetration holes and correspond to the through holes, so that the limiting plate moves between an initial position at which a distance is maintained from the frame plate and an extreme position in contact with the frame plate.

Description

Electrical test equipment

The present invention relates to a sample testing device, and more particularly to an electrical testing device.

Referring to Figure 1, a conventional test device 1 is suitable for establishing an electrical connection with an electronic component 2 to perform electrical testing. The device comprises a body 11 and a plurality of probes 12 extending from the body 11 and capable of deforming and accumulating an elastic recovery force when subjected to pressure. Each probe 12 corresponds to a respective electrical contact 21 on the electronic component 2, thereby establishing an electrical connection between the electronic component 2 and the test device 1 for testing the functionality of the electronic component 2.

When the electronic component 2 is placed in the test device 1 for testing, each probe 12 has a single-arm appearance. Therefore, when each probe 12 contacts a respective electrical contact 21, it will deform along the direction of pressure against the electronic component 2 due to its own structural elasticity. This also utilizes the elastic recovery force of the probes 12 to make the electrical connection between the test device 1 and the electronic component 2 more stable.

However, the probe 12, which relies solely on a single-arm structure and, more specifically, provides only a point-to-point connection, can easily slip at the connection with the electrical contact 21 if the probe 12 has tolerances or wear defects. This not only causes an unstable electrical connection but also potentially causes unnecessary wear on the probe 12 and even the electronic component 2. Furthermore, if the probe 12 is damaged or otherwise subjected to external forces, the deformation may exceed expectations or deviate in direction, thereby affecting the testing performance of the test device 1 and even shortening the service life of the probe 12.

Therefore, the object of the present invention is to provide an electrical testing device that makes the electrical connection more stable during testing.

Therefore, the electrical testing device of the present invention includes a main body unit having a frame plate surrounding and defining a setting space, a conducting unit fixed in the setting space, and a positioning unit installed on the main body unit.

The frame plate of the main unit has a plurality of through-hole positioning holes and a plurality of through holes spaced apart from the positioning holes.

The conductive unit includes a base made of an insulating material and a plurality of conductive members extending outward from the base. Each of the conductive members can generate a maximum deformation amount that can be restored to its original state along a deformation direction toward the base.

The positioning unit includes at least one limiting plate, a plurality of positioning members, and a plurality of internal support members. Each limiting plate has a plurality of through slots for the conductive members to extend through, a plurality of alignment holes whose positions correspond to the positioning holes, and a plurality of through holes whose positions correspond to the through holes. The positioning members are arranged in the positioning holes and the alignment holes to position the at least one limiting plate. The internal support members are respectively arranged in the through holes and pass through the corresponding through holes. Each internal support member has a pin portion arranged in an individual through hole and an individual through hole, and at least one elastic portion wrapped around the pin portion and pressed against the at least one limiting plate. The elastic portions of the inner supports enable the at least one limiting plate to move between an initial position at which the limiting plate maintains a set distance from the frame plate and a limit position in contact with the frame plate.

The effectiveness of the present invention is that, by means of the positioning members and the internal supporting members of the positioning unit, an appropriate distance can be maintained between the at least one limiting plate and the frame plate. When the electronic component to be tested moves toward the at least one limiting plate and thereby establishes an electrical connection with the conductive members for testing, the thickness of the at least one limiting plate, combined with the buffer margin formed by the set distance, can prevent the conductive members from deforming beyond the maximum deformation when subjected to external forces during testing. While ensuring that the conductive members do not break or undergo irreversible deformation, the expected performance of the electrical test can be ensured, thereby optimizing the stability of the test.

Before the present invention is described in detail, it should be noted that similar elements are denoted by the same reference numerals in the following description.

Referring to FIG. 2 , a first embodiment of the electrical testing device of the present invention is shown. This first embodiment comprises a main unit 3 defining a space 300, a conductive unit 4 secured within the space 300, and a positioning unit 5 mounted on the main unit 3. The space 300 is defined as extending along an auxiliary line L. As shown in FIG. 3 , an electronic component 90 to be tested is electrically connected to the conductive unit 4 along the auxiliary line L. Electrical testing is then performed on the electronic component 90 using a driving device 99, which is electrically connected to the side opposite to the electronic component 90, as described in the first embodiment.

