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TWI886318B - Processing method of workpiece - Google Patents

Processing method of workpiece Download PDF

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Publication number
TWI886318B
TWI886318B TW110129335A TW110129335A TWI886318B TW I886318 B TWI886318 B TW I886318B TW 110129335 A TW110129335 A TW 110129335A TW 110129335 A TW110129335 A TW 110129335A TW I886318 B TWI886318 B TW I886318B
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workpiece
coordinates
acquisition step
processing
displacement information
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TW110129335A
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Chinese (zh)
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TW202224006A (en
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前田勉
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日商迪思科股份有限公司
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/36Removing material
    • B23K26/362Laser etching
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q17/00Arrangements for observing, indicating or measuring on machine tools
    • B23Q17/24Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves
    • B23Q17/2428Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves for measuring existing positions of tools or workpieces
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/08Devices involving relative movement between laser beam and workpiece
    • B23K26/083Devices involving movement of the workpiece in at least one axial direction
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/70Auxiliary operations or equipment
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q1/00Members which are comprised in the general build-up of a form of machine, particularly relatively large fixed members
    • B23Q1/25Movable or adjustable work or tool supports
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q17/00Arrangements for observing, indicating or measuring on machine tools
    • B23Q17/20Arrangements for observing, indicating or measuring on machine tools for indicating or measuring workpiece characteristics, e.g. contour, dimension, hardness

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  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Plasma & Fusion (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Dicing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Laser Beam Processing (AREA)

Abstract

[課題]提供一種可以用較高的精度來對具矩形狀的正反面之板狀的被加工物進行加工之新的被加工物的加工方法。 [解決手段]一種被加工物的加工方法,在使用工作夾台與加工單元來對板狀的被加工物進行加工時使用,前述板狀的被加工物具有具4個邊之矩形狀的第1面、及和第1面位於相反側之矩形狀的第2面,前述工作夾台具有保持面,前述加工單元對已保持在工作夾台之被加工物進行加工,前述被加工物的加工方法包含以下步驟:取得步驟,在已將被加工物的第2面側保持於工作夾台的保持面的狀態下,測定包含被加工物的4個邊的區域之高度來得到位移資訊,並從前述位移資訊取得:邊在平行於保持面的XY平面內的方向、與表示4個邊在XY平面內的位置之4個XY座標;及加工步驟,依據邊的方向與4個XY座標來對被加工物進行加工。 [Topic] Provide a new processing method that can process a plate-shaped workpiece with a rectangular front and back surface with higher precision. [Solution] A method for processing a workpiece is used when a workpiece in the form of a plate is processed using a work jig and a processing unit. The plate-shaped workpiece has a rectangular first surface with four sides and a rectangular second surface located on the opposite side of the first surface. The work jig has a holding surface. The processing unit processes the workpiece held on the work jig. The method for processing the workpiece includes the following steps: an acquisition step, in which the height of a region including the four sides of the workpiece is measured to obtain displacement information while the second side of the workpiece is held on the holding surface of the work jig, and the direction of the side in the XY plane parallel to the holding surface and the four XY coordinates indicating the positions of the four sides in the XY plane are obtained from the displacement information; and a processing step, in which the workpiece is processed according to the direction of the side and the four XY coordinates.

Description

被加工物的加工方法Processing method of workpiece

本發明是關於一種在對具矩形狀的正反面之板狀的被加工物進行加工時所使用之被加工物的加工方法。The present invention relates to a method for processing a workpiece used when processing a plate-shaped workpiece having rectangular front and back surfaces.

構成平板顯示器的畫面之基板之類的光學零件,可藉由對在可見光區透明之玻璃板等的被加工物進行加工來製造。在加工像這樣的被加工物時,可使用例如生成高輸出的雷射光束來利用之雷射加工裝置、或將包含磨粒之環狀的切削刀片裝設於主軸之切削裝置等的加工裝置(參照例如專利文獻1)。Optical parts such as substrates constituting the screen of flat panel displays can be manufactured by processing a workpiece such as a glass plate that is transparent in the visible light region. When processing such a workpiece, a processing device such as a laser processing device that generates a high-output laser beam or a cutting device that mounts a ring-shaped cutting blade containing abrasive grains on a spindle can be used (see, for example, Patent Document 1).

一般而言,這些加工裝置會從以相機拍攝被加工物而得到的圖像中,提取存在於被加工物之器件等的型樣,並確認被加工物之應被加工的位置(加工預定線)。另一方面,在對不存在型樣之被加工物進行加工的情況下,是例如將被加工物配置在加工裝置所具備的工作夾台的已決定的位置,而做成可以對被加工物的已決定的位置進行加工。 先前技術文獻 專利文獻 Generally speaking, these processing devices extract the shape of the device or the like existing in the workpiece from the image obtained by photographing the workpiece with a camera, and confirm the position of the workpiece to be processed (the predetermined processing line). On the other hand, when processing a workpiece without a shape, for example, the workpiece is arranged at a predetermined position of a work clamp provided in the processing device, so that the predetermined position of the workpiece can be processed. Prior art literature Patent literature

專利文獻1:日本特開2006-93333號公報Patent document 1: Japanese Patent Application Publication No. 2006-93333

發明欲解決之課題Invention Problems to be Solved

可是,雖然在加工裝置內搬送被加工物的搬送機構會構成為能夠以較高的精度來對工作夾台搬入被加工物,但實際上以下情形也很多:在已被搬入之被加工物的位置、與作為目標之被加工物的位置之間,產生5mm以下的偏離。據此,在將被加工物配置在工作夾台的已決定的位置之上述的方法中,並不一定能夠以足夠高的精度來加工被加工物。However, although the transport mechanism for transporting the workpiece in the processing device is configured to carry the workpiece to the worktable with high accuracy, in reality, there are many cases where the position of the workpiece that has been carried in and the position of the target workpiece are offset by less than 5 mm. Therefore, in the above method of arranging the workpiece at a predetermined position of the worktable, it is not necessarily possible to process the workpiece with sufficiently high accuracy.

例如,在對具圓形的正反面之被加工物進行加工的情況下,可以藉由從外周緣的3點之位置來求出相當於圓的中心之位置,而以較高的精度來加工被加工物。然而,在對具矩形狀的正反面之被加工物進行加工的情況下,並無法將這種用於對具圓形的正反面之被加工物進行加工之手法直接轉用。For example, when processing a workpiece with a circular front and back surface, the workpiece can be processed with higher accuracy by finding the position equivalent to the center of the circle from the positions of three points on the outer periphery. However, when processing a workpiece with a rectangular front and back surface, this method used for processing a workpiece with a circular front and back surface cannot be directly transferred to the workpiece.

據此,本發明之目的在於提供一種能夠以較高的精度來對具矩形狀的正反面之板狀的被加工物進行加工之新的被加工物的加工方法。 用以解決課題之手段 Accordingly, the purpose of the present invention is to provide a new method for processing a workpiece that can process a plate-shaped workpiece with a rectangular front and back surface with higher precision. Means for solving the problem

根據本發明的一個層面,可提供一種被加工物的加工方法,其在使用工作夾台與加工單元來對板狀的被加工物進行加工時使用,前述板狀的被加工物具有具4個邊之矩形狀的第1面、及和第1面位於相反側之矩形狀的第2面,前述工作夾台具有保持面,前述加工單元對已保持在該工作夾台之該被加工物進行加工,前述被加工物的加工方法包含以下步驟: 取得步驟,在已將該被加工物的該第2面側保持於該工作夾台的該保持面的狀態下,測定包含該被加工物的4個該邊的區域之高度來得到位移資訊,並從前述位移資訊取得:該邊在平行於該保持面的XY平面內的方向、與表示4個該邊在該XY平面內的位置之4個XY座標;及 加工步驟,依據該邊的方向與該4個XY座標來對該被加工物進行加工。 According to one aspect of the present invention, a method for processing a workpiece can be provided, which is used when a workpiece in the form of a plate is processed using a work jig and a processing unit. The plate-shaped workpiece has a rectangular first surface with four sides and a rectangular second surface located on the opposite side of the first surface. The work jig has a holding surface. The processing unit processes the workpiece held on the work jig. The method for processing the workpiece includes the following steps: An acquisition step, in which the height of an area including the four sides of the workpiece is measured to obtain displacement information while the second side of the workpiece is held on the holding surface of the work jig, and the following are obtained from the displacement information: the direction of the side in an XY plane parallel to the holding surface, and four XY coordinates representing the positions of the four sides in the XY plane; and Processing step: Process the object according to the direction of the edge and the four XY coordinates.

在上述之本發明的一個層面中,該取得步驟更包含以下步驟: 方向取得步驟,藉由讓用於測定高度之測定器與該工作夾台相對地移動,而在通過Y方向上不同的位置且平行於X方向之2條直線上測定包含該被加工物的1個該邊的區域之高度來得到位移資訊,並從前述位移資訊計算表示該邊與該2條直線交叉的2個位置之XY座標,來取得該邊的方向; 第1座標取得步驟,將繞著相對於該XY平面垂直之旋轉軸的該工作夾台的方向調整成使在該方向取得步驟中所取得的該邊的方向成為相對於該Y方向平行之後,讓該測定器與該工作夾台相對地移動,藉此在平行於該X方向的1條直線上測定包含該被加工物的相向的2個該邊的區域之高度來得到位移資訊,並從前述位移資訊取得表示相向的2個該邊與該1條直線交叉的2個位置之2個XY座標;及 第2座標取得步驟,將繞著該旋轉軸的該工作夾台的方向調整成使在該方向取得步驟中所取得的該邊的方向成為相對於該Y方向垂直之後,讓該測定器與該工作夾台相對地移動,藉此在平行於該X方向的1條直線上測定包含該被加工物的相向的其他2個該邊的區域之高度來得到位移資訊,並從前述位移資訊取得表示相向的其他2個該邊與該1條直線交叉的2個位置之2個XY座標。 In one aspect of the present invention, the acquisition step further includes the following steps: A direction acquisition step, wherein the height of an area including one side of the workpiece is measured on two straight lines passing through different positions in the Y direction and parallel to the X direction by moving the height measuring device and the work clamp relative to each other to obtain displacement information, and the XY coordinates of two positions where the side and the two straight lines intersect are calculated from the displacement information to obtain the direction of the side; The first coordinate acquisition step is to adjust the direction of the work clamp around the rotation axis perpendicular to the XY plane so that the direction of the edge acquired in the direction acquisition step becomes parallel to the Y direction, and then move the measuring device and the work clamp relative to each other, thereby measuring the height of the area including the two opposing edges of the workpiece on a straight line parallel to the X direction to obtain displacement information, and obtain two XY coordinates representing the two positions where the two opposing edges intersect the straight line from the above displacement information; and In the second coordinate acquisition step, the direction of the work clamp around the rotation axis is adjusted so that the direction of the side obtained in the direction acquisition step becomes perpendicular to the Y direction, and the measuring device and the work clamp are moved relative to each other, thereby measuring the height of the area including the other two sides of the workpiece facing each other on a straight line parallel to the X direction to obtain displacement information, and obtaining two XY coordinates representing the two positions where the other two sides facing each other intersect the straight line from the above displacement information.

又,在上述之本發明的一個層面中,該取得步驟包更含以下步驟: 第1座標取得步驟,藉由讓用於測定高度之測定器與該工作夾台相對地移動,而在通過在Y方向上不同的位置且平行於X方向之2條直線上測定包含該被加工物的相向的2個該邊的區域之高度來得到位移資訊,並從前述位移資訊取得表示相向的2個該邊與該2條直線交叉的3個以上的位置之3個以上的XY座標; 第2座標取得步驟,以繞著相對於該XY平面垂直之旋轉軸的該工作夾台的方向,相對於在該第1座標取得步驟中的該工作夾台的方向垂直之狀態,讓該測定器與該工作夾台相對地移動,藉此在平行於該X方向的1條直線上測定包含該被加工物的相向的其他2個該邊的區域之高度來得到位移資訊,並從前述位移資訊取得表示相向的其他2個該邊與該1條直線交叉的2個位置之2個XY座標; 方向取得步驟,從在該第1座標取得步驟中所取得,且表示相向的2個該邊的其中一邊與該2條直線交叉的2個位置之2個XY座標,來取得相向的2個該邊的其中一邊的方向;及 補正座標取得步驟,依據在該方向取得步驟中所取得的該邊的方向,對在該第1座標取得步驟中所取得且表示相向的2個該邊與該2條直線的其中一條直線交叉的2個位置之2個XY座標、與在該第2座標取得步驟中所取得的2個XY座標進行補正,而取得經補正之4個XY座標。 Furthermore, in one aspect of the present invention described above, the acquisition step further includes the following steps: A first coordinate acquisition step, wherein the height of the region including the two opposing sides of the workpiece is measured on two straight lines at different positions in the Y direction and parallel to the X direction by moving the height measuring device and the worktable relative to each other to obtain displacement information, and more than three XY coordinates representing more than three positions where the two opposing sides intersect the two straight lines are obtained from the displacement information; The second coordinate acquisition step is to move the measuring device and the work clamp relative to each other in a state that the direction of the work clamp around the rotation axis perpendicular to the XY plane is perpendicular to the direction of the work clamp in the first coordinate acquisition step, thereby measuring the height of the area including the other two opposing sides of the workpiece on a straight line parallel to the X direction to obtain displacement information, and obtain two XY coordinates representing two positions where the other two opposing sides intersect the one straight line from the above displacement information; The direction acquisition step is to obtain the direction of one of the two opposing sides from the two XY coordinates obtained in the first coordinate acquisition step and representing two positions where one of the two opposing sides intersects the two straight lines; and The coordinate correction step is to correct the two XY coordinates of the two positions where the two sides facing each other and one of the two straight lines intersect, obtained in the first coordinate acquisition step, and the two XY coordinates obtained in the second coordinate acquisition step, according to the direction of the side obtained in the direction acquisition step, to obtain four corrected XY coordinates.

