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TWI894647B - System and method for signal optimization adjustment based on different heat source information - Google Patents

System and method for signal optimization adjustment based on different heat source information

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Publication number
TWI894647B
TWI894647B TW112137701A TW112137701A TWI894647B TW I894647 B TWI894647 B TW I894647B TW 112137701 A TW112137701 A TW 112137701A TW 112137701 A TW112137701 A TW 112137701A TW I894647 B TWI894647 B TW I894647B
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Taiwan
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signal
heat source
information
signal receiver
electrical
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TW112137701A
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Chinese (zh)
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TW202509781A (en
Inventor
萬峰 滕
游逸民
葉建村
魏兆隆
黃凡城
蘇意雯
葉庭竹
黃美意
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美商美超微電腦股份有限公司
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Priority to US18/735,950 priority Critical patent/US20250062856A1/en
Publication of TW202509781A publication Critical patent/TW202509781A/en
Application granted granted Critical
Publication of TWI894647B publication Critical patent/TWI894647B/en

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Abstract

The present disclosure provides a system for signal optimization adjustment based on different heat source information. The system includes a plurality of heat source measurers, a first system chip, a second system chip, an electrical interconnection, and a bit error risk evaluator. The first system chip includes a signal transmitter, and the second system chip includes a signal receiver. The second system chip provides an electrical characteristic state of the signal receiver, and a signal adjustment information of the signal transmitter and/or the signal receiver. The bit error risk evaluator executes signal optimization adjustment for an electrical characteristic of the signal receiver according to the electrical characteristic state. The present disclosure further provides a method for signal optimization adjustment.

Description

依不同熱源資訊進行訊號最佳化調整之系統與方法System and method for signal optimization adjustment based on different heat source information

本發明係有關一種訊號最佳化調整之系統與方法,尤指一種依不同熱源資訊進行訊號最佳化調整之系統與方法。The present invention relates to a system and method for signal optimization adjustment, and more particularly to a system and method for signal optimization adjustment based on different heat source information.

隨著人類對於數位化生活的需求,許多新的有線或無線技術持續在發展。舉凡個人手持裝置到資料中心的伺服器,都正進行著快速的升級和變革,以因應資訊的大量、高速且高品質的傳輸。As people's demands for digital life continue to grow, many new wired and wireless technologies continue to develop. For example, everything from personal handheld devices to data center servers is undergoing rapid upgrades and changes to accommodate the massive, high-speed, and high-quality transmission of information.

所謂的數位通訊,不外乎是由晶片傳送代表特定意義的編碼。這些編碼由發送器傳送至接收器,訊號接收的準確度越高即代表高品質的傳輸。反之,若在接收器端所接收到的訊號與發送器端所發送出的訊號不一致,而導致接收器給晶片錯誤的編碼,則代表低品質的訊號傳輸。然而,一個低品質的傳輸設備或裝置,是無法滿足數位通訊正在快速變革的趨勢。Digital communication is nothing more than the transmission of codes representing specific meanings by chips. These codes are transmitted from a transmitter to a receiver. The higher the accuracy of the signal reception, the higher the transmission quality. Conversely, if the signal received by the receiver is inconsistent with the signal sent by the transmitter, resulting in the receiver mis-coding the chip, the signal quality is low. However, low-quality transmission equipment or devices cannot meet the rapidly changing trends in digital communications.

然而,訊號—特別是高速訊號,在發送器端的晶片與接收器端的晶片之間傳輸,存在許多物理上或設計上的影響因素。這些影響因素,都有可能讓訊號在接收器端與發送器端不一致,比如說:雜訊、訊號間干擾。此外,還有值得一提的:高溫環境對材質帶來的物理變化,也會影響到電氣的傳輸品質。然而,現有的技術尚未對這方面的技術有足夠的研究與探討,也因此如何克服或消弭熱效應對電氣的影響,以提供高品質的數位傳輸的系統或設計方法,都尚待技術上的突破。However, the transmission of signals—especially high-speed signals—between the transmitter and receiver chips presents numerous physical and design factors. These factors, such as noise and inter-signal interference, can cause signal inconsistencies between the transmitter and receiver. Furthermore, it's worth noting that high temperatures cause physical changes in materials, which can affect electrical transmission quality. However, existing technologies haven't yet adequately researched and explored this aspect. Therefore, systems and design methods that overcome or eliminate the impact of thermal effects on electrical components to provide high-quality digital transmission still require technological breakthroughs.

有鑒於此,本發明擬提出一種訊號最佳化調整之系統與方法,尤指一種依不同熱源資訊進行訊號最佳化調整之系統與方法的新技術,專注處理熱效應對電氣的影響,進而準確地評估熱源在系統環境的狀態,及訊號通道受熱的特性變化,並採取訊號最佳化調整的技術手段。In light of this, the present invention proposes a system and method for signal optimization and adjustment, specifically a novel technology for optimizing signal adjustment based on different heat source information. This technology focuses on addressing the impact of thermal effects on electrical circuits, accurately assessing the state of heat sources in the system environment and the changes in the heat-related characteristics of signal channels, and then adopting technical means for signal optimization and adjustment.

本發明之一目的在於提供一種依不同熱源資訊進行訊號最佳化調整之系統。該系統包含複數個熱源量測器、第一系統晶片、第二系統晶片、電氣線路以及誤碼風險評估機。複數個熱源量測器獲得各部件之熱源資訊。第一系統晶片包含訊號發送器。第二系統晶片包含訊號接收器。電氣線路為與該第一系統晶片和該第二系統晶片內部連接,至少包含電路板。其中第二系統晶片提供訊號接收器之電氣特性狀態,及訊號發送器和/或訊號接收器之訊號調整資訊。誤碼風險評估機依照電氣特性狀態,對訊號接收器端之電氣特性進行訊號之最佳化調整。One purpose of the present invention is to provide a system for optimizing and adjusting signals based on different heat source information. The system includes a plurality of heat source meters, a first system chip, a second system chip, electrical circuits, and an error risk evaluator. The plurality of heat source meters obtain heat source information of each component. The first system chip includes a signal transmitter. The second system chip includes a signal receiver. The electrical circuit is internally connected to the first system chip and the second system chip, and includes at least a circuit board. The second system chip provides the electrical characteristic status of the signal receiver, and signal adjustment information of the signal transmitter and/or signal receiver. The error risk evaluator optimizes the signal based on the electrical characteristic status of the signal receiver.

本發明之另一目的在於提供一種依不同熱源資訊進行訊號最佳化調整之方法。該方法包含從系統內的複數個熱源量測器,取得包含訊號發送器之第一系統晶片之熱源資訊以及取得包含訊號接收器之第二系統晶片之熱源資訊。取得與第一系統晶片和第二系統晶片內部連接之電氣線路,至少包含電路板之熱源資訊。取得第二系統晶片提供之訊號接收器端的電氣特性狀態及訊號發送器和訊號接收器之訊號調整資訊。計算至少一個誤碼風險評估。根據誤碼風險評估對訊號接收器端之電氣特性進行訊號之最佳化調整。Another object of the present invention is to provide a method for optimizing and adjusting signals based on different heat source information. The method includes obtaining heat source information of a first system chip including a signal transmitter and heat source information of a second system chip including a signal receiver from a plurality of heat source meters within the system. Heat source information of at least a circuit board is obtained from electrical circuits internally connected to the first system chip and the second system chip. The electrical characteristic state of the signal receiver end and signal adjustment information of the signal transmitter and the signal receiver end provided by the second system chip are obtained. At least one error risk assessment is calculated. Signals are optimized and adjusted based on the electrical characteristics of the signal receiver end according to the error risk assessment.

藉此,本發明所提出的依不同熱源資訊進行訊號最佳化調整之系統與方法,能夠透過依不同熱源資訊進行訊號最佳化調整的新技術,專注處理熱效應對電氣的影響,進而準確地評估熱源在系統環境的狀態,及訊號通道受熱的特性變化,對訊號進行最佳化調整。意即,本發明所提出的系統與方法,進一步地將熱的因素所造成訊號衰減效應加以考量,並且透過全通道的熱電特性評估,可以更準確地判斷溫度對訊號完整度的影響,進而對訊號整資訊(等化器、預加強、去加強、等化器和/或重定時器、中繼器)進行調整與設計,或者重新設計佈線,實現訊號的最佳化調整,以確保訊號完整性及高品質的訊號傳輸。Thus, the system and method proposed by this invention for optimizing signals based on different heat source information can focus on addressing the impact of thermal effects on electrical circuits through a new technology for optimizing signals based on different heat source information. This technology can then accurately assess the status of the heat source in the system environment and the changes in the heat characteristics of the signal channel, thereby optimizing the signal. In other words, the system and method proposed by this invention further considers the signal attenuation effects caused by thermal factors. By evaluating the thermoelectric characteristics of the entire channel, it can more accurately determine the impact of temperature on signal integrity. This allows for the adjustment and design of signal conditioning information (equalizer, pre-emphasis, de-emphasis, equalizer and/or retimer, repeater), or redesign of wiring, to achieve optimal signal adjustment to ensure signal integrity and high-quality signal transmission.

為了能更進一步瞭解本發明為達成預定目的所採取之技術、手段及功效,請參閱以下有關本發明之詳細說明與附圖,相信本發明之目的、特徵與特點,當可由此得一深入且具體之瞭解,然而所附圖式僅提供參考與說明用,並非用來對本發明加以限制者。To further understand the techniques, means, and effects employed by the present invention to achieve its intended purpose, please refer to the following detailed description and accompanying drawings of the present invention. It is believed that this will provide a deeper and more detailed understanding of the purposes, features, and characteristics of the present invention. However, the accompanying drawings are provided for reference and illustration purposes only and are not intended to limit the present invention.

茲有關本發明之技術內容及詳細說明,配合圖式說明如下。The technical content and detailed description of the present invention are as follows, along with the accompanying drawings.

以下係藉由特定的具體實施例說明本創作之實施方式,熟悉此技術之人士可由本說明書所揭示之內容輕易地瞭解本創作之其他優點及功效。本創作亦可藉由其他不同的具體實例加以施行或應用,本創作說明書中的各項細節亦可基於不同觀點與應用在不悖離本創作之精神下進行各種修飾與變更。The following describes the implementation of this invention through specific embodiments. Those skilled in the art will readily understand its other advantages and benefits from the information provided in this specification. This invention may also be implemented or applied through various other specific embodiments, and the details in this specification may be modified and altered based on different perspectives and applications without departing from the spirit of this invention.