2 to 4 , the main unit 3 includes a frame 31 that surrounds and defines the installation space 300. The frame 31 has a plurality of through-holes 311, a plurality of through-holes 312 spaced apart from the positioning holes 311, and a plurality of protruding rings 313 disposed in the through-holes 312, each having a hole 319 smaller in diameter than the through-hole 312 and extending in the same direction as the through-hole 312.

The conductive unit 4 includes a base 41 made of an insulating material and a plurality of conductive members 42 extending outward from the base 41 toward opposite sides along the auxiliary line L. Specifically, the base 41 is a plurality of spaced-apart substrates, while the conductive members 42 are formed from a metal layer formed between the substrates. Specifically, they can be fabricated using semiconductor processes to form the desired configuration, facilitating the design of the positional distribution of the conductive members 42 corresponding to the contacts of the electronic component 90 to be tested. Because each conductive member 42 is essentially a flexible arm, each conductive member 42 can deform in a direction toward the base 41, generating a maximum amount of deformation that allows it to return to its original state.

The positioning unit 5 includes two limiting plates 51 disposed on opposite sides of the frame plate 31 along the auxiliary line L, a plurality of positioning members 52 for positioning the limiting plates 51, and a plurality of internal supports 53 for supporting the relative positions of the frame plate 31 and the limiting plates 51. Each limiting plate 51 has a plurality of through slots 510 for the conductive members 42 to extend through, a plurality of alignment holes 511 corresponding to the positioning holes 311, and a plurality of through holes 512 corresponding to the through holes 312. As shown in FIG. 5 , the cross-section of each through-slot 510 is generally narrower on the outside to match the width of the conductive members 42 and gradually expands inward. This provides a guiding effect for the conductive members 42, aligning them from opposite sides toward the center as they extend outward. This allows the conductive members 42, which are inevitably slightly offset, to be more accurately positioned in their pre-set positions as they extend outward from the through-slot 510.

Referring again to Figures 2 to 4 , the positioning members 52 are disposed in the positioning holes 311 and the alignment holes 511 to position the limiting plates 51. Each positioning member 52 has a through-portion 521 extending into a respective positioning hole 311 and alignment hole 511, and a bent portion 522 bent from the through-portion 521 to overlap the corresponding limiting plate 51. The inner support members 53 are respectively disposed through the through-portions 312 and pass through the corresponding through-holes 512. Each inner support member 53 has a pin portion 531 extending through a respective hole 319 and a respective through-hole 512, and two elastic portions 532 wound around the pin portion 531, with opposite ends respectively abutting between the respective protruding ring portion 313 and the corresponding limiting plate 51. Specifically, the elastic portions 532 of each inner support member 53 are compression springs. The elastic restoring forces of the elastic portions 532 toward opposite sides cooperate with the inward positioning forces of the bent portions 522 of the positioning members 52 hooked to the corresponding limiting plates 51, thereby maintaining a desired distance between the limiting plates 51 and the frame plate 31 in the absence of external forces.

Referring to FIG. 6 in conjunction with FIG. 4 , the elastic portions 532 of the inner supports 53 enable each of the limiting plates 51 to move between an initial position maintaining a predetermined distance D from the frame plate 31 and a limit position contacting the frame plate 31. The movement of a single limiting plate 51 during an actual electrical test of an electronic component 90 to be tested will be used as an example to illustrate this. When the multiple electrical contacts 901 of the electronic component 90 corresponding to the positions of the conductive members 42 are designed to be protruding outward, as the electronic component 90 moves toward the limit plate 51 located on the same side of the first embodiment, since the conductive members 42 extend through the through slots 510 to a protruding extension d outside the limit plate 51, when the electronic component 90 contacts the conductive members 42 and pushes against the limit plate 51, it can only move the protruding extension d and the set distance D at most, and the limit plate 51 will contact the frame plate 31, that is, move to the extreme position. Therefore, as long as the sum of the protrusion length d and the set distance D is no greater than the maximum deformation of the conductive members 42, the first embodiment can provide a buffer margin for the contact between the conductive members 42 and the electrical contacts 901, thereby preventing the conductive members 42 from generating irreversible deformation when subjected to external forces. This ensures that the conductive members 42 remain in the set state, reducing the possibility of the conductive members 42 being damaged or even bent or broken, thereby maintaining the expected performance of the first embodiment in performing electrical tests and optimizing the stability of the test.