根據本發明之另一個層面,可提供一種被加工物的加工方法,其在使用工作夾台與加工單元來對板狀的被加工物進行加工時使用,前述板狀的被加工物具有具4個邊之矩形狀的第1面、及和該第1面位於相反側之矩形狀的第2面,前述工作夾台具有保持面,前述加工單元對已保持在該工作夾台之該被加工物進行加工,前述被加工物的加工方法包含以下步驟: 取得步驟,在已將該被加工物的該第2面側保持於該工作夾台的該保持面的狀態下,從拍攝包含該被加工物的1個該邊的區域而得到的圖像來取得該邊在平行於該保持面的XY平面內的方向,並從測定包含該被加工物的4個該邊的區域之高度而得到的位移資訊取得表示4個該邊在該XY平面內的位置之4個XY座標;及 加工步驟,依據該邊的方向與該4個XY座標來對該被加工物進行加工。 發明效果 According to another aspect of the present invention, a method for processing a workpiece can be provided, which is used when a workpiece in the form of a plate is processed using a work jig and a processing unit. The plate-shaped workpiece has a rectangular first surface with four sides and a rectangular second surface located on the opposite side of the first surface. The work jig has a holding surface. The processing unit processes the workpiece held on the work jig. The method for processing the workpiece includes the following steps: An acquisition step, in which the direction of one side of the workpiece is acquired in an XY plane parallel to the holding surface from an image obtained by photographing an area including the side of the workpiece while the second side of the workpiece is held on the holding surface of the work clamp, and four XY coordinates representing the positions of the four sides in the XY plane are acquired from displacement information obtained by measuring the height of an area including the four sides of the workpiece; and a processing step, in which the workpiece is processed according to the direction of the side and the four XY coordinates. Effect of the invention

在有關於本發明的一個層面以及另一個層面的被加工物的加工方法中,由於會取得被加工物的第1面所具有的任一個邊的方向、及表示第1面所具有的4個邊的位置之4個XY座標,因此可以依據這些而以高精度來對被加工物進行加工。In the processing method of a workpiece of one layer and another layer of the present invention, since the direction of any edge of the first surface of the workpiece and the four XY coordinates representing the positions of the four edges of the first surface can be obtained, the workpiece can be processed with high precision based on these.

用以實施發明之形態The form used to implement the invention

以下,一邊參照附加圖式一邊針對本發明的實施形態來說明。圖1是顯示在本實施形態中所使用之雷射加工裝置(加工裝置)2的立體圖。再者,在圖1中,已將雷射加工裝置2的一部分的構成要素省略。又,在以下的說明中所使用之X方向(前後方向、加工進給方向)、Y方向(左右方向、分度進給方向)、及Z方向(鉛直方向、切入進給方向)是相互垂直的。Hereinafter, the embodiments of the present invention will be described with reference to the attached drawings. FIG. 1 is a perspective view showing a laser processing device (processing device) 2 used in the present embodiment. In FIG. 1 , some components of the laser processing device 2 are omitted. In addition, the X direction (front-back direction, processing feed direction), the Y direction (left-right direction, indexing feed direction), and the Z direction (vertical direction, cutting feed direction) used in the following description are perpendicular to each other.

如圖1所示,雷射加工裝置2具備有支撐複數個構成要素之基台4。在此基台4的後端部設有朝上方突出之柱狀或壁狀的支撐構造6。又,在基台4的前方的角部設有朝上方突出之柱狀的容置部4a。As shown in Fig. 1, the laser processing device 2 has a base 4 supporting a plurality of components. A columnar or wall-shaped support structure 6 protruding upward is provided at the rear end of the base 4. In addition, a columnar housing portion 4a protruding upward is provided at the front corner of the base 4.

在容置部4a的上表面形成有開口部。在容置部4a的內側形成有透過上表面的開口部和外部相通之空間,且容置有具有大致平坦的上表面之片匣支撐台8、與使片匣支撐台8升降之升降機構(未圖示)。可在從容置部4a的開口部露出之片匣支撐台8的上表面載置片匣10,前述片匣10可以容置複數個被加工物11。An opening is formed on the upper surface of the accommodating portion 4a. A space is formed on the inner side of the accommodating portion 4a that communicates with the outside through the opening of the upper surface, and accommodates a film cassette support platform 8 having a substantially flat upper surface and a lifting mechanism (not shown) for lifting the film cassette support platform 8. A film cassette 10 can be placed on the upper surface of the film cassette support platform 8 exposed from the opening of the accommodating portion 4a, and the aforementioned film cassette 10 can accommodate a plurality of workpieces 11.

被加工物11是例如使用在可見光區中透明的玻璃材料來形成為板狀,且具有具4個邊之矩形狀的第1面(正面)11a、與和第1面11a位於相反側之矩形狀的第2面(背面)11b(參照圖4等)。在此被加工物11的第1面11a以及第2面11b並未設有器件等構造。The workpiece 11 is formed into a plate-like shape using a glass material that is transparent in the visible light region, for example, and has a rectangular first surface (front surface) 11a having four sides and a rectangular second surface (back surface) 11b located on the opposite side of the first surface 11a (see FIG. 4, etc.). The first surface 11a and the second surface 11b of the workpiece 11 are not provided with a device or the like.

又,在被加工物11的第2面11b側貼附有直徑比被加工物11更大的膠帶(切割膠帶)13。膠帶13的外周部分已固定在配置成圍繞被加工物11之環狀的框架15上。亦即,被加工物11成為:以透過膠帶13被框架15所支撐之狀態來容置於片匣10。Furthermore, a tape (cutting tape) 13 having a larger diameter than the workpiece 11 is attached to the second surface 11b of the workpiece 11. The outer peripheral portion of the tape 13 is fixed to a frame 15 arranged in a ring shape around the workpiece 11. That is, the workpiece 11 is accommodated in the cassette 10 in a state of being supported by the frame 15 via the tape 13.

不過,對被加工物11的材質、形狀、構造、大小等並無限制。也可以使用例如,由以矽為代表之半導體、陶瓷、樹脂、金屬等的材料所形成之基板來作為被加工物11。同樣地,在被加工物11中,亦可形成有IC(積體電路,Integrated Circuit)或LED(發光二極體,Light Emitting Diode)等的器件。此外,被加工物11亦可為未透過膠帶13被支撐於框架15。However, there is no limitation on the material, shape, structure, size, etc. of the workpiece 11. For example, a substrate formed of a semiconductor material represented by silicon, ceramics, resin, metal, etc. may be used as the workpiece 11. Similarly, a device such as an IC (Integrated Circuit) or an LED (Light Emitting Diode) may be formed in the workpiece 11. In addition, the workpiece 11 may be supported on the frame 15 without being supported by the tape 13.

在相鄰於容置部4a的位置配置有對位單元12,前述對位單元12可以讓支撐被加工物11之框架15的大致的位置對齊。對位單元12包含例如一邊維持相對於Y方向平行的狀態一邊接近以及遠離的一對導軌。各導軌具有支撐框架15的底面、及相對於此底面垂直的側面。A positioning unit 12 is disposed adjacent to the accommodating portion 4a. The positioning unit 12 can align the approximate position of the frame 15 supporting the workpiece 11. The positioning unit 12 includes, for example, a pair of guide rails that approach and move away while maintaining a parallel state relative to the Y direction. Each guide rail has a bottom surface supporting the frame 15 and a side surface perpendicular to the bottom surface.

例如,可以藉由將已從片匣10搬出之框架15載置於對位單元12的導軌,且以此導軌在X方向上將框架15夾入,而讓框架15(亦即被加工物11)對齊於預定的位置。在對位單元12的上方,配置有用於搬送框架15之搬送單元14。For example, the frame 15 removed from the film magazine 10 can be placed on the guide rail of the alignment unit 12 and the frame 15 can be clamped in the X direction by the guide rail to align the frame 15 (i.e., the workpiece 11) at a predetermined position. Above the alignment unit 12, a conveying unit 14 for conveying the frame 15 is arranged.

在對位單元12的側邊的區域配置有移動機構(加工進給機構、分度進給機構)16。移動機構16具備有固定在基台4的上表面且相對於Y方向大致平行的一對Y軸導軌18。在Y軸導軌18,以可以滑動的態樣安裝有Y軸移動工作台20。A moving mechanism (processing feed mechanism, indexing feed mechanism) 16 is arranged in the area on the side of the positioning unit 12. The moving mechanism 16 has a pair of Y-axis guide rails 18 fixed to the upper surface of the base 4 and substantially parallel to the Y direction. A Y-axis moving table 20 is slidably mounted on the Y-axis guide rails 18.

在Y軸移動工作台20的下表面側設有螺帽部(未圖示)。在此螺帽部,以可以旋轉的態樣連結有相對於Y軸導軌18大致平行的Y軸滾珠螺桿22。在Y軸滾珠螺桿22的一端部連結有Y軸脈衝馬達24。只要以Y軸脈衝馬達24使Y軸滾珠螺桿22旋轉,Y軸移動工作台20即沿著Y軸導軌18在Y方向上移動。A nut portion (not shown) is provided on the lower surface of the Y-axis moving table 20. A Y-axis ball screw 22 roughly parallel to the Y-axis guide rail 18 is rotatably connected to the nut portion. A Y-axis pulse motor 24 is connected to one end of the Y-axis ball screw 22. As long as the Y-axis pulse motor 24 rotates the Y-axis ball screw 22, the Y-axis moving table 20 moves in the Y direction along the Y-axis guide rail 18.

在Y軸移動工作台20的上表面固定有大致平行於X方向的一對X軸導軌26。在X軸導軌26,以可以滑動的態樣安裝有X軸移動工作台28。在X軸移動工作台28的下表面側設有螺帽部(未圖示)。A pair of X-axis guide rails 26 substantially parallel to the X direction are fixed to the upper surface of the Y-axis moving table 20. An X-axis moving table 28 is slidably mounted on the X-axis guide rails 26. A nut portion (not shown) is provided on the lower surface side of the X-axis moving table 28.

在此螺帽部,以可以旋轉的態樣連結有相對於X軸導軌26大致平行的X軸滾珠螺桿30。在X軸滾珠螺桿30的一端部連結有X軸脈衝馬達32。只要以X軸脈衝馬達32使X軸滾珠螺桿30旋轉,X軸移動工作台28即沿著X軸導軌26在X方向上移動。The nut portion is rotatably connected to an X-axis ball screw 30 that is substantially parallel to the X-axis guide rail 26. An X-axis pulse motor 32 is connected to one end of the X-axis ball screw 30. When the X-axis pulse motor 32 rotates the X-axis ball screw 30, the X-axis moving table 28 moves in the X-direction along the X-axis guide rail 26.

在X軸移動工作台28的上表面側設有θ工作台34。θ工作台34包含構成為可以繞著相對於Z方向大致平行的旋轉軸旋轉之工作台基座34a(參照圖4等)、及連結於工作台基座34a之馬達等的旋轉驅動源(未圖示)。可在工作台基座34a的上表面固定工作夾台36。A θ table 34 is provided on the upper surface side of the X-axis moving table 28. The θ table 34 includes a table base 34a (see FIG. 4 etc.) configured to be rotatable around a rotation axis substantially parallel to the Z direction, and a rotation drive source (not shown) such as a motor connected to the table base 34a. A work clamp 36 can be fixed on the upper surface of the table base 34a.

工作夾台36包含例如使用以不鏽鋼為代表之金屬而形成的圓盤狀的框體38(參照圖4等)。在框體38的上表面側形成有在上端具有圓形的開口之凹部38a(參照圖4等)。於此凹部38a固定有使用陶瓷等且形成為多孔質的圓盤狀之保持板40(參照圖4等)。保持板40的上表面相對於X方向及Y方向大致平行,並且成為隔著膠帶13來保持被加工物11的第2面11b側之保持面40a。The work clamp 36 includes a disc-shaped frame 38 (see FIG. 4, etc.) formed of a metal such as stainless steel. A recess 38a (see FIG. 4, etc.) having a circular opening at the upper end is formed on the upper surface side of the frame 38. A retaining plate 40 (see FIG. 4, etc.) formed of a porous disc and made of ceramic or the like is fixed to the recess 38a. The upper surface of the retaining plate 40 is substantially parallel to the X direction and the Y direction, and serves as a retaining surface 40a that retains the second surface 11b side of the workpiece 11 via the tape 13.

保持板40的下表面側已透過設置於框體38的內部之流路38b、或閥(未圖示)等而連接於噴射器等的吸引源(未圖示)。因此,只要使膠帶13接觸於保持面40a,並開啟閥且使吸引源的負壓作用,被加工物11即隔著膠帶13被吸引於工作夾台36。在工作夾台36的周圍配置有可以從四方將支撐被加工物11之環狀的框架15固定的4個夾具42。The lower surface of the holding plate 40 is connected to a suction source (not shown) such as an ejector through a flow path 38b or a valve (not shown) provided inside the frame 38. Therefore, as long as the tape 13 is brought into contact with the holding surface 40a, the valve is opened, and the negative pressure of the suction source is applied, the workpiece 11 is attracted to the work clamp 36 through the tape 13. Four clamps 42 are arranged around the work clamp 36 to fix the annular frame 15 supporting the workpiece 11 from all sides.