須知,本說明書所附圖式繪示之結構、比例、大小、元件數量等,均僅用以配合說明書所揭示之內容,以供熟悉此技術之人士瞭解與閱讀,並非用以限定本創作可實施之限定條件,故不具技術上之實質意義,任何結構之修飾、比例關係之改變或大小之調整,在不影響本創作所能產生之功效及所能達成之目的下,均應落在本創作所揭示之技術內容得能涵蓋之範圍內。It should be noted that the structures, proportions, sizes, and number of components illustrated in the figures included in this manual are intended solely to facilitate understanding and reading by those familiar with the art, in conjunction with the contents disclosed herein. They are not intended to limit the conditions under which this invention may be implemented, and therefore have no substantive technical significance. Any structural modifications, changes in proportions, or adjustments in size, without affecting the efficacy and objectives of this invention, shall be within the scope of the technical content disclosed herein.

請參見圖1所示,其係為本發明依不同熱源資訊進行訊號最佳化調整之系統的系統示意圖。圖1所示為高速串行的數位訊號傳輸總線,整個訊號鍵包含了三個部分:訊號發送器(signal transmitter)10所在的發送端Tx、訊號通道(channel)CH以及訊號接收器(signal receiver)20所在的接收端Rx。配合參見圖2所示,其係為本發明依不同熱源資訊進行訊號最佳化調整之系統的系統方塊圖。如圖2所示,本發明的系統包含第一系統晶片1、第二系統晶片2以及與第一系統晶片1和第二系統晶片2內部連接之電氣線路3。其中第一系統晶片1包含訊號發送器10,第二系統晶片2包含訊號接收器20,電氣線路3至少包含電路板30。在此所謂串行訊號,是指當前高速訊號協定較常用的串列解串(SerDes)技術,然而本發明並不限於串行訊號,平行訊號也適用於本發明的技術內涵。Please refer to FIG1 , which is a schematic diagram of a system for optimizing signals based on different heat source information according to the present invention. FIG1 shows a high-speed serial digital signal transmission bus. The entire signal bus includes three parts: a transmitter Tx where a signal transmitter 10 is located, a signal channel CH, and a receiver Rx where a signal receiver 20 is located. In conjunction with FIG2 , which is a block diagram of a system for optimizing signals based on different heat source information according to the present invention. As shown in FIG2 , the system of the present invention includes a first system chip 1, a second system chip 2, and an electrical circuit 3 internally connected to the first and second system chips 1 and 2. The first system chip 1 includes a signal transmitter 10, the second system chip 2 includes a signal receiver 20, and the electrical circuit 3 includes at least a circuit board 30. The so-called serial signal here refers to the serial deserialization (SerDes) technology that is commonly used in current high-speed signal protocols. However, the present invention is not limited to serial signals; parallel signals are also applicable to the technical content of the present invention.

配合參見圖3所示,其係為本發明依不同熱源資訊進行訊號最佳化調整之系統的系統硬體圖。該系統的各硬體(部件、元件、模組、裝置、設備…等),例如系統晶片1,2、訊號發送、接收器10,20、電路板30、熱源量測器11,21,31…等,可透過匯流排(bus)100提供彼此之間的通訊、傳輸、信息交換…等操作。See Figure 3 for a hardware diagram of the present invention's system for optimizing signals based on different heat source information. The system's hardware (components, elements, modules, devices, equipment, etc.), such as system chips 1 and 2, signal transmitters and receivers 10 and 20, circuit board 30, and heat source sensors 11, 21, and 31, can communicate, transmit, and exchange information with each other via bus 100.

如圖1所示,訊號發送器10傳送訊號,經過電氣線路3(或統稱訊號通道CH),最後由訊號接收器20所接收。其中訊號發送器10所傳送的位元串(bit pattern)BP,其係由邏輯0、1表示電壓變化的數位訊號所表示。而對於訊號接收器20所接收到的訊號,可判斷比如緩慢上升時間、符號間干擾、衰減損耗…等存在的電氣特性問題。舉例來說,藉由分析其眼圖(eye diagram)ED,可快速地評估所接收到訊號的品質,然而,眼圖ED只是其中一種評估訊號品質的方法。依據眼圖ED精神的其他種評估態樣,如十字線,面積法等,或以電壓、電流、電阻等換算成級距分數(Score),變成各類型的跑分軟體工具,也是可以實施的方式。As shown in Figure 1, a signal transmitter 10 transmits a signal through an electrical line 3 (or generally referred to as a signal channel CH), ultimately being received by a signal receiver 20. The bit pattern BP transmitted by the signal transmitter 10 is represented by a digital signal, where logical 0s and 1s represent voltage variations. The signal received by the signal receiver 20 can be analyzed for electrical characteristics such as slow rise time, intersymbol interference, and attenuation loss. For example, by analyzing its eye diagram (ED), the quality of the received signal can be quickly assessed. However, the eye diagram (ED) is only one method of evaluating signal quality. Other evaluation methods based on the eye diagram ED principle, such as crosshairs and the area method, or converting voltage, current, resistance, etc. into a range score and creating various types of benchmark software tools, are also feasible.

此外,本發明揭示的該系統更包含複數個熱源量測器,用以獲得前揭各部件之熱源資訊。由於在數位訊號傳輸中,不同的區段其熱效應狀況不同,因此如圖1與圖2所示,複數個熱源量測器包含位於該第一系統晶片1內之至少一熱源量測器11和位於第二系統晶片2內之至少一熱源量測器21,其中熱源量測器11取得第一系統晶片1的熱源資訊H1,熱源量測器21取得第二系統晶片2的熱源資訊H2。此外熱源量測器31取得電路板30的熱源資訊H3。其中熱源量測器可為,但不限制為熱感測元件、溫度計、熱像儀…等,用以獲得該部件的溫度或該部件的熱成像資訊之量測器。所謂熱感測元件,並不限於感測溫度的單一手段,得到熱資訊的等效方式,如阻抗資訊、電壓電流的換算,或某一特定材料參數的時間變化,都可做為觀測溫度的方法。因此,本發明所定義的熱源量測器不限定於通用的感測器(Sensor)技術,只要能夠提供物理上熱資訊的方法都應包含在內。In addition, the system disclosed in the present invention further includes a plurality of heat source meters for obtaining heat source information of the aforementioned components. Since different sections have different thermal effect conditions during digital signal transmission, as shown in Figures 1 and 2, the plurality of heat source meters include at least one heat source meter 11 located in the first system chip 1 and at least one heat source meter 21 located in the second system chip 2, wherein the heat source meter 11 obtains heat source information H1 of the first system chip 1, and the heat source meter 21 obtains heat source information H2 of the second system chip 2. In addition, the heat source meter 31 obtains heat source information H3 of the circuit board 30. The heat source meter can be, but is not limited to, a thermal sensing element, a thermometer, a thermal imager, etc., which is a meter for obtaining the temperature of the component or the thermal imaging information of the component. Thermal sensing elements are not limited to a single means of sensing temperature. Equivalent methods of obtaining thermal information, such as impedance information, voltage-current conversion, or the time-dependent variation of a specific material parameter, can all serve as temperature observation methods. Therefore, the heat source measurement defined in this invention is not limited to general sensor technology but encompasses any method that can provide physical thermal information.

對於數位訊號傳輸,電氣特性的量測是電路設計上最基本的要求。其中常見的電氣特性量測包括阻抗量測(Impedance Measurement)與S參數量測(S-parameter Measurement)。特性阻抗在電路設計上為最基本的電氣參數,量測阻抗通常使用時域反射儀(Time Domain Reflectometer, TDR)或者向量網路分析儀(Vector Network Analyzer, VNA)搭配合適的探針進行量測,主要針對單端與差分阻抗測試(single ended and differential impedance)。本發明所謂的量測,並不單指使用儀器進行量測,事實上,在晶片與晶片的訊號傳遞上,從發送端到接收端的訊號的電氣特性變化,即便在硬體系統內部,也可以被量測或計算求出,即時的量測或計算,可以提供硬體系統即時調整訊號的資訊,而系統晶片帶有此種觀測或調整的機制,是當前先進晶片上不可或缺的重要功能。For digital signal transmission, measuring electrical characteristics is a fundamental requirement in circuit design. Common electrical characteristic measurements include impedance and S-parameter measurements. Characteristic impedance is the most fundamental electrical parameter in circuit design. Impedance is typically measured using a time domain reflectometer (TDR) or vector network analyzer (VNA) with appropriate probes, primarily for single-ended and differential impedance testing. The so-called measurement in this invention does not simply refer to measurement performed using instruments. In fact, during chip-to-chip signal transmission, the changes in the electrical characteristics of the signal from the transmitter to the receiver can be measured or calculated even within the hardware system. Real-time measurement or calculation can provide the hardware system with information to adjust the signal in real time. The inclusion of such observation or adjustment mechanisms in system chips is an indispensable and important function in current advanced chips.

前述S參數是頻域特性的觀察,其在電路設計上為基本的電性參數之一,通常以2 Port或者4 Port的形式表現,通常最常使用的就是插入損失(Insertion Loss)、介電常數(Dk)、損失正切(Df)、回波損失(Return Loss)、電壓駐波比(VSWR)、遠端串音(FEXT)、近端串音(NEXT)、信噪比(SNR)、衰减噪音比(ICN)、衰减串音比(ICR)…等。量測S參數通常使用向量網路分析儀搭配合適的探針、接頭或者制具進行量測。此種參數並不限於由晶片內部直接取得資訊,藉由量測阻抗資訊、電壓電流的變化等方式,可以間接換算出這些電氣參數,提供訊號調整的一個基底。The aforementioned S-parameters are observations of frequency-domain characteristics and are fundamental electrical parameters in circuit design. They are typically presented in a two-port or four-port format. The most commonly used are insertion loss, dielectric constant (Dk), loss tangent (Df), return loss, voltage-to-wave ratio (VSWR), far-end crosstalk (FEXT), near-end crosstalk (NEXT), signal-to-noise ratio (SNR), attenuation-to-noise ratio (ICN), attenuation-to-crosstalk ratio (ICR), and so on. S-parameters are typically measured using a vector network analyzer (VNA) with appropriate probes, connectors, or fixtures. These parameters are not limited to direct information obtained from within the chip; by measuring impedance information, voltage and current changes, and other factors, these electrical parameters can be indirectly converted and calculated, providing a foundation for signal adjustments.