Referring to FIG. 7 , another embodiment is shown in which the electrical contacts 901 are flat. Compared to the embodiment shown in FIG. 6 , the embodiment shown in FIG. 7 differs from the embodiment shown in FIG. Besides the different shape of the electrical contacts 901, which may result in a different timing for the electronic component 90 to contact the limiting plate 51, this embodiment also achieves the same effect of providing a buffer margin for the contact between the conductive members 42 and the electrical contacts 901, thereby preventing the conductive members 42 from irreversibly deforming when subjected to external forces.

Next, referring to FIG. 7 in conjunction with FIG. 4 and FIG. 6 , when the test is completed, the electrical contacts 901 are separated from the conductive members 42 , and the limit plate 51 will move away from the frame plate 31 due to the elastic restoring force accumulated when the elastic portions 532 are pushed, and return to the initial position at the set distance D from the frame plate 31 while being positioned by the positioning members 52 .

8 in conjunction with FIG. 4 , in another electrical test scenario, the electrical contacts 901 of the electronic component 90 must extend into the through slots 510 in order to actually contact the conductive members 42 . At this time, in order to meet such detection requirements and also to prevent the conductive parts 42 from being excessively deformed when under pressure, when the limiting plate 51 is in the initial position, the set distance D is not greater than the maximum deformation of the conductive parts 42. By properly designing the set distance D and coordinating the thickness of the limiting plate 51, a buffer margin can be provided for the contact between the conductive parts 42 and the electrical contacts 901, thereby preventing the conductive parts 42 from being irreversibly deformed when subjected to external force, thereby achieving the effect of optimizing the stability of the detection.

Referring to FIG. 9 , a second embodiment of the electrical testing device of the present invention is shown. This second embodiment differs from the first embodiment in that the main unit 3 of the second embodiment further includes two packaging plates 32 that enclose the base 41 from opposite sides along the auxiliary line L and are formed with a plurality of slots 320 for the conductive members 42 to extend through. Specifically, each packaging plate 32 is pre-connected to a respective limiting plate 51 in a modular manner. Thus, in FIG. 9 , one of the packaging plates 32 is attached to the bottom side of the upper limiting plate 51. Through these packaging plates 32, in addition to further packaging the main unit 3 into a more complete assembly component, when the conductive components 42 first extend through the slots 320 and then extend into the through slots 510, it is also more conducive to placing the conductive components 42 in a more accurate position, thereby achieving a more precise electrical connection, thereby further optimizing the detection performance.

In summary, the electrical testing device of the present invention, through the positioning members 52 and the internal supports 53 of the positioning unit 5, can maintain an appropriate set distance D between the limiting plates 51 and the frame plate 31. Furthermore, the thickness of the limiting plates 51 is combined to provide a deformation buffer for the conductive contacts 42 during testing. This ensures that the conductive contacts 42 do not break or undergo irreversible deformation, thereby ensuring that the expected performance of the electrical test is achieved and optimizing the stability of the test. Therefore, the purpose of the present invention is truly achieved.

However, the above description is merely an example of the present invention and should not be used to limit the scope of the present invention. All simple equivalent changes and modifications made within the scope of the patent application and the contents of the patent specification of the present invention are still within the scope of the present patent.