在支撐構造6設置有從其前表面突出之支撐臂6a。在支撐臂6a的前端部配置有照射頭(加工單元)44。此照射頭44會例如將以雷射振盪器(加工單元)(未圖示)所脈衝振盪產生之雷射光束44a(參照圖8)朝下方的對象照射。A support arm 6a protruding from the front surface of the support structure 6 is provided. An irradiation head (processing unit) 44 is arranged at the front end of the support arm 6a. The irradiation head 44 irradiates a laser beam 44a (see FIG. 8 ) generated by pulse oscillation of a laser oscillator (processing unit) (not shown) toward an object below.

雖然對雷射振盪器所生成的雷射光束44a之波長並無特別的限制,但在本實施形態中,所使用的是可以生成穿透被加工物11之波長的雷射光束44a(穿透性的雷射光束44a)的雷射振盪器。可藉由讓這種波長的雷射光束44a藉由例如照射頭44來聚光於被加工物11的內部,而將被加工物11的內部改質。Although there is no particular limitation on the wavelength of the laser beam 44a generated by the laser oscillator, in the present embodiment, a laser oscillator is used that can generate a laser beam 44a (a penetrating laser beam 44a) of a wavelength that can penetrate the workpiece 11. By focusing the laser beam 44a of such a wavelength on the inside of the workpiece 11 through, for example, the irradiation head 44, the inside of the workpiece 11 can be modified.

在照射頭44的X方向的一側的區域配置有相機(拍攝單元)46。相機46包含例如對可見光區之光具有感光度之CMOS(互補式金屬氧化物半導體,Complementary Metal Oxide Semiconductor)影像感測器或CCD(電荷耦合器件,Charge Coupled Device)影像感測器等之2維光感測器、及成像用的透鏡,且可拍攝已被工作夾台36所保持之被加工物11的上表面側(第1面11a側),並生成拍到被加工物11之圖像。A camera (photographing unit) 46 is disposed in a region on one side of the irradiation head 44 in the X direction. The camera 46 includes a two-dimensional photo sensor such as a CMOS (Complementary Metal Oxide Semiconductor) image sensor or a CCD (Charge Coupled Device) image sensor that is sensitive to light in the visible light region, and an imaging lens, and can photograph the upper surface side (first surface 11a side) of the workpiece 11 held by the workpiece 36, and generate an image of the workpiece 11.

在相機46的X方向的一側的區域,配置有以雷射光束來測定到對象的距離之光學式的位移測定器(測定器)48。此位移測定器48包含例如對下方的對象照射雷射光束48a(參照圖4)之照射單元、與接收在對象上反射之雷射光束48a的光接收單元,並可測定已被工作夾台36所保持之被加工物11的上表面(第1面11a)的高度等,來生成有關於位移之資訊(以下為位移資訊)。An optical displacement measuring device (measurer) 48 for measuring the distance to an object by a laser beam is arranged in a region on one side of the camera 46 in the X direction. The displacement measuring device 48 includes, for example, an irradiation unit for irradiating a laser beam 48a (see FIG. 4 ) to an object below, and a light receiving unit for receiving the laser beam 48a reflected by the object, and can measure the height of the upper surface (first surface 11a) of the workpiece 11 held by the work clamp 36, and generate information on displacement (hereinafter referred to as displacement information).

使片匣支撐台8升降之升降機構、對位單元12、搬送單元14、移動機構16的Y軸脈衝馬達24以及X軸脈衝馬達32、θ工作台34的旋轉驅動源、連接於工作夾台36的閥、照射頭44或雷射振盪器、相機46、位移測定器48等的構成要素已分別連接於控制單元50。控制單元50會配合被加工物11的加工所需之一連串的工序來控制上述的各構成要素。The components such as the lifting mechanism for lifting and lowering the magazine support table 8, the alignment unit 12, the conveying unit 14, the Y-axis pulse motor 24 and the X-axis pulse motor 32 of the moving mechanism 16, the rotation drive source of the θ table 34, the valve connected to the work clamp 36, the irradiation head 44 or the laser oscillator, the camera 46, and the displacement measuring device 48 are respectively connected to the control unit 50. The control unit 50 controls the above-mentioned components in accordance with a series of processes required for processing the workpiece 11.

控制單元50可為例如電腦,前述電腦包含藉由CPU(中央處理單元,Central Processing Unit)等之處理裝置所構成的運算部50a、與藉由DRAM(動態隨機存取記憶體,Dynamic Random Access Memory)等之主記憶裝置或快閃記憶體等之輔助記憶裝置所構成的記憶部50b。藉由依照記憶於記憶部50b之軟體來使運算部50a等動作,可實現控制單元50的功能。不過,控制單元50的功能亦可僅藉由硬體來實現。The control unit 50 may be, for example, a computer, which includes a computing unit 50a formed by a processing device such as a CPU (Central Processing Unit), and a memory unit 50b formed by a main memory device such as a DRAM (Dynamic Random Access Memory) or an auxiliary memory device such as a flash memory. The functions of the control unit 50 can be realized by operating the computing unit 50a and the like according to the software stored in the memory unit 50b. However, the functions of the control unit 50 may also be realized only by hardware.

例如,可將已從上述之片匣10搬出,並以對位單元12對齊於預定的位置之被加工物11(框架15),以搬送單元14搬入到工作夾台36,並藉由保持面40a來保持該第2面11b側。此時,也會起因於已貼附於被加工物11之膠帶13的位置的精度、或由搬送單元14所進行之搬送動作的精度等,而常有以下情形:在實際上搬入工作夾台36之被加工物11的位置、與作為目標之被加工物11的位置之間產生偏離。For example, the workpiece 11 (frame 15) that has been taken out of the above-mentioned film cassette 10 and aligned at a predetermined position by the alignment unit 12 can be moved into the work clamp 36 by the conveying unit 14, and the second surface 11b side can be held by the holding surface 40a. At this time, due to the accuracy of the position of the tape 13 attached to the workpiece 11 or the accuracy of the conveying operation performed by the conveying unit 14, the following situation often occurs: the position of the workpiece 11 actually moved into the work clamp 36 is offset from the target position of the workpiece 11.

於是,在本實施形態中,會在以可以排除像這樣的位置的偏離的影響的方式來取得被加工物11的方向或位置等的資訊後,再對被加工物11進行加工。圖2是顯示本實施形態之被加工物的加工方法的流程圖。如圖2所示,在本實施形態之被加工物的加工方法中,首先是進行方向取得步驟ST11,前述方向取得步驟ST11是取得被加工物11的第1面11a所具有之邊的方向。圖3是顯示方向取得步驟ST11之概要的平面圖。再者,在圖3中,已將膠帶13等的一部分的要素省略。Therefore, in the present embodiment, the object 11 is processed after obtaining information such as the direction or position of the object 11 in a manner that eliminates the influence of such positional deviation. FIG. 2 is a flow chart showing the method for processing the object of the present embodiment. As shown in FIG. 2, in the method for processing the object of the present embodiment, the direction obtaining step ST11 is first performed. The direction obtaining step ST11 is to obtain the direction of the edge of the first surface 11a of the object 11. FIG. 3 is a plan view showing an overview of the direction obtaining step ST11. In addition, in FIG. 3, some elements such as the tape 13 have been omitted.

在方向取得步驟ST11中,首先會測定包含被加工物11的至少1個邊11c的區域之高度來得到位移資訊,並從前述位移資訊來計算表示此邊11c的位置之XY座標。圖4是顯示測定被加工物11的高度之情形的側面圖。再者,在圖4中是將一部分的要素以剖面來顯示。In the direction acquisition step ST11, the height of the region including at least one side 11c of the workpiece 11 is first measured to obtain displacement information, and the XY coordinates representing the position of the side 11c are calculated from the displacement information. FIG4 is a side view showing the state of measuring the height of the workpiece 11. In addition, FIG4 shows a part of the elements in cross section.

例如,如圖4所示,控制單元50一邊使保持有被加工物11之狀態的工作夾台36朝X方向移動,一邊使位移測定器48作動,來得到X方向上的位置與高度之關係。亦即,控制單元50會使位移測定器48與工作夾台36相對地移動,而在平行於X方向的直線上測定包含被加工物11的邊11c的區域之高度。For example, as shown in Fig. 4, the control unit 50 moves the worktable 36 holding the workpiece 11 in the X direction while actuating the displacement measuring device 48 to obtain the relationship between the position and the height in the X direction. That is, the control unit 50 moves the displacement measuring device 48 and the worktable 36 relative to each other and measures the height of the area including the side 11c of the workpiece 11 on a straight line parallel to the X direction.

圖5是顯示藉由此測定所得到的位移資訊之例的圖形。如上述,若使位移測定器48與工作夾台36相對地移動,而在平行於X方向的直線上測定包含被加工物11的邊11c的區域之高度後,即可沿著此直線得到相當於被加工物11的厚度之輪廓的位移資訊。所得到之位移資訊會被記憶於記憶部50b。FIG5 is a diagram showing an example of displacement information obtained by such measurement. As described above, if the displacement measuring device 48 and the work clamp 36 are moved relative to each other, and the height of the area including the side 11c of the workpiece 11 is measured on a straight line parallel to the X direction, displacement information of the contour corresponding to the thickness of the workpiece 11 can be obtained along the straight line. The obtained displacement information is stored in the memory unit 50b.

更具體而言,首先會沿著圖3所示之第1直線21a來測定包含被加工物11的邊11c的區域之高度。在此,在第1直線21a與邊11c之交叉的位置A之高度、與相鄰於位置A之被加工物11的外部的位置之高度之間,會存在大的差距(高低差)。More specifically, the height of the region including the side 11c of the workpiece 11 is first measured along the first straight line 21a shown in Fig. 3. Here, there is a large difference (height difference) between the height of the position A where the first straight line 21a and the side 11c intersect and the height of the position outside the workpiece 11 adjacent to the position A.

據此,如圖5所示,可以藉由從所得到的位移資訊提取高低差大的位置,來計算位置A的X座標(X 1)。再者,相對於X方向平行的第1直線21a上的任意的位置之Y座標是任一個位置皆相等。因此,可以藉由使用表示測定時的Y軸移動工作台20(工作夾台36)的位置之資訊等,來計算位置A之Y座標(Y 1)。 Accordingly, as shown in FIG5 , the X coordinate (X 1 ) of position A can be calculated by extracting the position with the largest height difference from the obtained displacement information. Furthermore, the Y coordinate of any position on the first straight line 21 a parallel to the X direction is equal to any position. Therefore, the Y coordinate (Y 1 ) of position A can be calculated by using information indicating the position of the Y-axis moving table 20 (work clamp 36) during measurement.

亦即,運算部50a會使用藉由測定而得到的位移資訊,來計算第1直線21a與邊11c交叉之位置A之X座標(X 1),並使用表示測定時的Y軸移動工作台20的位置之資訊等,來計算位置A之Y座標(Y 1)。所計算出之位置A的座標(X 1‚Y 1)會記憶於記憶部50b。 That is, the calculation unit 50a uses the displacement information obtained by the measurement to calculate the X coordinate ( X1 ) of the position A where the first straight line 21a intersects the side 11c, and uses the information indicating the position of the Y-axis moving table 20 during the measurement to calculate the Y coordinate ( Y1 ) of the position A. The calculated coordinates ( X1 , Y1 ) of the position A are stored in the storage unit 50b.

在沿著第1直線21a測定包含被加工物11的邊11c的區域之高度後,在使工作夾台36(Y軸移動工作台20)朝Y方向移動後,進行同樣的測定。亦即,沿著通過在Y方向上和第1直線21a不同的位置且平行於X方向的第2直線21b,來測定包含被加工物11的邊11c的區域之高度。After measuring the height of the area including the side 11c of the workpiece 11 along the first straight line 21a, the work table 36 (Y-axis moving table 20) is moved in the Y direction and the same measurement is performed. That is, the height of the area including the side 11c of the workpiece 11 is measured along the second straight line 21b that passes through a position different from the first straight line 21a in the Y direction and is parallel to the X direction.

然後,運算部50a會使用藉由測定而得到的位移資訊,來計算第2直線21b與邊11c交叉之位置B之X座標(X 2),並使用表示測定時的Y軸移動工作台20(工作夾台36)的位置之資訊等,來計算位置B之Y座標(Y 2)。所計算出之位置B的座標(X 2‚Y 2)會記憶於記憶部50b。 Then, the calculation unit 50a uses the displacement information obtained by the measurement to calculate the X coordinate (X 2 ) of the position B where the second straight line 21b intersects the side 11c, and uses the information indicating the position of the Y-axis moving table 20 (work clamp 36) during the measurement to calculate the Y coordinate (Y 2 ) of the position B. The calculated coordinates (X 2 ‚Y 2 ) of the position B are stored in the storage unit 50b.

再者,在本實施形態中,雖然是將工作夾台36的旋轉軸、與相對於保持面40a平行的XY平面相交之位置設為原點(O)來計算表示各位置的座標,但亦可將其他的位置設定為座標系統的原點。Furthermore, in this embodiment, although the position where the rotation axis of the work clamp 36 intersects with the XY plane parallel to the holding surface 40a is set as the origin (O) to calculate the coordinates representing each position, other positions may be set as the origin of the coordinate system.