此外,在數位訊號傳輸中,為了補償訊號通道CH對訊號的損耗、衰減,在發送端Tx和/或接收端Rx採用等化、均衡的技術,以主動或者被動的方式對訊號進行補償。其中在發送端Tx的等化器(Equalizer)通常亦稱為加重或加強(Emphasis),常見的技術包含:Pre-emphasis(預加強)、De-emphasis(去加強)以及FFE(向前反饋等化器)。首先,欲傳送的訊號先進行編碼(Coding),然後經過Pre-emphasis和/或De-emphasis將訊號的高低頻能量比調整,再經過發送端緩衝器(Tx buffer)將訊號提升至標準電壓準位,再送出至訊號通道CH。Furthermore, in digital signal transmission, equalization and balancing techniques are employed at the transmitter (Tx) and/or receiver (Rx) to compensate for signal loss and attenuation in the signal channel (CH), either actively or passively. The equalizer at the transmitter (Tx) is also commonly referred to as emphasis or emphasis. Common techniques include pre-emphasis, de-emphasis, and FFE (forward feedback equalizer). The signal to be transmitted is first encoded. Pre-emphasis and/or de-emphasis are then used to adjust the high- and low-frequency energy ratio. The signal is then boosted to a standard voltage level by a transmitter buffer before being sent to the signal channel (CH).

在接收端Rx的等化器(Equalizer)常見的技術包含:CTLE(連續時間線性等化器)與DFE(判決反饋等化器)。當進入到訊號通道CH的訊號可能會受到一些通道所造成的問題,例如符元干擾(Intersymbol Interference, ISI)、串音干擾、延遲差、訊號反射(reflection)…等,使訊號品質變差。所造成品質變差的訊號先進入接收端緩衝器(Rx buffer)載入正確負載狀況,然後再使訊號進入CTLE,將損耗的訊號的高低頻的能量比調整後,再進入DFE將訊號利用疊積(convolution)的運算,將訊號還原至較佳的品質。值得一提的是,調整固定幅度的等化器並非最為理想,在實務上需因應不同的通道傳輸環境,提供均衡參數調整設計。Common equalizer technologies at the receiver include CTLE (Continuous Time Linear Equalizer) and DFE (Decision Feedback Equalizer). When a signal enters the signal channel (CH), it may be affected by channel artifacts such as intersymbol interference (ISI), crosstalk, delay, and reflections, degrading signal quality. The degraded signal first enters the receiver buffer to be properly loaded. The signal then enters the CTLE, where the high- and low-frequency energy ratio of the degraded signal is adjusted. The DFE then uses convolution operations to restore the signal to optimal quality. It's worth noting that a fixed-amplitude equalizer isn't ideal; in practice, it's necessary to provide a design with adjustable equalization parameters to accommodate varying channel transmission environments.

此外,為了解決訊號傳輸距離增加導致訊號衰減程度加重且訊號品質下降,進而導致資料位元錯誤的問題,通常可在訊號通道CH間加入重定時器(Retimer)和/或中繼器(Redriver)。重定時器主要包含兩個功能,一者是對訊號進行均衡,另一者則是對有確定性或隨機性抖動的資料時脈訊號進行修復,進而輸出一個乾淨的訊號給後端裝置使用。中繼器則是使用等化或預加強的技術,補償與矯正傳輸端上訊號的損失,並在接收端上恢復訊號完整性。Furthermore, to address the issue of increased signal attenuation and quality degradation with increased signal transmission distance, which in turn leads to data bit errors, a retimer and/or repeater are typically added between signal channels. A retimer primarily performs two functions: equalization and correction of data clock signals with deterministic or random jitter, outputting a clean signal for backend devices. Repeaters, on the other hand, use equalization or pre-emphasis techniques to compensate for and correct signal losses at the transmitter and restore signal integrity at the receiver.

在本發明中,第二系統晶片2提供接收端Rx的訊號接收器20的電氣特性狀態,例如訊號接收器20的阻抗值、S參數、接收訊號的電壓大小…或其他電氣參數,作為訊號接收器20所接收到之訊號的評估。In the present invention, the second system chip 2 provides the electrical characteristic status of the signal receiver 20 at the receiving end Rx, such as the impedance value, S parameter, voltage level of the received signal, or other electrical parameters of the signal receiver 20, as an evaluation of the signal received by the signal receiver 20.

再者,第二系統晶片2提供訊號發送器10和/或訊號接收器20的訊號調整資訊,例如提供發送端Tx的等化器和/或接收端Rx的等化器等可對訊號進行調整的資訊。例如,原先於發送端Tx的預加強值為-3.5dB,接收端Rx的CTLE值為8,DFE值為0.035。而此時眼圖ED的眼高(EH)眼寬(EW)為35.02mV、0.36 UI。由此基礎下,可以推算出訊號通道CH的S參數,進而能夠得到調整的方向。Furthermore, the second system chip 2 provides signal conditioning information for the transmitter 10 and/or receiver 20, such as information for the transmitter Tx equalizer and/or receiver Rx equalizer, enabling signal conditioning. For example, the original Tx pre-emphasis value is -3.5dB, the Rx CTLE value is 8, and the DFE value is 0.035. At this point, the eye height (EH) and eye width (EW) of the eye diagram ED are 35.02mV and 0.36UI, respectively. Based on this information, the S-parameters of the signal channel CH can be calculated, and the adjustment direction can be determined.

以下,透過範例數值(如表1、表2記載),說明訊號調整資訊的意涵。 表1 室溫狀態 P6 P7 P8 R_EW (UI) 0.435 0.362 0.388 R_EH (mV) 45.39 28.96 35.78 R_IL (dB) -25.45 -25.45 -25.45 R_CTLE 8 11 11 R_DFE1 0.03906 0.02539 0.03516 R_DFE2 0.00586 0.00000 0.00586 R_DFE3 0.00195 0.00195 0.00391 表2 高溫狀態 P6 P7 P8 A_EW (UI) 0.387 0.290 0.341 A_EH (mV) 32.21 16.77 22.32 A_IL (dB) -28.45 -28.45 -28.45 A_CTLE 7 8 8 A_DFE1 0.03516 0.01953 0.02539 A_DFE2 0.00586 -0.00195 0.00195 A_DFE3 0.00195 0.00000 0.00195 Below, we use example values (as shown in Table 1 and Table 2) to illustrate the meaning of signal adjustment information. Room temperature P6 P7 P8 R_EW (UI) 0.435 0.362 0.388 R_EH (mV) 45.39 28.96 35.78 R_IL (dB) -25.45 -25.45 -25.45 R_CTLE 8 11 11 R_DFE1 0.03906 0.02539 0.03516 R_DFE2 0.00586 0.00000 0.00586 R_DFE3 0.00195 0.00195 0.00391 Table 2 High temperature P6 P7 P8 A_EW (UI) 0.387 0.290 0.341 A_EH (mV) 32.21 16.77 22.32 A_IL (dB) -28.45 -28.45 -28.45 A_CTLE 7 8 8 A_DFE1 0.03516 0.01953 0.02539 A_DFE2 0.00586 -0.00195 0.00195 A_DFE3 0.00195 0.00000 0.00195

根據表1(室溫狀態)與表2(高溫狀態)所呈現的數值可清楚看出,在高溫狀態下的眼高、眼寬的效能,相較於室溫狀態下的眼高、眼寬的效能來得較差。此外,在高溫狀態下的整體通道的衰減,相較於室溫狀態下的整體通道的衰減來得大。配合參見圖11,其中表1所示室溫狀態的R_EW為眼寬值,對應曲線C21、R_EH為眼高值,對應曲線C11、R_IL為整體通道衰減,對應曲線C31。表2所示高溫狀態的A_EW為眼寬值,對應曲線C22、A_EH為眼高值,對應曲線C12、A_IL為整體通道衰減,對應曲線C32。此外,P6、P7、P8係為訊號調整資訊,即EQ調整資訊。在此並再次強調,利用眼高眼寬來衡量訊號品質僅為諸多方式其中之一,將訊號代表的電壓電流轉換成比級距分數,或轉換成步階響應(Step Response)或脈衝響應(Pulse Response),都屬於本發明的技術範圍。The values presented in Table 1 (room temperature) and Table 2 (high temperature) clearly show that the performance of eye height and eye width at high temperature is worse than at room temperature. Furthermore, the overall channel attenuation is greater at high temperature than at room temperature. For further information, see Figure 11. Table 1 shows R_EW at room temperature, which represents the eye width value and the corresponding curve C21. R_EH represents the eye height value and the corresponding curve C11. R_IL represents the overall channel attenuation and the corresponding curve C31. Table 2 shows the eye width (A_EW) at high temperature, corresponding to curve C22, eye height (A_EH), overall channel attenuation (A_IL), and overall channel attenuation (C12). Furthermore, P6, P7, and P8 represent signal adjustment information, namely, EQ adjustment information. It is emphasized again that using eye width and height to measure signal quality is only one of many methods. Converting the voltage or current represented by the signal into a step-spacing fraction, or into a step response or pulse response, also falls within the technical scope of this invention.

舉一例來說明,晶片在開機時或室溫時,依據不同晶片訊號調整資訊可能為一初始設定值,後續經由鏈路訓練,晶片選擇使用P7作為訊號調整資訊的依據。當晶片運作一段時間後,由於溫升因素,使其眼高、眼寬的效能開始衰退。此時,若經風險評估與判斷後欲進行訊號調整,則可使用P6或P8作為訊號調整資訊的依據,因為其任一者的眼高、眼寬的效能都較為改善。至於選擇P6或P8作為訊號調整資訊的依據,並不單純只參考眼高、眼寬較高效能的一者。舉例來說,對P6而言,其眼高、眼寬的效能較P8的眼高、眼寬的效能來的高。然而,並不一定會選擇P6作為訊號調整資訊的依據。更進一步地,尚需要配合等化器(CTLE、DFE)的參數進行整體的考量。換言之,或許可選擇P8,由於其CTLE值較高(雖然其眼高、眼寬的效能較低)。綜上說明,若僅根據眼高、眼寬的效能作為訊號調整資訊的依據,而忽視其他的考量(例如EQ元件參數,針對高、低頻成份補償的效果),這樣將失去訊號調整資訊的意義。因此,因應不同的通道環境,選擇最合適的訊號調整資訊,才是技術的關鍵所在。For example, at power-up or at room temperature, the signal adjustment information for each chip may be initialized to a certain value. Later, during link training, the chip may select P7 as the basis for signal adjustment information. After the chip operates for a period of time, its eye height and eye width performance begin to decline due to temperature rise. At this point, if signal adjustment is desired after risk assessment and judgment, P6 or P8 can be used as the basis for signal adjustment information, as either one offers improved eye height and eye width performance. The choice of P6 or P8 as the basis for signal adjustment information is not simply based on the higher performance of eye height or eye width. For example, the P6 has higher performance in terms of eye height and eye width than the P8. However, this doesn't necessarily mean you should choose the P6 as the basis for signal adjustment information. Furthermore, it's necessary to consider the parameters of the equalizer (CTLE, DFE) as a whole. In other words, the P8 might be chosen due to its higher CTLE value (even though its eye height and eye width performance are lower). In summary, if you only base signal adjustment information on the performance of eye height and eye width while ignoring other considerations (such as EQ component parameters and the effectiveness of compensating for high- and low-frequency components), the signal adjustment information will lose its meaning. Therefore, the key to this technology is to select the most appropriate signal adjustment information to suit different channel environments.