3: Main unit 300: Installation space 31: Frame 311: Positioning hole 312: Through hole 313: Raised ring 319: Hole 32: Package 320: Slot 4: Conductor unit 41: Base 42: Conductor 5: Positioning unit 51: Stop plate 510: Through slot 511: Alignment hole 512: Through hole 52: Positioning member 521: Extended portion 522: Bend 53: Internal support 531: Pin 532: Elastic portion 90: Electronic component 901: Electrical contact 99: Drive device d: Extended length D: Setting distance L: Auxiliary line

Other features and functions of the present invention are clearly illustrated in the embodiments with reference to the accompanying drawings, in which: Figure 1 is a schematic diagram illustrating a conventional test device; Figure 2 is a perspective exploded view illustrating a first embodiment of the electrical test device of the present invention; Figure 3 is a schematic diagram illustrating the use of the first embodiment in conjunction with a drive device to perform an electrical test on an electronic component to be tested; Figure 4 is a fragmentary cross-sectional view illustrating a conductive unit of the first embodiment, and one of the positioning members and one of the inner support members of a positioning unit of the first embodiment; Figure 5 is a fragmentary cross-sectional view illustrating a limiting plate of the positioning unit; Figure 6 is a schematic diagram illustrating the use of the first embodiment to perform a test on the electronic component; Figure 7 is a schematic diagram illustrating an embodiment in which the multiple electrical contacts of the electronic component are flat-plate shaped; Figure 8 is a schematic diagram illustrating another embodiment of testing the electronic component using the first embodiment; and Figure 9 is an exploded perspective view illustrating a second embodiment of the electrical testing device of the present invention.

3: Main unit

300: Setting up space

31: Frame board

311: Positioning hole

312: Drilling hole

4: Conductor unit

41: Base

42: Connectors

5: Positioning unit

51: Limit plate

510: Through slot

511: Alignment hole

512: Through hole

52: Positioning piece

521: Threading and Extension Section

522: Bend

53: Internal support

L: Auxiliary line

Claims (9)

An electrical test device comprises: A main body unit including a frame plate surrounding and defining a mounting space, the frame plate having a plurality of through-holes and a plurality of through-holes spaced apart from the positioning holes; A conductive unit fixed in the mounting space and including a base made of an insulating material and a plurality of conductive members extending outward from the base, each conductive member capable of generating a maximum deformation in a deformation direction toward the base that allows it to recover to its original state; and A positioning unit mounted on the main body unit and including At least one limiting plate, each limiting plate having a plurality of through slots for the conductive members to extend through, a plurality of alignment holes whose positions correspond to the positioning holes, and a plurality of through holes whose positions correspond to the through-holes. A plurality of positioning members are disposed in the positioning holes and the alignment holes to position the at least one stop plate, and a plurality of inner support members are respectively disposed in the through-holes and pass through the corresponding through-holes. Each inner support member has a pin portion disposed in a respective through-hole and a respective through-hole, and at least one elastic portion wound around the pin portion and abutting against the at least one stop plate. The elastic portions of the inner support members enable the at least one stop plate to move between an initial position maintaining a set distance from the frame plate and an extreme position in contact with the frame plate. An electrical testing device as described in claim 1, wherein, when the at least one limit plate is in the initial position, the sum of a protruding extension of the conductive members extending through the through slots to the outside of the at least one limit plate and the set distance is no more than the maximum deformation of the conductive members. An electrical testing device as described in claim 1, wherein when the at least one limiting plate is in the initial position, the set distance is not greater than the maximum deformation of the conductive components. An electrical testing device as described in claim 2 or 3, wherein the conductive members of the conductive unit extend along an auxiliary line toward opposite sides away from the base, and the positioning unit includes two limiting plates located on opposite sides of the conductive unit. The electrical testing device as described in claim 4, wherein the main unit further includes two packaging plates that enclose the base from opposite sides along the auxiliary line and are formed with a plurality of slots for the conductive components to extend through. An electrical testing device as described in claim 4, wherein each positioning member of the positioning unit has a through-protruding portion extending into the respective positioning hole and the respective alignment hole, and a bent portion bent from the through-protruding portion and used to overlap the at least one limiting plate. The electrical testing device as described in claim 1, wherein the cross-section of each through slot of each limiting plate is gradually expanded from the outside to the inside. An electrical testing device as described in any one of claims 1 to 3, wherein the frame plate of the main unit further includes a plurality of convex ring portions respectively arranged in the through holes and forming a hole with a hole diameter smaller than that of the through holes, and the elastic portion of each inner support member is pressed against between the individual convex ring portion and the at least one limit plate. The electrical testing device as described in claim 8, wherein the elastic portion of each inner support member of the positioning unit is a compression spring.