已計算出表示位置A之座標(X 1‚Y 1)與表示位置B之座標(X 2‚Y 2)之後,使用這些來取得相對於保持面40a平行之XY平面內的邊11c的方向。例如,運算部50a會對位置A之座標(X 1‚Y 1)與位置B之座標(X 2‚Y 2)適用三角形法,來計算邊11c與Y方向所成的角度(θ 1)。所計算出的角度(θ 1)會作為邊11c的方向而記憶於記憶部50b。 After the coordinates (X 1 ‚Y 1 ) indicating the position A and the coordinates (X 2 ‚Y 2 ) indicating the position B are calculated, these are used to obtain the direction of the side 11c in the XY plane parallel to the holding surface 40a. For example, the calculation unit 50a applies the triangulation method to the coordinates (X 1 ‚Y 1 ) of the position A and the coordinates (X 2 ‚Y 2 ) of the position B to calculate the angle (θ 1 ) formed by the side 11c and the Y direction. The calculated angle (θ 1 ) is stored in the storage unit 50b as the direction of the side 11c.

再者,運算部50a亦可計算邊11c與X方向所成的角來作為邊11c的方向。又,在本實施形態中,雖然是使用第1直線21a與邊11c交叉之位置A之座標、與第2直線21b與邊11c交叉之位置B之座標,來取得邊11c的方向,但亦可例如使用相向於邊11c之邊11d上的2個位置之座標來取得邊11d的方向。Furthermore, the calculation unit 50a may also calculate the angle between the side 11c and the X direction as the direction of the side 11c. In addition, in the present embodiment, although the direction of the side 11c is obtained by using the coordinates of the position A where the first straight line 21a and the side 11c intersect and the coordinates of the position B where the second straight line 21b and the side 11c intersect, the direction of the side 11d may be obtained by using the coordinates of two positions on the side 11d facing the side 11c.

如圖2所示,在方向取得步驟ST11之後,會進行第1座標取得步驟ST12,前述第1座標取得步驟ST12會取得在相對於保持面40a平行的XY平面內表示被加工物11之相向的2個邊的位置之2個座標。圖6是顯示第1座標取得步驟ST12之概要的平面圖。再者,在圖6中也是將膠帶13等的一部分的要素省略。As shown in FIG2, after the direction acquisition step ST11, the first coordinate acquisition step ST12 is performed. The first coordinate acquisition step ST12 acquires two coordinates representing the positions of two opposing sides of the workpiece 11 in the XY plane parallel to the holding surface 40a. FIG6 is a plan view showing an overview of the first coordinate acquisition step ST12. In FIG6, some elements such as the tape 13 are omitted.

在第1座標取得步驟ST12中,首先控制單元50會將工作夾台36的方向以繞著相對於XY平面垂直的旋轉軸的方式來調整,以使得在方向取得步驟ST11中所取得之邊11c的方向成為相對於Y方向平行。亦即,從圖3所示之狀態,使工作夾台36旋轉相當於θ 1之角度(在本實施形態中,是在平面視角下朝順時針方向θ 1之角度)。藉此,被加工物11的相向之邊11c以及邊11d會成為相對於Y方向平行。 In the first coordinate acquisition step ST12, the control unit 50 first adjusts the direction of the work clamp 36 around the rotation axis perpendicular to the XY plane so that the direction of the side 11c acquired in the direction acquisition step ST11 becomes parallel to the Y direction. That is, from the state shown in FIG. 3, the work clamp 36 is rotated by an angle equivalent to θ1 (in this embodiment, it is an angle of θ1 in the clockwise direction in the plane viewing angle). Thereby, the opposite sides 11c and 11d of the workpiece 11 become parallel to the Y direction.

之後,控制單元50一邊使保持有被加工物11之狀態的工作夾台36朝X方向移動,一邊使位移測定器48作動,來得到X方向上的位置與高度之關係。亦即,使位移測定器48與工作夾台36相對地移動,而在平行於X方向的直線上測定包含被加工物11的相向的2個邊11c以及邊11d的區域之高度。所得到之位移資訊會被記憶於記憶部50b。After that, the control unit 50 moves the worktable 36 holding the workpiece 11 in the X direction while actuating the displacement measuring device 48 to obtain the relationship between the position and the height in the X direction. That is, the displacement measuring device 48 and the worktable 36 are moved relative to each other, and the height of the area including the two opposing sides 11c and the side 11d of the workpiece 11 is measured on a straight line parallel to the X direction. The obtained displacement information is stored in the memory unit 50b.

更具體而言,首先會沿著圖6所示之第3直線21c來測定包含被加工物11的相向的邊11c以及邊11d的區域之高度。在此,在第3直線21c與邊11c交叉的位置C1之高度、與在被加工物11的外部相鄰於位置C1的位置之高度之間,會存在大的差距。又,在第3直線21c與邊11d交叉的位置C2之高度、與在被加工物11的外部相鄰於位置C2的位置之高度之間,會存在大的差距。More specifically, the height of the region including the opposing sides 11c and 11d of the workpiece 11 is first measured along the third straight line 21c shown in FIG6 . Here, there is a large difference between the height of the position C1 where the third straight line 21c intersects the side 11c and the height of the position adjacent to the position C1 outside the workpiece 11. Also, there is a large difference between the height of the position C2 where the third straight line 21c intersects the side 11d and the height of the position adjacent to the position C2 outside the workpiece 11.

據此,可以藉由從所得到的位移資訊中提取高低差大的位置,來計算位置C1的X座標(X 31)與位置C2的X座標(X 32)。再者,相對於X方向平行的第3直線21c上之任意的位置之Y座標是任一個位置皆相等。因此,可以藉由使用表示測定時的Y軸移動工作台20(工作夾台36)的位置之資訊等,來計算位置C1以及位置C2之Y座標(Y 3)。 Based on this, the X coordinate (X 31 ) of position C1 and the X coordinate (X 32 ) of position C2 can be calculated by extracting the position with the largest height difference from the obtained displacement information. Furthermore, the Y coordinate of any position on the third straight line 21c parallel to the X direction is equal to any position. Therefore, the Y coordinate (Y 3 ) of position C1 and position C2 can be calculated by using information indicating the position of the Y-axis moving table 20 (work clamp 36) during measurement.

亦即,運算部50a會使用藉由測定而得到的位移資訊,來計算第3直線21c與邊11c交叉之位置C1之X座標(X 31),並使用表示測定時的Y軸移動工作台20的位置之資訊等,來計算位置C1之Y座標(Y 3)。所計算出之位置C1之座標(X 31‚Y 3)會記憶於記憶部50b。 That is, the calculation unit 50a uses the displacement information obtained by the measurement to calculate the X coordinate (X 31 ) of the position C1 where the third straight line 21c intersects the side 11c, and uses the information indicating the position of the Y-axis moving table 20 during the measurement to calculate the Y coordinate (Y 3 ) of the position C1. The calculated coordinates (X 31 ‚Y 3 ) of the position C1 are stored in the storage unit 50b.

又,運算部50a會使用藉由測定而得到的位移資訊,來計算第3直線21c與邊11d交叉之位置C2之X座標(X 32),並使用表示測定時的Y軸移動工作台20的位置之資訊等,來計算位置C2之Y座標(Y 3)。所計算出之位置C2之座標(X 32‚Y 3)會記憶於記憶部50b。 Furthermore, the calculation unit 50a calculates the X coordinate (X 32 ) of the position C2 where the third straight line 21c intersects the side 11d using the displacement information obtained by the measurement, and calculates the Y coordinate (Y 3 ) of the position C2 using the information indicating the position of the Y-axis moving table 20 during the measurement. The calculated coordinates (X 32 ‚Y 3 ) of the position C2 are stored in the storage unit 50b.

如圖2所示,在第1座標取得步驟ST12之後,會進行第2座標取得步驟ST13,前述第2座標取得步驟ST13會取得在相對於保持面40a平行的XY平面內表示被加工物11之相向的其他2個邊的位置之2個座標。圖7是顯示第2座標取得步驟ST13之概要的平面圖。再者,在圖7中也是將膠帶13等的一部分的要素省略。As shown in FIG2, after the first coordinate acquisition step ST12, the second coordinate acquisition step ST13 is performed. The second coordinate acquisition step ST13 acquires two coordinates representing the positions of the other two opposing sides of the workpiece 11 in the XY plane parallel to the holding surface 40a. FIG7 is a plan view showing the outline of the second coordinate acquisition step ST13. In FIG7, some elements such as the tape 13 are omitted.

在第2座標取得步驟ST13中,首先控制單元50會將工作夾台36的方向以繞著相對於XY平面垂直的旋轉軸的方式來調整,以使得在方向取得步驟ST11中所取得之邊11c的方向成為相對於Y方向垂直。亦即,從圖6所示之狀態,使工作夾台36旋轉相當於90°之角度(在本實施形態中,是在平面視角下朝順時針方向90°之角度)。藉此,被加工物11的相向之邊11e以及邊11f即成為相對於Y方向平行。In the second coordinate acquisition step ST13, the control unit 50 first adjusts the direction of the work clamp 36 around the rotation axis perpendicular to the XY plane so that the direction of the side 11c acquired in the direction acquisition step ST11 becomes perpendicular to the Y direction. That is, from the state shown in FIG. 6, the work clamp 36 is rotated by an angle of 90° (in the present embodiment, an angle of 90° in the clockwise direction in a plane view). In this way, the opposite sides 11e and 11f of the workpiece 11 become parallel to the Y direction.

之後,控制單元50一邊使保持有被加工物11之狀態的工作夾台36朝X方向移動,一邊使位移測定器48作動,來得到X方向上的位置與高度之關係。亦即,使位移測定器48與工作夾台36相對地移動,而在平行於X方向的直線上測定包含被加工物11之相向的其他2個邊11e及邊11f的區域之高度。所得到之位移資訊會被記憶於記憶部50b。After that, the control unit 50 moves the worktable 36 holding the workpiece 11 in the X direction while actuating the displacement measuring device 48 to obtain the relationship between the position and the height in the X direction. That is, the displacement measuring device 48 and the worktable 36 are moved relative to each other, and the height of the area including the other two sides 11e and 11f of the workpiece 11 facing each other is measured on a straight line parallel to the X direction. The obtained displacement information is stored in the memory unit 50b.

更具體而言,首先會沿著圖7所示之第4直線21d來測定包含被加工物11之相向的邊11e以及邊11f的區域之高度。在此,在第4直線21d與邊11e交叉的位置D1之高度、與在被加工物11的外部相鄰於位置D1的位置之高度之間,會存在大的差距。又,在第4直線21d與邊11f交叉的位置D2之高度、與在被加工物11的外部相鄰於位置D2的位置之高度之間,會存在大的差距。More specifically, the height of the region including the opposite sides 11e and 11f of the workpiece 11 is first measured along the fourth straight line 21d shown in FIG7 . Here, there is a large difference between the height of the position D1 where the fourth straight line 21d intersects the side 11e and the height of the position adjacent to the position D1 outside the workpiece 11. Also, there is a large difference between the height of the position D2 where the fourth straight line 21d intersects the side 11f and the height of the position adjacent to the position D2 outside the workpiece 11.

據此,可以藉由從所得到的位移資訊中提取高低差大的位置,來計算位置D1之X座標(X 41)與位置D2之X座標(X 42)。再者,相對於X方向平行的第4直線21d上之任意的位置之Y座標是任一個位置皆相等。因此,可以藉由使用表示測定時的Y軸移動工作台20(工作夾台36)的位置之資訊等,來計算位置D1以及位置D2之Y座標(Y 4)。 Based on this, the X coordinate ( X41 ) of position D1 and the X coordinate ( X42 ) of position D2 can be calculated by extracting the position with the largest height difference from the obtained displacement information. Furthermore, the Y coordinate of any position on the fourth straight line 21d parallel to the X direction is equal to any position. Therefore, the Y coordinate ( Y4 ) of position D1 and position D2 can be calculated by using information indicating the position of the Y-axis moving table 20 (work clamp 36) during measurement.

亦即,運算部50a會使用藉由測定而得到的位移資訊,來計算第4直線21d與邊11e交叉之位置D1之X座標(X 41),並使用表示測定時的Y軸移動工作台20的位置之資訊等,來計算位置D1之Y座標(Y 4)。所計算出之位置D1之座標(X 41‚Y 4)會記憶於記憶部50b。 That is, the calculation unit 50a uses the displacement information obtained by the measurement to calculate the X coordinate ( X41 ) of the position D1 where the fourth straight line 21d intersects the side 11e, and uses the information indicating the position of the Y-axis moving table 20 during the measurement to calculate the Y coordinate ( Y4 ) of the position D1. The calculated coordinates ( X41 , Y4 ) of the position D1 are stored in the storage unit 50b.

又,運算部50a會使用藉由測定而得到的位移資訊,來計算第4直線21d與邊11f交叉之位置D2之X座標(X 42),並使用表示測定時的Y軸移動工作台20的位置之資訊等,來計算位置D2之Y座標(Y 4)。所計算出之位置D2之座標(X 42‚Y 4)會記憶於記憶部50b。 Furthermore, the calculation unit 50a uses the displacement information obtained by the measurement to calculate the X coordinate ( X42 ) of the position D2 where the fourth straight line 21d intersects the side 11f, and uses the information indicating the position of the Y-axis moving table 20 during the measurement to calculate the Y coordinate ( Y4 ) of the position D2. The calculated coordinates ( X42 , Y4 ) of the position D2 are stored in the storage unit 50b.