進一步地,本發明揭示的該系統更包含誤碼風險評估機,用以評估是否對訊號接收器端Rx之電氣特性進行訊號之最佳化調整。換言之,本發明針對所接收到的訊號是否進行最佳化調整,仍會進行評估,一旦判斷出所接收到的訊號不存在錯誤或存在極低錯誤的可能性(錯誤的風險極低),則不對接收到的訊號進行最佳化調整。反之,若接收到的訊號存在極高錯誤的可能性時,則依照訊號接收器20的電氣特性狀態,對所接收到的訊號進行補償,實現訊號最佳化的調整。Furthermore, the system disclosed in the present invention further includes an error risk estimator for evaluating whether to optimize the electrical characteristics of the signal receiver Rx. In other words, the present invention continues to evaluate whether the received signal is optimized. If it is determined that the received signal is error-free or has a very low error probability (extremely low error risk), the received signal is not optimized. Conversely, if the received signal has a very high error probability, the received signal is compensated according to the electrical characteristics of the signal receiver 20 to achieve signal optimization.

在一實施例中,誤碼風險評估機根據該些熱源量測器11,21,31所蒐集之熱源資訊H1,H2,H3,並依照各部件之限制或警示溫度,提供風險或無風險之反饋。例如,設定某一部件之警示溫度為85°C、限制溫度為95°C。當熱源資訊H1,H2,H3為低於警示溫度時,則提供無風險之反饋,不對接收到的訊號進行最佳化調整。反之,若熱源資訊H1,H2,H3為高於限制溫度時,則需要對接收到的訊號進行最佳化調整。若介於兩個溫度之間,則可依據通道傳輸環境的實際狀況,評估是否對訊號進行調整。前述所揭示的判斷機制,僅為多種實施態樣中的其中之一,事實上這樣的判斷邏輯可以被更加複雜或被更加簡化以因應不同硬體系統的實際需求。在當前的應用趨勢上,這樣的判斷機制,是一演算法的函數,利用韌體(firmware)的方式,結合於系統晶片、記憶體或基板管理控制器(Baseboard management controller),在硬體系統上執行。此種演算法的大小也會影響系統晶片的硬體容量,因此也有獨立實施於一軟體上的實施方式。In one embodiment, the error risk assessment engine provides risk or no-risk feedback based on the heat source information H1, H2, H3 collected by the heat source sensors 11, 21, 31 and the limit or warning temperature of each component. For example, the warning temperature of a component is set to 85°C and the limit temperature is set to 95°C. When the heat source information H1, H2, H3 is below the warning temperature, no-risk feedback is provided, and the received signal is not optimized. Conversely, if the heat source information H1, H2, H3 is above the limit temperature, the received signal needs to be optimized. If the temperature is between the two limits, the actual conditions of the channel transmission environment can be used to evaluate whether to adjust the signal. The judgment mechanism described above is just one of many possible implementations. In reality, this judgment logic can be made more complex or simplified to meet the specific needs of different hardware systems. In current applications, this judgment mechanism is implemented as an algorithmic function, integrated into the system chip (SoC), memory, or baseboard management controller (BMC) via firmware, and executed on the hardware system. The size of this algorithm can also affect the hardware capacity of the SoC, so it can also be implemented independently in software.

配合圖5所示,其係為本發明依不同熱源資訊進行訊號最佳化調整之系統的另一系統示意圖。相應於圖2,在圖5中所要說明的是系統包括兩個獨立系統晶片,即處理器系統晶片1’與裝置系統晶片2’。進一步地,每個獨立系統晶片都各自有記憶體介面11’,21’、核心12’,22’、匯流排13’,23’、I/O介面14’,24’。值得一提,處理器系統晶片1’可同時包括發送器15’與接收器16’;同樣地,裝置系統晶片2’亦可同時包括發送器25’與接收器26’,以實現處理器系統晶片1’與裝置系統晶片2’之間的雙向訊號傳遞。再者,處理器系統晶片1’與裝置系統晶片2’的至少一者,可提供鏈路訓練機,意即處理器系統晶片1’的I/O介面14’可提供鏈路訓練機17’和/或裝置系統晶片2’的I/O介面24’可提供鏈路訓練機27’。FIG5 is another schematic diagram of a system for optimizing signals based on different heat source information according to the present invention. Corresponding to FIG2 , FIG5 illustrates a system comprising two independent system chips: a processor system chip 1′ and a device system chip 2′. Furthermore, each independent system chip has its own memory interface 11′, 21′, cores 12′, 22′, buses 13′, 23′, and I/O interfaces 14′, 24′. It is worth noting that the processor system chip 1′ can include both a transmitter 15′ and a receiver 16′; similarly, the device system chip 2′ can also include both a transmitter 25′ and a receiver 26′, enabling bidirectional signal transmission between the processor system chip 1′ and the device system chip 2′. Furthermore, at least one of the processor system chip 1’ and the device system chip 2’ can provide a link trainer, that is, the I/O interface 14’ of the processor system chip 1’ can provide a link trainer 17’ and/or the I/O interface 24’ of the device system chip 2’ can provide a link trainer 27’.

在一實施例中,本發明進一步揭露一先進的實施態樣,以第二系統晶片2,即裝置系統晶片2’為例,其包含一鏈路訓練機(Link Trainer),配合參見圖6所示,以邏輯樹的方式呈現該鏈路訓練機,其負責鏈路定向和初始化,說明從上電或複位、到正常工作狀態(L0)的初始化過程,以及描述低功耗管理狀態(L0s、L1、L2)。在鏈路訓練過程中,透過兩端設備發送鏈路訓練有序集(Training Sequence, TS)來交互信息,完成配置鏈路寬度、通路反排、極性顛倒、協商速率、位鎖定/符號鎖定、速度切換以及均衡的內容。In one embodiment, the present invention further discloses an advanced implementation. Taking the second SoC 2, i.e., the device SoC 2', as an example, it includes a link trainer. Referring to FIG6 , the link trainer is presented in a logic tree format. It is responsible for link orientation and initialization, illustrating the initialization process from power-on or reset to the normal operating state (L0), as well as describing the low-power management states (L0s, L1, and L2). During the link training process, the two devices exchange information by sending Link Training Sequences (TSs) to configure link width, lane reversal, polarity inversion, rate negotiation, bit lock/symbol lock, speed switching, and balancing.

前述鏈路訓練機包含多種狀態,每個狀態完成各自的功能。具體地,復位進入的初始狀態是檢測(Detect),在此狀態,設備檢測在鏈路的另一端是否有設備。在輪詢(Polling)狀態實現位鎖定和符號鎖定,確認通路是否可用。在配置(Configuration)狀態給有效的通道分配鏈路號和通路號。接著就是正常工作狀態L0,在此狀態可以發送和接收事務層包(Transaction Layer Packet, TLP)、數據鏈路層包(Data Link Layer Packet, DLLP)以及物理層的有序集。L0s、L1、L2都是低功耗狀態,在鏈路沒有包需要發送的情況下進入低功耗狀態可以降低鏈路的功耗。當鏈路發生了某個錯誤時可以從正常工作狀態L0進入恢復(Recovery)狀態,進行鏈路重訓練。此外,還有回環(Loopback)狀態,兩端設備進入測試狀態。此外鏈路禁止(Disabled)狀態,使得一條已配置的鏈路被禁止,以及熱重置(Hot Reset)狀態,使得設備熱重置。The aforementioned link trainer contains multiple states, each performing its own function. Specifically, the initial state upon reset is Detect, in which the device detects the presence of a device at the other end of the link. The Polling state implements bit and symbol locking to confirm the availability of the link. The Configuration state assigns link and channel numbers to valid channels. Next comes the normal operating state, L0, in which transaction layer packets (TLPs), data link layer packets (DLLPs), and physical layer ordered sets can be sent and received. L0s, L1, and L2 are all low-power states. Entering a low-power state when there are no packets to send reduces link power consumption. When a link error occurs, the device can enter the Recovery state from the normal operating state L0 to retrain the link. There is also the Loopback state, which puts both devices into a test state. There is also the Disabled state, which disables a configured link, and the Hot Reset state, which performs a hot reset of the device.

第二系統晶片2的鏈路訓練機提供訊號接收器20之電氣特性狀態以及訊號發送器10和訊號接收器20之訊號調整資訊。此種鏈路訓練機也有多種實施態樣,若一晶片原先已有標準的或先前的鏈路訓練機,其可能為一模組或一獨立功能。於此情形,一種實施方式為誤碼風險評估機為附加於鏈路訓練機之函數集,包含於訊號發送器10和訊號接收器20之間重啟鏈路訓練之啟動條件或排除條件,用以對第一系統晶片1和/或第二系統晶片2內的至少一等化器,或電氣線路3的至少一訊號調整器進行傳送訊號調整之指令。The link trainer of the second system chip 2 provides the electrical characteristic status of the signal receiver 20 and signal adjustment information for the signal transmitter 10 and the signal receiver 20. This link trainer can be implemented in a variety of ways. If a chip already has a standard or previous link trainer, it may be a module or a standalone function. In this case, one implementation method is to have the error risk estimator be a set of functions attached to the link trainer, including activation conditions or exclusion conditions for restarting link training between the signal transmitter 10 and the signal receiver 20, and used to transmit signal adjustment instructions to at least one equalizer within the first system chip 1 and/or the second system chip 2, or at least one signal adjuster in the electrical circuit 3.

在另一實施例中,第二系統晶片2包含一鏈路訓練機,提供訊號接收器20之電氣特性狀態以及訊號發送器10和訊號接收器20之訊號調整資訊。其中誤碼風險評估機為系統上之執行之函數(非附加於鏈路訓練機之函數集),用以對第一系統晶片1和/或第二系統晶片2內的至少一等化器或電氣線路3的至少一訊號調整器進行傳送訊號調整之指令。In another embodiment, the second SoC 2 includes a link trainer that provides electrical characteristic status of the signal receiver 20 and signal adjustment information for the signal transmitter 10 and the signal receiver 20. The error risk estimator is a function executed on the system (not a function set attached to the link trainer) that transmits signal adjustment instructions to at least one equalizer or at least one signal adjuster of the electrical circuit 3 within the first SoC 1 and/or the second SoC 2.