如上述,在沿著第3直線21c測定了被加工物11的高度後,在沿著第4直線21d測定被加工物11的高度時,使工作夾台36旋轉相當於90°之角度。因此,即使直接使用位置C1之座標(X 31,Y 3)以及位置C2之座標(X 32 Y 3)、與位置D1之座標(X 41,Y 4)以及位置D2之座標(X 42,Y 4),仍未能合宜地表現被加工物11的位置。 As described above, after the height of the workpiece 11 is measured along the third straight line 21c, the worktable 36 is rotated by an angle equivalent to 90° when the height of the workpiece 11 is measured along the fourth straight line 21d. Therefore, even if the coordinates ( X31 , Y3 ) of the position C1 and the coordinates ( X32 , Y3 ) of the position C2, and the coordinates ( X41 , Y4 ) of the position D1 and the coordinates ( X42 , Y4) of the position D2 are directly used , the position of the workpiece 11 cannot be properly expressed.

於是,如圖2所示,在第2座標取得步驟ST13之後,會進行補正座標取得步驟ST14,前述補正座標取得步驟ST14會補正位置C1之座標(X 31,Y 3)以及位置C2之座標(X 32,Y 3)、與位置D1之座標(X 41,Y 4)以及位置D2之座標(X 42,Y 4)的其中一者來取得補正座標。 Therefore, as shown in FIG. 2 , after the second coordinate acquisition step ST13 , a correction coordinate acquisition step ST14 is performed. The correction coordinate acquisition step ST14 corrects the coordinates (X 31 , Y 3 ) of position C1 and the coordinates (X 32 , Y 3 ) of position C2, and one of the coordinates (X 41 , Y 4 ) of position D1 and the coordinates (X 42 , Y 4 ) of position D2 to obtain the correction coordinates.

具體而言,是例如運算部50a施行使位置D1之座標(X 41,Y 4)以及位置D2之座標(X 42,Y 4)的每一個座標旋轉相當於-90°之角度(在本實施形態中,是在平面視角下朝逆時針方向90°之角度)之運算處理,而取得補正後的位置D1之座標以及位置D2之座標(補正座標)。所取得之補正後的位置D1之座標以及位置D2之座標會記憶於記憶部50b。 Specifically, for example, the calculation unit 50a performs a calculation process to rotate the coordinates of the position D1 ( X41 , Y4 ) and the coordinates of the position D2 ( X42 , Y4 ) by an angle equivalent to -90° (in this embodiment, an angle of 90° in the counterclockwise direction in a plane view), and obtains the corrected coordinates of the position D1 and the coordinates of the position D2 (corrected coordinates). The obtained corrected coordinates of the position D1 and the coordinates of the position D2 are stored in the storage unit 50b.

對雷射加工裝置2的控制單元50而言,被加工物11的形狀(第1面11a之形狀)是已知的。因此,控制單元50可以藉由如此進行而得到之補正後的位置D1之座標以及位置D2之座標、和上述之位置C1之座標(X 31,Y 3)以及位置C2之座標(X 32, Y 3),來合宜地掌握被加工物11的位置。 The shape of the workpiece 11 (the shape of the first surface 11a) is known to the control unit 50 of the laser processing device 2. Therefore, the control unit 50 can appropriately grasp the position of the workpiece 11 by using the coordinates of the position D1 and the coordinates of the position D2 obtained after correction and the coordinates of the position C1 ( X31 , Y3 ) and the coordinates of the position C2 ( X32 , Y3 ) mentioned above.

再者,在本實施形態中,雖然已取得經補正之位置D1之座標以及位置D2之座標,但亦可取得經補正之位置C1之座標以及位置C2之座標。在此情況下,會成為如下之情形:與位置D1之座標(X 41,Y 4)以及位置D2的座標(X 42,Y 4)相應,來施行使位置C1之座標(X 31,Y 3)以及位置C2之座標(X 32,Y 3)的每一個座標旋轉相當於90°之角度(在本實施形態中,是在平面視角下朝順時針方向90°之角度)之運算處理。 Furthermore, in the present embodiment, although the coordinates of the position D1 and the coordinates of the position D2 are obtained after correction, the coordinates of the position C1 and the coordinates of the position C2 may also be obtained after correction. In this case, the following situation will be achieved: corresponding to the coordinates of the position D1 ( X41 , Y4 ) and the coordinates of the position D2 ( X42 , Y4 ), the operation processing of rotating each of the coordinates of the position C1 ( X31 , Y3 ) and the coordinates of the position C2 ( X32 , Y3 ) by an angle equivalent to 90° (in the present embodiment, an angle of 90° in the clockwise direction in a plane viewing angle) is performed.

在補正座標取得步驟ST14之後,會進行加工步驟ST15,前述加工步驟ST15會利用在上述之一連串的取得步驟(方向取得步驟ST11、第1座標取得步驟ST12、第2座標取得步驟ST13以及補正座標取得步驟ST14)中所取得之有關於被加工物11的位置以及方向之資訊來對被加工物11進行加工。亦即,在加工步驟ST15中,會依據邊的方向、與表示各邊的位置之4個XY座標來對被加工物11進行加工。圖8是顯示加工步驟ST15之概要的側面圖。再者,在圖8中也是將一部分的要素以剖面來顯示。After the correction coordinate acquisition step ST14, the processing step ST15 is performed. The processing step ST15 uses the information about the position and direction of the workpiece 11 acquired in the above-mentioned series of acquisition steps (direction acquisition step ST11, first coordinate acquisition step ST12, second coordinate acquisition step ST13 and correction coordinate acquisition step ST14) to process the workpiece 11. That is, in the processing step ST15, the workpiece 11 is processed according to the direction of the edge and the four XY coordinates indicating the position of each edge. FIG8 is a side view showing the outline of the processing step ST15. In addition, in FIG8, a part of the elements is also shown in cross section.

在本實施形態之加工步驟ST15中,會沿著加工預定線來將被加工物11的內部改質。具體而言,首先,控制單元50會考慮上述之邊的方向來調整工作夾台36的方向,並將成為對象之加工預定線設成相對於X方向平行。接著,控制單元50會考慮上述之4個XY座標來調整工作夾台36的位置,並讓照射頭44的位置在對象之加工預定線的延長線的上方對齊。In the processing step ST15 of the present embodiment, the interior of the object 11 to be processed is modified along the predetermined processing line. Specifically, first, the control unit 50 adjusts the direction of the work clamp 36 in consideration of the direction of the above-mentioned edge, and sets the predetermined processing line of the object to be parallel to the X direction. Next, the control unit 50 adjusts the position of the work clamp 36 in consideration of the above-mentioned four XY coordinates, and aligns the position of the irradiation head 44 above the extension line of the predetermined processing line of the object.

然後,如圖8所示,一邊從照射頭44朝向被加工物11照射雷射光束44a,一邊使工作夾台36朝X方向移動。亦即,使工作夾台36與照射頭44在相對於加工預定線平行的方向上相對地移動。在此,將照射頭44調整成例如使雷射光束44a聚光於被加工物11的內部。Then, as shown in FIG8 , while the laser beam 44a is irradiated from the irradiation head 44 toward the workpiece 11, the work clamp 36 is moved in the X direction. That is, the work clamp 36 and the irradiation head 44 are moved relative to each other in a direction parallel to the predetermined processing line. Here, the irradiation head 44 is adjusted so that, for example, the laser beam 44a is focused on the inside of the workpiece 11.

如此,可藉由使穿透被加工物11之波長的雷射光束44a(穿透性的雷射光束44a)聚光於被加工物11的內部,而將被加工物11的內部改質,並形成改質層17。在本實施形態中,由於是使工作夾台36與照射頭44相對地移動來將雷射光束44a照射於加工預定線,因此可沿著此加工預定線形成改質層17。上述之動作會重複直到被加工物11沿著全部的加工預定線被加工為止。In this way, the inside of the object 11 can be modified by focusing the laser beam 44a (penetrating laser beam 44a) of a wavelength that penetrates the object 11 to the inside of the object 11, thereby forming a modified layer 17. In this embodiment, since the work clamp 36 and the irradiation head 44 are moved relative to each other to irradiate the laser beam 44a to the processing predetermined line, the modified layer 17 can be formed along the processing predetermined line. The above-mentioned operation is repeated until the object 11 is processed along all the processing predetermined lines.

如以上,在本實施形態之被加工物的加工方法中,由於取得被加工物11的第1面11a所具有之邊(邊11c)的方向、與第1面11a所具有之4個邊(邊11c、邊11d、邊11e以及邊11f)的每一個的位置(位置C1、位置C2、位置D1以及位置D2)之4個XY座標,因此可以依據這些而以高精度來對被加工物11進行加工。As described above, in the processing method of the workpiece of the present embodiment, since the direction of the edge (edge 11c) of the first surface 11a of the workpiece 11 and the four XY coordinates of the position (position C1, position C2, position D1, and position D2) of each of the four edges (edge 11c, edge 11d, edge 11e, and edge 11f) of the first surface 11a are obtained, the workpiece 11 can be processed with high precision based on these.

又,在本實施形態之被加工物的加工方法中,由於利用測定到對象之距離的位移測定器48來取得邊的方向與4個XY座標,因此即使在例如被加工物11為透明的情況、或在被加工物11上未形成有器件等的構造(型樣)的情況下,仍然可以正確地掌握被加工物11的位置。Furthermore, in the processing method of the workpiece of the present embodiment, since the direction of the edge and the four XY coordinates are obtained by using the displacement measuring device 48 that measures the distance to the object, the position of the workpiece 11 can still be accurately grasped even in the case where, for example, the workpiece 11 is transparent or a structure (pattern) such as a device is not formed on the workpiece 11.

據此,在加工被加工物11時,在不欲對其外周緣照射雷射光束44a的情況下等,本實施形態之被加工物的加工方法是極為有效的。又,根據本實施形態之被加工物的加工方法,也可以防止弄錯而對被加工物11的外部照射雷射光束44a之情形等。Thus, the processing method of the object 11 of this embodiment is very effective when it is not desired to irradiate the outer periphery of the object 11. In addition, the processing method of the object 11 of this embodiment can prevent the laser beam 44a from being irradiated to the outside of the object 11 by mistake.

再者,本發明並不因上述之實施形態之記載而受到限制,且可以進行各種變更來實施。圖9是顯示第1變形例之被加工物的加工方法的流程圖。如圖9所示,在第1變形例之被加工物的加工方法中,用於取得被加工物11的邊的方向、及表示被加工物11的4個邊的位置之4個座標之一連串的取得步驟與上述之實施形態相異。Furthermore, the present invention is not limited by the description of the above-mentioned embodiments and can be implemented with various modifications. FIG. 9 is a flow chart showing the processing method of the first modified example. As shown in FIG. 9, in the processing method of the first modified example, a series of acquisition steps for acquiring the direction of the side of the object 11 and the four coordinates representing the positions of the four sides of the object 11 are different from the above-mentioned embodiments.

具體而言,首先會進行第1座標取得步驟ST21,前述第1座標取得步驟ST21是在平行於X方向的2條直線上測定包含被加工物11之相向的2個邊的區域之高度來得到位移資訊,並從前述位移資訊取得表示相向的2個邊與2條直線交叉之3個以上的位置之3個以上的XY座標。圖10是顯示第1變形例之第1座標取得步驟ST21之概要的平面圖。再者,在圖10中也是將膠帶13等的一部分的要素省略。Specifically, the first coordinate acquisition step ST21 is performed first. The first coordinate acquisition step ST21 measures the height of the region including the two opposing sides of the workpiece 11 on two straight lines parallel to the X direction to obtain displacement information, and obtains three or more XY coordinates representing three or more positions where the two opposing sides and the two straight lines intersect from the displacement information. FIG. 10 is a plan view showing an overview of the first coordinate acquisition step ST21 of the first variant. In addition, in FIG. 10 , some elements such as the tape 13 are omitted.

在第1變形例之第1座標取得步驟ST21中,控制單元50一邊使保持有被加工物11之狀態的工作夾台36在X方向上移動,一邊使位移測定器48作動,而得到X方向上的位置與高度之關係。亦即,使位移測定器48與工作夾台36相對地移動,並在平行於X方向的直線上測定包含被加工物11之相向的2個邊的區域之高度。所得到之位移資訊會被記憶於記憶部50b。In the first coordinate acquisition step ST21 of the first modification, the control unit 50 moves the worktable 36 holding the workpiece 11 in the X direction while actuating the displacement measuring device 48 to obtain the relationship between the position and the height in the X direction. That is, the displacement measuring device 48 and the worktable 36 are moved relative to each other, and the height of the region including the two opposing sides of the workpiece 11 is measured on a straight line parallel to the X direction. The obtained displacement information is stored in the memory unit 50b.

更具體而言,首先會沿著圖10所示之第1直線31a來測定包含被加工物11的相向的邊11c以及邊11d的區域之高度。在此,在第1直線31a與邊11c交叉的位置E1之高度、與在被加工物11的外部相鄰於位置E1的位置之高度之間,會存在大的差距。又,在第1直線31a與邊11d交叉的位置E2之高度、與在被加工物11的外部相鄰於位置E2的位置之高度之間,會存在大的差距。More specifically, the height of the region including the opposing sides 11c and 11d of the workpiece 11 is first measured along the first straight line 31a shown in FIG10. Here, there is a large difference between the height of the position E1 where the first straight line 31a intersects the side 11c and the height of the position adjacent to the position E1 outside the workpiece 11. Also, there is a large difference between the height of the position E2 where the first straight line 31a intersects the side 11d and the height of the position adjacent to the position E2 outside the workpiece 11.

據此,可以藉由從所得到的位移資訊中提取高低差大的位置,來計算位置E1的X座標(X 51)與位置E2的X座標(X 52)。再者,相對於X方向平行的第1直線31a上的任意的位置之Y座標是任一個位置皆相等。因此,可以藉由使用表示測定時的Y軸移動工作台20(工作夾台36)的位置之資訊等,來計算位置E1以及位置E2之Y座標(Y 5)。 Based on this, the X coordinate ( X51 ) of position E1 and the X coordinate ( X52 ) of position E2 can be calculated by extracting the position with the largest height difference from the obtained displacement information. Furthermore, the Y coordinate of any position on the first straight line 31a parallel to the X direction is equal to any position. Therefore, the Y coordinate ( Y5 ) of position E1 and position E2 can be calculated by using information indicating the position of the Y-axis moving table 20 (work clamp 36) during measurement.

亦即,運算部50a會使用藉由測定而得到的位移資訊,來計算第1直線31a與邊11c交叉的位置E1之X座標(X 51),並使用表示測定時的Y軸移動工作台20的位置之資訊等,來計算位置E1之Y座標(Y 5)。所計算出之位置E1之座標(X 51‚Y 5)會記憶於記憶部50b。 That is, the calculation unit 50a uses the displacement information obtained by the measurement to calculate the X coordinate ( X51 ) of the position E1 where the first straight line 31a intersects the side 11c, and uses the information indicating the position of the Y-axis moving table 20 during the measurement to calculate the Y coordinate ( Y5 ) of the position E1. The calculated coordinates ( X51 , Y5 ) of the position E1 are stored in the storage unit 50b.

又,運算部50a會使用藉由測定而得到的位移資訊,來計算第1直線31a與邊11d交叉的位置E2之X座標((X 52),並使用表示測定時的Y軸移動工作台20的位置之資訊等,來計算位置E2之Y座標(Y 5)。所計算出之位置E2之座標(X 52‚Y 5)會記憶於記憶部50b。 Furthermore, the calculation unit 50a calculates the X coordinate (( X52 )) of the position E2 where the first straight line 31a intersects the side 11d using the displacement information obtained by the measurement, and calculates the Y coordinate (Y5) of the position E2 using the information indicating the position of the Y-axis moving table 20 during the measurement. The calculated coordinates ( X52 , Y5 ) of the position E2 are stored in the storage unit 50b.

在沿著第1直線31a測定包含被加工物11的相向的邊11c以及邊11d的區域之高度後,在使工作夾台36(Y軸移動工作台20)朝Y方向移動後,進行同樣的測定。亦即,沿著通過在Y方向上和第1直線31a不同的位置且平行於X方向的第2直線31b,來測定包含被加工物11的邊11c以及邊11d的區域之高度。After measuring the height of the area including the opposite sides 11c and 11d of the workpiece 11 along the first straight line 31a, the work table 36 (Y-axis moving table 20) is moved in the Y direction and the same measurement is performed. That is, the height of the area including the sides 11c and 11d of the workpiece 11 is measured along the second straight line 31b that passes through a different position in the Y direction from the first straight line 31a and is parallel to the X direction.

並且,運算部50a會使用藉由測定而得到的位移資訊,來計算第2直線31b與邊11c交叉的位置F1之X座標(X 61),並使用表示測定時的Y軸移動工作台20的位置之資訊等,來計算位置F1之Y座標(Y 6)。所計算出之位置F1之座標(X 61‚Y 6)會記憶於記憶部50b。 Furthermore, the calculation unit 50a uses the displacement information obtained by the measurement to calculate the X coordinate ( X61 ) of the position F1 where the second straight line 31b intersects the side 11c, and uses the information indicating the position of the Y-axis moving table 20 during the measurement to calculate the Y coordinate ( Y6 ) of the position F1. The calculated coordinates ( X61 , Y6 ) of the position F1 are stored in the storage unit 50b.

又,運算部50a會使用藉由測定而得到的位移資訊,來計算第2直線31b與邊11d交叉的位置F2之X座標(X 62),並使用表示測定時的Y軸移動工作台20的位置之資訊等,來計算位置F2之Y座標(Y 6)。所計算出之位置F2之座標(X 62‚Y 6)會記憶於記憶部50b。 Furthermore, the calculation unit 50a uses the displacement information obtained by the measurement to calculate the X coordinate ( X62 ) of the position F2 where the second straight line 31b intersects the side 11d, and uses the information indicating the position of the Y-axis moving table 20 during the measurement to calculate the Y coordinate ( Y6 ) of the position F2. The calculated coordinates ( X62 , Y6 ) of the position F2 are stored in the storage unit 50b.

再者,在此第1變形例之第1座標取得步驟ST21中,雖然全部取得有表示第1直線31a以及第2直線31b、與邊11c以及邊11d交叉的4個位置之4個XY座標,但在本發明中只要可以取得4個XY座標當中的任3個座標即可。Furthermore, in the first coordinate acquisition step ST21 of this first variant, although four XY coordinates representing the four positions where the first straight line 31a and the second straight line 31b intersect with the side 11c and the side 11d are acquired, in the present invention, any three of the four XY coordinates can be acquired.

如圖9所示,在第1座標取得步驟ST21之後,會進行第2座標取得步驟ST22,前述第2座標取得步驟ST22是在平行於X方向的1條直線上測定包含被加工物11之相向的其他2個邊的區域之高度來得到位移資訊,並從前述位移資訊取得表示相向的其他2個邊與1條直線交叉的2個位置之2個XY座標。圖11是顯示第1變形例之第2座標取得步驟ST22之概要的平面圖。再者,在圖11中也是將膠帶13等的一部分的要素省略。As shown in FIG9 , after the first coordinate acquisition step ST21, the second coordinate acquisition step ST22 is performed. The second coordinate acquisition step ST22 measures the height of the region including the other two sides of the workpiece 11 facing each other on a straight line parallel to the X direction to obtain displacement information, and obtains two XY coordinates representing two positions where the other two sides facing each other intersect the straight line from the displacement information. FIG11 is a plan view showing an overview of the second coordinate acquisition step ST22 of the first variant. In addition, in FIG11 , some elements such as the tape 13 are omitted.

在第2座標取得步驟ST22中,首先會將工作夾台36的方向調整成相對於在上述之第1座標取得步驟ST21中的工作夾台36的方向垂直。亦即,控制單元50使工作夾台36從圖10所示之狀態旋轉相當於90°之角度(在第1變形例中,是在平面視角下朝順時針方向90°之角度)。In the second coordinate acquisition step ST22, the direction of the work clamp 36 is first adjusted to be perpendicular to the direction of the work clamp 36 in the first coordinate acquisition step ST21. That is, the control unit 50 rotates the work clamp 36 from the state shown in FIG. 10 by an angle of 90° (in the first variant, an angle of 90° in the clockwise direction in a plane view).

之後,控制單元50一邊使保持有被加工物11之狀態的工作夾台36朝X方向移動,一邊使位移測定器48作動,來得到X方向上的位置與高度之關係。亦即,使位移測定器48與工作夾台36相對地移動,並在平行於X方向的直線上測定包含被加工物11之相向的其他2個邊的區域之高度。所得到之位移資訊會被記憶於記憶部50b。After that, the control unit 50 moves the worktable 36 holding the workpiece 11 in the X direction while actuating the displacement measuring device 48 to obtain the relationship between the position and the height in the X direction. That is, the displacement measuring device 48 and the worktable 36 are moved relative to each other, and the height of the area including the other two sides of the workpiece 11 facing each other is measured on a straight line parallel to the X direction. The obtained displacement information is stored in the memory unit 50b.

更具體來說,是例如沿著圖11所示之第3直線31c來測定包含被加工物11之相向的邊11e以及邊11f的區域之高度。在此,在第3直線31c與邊11e交叉的位置G1之高度、與在被加工物11的外部相鄰於位置G1的位置之高度之間,會存在大的差距。又,在第3直線31c與邊11f交叉的位置G2之高度、與在被加工物11的外部相鄰於位置G2的位置之高度之間,會存在大的差距。More specifically, for example, the height of the region including the sides 11e and 11f facing each other of the workpiece 11 is measured along the third straight line 31c shown in FIG11. Here, there is a large difference between the height of the position G1 where the third straight line 31c intersects the side 11e and the height of the position adjacent to the position G1 outside the workpiece 11. Also, there is a large difference between the height of the position G2 where the third straight line 31c intersects the side 11f and the height of the position adjacent to the position G2 outside the workpiece 11.

據此,可以藉由從所得到的位移資訊中提取高低差大的位置,來計算位置G1之X座標(X 71)與位置G2之X座標(X 72)。再者,相對於X方向平行的第3直線31c上的任意的位置之Y座標是任一個位置皆相等。因此,可以藉由使用表示測定時的Y軸移動工作台20(工作夾台36)的位置之資訊等,來計算位置G1以及位置G2之Y座標(Y 7)。 Based on this, the X coordinate (X 71 ) of position G1 and the X coordinate (X 72 ) of position G2 can be calculated by extracting the position with the largest height difference from the obtained displacement information. Furthermore, the Y coordinate of any position on the third straight line 31c parallel to the X direction is equal to any position. Therefore, the Y coordinate (Y 7 ) of position G1 and position G2 can be calculated by using information indicating the position of the Y-axis moving table 20 (work clamp 36) during measurement.

亦即,運算部50a會使用藉由測定而得到的位移資訊,來計算第3直線31c與邊11e交叉之位置G1之X座標(X 71),並使用表示測定時的Y軸移動工作台20的位置之資訊等,來計算位置G1之Y座標(Y 7)。所計算出之位置G1之座標(X 71‚Y 7)會記憶於記憶部50b。 That is, the calculation unit 50a uses the displacement information obtained by the measurement to calculate the X coordinate (X 71 ) of the position G1 where the third straight line 31c intersects the side 11e, and uses the information indicating the position of the Y-axis moving table 20 during the measurement to calculate the Y coordinate (Y 7 ) of the position G1. The calculated coordinates (X 71 ‚Y 7 ) of the position G1 are stored in the storage unit 50b.

又,運算部50a會使用藉由測定而得到的位移資訊,來計算第3直線31c與邊11f交叉之位置G2之X座標(X 72),並使用表示測定時的Y軸移動工作台20的位置之資訊等,來計算位置G2之Y座標(Y 7)。所算出之位置G2之座標(X 72‚Y 7)會記憶於記憶部50b。 Furthermore, the calculation unit 50a calculates the X coordinate ( X72 ) of the position G2 where the third straight line 31c intersects the side 11f using the displacement information obtained by the measurement, and calculates the Y coordinate (Y7) of the position G2 using the information indicating the position of the Y-axis moving table 20 during the measurement. The calculated coordinates ( X72 , Y7 ) of the position G2 are stored in the storage unit 50b.

如圖9所示,在第2座標取得步驟ST22之後,會進行方向取得步驟ST23,前述方向取得步驟ST23是從在第1座標取得步驟ST21中所取得且表示相向的2個邊的其中一邊與2條直線交叉的2個位置之2個XY座標,來取得相向的2個邊的其中一邊的方向。As shown in FIG9 , after the second coordinate acquisition step ST22, the direction acquisition step ST23 is performed. The direction acquisition step ST23 obtains the direction of one of the two opposing sides from the two XY coordinates obtained in the first coordinate acquisition step ST21 and representing the two positions where one of the two opposing sides intersects with the two straight lines.

例如,運算部50a會對邊11c與第1直線31a交叉的位置E1之座標(X 51‚Y 5)、和邊11c與第2直線31b交叉的位置F1之座標(X 61‚Y 6)適用三角形法,來計算邊11c與Y方向所成的角度(θ 2)。所計算出的角度(θ 2)會作為邊11c的方向而記憶於記憶部50b。 For example, the calculation unit 50a applies the triangulation method to the coordinates (X 51 ‚Y 5 ) of the position E1 where the side 11c intersects the first straight line 31a and the coordinates (X 61 ‚Y 6 ) of the position F1 where the side 11c intersects the second straight line 31b to calculate the angle (θ 2 ) between the side 11c and the Y direction. The calculated angle (θ 2 ) is stored in the storage unit 50b as the direction of the side 11c.

再者,運算部50a亦可計算邊11c與X方向所成的角來作為邊11c的方向。又,運算部50a亦可對邊11d與第1直線31a交叉的位置E2之座標(X 52‚Y 5)、和邊11d與第2直線31b交叉的位置F2之座標(X 62‚Y 6)適用三角形法,來計算邊11d與Y方向或X方向所成的角度。 Furthermore, the calculation unit 50a may calculate the angle between the side 11c and the X direction as the direction of the side 11c. Furthermore, the calculation unit 50a may apply the triangulation method to the coordinates ( X52 , Y5 ) of the position E2 where the side 11d intersects the first straight line 31a and the coordinates ( X62 , Y6 ) of the position F2 where the side 11d intersects the second straight line 31b to calculate the angle between the side 11d and the Y direction or the X direction.