系統除了在發送端Tx具有Pre-emphasis、De-emphasis以及FFE,在接收端Rx具有CTLE與DFE之等化器外,更可在電氣線路3包含至少一訊號調整器,例如Retimer和/或Redriver,具有訊號放大、縮小…等功能,其包含訊號調整資訊。此種訊號調整器具備可程式的(programmable)的調整埠口,可供系統晶片或系統硬體以指令(Command)的方式控制,因此,可藉由調整該至少一訊號調整器之電氣特性,進行訊號接收器端Rx之電氣特性之最佳化調整。在設計階段時,透過調整預加強、去加強、等化器和/或重定時器、中繼器,或者,可透過重新設計佈線(trace),實現訊號的最佳化調整。在實際系統開機上電(Power-on)後,則調整預加強、去加強、等化器和/或重定時器、中繼器以實現訊號的最佳化調整則為主要方法。進一步言,硬體系統上若有上載加速器/卡,前述熱分析可以通過加速器做AI模型進行訓練。更進一步言,前述熱分析也可以通過硬體系統上的儲存裝置裡預載的熱資料庫提供。In addition to pre-emphasis, de-emphasis, and FFE at the transmitter (Tx), and CTLE and DFE equalizers at the receiver (Rx), the system can also include at least one signal conditioner in electrical line 3, such as a retimer and/or redriver, which has functions such as signal amplification and reduction and contains signal conditioning information. This signal conditioner has a programmable adjustment port that can be controlled by the system chip or system hardware via commands. Therefore, by adjusting the electrical characteristics of the at least one signal conditioner, the electrical characteristics of the signal receiver (Rx) can be optimized. During the design phase, signal optimization can be achieved by adjusting pre-emphasis, de-emphasis, equalizers and/or retimers, repeaters, or by redesigning the traces. After the actual system is powered on, the primary method is to adjust pre-emphasis, de-emphasis, equalizers, and/or retimers and repeaters to achieve optimal signal adjustment. Furthermore, if the hardware system has an accelerator/card, the aforementioned thermal analysis can be used to train the AI model. Furthermore, the aforementioned thermal analysis can also be provided by a pre-loaded thermal database in the hardware system's storage device.

前述實施例,係揭露於硬體系統上韌體和硬體的方式達成本發明的技術手段,在一實施例中,訊號接收器端Rx之電氣特性進行訊號之最佳化調整,係藉由系統上的控制台,所述控制台可以為一軟件或作業系統之一程式。利用重啟系統的方式,更新訊號發送器10和訊號接收器20之訊號調整組合以達到訊號之最佳化調整。於此所述重啟系統,可以指作業系統(OS)進行系統重置,另一實施方式,比如控制鏈路訓練機的熱重置功能,達到重新訓練的結果,也包含在本發明的實施方式內。The aforementioned embodiments disclose technical means for achieving the present invention by means of firmware and hardware on a hardware system. In one embodiment, the electrical characteristics of the signal receiver Rx are optimized and adjusted by a control console on the system, which can be a software or operating system program. By restarting the system, the signal adjustment combination of the signal transmitter 10 and the signal receiver 20 is updated to achieve optimal signal adjustment. Restarting the system herein can refer to resetting the system by the operating system (OS). Another embodiment, such as controlling the hot reset function of the link trainer to achieve a retraining result, is also included in the embodiments of the present invention.

此外,本發明揭示的該系統更包含網路模組40。在一實施例中,網路模組40用以連接外部資料庫,訊號調整資訊之訓練模型係連結外部資料庫資訊,參考即時更新的訓練資訊,傳送系統內至少一等化器或至少一訊號調整器之調整指令。In addition, the system disclosed in the present invention further includes a network module 40. In one embodiment, the network module 40 is used to connect to an external database. The signal adjustment information training model is linked to the external database information, references the real-time updated training information, and transmits adjustment instructions for at least one equalizer or at least one signal conditioner in the system.

在另一實施例中,網路模組40用以連接外部系統架構組合之資料庫,熱源量測器11,21,31之資訊參考系統架構組合之資料庫調整之訓練模型,產生熱源資訊H1,H2,H3提供誤碼風險評估機,依照該電氣特性狀態,對訊號接收器端Rx之電氣特性進行訊號之最佳化調整。In another embodiment, the network module 40 is used to connect to the database of the external system architecture combination. The information of the heat source meters 11, 21, and 31 is used to adjust the training model of the database of the reference system architecture combination to generate heat source information H1, H2, and H3 for providing to the error risk estimator. According to the electrical characteristic state, the electrical characteristics of the signal receiver end Rx are optimized and adjusted.

請參見圖4所示,其係為本發明依不同熱源資訊進行訊號調整之方法的流程圖,其中該方法可藉由例如,但不限制為電腦可讀取記錄媒體所執行,且該方法包含步驟如下,且配合前揭圖1~圖3。首先,從一系統內的複數個熱源量測器11,21,31,取得包含訊號發送器10之第一系統晶片1之熱源資訊H1,以及取得包含訊號接收器20之第二系統晶片2之熱源資訊H2(步驟S10)。Please refer to Figure 4, which is a flow chart of a method for signal adjustment based on different heat source information according to the present invention. The method can be executed by, for example, but not limited to, a computer-readable recording medium, and the method includes the following steps, which are combined with Figures 1 to 3 mentioned above. First, heat source information H1 of a first system chip 1 including a signal transmitter 10 and heat source information H2 of a second system chip 2 including a signal receiver 20 are obtained from a plurality of heat source measuring devices 11, 21, and 31 within a system (step S10).

然後,取得與第一系統晶片1和第二系統晶片2內部連接之電氣線路3所至少包含電路板30之熱源資訊H3(步驟S20)。然後,取得第二系統晶片2提供之訊號接收器端Rx的電氣特性狀態,以及訊號發送器10和/或訊號接收器20之訊號調整資訊(步驟S30)。然後,計算至少一個誤碼風險評估(步驟S40)。最後,根據該至少一個誤碼風險評估對訊號接收器端Rx之電氣特性進行訊號之最佳化調整(步驟S50)。Next, heat source information H3 is obtained for the electrical circuit 3 internally connected to the first SoC 1 and the second SoC 2, including at least the circuit board 30 (step S20). The electrical characteristics of the signal receiver Rx provided by the second SoC 2, as well as signal adjustment information for the signal transmitter 10 and/or the signal receiver 20, are obtained (step S30). At least one error risk assessment is then calculated (step S40). Finally, signal optimization is performed on the electrical characteristics of the signal receiver Rx based on the at least one error risk assessment (step S50).

相應於圖1~圖3所揭示依不同熱源資訊進行訊號最佳化調整之系統的方法內容,可參見其說明書之對應內容,因此重覆的內容不再多加贅述。For details on the method of optimizing the signal adjustment system based on different heat source information disclosed in Figures 1 to 3, please refer to the corresponding contents of the manual, so the repeated contents will not be elaborated on again.

本發明的方法,更包含取得至少一訊號調整器之訊號調整資訊,以及藉由調整至少一訊號調整器之電氣特性,進行訊號接收器端Rx之電氣特性之最佳化調整。The method of the present invention further includes obtaining signal adjustment information of at least one signal modulator, and optimizing the electrical characteristics of the signal receiver Rx by adjusting the electrical characteristics of the at least one signal modulator.

在一實施例中,計算誤碼風險評估包含蒐集該些熱源量測器11,21,31之熱源資訊H1,H2,H3,並依照各部件之限制或警示溫度,提供風險或無風險之反饋。In one embodiment, calculating the error risk assessment includes collecting the heat source information H1, H2, H3 from the heat source sensors 11, 21, 31 and providing risk or no risk feedback based on the limit or warning temperature of each component.

在一實施例中,第二系統晶片2包含鏈路訓練機。該方法更包含:自鏈路訓練機取得訊號接收器20之電氣特性狀態,及訊號發送器10和/或訊號接收器20之訊號調整資訊,以及對第一系統晶片1和/或第二系統晶片2內之至少一等化器或電氣線路3之至少一訊號調整器傳送訊號調整之指令,或啟動於訊號發送器10和訊號接收器20之間的鏈路訓練。In one embodiment, the second SoC 2 includes a link trainer. The method further includes obtaining electrical characteristic status of the signal receiver 20 and signal adjustment information of the signal transmitter 10 and/or the signal receiver 20 from the link trainer, and transmitting a signal adjustment instruction to at least one equalizer or at least one signal adjuster of the electrical circuit 3 within the first SoC 1 and/or the second SoC 2, or initiating link training between the signal transmitter 10 and the signal receiver 20.

再者,請參見圖12,其係為本發明依不同熱源資訊進行訊號最佳化調整之方法的另一流程圖,即為與模擬、設計方式有關的獨立方法。該方法包含步驟如下,首先,執行熱模擬以獲得熱分佈資料(步驟S100)。然後,執行與溫度相關的電氣模擬,且透過目前的BRD文件獲得佈線的插入損失資料(步驟S110)。然後,執行與溫度相關的電氣模擬,以獲得晶片封裝、連接器、線纜的插入損失資料(步驟S120)。然後,將具有溫度量測資料的通道的所有元素建立在通道分析工具中,以獲得電氣特性(步驟S130)。然後,判斷風險是否存在(步驟S140)。在步驟S140的判斷中,若無風險存在之虞,則結束此方法流程。反之,在步驟S140的判斷中,若存在風險,則調整等化器、修正BRD文件和/或改變配置設計(步驟S140)。再返回步驟S110,重新執行步驟S110及後續之步驟。Furthermore, please refer to Figure 12, which is another flow chart of the present invention's method for optimizing signals based on different heat source information, which is an independent method related to simulation and design methods. The method includes the following steps: First, a thermal simulation is performed to obtain heat distribution data (step S100). Then, a temperature-dependent electrical simulation is performed, and insertion loss data of the wiring is obtained using the current BRD file (step S110). Then, a temperature-dependent electrical simulation is performed to obtain insertion loss data for the chip package, connector, and cable (step S120). All elements of the channel with temperature measurement data are then created in the channel analysis tool to obtain electrical characteristics (step S130). A determination is then made as to whether a risk exists (step S140). If the determination in step S140 indicates no risk exists, the method ends. Otherwise, if the determination in step S140 indicates a risk exists, the equalizer is adjusted, the BRD file is modified, and/or the configuration design is changed (step S140). The method then returns to step S110 and repeats step S110 and subsequent steps.