在方向取得步驟ST23之後,會進行補正座標取得步驟ST24,前述補正座標取得步驟ST24會依據在此方向取得步驟ST23中所取得的邊的方向,來對在第1座標取得步驟ST21中所取得的2個XY座標、與在第2座標取得步驟ST22中所取得的2個XY座標進行補正,來取得補正座標。After the direction acquisition step ST23, the correction coordinate acquisition step ST24 will be performed. The correction coordinate acquisition step ST24 will correct the two XY coordinates obtained in the first coordinate acquisition step ST21 and the two XY coordinates obtained in the second coordinate acquisition step ST22 according to the direction of the edge obtained in this direction acquisition step ST23 to obtain the corrected coordinates.

具體而言,是例如運算部50a施行使邊11c與第1直線31a交叉的位置E1之座標(X 51‚Y 5)、和邊11d與第1直線31a交叉的位置E2之座標(X 52‚Y 5)的每一個座標旋轉相當於θ 2之角度(在本實施形態中,是在平面視角下朝順時針方向θ 2之角度)之運算處理,來取得補正後的位置E1之座標以及位置E2之座標(補正座標)。所取得之補正後的位置E1之座標以及位置E2之座標會記憶於記憶部50b。 Specifically, for example, the calculation unit 50a performs a calculation process to rotate the coordinates ( X51 , Y5 ) of the position E1 where the side 11c intersects the first straight line 31a, and the coordinates ( X52 , Y5 ) of the position E2 where the side 11d intersects the first straight line 31a by an angle of θ2 (in this embodiment, an angle of θ2 in the clockwise direction in a plane view) to obtain the corrected coordinates of the position E1 and the coordinates of the position E2 (corrected coordinates). The corrected coordinates of the position E1 and the coordinates of the position E2 obtained are stored in the storage unit 50b.

再者,運算部50a亦可施行使邊11c與第2直線31b交叉的位置F1之座標(X 61‚Y 6)、和邊11d與第2直線31b交叉的位置F2之座標(X 62‚Y 6)的每一個座標旋轉相當於θ 2之角度(在本實施形態中,是在平面視角下朝順時針方向θ 2之角度)之運算處理,來取得補正後的位置F1之座標以及位置F2之座標。 Furthermore, the calculation unit 50a may also perform a calculation process to rotate the coordinates ( X61 "Y6 " ) of the position F1 where the side 11c intersects the second straight line 31b and the coordinates ( X62 "Y6 " ) of the position F2 where the side 11d intersects the second straight line 31b by an angle equal to θ2 (in the present embodiment, an angle of θ2 in the clockwise direction in a plane viewing angle) to obtain the corrected coordinates of the position F1 and the coordinates of the position F2.

又,運算部50a會施行使邊11e與第3直線31c交叉的位置G1之座標(X 71‚Y 7)、和邊11f與第3直線31c交叉的位置G2之座標(X 72‚Y 7)的每一個座標旋轉相當於θ 2-90°之角度(在本實施形態中,是在平面視角下朝順時針方向θ 2-90°之角度)之運算處理,來取得補正後的位置G1之座標以及位置G2之座標(補正座標)。所取得之補正後的位置G1之座標及位置G2之座標會記憶於記憶部50b。 Furthermore, the operation unit 50a performs an operation process to rotate the coordinates ( X71 "Y7 " ) of the position G1 where the side 11e intersects the third straight line 31c and the coordinates ( X72 "Y7 " ) of the position G2 where the side 11f intersects the third straight line 31c by an angle equivalent to θ2-90 ° (in the present embodiment, an angle of θ2-90 ° in the clockwise direction in a plane view) to obtain the corrected coordinates of the position G1 and the coordinates of the position G2 (corrected coordinates). The corrected coordinates of the position G1 and the coordinates of the position G2 are stored in the storage unit 50b.

如此進行而取得的補正座標是表示已將邊11c的方向調整成相對於Y方向平行之狀態下的位置E1、位置E2、位置G1以及位置G2。據此,藉由使用這種補正座標,變得可以精度良好地對被加工物11進行加工。再者,亦可利用同樣的方法,在已將邊11c的方向調整成相對於Y方向垂直之狀態下來取得表示各位置之補正座標。The correction coordinates obtained in this way are positions E1, E2, G1, and G2, which indicate that the direction of the side 11c is adjusted to be parallel to the Y direction. Thus, by using such correction coordinates, the workpiece 11 can be processed with good accuracy. Furthermore, the correction coordinates indicating each position can be obtained by the same method, in a state where the direction of the side 11c is adjusted to be perpendicular to the Y direction.

在補正座標取得步驟ST24之後,會進行加工步驟ST25,前述加工步驟ST25會利用在上述之一連串的取得步驟(第1座標取得步驟ST21、第2座標取得步驟ST22、方向取得步驟ST23以及補正座標取得步驟ST24)中所取得之有關於被加工物11的位置以及方向的資訊來對被加工物11進行加工。亦即,在加工步驟ST25中,會依據邊的方向、與表示各邊的位置之4個XY座標來對被加工物11進行加工。加工步驟ST25的具體的程序宜與實施形態之加工步驟ST15相同。After the correction coordinate acquisition step ST24, the processing step ST25 is performed. The processing step ST25 uses the information about the position and direction of the workpiece 11 acquired in the above series of acquisition steps (the first coordinate acquisition step ST21, the second coordinate acquisition step ST22, the direction acquisition step ST23, and the correction coordinate acquisition step ST24) to process the workpiece 11. That is, in the processing step ST25, the workpiece 11 is processed according to the direction of the edge and the four XY coordinates indicating the position of each edge. The specific procedure of the processing step ST25 is preferably the same as the processing step ST15 of the embodiment.

在此第1變形例之被加工物的加工方法中,由於也可取得被加工物11的第1面11a所具有之邊(邊11c)的方向、及顯示第1面11a所具有之4個邊(邊11c、邊11d、邊11e以及邊11f)的每一個的位置(位置E1、位置E2、位置G1以及位置G2)之4個XY座標,因此可以依據這些而以高精度來對被加工物11進行加工。In the processing method of the workpiece of this first variant, since the direction of the edge (edge 11c) of the first surface 11a of the workpiece 11 and the four XY coordinates of the position (position E1, position E2, position G1 and position G2) of each of the four edges (edge 11c, edge 11d, edge 11e and edge 11f) of the first surface 11a can also be obtained, the workpiece 11 can be processed with high precision based on these.

又,在第1變形例之被加工物的加工方法中,由於也利用測定到對象之距離的位移測定器48來取得邊的方向與4個XY座標,因此即使在例如被加工物11為透明的情況、或在被加工物11上未形成有器件等的構造(型樣)的情況下,仍然可以正確地掌握被加工物11的位置。Furthermore, in the processing method of the workpiece of the first variant, since the direction of the edge and the four XY coordinates are obtained by using the displacement measuring device 48 that measures the distance to the object, the position of the workpiece 11 can still be accurately grasped even in the case where, for example, the workpiece 11 is transparent or a structure (pattern) such as a device is not formed on the workpiece 11.

據此,在加工被加工物11時,在不欲對其外周緣照射雷射光束44a的情況等,第1變形例之被加工物的加工方法是極為有效的。又,根據第1變形例之被加工物的加工方法,也可以防止弄錯而對被加工物11的外部照射雷射光束44a之情形等。Thus, the first modified example of the processing method for processing an object 11 is extremely effective when it is not desired to irradiate the outer periphery of the object 11. In addition, the first modified example of the processing method for processing an object can prevent the laser beam 44a from being irradiated to the outside of the object 11 by mistake.

再者,在上述之實施形態中,雖然是藉由使用位移測定器48來得到位移資訊,而取得被加工物11的第1面11a所具有之邊的方向,但也可以用例如使用相機46來拍攝被加工物11的方法來取得第1面11a所具有之邊的方向。Furthermore, in the above-mentioned embodiment, although the direction of the edge of the first surface 11a of the workpiece 11 is obtained by obtaining displacement information using the displacement measuring device 48, the direction of the edge of the first surface 11a can also be obtained by, for example, using a camera 46 to photograph the workpiece 11.

亦即,在此第2變形例之被加工物的加工方法的方向取得步驟中,可為例如,運算部50a從以相機46拍攝包含被加工物11的1個邊的區域而得到的圖像中,計算邊之上的2個位置之座標,藉此取得邊的方向。其他的步驟亦可和上述之實施形態相同。That is, in the direction obtaining step of the processing method of the workpiece of the second modification, for example, the calculation unit 50a can calculate the coordinates of two positions on the edge from the image obtained by photographing the area including one edge of the workpiece 11 with the camera 46, thereby obtaining the direction of the edge. The other steps can also be the same as those of the above-mentioned embodiment.

又,在上述之實施形態以及各變形例中,雖然是在第1座標取得步驟ST12或第1座標取得步驟ST21之後,進行第2座標取得步驟ST13或第2座標取得步驟ST22,但亦可調換其等的順序。此外,在上述之第1變形例中,雖然是在第2座標取得步驟ST22之後進行方向取得步驟ST23,但方向取得步驟ST23亦可在第1座標取得步驟ST21之後,且在第2座標取得步驟ST22之前進行。Furthermore, in the above-mentioned embodiments and various modifications, although the second coordinate acquisition step ST13 or the second coordinate acquisition step ST22 is performed after the first coordinate acquisition step ST12 or the first coordinate acquisition step ST21, the order thereof may be reversed. Furthermore, in the above-mentioned first modification, although the direction acquisition step ST23 is performed after the second coordinate acquisition step ST22, the direction acquisition step ST23 may be performed after the first coordinate acquisition step ST21 and before the second coordinate acquisition step ST22.

又,在上述之實施形態及各變形例中,雖然是在加工步驟ST15或加工步驟ST25中於被加工物11形成有改質層17,但在本發明的加工步驟中,亦可藉雷射光束來將被加工物11燒蝕加工。在此情況下,可使用具備有如下之雷射振盪器之雷射加工裝置:可以生成會被被加工物11吸收之波長的雷射光束(吸收性的雷射光束)。Furthermore, in the above-mentioned embodiments and various modifications, although the modified layer 17 is formed on the workpiece 11 in the processing step ST15 or the processing step ST25, the workpiece 11 may be ablated by a laser beam in the processing step of the present invention. In this case, a laser processing device having a laser oscillator that can generate a laser beam of a wavelength that is absorbed by the workpiece 11 (absorptive laser beam) may be used.

又,在本發明之加工步驟中,也可以用將環狀的切削刀片(加工單元)切入被加工物11之方法來對被加工物11進行加工,前述環狀的切削刀片是以結合劑固定磨粒而形成。在此情況下,是例如使用具備有供環狀的切削刀片裝設之主軸(加工單元)的切削裝置(加工裝置)來取代照射頭44或雷射振盪器。Furthermore, in the processing step of the present invention, the workpiece 11 may be processed by cutting a ring-shaped cutting blade (processing unit) into the workpiece 11. The ring-shaped cutting blade is formed by fixing abrasive grains with a binder. In this case, for example, a cutting device (processing device) having a spindle (processing unit) for mounting the ring-shaped cutting blade is used instead of the irradiation head 44 or the laser oscillator.

又,在上述之實施形態以及各變形例中,雖然所使用的是以雷射光束48a來測定到對象之距離的光學式的位移測定器48,但是也可以取代像這樣的光學式的位移測定器48,而將背壓感測器或超音波感測器等作為位移測定器(測定器)來使用。Furthermore, in the above-mentioned embodiments and various variations, although an optical displacement meter 48 that uses a laser beam 48a to measure the distance to an object is used, such an optical displacement meter 48 may be replaced by a back pressure sensor or an ultrasonic sensor as a displacement meter (meter).

又,上述之實施形態以及各變形例之被加工物的加工方法,亦可在不會產生矛盾的範圍內替換X方向與Y方向之關係的狀態下實施。例如,在上述之實施形態以及各變形例中,雖然是藉由使工作夾台36與位移測定器48在X方向上相對地移動來測定包含任意之邊的區域之高度,但也可以藉由使工作夾台36與位移測定器48在Y方向上相對地移動,來測定包含任意之邊的區域之高度。Furthermore, the processing methods of the workpiece of the above-mentioned embodiments and various modifications can also be implemented in a state where the relationship between the X direction and the Y direction is replaced within a range that does not cause a contradiction. For example, in the above-mentioned embodiments and various modifications, although the height of the area including any side is measured by moving the work clamp 36 and the displacement measuring device 48 relative to each other in the X direction, the height of the area including any side can also be measured by moving the work clamp 36 and the displacement measuring device 48 relative to each other in the Y direction.

又,亦可依據在上述之實施形態以及各變形例所取得之邊的方向、或4個XY座標,來取得被加工物11的任意的位置之座標(例如被加工物11的重心之座標),並利用於之後的被加工物11的加工。Furthermore, the coordinates of any position of the workpiece 11 (for example, the coordinates of the center of gravity of the workpiece 11) can be obtained based on the direction of the edges or the four XY coordinates obtained in the above-mentioned implementation forms and various variations, and used for subsequent processing of the workpiece 11.

另外,上述之實施形態以及各變形例之構造、方法等,只要在不脫離本發明的目的之範圍內,皆可以合宜變更來實施。In addition, the above-mentioned embodiments and the structures and methods of various variations can be implemented with appropriate changes as long as they do not deviate from the scope of the purpose of the present invention.

2:雷射加工裝置(加工裝置) 4:基台 4a:容置部 6:支撐構造 6a:支撐臂 8:片匣支撐台 10:片匣 11:被加工物 11a:第1面(正面) 11b:第2面(背面) 11c,11d,11e,11f:邊 12:對位單元 13:膠帶(切割膠帶) 14:搬送單元 15:框架 16:移動機構(加工進給機構、分度進給機構) 17:改質層 18:Y軸導軌 20:Y軸移動工作台 21a,31a:第1直線 21b,31b:第2直線 21c,31c:第3直線 21d:第4直線 22:Y軸滾珠螺桿 24:Y軸脈衝馬達 26:X軸導軌 28:X軸移動工作台 30:X軸滾珠螺桿 32:X軸脈衝馬達 34:θ工作台 34a:工作台基座 36:工作夾台 38:框體 38a:凹部 38b:流路 40:保持板 40a:保持面 42:夾具 44:照射頭(加工單元) 44a:雷射光束 46:相機(拍攝單元) 48:位移測定器(測定器) 48a:雷射光束 50:控制單元 50a:運算部 50b:記憶部 A,B,C1,C2,D1,D2,E1,E2,F1,F2,G1,G2:位置 O:原點 X,Y,Z:方向 X 1,X 2,X 31,X 32,X 41,X 42,X 51,X 52,X 61,X 62,X 71,X 72:座標 Y 1,Y 2,Y 3,Y 4,Y 5,Y 6,Y 7:座標 θ 12:角度 ST11,ST23:方向取得步驟 ST12,ST21:第1座標取得步驟 ST13,ST22:第2座標取得步驟 ST14,ST24:補正座標取得步驟 ST15,ST25:加工步驟 2: Laser processing device (processing device) 4: Base 4a: Accommodation portion 6: Support structure 6a: Support arm 8: Cassette support table 10: Cassette 11: Workpiece 11a: First surface (front) 11b: Second surface (back) 11c, 11d, 11e, 11f: Side 12: Alignment unit 13: Tape (cutting tape) 14: Transport unit 15: Frame 16: Moving mechanism (processing feed mechanism, indexing feed mechanism) 17: modified layer 18: Y-axis guide rail 20: Y-axis moving table 21a, 31a: first straight line 21b, 31b: second straight line 21c, 31c: third straight line 21d: fourth straight line 22: Y-axis ball screw 24: Y-axis pulse motor 26: X-axis guide rail 28: X-axis moving table 30: X-axis ball screw 32: X-axis pulse motor 34: θ table 34a: table base 36: work clamp 38: frame 38a: recess 38b: flow path 40: holding plate 40a: holding surface 42: clamp 44: irradiation head (processing unit) 44a: laser beam 46: camera (photographing unit) 48: Displacement measuring device (measuring device) 48a: Laser beam 50: Control unit 50a: Calculation unit 50b: Memory unit A, B, C1, C2, D1, D2, E1, E2, F1, F2, G1, G2: Position O: Origin X, Y, Z: Directions X 1 , X 2 , X 31 , X 32 , X 41 , X 42 , X 51 , X 52 , X 61 , X 62 , X 71 , X 72 : Coordinates Y 1 , Y 2 , Y 3 , Y 4 , Y 5 , Y 6 , Y 7 : Coordinates θ 1 , θ 2 : Angle ST11, ST23: Direction acquisition step ST12, ST21: First coordinate acquisition step ST13, ST22: Second coordinate acquisition step ST14, ST24: Correction coordinate acquisition step ST15, ST25: Processing step

圖1是顯示雷射加工裝置的立體圖。 圖2是顯示被加工物的加工方法的流程圖。 圖3是顯示方向取得步驟之概要的平面圖。 圖4是顯示測定加工物的高度之情形的側面圖。 圖5是顯示位移資訊之例的圖形。 圖6是顯示第1座標取得步驟之概要的平面圖。 圖7是顯示第2座標取得步驟之概要的平面圖。 圖8是顯示加工步驟之概要的側面圖。 圖9是顯示第1變形例之被加工物的加工方法的流程圖。 圖10是顯示第1變形例之第1座標取得步驟之概要的平面圖。 圖11是顯示第1變形例之第2座標取得步驟之概要的平面圖。 FIG. 1 is a perspective view showing a laser processing device. FIG. 2 is a flow chart showing a processing method for a workpiece. FIG. 3 is a plan view showing an overview of a direction acquisition step. FIG. 4 is a side view showing a situation of measuring the height of a workpiece. FIG. 5 is a diagram showing an example of displacement information. FIG. 6 is a plan view showing an overview of a first coordinate acquisition step. FIG. 7 is a plan view showing an overview of a second coordinate acquisition step. FIG. 8 is a side view showing an overview of a processing step. FIG. 9 is a flow chart showing a processing method for a workpiece of a first variant. FIG. 10 is a plan view showing an overview of a first coordinate acquisition step of a first variant. FIG. 11 is a plan view showing an overview of a second coordinate acquisition step of a first variant.

ST11:方向取得步驟 ST11: Direction acquisition step

ST12:第1座標取得步驟 ST12: Step 1 of obtaining coordinates

ST13:第2座標取得步驟 ST13: Step 2 of obtaining coordinates

ST14:補正座標取得步驟 ST14: Correction coordinate acquisition step

ST15:加工步驟 ST15: Processing steps

Claims (4)

一種被加工物的加工方法,在使用工作夾台與加工單元來對板狀的被加工物進行加工時使用,前述板狀的被加工物具有具4個邊之矩形狀的第1面、及和該第1面位於相反側之矩形狀的第2面,前述工作夾台具有保持面,前述加工單元對已保持在該工作夾台之該被加工物進行加工,前述被加工物的加工方法包含以下步驟: 取得步驟,在已將該被加工物的該第2面側保持於該工作夾台的該保持面的狀態下,測定包含該被加工物的4個該邊的區域之高度來得到位移資訊,並從前述位移資訊取得:該邊在平行於該保持面的XY平面內的方向、與表示4個該邊在該XY平面內的位置之4個XY座標;及 加工步驟,依據該邊的方向與該4個XY座標來對該被加工物進行加工。 A method for processing a workpiece is used when a workpiece in the form of a plate is processed using a work jig and a processing unit. The plate-shaped workpiece has a rectangular first surface with four sides and a rectangular second surface located on the opposite side of the first surface. The work jig has a holding surface. The processing unit processes the workpiece held on the work jig. The method for processing the workpiece includes the following steps: An acquisition step, in which the height of an area including the four sides of the workpiece is measured to obtain displacement information while the second side of the workpiece is held on the holding surface of the work jig, and the following are obtained from the displacement information: the direction of the side in an XY plane parallel to the holding surface, and four XY coordinates representing the positions of the four sides in the XY plane; and Processing step: Process the object according to the direction of the edge and the four XY coordinates. 如請求項1之被加工物的加工方法,其中該取得步驟更包含以下步驟: 方向取得步驟,藉由讓用於測定高度之測定器與該工作夾台相對地移動,而在通過Y方向上不同的位置且平行於X方向之2條直線上測定包含該被加工物的1個該邊的區域之高度來得到位移資訊,並從前述位移資訊計算表示該邊與該2條直線交叉的2個位置之XY座標,來取得該邊的方向; 第1座標取得步驟,將繞著相對於該XY平面垂直之旋轉軸的該工作夾台的方向調整成使在該方向取得步驟中所取得的該邊的方向成為相對於該Y方向平行之後,讓該測定器與該工作夾台相對地移動,藉此在平行於該X方向的1條直線上測定包含該被加工物的相向的2個該邊的區域之高度來得到位移資訊,並從前述位移資訊取得表示相向的2個該邊與該1條直線交叉的2個位置之2個XY座標;及 第2座標取得步驟,將繞著該旋轉軸的該工作夾台的方向調整成使在該方向取得步驟中所取得的該邊的方向成為相對於該Y方向垂直之後,讓該測定器與該工作夾台相對地移動,藉此在平行於該X方向的1條直線上測定包含該被加工物的相向的其他2個該邊的區域之高度來得到位移資訊,並從前述位移資訊取得表示相向的其他2個該邊與該1條直線交叉的2個位置之2個XY座標。 The processing method of the workpiece as claimed in claim 1, wherein the obtaining step further includes the following steps: A direction obtaining step, wherein the height of the area including one side of the workpiece is measured on two straight lines passing through different positions in the Y direction and parallel to the X direction by moving the measuring device for measuring the height relative to the work clamp to obtain displacement information, and the XY coordinates of the two positions where the edge intersects the two straight lines are calculated from the above displacement information to obtain the direction of the edge; The first coordinate acquisition step is to adjust the direction of the work clamp around the rotation axis perpendicular to the XY plane so that the direction of the edge acquired in the direction acquisition step becomes parallel to the Y direction, and then move the measuring device and the work clamp relative to each other, thereby measuring the height of the area including the two opposing edges of the workpiece on a straight line parallel to the X direction to obtain displacement information, and obtain two XY coordinates representing the two positions where the two opposing edges intersect the straight line from the above displacement information; and In the second coordinate acquisition step, the direction of the work clamp around the rotation axis is adjusted so that the direction of the side obtained in the direction acquisition step becomes perpendicular to the Y direction, and the measuring device and the work clamp are moved relative to each other, thereby measuring the height of the area including the other two sides of the workpiece facing each other on a straight line parallel to the X direction to obtain displacement information, and obtaining two XY coordinates representing the two positions where the other two sides facing each other intersect the straight line from the above displacement information. 如請求項1之被加工物的加工方法,其中該取得步驟更包含以下步驟: 第1座標取得步驟,藉由讓用於測定高度之測定器與該工作夾台相對地移動,而在通過在Y方向上不同的位置且平行於X方向之2條直線上測定包含該被加工物的相向的2個該邊的區域之高度來得到位移資訊,並從前述位移資訊取得表示相向的2個該邊與該2條直線交叉的3個以上的位置之3個以上的XY座標; 第2座標取得步驟,以繞著相對於該XY平面垂直之旋轉軸的該工作夾台的方向,相對於在該第1座標取得步驟中的該工作夾台的方向垂直之狀態,讓該測定器與該工作夾台相對地移動,藉此在平行於該X方向的1條直線上測定包含該被加工物的相向的其他2個該邊的區域之高度來得到位移資訊,並從前述位移資訊取得表示相向的其他2個該邊與該1條直線交叉的2個位置之2個XY座標; 方向取得步驟,從在該第1座標取得步驟中所取得,且表示相向的2個該邊的其中一邊與該2條直線交叉的2個位置之2個XY座標,來取得相向的2個該邊的其中一邊的方向;及 補正座標取得步驟,依據在該方向取得步驟中所取得的該邊的方向,對在該第1座標取得步驟中所取得且表示相向的2個該邊與該2條直線的其中一條直線交叉的2個位置之2個XY座標、與在該第2座標取得步驟中所取得的2個XY座標進行補正,而取得經補正之4個XY座標。 The processing method of the workpiece as claimed in claim 1, wherein the obtaining step further includes the following steps: The first coordinate obtaining step, by moving the measuring device for measuring the height relative to the work clamp, and measuring the height of the area including the two opposite sides of the workpiece on two straight lines at different positions in the Y direction and parallel to the X direction to obtain displacement information, and obtaining more than three XY coordinates representing more than three positions where the two opposite sides intersect the two straight lines from the above displacement information; The second coordinate acquisition step is to move the measuring device and the work clamp relative to each other in a state that the direction of the work clamp around the rotation axis perpendicular to the XY plane is perpendicular to the direction of the work clamp in the first coordinate acquisition step, thereby measuring the height of the area including the other two opposing sides of the workpiece on a straight line parallel to the X direction to obtain displacement information, and obtain two XY coordinates representing two positions where the other two opposing sides intersect the one straight line from the above displacement information; The direction acquisition step is to obtain the direction of one of the two opposing sides from the two XY coordinates obtained in the first coordinate acquisition step and representing two positions where one of the two opposing sides intersects the two straight lines; and The coordinate correction step is to correct the two XY coordinates of the two positions where the two sides facing each other and one of the two straight lines intersect, obtained in the first coordinate acquisition step, and the two XY coordinates obtained in the second coordinate acquisition step, according to the direction of the side obtained in the direction acquisition step, to obtain four corrected XY coordinates. 一種被加工物之加工方法,在使用工作夾台與加工單元來對板狀的被加工物進行加工時使用,前述板狀的被加工物具有具4個邊之矩形狀的第1面、及和該第1面位於相反側之矩形狀的第2面,前述工作夾台具有保持面,前述加工單元對已保持在該工作夾台之該被加工物進行加工,前述被加工物的加工方法包含以下步驟: 取得步驟,在已將該被加工物的該第2面側保持於該工作夾台的該保持面的狀態下,從拍攝包含該被加工物的1個該邊的區域而得到的圖像來取得該邊在平行於該保持面的XY平面內的方向,並從測定包含該被加工物的4個該邊的區域之高度而得到的位移資訊取得表示4個該邊在該XY平面內的位置之4個XY座標;及 加工步驟,依據該邊的方向與該4個XY座標來對該被加工物進行加工。 A method for processing a workpiece is used when a plate-shaped workpiece is processed using a work jig and a processing unit. The plate-shaped workpiece has a rectangular first surface with four sides and a rectangular second surface located on the opposite side of the first surface. The work jig has a holding surface. The processing unit processes the workpiece held on the work jig. The method for processing the workpiece includes the following steps: An acquisition step, in which the direction of one side of the workpiece in an XY plane parallel to the holding surface is acquired from an image obtained by photographing an area including the side of the workpiece, and four XY coordinates representing the positions of the four sides in the XY plane are acquired from displacement information obtained by measuring the height of the area including the four sides of the workpiece; and Processing step: Process the object according to the direction of the edge and the four XY coordinates.
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