承上與模擬、設計方式有關的獨立方法所述,本發明揭示的該方法更包含從幾何及材料檔案定義系統架構及部件資訊,包含第一系統晶片1、第二系統晶片2以及電路板30的部件資訊,以及其所構成之系統架構資訊,或者,更包括電氣線路30中的一個或複數個線纜。這些幾何及材料檔案可以為一電腦輔助設計圖檔(Computer Aided Design, CAD)或一工業圖檔格式ASCII。然後,初始化各部件發熱條件和系統機箱之熱流條件,這些熱流條件包含邊界條件,另外可以再形成一獨立設定檔。藉由前述幾何檔案和/或熱流條件檔案以產生網格檔或等效的節點矩陣資料檔。其中網格檔的內容係為在三維座標中建構自定義之空間中的熱分佈狀態,並且能夠針對溫度梯度較高的範圍,再進行更精細的網格劃分,因此有助於熱分析的具體化與深入化。另外,節點矩陣資料檔的內容係透過行與列的節點資訊,建構出熱分佈狀態,並且可提供熱向量作為熱源輸入。As described above with respect to the independent method related to simulation and design, the method disclosed in the present invention further includes defining the system architecture and component information from the geometry and material files, including the component information of the first system chip 1, the second system chip 2 and the circuit board 30, as well as the system architecture information constituted thereby, or further including one or more cables in the electrical circuit 30. These geometry and material files can be a computer-aided design drawing file (Computer Aided Design, CAD) or an industrial drawing file format ASCII. Then, the thermal conditions of each component and the thermal flow conditions of the system chassis are initialized. These thermal flow conditions include boundary conditions, and an independent setting file can be formed. A grid file or an equivalent node matrix data file is generated by the aforementioned geometry file and/or thermal flow condition file. The grid file constructs a custom heat distribution in three-dimensional space. It also allows for finer grid division in areas with high temperature gradients, thus helping to refine and deepen thermal analysis. Furthermore, the node matrix data file constructs heat distribution using row and column node information and provides heat vectors as heat source input.

該網格檔或等效的節點矩陣資料檔隨著技術演進,也有其他種態樣的格式,以減少對幾何結構建立網格,產生太繁複及龐大的網格檔,利用能量矩陣的演算法,也可以完全不建立網格(Mesh less),在此僅舉當前主流且較為可靠的實施方式。因此,透過網格檔或等效的節點矩陣資料檔,可產生熱源分析之資料檔,包含第一系統晶片1、第二系統晶片2和電路板30之熱源資訊H1,H2,H3,或者,更包含一個或複數個線纜之熱源資訊。其中,該熱源分析之資料檔可藉由有限體積法或一有限元素法之產生,使誤碼風險評估對訊號接收器端Rx之電氣特性進行訊號之最佳化調整。在一實施例中,對訊號最佳化調整係為調整幾何及材料檔案的一個或複數個阻抗匹配。在另一實施例中,對訊號最佳化調整係為調整幾何及材料檔案之一個或複數個走線長度。As technology evolves, the grid file or equivalent node matrix data file has evolved into other formats to reduce the need to create a grid for the geometric structure, which would otherwise result in an overly complex and large grid file. Energy matrix algorithms can also be used to completely eliminate the need for mesh creation (mesh-less). This is merely an example of a currently mainstream and reliable implementation. Therefore, a heat source analysis data file can be generated using a grid file or equivalent node matrix data file, including heat source information H1, H2, and H3 for the first system chip 1, the second system chip 2, and the circuit board 30, or further including heat source information for one or more cables. The heat source analysis data file can be generated using a finite volume method or a finite element method, enabling error risk assessment and signal optimization adjustment of the electrical characteristics of the signal receiver Rx. In one embodiment, the signal optimization adjustment involves adjusting one or more impedance matching parameters in the geometry and material file. In another embodiment, the signal optimization adjustment involves adjusting one or more trace length parameters in the geometry and material file.

進一步地,執行熱電分析之電氣模擬引擎,該熱電分析之電氣模擬引擎包含一個或複數個晶片封裝之區段之熱電耦合之電氣特性狀態,進而產生依據不同熱源在個別區段,包括發送端區段、通道區段、接收端區段(或上述區段中,可再切分為更細的複數區段)之熱電耦合的電氣特性狀態,藉以計算第二系統晶片2提供之訊號接收器端Rx之該電氣特性狀態,及訊號發送器10和/或訊號接收器20之訊號調整資訊。配合圖10所示,其以方塊圖的方式揭示處理器系統晶片1’(對應於圖2的第一系統晶片1)、裝置系統晶片2’(對應於圖2的第二系統晶片2)以及電氣線路3’所構成的多區段(Segment)訊號通道。在處理器系統晶片1’中,其包括發送器15’與封裝結構18’,其中封裝結構18’通常包括打線181’、載板182’以及封材183’。同樣地,在裝置系統晶片2’中,其包括接收器26’與封裝結構28’,其中封裝結構28’通常包括打線281’、載板282’以及封材283’。在電氣線路3’中,其包括,但不限制為,載板31’、電路板32’、訊號線33’、連接器34’、電子元件35’或其組合。其中,所述電子元件35’係為例如但不限制重定時器(Retimer)和/或中繼器(Redriver),或者是訊號切換器(Switch IC)。廣義來說,當訊號從發送器15’發送,直到接收器26’所接收的過程所經過的路徑都可稱為通道。也由於訊號所經過的路徑不具有相同特性(例如材料特性、阻抗特性…等),承前所述,訊號從發送器15’發送,會經過處理器系統晶片1’的封裝結構18’,再經過電氣線路3’的載板31’、電路板32’、訊號線33’、連接器34’、電子元件35’,最後再經過裝置系統晶片2’的封裝結構28’,直到被接收器26’所接收。在訊號傳遞的過程,由於封裝結構18’、載板31’、電路板32’、訊號線33’、連接器34’、電子元件35’、封裝結構28’具有不同的特性,因此可以視為訊號經過不同的區段(Segment)的通道。Furthermore, an electrical simulation engine for thermoelectric analysis is executed. This electrical simulation engine includes the electrical characteristic states of thermoelectric coupling of one or more chip package segments, thereby generating electrical characteristic states of thermoelectric coupling in individual segments, including the transmitter segment, the channel segment, and the receiver segment (or the aforementioned segments can be further divided into multiple smaller segments), based on different heat sources. This is used to calculate the electrical characteristic states of the signal receiver Rx provided by the second system chip 2, as well as signal conditioning information for the signal transmitter 10 and/or signal receiver 20. As shown in Figure 10, a block diagram is shown, which illustrates a multi-segment signal channel composed of a processor system chip 1' (corresponding to the first system chip 1 in Figure 2), a device system chip 2' (corresponding to the second system chip 2 in Figure 2), and an electrical circuit 3'. In the processor system chip 1’, it includes a transmitter 15’ and a package structure 18’, wherein the package structure 18’ generally includes bonding wires 181’, a carrier 182’, and a sealing material 183’. Similarly, in the device system chip 2’, it includes a receiver 26’ and a package structure 28’, wherein the package structure 28’ generally includes bonding wires 281’, a carrier 282’, and a sealing material 283’. In the electrical circuit 3’, it includes, but is not limited to, a carrier 31’, a circuit board 32’, a signal line 33’, a connector 34’, an electronic component 35’, or a combination thereof. The electronic component 35’ is, for example, but not limited to, a retimer and/or a repeater, or a signal switch IC. Broadly speaking, the path a signal traverses from transmitter 15' to receiver 26' can be called a channel. Because signal paths vary in characteristics (e.g., material properties, impedance characteristics, etc.), as previously mentioned, a signal transmitted from transmitter 15' passes through package 18' of processor system chip 1', then through carrier 31' of electrical circuit 3', circuit board 32', signal line 33', connector 34', electronic component 35', and finally through package 28' of device system chip 2' until it is received by receiver 26'. During the signal transmission process, the package structure 18', carrier board 31', circuit board 32', signal line 33', connector 34', electronic component 35', and package structure 28' have different characteristics and can therefore be considered as channels through which the signal passes through different segments.

所述各區段(Segment)資訊,並不限於都由同一分析流程取得,在實務上,晶片內部包含晶片封裝的資訊,可以由晶片供應商提供電氣參數、熱參數或電氣特性表等方式取得,而於電氣線路包含線纜(銅線纜光纖線纜)的情形,線纜部分也可由線纜供應商提供對應的電氣參數、熱參數或電氣特性表等方式取得。這些資訊可以如前述的方式,儲存於系統硬體的記憶體、儲存裝置,或由網路模組40連線到外部資料庫的方式實現。The segment information described above is not limited to being obtained through the same analysis process. In practice, information within the chip, including chip packaging, can be obtained by providing electrical parameters, thermal parameters, or electrical characteristic tables from the chip supplier. Furthermore, if the electrical circuit includes cables (copper or optical), the cable portion can also be obtained by providing corresponding electrical parameters, thermal parameters, or electrical characteristic tables from the cable supplier. This information can be stored in the system hardware's memory or storage device, as described above, or by connecting the network module 40 to an external database.

進一步地,請參見圖7,其係為本發明依不同熱源資訊進行訊號最佳化調整之系統的系統示意的立體圖,配合參見圖10。處理器系統晶片1’(即CPU)與裝置系統晶片2’配置於系統的容置空間內,並且該容置空間內更配置線纜10’(即Cable),意即電氣線路3’中的線纜10’。處理器系統晶片1’與線纜10’之間透過第一走線110’所連接,並且裝置系統晶片2’與線纜10’之間透過第二走線210’所連接,因此當訊號從處理器系統晶片1’(的發送器15’)傳送至裝置系統晶片2’(的接收器26’)過程,除了會經過處理器系統晶片1’的封裝結構18’以及裝置系統晶片2’的封裝結構28’外,亦經過線纜10’。也因為訊號經過多區段(Segment)訊號通道,因此造成訊號傳送中的失真、衰減。配合參見圖8,其係為相應圖7的俯視圖。透過引入外部氣流AF(例如圖中的左側處引入),流動的氣流將熱源產生的熱引至熱源量測器,因此可獲得處理器系統晶片1’的熱源資訊、裝置系統晶片2’的熱源資訊和/或線纜10’(即電氣線路3’)的熱源資訊。同樣地,配合參見圖9,其與圖8最大的差異在於,處理器系統晶片1’與裝置系統晶片2’之間,直接透過一走線120’所連接。當訊號從處理器系統晶片1’(的發送器15’)傳送至裝置系統晶片2’(的接收器26’)過程,會經過處理器系統晶片1’的封裝結構18’以及裝置系統晶片2’的封裝結構28’的多區段(Segment)訊號通道,因此造成訊號傳送中的失真、衰減,使訊號的品質變差。同樣地,透過引入外部氣流AF(例如圖中的左側處引入),流動的氣流將熱源產生的熱引至熱源量測器,因此可獲得處理器系統晶片1’的熱源資訊和/或裝置系統晶片2’的熱源資訊。Further, please refer to Figure 7, which is a perspective diagram illustrating a system for optimizing signals based on different heat source information, according to the present invention. See also Figure 10. A processor system chip 1' (i.e., CPU) and a device system chip 2' are disposed within a system housing. Furthermore, a cable 10' (i.e., a cable within an electrical circuit 3') is disposed within the housing. Processor SoC 1' is connected to cable 10' via first trace 110', and device SoC 2' is connected to cable 10' via second trace 210'. Therefore, when a signal is transmitted from processor SoC 1' (transmitter 15') to device SoC 2' (receiver 26'), it not only passes through processor SoC 1''s package 18' and device SoC 2''s package 28', but also through cable 10'. Because the signal passes through multiple segments, distortion and attenuation occur during transmission. See Figure 8 for a top view corresponding to Figure 7. By introducing external airflow AF (e.g., from the left side of the figure), the flowing airflow directs heat generated by the heat source to the heat source measurement device, thereby obtaining heat source information for the processor system chip 1', the device system chip 2', and/or the cable 10' (i.e., the electrical line 3'). Similarly, referring to FIG. 9 , the biggest difference from FIG. 8 is that the processor system chip 1' and the device system chip 2' are directly connected via a trace 120'. When a signal is transmitted from processor SoC 1′ (transmitter 15′) to device SoC 2′ (receiver 26′), it passes through the multi-segment signal paths of processor SoC 1′'s package structure 18′ and device SoC 2′'s package structure 28′. This can cause distortion and attenuation during signal transmission, degrading signal quality. Similarly, by introducing external airflow AF (e.g., on the left side of the figure), the flowing airflow directs heat generated by the heat source to the heat source sensor, thereby obtaining heat source information for processor SoC 1′ and/or device SoC 2′.

綜上所述,本發明所提出的系統與方法,進一步地將熱的因素所造成訊號衰減效應加以考量,並且透過全通道的熱電特性評估,可以更準確地判斷溫度對訊號完整度的影響,進而對訊號整資訊(等化器、預加強、去加強、等化器和/或重定時器、中繼器)進行調整與設計,或者重新設計佈線,實現訊號的最佳化調整,以確保訊號完整性及高品質的訊號傳輸。In summary, the system and method proposed by the present invention further considers the signal attenuation effects caused by thermal factors. By evaluating the thermoelectric characteristics of the entire channel, it can more accurately determine the impact of temperature on signal integrity. This allows for adjustments and design of signal conditioning (equalizers, pre-emphasis, de-emphasis, equalizers and/or retimers, repeaters), or redesign of wiring, to achieve optimal signal conditioning to ensure signal integrity and high-quality signal transmission.

1:第一系統晶片 2:第二系統晶片 3:電氣線路 10:訊號發送器 20:訊號接收器 30:電路板 40:網路模組 100:匯流排 11,21,31:熱源量測器 H1,H2,H3:熱源資訊 Tx:訊號發送端 Rx:訊號接收端 CH:訊號通道 BP:位元串 ED:眼圖 S10~S50:步驟 1’:處理器系統晶片 2’:裝置系統晶片 3’:電氣線路 11’,21’:記憶體介面 12’,22’:核心 13’:處理器匯流排 23’:裝置匯流排 14’,24’:I/O介面 15’,25’:發送器 16’,26’:接收器 17’,27’:鏈路訓練機 10’:線纜 110’,210’,120’:走線 AF:氣流 18’,28’:封裝 181’,281’:打線 182’,282’:載板 183’,283’:封材 31’:載板 32’:電路板 33’:訊號線 34’:連接器 35’:電子元件 C11~C32:曲線 S100~S150:步驟 1: SoC (System on Chip) 2: SoC (System on Chip) 3: Electrical wiring 10: Signal transmitter 20: Signal receiver 30: Circuit board 40: Network module 100: Bus 11, 21, 31: Heat source measurement H1, H2, H3: Heat source information Tx: Signal transmitter Rx: Signal receiver CH: Signal channel BP: Bit stream ED: Eye diagram S10-S50: Steps 1': Processor SoC 2': Device SoC 3': Electrical wiring 11', 21': Memory interface 12', 22': Core 13': Processor bus 23': Device bus 14’, 24’: I/O interface 15’, 25’: Transmitter 16’, 26’: Receiver 17’, 27’: Link trainer 10’: Cable 110’, 210’, 120’: Tracing AF: Airflow 18’, 28’: Package 181’, 281’: Wire bonding 182’, 282’: Carrier 183’, 283’: Sealing material 31’: Carrier 32’: PCB 33’: Signal cable 34’: Connector 35’: Electronic components C11-C32: Curves S100-S150: Steps

圖1:係為本發明依不同熱源資訊進行訊號最佳化調整之系統的系統示意圖。Figure 1 is a schematic diagram of the system for optimizing signals based on different heat source information according to the present invention.

圖2:係為本發明依不同熱源資訊進行訊號最佳化調整之系統的系統方塊圖。Figure 2 is a block diagram of the system for optimizing signals based on different heat source information according to the present invention.

圖3:係為本發明依不同熱源資訊進行訊號最佳化調整之系統的系統硬體圖。Figure 3 is a system hardware diagram of the present invention's system for optimizing signals based on different heat source information.

圖4:係為本發明依不同熱源資訊進行訊號調整之方法的流程圖。Figure 4 is a flow chart of the method of the present invention for signal adjustment based on different heat source information.

圖5:係為本發明依不同熱源資訊進行訊號最佳化調整之系統的另一系統示意圖。FIG5 is another schematic diagram of the system of the present invention for performing signal optimization adjustment based on different heat source information.

圖6:係為本發明依不同熱源資訊進行訊號最佳化調整之系統的鏈路訓練機示意圖。FIG6 is a schematic diagram of a link training machine of the present invention for optimizing signal adjustment based on different heat source information.

圖7:係為本發明依不同熱源資訊進行訊號最佳化調整之系統的系統示意的立體圖。FIG7 is a three-dimensional diagram showing a system for optimizing and adjusting signals based on different heat source information according to the present invention.

圖8:係為本發明依不同熱源資訊進行訊號最佳化調整之系統的系統示意的俯視圖。FIG8 is a top view schematically showing the system of the present invention for performing signal optimization adjustment based on different heat source information.

圖9:係為本發明依不同熱源資訊進行訊號最佳化調整之系統的系統示意的另一俯視圖。FIG9 is another top view illustrating the system for optimizing signals based on different heat source information according to the present invention.

圖10:係為本發明依不同熱源資訊進行訊號最佳化調整之系統的通道方塊圖。Figure 10 is a channel block diagram of the system for optimizing signals based on different heat source information according to the present invention.

圖11:係為本發明依不同熱源資訊進行訊號最佳化調整之系統的訊號調整資訊表。FIG11 is a table showing signal adjustment information for a system of the present invention that optimizes signal adjustment based on different heat source information.

圖12:係為本發明依不同熱源資訊進行訊號最佳化調整之方法的另一流程圖。FIG12 is another flow chart of the method for optimizing the signal adjustment according to different heat source information of the present invention.

1:第一系統晶片 1: First System on Chip

2:第二系統晶片 2: Second System Chip

3:電氣線路 3: Electrical wiring

10:訊號發送器 10: Signal transmitter

20:訊號接收器 20: Signal Receiver

11,21,31:熱源量測器 11, 21, 31: Heat source measurement device

H1,H2,H3:熱源資訊 H1, H2, H3: Heat source information

Claims (21)

一種依不同熱源資訊進行訊號最佳化調整之系統,該系統包含: 複數個熱源量測器,獲得各部件之熱源資訊, 包含一訊號發送器之一第一系統晶片, 包含一訊號接收器之一第二系統晶片, 與該第一系統晶片和該第二系統晶片內部連接之一電氣線路,至少包含一電路板, 其中該第二系統晶片提供該訊號接收器之一電氣特性狀態,及該訊號發送器和/或該訊號接收器之一訊號調整資訊,以及 一誤碼風險評估機,根據該些熱源量測器所蒐集之熱源資訊,並依照各部件之限制或警示溫度,提供風險或無風險之反饋,進而依照該電氣特性狀態,對該訊號接收器端之電氣特性進行訊號之最佳化調整。 A system for optimizing signals based on different heat source information includes: a plurality of heat source sensors that obtain heat source information for various components; a first system-on-chip (SoC) including a signal transmitter; a second system-on-chip (SoC) including a signal receiver; an electrical circuit internally connected to the first and second SoCs, comprising at least one circuit board; the second SoC provides the signal receiver with an electrical characteristic state and signal adjustment information for the signal transmitter and/or the signal receiver; and an error risk estimator that, based on the heat source information collected by the heat source sensors and the limit or warning temperature of each component, provides feedback indicating risk or no risk. The system then optimizes the signal based on the electrical characteristic state to the electrical characteristics of the signal receiver. 如請求項1所述之系統,其中該複數個熱源量測器,包含位於該第一系統晶片內的一第一熱源量測器、位於該第二系統晶片內的一第二熱源量測器,以及一第三熱源量測器,分別量測該第一系統晶片發熱的熱源資訊、該第二系統晶片發熱的熱源資訊,以及該電路板發熱的熱源資訊; 其中該誤碼風險評估機依照所量測的該等熱源資訊以及該電氣特性狀態,對該訊號接收器端之電氣特性進行訊號之最佳化調整。 The system of claim 1, wherein the plurality of heat source sensors include a first heat source sensor located within the first system chip, a second heat source sensor located within the second system chip, and a third heat source sensor, respectively measuring heat source information of the first system chip, the second system chip, and the circuit board; The error risk estimator optimizes the electrical characteristics of the signal receiver based on the measured heat source information and the electrical characteristic status. 如請求項1所述之系統,其中該系統包含: 於該電氣線路的至少一訊號調整器包含該訊號調整資訊, 藉由調整該至少一訊號調整器之電氣特性,進行該訊號接收器端之電氣特性之最佳化調整。 The system of claim 1, wherein the system comprises: At least one signal conditioner in the electrical circuit includes the signal conditioning information; By adjusting the electrical characteristics of the at least one signal conditioner, the electrical characteristics of the signal receiver are optimized. 如請求項1所述之系統,其中該第二系統晶片包含一鏈路訓練機,提供該訊號接收器之該電氣特性狀態及該訊號發送器和該訊號接收器之訊號調整資訊,該誤碼風險評估機為附加於該鏈路訓練機之函數集,對該第一系統晶片和/或該第二系統晶片內之至少一等化器或該電氣線路之該至少一訊號調整器傳送訊號調整之指令。The system as described in claim 1, wherein the second system chip includes a link trainer that provides the electrical characteristic state of the signal receiver and signal adjustment information of the signal transmitter and the signal receiver, and the error risk assessor is a function set attached to the link trainer that transmits signal adjustment instructions to at least one equalizer in the first system chip and/or the second system chip or at least one signal adjuster in the electrical circuit. 如請求項4所述之系統,其中該鏈路訓練機之附加函數包含於該訊號發送器和該訊號接收器之間重啟鏈路訓練之啟動條件或排除條件。The system of claim 4, wherein the additional function of the link trainer includes an activation condition or an exclusion condition for restarting link training between the signal transmitter and the signal receiver. 如請求項1所述之系統,該訊號接收器端之電氣特性進行訊號之最佳化調整,係藉由一系統上之控制台,利用重啟系統的方式,更新該訊號發送器和該訊號接收器之訊號調整組合以達到訊號之最佳化調整。In the system described in claim 1, the electrical characteristics of the signal receiver are optimized to adjust the signal by restarting the system through a control console on the system to update the signal adjustment combination of the signal transmitter and the signal receiver to achieve optimal signal adjustment. 如請求項1所述之系統,其中該第二系統晶片包含一鏈路訓練機,提供該訊號接收器之該電氣特性狀態及該訊號發送器和該訊號接收器之訊號調整資訊, 其中該誤碼風險評估機為一系統上之執行之函數,對該第一系統晶片和/或該第二系統晶片內的至少一等化器或該電氣線路的至少一訊號調整器傳送訊號調整之指令。 The system of claim 1, wherein the second SoC includes a link trainer that provides the electrical characteristic state of the signal receiver and signal adjustment information for the signal transmitter and the signal receiver, and wherein the error risk estimator is a function executed on the system that transmits signal adjustment instructions to at least one equalizer within the first SoC and/or the second SoC or at least one signal adjuster in the electrical circuit. 如請求項1所述之系統,包含一網路模組,以連接外部資料庫,該訊號調整資訊之訓練模型係連結該外部資料庫資訊,參考即時更新的訓練資訊,傳送系統內至少一等化器或至少一訊號調整器之調整指令。The system as described in claim 1 includes a network module to connect to an external database, and the training model of the signal adjustment information is linked to the external database information, refers to the real-time updated training information, and transmits adjustment instructions for at least one equalizer or at least one signal adjuster in the system. 如請求項1所述之系統,包含一網路模組,以連接外部系統架構組合之資料庫,該熱源量測器之資訊參考該系統架構組合之資料庫調整之訓練模型,產生熱源資訊提供該誤碼風險評估機,依照該電氣特性狀態,對該訊號接收器端之電氣特性進行訊號之最佳化調整。The system as described in claim 1 includes a network module for connecting to a database of an external system architecture combination. The information of the heat source meter is referenced to a training model adjusted by the database of the system architecture combination to generate heat source information for providing to the error risk assessment machine, which optimizes the signal by adjusting the electrical characteristics of the signal receiver according to the electrical characteristic state. 一種依不同熱源資訊進行訊號調整之方法,該方法包含: 從一系統內的複數個熱源量測器,取得包含一訊號發送器之一第一系統晶片之熱源資訊以及取得包含一訊號接收器之一第二系統晶片之熱源資訊, 取得與該第一系統晶片和該第二系統晶片內部連接之一電氣線路所至少包含一電路板之熱源資訊, 取得該第二系統晶片提供之該訊號接收器端的電氣特性狀態,及該訊號發送器和/或該訊號接收器之一訊號調整資訊, 計算至少一個誤碼風險評估,以及 根據該至少一個誤碼風險評估蒐集該些熱源量測器之熱源資訊,並依照各部件之限制或警示溫度,提供風險或無風險之反饋,進而對該訊號接收器端之電氣特性進行訊號之最佳化調整。 A method for signal adjustment based on different heat source information, the method comprising: obtaining heat source information of a first system chip including a signal transmitter and heat source information of a second system chip including a signal receiver from a plurality of heat source sensors within a system; obtaining heat source information of at least one circuit board included in an electrical circuit internally connected to the first system chip and the second system chip; obtaining electrical characteristic status of the signal receiver provided by the second system chip and signal adjustment information of the signal transmitter and/or the signal receiver; calculating at least one error risk assessment; and Based on the at least one error risk assessment, heat source information from the heat source sensors is collected and, based on the limit or warning temperature of each component, feedback indicating risk or no risk is provided, thereby optimizing the electrical characteristics of the signal receiver. 如請求項10所述之方法,其中該複數個熱源量測器,包含位於該第一系統晶片內的一第一熱源量測器、位於該第二系統晶片內的一第二熱源量測器,以及一第三熱源量測器,分別量測該第一系統晶片發熱的熱源資訊、該第二系統晶片發熱的熱源資訊,以及該電路板發熱的熱源資訊; 其中該誤碼風險評估機依照所量測的該等熱源資訊以及該電氣特性狀態,對該訊號接收器端之電氣特性進行訊號之最佳化調整。 The method of claim 10, wherein the plurality of heat source sensors include a first heat source sensor located within the first system chip, a second heat source sensor located within the second system chip, and a third heat source sensor, respectively measuring heat source information of heat generated by the first system chip, heat source information of heat generated by the second system chip, and heat source information of heat generated by the circuit board; The error risk estimator optimizes the electrical characteristics of the signal receiver based on the measured heat source information and the electrical characteristic status. 如請求項10所述之方法,其中該方法包含: 取得至少一訊號調整器之該訊號調整資訊,以及 藉由調整該至少一訊號調整器之電氣特性,進行該訊號接收器端之電氣特性之最佳化調整。 The method of claim 10, wherein the method comprises: obtaining signal adjustment information of at least one signal modulator, and optimizing electrical characteristics of the signal receiver by adjusting electrical characteristics of the at least one signal modulator. 如請求項10所述之方法,其中該第二系統晶片包含一鏈路訓練機,該方法包含: 自該鏈路訓練機取得該訊號接收器之一電氣特性狀態,及該訊號發送器和/或該訊號接收器之該訊號調整資訊,以及 對該第一系統晶片和/或該第二系統晶片內之至少一等化器或該電氣線路之至少一訊號調整器傳送訊號調整之指令,或啟動於該訊號發送器和該訊號接收器之間的鏈路訓練。 The method of claim 10, wherein the second SoC includes a link trainer, the method comprising: obtaining from the link trainer an electrical characteristic state of the signal receiver and the signal adjustment information of the signal transmitter and/or the signal receiver, and sending a signal adjustment instruction to at least one equalizer or at least one signal adjuster of the electrical circuit within the first SoC and/or the second SoC, or initiating link training between the signal transmitter and the signal receiver. 如請求項10所述之方法,包含: 從一幾何及材料檔案定義一系統架構及部件資訊,包含該第一系統晶片、該第二系統晶片和該電路板, 初始化各部件發熱條件和一系統機箱之熱流條件,以及 產生一網格檔或等效的節點矩陣資料檔。 The method of claim 10, comprising: defining a system architecture and component information, including the first system chip, the second system chip, and the circuit board, from a geometry and material file; initializing thermal conditions of each component and thermal flow conditions of a system chassis; and generating a grid file or an equivalent node matrix data file. 如請求項14所述之方法,包含: 產生一熱源分析之資料檔,包含該第一系統晶片、該第二系統晶片和該電路板之熱源資訊。 The method of claim 14, comprising: Generating a heat source analysis data file comprising heat source information of the first system chip, the second system chip, and the circuit board. 如請求項14所述之方法,包含: 執行一熱電分析之電氣模擬引擎,產生依據不同熱源在個別區段之熱電耦合的一電氣特性狀態,藉以計算該第二系統晶片提供之該訊號接收器端之該電氣特性狀態,及該訊號發送器和/或該訊號接收器之該訊號調整資訊。 The method of claim 14, comprising: Executing an electrical simulation engine for thermoelectric analysis to generate an electrical characteristic state based on thermoelectric coupling of different heat sources in respective segments, thereby calculating the electrical characteristic state of the signal receiver provided by the second system chip and the signal conditioning information of the signal transmitter and/or the signal receiver. 如請求項15所述之方法,其中該系統架構及部件資訊更包含於該電氣線路中之一個或複數個線纜,該熱源分析之資料檔更包含一個或複數個線纜之熱源資訊。The method of claim 15, wherein the system architecture and component information further includes one or more cables in the electrical circuit, and the heat source analysis data file further includes heat source information of one or more cables. 如請求項16所述之方法,其中該熱電分析之電氣模擬引擎,包含一個或複數個晶片封裝之區段之熱電耦合之該電氣特性狀態。The method of claim 16, wherein the electrical simulation engine for thermoelectric analysis includes the electrical characteristic states of the thermoelectric coupling of sections of one or more chip packages. 如請求項15所述之方法,其中該一熱源分析之資料檔,為一有限體積法或一有限元素法所產生,該誤碼風險評估對該訊號接收器端之電氣特性進行訊號之最佳化調整。The method of claim 15, wherein the data file for heat source analysis is generated by a finite volume method or a finite element method, and the error risk assessment optimizes the signal based on the electrical characteristics of the signal receiver. 如請求項14所述之方法,其中該進行訊號最佳化調整,為調整該幾何及材料檔案之一個或複數個阻抗匹配。The method of claim 14, wherein the signal optimization adjustment is performed by adjusting one or more impedance matches of the geometry and material file. 如請求項14所述之方法,其中該進行訊號最佳化調整,為調整該幾何及材料檔案之一個或複數個走線長度。The method of claim 14, wherein the signal optimization adjustment is performed by adjusting one or more trace lengths of the geometry and material file.
TW112137701A 2023-08-18 2023-10-02 System and method for signal optimization adjustment based on different heat source information TWI894647B (en)

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